CN116626576A - Probe phase error determining device and method - Google Patents
Probe phase error determining device and method Download PDFInfo
- Publication number
- CN116626576A CN116626576A CN202310914681.1A CN202310914681A CN116626576A CN 116626576 A CN116626576 A CN 116626576A CN 202310914681 A CN202310914681 A CN 202310914681A CN 116626576 A CN116626576 A CN 116626576A
- Authority
- CN
- China
- Prior art keywords
- phase
- probe
- voltage
- current
- signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 title claims abstract description 127
- 238000000034 method Methods 0.000 title claims abstract description 20
- 230000003321 amplification Effects 0.000 claims description 30
- 238000003199 nucleic acid amplification method Methods 0.000 claims description 30
- 239000003990 capacitor Substances 0.000 claims description 24
- 230000015556 catabolic process Effects 0.000 claims description 16
- 230000000903 blocking effect Effects 0.000 claims description 5
- 238000010586 diagram Methods 0.000 description 9
- 238000012937 correction Methods 0.000 description 4
- 230000001939 inductive effect Effects 0.000 description 4
- 239000004973 liquid crystal related substance Substances 0.000 description 4
- 238000012544 monitoring process Methods 0.000 description 3
- 238000010587 phase diagram Methods 0.000 description 3
- 239000000969 carrier Substances 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Amplifiers (AREA)
Abstract
The application discloses a probe phase error determining device and a method, wherein the probe phase error determining device comprises: the signal amplifying module is used for amplifying the target signal to obtain a first target signal when receiving the target signal and outputting the first target signal; the phase output module is used for inputting the first target signal, adjusting the voltage phase and the current phase of the first target signal to be in-phase, and outputting the first current phase and the first voltage phase of the first target signal in-phase; the probe phase error determining module is used for inputting a first current phase and a first voltage phase detected by the probe and determining a detected phase difference between the first current phase and the first voltage phase, wherein the phase difference is the phase error of the probe. The probe phase error determining device disclosed by the application can be used for determining the phase error of the probe for high voltage and high current.
Description
Technical Field
The application relates to the technical field of probes, in particular to a device and a method for determining a phase error of a probe.
Background
In the double pulse test, the voltage probe and the current probe can accurately measure the on-loss and the off-loss of the components only by correcting the phase errors of the voltage probe and the current probe.
The existing phase correction device generally only determines and corrects the phase error for a voltage probe or a current probe which detects low voltage and small current, so that the phase error of the voltage probe or the current probe which needs to detect high voltage and large current cannot be determined, and further the phase error cannot be corrected.
Disclosure of Invention
The application provides a device and a method for determining a phase error of a probe, which are used for solving the problem that the phase error of the probe which needs high voltage and high current cannot be determined.
In order to solve the above technical problem, in a first aspect, the present application provides a probe phase error determining apparatus, including: the signal amplifying module is used for amplifying the target signal to obtain a first target signal when receiving the target signal and outputting the first target signal;
the phase output module is used for inputting the first target signal, adjusting the voltage phase and the current phase of the first target signal to be in-phase, and outputting the first current phase and the first voltage phase of the first target signal in-phase;
the probe phase error determining module is used for inputting a first current phase and a first voltage phase detected by the probe and determining a detected phase difference between the first current phase and the first voltage phase, wherein the phase difference is the phase error of the probe.
Optionally, the phase output module includes: the first capacitor is connected with the signal amplifying module; the first inductor is connected with the first capacitor; and the first resistor is connected with the first inductor.
Optionally, the signal amplifying module includes: the collector electrode of the triode is connected with the phase output module; and the bias circuit is connected with the triode and is used for enabling the triode to work in an avalanche breakdown region.
Optionally, the bias circuit includes: the negative electrode of the power supply is connected with the emitting electrode of the triode; the first bias resistor is connected between the positive electrode of the power supply and the collector electrode of the triode; and the second bias resistor is connected between the emitter of the triode and the base electrode of the triode.
Optionally, the signal amplifying module further includes: and the blocking capacitor is connected with the base electrode of the triode.
Optionally, the number of the signal amplifying modules is at least two; and the collector electrodes of the triodes in the signal amplification modules are connected to the same node.
Optionally, the number of the signal amplifying modules is at least two, and the signal amplifying modules are connected according to a preset sequence; in the two adjacent signal amplifying modules, the collector electrode of the triode of the former signal amplifying module is connected with the emitter electrode of the triode of the latter signal amplifying module.
In a second aspect, the present application provides a probe phase error determining method applied to the probe phase error determining apparatus according to the first aspect, the method comprising:
inputting a target signal to a signal amplification module;
detecting a first voltage of a first resistor in phase and a first current flowing through the first resistor by a probe under the condition that the capacitance reactance of the first capacitor and the inductance reactance of the first inductor are equal;
determining a target phase difference between a first voltage phase detected by a probe and a first current phase, wherein the first voltage phase is the phase of the first voltage, and the first current phase is the phase of the first current;
the target phase difference is determined as a phase error of the probe.
Optionally, the determining the target phase difference between the first voltage phase and the first current phase detected by the probe includes:
determining a first voltage phase point and a first current phase point corresponding to the phase in the phase of the first voltage and the phase of the first current;
and determining the phase difference between the first voltage phase point and the first current phase point as a target phase difference between the first voltage phase and the first current phase detected by the probe.
Optionally, the target phase difference between the first voltage phase and the first current phase detected by the probe includes: determining a second voltage phase point corresponding to the maximum value of the first voltage; determining a second current phase point corresponding to the maximum value of the first current; and determining the phase difference between the second voltage phase point and the second current phase point as a target phase difference between the first voltage phase and the first current phase detected by the probe.
Compared with the prior art, the probe phase error determining device provided by the application has the following beneficial effects:
the signal amplifying module can amplify the low-voltage and low-current target signal into a high-voltage and high-current signal; the phase output module can adjust the phase of the output voltage and the phase of the current so that if the probe has phase errors, the probe detects the in-phase voltage and the in-phase current output by the phase output module, and the phase difference between the detected voltage phase and the detected current phase can be determined as the phase errors of the probe, so that when the phase output module inputs the signals of high voltage and high current output by the signal amplifying module, the determination of the phase errors of the probe for detecting the high voltage and the high current can be realized.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions of the prior art, the drawings that are required in the embodiments or the description of the prior art will be briefly described, and it is apparent that the drawings in the following description are only some embodiments of the present application, but not all embodiments, and other drawings obtained according to these drawings without inventive effort are all within the scope of the present application.
Fig. 1 is a schematic structural diagram of a probe phase error determining device according to an embodiment of the present application.
Fig. 2 is a schematic structural diagram of a phase output module according to an embodiment of the present application.
Fig. 3 is a schematic structural diagram of a signal amplifying module according to an embodiment of the present application.
Fig. 4 is a schematic structural diagram of another signal amplifying module according to an embodiment of the present application.
Fig. 5 is a flowchart of a method for determining a probe phase error according to an embodiment of the present application.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application will be described in further detail with reference to the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the application.
In order that the present disclosure may be more fully described and fully understood, the following description is provided by way of illustration of embodiments and specific examples of the present application; this is not the only form of practicing or implementing the application as embodied. The description covers the features of the embodiments and the method steps and sequences for constructing and operating the embodiments. However, other embodiments may be utilized to achieve the same or equivalent functions and sequences of steps. All other embodiments, which can be made by those skilled in the art based on the embodiments of the application without making any inventive effort, are intended to be within the scope of the application.
It should be noted that the terms "first," "second," and the like in the description and the claims of the present application and the above figures are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used may be interchanged where appropriate such that the embodiments of the application described herein may be implemented in sequences other than those illustrated or otherwise described herein.
In the description of the embodiments of the present application, unless otherwise indicated, "/" means or, for example, a/B may represent a or B; the text "and/or" is merely an association relation describing the associated object, and indicates that three relations may exist, for example, a and/or B may indicate: in addition, in the description of the embodiments of the present application, "plural" means two or more, and other words and the like, it is to be understood that the preferred embodiments described herein are for illustration and explanation of the present application only, and are not intended to limit the present application, and embodiments of the present application and features in the embodiments may be combined with each other without conflict.
Example 1
Fig. 1 is a schematic structural diagram of a probe phase error determining apparatus 100 according to an embodiment of the present application, where the probe phase error determining apparatus 100 includes: the signal amplifying module 110 is configured to amplify a target signal to obtain a first target signal when receiving the target signal, and output the first target signal;
a phase output module 120, configured to input the first target signal, adjust a voltage phase and a current phase of the first target signal to be in phase, and output a first current phase and a first voltage phase of the first target signal to be in phase;
the probe phase error determining module 130 is configured to input a first current phase and a first voltage phase detected by a probe, and determine a detected phase difference between the first current phase and the first voltage phase, where the phase difference is a phase error of the probe.
Specifically, the target signal may be a pulse signal or a non-pulse signal, and the pulse signal may be a square wave pulse, a sine wave pulse, a triangular wave pulse, or the like, which is not particularly limited herein.
Specifically, the target signal may be generated by a signal generator and sent to the signal amplifying module 110, for example, the signal generator may be a pulse signal generator when the target signal is a pulse signal; further, the target signal may be sent to the signal amplifying module 110 by a wireless transmission method, or the target signal may be sent to the signal amplifying module 110 by a wired method when the signal generator is connected to the signal amplifying module 110 by a wired method, which is not limited herein.
It should be noted that, the amplification factor of the first target signal compared to the target signal may be controlled by the parameter setting of the signal amplifying module 110, and the specific parameter may be determined according to the specific circuit structure of the signal amplifying module 110 designed by one skilled in the relevant art in application.
It is understood that the signal amplifying module 110 may be any circuit module that can perform a signal amplifying function, such as a dc coupled amplifying circuit, a capacitive coupled amplifying circuit, or a transformer coupled amplifying circuit.
It is understood that the phase output module 120 may be any circuit module that makes the current phase and the voltage phase of the input first target signal in phase. For example, the phase output module 120 may include a controller, a phase adjustment module, and a phase monitoring module, where the phase output module 120 may monitor a current phase and a voltage phase of the first target signal through the phase monitoring module, and may determine a phase error of the current phase and the voltage phase through the controller, and further the controller may control the phase adjustment circuit to adjust the current phase and the voltage phase of the first target signal according to the phase error until the current phase and the voltage phase of the first target signal monitored by the phase monitoring module are the same; the phase output module 120 may also be a series resonant circuit, so that when the series resonant circuit reaches a resonant state, the current phase and the voltage phase of the first target signal output by the resonant circuit are in phase.
It will be appreciated that the probe may comprise a voltage probe and a current probe, the voltage probe may be used to detect a voltage phase and the current probe may be used to detect a current phase, wherein the voltage probe may be any probe that may be used to detect a voltage and the current probe may be any probe that may be used to detect a current.
It is understood that the probe phase error determination module 130 may be any functional module that may be used to determine the phase difference between the current phase and the voltage phase detected by the probe. For example, the probe phase error determining module 130 may be a device capable of displaying a voltage phase and a current phase, such as an oscilloscope, so that a phase difference between the voltage phase and the current phase may be determined by naked eyes; the probe phase error determination module 130 may also be a calculation module that may be designed as a module that calculates the input voltage phase and current phase errors.
Thus, the signal amplification module 110 can amplify the low-voltage and low-current target signal into a high-voltage and high-current signal; the phase output module 120 can adjust the phase of the output voltage and the phase of the current so that if the probe has a phase error, the probe detects the in-phase voltage and the in-phase current output by the phase output module 120, and the detected phase difference between the voltage phase and the current phase can be determined as the phase error of the probe, so when the phase output module 120 inputs the high-voltage and high-current signals output by the signal amplifying module 110, the determination of the phase error of the probe for detecting the high-voltage and high-current signals can be realized.
In an alternative implementation manner, as shown in fig. 2, a schematic structural diagram of a phase output module 120 according to an embodiment of the present application is shown, where the phase output module 120 includes: a first capacitor 121 connected to the signal amplifying module 110; a first inductor 122 connected to the first capacitor 121; the first resistor 123 is connected to the first inductor 122.
It will be appreciated that the first resistor 123 may be grounded (the ground point is indicated by GND in fig. 2), so that there is a potential difference between the input and output terminals of the phase output module 120, and thus the phase output module 120 may operate normally.
Specifically, the first capacitor 121 may receive the first target signal output by the signal amplifying module 110 by being connected to the signal amplifying module 110.
It may be understood that when the capacitive reactance of the first capacitor 121 is equal to the inductive reactance of the first inductor 122, the phase output module 120 reaches a resonant state, and the phase output module 120 may output, through the first resistor 123, a first current phase and a first voltage phase of the in-phase first target signal, where the first current phase is a phase of a current flowing through the first resistor 123, and the first voltage phase is a phase of a voltage across the first resistor 123.
It will be appreciated that the specific values of the first capacitor 121 and the first inductor 122 may be based on the bandwidth of the probeAnd (5) setting. Specifically, the bandwidth of the probe needs to be equal to the resonant frequency of the phase output module 120, whichThe following equation (1) may be used to obtain the result, and thus the resonance frequency of the phase output module 120 may be changed by changing the capacitance value of the first capacitor 121 and/or the inductance value of the first inductor 122, so that the resonance frequency is adapted to the bandwidth of the probe.
； （1）
Wherein, the liquid crystal display device comprises a liquid crystal display device,for the inductance value of the first inductance 122, +.>Is the capacitance value of the first capacitor 121.
It will be appreciated that the resistance of the first resistor 123 may not be set too small, when the phase output module 120 is operating in the resonant state, i.e. the capacitive reactance of the first capacitor 121 is equal to the inductive reactance of the first inductor 122, the impedance of the phase output module 120As can be seen from the following formula (2), when the phase output module 120 is in the resonant state, the impedance of the phase output module 120 is equal to the resistance value of the first resistor 123, so that the first current output by the phase output module 120 is equal to the current value of the first target signal, and the ratio of the first voltage output by the phase output module 120 to the voltage value of the first target signal is the resistance value of the first resistor 123, so that the resistance value of the first resistor 123 cannot be too small to avoid the problem that the voltage values at both ends of the first resistor 123 detected by the probe are not high enough due to the too small resistance value, and the resistance value of the first resistor 123 can be detected by a person skilled in the relevant artThe operator makes specific settings at the time of application.
； （2）
Wherein, the liquid crystal display device comprises a liquid crystal display device,for the impedance of the phase output module 120, +.>Is the resistance value of the first resistor 123 +.>Inductive reactance of the first inductance 122, +.>Is the capacitive reactance of the first capacitor 121.
In this way, the in-phase current and voltage are output through the phase output module 120, so that when the probe detects the in-phase current and voltage, the phase error of the probe can be intuitively and conveniently determined through the detected phase difference between the voltage and the current. In addition, the phase output module 120 includes a capacitor, an inductor and a resistor, so that the phase output module 120 needs fewer elements, and thus the phase output module 120 has smaller volume and lower cost.
In an alternative implementation manner, as shown in fig. 3, a schematic structural diagram of a signal amplifying module 110 provided in an embodiment of the present application, the signal amplifying module 110 (as shown in B1 in fig. 3) includes: a triode 111 (shown as Q1 in fig. 3), wherein a collector of the triode 111 is connected with the phase output module 120; and a bias circuit 112 connected to the triode 111 for operating the triode 111 in an avalanche breakdown region.
Specifically, the bias circuit 112 may be any circuit that operates the transistor 111 in an avalanche breakdown region. For example, the bias circuit 112 may be a high-voltage dc power supply connected between the collector and the emitter of the triode 111, so that the depletion layer of the collector junction of the triode 111 is under a strong electric field, at this time, the base electrode of the triode 111 inputs a target signal, so that when the current Ib flowing through the base junction of the triode 111 is smaller than 0, the base junction is reversely biased, and further the carriers are rapidly accelerated under the action of the strong electric field of the collector and emitter, and obtain larger energy, so as to generate a new hole-electron pair, and the newly generated carriers continue to collide and ionize, so as to generate avalanche growth, so that the triode 111 works in an avalanche breakdown region, the collector current of the triode 111 is rapidly increased, and a first target signal (voltage and current are larger) with larger instantaneous pulse power is emitted; for another example, a bias resistor may be connected between the high voltage power supply and the transistor 111 to control the voltage between the collector and emitter of the transistor 111 so that the transistor 111 may operate in an avalanche breakdown region.
Thus, by operating the triode 111 in the avalanche breakdown region, a signal with a larger voltage and current can be obtained, and compared with a signal with a larger voltage and a higher current obtained by other methods, the use of the triode makes the signal amplification module 110 smaller in size and lower in cost; and the mode of making the triode work in the avalanche breakdown region and then generating the signal with large voltage and high current has no strict requirement on the input signal amplitude of the signal amplifying module 110, so that the process of generating the signal with large voltage and high current is easier to realize.
In an alternative implementation, as shown in fig. 3, the bias circuit 112 includes: a power source 1121, wherein a negative electrode (shown as a ground GND in fig. 3) of the power source 1121 is connected to an emitter of the triode 111; a first bias resistor 1122 (shown as R1 in fig. 3) connected between the positive electrode of the power source 1121 (shown as VCC in fig. 3) and the collector of the transistor 111; a second bias resistor 1123 (shown as R2 in fig. 3) is connected between the emitter of the transistor 111 and the base of the transistor 111.
It will be appreciated that the first bias resistor 1122 may be used to regulate the voltage between the collector and emitter and thus may be used to control the operation of the transistor 111 in the avalanche breakdown region, so the resistance value of the first bias resistor 1122 may be adapted according to the voltage of the selected power source 1121 so that the transistor 111 operates in the avalanche breakdown region.
It will be appreciated that the second bias resistor 1123 may be used to adjust the magnitude of the current flowing through the base junction such that the transistor 111 operates IN the avalanche breakdown region, and the current of the base junction is generated by the input target signal (as shown IN fig. 3 IN 1), so that the specific resistance value of the second bias resistor 1123 may be adapted to the input target signal, as determined by the choice of the target signal IN the specific application.
In this way, the bias circuit 112 can make the triode 111 work in the avalanche breakdown zone by including the power supply 1121, the first bias resistor 1122 and the second bias resistor 1123, and can make the triode 111 work in the avalanche breakdown zone without changing the power supply 1121 and the target signal by regulating the resistance values of the first bias resistor 1122 and the second bias resistor 1123, so that the bias circuit 112 is easier to realize; and because the bias circuit 112 has fewer and more readily available components, the bias circuit 112 is smaller and less costly.
In an alternative implementation, as shown in fig. 3, the signal amplifying module 110 further includes: and a blocking capacitor 113 connected to the base of the triode 111.
It can be appreciated that when the input target signal is an ac signal, the blocking capacitor 113 can block the input target signal, so as to accelerate the turn-off of the triode 111, and avoid the triode 111 from being overheated and damaged due to long-time operation of the triode 111 in the avalanche breakdown region.
In an alternative implementation, the number of the signal amplifying modules 110 is at least two; the collectors of the transistors 111 in each of the signal amplification modules 110 are connected to the same node.
It will be appreciated that the collectors of the transistors 111 in each of the signal amplification modules 110 are connected to the same node, and each of the signal amplification modules 110 may be connected in parallel.
Note that, the junction point after the collector connection of each transistor 111 may be used as a signal output point of the signal amplifying module 110, and the signal output point may be connected to the phase output module 120, and the signal of the signal amplifying module 110 connected in parallel may be input to the phase output module 120.
Thus, by connecting the signal amplification modules 110 in parallel, the current of the signal output from the signal amplification module 110 can be increased.
As a specific example of this implementation manner, as shown IN fig. 4, a schematic structural diagram of another signal amplifying module 110 provided by the embodiment of the present application is shown, IN fig. 4, a circuit structure diagram of two signal amplifying modules 110 connected IN parallel is shown, IN fig. 4, B1 and B2 are respectively two signal amplifying modules, IN which Q1 and Q2 are respectively transistors 111 included IN B1 and B2, VCC and GND IN B1 and B2 are respectively anodes and cathodes of a power source 1121 included IN B1 and B2, R1 and R2 are bias resistors of B1, for making Q1 operate IN an avalanche breakdown region, R5 and R6 are bias resistors of B2, for making Q2 operate IN an avalanche breakdown region, C2 and C3 are respectively blocking capacitors 113 of B1 and B2, and IN2 are respectively two paths of target signals input by B1 and B2.
In an alternative implementation manner, the number of the signal amplifying modules 110 is at least two, and the signal amplifying modules 110 are connected according to a preset sequence; in two adjacent signal amplifying modules 110, the collector of the triode 111 of the former signal amplifying module 110 is connected with the emitter of the triode 111 of the latter signal amplifying module 110.
It can be appreciated that by connecting the collector of the transistor 111 of the former signal amplification module 110 to the emitter of the transistor 111 of the latter signal amplification module 110 in adjacent two signal amplification modules 110, the plurality of signal amplification modules 110 connected to each other can be connected in series.
It will be appreciated that the signal amplification modules 110 are connected in a predetermined sequence, which may be any sequence, and may be specifically set according to the specific needs of the application.
After the signal amplification modules 110 connected in series are connected in series, the base of the triode 111 connected in series in the signal amplification module 110 at the head end may be used as the input end of the target signal, and the collector of the triode 111 connected in series in the signal amplification module 110 at the tail end may be used as the output end of the amplified target signal.
Thus, by connecting the signal amplification modules 110 in series, the voltage of the signal output from the signal amplification module 110 can be increased.
Alternatively, it will be appreciated that multiple signal amplification modules 110 in series may be connected in parallel, or multiple signal amplification modules 110 in parallel may be connected in series, if it is desired to increase both the voltage and current of the signal output by the signal amplification modules 110 at the same time as the particular application.
Example 2
As shown in fig. 5, a flowchart of a method for determining a probe phase error according to an embodiment of the present application is provided, where the method is applied to a device for determining a probe phase error according to an embodiment of the present application, and includes:
step S101, inputting the target signal to the signal amplifying module 110.
Specifically, the target signal may be a pulse signal or a non-pulse signal, and the pulse signal may be a square wave pulse, a sine wave pulse, a triangular wave pulse, or the like, which is not particularly limited herein.
Specifically, the target signal may be generated by a signal generator and sent to the signal amplifying module 110, for example, the signal generator may be a pulse signal generator when the target signal is a pulse signal.
Step S102, when the capacitance of the first capacitor 121 and the inductance of the first inductor 122 are equal, the probe detects the first voltage of the in-phase first resistor 123 and the first current flowing through the first resistor 123.
It will be appreciated that the impedance of the series resonant circuit can be obtained by the above formula (2), so that when the capacitance reactance of the first capacitor 121 and the inductance reactance of the first inductor 122 are equal (i.e. when the series resonant circuit is in a resonant state), the first voltage across the first resistor 123 and the first current flowing through the first resistor can be obtained by the formula (2) in phase.
As can be understood, since the impedance of the series resonant circuit is the impedance of the first resistor 123 when in the resonant state as known by the formula (2), the phase of the first voltage of the first resistor 123 overlaps with the phase of the first current, and at a certain phase, the magnitude value of the first voltage is a multiple of the magnitude value of the first current, which is the resistance value of the first resistor 123.
Step S103: a target phase difference of the first voltage phase detected by the probe and the first current phase is determined.
The first voltage phase is a phase of the first voltage, and the first current phase is a phase of the first current.
It is further understood that when the probe has a phase error, the probe detects the in-phase first voltage and the in-phase first current, so that the in-phase first voltage and the in-phase first current have a phase non-overlapping phenomenon, and a phase difference of the phase non-overlapping of the first voltage and the phase of the first current can be determined.
Step S104: the target phase difference is determined as a phase error of the probe.
The phase error of the probe in this step may be a phase error of the voltage probe or a phase error of the current probe, and the phase error of the probe in this step may be a relative error, the phase error of the voltage probe may be a relative error with respect to the phase error of the current probe, and the phase error of the current probe may be a relative error with respect to the phase error of the voltage probe.
Thus, by inputting the target signal to the signal amplifying module 110, when the capacitive reactance of the first capacitor 121 and the inductive reactance of the first inductor 122 are equal, the first voltage of the first resistor 123 in phase and the first current flowing through the first resistor 123 are detected by the probe, and the target phase difference between the first voltage phase detected by the probe and the first current phase is determined, wherein the first voltage phase is the phase of the first voltage, the first current phase is the phase of the first current, and the target phase difference is determined as the phase error of the probe, so that the phase error of the probe can be determined, and the phase error of the probe can be corrected, so that the probe works normally.
In an alternative implementation, step S103 includes: determining a first voltage phase point and a first current phase point corresponding to the phase in the phase of the first voltage and the phase of the first current;
and determining the phase difference between the first voltage phase point and the first current phase point as a target phase difference between the first voltage phase and the first current phase detected by the probe.
It is understood that the first voltage phase point and the first current phase point, which correspond to the phases, may be regarded as points, which correspond to the first voltage variation trend and the first current amplitude variation trend. For example, the first voltage phase point may be a phase point corresponding to a minimum first voltage value, and the first current phase point may be a phase point corresponding to a minimum first current value.
Thus, the phase error of the probe can be determined by the phase of the first voltage and the phase of the first current detected by the probe.
In an alternative implementation, step S103 includes: determining a second voltage phase point corresponding to the maximum value of the first voltage;
determining a second current phase point corresponding to the maximum value of the first current;
and determining the phase difference between the second voltage phase point and the second current phase point as a target phase difference between the first voltage phase and the first current phase detected by the probe.
In this way, the way the probe phase error is determined by the first voltage maximum and the first current maximum makes it easier to determine the probe phase error, since the maximum of the first voltage and the maximum of the first current are easier to find.
In an alternative implementation, after step S104, the method further includes: and carrying out phase correction on the probe according to the target phase difference.
Specifically, the manner of phase correction of the probe in the present implementation may be any manner that can perform phase correction of the probe in the related art. For example, the probe may be manually corrected, or the probe may be automatically corrected, where when the probe is manually corrected, the probe may be connected to the display end, and further, the probe is continuously manually corrected through the phase diagram of the first voltage and the phase diagram of the first current, which are detected by the probe and displayed by the display end, until the phase diagrams of the first voltage and the first current, which are displayed by the display end, coincide; when the probe is automatically calibrated, the controller can control the calibration device to calibrate the probe according to the phase error until the phase error determined by the probe phase error determination device 100 is smaller than a preset error threshold.
It will be apparent to those skilled in the art that various modifications and variations can be made to the present application without departing from the spirit or scope of the application. Thus, it is intended that the present application also include such modifications and alterations insofar as they come within the scope of the appended claims or the equivalents thereof.
Claims (10)
1. A probe phase error determination apparatus, comprising:
the signal amplifying module is used for amplifying the target signal to obtain a first target signal when receiving the target signal and outputting the first target signal;
the phase output module is used for inputting the first target signal, adjusting the voltage phase and the current phase of the first target signal to be in-phase, and outputting the first current phase and the first voltage phase of the first target signal in-phase;
the probe phase error determining module is used for inputting a first current phase and a first voltage phase detected by the probe and determining a detected phase difference between the first current phase and the first voltage phase, wherein the phase difference is the phase error of the probe.
2. The probe phase error determination apparatus according to claim 1, wherein the phase output module includes:
the first capacitor is connected with the signal amplifying module;
the first inductor is connected with the first capacitor;
and the first resistor is connected with the first inductor.
3. The probe phase error determination apparatus according to claim 1, wherein the signal amplification module includes:
the collector electrode of the triode is connected with the phase output module;
and the bias circuit is connected with the triode and is used for enabling the triode to work in an avalanche breakdown region.
4. A probe phase error determination apparatus according to claim 3, wherein the bias circuit comprises:
the negative electrode of the power supply is connected with the emitting electrode of the triode;
the first bias resistor is connected between the positive electrode of the power supply and the collector electrode of the triode;
and the second bias resistor is connected between the emitter of the triode and the base electrode of the triode.
5. The probe phase error determination apparatus of claim 3 wherein the signal amplification module further comprises: and the blocking capacitor is connected with the base electrode of the triode.
6. A probe phase error determination apparatus according to claim 3, wherein the number of signal amplification modules is at least two;
and the collector electrodes of the triodes in the signal amplification modules are connected to the same node.
7. The probe phase error determination apparatus according to claim 3, wherein the number of the signal amplification modules is at least two, and the signal amplification modules are connected in a preset order;
in the two adjacent signal amplifying modules, the collector electrode of the triode of the former signal amplifying module is connected with the emitter electrode of the triode of the latter signal amplifying module.
8. A probe phase error determination method applied to the probe phase error determination device according to claims 1 to 7, comprising:
inputting a target signal to a signal amplification module;
detecting a first voltage of a first resistor in phase and a first current flowing through the first resistor by a probe under the condition that the capacitance reactance of the first capacitor and the inductance reactance of the first inductor are equal;
determining a target phase difference between a first voltage phase detected by a probe and a first current phase, wherein the first voltage phase is the phase of the first voltage, and the first current phase is the phase of the first current;
the target phase difference is determined as a phase error of the probe.
9. The method of determining a phase error of a probe of claim 8, wherein determining a target phase difference of a first voltage phase and a first current phase detected by the probe comprises:
determining a first voltage phase point and a first current phase point corresponding to the phase in the phase of the first voltage and the phase of the first current;
and determining the phase difference between the first voltage phase point and the first current phase point as a target phase difference between the first voltage phase and the first current phase detected by the probe.
10. The method of claim 8, wherein the target phase difference between the first voltage phase and the first current phase detected by the probe comprises:
determining a second voltage phase point corresponding to the maximum value of the first voltage;
determining a second current phase point corresponding to the maximum value of the first current;
and determining the phase difference between the second voltage phase point and the second current phase point as a target phase difference between the first voltage phase and the first current phase detected by the probe.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310914681.1A CN116626576B (en) | 2023-07-25 | 2023-07-25 | Probe phase error determining device and method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310914681.1A CN116626576B (en) | 2023-07-25 | 2023-07-25 | Probe phase error determining device and method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN116626576A true CN116626576A (en) | 2023-08-22 |
| CN116626576B CN116626576B (en) | 2023-11-07 |
Family
ID=87603055
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202310914681.1A Active CN116626576B (en) | 2023-07-25 | 2023-07-25 | Probe phase error determining device and method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN116626576B (en) |
Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001091552A (en) * | 1999-09-22 | 2001-04-06 | Hioki Ee Corp | Method for correcting phase difference in circuit element measuring device |
| CN1627087A (en) * | 2003-12-04 | 2005-06-15 | 阿克塔里斯英国有限公司 | Electric power meter |
| CN104135265A (en) * | 2014-08-07 | 2014-11-05 | 金陵科技学院 | Design method of inductive load driving circuit and circuit thereof |
| CN104360298A (en) * | 2014-11-12 | 2015-02-18 | 国家电网公司 | Performance test system and method for merging unit tester |
| KR101547266B1 (en) * | 2014-05-15 | 2015-08-25 | 전자부품연구원 | Apparatus and method for correcting phase between voltage and current signal of power meter and the power meter using the same |
| CN204681320U (en) * | 2015-04-28 | 2015-09-30 | 常州市东升检测仪器有限公司 | Opto-electronic receiver amplifying circuit |
| CN105372611A (en) * | 2015-11-27 | 2016-03-02 | 许昌许继软件技术有限公司 | Reliability verification method for SV data acquired based on wave recording device |
| KR101681288B1 (en) * | 2015-07-13 | 2016-11-29 | 엘에스산전 주식회사 | Method for error calibration of electric power device |
| CN107884737A (en) * | 2017-11-13 | 2018-04-06 | 国网福建省电力有限公司 | The live capacitive apparatus on-line monitoring check system and method for wireless high-precise synchronization |
| CN109391047A (en) * | 2017-08-10 | 2019-02-26 | 现代自动车株式会社 | Foreign matter detecting method, wireless power transmission and control device |
| CN111521965A (en) * | 2020-05-08 | 2020-08-11 | 广东电网有限责任公司电力科学研究院 | Transformer bushing dielectric loss detection device correction system and method |
| CN114062763A (en) * | 2021-11-18 | 2022-02-18 | 浙江天正电气股份有限公司 | Mutual inductor assembly and implementation method and use method thereof without secondary calibration |
-
2023
- 2023-07-25 CN CN202310914681.1A patent/CN116626576B/en active Active
Patent Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001091552A (en) * | 1999-09-22 | 2001-04-06 | Hioki Ee Corp | Method for correcting phase difference in circuit element measuring device |
| CN1627087A (en) * | 2003-12-04 | 2005-06-15 | 阿克塔里斯英国有限公司 | Electric power meter |
| KR101547266B1 (en) * | 2014-05-15 | 2015-08-25 | 전자부품연구원 | Apparatus and method for correcting phase between voltage and current signal of power meter and the power meter using the same |
| CN104135265A (en) * | 2014-08-07 | 2014-11-05 | 金陵科技学院 | Design method of inductive load driving circuit and circuit thereof |
| CN104360298A (en) * | 2014-11-12 | 2015-02-18 | 国家电网公司 | Performance test system and method for merging unit tester |
| CN204681320U (en) * | 2015-04-28 | 2015-09-30 | 常州市东升检测仪器有限公司 | Opto-electronic receiver amplifying circuit |
| KR101681288B1 (en) * | 2015-07-13 | 2016-11-29 | 엘에스산전 주식회사 | Method for error calibration of electric power device |
| CN105372611A (en) * | 2015-11-27 | 2016-03-02 | 许昌许继软件技术有限公司 | Reliability verification method for SV data acquired based on wave recording device |
| CN109391047A (en) * | 2017-08-10 | 2019-02-26 | 现代自动车株式会社 | Foreign matter detecting method, wireless power transmission and control device |
| CN107884737A (en) * | 2017-11-13 | 2018-04-06 | 国网福建省电力有限公司 | The live capacitive apparatus on-line monitoring check system and method for wireless high-precise synchronization |
| CN111521965A (en) * | 2020-05-08 | 2020-08-11 | 广东电网有限责任公司电力科学研究院 | Transformer bushing dielectric loss detection device correction system and method |
| CN114062763A (en) * | 2021-11-18 | 2022-02-18 | 浙江天正电气股份有限公司 | Mutual inductor assembly and implementation method and use method thereof without secondary calibration |
Also Published As
| Publication number | Publication date |
|---|---|
| CN116626576B (en) | 2023-11-07 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4126137A (en) | Electrosurgical unit | |
| JP5731879B2 (en) | Static elimination device and static elimination control method | |
| CN103513191B (en) | Power source loads proving installation | |
| US9648719B2 (en) | High-frequency power supply device | |
| CN103777047B (en) | Source of resistance range adjustment equipment and method | |
| TWI511437B (en) | Detection device for power component driver and detection method thereof | |
| CN116626576B (en) | Probe phase error determining device and method | |
| CN112532198B (en) | Radio frequency ion source impedance matching method and device | |
| EP2899549A1 (en) | Active shunt source-measure unit (SMU) circuit | |
| CN107124148A (en) | One kind control circuit, biasing circuit and control method | |
| CN114796872A (en) | Method for modulating Pulse Width Modulation (PWM) waves of pulse magnetic therapeutic apparatus | |
| CN107535019A (en) | For the method for the power control circuit for calibrating induced cooking utensils | |
| JP6184436B2 (en) | Power circuit for driving creeping discharge elements | |
| US20120069485A1 (en) | Method and device for automatic positive and negative ion balance control in a bipolar ion generator | |
| US20180131280A1 (en) | Power source apparatus | |
| US11469742B2 (en) | Waveform generator | |
| US2611861A (en) | Amplitude comparison circuit | |
| CN103199809B (en) | A kind of in-phase bipolar high-voltage proportional amplification circuit | |
| CN118041460A (en) | Radio frequency energy generating device and calibration method | |
| KR101517176B1 (en) | Triangle- Wave Generate Device of capabling a Frequency Control variably and Drive Method of the Same | |
| JP6481398B2 (en) | Detector and communication device | |
| CN219875716U (en) | Oscillator frequency calibration device | |
| CN219960116U (en) | Current limiting circuit and power device testing device | |
| CN113960353B (en) | High-precision low-ripple testing device of high-voltage power supply | |
| CN115372847B (en) | Control device and method of battery test equipment |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |