CN116548990A - Method for obtaining high-resolution image based on X-rays - Google Patents
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- 238000000034 method Methods 0.000 title claims abstract description 25
- 238000004846 x-ray emission Methods 0.000 claims abstract description 12
- 230000001678 irradiating effect Effects 0.000 claims abstract description 8
- 238000010894 electron beam technology Methods 0.000 claims description 21
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- A61B6/5241—Devices using data or image processing specially adapted for radiation diagnosis involving processing of medical diagnostic data combining image data of a patient, e.g. combining a functional image with an anatomical image combining images from the same or different ionising radiation imaging techniques, e.g. PET and CT combining overlapping images of the same imaging modality, e.g. by stitching
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Abstract
The invention discloses a method for obtaining a high-resolution image based on X-rays, which comprises the following steps: constructing an X-ray combined emission source; the X-ray combined emission source consists of a plurality of micro emission sources; the diameter of an X-ray emission light spot emitted by the micro emission source is smaller than a preset value; exciting the X-ray combined emission source to generate a plurality of X-ray single beams, and irradiating a target object to obtain a plurality of substantially identical blurred images; and carrying out numerical processing on a plurality of substantially identical blurred images so as to obtain clear and high-resolution target images. The invention has the beneficial effects that: high resolution and high speed and low radiation dose imaging X-ray images with exposure times less than 10 microseconds for human X-ray spots of a predetermined value (e.g., less than 50 microns) can be produced without increasing the radiation dose, thereby overcoming one or more of the problems due to the limitations and disadvantages of the related art to a certain extent.
Description
Technical Field
The invention relates to the field of X-ray imaging, in particular to a method for obtaining a high-resolution image based on X-rays.
Background
X-rays are widely applied in the fields of industrial nondestructive detection, safety inspection, medical diagnosis, treatment and the like, and particularly, X-ray perspective imaging equipment manufactured by utilizing the high penetrating power of the X-rays plays an important role in various aspects of daily life of people. Such devices were earlier plastic-type planar perspective imaging devices, and have been developed as digital, multi-view, and high-resolution stereoscopic imaging devices, such as CT (Computed Tomography, electronic computed tomography) devices, that can obtain high-definition, large-area (e.g., human) three-dimensional stereoscopic or slice images. However, in conventional radiography, the resolution is limited by the physical properties of the emission light source (X-ray emission spot size, X-ray emission intensity, etc.), and in medical X-ray imaging devices, the resolution can generally only reach sub-centimeter levels. Substances or tissues with poor X-ray absorption capacity have low X-ray absorption degree, images lack contrast, resolution is poorer, and contrast effect is not ideal.
To achieve high resolution (< 50 μm) X-ray imaging and medical imaging of X-ray tomography, an X-ray source with high brightness is required.
The brightness of the light source is determined by three factors of the radiation emission opening angle, the size of the emission light spot and the emission intensity of the light source.
Under the condition of fixed light source emission intensity, the brightness can be improved by reducing the emission opening angle or the light spot area. However, conventional, asynchronously-radiating X-ray sources emit X-rays with almost no directivity, and therefore have a very large emission opening angle.
In X-ray imaging techniques that do not use optical components to manipulate the X-ray emission properties, the only viable way to increase the resolution of the imaging is to reduce the spot of X-ray emission. The X-ray emission is generated by bombarding a metal target by a high-energy electron beam, the spot size can be realized by regulating and controlling the focusing of the electron beam, and the sub-micron or even nanometer or below can be achieved theoretically. However, since electrons move in the metal target at a high speed after the bombardment of the high-energy electron beam, the X-ray emission area excited by the electrons is generally larger than the area bombarded by the high-energy electron beam and reaches the micrometer scale or more, the resolution of the traditional X-ray light source cannot reach the micrometer or less.
The micro-focus X-ray generator can reduce the X-ray emission spot to below 10 microns, but the X-rays generated by electron bombardment have a very large emission angle, and when a sample is at a certain distance from the emission source, the X-ray flux (the number of photons per unit area) reaching the sample is greatly reduced (inversely proportional to the square of the distance), so that medical imaging of a human body or living animals by using micro-focus X-rays is very difficult in practice.
After long exposure, low-flux X-ray imaging can significantly lose high resolution of the image due to movement of the specimen itself. However, the emission intensity brightness per unit area of the micro-focus X-ray source is limited by the power density tolerated by the electron bombarded metal target and cannot be infinitely increased. For example, chest radiographs, typically do not have exposure times in excess of several to tens of microseconds to avoid blurring of the image, loss of resolution and image contrast due to heart and lung motion. If one tries to perform high shutter speed imaging (e.g., chest radiography) with a micro-focus X-ray source with millisecond exposure, the required X-ray intensity will far exceed the limit at which X-set can occur before melting the metal due to electron bombardment.
Therefore, the resolution of the image is low due to long exposure time caused by the oversized light spot or low brightness, which not only reduces the definition of the image and affects the quality of the image, but also the contrast of the image is eroded by the low-resolution X-ray image, including the contour contrast improvement caused by the refraction of the X-ray edge. This is why conventional X-ray imaging can only image contrast differences caused by differences in the absorption capacity of X-rays with materials, whereas soft tissues with close absorption contrast have no imaging capacity at all.
Therefore, the high resolution of the micro-focus (to <20 microns) X-ray source can improve the profile contrast of the edge of soft tissue, thereby having great potential advantages and prospects in medical application, but at the same time, the clinical application of high-resolution medical imaging devices and the like requires short exposure time and is subject to the problem that the metal target is bombarded by high-energy electrons.
Disclosure of Invention
In order to solve the technical problems of unobvious X-ray imaging contrast and low resolution in the prior art, the invention provides a method for obtaining a high-resolution image based on X-rays, which comprises the following steps:
s1, constructing an X-ray combined emission source; the X-ray combined emission source consists of a plurality of micro emission sources; the diameter of an X-ray emission light spot emitted by the micro emission source is smaller than a preset value;
s2, exciting the X-ray combined emission source to generate a plurality of X-ray single beams, and irradiating a target object to obtain a plurality of substantially identical images;
s3, performing image processing on a plurality of substantially identical images to obtain a final high-resolution enhanced image.
The beneficial effects provided by the invention are as follows: x-ray images having a high resolution of better than 50 μm and a high-speed imaging of the human body with an exposure time of less than 10 microseconds can be produced without increasing the radiation dose, thereby overcoming one or more of the problems due to the limitations and disadvantages of the related art to a certain extent.
Drawings
FIG. 1 is a schematic flow chart of the method of the present invention;
FIG. 2 is a schematic view of the structure of an X-ray combined emission source;
FIG. 3 is a schematic view of an X-ray taken sample imaging;
FIG. 4 is a schematic illustration of a reflective X-ray source;
FIG. 5 is a schematic illustration of a transmission X-ray source assembly;
FIG. 6 is a schematic view of another X-ray combined emission source;
FIG. 7 is a schematic diagram of an alternative excitation pattern of an X-ray combined emission source;
FIG. 8 is a schematic diagram of the processing results of the method of the present invention.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the present invention more apparent, embodiments of the present invention will be further described with reference to the accompanying drawings.
Referring to fig. 1, fig. 1 is a flow chart of the method of the present invention. The invention provides a method for obtaining a high-resolution image based on X-rays, which comprises the following steps:
s1, constructing an X-ray combined emission source; the X-ray combined emission source consists of a plurality of micro emission sources; the diameter of an X-ray emission light spot emitted by the micro emission source is smaller than a preset value;
s2, exciting the X-ray combined emission source to generate a plurality of X-ray single beams, and irradiating a target object to obtain a plurality of substantially identical images;
referring to fig. 2, fig. 2 is a schematic structural diagram of an X-ray combined emission source; it should be noted that the X-ray combined emission source of the present invention is a composite body in which a plurality of micro emission sources are arranged on the same plane substrate, the number of the micro emission sources is not less than 2, and when the composite body is bombarded by large-area electron beams, all the micro emission sources can emit X-rays simultaneously to form a large light source composed of a plurality of small light sources; each micro-emission source may produce a separate blurred image when the subject is photographed.
As an embodiment, the diameter of the X-ray emitting area (as shown in fig. 2, diameter d) of the X-ray combined emitting source from the single micro-emitting source is smaller than 50 micrometers, so that the single micro-X-ray emitting source can independently generate X-ray images with resolution similar to the size of the emitting area.
As an example, when a single micro-emitter is less than 1 micron, coating with diamond or a low atomic weight material may produce an X-ray spot less than 1 micron, enabling nano-resolution imaging.
It should be noted that, in the X-ray combined emission source of the present invention, flexible arrangement may be adopted between the micro emission sources, and the distance (as shown in fig. 2, length L) between the single micro emission sources is smaller than the coherence length (for example, 1 micron) of the excitation light (for example, electron beam) for exciting and generating the X-rays, so that the X-rays emitted by the single X-ray micro emission sources have high coherence therebetween and can be used as a high-coherence X-ray source.
It should be noted that, in order to ensure that the final image generated by the single micro-emission source is the same or substantially the same, the material of the single micro-emission source is metal capable of generating X-rays under electron bombardment, the shape of the single micro-emission source should be the same or the same as possible (for example, the single micro-emission source is cylindrical, other shapes may be adopted in some other embodiments), the bottom circle is an X-ray emission surface, and the diameter of the light emitting area of the single micro-emission source is less than 50 micrometers, so that the single micro-emission source can independently generate X-ray images with resolution similar to the size of the emission area.
S3, performing image processing on a plurality of substantially identical images to obtain a final enhanced image;
the images that are substantially identical, specifically, a plurality of images, are taken with a positional difference (determined by the irradiation position of the emission source) therebetween.
In the image processing described in the present application, a plurality of substantially identical images are superimposed, and because there is a positional difference between imaging contents of the plurality of images, the superimposed images are blurred images.
Further, the present application processes the blurred image to obtain a target image having brightness as a superimposed image, but having resolution as a single image.
In this application, the image processing method is an algorithm such as image deconvolution and artificial intelligent image learning.
In step S3, a plurality of substantially identical images are processed, and a processing manner adopted to obtain a single image with high resolution and high image intensity is specifically as follows: the known relation between the multiple image acquisition modes and the relative positions of the target and the X-ray combined emission source is used for reducing multiple images which are acquired at the same time and generated by the irradiation of the target by the multiple X-ray single beams into multiple images which are regarded as the same substantially, and the multiple substantial images are overlapped to obtain a single high-resolution high-image-intensity image after being subjected to proper relative movement.
The known relationship between the multiple image acquisition modes and the relative positions of the target and the X-ray combined emission source may be used to treat multiple images generated by irradiating the target with multiple X-rays in an artificial intelligence image processing mode as images acquired at the same time, thereby obtaining a single high-resolution high-image-intensity image.
The known relation between the multiple image acquisition modes and the relative positions of the target and the X-ray combined emission source can be used for obtaining three-dimensional images by using an artificial intelligence image processing mode to treat images generated by irradiating the target with multiple X-rays in a single beam as images irradiated to the target at different angles in the tomographic scanning and using a tomographic scanning reconstruction algorithm.
It should be noted that, the known relationship between the interference image generated by the irradiation of the object by the high-coherence X-ray micro-emission source and the relative position of the object and the high-coherence X-ray combined emission source may also be used to obtain a high-resolution image.
It should be noted that, the image processing method of the present invention performs superposition calculation processing on the X-ray images generated by all the single X-ray micro-emission sources, which are related to the distance between the X-ray micro-emission sources, the diameter of the emission surface, and the opening angle of the photographed sample.
As an example, please refer to fig. 3, fig. 3 is a schematic diagram of an X-ray imaging of a sample. When the distance (L) between two X-ray micro-emission sources (fig. 3, length L) is smaller than 10 times the size of the light emitting area (fig. 2, diameter d), and the ratio (L/h) of the distance (L) between the X-ray micro-emission sources and the sample (fig. 3, length h) is smaller than 0.02 or 0.01, all X-ray images generated by the single X-ray micro-emission sources can be treated as the same image for processing (fig. 3, projection imaging part).
As an embodiment, when the distance between two X-ray micro-emission sources is greater than 10 times of the size of the light emitting area (as shown in figure one and diameter d), the ratio (L/h) of the distance between the X-ray micro-emission sources and the sample is greater than 0.1, i.e. the distance is greater than 0.1 radian at the opening angle (L/h) of the sample, all X-ray images generated by the single X-ray micro-emission sources can be regarded as images of different angles during tomographic imaging, and the tomographic three-dimensional imaging is completed by using a tomographic reconstruction mode without rotating the light source/the image detector.
The excitation method for exciting the X-ray combined emission source in step S2 is specifically as follows.
The excitation mode of the invention is a mode and a way of bombarding the X-ray combined emission source by adopting electron beams generated by a large excitation light source or an electron gun, so that the X-ray combined emission source generates specific X-rays.
It should be noted that, the X-ray combined emission source is excited by a single excitation source (e.g. high-energy electron beam) to simultaneously excite all the micro emission sources, so as to generate a plurality of X-ray single-beam irradiation targets, generate a plurality of images which can be regarded as the same time, and acquire a single image at the same exposure time by the image detector.
It should be noted that, the X-ray combined emission source is capable of exciting the respective micro emission sources at different times (but at a time interval longer than the exposure time of the detector) by a single excitation source (e.g., a high-energy electron beam), and multiple images generated by irradiating the target with multiple X-rays by a single beam can be acquired by the detector.
Referring to fig. 4, fig. 4 is a schematic diagram of a reflective X-ray combined emission source; the excitation mode is that high-energy electron beams are adopted to bombard the emission surface of the emission source from the front surface of the X-ray combined emission source at a certain angle, and each micro emission source generates X-rays from the reflection direction of electron bombardment, as shown in fig. 4.
Referring to fig. 5, fig. 5 is a schematic view of a transmission type X-ray combined emission source; the excitation mode is that the high-energy electron beam is adopted to bombard the micro-emission sources from the back of the X-ray combined emission source in a penetrating mode, and each micro-emission source generates X-rays along the electron bombardment direction as shown in fig. 5.
The excitation mode is to scan the high-energy electron beam emitted by the electron gun through the combined emission source in a transmission or reflection mode. Each high-energy electron pulse bombards the micro-emission source at a different position of the combined emission source and generates X-rays in a corresponding direction.
The method does not damage the metal target due to excessive electron bombardment per unit area while generating sufficient total photon flux for radiological and tomographic applications.
The image acquisition time can reach the same level as conventional clinical radiology systems and phase contrast radiation and tomography can be performed on such systems by replacing the X-ray generator with a conventional source of radiation.
As another embodiment, the X-ray combined emission source of the present invention may further comprise: and the metal substrate is formed by the electron bombardment part which can correspondingly generate X rays after being wholly or partially bombarded by electrons.
Referring to fig. 6, fig. 6 is a schematic diagram of another X-ray combined emission source.
The metal base plate is excited in the following manner: and bombarding the metal substrate in sequence by adopting a pulse high-energy electron beam according to the arrangement positions which are arranged on the metal substrate plate in a preset manner at certain intervals, so as to generate a plurality of X-rays with different time, and generate a plurality of substantially identical images.
As shown on the left side of fig. 6, the electron generator generates a high energy electron beam at time t1, and the electron generator shown in fig. 6 is pulsed, i.e. generates a beam at a certain time. At the time t1, the electron beam bombards the n1 position of the metal base plate, so that X rays of the n1 position at the time t1 are generated;
the right side of fig. 6 shows a high-energy electron beam generated by the electron generator at time t2, which bombards the n2 position of the metal base plate at time t2, thereby generating X-rays at time t2, n2 position;
the X-rays at other times are as above, and the above-mentioned t1, n1, t2, and n2 positions may be preset according to actual conditions, and are only for explanation and not limitation.
Further, referring to fig. 7, fig. 7 is an overall schematic diagram of another excitation method of an X-ray combined emission source. Based on the above explanation, the high-energy electron beam strikes the metal base plate at a predetermined time, a striking position, thereby forming a plurality of X-rays, thereby generating a plurality of substantially identical images.
The image recorded on one detection system is a superposition of radiographic images produced by a single micro X-ray source that appears very blurred prior to processing. A high resolution image with a resolution similar to the size of a single source can be computed by a priori knowledge of the geometry of the image and the single source. The image after deconvolution and superposition of the plurality of pictures becomes clearer and has high resolution. Referring to fig. 8, fig. 8 is a schematic diagram of a processing result of the method of the present invention; the left side of fig. 8 is an image generated by a single micro-radiation source, and the right side of fig. 8 is an image generated after superposition of the present application.
The invention can replace the X-ray tube of the traditional X-ray generator without modifying other hardware parts of the radiation or tomography system, so that the invention can be matched with the X-ray imaging and tomography system with extremely wide medical and industrial diagnosis application in the most economical way, and greatly improves the resolution and contrast thereof. Meanwhile, the invention can be matched with a rapid imaging X-ray detector to obtain clearer and higher-resolution images.
In combination, the invention has the beneficial effects that: x-ray images having a high resolution of better than 50 μm and a high-speed imaging of the human body with an exposure time of less than 10 microseconds can be produced without increasing the radiation dose, thereby overcoming one or more of the problems due to the limitations and disadvantages of the related art to a certain extent.
The foregoing description of the preferred embodiments of the invention is not intended to limit the invention to the precise form disclosed, and any such modifications, equivalents, and alternatives falling within the spirit and scope of the invention are intended to be included within the scope of the invention.
Claims (10)
1. A method for obtaining a high resolution image based on X-rays, characterized by: the method comprises the following steps:
s1, constructing an X-ray combined emission source; the X-ray combined emission source consists of a plurality of micro emission sources; the diameter of an X-ray emission light spot emitted by the micro emission source is smaller than a preset value;
s2, exciting the X-ray combined emission source to generate a plurality of X-ray single beams, and irradiating a target object to obtain a plurality of substantially identical images;
s3, performing image processing on a plurality of substantially identical images to obtain a final high-resolution enhanced image.
2. A method of obtaining a high resolution image based on X-rays according to claim 1, wherein: the X-ray combined emission sources are a complex of a plurality of micro emission sources arranged on the same plane substrate, and the number of the micro emission sources is more than or equal to 2.
3. A method of obtaining a high resolution image based on X-rays according to claim 1, wherein: the arrangement space between adjacent micro-emission sources is smaller than the coherence length of excitation light generated by exciting the X-ray combined emission sources in the step S2, and the micro-emission sources generate high coherence X-rays.
4. A method of obtaining a high resolution image based on X-rays according to claim 1, wherein: when the distance L between two adjacent micro-emission sources is smaller than the size of the light-emitting area of a preset multiple, and the ratio of the distance between the distance and the sample of the micro-emission sources is smaller than a preset value, a plurality of images generated by irradiating the target object by a plurality of X-ray single beams are regarded as the substantially same image.
5. A method of obtaining a high resolution image based on X-rays according to claim 1, wherein: the electron beam bombards the X-ray combined emission source in a transmission type or reflection type.
6. A method of obtaining a high resolution image based on X-rays according to claim 5, wherein: the transmission type concretely refers to: all the micro-emission sources in the X-ray combined emission source are simultaneously bombarded in a penetrating manner from the back of the X-ray combined emission source by using a high-energy electron beam, and each micro-emission source generates X-rays along the electron bombardment direction.
7. A method of obtaining a high resolution image based on X-rays according to claim 6, wherein: the reflecting type concretely refers to: the high-energy electron beam is adopted to bombard the emitting surfaces of all the micro-emitting sources in the X-ray combined emitting source at a certain angle from the front surface of the X-ray combined emitting source, and each micro-emitting source generates X-rays from the reflecting direction of electron bombardment.
8. A method of obtaining high resolution images based on X-rays according to claim 1, wherein said X-ray combined emission source is further comprised of: and the metal substrate is formed by the electron bombardment part which can correspondingly generate X rays after being wholly or partially bombarded by electrons.
9. The method for obtaining high resolution images based on X-rays according to claim 8, wherein the metal base plate is excited by: and bombarding the metal substrate in sequence by adopting a pulse high-energy electron beam according to the arrangement positions which are arranged on the metal substrate plate in a preset manner at certain intervals, so as to generate a plurality of X-rays with different time, and generate a plurality of substantially identical images.
10. A method for obtaining high resolution images based on X-rays according to claim 8, wherein said image processing in step S3 is in particular deconvolution or artificial intelligence image algorithm processing.
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