CN116593400B - Method and system for detecting black spot damage of solar panel - Google Patents
Method and system for detecting black spot damage of solar panel Download PDFInfo
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- 206010027146 Melanoderma Diseases 0.000 title claims abstract description 64
- 238000000034 method Methods 0.000 title claims abstract description 53
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims abstract description 32
- 238000001514 detection method Methods 0.000 claims abstract description 32
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 32
- 239000010703 silicon Substances 0.000 claims abstract description 32
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- 230000003313 weakening effect Effects 0.000 claims abstract description 13
- 238000004590 computer program Methods 0.000 claims description 8
- 238000004364 calculation method Methods 0.000 claims description 7
- 230000008859 change Effects 0.000 claims description 6
- 230000007547 defect Effects 0.000 description 6
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- 230000006870 function Effects 0.000 description 6
- 230000005284 excitation Effects 0.000 description 4
- 230000002829 reductive effect Effects 0.000 description 4
- 230000000670 limiting effect Effects 0.000 description 3
- 230000002238 attenuated effect Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 238000002679 ablation Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 238000009659 non-destructive testing Methods 0.000 description 1
- 230000036961 partial effect Effects 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 238000012549 training Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 238000002604 ultrasonography Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/1702—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B17/00—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
- H02S50/15—Testing of PV devices, e.g. of PV modules or single PV cells using optical means, e.g. using electroluminescence
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/1702—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids
- G01N2021/1706—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids in solids
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Abstract
The invention provides a method and a system for detecting black spot damage of a solar panel, wherein the method comprises the following steps: establishing a two-dimensional coordinate system of the surface of the solar panel, and synchronously moving the pulse laser and the laser interferometer in the longitudinal axis direction; reading laser interferometer signals of each vertical coordinate point, respectively corresponding the maximum value and the minimum value of the signal amplitude to the highest position and the lowest position of the Jet color sequence, converting the amplitude information into color information, and outputting a corresponding one-dimensional scanning image; superposing the one-dimensional scanning images corresponding to the vertical coordinate points to obtain a complete two-dimensional scanning image; when the maximum amplitude values of signals corresponding to adjacent ordinate values in the two-dimensional scanning image are different, recording the ordinate values corresponding to the position where the amplitude value of the signals is weakened, and calculating the black spot abscissa according to the first weakening occurrence time of the signals and the surface wave speed of the silicon plate; and outputting the corresponding abscissa and ordinate at the black spot. Through the scheme, the black spot detection precision and efficiency can be effectively improved, the implementation process is simple, and the front-end preparation work is not needed.
Description
Technical Field
The invention belongs to the field of laser ultrasound, and particularly relates to a method and a system for detecting black spot damage of a solar panel.
Background
Solar energy is used as a novel clean energy source, and the utilization value of the solar energy is very high. The solar panel can be subjected to direct solar irradiation for a long time in the use process, and partial areas are heated seriously to cause ablation to generate black spots, so that the solar panel is locally invalid, and the overall conversion efficiency is affected.
Currently, the black spot detection on the surface of the solar panel comprises two methods, namely manual detection and machine vision detection, and the manual detection is regarded as needing to consume human resources for detection, so that the detection has the advantages of large workload, low efficiency, detection precision influenced by artificial factors, easiness in occurrence of phenomena of missing detection, false detection and the like; the machine vision method needs to collect and train data on the solar panel in advance before detection, different data sets are needed for solar panels with different specifications, and after the training is finished, the solar panels can be used for detection, so that a great deal of time is required for preparation work.
In view of the above, it is necessary to provide a method for detecting black spot damage of a solar panel, which has a simple detection process and high detection accuracy and efficiency.
Disclosure of Invention
In view of the above, the embodiment of the invention provides a method and a system for detecting black spot damage of a solar panel, which are used for solving the problems of complex detection process, and detection efficiency and accuracy bias of the existing solar panel.
In a first aspect of an embodiment of the present invention, there is provided a method for detecting black spot damage of a solar panel, including:
setting a pulse laser and a laser interferometer at the same horizontal position of a solar panel, establishing a two-dimensional coordinate system of the surface of the solar panel, and synchronously moving the pulse laser and the laser interferometer in the longitudinal axis direction of the coordinate system for scanning;
reading laser interferometer signals of each vertical coordinate point through a matlab interface, respectively corresponding the maximum value and the minimum value of the signal amplitude to the highest position and the lowest position of a Jet color sequence, converting the signal amplitude information into color information, and outputting a corresponding one-dimensional scanning image;
superposing the one-dimensional scanning images corresponding to the vertical coordinate points to obtain a complete two-dimensional scanning image;
when the maximum amplitude values of signals corresponding to adjacent ordinate values in the two-dimensional scanning image are different, recording the ordinate values corresponding to the position where the amplitude value of the signals is weakened, and calculating the black spot abscissa according to the first weakening occurrence time of the signals and the surface wave speed of the silicon plate;
the ultrasonic signal wave speed of the surface of the silicon plate is calculated according to the formula (1):
；（1）
the black spot abscissa is calculated according to formula (2):
；（2）
in the method, in the process of the invention,for the surface wave velocity +.>Poisson's ratio for silicon plate, +.>Shear modulus of silicon plate>Is silicon plate density->Black spot abscissa +.>The time of occurrence is reduced for the first time of the ultrasonic signal;
and outputting the corresponding abscissa and ordinate at the black spot.
In a second aspect of the embodiment of the present invention, there is provided a system for detecting black spot damage of a solar panel, including:
the signal acquisition module is used for setting the pulse laser and the laser interferometer to be at the same horizontal position, establishing a two-dimensional coordinate system of the surface of the solar panel, and synchronously moving the pulse laser and the laser interferometer in the longitudinal axis direction of the coordinate system for scanning;
the one-dimensional image generation module is used for reading laser interferometer signals of all the vertical coordinate points through the matlab interface, respectively corresponding the maximum value and the minimum value of the signal amplitude to the highest position and the lowest position of the Jet color sequence, converting the signal amplitude information into color information and outputting a corresponding one-dimensional scanning image;
the two-dimensional image generation module is used for superposing the one-dimensional scanning images corresponding to each vertical coordinate point to obtain a complete two-dimensional scanning image;
the coordinate calculation module is used for recording the ordinate corresponding to the weakening position of the signal amplitude when the maximum amplitude of the signals corresponding to the adjacent ordinate in the two-dimensional scanning image is different, and calculating the black spot abscissa according to the first weakening occurrence time of the signals and the surface wave speed of the silicon plate;
the ultrasonic signal wave speed of the surface of the silicon plate is calculated according to the formula (1):
；（1）
the black spot abscissa is calculated according to formula (2):
；（2）
in the method, in the process of the invention,for the surface wave velocity +.>Poisson's ratio for silicon plate, +.>Shear modulus of silicon plate>Is silicon plate density->Black spot abscissa +.>The time of occurrence is reduced for the first time of the ultrasonic signal;
and the coordinate output module is used for outputting the corresponding abscissa and ordinate at the black spot.
In a third aspect of the embodiments of the present invention, there is provided an electronic device comprising a memory, a processor and a computer program stored in the memory and executable on the processor, the processor implementing the steps of the method according to the first aspect of the embodiments of the present invention when the computer program is executed by the processor.
In a fourth aspect of the embodiments of the present invention, there is provided a computer readable storage medium storing a computer program which, when executed by a processor, implements the steps of the method provided by the first aspect of the embodiments of the present invention.
According to the embodiment of the invention, the laser ultrasonic detection is carried out on the solar panel, whether the black spot exists on the surface of the solar panel can be rapidly judged by utilizing the characteristic signals of the laser ultrasonic surface waves, and the position of the black spot is accurately calculated based on the ultrasonic wave propagation characteristics, so that the implementation process is simple, the front preparation work is not needed, the detection precision is high, the detection efficiency is high, meanwhile, the direct contact with the solar panel is not needed, and the secondary damage to the solar panel is avoided.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following description will briefly explain the drawings used in the embodiments or the description of the prior art, and it is obvious that the drawings described below are only some embodiments of the present invention, and other drawings may be obtained according to these drawings without inventive effort to a person skilled in the art.
Fig. 1 is a schematic flow chart of a method for detecting black spot damage of a solar panel according to an embodiment of the invention;
FIG. 2 is a schematic diagram of the installation of a pulsed laser and a laser interferometer according to one embodiment of the present invention;
FIG. 3 is a schematic diagram of a laser ultrasonic detection principle according to an embodiment of the present invention;
fig. 4 is a schematic structural diagram of a black spot damage detection system for a solar panel according to an embodiment of the present invention;
fig. 5 is a schematic structural diagram of an electronic device according to an embodiment of the present invention.
Detailed Description
In order to make the objects, features and advantages of the present invention more comprehensible, the technical solutions in the embodiments of the present invention are described in detail below with reference to the accompanying drawings, and it is apparent that the embodiments described below are only some embodiments of the present invention, but not all embodiments of the present invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
It should be understood that the term "comprising" and other similar meaning in the description of the invention or the claims and the above-mentioned figures is intended to cover a non-exclusive inclusion, such as a process, method or system, apparatus comprising a series of steps or elements, without limitation to the listed steps or elements. Furthermore, "first" and "second" are used to distinguish between different objects and are not used to describe a particular order.
The laser ultrasonic technology is a novel nondestructive testing technology, relies on pulse laser to excite ultrasonic waves on the surface of an object and uses a laser interferometer to receive the ultrasonic waves, and can realize real non-contact, nondestructive and high-precision detection work. And the propagation characteristic of the ultrasonic wave is only related to the physical property of the object to be detected, so that the requirement on the detection environment is very small, and the method is very suitable for being applied to the detection and identification of the black spots of the solar panel. Meanwhile, the internal defect does not interfere with the propagation characteristic of the surface wave, and the phenomenon that the surface wave is recovered after being weakened to the minimum value gradually in a linear mode in the surface defect is a special signal of the black spot damage, so that the method can accurately identify the black spot in the detection of the black spot damage, is not interfered by other defects, and has high detection efficiency.
Referring to fig. 1, a flow chart of a method for detecting black spot damage of a solar panel according to an embodiment of the invention includes:
s101, setting a pulse laser and a laser interferometer at the same horizontal position of a solar panel, establishing a two-dimensional coordinate system of the surface of the solar panel, and synchronously moving the pulse laser and the laser interferometer in the longitudinal axis direction of the coordinate system for scanning;
the pulse laser excites ultrasonic waves on the surface of the solar panel, and the ultrasonic waves are received by a laser interferometer, so that black spot detection can be realized. In this embodiment, the pulse laser and the laser interferometer are always kept on the same horizontal line, so that the heights of the pulse laser and the laser interferometer in the vertical direction are fixed, and the horizontal position of the pulse laser and the laser interferometer can be adjusted through the slide way according to the width of the measured object. The scanning line (namely the connection line of the laser and the interferometer) is ensured to be kept horizontal, and the subsequent black spot detection and calculation can be facilitated.
As shown in fig. 2, the pulse laser is moved to irradiate the excitation laser on the upper left corner of the solar panel, and then the laser interferometer is moved to irradiate the receiving laser on the upper right corner of the solar panel, so that the transmission range of the ultrasonic signal corresponds to the excitation laser, the whole width of the solar panel is covered, and the length of the scanning line is exactly the same as the width of the solar panel, so that missed detection is avoided.
It will be readily appreciated that the ordinate of the pulsed laser and the laser interferometer are kept the same (i.e. both remain on the same horizontal line) during the longitudinal movement based on the two-dimensional coordinate system of the solar panel surface. The movable platform synchronously moves the vertical positions of the two, so that the height of the whole solar panel can be covered from top to bottom, and the whole solar panel can be completely scanned.
In some embodiments, the ultrasonic signals received by the laser interferometer are synchronously output to the LUSS software system of the computer so as to observe the changes of the ultrasonic signals in real time. Corresponding scanned images and texts can be generated according to the ultrasonic signals and used for visually observing defects of the solar panel.
S102, reading laser interferometer signals of each vertical coordinate point through a matlab interface, respectively corresponding the maximum value and the minimum value of the signal amplitude to the highest position and the lowest position of a Jet color sequence, converting the signal amplitude information into color information, and outputting a corresponding one-dimensional scanning image;
the one-dimensional scanning image corresponds to the ordinate of the scanning position and contains the amplitude information of the ultrasonic signal. And reading ultrasonic signals through a matlab interface, respectively corresponding the maximum value and the minimum value of the signal amplitude to the highest position and the lowest position of the Jet color sequence, converting the amplitude information of the ultrasonic signals into color information, and outputting the color information as a one-dimensional image.
S103, superposing one-dimensional scanning images corresponding to each vertical coordinate point to obtain a complete two-dimensional scanning image;
the two-dimensional scanning image comprises ultrasonic signal amplitude information corresponding to different ordinate, and whether black spots exist on the solar panel can be visually observed and judged by superposing one-dimensional images.
S104, when the maximum amplitude of the ultrasonic signals corresponding to the adjacent ordinate in the two-dimensional scanning image is different, recording the ordinate corresponding to the weakening position of the amplitude of the ultrasonic signals, and calculating the black spot abscissa according to the first weakening occurrence time of the ultrasonic signals and the surface wave speed of the silicon plate;
the ultrasonic signal wave speed of the surface of the silicon plate is calculated according to the formula (1):
；
the black spot abscissa is calculated according to formula (2):
；
in the method, in the process of the invention,for the surface wave velocity +.>Poisson's ratio for silicon plate, +.>Shear modulus of silicon plate>Is silicon plate density->Black spot abscissa +.>The time of occurrence is first attenuated for the ultrasonic signal.
The two-dimensional scanning image can intuitively judge whether black spots exist on the solar panel, and if the black spots exist, the corresponding ordinate of the weakening position is positioned according to the maximum amplitude change of the ultrasonic signal.
Optionally, based on the change of the maximum amplitude of the ultrasonic signal in the two-dimensional image, judging whether the solar panel has black spots or not.
It can be understood that in the state without black spots, the surface wave can be directly transmitted from the position of exciting laser to the position of receiving the laser due to the smooth surface of the solar panel, and the loss of signals can not be caused, so that the amplitude value in the one-dimensional image is obvious. In the scanning process, if black spots are not generated all the time, the arrival time of the surface wave is not changed, so that the two-dimensional scanning image presents a vertical line. Once the black spot appears, the propagation of the surface wave is disturbed, as shown in fig. 3, the larger the area of the black spot is, the larger the disturbance amplitude is, and even the propagation of the surface wave can be directly blocked, so that the amplitude of the one-dimensional scanning image is suddenly reduced, and the vertical line in the two-dimensional scanning image is gradually thinned or even interrupted.
Based on the phenomenon, after the ultrasonic signal is received, the distribution condition of the vertical lines in the two-dimensional scanning image can be observed, and if the vertical lines are intact, the solar panel can be judged that black spots do not exist. If part of vertical lines in the two-dimensional scanning image have the condition that the signals are recovered after being weakened to the minimum value step by step, namely the maximum amplitude of the ultrasonic signals is changed, the existence of black spots on the solar panel can be judged.
And (3) taking the maximum amplitude of the one-dimensional scanning image in a normal state as a standard, and comparing the amplitude change of the ultrasonic signal to record the ordinate corresponding to the position where the signal is weakened, wherein the ordinate is the relative position of the black spot on the surface of the solar panel.
S105, outputting the corresponding abscissa and ordinate at the black spot.
And outputting the corresponding seat position of the black spot after calculating the abscissa corresponding to the black spot, wherein the abscissa and the ordinate represent the position of the black spot under the solar panel coordinate system. When a plurality of black spots exist, the scanned black spot coordinates can be directly output.
In the embodiment, the pulse laser is used for emitting excitation laser and exciting ultrasonic waves in the solar panel, and the laser interferometer is used for receiving ultrasonic signals at the same horizontal line position, so that physical contact with the solar panel is not needed in the whole process, and secondary damage to the solar panel can be avoided to the greatest extent. The ultrasonic wave propagation characteristic based on laser excitation is stable, the surface defect is sensitive, the black spot on the surface of the solar panel can be accurately detected, defect information is carried and received by the interferometer, and the detection precision and efficiency of the black spot can be ensured. Meanwhile, compared with manual detection and machine vision, the method is simpler in implementation process, does not need front-end work, and can be directly applied to solar panels of any specification.
It should be understood that the sequence number of each step in the above embodiment does not mean the sequence of execution, and the execution sequence of each process should be determined by its function and internal logic, and should not be construed as limiting the implementation process of the embodiment of the present invention.
Fig. 4 is a schematic structural diagram of a system for detecting black spot damage of a solar panel according to an embodiment of the present invention, where the system includes:
the signal acquisition module 410 is used for setting the pulse laser and the laser interferometer to be at the same horizontal position, establishing a two-dimensional coordinate system of the surface of the solar panel, and synchronously moving the pulse laser and the laser interferometer in the longitudinal axis direction of the coordinate system for scanning;
the one-dimensional image generating module 420 is configured to read laser interferometer signals of each vertical coordinate point through the matlab interface, respectively correspond a maximum value and a minimum value of signal amplitude to a highest position and a lowest position of the Jet color sequence, convert the signal amplitude information into color information, and output a corresponding one-dimensional scanning image;
the two-dimensional image generating module 430 is configured to superimpose the one-dimensional scan images corresponding to each vertical coordinate point to obtain a complete two-dimensional scan image;
the coordinate calculation module 440 is configured to record an ordinate corresponding to a position where the amplitude of the ultrasonic signal is reduced when the maximum amplitudes of the ultrasonic signals corresponding to adjacent ordinate in the two-dimensional scan image are different, and calculate a black spot abscissa according to the occurrence time of the first attenuation of the ultrasonic signal and the surface wave speed of the silicon plate;
the ultrasonic signal wave speed of the surface of the silicon plate is calculated according to the formula (1):
；
the black spot abscissa is calculated according to formula (2):
；
in the method, in the process of the invention,for the surface wave velocity +.>Poisson's ratio for silicon plate, +.>For the shear modulus of the silicon plate,/>is silicon plate density->Black spot abscissa +.>The time of occurrence is first attenuated for the ultrasonic signal.
And the coordinate output module 450 is used for outputting the corresponding abscissa and ordinate at the black spot.
Optionally, the coordinate calculation module 440 further includes:
and the black spot judging module is used for judging whether the solar panel has black spots or not based on the change of the maximum amplitude of the ultrasonic signal in the two-dimensional image.
It will be clear to those skilled in the art that, for convenience and brevity of description, specific working procedures of the above-described system and module may refer to corresponding procedures in the foregoing method embodiments, which are not described herein again.
Fig. 5 is a schematic structural diagram of an electronic device according to an embodiment of the present invention. The electronic equipment is used for detecting black spots on the surface of the solar panel. As shown in fig. 5, the electronic apparatus 5 of this embodiment includes: the memory 510, the processor 520, and the system bus 530, the memory 510 including an executable program 5101 stored thereon, it will be understood by those skilled in the art that the electronic device structure shown in fig. 5 is not limiting of the electronic device and may include more or fewer components than illustrated, or may combine certain components, or a different arrangement of components.
The following describes the respective constituent elements of the electronic device in detail with reference to fig. 5:
the memory 510 may be used to store software programs and modules, and the processor 520 performs various functional applications and data processing of the electronic device by executing the software programs and modules stored in the memory 510. The memory 510 may mainly include a storage program area that may store an operating system, application programs required for at least one function (such as a sound playing function, an image playing function, etc.), and a storage data area; the storage data area may store data created according to the use of the electronic device (such as cache data), and the like. In addition, memory 510 may include high-speed random access memory, and may also include non-volatile memory, such as at least one magnetic disk storage device, flash memory device, or other volatile solid-state storage device.
An executable program 5101 containing a network request method on a memory 510, the executable program 5101 may be partitioned into one or more modules/units which are stored in the memory 510 and executed by a processor 520 for assisting positioning based on a camera or the like, and the one or more modules/units may be a series of computer program instruction sections capable of performing a specific function for describing an execution process of the executable program 5101 in the electronic device 5. For example, the executable program 5101 may be divided into functional modules such as a signal acquisition module, an image generation module, a coordinate calculation module, and a coordinate output module.
Processor 520 is a control center of the electronic device that utilizes various interfaces and lines to connect various portions of the overall electronic device, perform various functions of the electronic device and process data by running or executing software programs and/or modules stored in memory 510, and invoking data stored in memory 510, thereby performing overall condition monitoring of the electronic device. Optionally, the processor 520 may include one or more processing units; preferably, the processor 520 may integrate an application processor that primarily handles operating systems, applications, etc., with a modem processor that primarily handles wireless communications. It will be appreciated that the modem processor described above may not be integrated into the processor 520.
The system bus 530 is used to connect various functional components inside the computer, and CAN transfer data information, address information, and control information, and the types of the system bus may be, for example, a PCI bus, an ISA bus, and a CAN bus. Instructions from processor 520 are transferred to memory 510 via a bus, memory 510 feeds back data to processor 520, and system bus 530 is responsible for data and instruction interaction between processor 520 and memory 510. Of course, the system bus 530 may also access other devices, such as a network interface, display device, etc.
In an embodiment of the present invention, the executable program executed by the processor 520 included in the electronic device includes:
setting a pulse laser and a laser interferometer at the same horizontal position of a solar panel, establishing a two-dimensional coordinate system of the surface of the solar panel, and synchronously moving the pulse laser and the laser interferometer in the longitudinal axis direction of the coordinate system for scanning;
reading laser interferometer signals of each vertical coordinate point through a matlab interface, respectively corresponding the maximum value and the minimum value of the signal amplitude to the highest position and the lowest position of a Jet color sequence, converting the signal amplitude information into color information, and outputting a corresponding one-dimensional scanning image;
superposing the one-dimensional scanning images corresponding to the vertical coordinate points to obtain a complete two-dimensional scanning image;
when the maximum amplitude values of signals corresponding to adjacent ordinate values in the two-dimensional scanning image are different, recording the ordinate values corresponding to the position where the amplitude value of the signals is weakened, and calculating the black spot abscissa according to the first weakening occurrence time of the signals and the surface wave speed of the silicon plate;
and outputting the corresponding abscissa and ordinate at the black spot.
It will be clearly understood by those skilled in the art that, for convenience and brevity of description, specific working procedures of the above-described system, apparatus and module may refer to corresponding procedures in the foregoing method embodiments, which are not repeated herein.
In the foregoing embodiments, the descriptions of the embodiments are emphasized, and in part, not described or illustrated in any particular embodiment, reference is made to the related descriptions of other embodiments.
The above embodiments are only for illustrating the technical solution of the present invention, and not for limiting the same; although the invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present invention.
Claims (4)
1. The method for detecting the black spot damage of the solar panel is characterized by comprising the following steps of:
setting a pulse laser and a laser interferometer at the same horizontal position of a solar panel, establishing a two-dimensional coordinate system of the surface of the solar panel, and synchronously moving the pulse laser and the laser interferometer in the longitudinal axis direction of the coordinate system for scanning;
reading laser interferometer signals of each vertical coordinate point through a matlab interface, respectively corresponding the maximum value and the minimum value of the signal amplitude to the highest position and the lowest position of a Jet color sequence, converting the signal amplitude information into color information, and outputting a corresponding one-dimensional scanning image;
superposing the one-dimensional scanning images corresponding to the vertical coordinate points to obtain a complete two-dimensional scanning image;
when the maximum amplitude values of signals corresponding to adjacent ordinate values in the two-dimensional scanning image are different, recording the ordinate values corresponding to the position where the amplitude value of the signals is weakened, and calculating the black spot abscissa according to the first weakening occurrence time of the signals and the surface wave speed of the silicon plate;
judging whether the solar panel has black spots or not based on the change of the maximum amplitude of the ultrasonic signal in the two-dimensional image;
the ultrasonic signal wave speed of the surface of the silicon plate is calculated according to the formula (1):
；（1）
the black spot abscissa is calculated according to formula (2):
；（2）
in the method, in the process of the invention,c R is the wave velocity of the surface wave,σis the poisson's ratio of the silicon plate,Gfor the shear modulus of the silicon plate,ρthe density of the silicon plate is x is the black spot abscissa, and t is the occurrence time of first weakening of the ultrasonic signal;
and outputting the corresponding abscissa and ordinate at the black spot.
2. A solar panel black spot damage detection system, comprising:
the signal acquisition module is used for setting the pulse laser and the laser interferometer to be at the same horizontal position, establishing a two-dimensional coordinate system of the surface of the solar panel, and synchronously moving the pulse laser and the laser interferometer in the longitudinal axis direction of the coordinate system for scanning;
the one-dimensional image generation module is used for reading laser interferometer signals of all the vertical coordinate points through the matlab interface, respectively corresponding the maximum value and the minimum value of the signal amplitude to the highest position and the lowest position of the Jet color sequence, converting the signal amplitude information into color information and outputting a corresponding one-dimensional scanning image;
the two-dimensional image generation module is used for superposing the one-dimensional scanning images corresponding to each vertical coordinate point to obtain a complete two-dimensional scanning image;
the coordinate calculation module is used for recording the ordinate corresponding to the weakening position of the signal amplitude when the maximum amplitude of the signals corresponding to the adjacent ordinate in the two-dimensional scanning image is different, and calculating the black spot abscissa according to the first weakening occurrence time of the signals and the surface wave speed of the silicon plate;
wherein, the coordinate calculation module further includes:
the black spot judging module is used for judging whether the solar panel has black spots or not based on the change of the maximum amplitude of the signal in the two-dimensional image;
the ultrasonic signal wave speed of the surface of the silicon plate is calculated according to the formula (1):
； （1）
the black spot abscissa is calculated according to formula (2):
；（2）
in the method, in the process of the invention,c R is the wave velocity of the surface wave,σis the poisson's ratio of the silicon plate,Gfor the shear modulus of the silicon plate,ρthe density of the silicon plate is x is the black spot abscissa, and t is the occurrence time of first weakening of the ultrasonic signal;
and the coordinate output module is used for outputting the corresponding abscissa and ordinate at the black spot.
3. An electronic device comprising a memory, a processor and a computer program stored in the memory and executable on the processor, wherein the processor, when executing the computer program, performs the steps of a method for detecting black spot damage of a solar panel according to any one of claims 1.
4. A computer readable storage medium storing a computer program, wherein the computer program when executed implements the steps of a method for detecting black spot damage of a solar panel according to any one of claims 1.
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