CN116626069A - Lens defect detection method - Google Patents
Lens defect detection method Download PDFInfo
- Publication number
- CN116626069A CN116626069A CN202310410951.5A CN202310410951A CN116626069A CN 116626069 A CN116626069 A CN 116626069A CN 202310410951 A CN202310410951 A CN 202310410951A CN 116626069 A CN116626069 A CN 116626069A
- Authority
- CN
- China
- Prior art keywords
- light source
- annular light
- lens
- picture
- area
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 title claims abstract description 67
- 230000007547 defect Effects 0.000 title claims abstract description 41
- 238000000034 method Methods 0.000 claims description 13
- 238000007781 pre-processing Methods 0.000 claims description 4
- 239000011521 glass Substances 0.000 description 4
- 238000005259 measurement Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000008094 contradictory effect Effects 0.000 description 1
- 230000004438 eyesight Effects 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 238000011895 specific detection Methods 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
- G01N2021/9583—Lenses
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/30—Computing systems specially adapted for manufacturing
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
The invention discloses a lens defect detection method, which comprises an image acquisition module, an annular light source and a bracket arranged between the image acquisition module and the annular light source, wherein the bracket is used for placing a lens, the annular light source comprises a first annular light source and a second annular light source which are mutually overlapped, and the diameter of the first annular light source is larger than that of the second annular light source. When the first annular light source is started, a first detection area and a first overexposure area are formed, when the second annular light source is started after the first annular light source is closed, a second detection area and a second overexposure area are formed, defects of the corresponding areas of the lenses can be obtained through the first detection area and the second detection area, and meanwhile defects which cannot be obtained after light rays penetrate through the second picture can be obtained through the first detection area and the standard image; the defect that the first picture cannot be obtained after light rays penetrate can be obtained through the comparison between the second detection area and the standard image.
Description
Technical Field
The invention relates to the field of lens detection methods, in particular to a lens defect detection method.
Background
The lens is made of transparent materials with one or more curved surfaces, which are made of optical materials such as glass or resin, and is often assembled with a glasses frame to form glasses after polishing, so that the glasses are used for correcting the eyesight of a user and obtaining a clear visual field.
Whether a lens is acceptable is therefore critical to inspection, wherein common defects of the lens are as follows: dirt, scratches, bubbles, edge chipping, deformation, and the like.
In the industry, the defects of the lenses are basically detected by the front and back sides of the eyes, but the labor cost is increased year by year, so that the efficiency of the human is easy to be low due to long-time detection work, and meanwhile, the productivity of the lenses is influenced due to long artificial training period and low resolution of the eyes.
Meanwhile, the defects are very thin, the defects are very difficult to detect by human eyes, the normal production of the lenses is greatly negatively affected, and the omission ratio is remarkably increased.
There are also methods for detecting the lens by using an automatic detection device, but the lens is greatly affected by the transparency of the lens and the scattering or refracting factors of light, so that the detection process is longer and the detection efficiency is affected.
Disclosure of Invention
The invention mainly aims to provide a lens defect detection method, which aims to realize automatic detection of a lens by adopting an automatic detection method, and meanwhile, the quality of an imaging picture is stable, so that the defect of the lens can be accurately found.
In order to achieve the above object, the present invention provides a lens defect detecting method, including an image acquisition module, an annular light source, and a bracket disposed between the image acquisition module and the annular light source, wherein the bracket is used for placing a lens, the annular light source includes a first annular light source and a second annular light source which are mutually stacked, the diameter of the first annular light source is larger than that of the second annular light source, the middle part of the first annular light source is provided with an avoidance hole, the second annular light source is disposed in the avoidance hole,
the detection step comprises:
s1: the lens is placed on the bracket, and the image acquisition module adjusts the relative distance between the lens and the lens;
s2: the method comprises the steps that a first annular light source is started, light rays of the first annular light source penetrate through a lens and cover a first detection area of the lens, a first overexposure area is formed at the position, far away from the first detection area, of the lens, and the image acquisition module acquires a first picture;
s3: the first annular light source is turned off, the second annular light source is turned on, light rays of the second annular light source penetrate through the lens and cover a second detection area of the lens, a second overexposure area is formed at the position, far away from the second detection area, of the lens, and the image acquisition module acquires a second picture;
s4: the first image comparison module compares the first picture and the second picture with the standard image to analyze whether a test blind area exists or not;
s5: and the second image comparison module compares the first picture and the second picture with the standard image to analyze whether defect factors exist or not, and analyzes and judges the types of the defect factors.
The technical scheme of the invention has the beneficial effects that:
1. in actual measurement, the LED array of the annular light source irradiates the surface of the measured object in a conical shape at an oblique angle, and a small area is illuminated in a diffuse reflection mode, so that the edge and the height change of the measured object can be highlighted, and the part which is difficult to see originally is highlighted; therefore, when the first annular light source is started, a first detection area and a first overexposure area are formed, when the second annular light source is started after the first annular light source is closed, a second detection area and a second overexposure area are formed, defects of the corresponding area of the lens can be obtained through the first detection area and the second detection area, and meanwhile defects which cannot be obtained after light rays penetrate through the second picture can be obtained through the first detection area and the standard image; the defect that the first picture cannot be obtained after light rays penetrate can be obtained through the comparison between the second detection area and the standard image;
the defects of the lens are obtained through multi-dimensional comparison, so that the detection precision is improved;
2. the detection method can be applied to defect detection of different transparencies, is a replicable and learnable model, and is simple and stable.
Drawings
FIG. 1 shows the detection steps of the present invention;
FIG. 2 is a first schematic diagram;
FIG. 3 is a second schematic diagram;
fig. 4 is a first picture and a second picture lamination view.
In the figure, 11 is a first detection region, 12 is a first overexposed region,
21 is a second detection region and 22 is a second overexposure region.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are only some, but not all embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
It should be noted that, in the embodiment of the present invention, directional indications (such as up, down, left, right, front, rear, top, bottom, inner, outer, vertical, lateral, longitudinal, counterclockwise, clockwise, circumferential, radial, axial … …) are referred to, and the directional indications are merely used to explain the relative positional relationship, movement conditions, etc. between the components in a specific posture (as shown in the drawings), and if the specific posture is changed, the directional indications are correspondingly changed.
In addition, if there is a description of "first" or "second" etc. in the embodiments of the present invention, the description of "first" or "second" etc. is only for descriptive purposes, and is not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. In addition, the technical solutions of the embodiments may be combined with each other, but it is necessary to base that the technical solutions can be realized by those skilled in the art, and when the technical solutions are contradictory or cannot be realized, the combination of the technical solutions should be considered to be absent and not within the scope of protection claimed in the present invention.
As shown in fig. 1 to 4, a lens defect detection method includes an image acquisition module, an annular light source and a bracket arranged between the image acquisition module and the annular light source, wherein the bracket is used for placing a lens, the annular light source comprises a first annular light source and a second annular light source which are mutually overlapped, the diameter of the first annular light source is larger than that of the second annular light source, an avoidance hole is arranged in the middle of the first annular light source, the second annular light source is arranged in the avoidance hole,
the detection step comprises:
s1: the lens is placed on the bracket, and the image acquisition module adjusts the relative distance between the lens and the lens;
s2: the method comprises the steps that a first annular light source is started, light rays of the first annular light source penetrate through a lens and cover a first detection area of the lens, a first overexposure area is formed at the position, far away from the first detection area, of the lens, and the image acquisition module acquires a first picture;
s3: the first annular light source is turned off, the second annular light source is turned on, light rays of the second annular light source penetrate through the lens and cover a second detection area of the lens, a second overexposure area is formed at the position, far away from the second detection area, of the lens, and the image acquisition module acquires a second picture;
s4: the first image comparison module compares the first picture and the second picture with the standard image to analyze whether a test blind area exists or not;
s5: and the second image comparison module compares the first picture and the second picture with the standard image to analyze whether defect factors exist or not, and analyzes and judges the types of the defect factors.
1. In actual measurement, the LED array of the annular light source irradiates the surface of the measured object in a conical shape at an oblique angle, and a small area is illuminated in a diffuse reflection mode, so that the edge and the height change of the measured object can be highlighted, and the part which is difficult to see originally is highlighted; therefore, when the first annular light source is started, a first detection area and a first overexposure area are formed, and when the second annular light source is started, a second detection area and a second overexposure area are formed, defects of the corresponding area of the lens can be obtained through the first detection area and the second detection area, and meanwhile defects which cannot be obtained after light rays penetrate through the second picture can be obtained through the comparison of the first detection area and the standard image; the defect that the first picture cannot be obtained after light rays penetrate can be obtained by comparing the second detection area with the standard image; the defects of the lens are obtained through multi-dimensional comparison, so that the detection precision is improved;
2. the detection method can be applied to defect detection of different transparencies, is a replicable and learnable model, and is simple and stable;
3. the annular light source is adopted to enable the lens to be imaged uniformly on the black-and-white camera, so that detection errors caused by light difference are avoided.
Specifically, in S4, it is checked whether or not a blind area exists, the first overexposed area and the second detection area are laminated, and the second overexposed area and the first detection area are laminated, and whether or not a detection blind area exists is compared. In actual measurement, the first overexposure area and the second overexposure area are stacked, so that a test blind area can be avoided, and the overall test of the lens is realized.
More specifically, the first and second annular light sources can adjust relative levelness, thereby adjusting light irradiation on the irradiation area of the lens.
In the embodiment of the invention, the relative brightness of the first annular light source and the second annular light source can be adjusted, and different brightness can be adjusted according to different products, so that refraction or reflection of corresponding light rays is realized, and the detection stability is improved.
Wherein fig. 2 is a first picture obtained under the first annular light source, and fig. 3 is a second picture obtained under the second annular light source.
Further, the region to be detected of the first picture further comprises a corresponding first overexposure region, the region to be detected of the second picture further comprises a corresponding second overexposure region, and whether a test blind area exists between the first picture and the second picture or not can be obtained through comparison of the overexposure regions, so that detection omission is avoided.
Furthermore, the image acquisition module comprises a black-and-white camera and a telecentric lens arranged below the black-and-white camera, and in a specific detection method, auxiliary tools can be added to detect the color of the lens, the refractive index of the lens and the light transmittance of the lens.
In the embodiment of the invention, the defect factors comprise dirt, scratch, bubble, edge collapse and deformation, and in a specific test, different defect factors can be added to adapt to different detection requirements.
Specifically, a preprocessing module is further disposed between S3 and S4, where the preprocessing module may collect the first picture and the second picture into a combined picture, and the combined picture is provided with at least one piece, for example, fig. 4 compares whether a detection blind area exists after stacking the first overexposed area of the first picture and the second overexposed area of the second picture.
The foregoing description is only of the preferred embodiments of the present invention, and is not intended to limit the scope of the invention, but rather, the equivalent structural changes made by the description of the present invention and the accompanying drawings or the direct/indirect application in other related technical fields are included in the scope of the invention.
Claims (7)
1. The lens defect detection method is characterized by comprising an image acquisition module, an annular light source and a bracket arranged between the image acquisition module and the annular light source, wherein the bracket is used for placing a lens, the annular light source comprises a first annular light source and a second annular light source which are mutually overlapped, the diameter of the first annular light source is larger than that of the second annular light source, the middle part of the first annular light source is provided with an avoidance hole, the second annular light source is arranged in the avoidance hole,
the detection step comprises:
s1: the lens is placed on the bracket, and the image acquisition module adjusts the relative distance between the lens and the lens;
s2: the method comprises the steps that a first annular light source is started, light rays of the first annular light source penetrate through a lens and cover a first detection area of the lens, a first overexposure area is formed at the position, far away from the first detection area, of the lens, and the image acquisition module acquires a first picture;
s3: the first annular light source is turned off, the second annular light source is turned on, light rays of the second annular light source penetrate through the lens and cover a second detection area of the lens, a second overexposure area is formed at the position, far away from the second detection area, of the lens, and the image acquisition module acquires a second picture;
s4: the first image comparison module compares the first picture and the second picture with the standard image to analyze whether a test blind area exists or not;
s5: and the second image comparison module compares the first picture and the second picture with the standard image to analyze whether defect factors exist or not, and analyzes and judges the types of the defect factors.
2. The method for detecting defects of a lens according to claim 1, wherein: and in S4, whether a blind area exists or not is checked, the first overexposure area and the second detection area are laminated, the second overexposure area and the first detection area are laminated, and whether a detection blind area exists or not is compared.
3. The method for detecting defects of a lens according to claim 1, wherein: the first annular light source and the second annular light source can adjust relative levelness.
4. The method for detecting defects of a lens according to claim 1, wherein: the first annular light source and the second annular light source can adjust relative brightness.
5. The method for detecting defects of a lens according to claim 1, wherein: the image acquisition module comprises a black-and-white camera and a telecentric lens arranged below the black-and-white camera.
6. The method for detecting defects of a lens according to claim 1, wherein: the defect factors include dirt, scratches, bubbles, edge chipping, and deformation.
7. The method for detecting defects of a lens according to claim 1, wherein: and a preprocessing module is further arranged between the S3 and the S4, the preprocessing module can collect the first picture and the second picture into a combined picture, and at least one combined picture is arranged.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310410951.5A CN116626069A (en) | 2023-04-17 | 2023-04-17 | Lens defect detection method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310410951.5A CN116626069A (en) | 2023-04-17 | 2023-04-17 | Lens defect detection method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN116626069A true CN116626069A (en) | 2023-08-22 |
Family
ID=87596328
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202310410951.5A Pending CN116626069A (en) | 2023-04-17 | 2023-04-17 | Lens defect detection method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN116626069A (en) |
-
2023
- 2023-04-17 CN CN202310410951.5A patent/CN116626069A/en active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN114705120B (en) | Dimension measurement method and scoring system based on mask information | |
| KR101600094B1 (en) | Inspection system for glass sheets | |
| CN109520436B (en) | Butterfly spring three-dimensional size automatic measurement system based on machine vision and measurement method thereof | |
| CN107764834B (en) | Device for automatically detecting surface defects of transparent part and detection method thereof | |
| US10365084B2 (en) | Bead measurement system | |
| US8165382B2 (en) | Glazing inspection method | |
| JPH0242307A (en) | Apparatus and method for displaying surface contour of convex object | |
| US20160223429A1 (en) | Contact lens inspection system and method | |
| CN105021628A (en) | Detection method for surface defects of optical fiber image inverter | |
| CN214747771U (en) | Automatic detection equipment for parts | |
| CN100570437C (en) | Be used for detecting automatically the instrument of the mark on the eyeglass | |
| CN105181713A (en) | Detection device used for optical fiber image inverter surface defects | |
| CN111579564B (en) | Transparent flat plate defect and diopter change detection system and method | |
| CN106501266B (en) | Optical thin film defect inspection method based on differential interference | |
| CN108548825A (en) | A kind of transparent plate defect detecting device and method based on two-dimentional illumination | |
| CN113624458B (en) | Film uniformity detecting system based on double-path full-projection light | |
| CN112330599B (en) | Dimension measurement scoring device, adjustment method and scoring method | |
| CN116626069A (en) | Lens defect detection method | |
| JP5531883B2 (en) | Adjustment method | |
| CN207662807U (en) | A kind of device of automatic detection transparent parts surface defect | |
| CN210401907U (en) | Optical detection system of liquid crystal display screen | |
| CN208736806U (en) | Infrared filter defect detecting device | |
| TW202030464A (en) | Methods and apparatus for determining prism in a lens | |
| CN115082424B (en) | 3D detection method of liquid crystal display screen | |
| CN113587854B (en) | Naked eye 3D grating film angle detection system and detection method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |