CN116633480A - Method and device for optimizing optical module - Google Patents
Method and device for optimizing optical module Download PDFInfo
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- CN116633480A CN116633480A CN202310412077.9A CN202310412077A CN116633480A CN 116633480 A CN116633480 A CN 116633480A CN 202310412077 A CN202310412077 A CN 202310412077A CN 116633480 A CN116633480 A CN 116633480A
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Classifications
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04J—MULTIPLEX COMMUNICATION
- H04J14/00—Optical multiplex systems
- H04J14/02—Wavelength-division multiplex systems
- H04J14/0221—Power control, e.g. to keep the total optical power constant
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04J—MULTIPLEX COMMUNICATION
- H04J14/00—Optical multiplex systems
- H04J14/02—Wavelength-division multiplex systems
- H04J14/0201—Add-and-drop multiplexing
- H04J14/0202—Arrangements therefor
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04J—MULTIPLEX COMMUNICATION
- H04J14/00—Optical multiplex systems
- H04J14/02—Wavelength-division multiplex systems
- H04J14/0227—Operation, administration, maintenance or provisioning [OAMP] of WDM networks, e.g. media access, routing or wavelength allocation
Abstract
The invention relates to the technical field of communication, and provides a method and a device for optimizing an optical module. Wherein the method comprises: in an initial state, regulating bias current until actual optical power meets a first preset requirement, regulating TEC voltage until actual wavelength meets a second preset requirement, and taking the regulated TEC voltage as a first TEC voltage; taking the state after the adjustment of the previous round as the initial state of the next round to carry out the next round of iteration; establishing a first relation between bias current and temperature obtained through final adjustment, and a second relation between TEC voltage and temperature obtained through final adjustment; the adjustment is made according to the first relationship and the second relationship. According to the invention, when the adjustment of the bias current and the adjustment of the TEC voltage both affect the optical power and the wavelength, the first relation between the bias current and the temperature and the second relation between the TEC voltage and the wavelength are accurately quantized, so that the optical module can still ensure that the optical power and the wavelength are qualified under the high and low temperature conditions.
Description
Technical Field
The present invention relates to the field of communications technologies, and in particular, to a method and an apparatus for optimizing an optical module.
Background
Dense optical wavelength division multiplexing is a core technology in the field of optical communication, and optical signals with different wavelengths can be transmitted in the same optical fiber through multiplexing, so that the communication bandwidth and the communication capacity can be obviously improved, and the cost can be obviously saved. The current 5G technology has a scheme that the required speed is achieved through a dense optical wavelength division multiplexing module on the basis of the existing link, but the requirements on parameters such as optical power, sensitivity and the like are higher than those of a conventional optical module, in the dense optical wavelength division multiplexing technology, because the wavelength interval between different channels is only 0.8nm, when the wavelength of the channels deviates or the spectrum width is widened, crosstalk between the channels is easily caused, so that the requirements on the wavelength stability and the spectrum width of a signal source are very high, and the wavelength tolerance of the DWDM (Dense Wavelength Division Multiplexing, optical wavelength division multiplexing) optical module in the whole temperature range is only + -0.04nm.
However, in practical applications, although the temperature of the die of the TOSA (Transmitter Optical Subassembly, optical emission assembly) of the optical module can be controlled to be constant by using the TEC, because the die temperature under the control of the TEC (Thermoelectric Cooler, thermoelectric refrigerator) is not strictly constant along with the external temperature, and the temperature brings about stress influence, the optical power, sensitivity and wavelength of the optical signal emitted by the optical module are deviated under the conditions of high temperature and low temperature. In particular, TOSA using TO package has a three-stage structure, so that the laser welding part is more, the optical power and sensitivity are easy TO change under the working condition of industrial temperature, and the wavelength deviation is easy TO exceed the tolerance value of +/-0.04 nm.
In view of this, overcoming the drawbacks of the prior art is a problem to be solved in the art.
Disclosure of Invention
The invention aims to solve the technical problem that the optical power and the wavelength of an optical signal emitted by an optical module deviate under the conditions of high temperature and low temperature, so that the tolerance value is exceeded and the requirements of the optical module cannot be met.
The invention adopts the following technical scheme:
in a first aspect, the present invention provides a method for optimizing an optical module, in which a plurality of iterations are performed under respective high temperature conditions or low temperature conditions, and in each iteration, the method comprises:
in a first initial state, regulating bias current until actual optical power meets a first preset requirement, taking the regulated bias current as the first bias current, regulating TEC voltage until actual wavelength meets a second preset requirement, and taking the regulated TEC voltage as a first TEC voltage;
taking the state after the adjustment of the previous round as a first initial state of the next round, and carrying out the next round of iteration until the actual optical power meets the first preset requirement and the actual wavelength meets the second preset requirement;
taking the finally adjusted first bias current as a target bias current, establishing a first relation between the target bias current and the temperature, taking the finally adjusted first TEC voltage as a target TEC voltage, and establishing a second relation between the target TEC voltage and the temperature; and the bias current is conveniently adjusted according to the first relation, and the TEC voltage is conveniently adjusted according to the second relation.
Preferably, determining the first preset requirement in the next iteration according to the number of the iterations, which is performed in one iteration, specifically includes:
when the number of one iteration is not greater than a first preset number, the first preset requirement is that the difference between the actual optical power and the preset optical power is smaller than a first preset difference;
when the number of one iteration is larger than the first preset number of times and not larger than the second preset number of times, the first preset requirement is that the difference between the actual optical power and the preset optical power is smaller than the second preset difference;
when the number of iterations is greater than a second preset number, the second preset number is that the difference between the actual optical power and the preset optical power is smaller than a third preset difference.
Preferably, the second preset requirement is that the deviation between the actual wavelength and the preset wavelength is within ±0.04 nm.
Preferably, the high temperature condition is in the range of greater than 25 ℃ and equal to or less than 85 ℃, and the low temperature condition is in the range of less than 25 ℃ and equal to or greater than-40 ℃.
In a second aspect, the present invention also provides a method for optimizing an optical module, performing a plurality of rounds of secondary iterations under a corresponding high temperature condition or low temperature condition, wherein in each round of secondary iterations, the method comprises:
In a second initial state, regulating the voff voltage until the actual sensitivity meets a third preset requirement, taking the regulated voff voltage as a first voff voltage, and executing a plurality of rounds of iteration according to any one of claims 1-4 under the condition of the first voff voltage;
if the number of times of performing one iteration is larger than the first preset iteration number, taking the state after the previous round of secondary iteration as a second initial state of the next round, and performing the next round of secondary iteration until the actual sensitivity is adjusted to meet the third preset requirement, wherein the actual light power meets the first preset requirement and the actual wavelength meets the second preset requirement;
establishing a first relation between the target bias current and the temperature by taking the finally-adjusted first bias current as the target bias current, establishing a second relation between the target TEC voltage and the temperature by taking the finally-adjusted first TEC voltage as the target TEC voltage, and establishing a third relation between the target voff voltage and the temperature by taking the finally-adjusted first voff voltage as the target voff voltage; and the bias current is conveniently adjusted according to the first relation, the TEC voltage is adjusted according to the second relation, and the voff voltage is adjusted according to the third relation.
Preferably, determining the third preset requirement in the next round of the second iteration according to the number of rounds of the second iteration, specifically includes:
when the number of the secondary iterations does not exceed a third preset number, the third preset requirement is that the difference between the actual sensitivity and the preset sensitivity is smaller than a fourth preset difference;
when the number of the secondary iterations exceeds a third preset number and does not exceed a fourth preset number, the third preset requirement is that the difference between the actual sensitivity and the preset sensitivity is smaller than a fifth preset difference;
when the number of the second iteration exceeds the fourth preset number and does not exceed the fifth preset number, the third preset requirement is that the difference between the actual sensitivity and the preset sensitivity is smaller than the sixth preset difference.
Preferably, the number of iterations is counted again each time a second iteration is performed.
Preferably, before performing the plurality of rounds of the second iteration, the method further comprises:
under the normal temperature condition, finding out that the actual optical power meets the first preset requirement, the actual wavelength meets the second preset requirement, and the actual sensitivity meets the initial bias current, the initial TEC voltage and the initial voff voltage corresponding to the third preset requirement;
And adjusting the voff voltage to the initial voff voltage, adjusting the bias current to the initial bias current, and adjusting the TEC voltage to the initial TEC voltage to obtain a second initial state of the first round, so as to perform the second iteration of the first round.
Preferably, when the number of the second iteration exceeds the second preset iteration number, the first relationship, the second relationship and the third relationship are established to fail, and the optical module test is failed.
In a third aspect, the present invention further provides a method and an apparatus for optimizing an optical module, for implementing the method for optimizing an optical module according to the first aspect, the apparatus comprising:
at least one processor; and a memory communicatively coupled to the at least one processor; wherein the memory stores instructions executable by the at least one processor for performing the method of optimizing an optical module of the first aspect.
In a fourth aspect, the present invention also provides a non-volatile computer storage medium storing computer-executable instructions for execution by one or more processors to perform the method of optimizing an optical module according to the first aspect.
According to the invention, by performing iterative adjustment for multiple times, when the adjustment of the bias current and the adjustment of the TEC voltage both affect the optical power and the wavelength, the first relation between the bias current and the temperature and the second relation between the TEC voltage and the wavelength can still be accurately quantified, so that a basis is provided for the compensation of the bias current and the TEC voltage under the high-low temperature condition, and the optical module can still ensure that the optical power and the wavelength are qualified under the high-low temperature condition.
Drawings
In order to more clearly illustrate the technical solution of the embodiments of the present invention, the drawings that are required to be used in the embodiments of the present invention will be briefly described below. It is evident that the drawings described below are only some embodiments of the present invention and that other drawings may be obtained from these drawings without inventive effort for a person of ordinary skill in the art.
FIG. 1 is a schematic flow chart of a method for optimizing an optical module according to an embodiment of the present invention;
FIG. 2 is a flow chart of another method for optimizing an optical module according to an embodiment of the present invention;
FIG. 3 is a flow chart of another method for optimizing an optical module according to an embodiment of the present invention;
FIG. 4 is a schematic diagram of a third relationship formed by a method for optimizing an optical module according to an embodiment of the present invention;
FIG. 5 is a schematic diagram of a first relationship formed by a method for optimizing an optical module according to an embodiment of the present invention;
FIG. 6 is a schematic diagram of a second relationship formed by a method of optimizing an optical module according to an embodiment of the present invention;
FIG. 7 is a flowchart of a method for optimizing an optical module according to an embodiment of the present invention;
FIG. 8 is a flow chart of a method for optimizing an optical module according to an embodiment of the present invention;
fig. 9 is a schematic structural diagram of an apparatus for optimizing an optical module according to an embodiment of the present invention.
Detailed Description
The present invention will be described in further detail with reference to the drawings and examples, in order to make the objects, technical solutions and advantages of the present invention more apparent. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the invention.
In addition, the technical features of the embodiments of the present invention described below may be combined with each other as long as they do not collide with each other.
Example 1:
in the prior art, the optical power and wavelength of an optical signal emitted by an optical module deviate under the conditions of high temperature and low temperature, so that the tolerance value is exceeded, and the requirement of the optical module cannot be met, and in view of the problem, the embodiment 1 of the invention provides a method for optimizing the optical module, which comprises the following steps: and performing multiple rounds of iteration under corresponding high-temperature conditions or low-temperature conditions, wherein the high-temperature conditions or the low-temperature conditions refer to ambient temperature and are relative to normal-temperature conditions, under actual application scenes, the normal-temperature conditions can be 25 ℃, the high-temperature conditions are in the range of more than 25 ℃ and less than or equal to 85 ℃, the low-temperature conditions are in the range of less than 25 ℃ and more than or equal to-40 ℃, for example, the high-temperature conditions can be 85 ℃, and the low-temperature conditions can be-40 ℃. Wherein, in each round of iteration, as shown in fig. 1, the method comprises:
In step 201, in a first initial state, the bias current is adjusted until the actual optical power meets a first preset requirement, the adjusted bias current is used as the first bias current, the TEC voltage is adjusted until the actual wavelength meets a second preset requirement, and the adjusted TEC voltage is used as the first TEC voltage.
Wherein, the first preset requirement and the second preset requirement are both obtained by analysis of a person skilled in the art according to the requirements of the optical module. In actual use, the bias current is adjusted to mainly influence the optical power, and has a certain influence on the wavelength, and the TEC voltage is adjusted to mainly influence the wavelength, so that the wavelength is also changed in the process of adjusting the bias current, and the actual wavelength possibly cannot meet the second preset requirement, so that the TEC voltage is adjusted again after the bias current is adjusted until the actual optical power meets the first preset requirement, and the optical power possibly changes in the process of adjusting the TEC voltage, and the actual optical power again cannot meet the first preset requirement after the TEC voltage is adjusted to the first TEC voltage, so that the step 202 is entered for feedback adjustment. And when the actual optical power meets the first preset requirement and the actual wavelength meets the second preset requirement, the bias current is regulated until the actual optical power meets the first preset requirement, and the TEC voltage is regulated until the actual wavelength meets the second preset requirement, the TEC voltage just meets the corresponding requirement through the minimum regulating amplitude. If the bias current is adjusted until the actual optical power meets the first preset requirement, the bias current is adjusted to the minimum extent when the actual optical power does not meet the first preset requirement, and the adjusted actual optical power is not adjusted any more after the adjusted actual optical power just meets the first preset requirement.
In step 202, the adjusted state of the previous round is used as the first initial state of the next round, and the next round of iteration is performed until the actual optical power meets the first preset requirement and the actual wavelength meets the second preset requirement, and the multiple rounds of iteration are finished. When the first round of iteration is performed, the first initial state can be set by a person skilled in the art according to the optical module characteristic analysis, and the initial state meets the first preset requirement of the actual optical power and the second preset requirement of the actual wavelength under the normal temperature condition. The state after the adjustment of the previous round is used as the first initial state of the next round, namely the first bias current of the previous round is used as the bias current before the adjustment of the next round, and the first TEC voltage of the previous round is used as the TEC voltage before the adjustment of the next round.
In step 203, the first bias current obtained by final adjustment is taken as a target bias current, a first relation between the target bias current and the temperature is established, the first TEC voltage obtained by final adjustment is taken as a target TEC voltage, and a second relation between the target TEC voltage and the temperature is established; and the bias current is conveniently adjusted according to the first relation, and the TEC voltage is conveniently adjusted according to the second relation. Step 203 is not included in a plurality of iterations, and step 203 is performed after the end of a plurality of iterations.
The first relation may be a compensation curve of the target bias current with temperature change in an actual usage scenario; the second relationship may be a compensation curve of TEC voltage versus temperature in an actual use scenario. The compensation curves corresponding to the target bias current changing along with the temperature can be found for the high temperature condition and the low temperature condition respectively, and the two compensation curves under the high temperature condition and the low temperature condition are used as a first relation together; similarly, for the high temperature condition and the low temperature condition, compensation curves corresponding to the change of TEC voltage along with the temperature are respectively found, and the two compensation curves under the high temperature condition and the low temperature condition are used as a second relation together.
It should be noted that, in this embodiment, the "previous round" and the "next round" are relative to two adjacent iteration processes, for example, three rounds of iterations have been performed by a certain time, and for convenience of description, these rounds of iterations are referred to as, in time sequence: the first round of iteration, the second round of iteration and the third round of iteration, the first round of iteration is the "last round of iteration" of the second round of iteration, the second round of iteration is the "next round of iteration" of the first round of iteration, the second round of iteration is the "last round of iteration" of the third round of iteration, the third round of iteration is the "next round of iteration" of the second round of iteration.
The final adjusted first bias current is the first bias current adjusted in the last iteration after multiple iterations until the actual optical power meets the first preset requirement and the actual wavelength meets the second preset requirement. If five iterations are performed before the actual optical power meets the first preset requirement and the actual wavelength meets the second preset requirement, the first bias current of the fifth iteration is used as the target bias current, and the first TEC voltage of the fifth iteration is used as the target TEC voltage.
In practical use, there is a specific embodiment of the step 201 and the step 202, as shown in fig. 2, including:
in step 301, in a first initial state, it is determined whether the actual optical power meets a first preset requirement and the actual wavelength meets a second preset requirement.
In step 302, if the actual optical power does not meet the first preset requirement, adjusting the bias current until the actual optical power meets the first preset requirement, and judging whether the actual wavelength meets the second preset requirement after adjustment; if the actual wavelength meets the second preset requirement, the adjusted bias current is taken as the first bias current, the TEC voltage is adjusted until the actual wavelength meets the second preset requirement, and the adjusted TEC voltage is taken as the first TEC voltage; the step 301 is executed again with the adjusted state as the first initial state.
In step 303, if the actual optical power meets the first preset requirement, but the actual wavelength does not meet the second preset requirement, the TEC voltage is adjusted until the actual wavelength meets the second preset requirement, the adjusted TEC voltage is used as the first TEC voltage, and the bias current corresponding to the first initial state is used as the first bias current; the step 301 is executed again with the adjusted state as the first initial state.
In step 304, if it is determined that the actual optical power meets the first preset requirement and the actual wavelength meets the second preset requirement, the iteration is considered to be ended, the bias current corresponding to the first initial state is used as the first bias current, and the TEC voltage corresponding to the first initial state is used as the first TEC voltage.
According to the embodiment, by performing iterative adjustment for multiple times, when the adjustment of the bias current and the adjustment of the TEC voltage both affect the optical power and the wavelength, the first relation between the bias current and the temperature and the second relation between the TEC voltage and the wavelength can still be accurately quantified, so that a basis is provided for the compensation of the bias current and the TEC voltage under the high-low temperature condition, and the optical module can still ensure that the optical power and the wavelength are qualified under the high-low temperature condition.
In an actual application scenario, the first preset requirement may be that a difference between the actual optical power and the preset optical power is smaller than a corresponding preset difference or within a corresponding allowable range, and the second preset requirement may be that a difference between the actual wavelength and the preset wavelength is smaller than a corresponding preset difference or within a corresponding allowable range, where the second preset requirement is that a deviation between the actual wavelength and the preset wavelength is within ±0.04 nm.
In order to further optimize the optical power of the optical module, so that the actual optical power obtained after adjustment is closer to the preset optical power, the embodiment further provides a preferred embodiment, that is, according to the number of rounds of iteration performed, determining a first preset requirement in the next round of iteration, where the method specifically includes: when the number of one iteration is not greater than a first preset number, the first preset requirement is that the difference between the actual optical power and the preset optical power is smaller than a first preset difference; when the number of one iteration is larger than the first preset number of times and not larger than the second preset number of times, the first preset requirement is that the difference between the actual optical power and the preset optical power is smaller than the second preset difference; when the number of iterations is greater than a second preset number, the second preset number is that the difference between the actual optical power and the preset optical power is smaller than a third preset difference.
The first preset times and the second preset times are obtained by the skilled person according to the experience analysis, and the preset optical power, the first preset difference value, the second preset difference value and the third preset difference value are obtained by the skilled person according to the requirement analysis of the optical module. The first preset difference value is smaller than the second preset difference value, and the second preset difference value is smaller than the third preset difference value and is located in the light power qualified range. In actual use, the first preset number of times may be 2, and the second preset number of times may be 4.
In this embodiment, by stepping the first preset requirement, when the number of iterations is smaller, the constraint on the actual optical power is stricter, so that the optical power is as close to the preset optical power as possible, and when the number of iterations is larger, the constraint on the actual optical power is looser, so that both the optical power and the wavelength can be within the corresponding qualified range as much as possible.
Example 2:
in practical use, the high temperature and low temperature conditions not only affect the optical power and the wavelength, but also affect the sensitivity of the optical module, so that the sensitivity cannot meet the requirement of the optical module, and in order to solve this problem, the embodiment further provides, on the basis of embodiment 1, a method for optimizing the optical module, where the method includes: performing a plurality of rounds of secondary iterations under respective high temperature conditions or low temperature conditions, wherein in each round of secondary iterations, as shown in fig. 3, the method comprises:
In step 401, in the second initial state, the voff voltage (reverse bias voltage) is adjusted until the actual sensitivity meets the third preset requirement, the adjusted voff voltage is taken as the first voff voltage, and the multiple rounds of iteration described in embodiment 1 are executed under the condition of the first voff voltage; the process described in step 201 to step 202 in embodiment 1 (step 203 in embodiment 1 is not included) is referred to by the multiple rounds of iteration, and its specific implementation is described in detail in embodiment 1, and is not described herein. The step of adjusting the voff voltage until the actual sensitivity meets the third preset requirement means that the voff voltage is adjusted so that the actual sensitivity just meets the third preset requirement.
The voff voltage is a key parameter affecting the chirp and dispersion of the laser, and has direct influence on the output optical power, chirp, extinction Ratio (ER), dispersion (DP), output optical eye diagram margin (MM), bias current and the like of the laser, and the extinction ratio, dispersion, output optical eye diagram margin, bias current are necessary indexes for evaluating the EML laser and the quality of an optical module, so that whether the voff voltage reasonably and directly affects the quality of the optical module.
The third preset requirement is analyzed by a person skilled in the art according to the requirements of the light module. In practical use, the adjustment of the voff voltage affects the sensitivity and the optical power, but does not affect the wavelength, the adjustment of the bias current affects the optical power mainly, affects the wavelength to a certain extent, has no effect on the sensitivity, but adjusts the TEC voltage affects the wavelength mainly, affects the optical power to a certain extent, and affects no sensitivity, so that the optical power may be changed in the process of adjusting the voff voltage, so that the optical power cannot meet the second preset requirement, and the wavelength is affected when the optical power is adjusted by adjusting the bias current, so that after the voff voltage is adjusted until the actual sensitivity meets the third preset requirement, the adjustment of the optical power and the wavelength is performed through a plurality of iterations (i.e. the number of iterations in the following step 402 is greater than the number of iterations in the first preset), and if the actual optical power meets the first preset requirement and the actual wavelength meets the second preset requirement, the next iteration is performed in the following step 402, so that the optical power is affected.
The condition of the first voff voltage means that, in multiple iterations, the corresponding voff voltages are the first voff voltages, and the bias current and TEC voltage before the corresponding adjustment are changed according to the number of the iterations, and the specific change method is described in embodiment 1 and is not described herein.
In step 402, if the number of iterations is greater than the first preset number of iterations, the state after the previous iteration is used as the second initial state of the next iteration, and the next iteration is performed until the actual sensitivity meets the third preset requirement, the actual optical power meets the first preset requirement, and the actual wavelength meets the second preset requirement, and the multiple iterations are ended.
Wherein, when each time of two iterations is performed, the number of times of one iteration is counted again. The first preset number of iterations is determined by empirical analysis by a person skilled in the art, and is typically greater than the second preset number. When the first round of the second iteration is performed, the second initial state may be set by a person skilled in the art according to the optical module characteristic analysis, where the initial state meets the third preset requirement in the normal temperature condition, the actual sensitivity meets the first preset requirement, and the actual optical power meets the second preset requirement. The state after the above round of secondary iteration is taken as a second initial state of the next round, and specifically comprises the following steps: the first bias current obtained by final adjustment of the previous round is used as the bias current before adjustment of the next round, the first TEC voltage obtained by final adjustment of the previous round is used as the TEC voltage before adjustment of the next round, and the voff voltage of the previous round is used as the voff voltage after adjustment of the next round. The previous and next rounds here are for a second iteration. When the first TEC voltage is brought into one iteration for understanding, the first TEC voltage obtained by the final adjustment of the previous round is the first TEC voltage of the last round of iteration in the previous round of second iteration, and the first bias current obtained by the final adjustment of the previous round is the first bias current of the last round of iteration in the previous round of second iteration.
In step 403, a first relationship between the target bias current and the temperature is established by taking the finally adjusted first bias current as the target bias current, a second relationship between the target TEC voltage and the temperature is established by taking the finally adjusted first TEC voltage as the target TEC voltage, a third relationship between the target voff voltage and the temperature is established by taking the finally adjusted first voff voltage as the target voff voltage; and the bias current is conveniently adjusted according to the first relation, the TEC voltage is adjusted according to the second relation, and the voff voltage is adjusted according to the third relation. Step 403 is not included in the multiple rounds of the second iteration, and step 403 is performed after the multiple rounds of the second iteration are completed.
The third relationship may be a compensation curve of the voff voltage with the temperature change in the actual application scenario. And the compensation curves corresponding to the change of the voff voltage along with the temperature can be found out for the high temperature condition and the low temperature condition respectively, and the two compensation curves under the high temperature condition and the low temperature condition are used as a third relation together.
Through a great deal of experimental tests by those skilled in the art, the sensitivity, the optical power and the wavelength change along with the temperature are unidirectional and linear, for example, the optical power can be gradually increased along with the temperature rise after the module temperature is higher than the normal temperature (such as 25 ℃), and the optical power can be gradually decreased along with the temperature reduction after the module temperature is lower than the normal temperature; that is, the sensitivity, the optical power and the wavelength of the optical module are all in a unitary function relation along with the change of the external temperature, and the parameters (i.e. the slope of the unitary function relation) of the three indexes can be adjusted to be fixed values under the conventional condition, in order to ensure that the sensitivity, the optical power and the wavelength of the optical module are more stable, the setting values of the voff voltage, the bias current and the TEC voltage are divided into two sections along with the change of the external temperature by taking the normal temperature as a demarcation point, under the normal temperature condition, the voff voltage is shown as the fixed value in an AF section in fig. 4, the bias current is shown as the fixed value in an IM section in fig. 5, the TEC voltage is shown as the fixed value in a PT section in fig. 6, and then the compensation curve when the voff voltage is changed along with the change of the ambient temperature, the compensation curve when the bias current is changed along with the change of the ambient temperature and the compensation curve when the TEC voltage is changed along with the change of the ambient temperature are all fitted into straight line forms, and under different temperature conditions, such as shown as the broken lines in fig. 4, 5 and fig. 6.
It should be noted that, unless specifically stated, the "previous round" and "next round" in this embodiment are both relative to two adjacent secondary iteration processes, for example, three rounds of secondary iterations have been performed by a certain time, and for convenience of description, these rounds of secondary iterations are referred to as: the first round of secondary iteration, the second round of secondary iteration and the third round of secondary iteration, the first round of secondary iteration is the 'last round of secondary iteration' of the second round of secondary iteration, the second round of secondary iteration is the 'next round of secondary iteration' of the first round of secondary iteration, the second round of secondary iteration is the 'last round of secondary iteration' of the third round of secondary iteration, and the third round of secondary iteration is the 'next round of secondary iteration' of the second round of secondary iteration.
The final adjusted first voff voltage is the first voff voltage adjusted in the last round of second iteration after multiple rounds of second iteration until the actual sensitivity meets the third preset requirement, the actual optical power meets the first preset requirement and the actual wavelength meets the second preset requirement. If five times of secondary iterations are performed before the actual optical power meets the first preset requirement and the actual wavelength meets the second preset requirement, the first bias current of the fifth time of secondary iterations is used as a target bias current, the first TEC voltage of the fifth time of secondary iterations is used as a target TEC voltage, and the first voff voltage of the fifth time of secondary iterations is used as a target voff voltage.
The target bias current in embodiment 1 is the bias current obtained by final adjustment after multiple iterations until the actual optical power meets the first preset requirement and the actual wavelength meets the second preset requirement, and the bias current needs to be distinguished from the target bias current in the embodiment; similarly, the target TEC voltage in embodiment 1 is the TEC voltage obtained by the final adjustment after multiple iterations until the actual optical power meets the first preset requirement and the actual wavelength meets the second preset requirement, and the corresponding target TEC voltage needs to be distinguished from the target TEC voltage in this embodiment.
The terms "primary" and "secondary" are merely used to refer to different iterative processes, and the terms "primary" and "secondary" are not specifically defined and should not be interpreted as sequential or otherwise having a specifically defined meaning.
In practical use, there is a specific embodiment of the steps 401 and 402, as shown in fig. 7, including:
in step 501, in the second initial state, it is determined whether the actual sensitivity meets the third preset requirement, whether the actual optical power meets the first preset requirement, and whether the actual wavelength meets the second preset requirement.
In step 502, if the actual sensitivity does not meet the third preset requirement, the voff voltage is adjusted until the actual sensitivity meets the third preset requirement, and step 503 is entered; otherwise, step 503 is entered directly.
In step 503, performing a plurality of rounds of iteration until the actual optical power meets the first preset requirement and the actual wavelength meets the second preset requirement, and ending the second iteration; or until the number of iteration rounds is greater than the first preset number of iterations, taking the last adjusted state as the second initial state, and returning to execute step 501.
According to the embodiment, through repeated iterative adjustment, when the adjustment of the voff voltage, the adjustment of the bias current and the adjustment of the TEC voltage have cross influence on the sensitivity, the optical power and the wavelength, the first relation between the bias current and the temperature, the second relation between the TEC voltage and the wavelength and the third relation between the voff voltage and the temperature can be accurately quantified, so that a basis is provided for the compensation of the voff voltage, the bias current and the TEC voltage under the high-low temperature condition, and the optical module can still ensure that the sensitivity, the optical power and the wavelength are qualified under the high-low temperature condition.
In order to further optimize the sensitivity of the optical module, so that the actual sensitivity obtained after adjustment is closer to the preset sensitivity, the embodiment further provides a preferred embodiment, that is, according to the number of rounds of the second iteration, determining a third preset requirement in the next round of the second iteration, where the third preset requirement specifically includes: when the number of the secondary iterations does not exceed a third preset number, the third preset requirement is that the difference between the actual sensitivity and the preset sensitivity is smaller than a fourth preset difference; when the number of the secondary iterations exceeds a third preset number and does not exceed a fourth preset number, the third preset requirement is that the difference between the actual sensitivity and the preset sensitivity is smaller than a fifth preset difference; when the number of the second iteration exceeds the fourth preset number and does not exceed the fifth preset number, the third preset requirement is that the difference between the actual sensitivity and the preset sensitivity is smaller than the sixth preset difference.
And when the number of the second iteration exceeds the second iteration number, ending the second iteration, and considering that the first relation, the second relation and the third relation are failed to be established, wherein the optical module is unqualified. In actual use, the third preset number of times may be 0, the fourth preset number of times may be 1, and the fifth preset number of times may be 2. The second iteration number is obtained by those skilled in the art through empirical analysis, and the second iteration number is generally greater than or equal to a fifth preset number.
The third preset times, the fourth preset times and the fifth preset times are all obtained by the skilled person through empirical analysis, and the preset sensitivity, the fourth preset difference value, the fifth preset difference value and the sixth preset difference value are obtained by the skilled person through analysis according to the requirements of the optical module. The fourth preset difference value is smaller than the fifth preset difference value, and the fifth preset difference value is smaller than the sixth preset difference value and is all located in the qualified sensitivity range.
In this embodiment, by grading the third preset requirement, when the number of the second iterations is smaller, the constraint on the actual sensitivity is stricter, so that the sensitivity is as close to the preset sensitivity as possible, and when the number of the second iterations is larger, the constraint on the actual sensitivity is looser, so that the sensitivity, the optical power and the wavelength can be within the corresponding qualified range as much as possible.
In an actual application scenario, the second initial state can be obtained according to experiments before performing the second iteration, that is, before performing multiple rounds of second iteration, the method further includes: under the normal temperature condition, finding out that the actual optical power meets the first preset requirement, the actual wavelength meets the second preset requirement, and the actual sensitivity meets the initial bias current, the initial TEC voltage and the initial voff voltage corresponding to the third preset requirement; and adjusting the voff voltage to the initial voff voltage, adjusting the bias current to the initial bias current, and adjusting the TEC voltage to the initial TEC voltage to obtain a second initial state of the first round, so as to perform the second iteration of the first round.
Example 3:
the invention is based on the method described in embodiment 1, and combines specific application scenes, and the implementation process in the characteristic scene of the invention is described by means of technical expression in the relevant scene. Taking the optimization process of the sensitivity, the optical power and the wavelength of the corresponding optical module as an example, the method specifically comprises the following steps:
firstly, the requirements of the optical module are analyzed by a person skilled in the art, the sensitivity and the optical power index are respectively divided into three gears, the first gear index requirement is the highest, the third gear index requirement is the lowest, but the index requirement of the module is also met. According to the priority order, the index conditions of the actual light module may exist are as follows:
1. The sensitivity meets the first-grade index, the optical power meets the first-grade index, and the wavelength is qualified.
2. The sensitivity meets the first-grade index, the optical power meets the second-grade index, and the wavelength is qualified.
3. The sensitivity meets the first grade index, the optical power meets the third grade index, and the wavelength is qualified.
4. The sensitivity meets the second grade index, the optical power meets the first grade index, and the wavelength is qualified.
5. The sensitivity meets the second-grade index, the optical power meets the second-grade index, and the wavelength is qualified.
6. The sensitivity meets the second grade index, the optical power meets the third grade index, and the wavelength is qualified.
7. The sensitivity meets the third grade index, the optical power meets the first grade index, and the wavelength is qualified.
8. The sensitivity meets the third grade index, the optical power meets the second grade index, and the wavelength is qualified.
9. The sensitivity meets the third-grade index, the optical power meets the third-grade index, and the wavelength is qualified.
10. The optical module cannot be adjusted to be qualified, and the test of the optical module is not qualified.
The first, second and third gear indexes of the sensitivity can be understood as the third preset requirement in embodiment 2, where the first gear index is that the difference between the actual sensitivity and the preset sensitivity is smaller than the fourth preset difference; the second gear index is that the difference between the actual sensitivity and the preset sensitivity is smaller than a fifth preset difference; the third gear index is that the difference between the actual sensitivity and the preset sensitivity is smaller than a sixth preset difference.
The first, second and third indexes of the optical power may be understood as the first preset requirement in embodiment 1, where the first index is that the difference between the actual optical power and the preset optical power is smaller than the first preset difference; the second gear index is that the difference value between the actual light power and the preset light power is smaller than a second preset difference value; the third gear index is that the difference between the actual light power and the preset light power is smaller than a third preset difference.
And determining a relation curve of the sensitivity, the optical power and the wavelength of the optical modules of the same type along with the change of the external temperature under the normal temperature condition. The initial conditions are shown as AF section in figure 4, IM section in figure 5 and PT section in figure 6, and are fixed values.
After setting each gear of sensitivity and each gear of optical power, when the sensitivity, optical power and wavelength deviation of the module at three temperature points of normal temperature, high temperature and low temperature exceed the normal range according to the feedback result, the single chip machine corrects the compensation curve according to the feedback result, and the specific steps are as follows: at normal temperature (usually 25 ℃), the sensitivity, the optical power and the wavelength of the optical module are qualified when defaulting, and the voff voltage, the bias current and the TEC voltage are initial values, namely a point D in fig. 4, a point K in fig. 5 and a point R in fig. 6, namely a second initial state corresponding to the first round of second iteration in the embodiment 2.
At high temperature, the correction high temperature section compensation curve specifically comprises: and the voff voltage real-time adjustment module judges according to the sensitivity feedback result of the error code meter test, if the sensitivity is qualified, the DF section in the figure 4 is adopted, and if the sensitivity is not qualified, the voff voltage is adjusted and compensated according to the condition of the sensitivity until the sensitivity meets the requirement, and a voff voltage curve after the DE section or the DG section is formed by fitting.
The bias current real-time adjustment module judges according to the optical power feedback result of the power meter test, if the optical power is qualified, the KM segment in fig. 5 is adopted, if the optical power is unqualified, the bias current is adjusted and compensated according to the condition of the optical power until the optical power meets the requirement, and a bias current curve after the KL segment or the KN segment is formed by fitting.
The TEC voltage real-time adjustment module judges according to the wavelength feedback result of the wavelength meter test, if the wavelength is qualified, the RT section in the graph 6 is adopted, if the wavelength is unqualified, the influence of the TEC voltage after modification on the optical power is synchronously considered according to the condition of the wavelength, the influence of the wavelength after bias current adjustment is also calculated, the TEC voltage is adjusted and compensated until the wavelength meets the requirement, and a TEC voltage curve after the RS section or the RU section compensation is formed by fitting.
And after the wavelength is regulated, returning to the position of the optical power real-time regulation module, correcting the offset current compensation curve to KL1 or KN1, entering the position of the wavelength real-time regulation module, confirming whether the wavelength is qualified, finishing the regulation if the wavelength is qualified, and automatically entering the debugging if the wavelength is unqualified.
So far, the optical module finishes redrawing of the temperature compensation curves of three parameters of the high-temperature section and stores the temperature compensation curves in a register.
At low temperature, the low temperature Duan Buchang curve is modified, specifically including: and at low temperature, the voff voltage real-time adjustment module judges according to the sensitivity feedback result of the error code meter test, if the sensitivity is qualified, the DA section in fig. 4 is adopted, and if the sensitivity is not qualified, the voff voltage is adjusted and compensated according to the condition of the sensitivity until the sensitivity meets the requirement, and a voff voltage curve after the DB section or the DC section is formed by fitting.
The bias current real-time adjustment module judges according to the optical power feedback result of the power meter test, if the optical power is qualified, the KI section in the graph 5 is adopted, if the optical power is unqualified, the bias current is adjusted and compensated according to the condition of the optical power until the optical power meets the requirement, and a bias current curve after KH section or KJ section compensation is formed by fitting.
The TEC voltage real-time adjustment module judges according to a wavelength feedback result of the wavelength meter test, if the wavelength is qualified, the RP section in the graph 6 is adopted, if the wavelength is unqualified, according to the condition of the wavelength, the influence of the TEC voltage after modification on the optical power is synchronously considered, the wavelength influence after bias current adjustment is also calculated, the TEC voltage is adjusted and compensated until the wavelength meets the requirement, and a TEC voltage curve after the RO section or the RQ section compensation is formed by fitting; and after the wavelength is regulated, returning to the position of the optical power real-time regulation module, correcting the offset current compensation curve to KH1 or KJ1, entering the position of the wavelength real-time regulation module, confirming whether the wavelength is qualified, finishing the regulation if the wavelength is qualified, and automatically entering the debugging if the wavelength is unqualified. The optical module finishes redrawing the temperature compensation curves of the three parameters of the low-temperature section and stores the temperature compensation curves in the register.
The optical module calls the compensation curve obtained by re-fitting under the corresponding temperature condition through the singlechip, so that stable sensitivity, optical power and wavelength can be obtained.
In the actual execution process, the execution flow of the corresponding fitting to obtain the compensation curve is shown in fig. 8, which specifically includes:
in step 601, it is determined whether the sensitivity satisfies a first-gear index; if not, regulating the voff voltage until the first gear index is met; the second number of debugs (which can be understood as the number of second iterations in example 2) is increased by 1, and step 604 is entered.
In step 602, it is determined whether the sensitivity satisfies the second gear index; if not, regulating the voff voltage until the second gear index is met; the second debug count is incremented by 1 and step 604 is entered.
In step 603, it is determined whether the sensitivity satisfies the third gear index; if not, regulating the voff voltage until a third gear index is met; the second debug count is incremented by 1 and step 604 is entered.
In step 604, it is determined whether the optical power meets a first-gear index; if not, the bias current is adjusted until the first-gear index is satisfied, the first debug count (i.e. the number of iterations in embodiment 1) is increased by 1, and step 607 is entered.
In step 605, it is determined whether the optical power satisfies a second gear index; if not, the bias current is adjusted until the second gear index is satisfied, the first debug frequency is increased by 1, and step 607 is entered.
In step 606, it is determined whether the optical power meets a third gear index; if not, the bias current is adjusted until the third gear index is satisfied, the first debug frequency is increased by 1, and step 607 is entered.
In step 607, it is determined whether the wavelength is acceptable, if not, the TEC voltage is adjusted until the wavelength is acceptable; step 608 is entered; if the TEC voltage is qualified, the debugging is finished, the corresponding TEC voltage is the target TEC voltage, the bias current is the target bias current, and the voff voltage is the target voff voltage; thereby establishing and obtaining a corresponding compensation curve.
In step 608, it is determined whether the first debug count is greater than 6 times (i.e. the first preset iteration count), if so, the first debug count is cleared and recounted, and step 610 is entered; otherwise, go to step 609.
In step 609, it is determined whether the first debug count is greater than 4 times (i.e. the second preset count), if so, step 606 is performed; otherwise, judging whether the first debugging times are greater than 2 times (i.e. the first preset times), if the first debugging times are not greater than 4 times and are greater than 2 times, entering step 605; otherwise, step 604 is entered.
In step 610, it is determined whether the second debug count is greater than 1 (i.e. the fourth preset count), and if the second debug count is not greater than 1, step 602 is entered; otherwise, judging whether the second debugging times are greater than 2 times (namely, fifth preset times), if the second debugging times are greater than 1 time and not greater than 2 times, entering step 603; otherwise, if the second debugging times are more than 2 times, the debugging is finished, a corresponding compensation curve cannot be obtained, and the optical module test is failed. The third preset number of times is 0, and if step 601, step 602 or step 603 is entered, the second debug number of times is greater than 0, so that no additional judgment is needed.
Example 4:
the present invention further provides an apparatus for optimizing an optical module, after providing the method for optimizing an optical module described in embodiment 1 and the method for optimizing an optical module described in embodiment 2, the apparatus comprising:
at least one processor; and a memory communicatively coupled to the at least one processor; wherein the memory stores instructions executable by the at least one processor for performing the method of embodiment 1, embodiment 2, or embodiment 3.
Under a specific use scene, the device comprises a temperature detection module, a sensitivity monitoring module, an optical power monitoring module, a wavelength monitoring module, a voff voltage real-time adjustment module, a bias current real-time adjustment module and a TEC voltage real-time adjustment module, wherein the temperature detection module is used for detecting the external working temperature of the optical module; the sensitivity monitoring module is used for detecting sensitivity deviation of the optical module in a high-low temperature state and feeding back the voff voltage real-time adjustment module; the optical power monitoring module is used for detecting the optical power offset of the optical module in a high-low temperature state and feeding back the offset current real-time adjustment module; the wavelength monitoring module is used for detecting wavelength deviation of the optical module in a high-low temperature state and feeding back the wavelength deviation to the TEC voltage real-time adjustment module; the device comprises a voff voltage real-time adjustment module, a bias current real-time adjustment module and a TEC voltage real-time adjustment module, wherein the voff voltage real-time adjustment module, the bias current real-time adjustment module and the TEC voltage real-time adjustment module are respectively used for sampling the current flowing through the thermistor so as to monitor the ambient temperature in real time, and calculating the voff voltage, the bias current and the TEC voltage in real time according to a temperature compensation curve. And responding to the feedback of the sensitivity, the optical power and the wavelength monitoring module on each parameter at normal temperature, high temperature and low temperature, adjusting the temperature compensation curve in real time, dividing the sensitivity and the optical power into three index gears, and preferentially meeting the better index gears.
Fig. 9 is a schematic diagram of an apparatus for optimizing an optical module according to an embodiment of the present invention. The device for optimizing an optical module of the present embodiment includes one or more processors 21 and a memory 22. In fig. 9, a processor 21 is taken as an example.
The processor 21 and the memory 22 may be connected by a bus or otherwise, which is illustrated in fig. 9 as a bus connection.
The memory 22 is used as a non-volatile computer readable storage medium for storing non-volatile software programs and non-volatile computer executable programs, such as the method of optimizing an optical module in embodiment 1. The processor 21 performs the method of optimizing the optical module by running non-volatile software programs and instructions stored in the memory 22.
The memory 22 may include high-speed random access memory, and may also include non-volatile memory, such as at least one magnetic disk storage device, flash memory device, or other non-volatile solid-state storage device. In some embodiments, memory 22 may optionally include memory located remotely from processor 21, which may be connected to processor 21 via a network. Examples of such networks include, but are not limited to, the internet, intranets, local area networks, mobile communication networks, and combinations thereof.
The program instructions/modules are stored in the memory 22, which when executed by the one or more processors 21, perform the method of optimizing an optical module in embodiment 1 described above.
It should be noted that, because the content of information interaction and execution process between modules and units in the above-mentioned device and system is based on the same concept as the processing method embodiment of the present invention, specific content may be referred to the description in the method embodiment of the present invention, and will not be repeated here.
Those of ordinary skill in the art will appreciate that all or a portion of the steps in the various methods of the embodiments may be implemented by a program that instructs associated hardware, the program may be stored on a computer readable storage medium, the storage medium may include: read Only Memory (ROM), random access Memory (RAM, random Access Memory), magnetic or optical disk, and the like.
The foregoing description of the preferred embodiments of the invention is not intended to be limiting, but rather is intended to cover all modifications, equivalents, and alternatives falling within the spirit and principles of the invention.
Claims (10)
1. A method of optimizing an optical module, wherein a plurality of iterations are performed under respective high or low temperature conditions, the method comprising, in each iteration:
In a first initial state, regulating bias current until actual optical power meets a first preset requirement, taking the regulated bias current as the first bias current, regulating TEC voltage until actual wavelength meets a second preset requirement, and taking the regulated TEC voltage as a first TEC voltage;
taking the state after the adjustment of the previous round as a first initial state of the next round, and carrying out the next round of iteration until the actual optical power meets the first preset requirement and the actual wavelength meets the second preset requirement;
taking the finally adjusted first bias current as a target bias current, establishing a first relation between the target bias current and the temperature, taking the finally adjusted first TEC voltage as a target TEC voltage, and establishing a second relation between the target TEC voltage and the temperature; and the bias current is conveniently adjusted according to the first relation, and the TEC voltage is conveniently adjusted according to the second relation.
2. The method for optimizing an optical module according to claim 1, wherein determining the first preset requirement for the next iteration according to the number of iterations performed, specifically comprises:
when the number of one iteration is not greater than a first preset number, the first preset requirement is that the difference between the actual optical power and the preset optical power is smaller than a first preset difference;
When the number of one iteration is larger than the first preset number of times and not larger than the second preset number of times, the first preset requirement is that the difference between the actual optical power and the preset optical power is smaller than the second preset difference;
when the number of iterations is greater than a second preset number, the second preset number is that the difference between the actual optical power and the preset optical power is smaller than a third preset difference.
3. A method of optimizing an optical module according to claim 1 or 2, characterized in that the second preset requirement is that the deviation between the actual wavelength and the preset wavelength is within ±0.04 nm.
4. The method of optimizing an optical module according to claim 1 or 2, wherein the high temperature condition is in a range of greater than 25 ℃ and equal to or less than 85 ℃ and the low temperature condition is in a range of less than 25 ℃ and equal to or greater than-40 ℃.
5. A method of optimizing an optical module, wherein a plurality of rounds of secondary iterations are performed under respective high or low temperature conditions, the method comprising, in each round of secondary iterations:
in a second initial state, regulating the voff voltage until the actual sensitivity meets a third preset requirement, taking the regulated voff voltage as a first voff voltage, and executing a plurality of rounds of iteration according to any one of claims 1-4 under the condition of the first voff voltage;
If the number of times of performing one iteration is larger than the first preset iteration number, taking the state after the previous round of secondary iteration as a second initial state of the next round, and performing the next round of secondary iteration until the actual sensitivity is adjusted to meet the third preset requirement, wherein the actual light power meets the first preset requirement and the actual wavelength meets the second preset requirement;
establishing a first relation between the target bias current and the temperature by taking the finally-adjusted first bias current as the target bias current, establishing a second relation between the target TEC voltage and the temperature by taking the finally-adjusted first TEC voltage as the target TEC voltage, and establishing a third relation between the target voff voltage and the temperature by taking the finally-adjusted first voff voltage as the target voff voltage; and the bias current is conveniently adjusted according to the first relation, the TEC voltage is adjusted according to the second relation, and the voff voltage is adjusted according to the third relation.
6. The method for optimizing an optical module according to claim 5, wherein determining the third preset requirement for the next round of the second iteration according to the number of rounds in which the second iteration has been performed, specifically comprises:
when the number of the secondary iterations does not exceed a third preset number, the third preset requirement is that the difference between the actual sensitivity and the preset sensitivity is smaller than a fourth preset difference;
When the number of the secondary iterations exceeds a third preset number and does not exceed a fourth preset number, the third preset requirement is that the difference between the actual sensitivity and the preset sensitivity is smaller than a fifth preset difference;
when the number of the second iteration exceeds the fourth preset number and does not exceed the fifth preset number, the third preset requirement is that the difference between the actual sensitivity and the preset sensitivity is smaller than the sixth preset difference.
7. The method of optimizing an optical module of claim 5, wherein the number of iterations is counted again for each two iterations.
8. The method of optimizing an optical module of claim 5, wherein prior to performing the plurality of rounds of two iterations, the method further comprises:
under the normal temperature condition, finding out that the actual optical power meets the first preset requirement, the actual wavelength meets the second preset requirement, and the actual sensitivity meets the initial bias current, the initial TEC voltage and the initial voff voltage corresponding to the third preset requirement;
and adjusting the voff voltage to the initial voff voltage, adjusting the bias current to the initial bias current, and adjusting the TEC voltage to the initial TEC voltage to obtain a second initial state of the first round, so as to perform the second iteration of the first round.
9. The method of optimizing an optical module of claim 5, wherein establishing the first relationship, the second relationship, and the third relationship fails when the number of second iterations exceeds a second preset number of iterations, and wherein the optical module fails the test.
10. An apparatus for optimizing an optical module, the apparatus comprising:
at least one processor; and a memory communicatively coupled to the at least one processor; wherein the memory stores instructions executable by the at least one processor for performing the method of optimizing a light module of any one of 1-4 or the method of optimizing a light module of any one of 5-9.
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