CN116560260A - Automatic test platform hardware control system, method, device, equipment and medium - Google Patents

Automatic test platform hardware control system, method, device, equipment and medium Download PDF

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Publication number
CN116560260A
CN116560260A CN202310371777.8A CN202310371777A CN116560260A CN 116560260 A CN116560260 A CN 116560260A CN 202310371777 A CN202310371777 A CN 202310371777A CN 116560260 A CN116560260 A CN 116560260A
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China
Prior art keywords
information
tested
equipment
module
test platform
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Inventor
陈延
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Shenzhen Kaihong Digital Industry Development Co Ltd
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Shenzhen Kaihong Digital Industry Development Co Ltd
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Priority to CN202310371777.8A priority Critical patent/CN116560260A/en
Publication of CN116560260A publication Critical patent/CN116560260A/en
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
    • G05B19/042—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
    • G05B19/0423—Input/output
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/20—Pc systems
    • G05B2219/24—Pc safety
    • G05B2219/24215—Scada supervisory control and data acquisition
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

The application relates to the field of automatic testing and discloses an automatic testing platform hardware control system, a method, a device, equipment and a medium. According to the method and the device, after the information reporting module obtains the information of the equipment to be tested, the information of the equipment to be tested is sent to the interface module, the information of the equipment to be tested is forwarded to the Linux host through the interface module, the Linux host generates a corresponding control instruction according to the information of the equipment to be tested, the Linux host sends the control instruction to the relay control module, the control instruction is analyzed in the relay control module, the corresponding relay is controlled to be closed according to the control instruction, the corresponding test interface is determined according to the type of the equipment to be tested, hardware control of an automatic test platform is achieved, and the efficiency of automatic test is improved.

Description

Automatic test platform hardware control system, method, device, equipment and medium
Technical Field
The present disclosure relates to the field of automated testing, and in particular, to an automated testing platform hardware control system, method, apparatus, device, and medium.
Background
The current automatic test platform focuses on the automation of the test flow, including the test of the hardware function and the test of the software function of the device to be tested, such as the test of the external interface of the hardware of the device by a relay and an IO module, and the test of the burning of the firmware of the device and the test of the software function. The test flow of the existing automatic test platform needs to be accessed to the devices one by one in the test process, the test results of the devices are recorded, and only the devices of the same type are accessed in batch test, so that statistics is inconvenient, and the automatic test efficiency is low. Therefore, how to improve the efficiency of the automated test is a technical problem to be solved.
Disclosure of Invention
The application provides an automatic test platform hardware control system, an automatic test platform hardware control method, an automatic test platform hardware control device and a medium, so that the efficiency of automatic test is improved.
In a first aspect, the present application provides an automated test platform hardware control system, comprising:
the system comprises a Linux host, an interface module, an information reporting module, a display module and a relay control module;
one end of the Linux host is connected with the interface module, the other end of the Linux host is connected with the relay control module, and the Linux host is used for receiving the information of the device to be tested forwarded by the interface module and generating a control instruction;
one end of the interface module is connected with the information reporting module, the other end of the interface module is connected with the Linux host, and the interface module is used for receiving the information of the equipment to be tested and forwarding the information of the equipment to be tested to the Linux host;
one end of the information reporting module is connected with the interface module, the other end of the information reporting module is connected with the equipment to be tested, and the information reporting module is used for acquiring the information of the equipment to be tested and sending the information of the equipment to be tested to the interface module;
the display module is connected with the interface module and is used for displaying the information of the equipment to be tested;
the relay control module is connected with the Linux host, and is used for receiving the control instruction from the Linux host and controlling the internal relay to be closed based on the control instruction.
Further, the interface module includes: USB interface, I2C interface and communication chip;
the USB interface is used for being connected with the equipment to be tested;
the I2C interface is used for receiving the information of the equipment to be tested;
the communication chip is used for establishing communication between the USB interface and the I2C interface, receiving the information of the equipment to be tested and sending the information of the equipment to be tested to the automatic test platform.
Further, the display module includes: an LCD display screen and a first I2C chip;
the first I2C chip is used for receiving the equipment information to be tested forwarded by the automatic test platform;
the LCD display screen is used for displaying the information of the equipment to be tested.
Further, the information reporting module includes: a rotary encoding switch and a second I2C chip;
the rotary coding switch is used for determining the type of the equipment to be detected and acquiring the information of the equipment to be detected;
the second I2C chip is configured to send the device type to be tested to the interface module.
Further, the relay control module includes: a relay and a third I2C chip;
the third I2C chip is used for receiving the control instruction;
and the relay is used for performing corresponding closing actions according to the control instruction.
In a second aspect, the present application provides an automated test platform hardware control method, including:
the interface module uploads the information of the equipment to be tested to the Linux host;
the Linux host analyzes the information of the equipment to be detected, generates a control instruction corresponding to the information of the equipment to be detected, and sends the control instruction to the relay control module;
and executing closing operation corresponding to the control instruction by a relay corresponding to the relay control module according to the control instruction.
Further, before the interface module uploads the information of the device to be tested to the Linux host, the interface module includes:
the information reporting module determines the type of the equipment to be tested, acquires the information of the equipment to be tested based on the type of the equipment to be tested, and sends the information of the equipment to be tested to the interface module.
Further, before the Linux host analyzes the information of the device to be detected, generates a control instruction corresponding to the information of the device to be detected, and sends the control instruction to the relay control module, the Linux host includes:
the information reporting module sends display information to the display module, and the display information is output to the outside through an LCD display screen in the display module, wherein the display information comprises other equipment state information and equipment information to be tested.
In a third aspect, the present application further provides an automated test platform hardware control device, where the automated test platform hardware control device includes:
the device to be tested information uploading module is used for uploading the device to be tested information of the device to be tested to the Linux host computer through the interface module;
the control instruction generation module is used for analyzing the information of the equipment to be detected by the Linux host computer, generating a control instruction corresponding to the information of the equipment to be detected and sending the control instruction to the relay control module;
and the control instruction execution module is used for executing the closing operation corresponding to the control instruction according to the control instruction by a relay corresponding to the relay inside the relay control module.
In a fourth aspect, the present application also provides a computer device comprising a memory and a processor; the memory is used for storing a computer program; the processor is configured to execute the computer program and implement the automated test platform hardware control method as described above when the computer program is executed.
In a fifth aspect, the present application further provides a storage medium storing a computer program, where the computer program when executed by a processor causes the processor to implement an automated test platform hardware control method as described above.
The application discloses an automatic test platform hardware control system, a method, a device, equipment and a medium, wherein the system comprises a Linux host, an interface module, an information reporting module, a display module and a relay control module; one end of the Linux host is connected with the interface module, the other end of the Linux host is connected with the relay control module, and the Linux host is used for receiving the information of the device to be tested forwarded by the interface module and generating a control instruction; one end of the interface module is connected with the information reporting module, the other end of the interface module is connected with the Linux host, and the interface module is used for receiving the information of the equipment to be tested and forwarding the information of the equipment to be tested to the Linux host; one end of the information reporting module is connected with the interface module, the other end of the information reporting module is connected with the equipment to be tested, and the information reporting module is used for acquiring the information of the equipment to be tested and sending the information of the equipment to be tested to the interface module; the display module is connected with the interface module and is used for displaying the information of the equipment to be tested; the relay control module is connected with the Linux host, and is used for receiving the control instruction from the Linux host and controlling the internal relay to be closed based on the control instruction. According to the method and the device, after the information reporting module acquires the information of the device to be tested, the information of the device to be tested is sent to the interface module, the information of the device to be tested is forwarded to the Linux host through the interface module, a corresponding control instruction is generated in the Linux host, the control instruction is sent to the relay control module, the corresponding relay is controlled to be closed, hardware control of the automatic test platform is achieved, and the efficiency of automatic test is improved.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings needed in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are some embodiments of the present application, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic block diagram of an automated test platform hardware control system according to an embodiment of the present application;
FIG. 2 is a schematic flow chart of an automated test platform hardware control method according to a first embodiment of the present application;
FIG. 3 is a schematic flow chart of an automated test platform hardware control method according to a second embodiment of the present application;
FIG. 4 is a schematic flow chart of an automated test platform hardware control method according to a third embodiment of the present application;
FIG. 5 is a schematic block diagram of an automated test platform hardware control device provided by an embodiment of the present application;
fig. 6 is a schematic block diagram of an apparatus according to an embodiment of the present application.
Detailed Description
The following description of the embodiments of the present application will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are some, but not all, of the embodiments of the present application. All other embodiments, which can be made by one of ordinary skill in the art without undue burden from the present disclosure, are within the scope of the present disclosure.
The flow diagrams depicted in the figures are merely illustrative and not necessarily all of the elements and operations/steps are included or performed in the order described. For example, some operations/steps may be further divided, combined, or partially combined, so that the order of actual execution may be changed according to actual situations.
It is to be understood that the terminology used in the description of the present application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. As used in this specification and the appended claims, the singular forms "a," "an," and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise.
It should also be understood that the term "and/or" as used in this specification and the appended claims refers to any and all possible combinations of one or more of the associated listed items, and includes such combinations.
The embodiment of the application provides an automatic test platform hardware control system, an automatic test platform hardware control method, an automatic test platform hardware control device, automatic test platform hardware control equipment and a medium. The method for controlling the hardware of the automatic test platform can be applied to a hardware control system of the automatic test platform, the information reporting module is used for acquiring the information of the equipment to be tested and then sending the information of the equipment to be tested to the interface module, the interface module is used for forwarding the information of the equipment to be tested to the Linux host, a corresponding control instruction is generated in the Linux host, the control instruction is sent to the relay control module, and the corresponding relay is controlled to be closed, so that the hardware control of the automatic test platform is realized, and the efficiency of automatic test is improved. The server can be an automatic test platform hardware control system or a server cluster.
Some embodiments of the present application are described in detail below with reference to the accompanying drawings. The following embodiments and features of the embodiments may be combined with each other without conflict.
Referring to fig. 1, fig. 1 is a schematic block diagram of an automatic test platform hardware control system according to an embodiment of the present application.
As shown in fig. 1, an automated test platform hardware control system includes:
the system comprises a Linux host, an interface module, an information reporting module, a display module and a relay control module;
one end of the Linux host is connected with the interface module, the other end of the Linux host is connected with the relay control module, and the Linux host is used for receiving the information of the device to be tested forwarded by the interface module and generating a control instruction;
one end of the interface module is connected with the information reporting module, the other end of the interface module is connected with the Linux host, and the interface module is used for receiving the information of the equipment to be tested and forwarding the information of the equipment to be tested to the Linux host;
one end of the information reporting module is connected with the interface module, the other end of the information reporting module is connected with the equipment to be tested, and the information reporting module is used for acquiring the information of the equipment to be tested and sending the information of the equipment to be tested to the interface module;
the display module is connected with the interface module and is used for displaying the information of the equipment to be tested;
the relay control module is connected with the Linux host, and is used for receiving the control instruction from the Linux host and controlling the internal relay to be closed based on the control instruction.
Further, the interface module includes: USB interface, I2C interface and communication chip;
the USB interface is used for being connected with the equipment to be tested;
the I2C interface is used for receiving the information of the equipment to be tested;
the communication chip is used for establishing communication between the USB interface and the I2C interface, receiving the information of the equipment to be tested and sending the information of the equipment to be tested to the automatic test platform.
Further, the display module includes: an LCD display screen and a first I2C chip;
the first I2C chip is used for receiving the equipment information to be tested forwarded by the automatic test platform;
the LCD display screen is used for displaying the information of the equipment to be tested.
Further, the information reporting module includes: a rotary encoding switch and a second I2C chip;
the rotary coding switch is used for determining the type of the equipment to be detected and acquiring the information of the equipment to be detected;
the second I2C chip is configured to send the device type to be tested to the interface module.
Further, the relay control module includes: a relay and a third I2C chip;
the third I2C chip is used for receiving the control instruction;
and the relay is used for performing corresponding closing actions according to the control instruction.
Specifically, as shown in fig. 1, the RK3568A development board is an example of a device to be tested, and has an interface for control, i.e. a brushhead interface, where the interface under the development board is connected to a terminal patch cord with a pitch of 1.25mm to 2.54mm, and then a GND (Ground) end and an eMMC (Embedded Multi Media Card) end used correspondingly, i.e. a brushhead interface, are directly connected to an xA port and an xB port of the relay.
Referring to fig. 2, fig. 2 is a schematic flowchart of an automatic test platform hardware control method according to a first embodiment of the present application. The hardware control method of the automatic test platform can be applied to the hardware control system of the automatic test platform, and is used for transmitting the information of the equipment to be tested to the interface module after the information of the equipment to be tested is acquired through the information reporting module, transmitting the information of the equipment to be tested to the Linux host through the interface module, generating a corresponding control instruction in the Linux host, transmitting the control instruction to the relay control module, controlling the corresponding relay to be closed, realizing the hardware control of the automatic test platform, and improving the efficiency of automatic test.
As shown in fig. 2, the method for controlling hardware of the automated test platform specifically includes steps S10 to S30. S10, uploading information of equipment to be tested of the equipment to be tested to the Linux host by the interface module;
s20, the Linux host analyzes the information of the equipment to be detected, generates a control instruction corresponding to the information of the equipment to be detected, and sends the control instruction to the relay control module;
s30, executing closing operation corresponding to the control instruction by a corresponding relay in the relay control module according to the control instruction.
In a specific embodiment, the operation flow of the hardware control method of the automatic test platform is as follows:
firstly, accessing to a tested device, rotating a rotary coding switch according to the type of the tested device, inputting device information to a communication chip on a USB-I2C converter by an I2C chip corresponding to the rotary coding switch, and uploading the device information to an automatic test platform after entering a host;
one end of the USB-I2C converter is connected to a first type-a interface of the USB-HUB, then a 4P pin with the upper mark character of I2C is found at the pin position of the other end, the 4P pin is correspondingly connected to an expansion interface on a bread board or a deconcentrator, the expansion interface is used for connecting a corresponding I2C interface on a PCB (Printed Circuit Board, a printed circuit board), and the USB-HUB is an expansion interface of the USB.
The information of the tested equipment can be transmitted to an I2C chip corresponding to the LCD screen through the host and displayed on the LCD screen, and other contents such as the running state of the tested equipment on an automatic test platform can be added besides the equipment information transmitted to the host, so that the distribution can be regulated and controlled conveniently;
and finally, the I2C chip of the relay controller module can receive a control command from a host, so that the change of the normally open and normally closed states of the connected relays is controlled, meanwhile, the relays serve as a switch to control the on-off of the tested equipment and other functions of interfaces exposed to the outside, and the interface module can realize batch access to the tested equipment and plug and play.
Specifically, the front side of the relay controller provides 1-8 total 8 electric signal input ports, two COM ports beside, two black VCC (Volt Current Condenser) ports, and two orange GND ports.
The VCC port and the GND port of the relay are respectively connected to the positive electrode and the negative electrode which are developed by the deconcentrator through the 12V voltage-stabilizing power supply.
The COM port of the relay is connected to the bread board or the GND port of the deconcentrator to which the USB-I2C is connected.
Each electric signal input port of the relay corresponds to the following corresponding digital xA, xB and xC ports and corresponds to the normally open, COM and normally closed ports, a signal output port p of the relay corresponding to the PCF8574 chip on the PCB in the I2C equipment is connected to the electric signal input port x of the relay through a DuPont wire, then the positive electrode of a power interface expanded by a power supply of a development board is connected to the xB end of the relay, and the xA end is connected with the positive electrode of a power supply expanded by a 12V stabilized power supply through a deconcentrator; the brush machine interface of RK3568B is directly connected to the xA and xB interfaces of the relay without connecting to a stabilized voltage supply.
The I2C chips of the three modules are provided with corresponding slave addresses (slave addresses), the I2C chips with different slave addresses are mounted on an I2C bus corresponding to the USB-I2C communication chip in the interface module, and a plurality of USB-I2C communication chips can be inserted into a host, so that the I2C bus numbers and the slave addresses of the I2C chips can be used for distinguishing the hardware control modules of the automatic test platform corresponding to the accessed tested equipment; after the tested equipment is accessed, the interface module confirms whether the tested equipment is normally accessed from USB interface information of the host and the input equipment information on the I2C bus, reads the input equipment information in real time after the normal access is confirmed, and transmits the input equipment information to an automatic test platform for scheduling and using of test tasks.
According to the embodiment, the information reporting module acquires the information of the equipment to be tested and then sends the information of the equipment to be tested to the interface module, the interface module forwards the information of the equipment to be tested to the Linux host, a corresponding control instruction is generated in the Linux host, the control instruction is sent to the relay control module, and the corresponding relay is controlled to be closed, so that hardware control of an automatic test platform is realized, the need of re-reading the information of the equipment to be tested every time the equipment to be tested is accessed is avoided, and the automatic test efficiency is improved.
Referring to fig. 3, fig. 3 is a schematic flowchart of an automatic test platform hardware control method according to a second embodiment of the present application. The hardware control method of the automatic test platform can be applied to the hardware control system of the automatic test platform, and is used for transmitting the information of the equipment to be tested to the interface module after the information of the equipment to be tested is acquired through the information reporting module, transmitting the information of the equipment to be tested to the Linux host through the interface module, generating a corresponding control instruction in the Linux host, transmitting the control instruction to the relay control module, controlling the corresponding relay to be closed, realizing the hardware control of the automatic test platform, and improving the efficiency of automatic test.
As shown in fig. 3, in the present embodiment, step S01 is included before step S10.
S01, the information reporting module determines the type of the equipment to be tested, acquires the information of the equipment to be tested based on the type of the equipment to be tested, and sends the information of the equipment to be tested to the interface module.
In a specific embodiment, the information reporting module includes a rotary coding switch and a second I2C chip, where the rotary coding switch is used to determine a type of a device to be tested and obtain information of the device to be tested, and the second I2C chip is used to send the type of the device to be tested to the interface module.
The interface module comprises a USB interface, an I2C interface and a communication chip, wherein the USB interface is used for being connected with the equipment to be tested, the I2C interface is used for receiving the information of the equipment to be tested, the communication chip is used for establishing communication between the USB interface and the I2C interface, receiving the information of the equipment to be tested and sending the information of the equipment to be tested to the automatic test platform.
According to the embodiment, the information reporting module acquires the information of the equipment to be tested and then sends the information of the equipment to be tested to the interface module, the interface module forwards the information of the equipment to be tested to the Linux host, a corresponding control instruction is generated in the Linux host, the control instruction is sent to the relay control module, and the corresponding relay is controlled to be closed, so that hardware control of an automatic test platform is realized, the need of re-reading the information of the equipment to be tested every time the equipment to be tested is accessed is avoided, and the automatic test efficiency is improved.
Referring to fig. 4, fig. 4 is a schematic flowchart of an automatic test platform hardware control method according to a third embodiment of the present application. The hardware control method of the automatic test platform can be applied to the hardware control system of the automatic test platform, and is used for transmitting the information of the equipment to be tested to the interface module after the information of the equipment to be tested is acquired through the information reporting module, transmitting the information of the equipment to be tested to the Linux host through the interface module, generating a corresponding control instruction in the Linux host, transmitting the control instruction to the relay control module, controlling the corresponding relay to be closed, realizing the hardware control of the automatic test platform, and improving the efficiency of automatic test.
As shown in fig. 4, in the present embodiment, step S11 is included before step S20.
And S11, the information reporting module sends display information to the display module, and the display information is output to the outside through an LCD display screen in the display module, wherein the display information comprises other equipment state information and equipment information to be tested.
In a specific embodiment, the information reporting module includes a rotary coding switch and a second I2C chip, where the rotary coding switch is used to determine a type of a device to be tested and obtain information of the device to be tested, and the second I2C chip is used to send the type of the device to be tested to the interface module.
The interface module comprises a USB interface, an I2C interface and a communication chip, wherein the USB interface is used for being connected with the equipment to be tested, the I2C interface is used for receiving the information of the equipment to be tested, the communication chip is used for establishing communication between the USB interface and the I2C interface, receiving the information of the equipment to be tested and sending the information of the equipment to be tested to the automatic test platform.
The display information includes other device state information and device information to be tested, such as operation state of the device, current voltage value, etc.
According to the embodiment, the information reporting module sends display information to the display module, and the display information is output to the outside through the LCD display screen in the display module, wherein the display information comprises other equipment state information and equipment information to be tested, a corresponding control instruction is generated in the Linux host, the control instruction is sent to the relay control module, and the corresponding relay is controlled to be closed, so that hardware control of an automatic test platform is realized, the need of re-reading equipment information every time equipment to be tested is avoided, and the automatic test efficiency is improved.
Referring to fig. 5, fig. 5 is a schematic block diagram of an automated test platform hardware control device according to an embodiment of the present application, where the automated test platform hardware control device is configured to execute the foregoing automated test platform hardware control method. The automatic test platform hardware control device can be configured in an automatic test platform hardware control system.
As shown in fig. 5, the automated test platform hardware control device 400 includes:
the device to be tested information uploading module 10 is used for uploading the device to be tested information of the device to be tested to the Linux host by the interface module;
the control instruction generating module 20 is configured to parse the information of the device to be tested by using the Linux host, generate a control instruction corresponding to the information of the device to be tested, and send the control instruction to the relay control module;
and the control instruction execution module 30 is used for executing the closing operation corresponding to the control instruction according to the control instruction by a relay corresponding to the relay control module.
Further, the automated test platform hardware control device further comprises:
the information reporting module is used for determining the type of the equipment to be tested, acquiring the information of the equipment to be tested based on the type of the equipment to be tested, and sending the information of the equipment to be tested to the interface module.
Further, the automated test platform hardware control device further comprises:
the information display module is used for sending display information to the display module by the information reporting module and outputting the display information to the outside through an LCD (liquid crystal display) screen in the display module, wherein the display information comprises other equipment state information and equipment information to be tested.
It should be noted that, for convenience and brevity of description, the specific working process of the apparatus and each module described above may refer to the corresponding process in the foregoing method embodiment, which is not described herein again.
The apparatus described above may be implemented in the form of a computer program which is executable on a device as shown in fig. 6.
Referring to fig. 6, fig. 6 is a schematic block diagram of an apparatus according to an embodiment of the present application. The device may be a server.
Referring to fig. 6, the device includes a processor, a memory, and a network interface connected by a system bus, wherein the memory may include a non-volatile medium and an internal memory.
The non-volatile medium may store an operating system and a computer program. The computer program includes program instructions that, when executed, cause the processor to perform any one of a number of automated test platform hardware control methods.
The processor is used to provide computing and control capabilities to support the operation of the entire device.
The internal memory provides an environment for the execution of a computer program in a non-volatile medium that, when executed by the processor, causes the processor to perform any one of the automated test platform hardware control methods.
The network interface is used for network communication such as transmitting assigned tasks and the like. It will be appreciated by those skilled in the art that the structure shown in fig. 6 is merely a block diagram of a portion of the structure associated with the present application and does not constitute a limitation of the apparatus to which the present application is applied, and that a particular apparatus may include more or less components than those shown in the drawings, or may combine certain components, or have a different arrangement of components.
It should be appreciated that the processor may be a central processing unit (Central Processing Unit, CPU), but may also be other general purpose processors, digital signal processors (Digital Signal Processor, DSP), application specific integrated circuits (Application Specific Integrated Circuit, ASIC), field-programmable gate arrays (Field-Programmable Gate Array, FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, or the like. Wherein the general purpose processor may be a microprocessor or the processor may be any conventional processor or the like.
Wherein in one embodiment the processor is configured to run a computer program stored in the memory to implement the steps of:
the interface module uploads the information of the equipment to be tested to the Linux host;
the Linux host analyzes the information of the equipment to be detected, generates a control instruction corresponding to the information of the equipment to be detected, and sends the control instruction to the relay control module;
and executing closing operation corresponding to the control instruction by a relay corresponding to the relay control module according to the control instruction.
In one embodiment, before the interface module uploads the device information to be tested of the device to be tested to the Linux host, the interface module is configured to implement:
the information reporting module determines the type of the equipment to be tested, acquires the information of the equipment to be tested based on the type of the equipment to be tested, and sends the information of the equipment to be tested to the interface module.
In one embodiment, the Linux host analyzes the device information to be tested, generates a control instruction corresponding to the device information to be tested, and is used for realizing before the control instruction is sent to the relay control module:
the information reporting module sends display information to the display module, and the display information is output to the outside through an LCD display screen in the display module, wherein the display information comprises other equipment state information and equipment information to be tested.
The embodiment of the application also provides a medium, wherein the medium stores a computer program, the computer program comprises program instructions, and the processor executes the program instructions to realize any one of the hardware control methods of the automatic test platform provided by the embodiment of the application.
The medium may be an internal storage unit of the device according to the foregoing embodiment, for example, a hard disk or a memory of the device. The medium may also be an external storage device of the device, such as a plug-in hard disk, a Smart Media Card (SMC), a Secure Digital (SD) Card, a Flash memory Card (Flash Card) or the like, which are provided on the device.
While the invention has been described with reference to certain preferred embodiments, it will be understood by those skilled in the art that various changes and substitutions of equivalents may be made and equivalents will be apparent to those skilled in the art without departing from the scope of the invention. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.

Claims (11)

1. An automated test platform hardware control system, the automated test platform hardware control system comprising: the system comprises a Linux host, an interface module, an information reporting module, a display module and a relay control module;
one end of the Linux host is connected with the interface module, the other end of the Linux host is connected with the relay control module, and the Linux host is used for receiving the information of the device to be tested forwarded by the interface module and generating a control instruction;
one end of the interface module is connected with the information reporting module, the other end of the interface module is connected with the Linux host, and the interface module is used for receiving the information of the equipment to be tested and forwarding the information of the equipment to be tested to the Linux host;
one end of the information reporting module is connected with the interface module, the other end of the information reporting module is connected with the equipment to be tested, and the information reporting module is used for acquiring the information of the equipment to be tested and sending the information of the equipment to be tested to the interface module;
the display module is connected with the interface module and is used for displaying the information of the equipment to be tested;
the relay control module is connected with the Linux host, and is used for receiving the control instruction from the Linux host and controlling the internal relay to be closed based on the control instruction.
2. The automated test platform hardware control system of claim 1, wherein the interface module comprises: USB interface, I2C interface and communication chip;
the USB interface is used for being connected with the equipment to be tested;
the I2C interface is used for receiving the information of the equipment to be tested;
the communication chip is used for establishing communication between the USB interface and the I2C interface, receiving the information of the equipment to be tested and sending the information of the equipment to be tested to the automatic test platform.
3. The automated test platform hardware control system of claim 1, wherein the display module comprises: an LCD display screen and a first I2C chip;
the first I2C chip is used for receiving the equipment information to be tested forwarded by the automatic test platform;
the LCD display screen is used for displaying the information of the equipment to be tested.
4. The automated test platform hardware control system of claim 1, wherein the information reporting module comprises: a rotary encoding switch and a second I2C chip;
the rotary coding switch is used for determining the type of the equipment to be detected and acquiring the information of the equipment to be detected;
the second I2C chip is configured to send the device type to be tested to the interface module.
5. The automated test platform hardware control system of claim 1, wherein the relay control module comprises: a relay and a third I2C chip;
the third I2C chip is used for receiving the control instruction;
and the relay is used for performing corresponding closing actions according to the control instruction.
6. The automatic test platform hardware control method is characterized in that the automatic test platform hardware control method is applied to an automatic test platform hardware control system, the automatic test platform hardware control system comprises an interface module, a Linux host and a relay control module, and the method comprises the following steps:
the interface module uploads the information of the equipment to be tested to the Linux host;
the Linux host analyzes the information of the equipment to be detected, generates a control instruction corresponding to the information of the equipment to be detected, and sends the control instruction to the relay control module;
and executing closing operation corresponding to the control instruction by a relay corresponding to the relay control module according to the control instruction.
7. The method for controlling hardware of an automatic test platform according to claim 6, wherein the automatic test platform hardware control system further comprises an information reporting module, and the interface module comprises:
the information reporting module determines the type of the equipment to be tested, acquires the information of the equipment to be tested based on the type of the equipment to be tested, and sends the information of the equipment to be tested to the interface module.
8. The method for controlling hardware of an automated test platform according to claim 7, wherein the automated test platform hardware control system further comprises a display module, and the Linux host computer analyzes the device information to be tested, generates a control instruction corresponding to the device information to be tested, and sends the control instruction to the relay control module, and comprises:
the information reporting module sends display information to the display module, and the display information is output to the outside through an LCD display screen in the display module, wherein the display information comprises other equipment state information and equipment information to be tested.
9. An automated test platform hardware control device, comprising:
the device to be tested information uploading module is used for uploading the device to be tested information of the device to be tested to the Linux host computer through the interface module;
the control instruction generation module is used for analyzing the information of the equipment to be detected by the Linux host computer, generating a control instruction corresponding to the information of the equipment to be detected and sending the control instruction to the relay control module;
and the control instruction execution module is used for executing the closing operation corresponding to the control instruction according to the control instruction by a relay corresponding to the relay inside the relay control module.
10. A computer device, the device comprising a memory and a processor;
the memory is used for storing a computer program;
the processor for executing the computer program and implementing the automated test platform hardware control method according to any one of claims 6 to 8 when the computer program is executed.
11. A storage medium storing a computer program which, when executed by a processor, causes the processor to implement the automated test platform hardware control method of any one of claims 6 to 8.
CN202310371777.8A 2023-03-30 2023-03-30 Automatic test platform hardware control system, method, device, equipment and medium Pending CN116560260A (en)

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Applications Claiming Priority (1)

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CN202310371777.8A CN116560260A (en) 2023-03-30 2023-03-30 Automatic test platform hardware control system, method, device, equipment and medium

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CN116560260A true CN116560260A (en) 2023-08-08

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