CN116699182A - Product testing method, device and storage medium - Google Patents
Product testing method, device and storage medium Download PDFInfo
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- 230000002452 interceptive effect Effects 0.000 claims abstract description 70
- 238000000034 method Methods 0.000 claims abstract description 48
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/54—Testing for continuity
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Abstract
The application discloses a product testing method, equipment and a storage medium, wherein the method comprises the steps of displaying an interactive panel, wherein the interactive panel comprises configuration components corresponding to all testing channels; channel configuration information configured by a user for each test channel through a configuration component is obtained from the interactive panel, wherein the channel configuration information comprises at least one test type; and controlling each test channel to test the product to be tested based on the channel configuration information corresponding to each test channel. The method provides the interactive panel to realize the configuration of the test channel and the channel configuration information according to the actual needs by a user, thereby realizing the automatic test of the product to be tested based on the channel configuration information of the test channel, and further improving the test efficiency and the test reliability.
Description
Technical Field
The application relates to the field of product testing, in particular to a product testing method, device and storage medium.
Background
According to the electrical load standards of ISO16750-2 and VW80000, 8 types of short circuit tests and 2 types of open circuit tests need to be completed. The test specimen typically has several tens of wire harnesses, each of which is required to perform different types of short and open circuit tests. There are several hundred groups of tests, and each wire harness is tedious to switch, easy to confuse, and at present, the test is very low in efficiency and poor in reliability by completely relying on manual operation.
The statements made above merely serve to provide background information related to the present disclosure and may not necessarily constitute prior art.
Disclosure of Invention
In view of the above problems, embodiments of the present application provide a method, an apparatus, and a storage medium for testing a product, which can alleviate the problem of low testing efficiency when a product is tested by completely relying on manual operation.
In a first aspect, the present application provides a method of testing a product, comprising:
displaying an interactive panel, wherein the interactive panel comprises configuration components corresponding to all test channels, and all the test channels are connected with test objects on a product to be tested in a one-to-one correspondence manner;
channel configuration information configured by a user on each test channel through the configuration component is obtained from the interactive panel, the channel configuration information comprises at least one test type, each test type corresponds to a hardware circuit, and the hardware circuits are used for carrying out electric test on each test type on test objects connected with each test channel;
and controlling each test channel to test the product to be tested based on the channel configuration information corresponding to each test channel.
According to the scheme provided by the embodiment, the interactive panel is provided to realize the configuration of the test channel and the channel configuration information according to actual needs by a user, so that the automatic test of the product to be tested based on the channel configuration information of the test channel is realized, and the test efficiency and the test reliability are improved.
In some embodiments, based on channel configuration information corresponding to each test channel, controlling each test channel to test a product to be tested includes:
based on channel configuration information corresponding to each test channel, respectively determining the configured test type of each test channel;
counting the test channels corresponding to each test type;
controlling to execute the test of each test type in turn; and controlling the plurality of test channels corresponding to the same test type to sequentially test.
In the scheme provided by the embodiment, for a plurality of test channels of the same test type, the test channels are controlled to be tested in sequence, and the ordered test process is helpful for further improving the test efficiency.
In some embodiments, the method further comprises:
under the condition that the test of each test type is controlled to be executed in sequence, the component states of display components corresponding to each test type and the first test channel in the interactive panel are adjusted, so that the adjusted component states indicate that the first test channel is executing the test of each test type, and the first test channel is the test channel executing each test type.
According to the scheme provided by the embodiment, under the condition that the test of each test type is controlled to be executed in sequence, the user can conveniently know the current test state by adjusting the component state of the display component in the interactive panel.
In some embodiments, the method further comprises:
responding to the signal for starting the test of the product to be tested, and calculating the total test time of the product to be tested based on the single-wire test time corresponding to each test type and the number of test channels comprising each test type;
and displaying the total testing time on the interactive panel.
In the scheme provided by the embodiment, the total test time is calculated and displayed on the interactive panel, so that a user can observe the test time conveniently.
In some embodiments, the method further comprises:
under the condition that the total test time is calculated, calculating the test time of the product to be tested based on the number of test channels in the interactive panel and the single-wire test time corresponding to each test type of which the second test channel is completed; the second test channel is a test channel for completing at least one test type;
calculating the difference value between the total test time and the tested test time to obtain the test residual time;
and updating the test total time with the test residual time on the interactive panel.
According to the scheme provided by the embodiment, the test remaining time is calculated and displayed on the interactive panel, so that a user can conveniently know the test process.
In some embodiments, the method further comprises:
under the condition of controlling the test of each test type to be sequentially executed, calculating single-wire remaining time based on single-wire test time corresponding to each test type and the time of each test type;
and displaying the single line residual time on the interactive panel.
According to the scheme provided by the embodiment, the single line remaining time is calculated and displayed on the interactive panel, so that a user can conveniently know the progress of a test of a certain currently-performed test type.
In some embodiments, the method further comprises:
and executing the step of controlling the test of each test type to be executed in turn under the condition that the state of the test total type of each test type in the interactive panel indicates that the test of the test total type is allowed to be executed.
In the scheme provided by the embodiment, the occurrence of the situation that the test of the product to be tested is wrong due to the fact that the user misconfigurates the channel configuration information of the test channel can be reduced by setting the test total type.
In a second aspect, the present application provides a product testing apparatus comprising:
the display module is used for displaying an interactive panel, the interactive panel comprises configuration components corresponding to all the test channels, and all the test channels are connected with test objects on a product to be tested in a one-to-one correspondence manner;
the system comprises an acquisition module, a configuration module and a configuration module, wherein the acquisition module is used for acquiring channel configuration information configured for each test channel by a user through the configuration component from the interactive panel, the channel configuration information comprises at least one test type, each test type corresponds to a hardware circuit, and the hardware circuit is used for carrying out electric test of each test type on test objects connected with each test channel;
the control module is used for controlling each test channel to test the product to be tested based on the channel configuration information corresponding to each test channel.
In a third aspect, the present application provides an electronic device, comprising: a processor and a memory;
the memory is used for storing a computer program;
the processor is configured to execute the program stored in the memory, and implement the product testing method according to the first aspect.
In a fourth aspect, the present application provides a computer readable storage medium storing a computer program which when executed by a processor implements the product testing method of the first aspect.
The foregoing description is only an overview of the present application, and is intended to be implemented in accordance with the teachings of the present application in order that the same may be more clearly understood and to make the same and other objects, features and advantages of the present application more readily apparent.
Drawings
Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The drawings are only for purposes of illustrating the preferred embodiments and are not to be construed as limiting the application. Also, like reference numerals are used to designate like parts throughout the figures.
FIG. 1 is a flow chart of a method for testing products according to some embodiments of the present application;
FIG. 2 is a schematic diagram of an interactive panel according to some embodiments of the present application;
FIG. 3 is a schematic diagram of a product testing apparatus according to some embodiments of the present application;
FIG. 4 is a schematic diagram of an electronic device according to some embodiments of the application;
fig. 5 is a schematic diagram of a computer-readable storage medium according to some embodiments of the application.
Detailed Description
Embodiments of the technical scheme of the present application will be described in detail below with reference to the accompanying drawings. The following examples are only for more clearly illustrating the technical aspects of the present application, and thus are merely examples, and are not intended to limit the scope of the present application.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs; the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application; the terms "comprising" and "having" and any variations thereof in the description of the application and the claims and the description of the drawings above are intended to cover a non-exclusive inclusion.
In the description of embodiments of the present application, the technical terms "first," "second," and the like are used merely to distinguish between different objects and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated, a particular order or a primary or secondary relationship. In the description of the embodiments of the present application, the meaning of "plurality" is two or more unless explicitly defined otherwise.
Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment may be included in at least one embodiment of the application. The appearances of such phrases in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. Those of skill in the art will explicitly and implicitly appreciate that the embodiments described herein may be combined with other embodiments.
In the description of the embodiments of the present application, the term "and/or" is merely an association relationship describing an association object, and indicates that three relationships may exist, for example, a and/or B may indicate: a exists alone, A and B exist together, and B exists alone. In addition, the character "/" herein generally indicates that the front and rear associated objects are an "or" relationship.
The electrical load standard requirements of ISO16750-2 and VW80000, and the circuit board corresponding to the battery pack and the internal battery management system need to complete 8 types of short circuit tests and 2 types of open circuit tests, and can be used under the condition that the test results meet the electrical load standard requirements. There are typically tens of wiring harnesses in a circuit board, each of which requires different types of short and open circuit testing to be accomplished. There are several hundred groups of tests, and each wire harness is tedious to switch, easy to confuse, and at present, the test is very low in efficiency and poor in reliability by completely relying on manual operation.
In order to alleviate the problem of low test efficiency in the electrical test which relies on manual operation to perform electrical load standard requirements, the embodiment of the application provides a product test method, wherein an interactive panel is provided in the method to realize the configuration of a test channel and channel configuration information according to actual needs by a user, thereby realizing the automatic test of a product to be tested based on the channel configuration information of the test channel, and further improving the test efficiency and the test reliability.
The product testing method provided by the embodiment of the application can be applied to testing any product to be tested comprising a circuit board, including but not limited to batteries, electric toys, terminal equipment, vehicles, school supplies and the like.
In some embodiments of the present application, the devices involved in the product analysis method may include, but are not limited to, a storage device and an upper computer. The storage device may include, but is not limited to, storing channel configuration information for each test channel. The host computer may include, but is not limited to, a server or terminal connected to a storage device. The connection relationship between the upper computer and the storage device can be wired connection or wireless connection, etc. In these embodiments, the host computer may obtain channel configuration information of each test channel from the storage device, and control each test channel to test the product to be tested based on the channel configuration information.
For convenience of description, the specific processing procedure of the embodiment of the present application will be described in detail below by taking an example that the related devices include an upper computer and a storage device.
Referring to fig. 1, an embodiment of the present application provides a method for testing a product, which specifically includes the following steps:
step 101, displaying an interactive panel, wherein the interactive panel comprises configuration components corresponding to all test channels, and all the test channels are in one-to-one correspondence connection with test objects on a product to be tested;
102, obtaining channel configuration information configured by a user on each test channel through a configuration component from an interactive panel, wherein the channel configuration information comprises at least one test type, each test type corresponds to a hardware circuit, and the hardware circuit is used for carrying out electric test on each test type on test objects connected with each test channel;
and 103, controlling each test channel to test the product to be tested based on the channel configuration information corresponding to each test channel.
In this embodiment, each test channel may correspond to a plurality of configuration components, and each configuration component corresponds to a test type. The user configures the configuration components to further configure the configuration information of the test channel, for example, when the user selects one configuration component, the channel configuration information of the test channel includes the test type corresponding to the configuration component.
It should be understood that the channel configuration information corresponding to different test channels may be identical, may be completely different, or may be partially identical. Specifically, when the test types included in the channel configuration information of the different test channels are identical, the channel configuration information of the different test channels is identical; when the channel configuration information of different test channels includes the same test type, then the channel configuration information of different test channels is the same; when the test types included in the channel configuration information of the different test channels are completely different, then the channel configuration information of the different test channels are completely different.
In application, the test types in the channel configuration information include, but are not limited to, an open 1 test, an open 3 test, a short (active) test for power, a short (inactive) test for power, a short (active) test for ground, a short (inactive) test for ground, a power loss (active) test, a power loss (inactive) test, a ground loss (active) test, a ground loss (inactive) test, and the like.
In application, the test channels include, but are not limited to, components such as a connection terminal and a connection plug on the test equipment, and when the test is actually performed, the test channels can be connected with test objects to be tested on the product to be tested, so that each test object in the product to be tested is tested. It should be understood that the test channel can also be connected with circuits for realizing tests of different test types inside the test equipment, and the test of the product to be tested can be realized by controlling the on-off of the circuits through the test channel according to the channel configuration information.
For easy understanding, a schematic diagram of the interactive panel shown in fig. 2 is given, and in fig. 2, the selection channels numbered 01-32 correspond to the test channels in this embodiment, and the "open circuit, short circuit to power supply, short circuit to ground, power supply loss and ground loss" correspond to the test types in the configuration information of the test channels in this embodiment. In fig. 2, the channel configuration information corresponding to each selected channel is the same, i.e., the channel configuration information of each selected channel includes test types of "open 1 time, open 3 times, short circuit to power (active), short circuit to ground (active), power loss (active), and ground loss (active)". In fig. 2, each selection channel corresponds to 10 square configuration components, taking the selection channel with the "01" number and the test type with the "open circuit 1 time" as examples, the square configuration component corresponding to the selection channel with the "01" number and the test type with the "open circuit 1 time" is one of all configuration components corresponding to the selection channel with the "01" number.
According to the scheme provided by the embodiment, the interactive panel is provided for the user to configure the test channel and the channel configuration information according to actual needs, so that the automatic test of the product to be tested based on the channel configuration information of the test channel is realized, and the test efficiency and the test reliability are improved.
In one or more embodiments of the present application, based on channel configuration information corresponding to each test channel, each test channel is controlled to test a product to be tested, including:
based on channel configuration information corresponding to each test channel, respectively determining the configured test type of each test channel;
counting the test channels corresponding to each test type;
controlling to execute the test of each test type in turn; and controlling the plurality of test channels to test sequentially for the plurality of test channels corresponding to the same test type.
In this embodiment, a channel configuration information may include one or more test types. And when the control sequentially executes the tests of the test types, testing the test channels corresponding to the channel configuration information comprising the test type one by one for each test type.
Specifically, the one-time test procedure includes: the method comprises the steps that an ith test type is tested on a jth test object which needs to be tested on an ith test type in a product to be tested, the jth test object corresponds to a jth test channel in an interactive panel, and the ith test type is a test type in channel configuration information of the jth test channel; i is more than 0 and less than or equal to the total category number of the test types included in the channel configuration information corresponding to each test channel, j is more than 0 and less than or equal to the total number of test objects in the product to be tested;
under the condition that the j-th test object is determined to complete the test of the i-th test type and is not the last test object needing to complete the test of the i-th test type in the product to be tested, updating j=j+1, and returning to execute a test process until all test objects needing to be tested of the i-th test type in the product to be tested complete the test of the i-th test type;
and updating i=i+1 under the condition that the j-th test object is determined to complete the test of the i-th test type, the j-th test object is the last test object which needs to complete the test of the i-th test type in the product to be tested, and the i-th test type is not the last test type in the channel configuration information corresponding to each test channel, and returning to execute the test process once until the product to be tested completes each test type in the channel configuration information corresponding to each test channel.
In application, it may be determined whether the jth test object completes testing of the ith test type based on the single line test time required to complete testing of the ith test type. In the application, the single-wire test time required by the test of the ith test type can be set by a user through the interactive panel every time the product test method is executed, and can also be preconfigured.
In combination with the interactive panel in fig. 2, taking a test object in a product to be tested as an example of a wire harness, a process of testing the product to be tested in this embodiment is described.
The test is started;
and executing an open circuit test for 1 time, executing a next wire harness after the open circuit test is completed, and if the interactive panel is identified to be not hooked with the type test in the executing process, skipping over the next wire harness, and executing the next wire harness until all the wire harnesses are completed.
And then, executing an open circuit test for 3 times, namely executing a next wire harness after the test is completed from the first wire harness, and if the interactive panel is identified to not hook the type of test in the executing process, skipping over the next wire harness, and executing the next wire harness until all the wire harnesses are completed.
And then executing a short-circuit activation test on the power supply, judging whether to execute the activation test from the first wire harness, if so, executing the next wire harness, and if not, executing the next wire harness until all the wire harnesses are completed.
And then, performing a power short-circuit unactivated test, judging whether to perform the unactivated test from the first wire harness, if so, performing the next wire harness after the execution, and if not, performing the next wire harness until all the wire harnesses are completed.
And then executing a short-circuit activation test to ground, judging whether to execute the activation test or not from the first wire harness, if so, executing the next wire harness, and if not, executing the next wire harness until all the wire harnesses are completed.
And then, performing a ground short circuit unactivated test, judging whether to perform the unactivated test from the first wire harness, if so, performing the next wire harness after the execution, and if not, performing the next wire harness until all the wire harnesses are completed.
And then executing a power failure activation test, judging whether to execute the activation test from the first wire harness, if so, executing the next wire harness, and if not, executing the next wire harness until all the wire harnesses are completed.
And then, executing a power failure unactivated test, judging whether to execute the unactivated test from the first wire harness, if so, executing the next wire harness after the execution, and if not, executing the next wire harness until all the wire harnesses are completed.
And then performing a missing activation test, judging whether to perform the activation test from the first wire harness, if yes, performing the next wire harness after the activation test is completed, and if not, performing the next wire harness until all the wire harnesses are completed.
And then the unactivated test is missed in an execution mode, whether the unactivated test is executed or not is judged from the first wire harness, if the unactivated test is needed to be executed, the next wire harness is executed after the unactivated test is completed, and if the unactivated test is not needed to be executed, the next wire harness is executed until all the wire harnesses are completed.
Ending the test.
In this embodiment, the testing of the product to be tested is performed in the order from top to bottom and from left to right, and in practical application, the testing may also be performed in the order from left to right and from top to bottom. Specifically, for the first wire harness, whether to execute the open circuit 1 test is firstly judged, if the open circuit is required to be completed, whether to execute the open circuit 3 times is judged, if the open circuit is required to be completed, whether to complete the short circuit activation test of the power supply is judged, according to the sequence, until the first wire harness completes all test types included in the channel configuration information corresponding to the '01' selection channel, and then the steps are repeated for the second wire harness.
In the scheme provided by the embodiment, for a plurality of test channels of the same test type, the test channels are controlled to be tested in sequence, and the ordered test process is helpful for further improving the test efficiency.
The foregoing description of various embodiments is intended to highlight differences between the various embodiments, which may be the same or similar to each other by reference, and is not repeated herein for the sake of brevity.
In one or more embodiments of the application, the method further comprises:
under the condition of controlling the test of each test type to be executed in turn, adjusting the component state of the display component corresponding to each test type and the first test channel in the interactive panel, so that the adjusted component state indicates that the first test channel is executing the test of each test type, and the first test channel is executing the test channel of each test type.
In application, different colors can be used to distinguish different component states. For example, a test of a certain test type may be performed in red. Different component states can also be distinguished by the frequency of flashing. Such as flashing at a high frequency to indicate that a test of a certain test type is being performed. It is of course also possible to distinguish between different component states with a combination of color and flashing frequency. Such as flashing red at a high frequency to indicate that a test of a certain test type is being performed.
According to the scheme provided by the embodiment, under the condition that the tests of all test types are controlled to be executed in sequence, the user can conveniently know the current test state by adjusting the component state of the display component in the interactive panel.
The foregoing description of various embodiments is intended to highlight differences between the various embodiments, which may be the same or similar to each other by reference, and is not repeated herein for the sake of brevity.
In one or more embodiments of the application, the method further comprises:
responding to the detected signal for starting the test of the product to be tested, and calculating the total test time of the product to be tested based on the single-wire test time corresponding to each test type and the number of test channels comprising each test type;
the total test time is displayed on the interactive panel.
It should be understood that single-line test time refers to the time that one test channel takes to complete a test of one test type. Still referring to the interactive panel of fig. 2, a single line test time of 1 open circuit refers to the time required for one wire harness to complete 1 open circuit test.
In practical application, the mechanism of testing the product to be tested by different test types based on the test channel is different, and the single-wire test time corresponding to the test type can comprise test process time, electrical load standard requirement time, switch switching time and the like. Still exemplified by the test types in the interactive panel of fig. 2, the test types in the interactive panel can be specifically classified into two major categories, i.e., an open test including 1 open and 3 open, and a short test including all but 1 open and 3 open. The single line test time is the same for all test types in the open circuit test, and the single line test time is the same for all test types in the short circuit test. Thus, for the interactive panel in fig. 2, the calculation formula for the total test time may be:
ttotal=+
Wherein Ttotal is the total test time, T1 is the open circuit test time, in s (seconds); t2 is the short circuit test time in s (seconds); t3 is the waiting time before and after the test, and is the unit s (seconds); t4 is relay switching waiting time, unit s (seconds); n is the number of test harnesses. It should be understood that, t1 and t2 are the test process time, t3 is the electrical load standard requirement time, and t4 is the switch switching time.
In the scheme provided by the embodiment, the total test time is calculated and displayed on the interactive panel, so that a user can observe the test time conveniently.
The foregoing description of various embodiments is intended to highlight differences between the various embodiments, which may be the same or similar to each other by reference, and is not repeated herein for the sake of brevity.
In one or more embodiments of the application, the method further comprises:
under the condition that the total test time is calculated, calculating the test time of the product to be tested based on the number of test channels in the interactive panel and the single-wire test time corresponding to each test type completed by the second test channel; the second test channel is a test channel for completing at least one test type;
calculating the difference between the total test time and the tested test time to obtain the test residual time;
the total test time is updated with the test remaining time on the interactive panel.
Still referring to the interactive panel of fig. 2, the equation for calculating the test remaining time may be:
Tremaining=Ttotal-
Wherein, ttotal is the total test time, tremaining is the test remaining time, T1 is the open circuit test time, unit s (seconds), T2 is the short circuit test time, unit s (seconds), T3 is the waiting time (including before and after the test), unit s (seconds), T4 is the relay switching waiting time, unit s (seconds), n is the test wire harness number.
According to the scheme provided by the embodiment, the test remaining time is calculated and displayed on the interactive panel, so that a user can conveniently know the test process.
The foregoing description of various embodiments is intended to highlight differences between the various embodiments, which may be the same or similar to each other by reference, and is not repeated herein for the sake of brevity.
In one or more embodiments of the application, the method further comprises:
under the condition of controlling the test of each test type to be executed in turn, calculating single-wire remaining time based on single-wire test time corresponding to each test type and the time of each test type;
and displaying the single line residual time on the interactive panel.
According to the scheme provided by the embodiment, the single line remaining time is calculated and displayed on the interactive panel, so that a user can conveniently know the progress of a test of a certain currently-performed test type.
The foregoing description of various embodiments is intended to highlight differences between the various embodiments, which may be the same or similar to each other by reference, and is not repeated herein for the sake of brevity.
In one or more embodiments of the application, the method further comprises:
and executing the step of controlling the test of each test type to be executed in turn under the condition that the state indication of the test total type to which each test type belongs in the interactive panel allows the test of the test total type to be executed.
By way of example of the interactive panel of fig. 2, the test aggregate type may be an open test or a short test.
In the scheme provided by the embodiment, the occurrence of the situation that the test of the product to be tested is wrong due to the fact that the user misconfigurates the channel configuration information of the test channel can be reduced by setting the test total type.
The foregoing description of various embodiments is intended to highlight differences between the various embodiments, which may be the same or similar to each other by reference, and is not repeated herein for the sake of brevity.
The embodiment of the application also provides a product testing device, as shown in fig. 3, which may include:
the display module 31 is configured to display an interactive panel, where the interactive panel includes configuration components corresponding to each test channel, and each test channel is connected with a test object on a product to be tested in a one-to-one correspondence manner;
the obtaining module 32 is configured to obtain, from the interactive panel, channel configuration information configured by a user for each test channel through the configuration component, where the channel configuration information includes at least one test type, each test type corresponds to a hardware circuit, and the hardware circuit is configured to perform an electrical test for each test type on a test object connected to each test channel;
the control module 33 is configured to control each test channel to test the product to be tested based on the channel configuration information corresponding to each test channel.
In some embodiments, the control module 33 is to:
based on channel configuration information corresponding to each test channel, respectively determining the configured test type of each test channel;
counting the test channels corresponding to each test type;
controlling to execute the test of each test type in turn; and controlling the plurality of test channels to test sequentially for the plurality of test channels corresponding to the same test type.
In some embodiments, the apparatus is further to:
under the condition of controlling the test of each test type to be executed in turn, adjusting the component state of the display component corresponding to each test type and the first test channel in the interactive panel, so that the adjusted component state indicates that the first test channel is executing the test of each test type, and the first test channel is executing the test channel of each test type.
In some embodiments, the apparatus is further to:
responding to the detected signal for starting the test of the product to be tested, and calculating the total test time of the product to be tested based on the single-wire test time corresponding to each test type and the number of test channels comprising each test type;
the total test time is displayed on the interactive panel.
In some embodiments, the apparatus is further to:
under the condition that the total test time is calculated, calculating the test time of the product to be tested based on the number of test channels in the interactive panel and the single-wire test time corresponding to each test type completed by the second test channel; the second test channel is a test channel for completing at least one test type;
calculating the difference between the total test time and the tested test time to obtain the test residual time;
the total test time is updated with the test remaining time on the interactive panel.
In some embodiments, the apparatus is further to:
under the condition of controlling the test of each test type to be executed in turn, calculating single-wire remaining time based on single-wire test time corresponding to each test type and the time of each test type;
and displaying the single line residual time on the interactive panel.
In some embodiments, the apparatus is further to:
and executing the step of controlling the test of each test type to be executed in turn under the condition that the state indication of the test total type to which each test type belongs in the interactive panel allows the test of the test total type to be executed.
The embodiment of the application also provides electronic equipment for executing the product testing method. Referring to fig. 4, a schematic diagram of an electronic device according to some embodiments of the present application is shown. As shown in fig. 4, the electronic device 4 includes: a processor 400, a memory 401, a bus 402 and a communication interface 403, the processor 400, the communication interface 403 and the memory 401 being connected by the bus 402; the memory 401 stores a computer program executable on the processor 400, and the processor 400 executes the product testing method according to any of the foregoing embodiments of the present application when the computer program is executed.
The memory 401 may include a high-speed random access memory (RAM: random Access Memory), and may further include a non-volatile memory (non-volatile memory), such as at least one magnetic disk memory. The communication connection between the device network element and at least one other network element is achieved through at least one communication interface 403 (which may be wired or wireless), the internet, a wide area network, a local network, a metropolitan area network, etc. may be used.
Bus 402 may be an ISA bus, a PCI bus, an EISA bus, or the like. The buses may be classified as address buses, data buses, control buses, etc. The memory 401 is configured to store a program, and the processor 400 executes the program after receiving an execution instruction, and the product testing method disclosed in any of the foregoing embodiments of the present application may be applied to the processor 400 or implemented by the processor 400.
The processor 400 may be an integrated circuit chip with signal processing capabilities. In implementation, the steps of the above method may be performed by integrated logic circuits of hardware in the processor 400 or by instructions in the form of software. The processor 400 may be a general-purpose processor, including a central processing unit (Central Processing Unit, CPU for short), a network processor (Network Processor, NP for short), etc.; but may also be a Digital Signal Processor (DSP), application Specific Integrated Circuit (ASIC), an off-the-shelf programmable gate array (FPGA) or other programmable logic device, discrete gate or transistor logic device, discrete hardware components. The disclosed methods, steps, and logic blocks in the embodiments of the present application may be implemented or performed. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like. The steps of the method disclosed in connection with the embodiments of the present application may be embodied directly in the execution of a hardware decoding processor, or in the execution of a combination of hardware and software modules in a decoding processor. The software modules may be located in a random access memory, flash memory, read only memory, programmable read only memory, or electrically erasable programmable memory, registers, etc. as well known in the art. The storage medium is located in the memory 401, and the processor 400 reads the information in the memory 401, and in combination with its hardware, performs the steps of the above method.
The electronic equipment provided by the embodiment of the application and the product testing method provided by the embodiment of the application have the same beneficial effects as the method adopted, operated or realized by the electronic equipment and the product testing method provided by the embodiment of the application due to the same inventive concept.
The embodiment of the present application further provides a computer readable storage medium corresponding to the product testing method provided in the foregoing embodiment, referring to fig. 5, the computer readable storage medium is shown as an optical disc 30, on which a computer program (i.e. a program product) is stored, where the computer program, when executed by a processor, performs the product testing method provided in any of the foregoing embodiments.
It should be noted that examples of the computer readable storage medium may also include, but are not limited to, a phase change memory (PRAM), a Static Random Access Memory (SRAM), a Dynamic Random Access Memory (DRAM), other types of Random Access Memory (RAM), a Read Only Memory (ROM), an Electrically Erasable Programmable Read Only Memory (EEPROM), a flash memory, or other optical or magnetic storage medium, which will not be described in detail herein.
The computer readable storage medium provided by the above embodiment of the present application has the same advantages as the method adopted, operated or implemented by the application program stored therein, because of the same inventive concept as the product testing method provided by the embodiment of the present application.
It should be noted that:
in the description provided herein, numerous specific details are set forth. However, it is understood that embodiments of the application may be practiced without these specific details. In some instances, well-known structures and techniques have not been shown in detail in order not to obscure an understanding of this description.
Similarly, it should be appreciated that in the above description of exemplary embodiments of the application, various features of the application are sometimes grouped together in a single embodiment, figure, or description thereof for the purpose of streamlining the disclosure and aiding in the understanding of one or more of the various inventive aspects. However, the disclosed method should not be construed as reflecting the following schematic diagram: i.e., the claimed application requires more features than are expressly recited in each claim. Rather, as the following claims reflect, inventive aspects lie in less than all features of a single foregoing disclosed embodiment. Thus, the claims following the detailed description are hereby expressly incorporated into this detailed description, with each claim standing on its own as a separate embodiment of this application.
Furthermore, those skilled in the art will appreciate that while some embodiments described herein include some features but not others included in other embodiments, combinations of features of different embodiments are meant to be within the scope of the application and form different embodiments. For example, in the following claims, any of the claimed embodiments can be used in any combination.
The present application is not limited to the above-mentioned embodiments, and any changes or substitutions that can be easily understood by those skilled in the art within the technical scope of the present application are intended to be included in the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (10)
1. A method of testing a product, comprising:
displaying an interactive panel, wherein the interactive panel comprises configuration components corresponding to all test channels, and all the test channels are connected with test objects on a product to be tested in a one-to-one correspondence manner;
channel configuration information configured by a user on each test channel through the configuration component is obtained from the interactive panel, the channel configuration information comprises at least one test type, each test type corresponds to a hardware circuit, and the hardware circuits are used for carrying out electric test on each test type on test objects connected with each test channel;
and controlling each test channel to test the product to be tested based on the channel configuration information corresponding to each test channel.
2. The method of claim 1, wherein controlling each test channel to test the product under test based on channel configuration information corresponding to the test channel comprises:
based on channel configuration information corresponding to each test channel, respectively determining the configured test type of each test channel;
counting the test channels corresponding to each test type;
controlling to execute the test of each test type in turn; and controlling the plurality of test channels corresponding to the same test type to sequentially test.
3. The method according to claim 2, wherein the method further comprises:
under the condition that the test of each test type is controlled to be executed in sequence, the component states of display components corresponding to each test type and the first test channel in the interactive panel are adjusted, so that the adjusted component states indicate that the first test channel is executing the test of each test type, and the first test channel is the test channel executing each test type.
4. A method according to any one of claims 1-3, wherein the method further comprises:
responding to the signal for starting the test of the product to be tested, and calculating the total test time of the product to be tested based on the single-wire test time corresponding to each test type and the number of test channels comprising each test type;
and displaying the total testing time on the interactive panel.
5. The method according to claim 4, wherein the method further comprises:
under the condition that the total test time is calculated, calculating the test time of the product to be tested based on the number of test channels in the interactive panel and the single-wire test time corresponding to each test type of which the second test channel is completed; the second test channel is a test channel for completing at least one test type;
calculating the difference value between the total test time and the tested test time to obtain the test residual time;
and updating the test total time with the test residual time on the interactive panel.
6. The method according to claim 2, wherein the method further comprises:
under the condition of controlling the test of each test type to be sequentially executed, calculating single-wire remaining time based on single-wire test time corresponding to each test type and the time of each test type;
and displaying the single line residual time on the interactive panel.
7. The method according to claim 2, wherein the method further comprises:
and executing the step of controlling the test of each test type to be executed in turn under the condition that the state of the test total type of each test type in the interactive panel indicates that the test of the test total type is allowed to be executed.
8. A product testing device, comprising:
the display module is used for displaying an interactive panel, the interactive panel comprises configuration components corresponding to all the test channels, and all the test channels are connected with test objects on a product to be tested in a one-to-one correspondence manner;
the system comprises an acquisition module, a configuration module and a configuration module, wherein the acquisition module is used for acquiring channel configuration information configured for each test channel by a user through the configuration component from the interactive panel, the channel configuration information comprises at least one test type, each test type corresponds to a hardware circuit, and the hardware circuit is used for carrying out electric test of each test type on test objects connected with each test channel;
the control module is used for controlling each test channel to test the product to be tested based on the channel configuration information corresponding to each test channel.
9. An electronic device, comprising: a processor and a memory;
the memory is used for storing a computer program;
the processor is configured to execute a program stored in the memory, and implement the product testing method of any one of claims 1 to 7.
10. A computer readable storage medium storing a computer program, wherein the computer program when executed by a processor implements the product testing method of any one of claims 1-7.
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