CN116539948A - Isolated transient short-circuit current test circuit - Google Patents
Isolated transient short-circuit current test circuit Download PDFInfo
- Publication number
- CN116539948A CN116539948A CN202310592258.4A CN202310592258A CN116539948A CN 116539948 A CN116539948 A CN 116539948A CN 202310592258 A CN202310592258 A CN 202310592258A CN 116539948 A CN116539948 A CN 116539948A
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- 238000012360 testing method Methods 0.000 title claims abstract description 92
- 230000001052 transient effect Effects 0.000 title claims abstract description 28
- 239000003990 capacitor Substances 0.000 claims abstract description 24
- 238000002955 isolation Methods 0.000 claims abstract description 19
- 230000009466 transformation Effects 0.000 claims abstract description 5
- 238000004146 energy storage Methods 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000011990 functional testing Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 230000003321 amplification Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0092—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/18—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers
Abstract
The invention belongs to the technical field of power device testing, in particular to an isolated transient short-circuit current testing circuit which comprises a direct-current power supply module, PWM1, PWM2, high-end drive, low-end drive, a device to be tested Q1, a device to be tested Q2, a filter inductor L, a load capacitor Co, a load resistor Ro, an adjustable isolation testing module and an oscilloscope; the direct current power supply module comprises a direct current power supply and a bus capacitor. The adjustable isolation test module in the circuit comprises two groups of transformers with adjustable turns ratio, and because the structure adopts the transformers, the electric isolation between the circuit to be tested and the oscilloscope is realized, the oscilloscope is not connected into a test loop, the safety of the oscilloscope can be improved, and good protection is realized; the number of turns of the end of the transformer connected with the test circuit is fixed, the number of turns of the end of the transformer connected with the oscilloscope is adjustable, the transformation ratio of the transformer can be adjusted from three gears of 2:1,1:1 and 2:3, the test range of current can be effectively expanded, the test precision is maintained in a larger working range, and the practicability is strong.
Description
Technical Field
The invention belongs to the technical field of power device testing, and particularly relates to an isolated transient short-circuit current testing circuit.
Background
In a power electronic system, transient short-circuit current is an important requirement for testing the reliability of a device, and is a necessary process for testing the device before application, and a traditional short-circuit current testing scheme needs to connect an oscilloscope testing end into a testing circuit, so that the safety of the oscilloscope is threatened due to the extremely large short-circuit instant current. Some isolated test schemes are proposed in the subsequent test schemes.
In the prior art, an isolated transient short-circuit current testing system and method are provided, wherein the two thin film piezoresistors are used for forming isolation between a circuit to be tested and an oscilloscope, but because the voltage range of the thin film piezoresistors is limited, the formed signals are smaller, signal amplification is required, higher precision is realized under the condition of large current, and the testing precision of the smaller current is difficult to meet;
therefore, it is necessary to provide an isolated transient short-circuit current test circuit, so as to effectively improve the above problems.
Disclosure of Invention
In order to solve the problems in the prior art, the invention provides an isolated transient short-circuit current testing circuit which has the characteristics of meeting the driving requirements and functional tests of GaN HEMTs, si-based power devices and SiC power devices, improving the safety of oscilloscopes, realizing good protection, effectively expanding the testing range of current and keeping the testing precision in a larger working range.
In order to achieve the above purpose, the present invention provides the following technical solutions: an isolated transient short-circuit current test circuit comprises a direct-current power supply module, PWM1, PWM2, high-end drive, low-end drive, a device to be tested Q1, a device to be tested Q2, a filter inductor L, a load capacitor Co, a load resistor Ro, an adjustable isolation test module and an oscilloscope; the direct current power supply module comprises a direct current power supply and a bus capacitor; the drain electrode of the device to be tested Q1 is connected with the positive electrode of the power supply through the adjustable test module, the source electrode of the device to be tested Q2 is connected with the negative electrode of the power supply through the adjustable test module, the grid electrodes of the device to be tested Q1 and the device to be tested Q2 are respectively connected with a high-end drive and a low-end drive, the source electrode of the device to be tested Q1 is connected with a load capacitor Co and a load resistor Ro through a filter inductor L, the load capacitor Co is electrically connected with the load resistor Ro, the drain electrode of the device to be tested Q2 is electrically connected with the load capacitor Co and the load resistor Ro, and the input end of the oscilloscope is connected with the output end of the adjustable isolation test module.
As an optimized technical scheme of the isolated transient short-circuit current testing circuit, PWM1 and PWM2 respectively provide control signals for high-side and low-side devices to be tested Q1 and Q2 through high-side driving and low-side driving.
As an optimized technical scheme of the isolated transient short-circuit current testing circuit, the oscilloscope is provided with two input ends, namely I1 and I2 respectively.
As an optimized technical scheme of the isolated transient short-circuit current testing circuit, the direct-current power supply and the bus capacitor provide stable direct-current power supply for the circuit to be tested.
As an optimized technical scheme of the isolated transient short-circuit current test circuit, the DC voltage range is 1-650V, and the bus capacitor provides energy storage.
As an optimized technical scheme of the isolated transient short-circuit current test circuit, the filter inductor L, the load capacitor Co and the load resistor Ro form a test circuit load, so that the test circuit load is convenient to disassemble and has test flexibility.
As an optimized technical scheme of the isolated transient short-circuit current testing circuit, the adjustable isolation testing module comprises two groups of transformers with adjustable turns ratio, and an oscilloscope is not connected into a testing loop.
As an optimized technical scheme of the isolated transient short-circuit current test circuit, the number of turns of the end of the transformer connected with the test circuit is fixed, the number of turns of the end of the transformer connected with the oscilloscope is adjustable, and the transformation ratio of the transformer connected with the oscilloscope comprises three gears of 2:1,1:1 and 2:3.
Compared with the prior art, the invention has the beneficial effects that:
1. when the invention is used, the high-end drive and the low-end drive are used for providing control signals for the high-end and low-end devices Q1 and Q2 to be tested, the PWM1 and PWM2 signals have uniform reference time starting points, but the time sequence and the pulse width are mutually separated, the Q1 and the Q2 can be precisely controlled according to the test requirement, the on-off states of the drive signals and the devices to be tested are freely combined, and the test flexibility is improved;
meanwhile, the PWM1 and the PWM2 can maintain high level or low level unchanged, the power supply voltage range of high-end driving and low-end driving is 3.3-20V, the pulse voltage range is-5-20V, and the driving requirements and the function test of GaN HEMT, si-based power devices and SiC power devices are met.
2. When the adjustable isolation test module in the circuit is used, the adjustable isolation test module in the circuit comprises two groups of transformers with adjustable turns ratio, and because the structure adopts the transformers, the electric isolation between the circuit to be tested and the oscilloscope is realized, the oscilloscope is not connected into a test loop, the safety of the oscilloscope can be improved, and good protection is realized;
the number of turns of the end of the transformer connected with the test circuit is fixed, the number of turns of the end of the transformer connected with the oscilloscope is adjustable, the transformation ratio of the transformer can be adjusted from three gears of 2:1,1:1 and 2:3, the test range of current can be effectively expanded, the test precision is maintained in a larger working range, and the practicability is strong.
Drawings
The accompanying drawings are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate the invention and together with the embodiments of the invention, serve to explain the invention. In the drawings:
FIG. 1 is a circuit diagram of an isolated transient short circuit current test of the present invention;
FIG. 2 is a schematic diagram of an adjustable isolation test module in an isolated transient short-circuit current test circuit according to the present invention.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Examples
Referring to fig. 1 and 2, the present invention provides the following technical solutions: an isolated transient short-circuit current test circuit comprises a direct-current power supply module, PWM1, PWM2, high-end drive, low-end drive, a device to be tested Q1, the device to be tested Q2, a filter inductor L, a load capacitor Co, a load resistor Ro, an adjustable isolation test module and an oscilloscope; the adjustable isolation test module is provided with a gating switch, so that the conversion of corresponding circuit functions can be realized, the prior art means can be realized through physical or electronic control, and excessive description is not needed;
the circuit comprises a direct current power supply module which comprises a power supply (direct current power supply) and a bus capacitor, wherein the anode and the cathode of the direct current power supply are electrically connected with a node of the bus capacitor to provide stable direct current power supply for the circuit to be tested; the direct-current voltage range is 1-650V so as to meet the test conditions of the withstand voltage range of a common power device, and the bus capacitor provides energy storage, so that the corresponding speed of transient output current can be effectively improved;
the drain electrode of the device to be tested Q1 is connected with the positive electrode of the power supply through the adjustable test module, the source electrode of the device to be tested Q2 is connected with the negative electrode of the power supply through the adjustable test module, the gate ends of the device to be tested Q1 and the device to be tested Q2 are respectively connected with a high-end drive and a low-end drive, the source end of the device to be tested Q1 is connected with a load capacitor Co and a load resistor Ro through a filter inductor L, the load capacitor Co is electrically connected with the load resistor Ro, the drain end of the device to be tested Q2 is electrically connected with the load capacitor Co and the load resistor Ro, and the input end of the oscilloscope is connected with the output end of the adjustable isolation test module.
PWM1 and PWM2 provide control signals (provide independent PWM signals) for high-end and low-end devices Q1 and Q2 to be tested through high-end drive and low-end drive respectively, PWM1 and PWM2 signals have unified reference time starting points, but time sequences and pulse widths are mutually separated, Q1 and Q2 can be precisely controlled according to test requirements, the on-off states of the drive signals and the devices to be tested are freely combined, and test flexibility is improved;
meanwhile, the high level or the low level of the PWM1 and the PWM2 can be kept unchanged (the PWM1 and the PWM2 are separated from each other and can provide a pulse signal and a continuous high or continuous low signal), and the power supply voltage of the high-end drive and the low-end drive ranges from 3.3V to 20V; the high-end drive provides a drive signal for the device to be tested Q1, and the low-end drive provides a drive signal for the device to be tested Q2; the pulse voltage range is-5-20V, and the driving requirement and the functional test of the GaN HEMT, the Si-based power device and the SiC power device are met.
The load part of the circuit comprises a filter inductance L, a load capacitance Co and a load resistance Ro, which are all of a detachable structure, can be exchanged according to test conditions, and has test flexibility;
the load resistor Ro has an output terminal, and can be connected to an electronic load according to a test requirement.
Referring to fig. 1, I1 and I2 are two input terminals of the oscilloscope, and can be connected with corresponding adjustable isolation test modules, so that necessary conditions are provided for normal operation of the circuit.
Referring to fig. 2, the adjustable isolation test module includes two groups of transformers with adjustable turns ratios, and can select different turns ratios according to different test scenes.
The number of turns of the end of the transformer connected with the test circuit is fixed, the number of turns of the end of the transformer connected with the oscilloscope is adjustable, and the transformation ratio of the transformer can be adjusted from three gears of 2:1,1:1 and 2:3;
and because the turns ratio of the transformer is adjustable, the testing range of the current can be effectively expanded, and the testing precision is maintained in a larger working range.
Finally, it should be noted that: the foregoing description is only a preferred embodiment of the present invention, and the present invention is not limited thereto, but it is to be understood that modifications and equivalents of some of the technical features described in the foregoing embodiments may be made by those skilled in the art, although the present invention has been described in detail with reference to the foregoing embodiments. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (8)
1. The isolated transient short-circuit current testing circuit is characterized by comprising a direct-current power supply module, PWM1, PWM2, high-end drive, low-end drive, a device to be tested Q1, a device to be tested Q2, a filter inductor L, a load capacitor Co, a load resistor Ro, an adjustable isolation testing module and an oscilloscope;
the direct current power supply module comprises a direct current power supply and a bus capacitor;
the drain electrode of the device to be tested Q1 is connected with the positive electrode of the power supply through the adjustable test module, the source electrode of the device to be tested Q2 is connected with the negative electrode of the power supply through the adjustable test module, the grid electrodes of the device to be tested Q1 and the device to be tested Q2 are respectively connected with a high-end drive and a low-end drive, the source electrode of the device to be tested Q1 is connected with a load capacitor Co and a load resistor Ro through a filter inductor L, the load capacitor Co is electrically connected with the load resistor Ro, the drain electrode of the device to be tested Q2 is electrically connected with the load capacitor Co and the load resistor Ro, and the input end of the oscilloscope is connected with the output end of the adjustable isolation test module.
2. The isolated transient short circuit current test circuit of claim 1, wherein: PWM1 and PWM2 provide control signals for high-side and low-side devices under test Q1 and Q2, respectively, through high-side and low-side driving.
3. The isolated transient short circuit current test circuit of claim 1, wherein: the oscilloscope has two input terminals, I1 and I2, respectively.
4. The isolated transient short circuit current test circuit of claim 1, wherein: the direct current power supply and the bus capacitor provide stable direct current power supply for the circuit to be tested.
5. The isolated transient short circuit current test circuit of claim 4, wherein: the direct-current voltage range is 1-650V, and the bus capacitor provides energy storage.
6. The isolated transient short circuit current test circuit of claim 1, wherein: the filter inductance L, the load capacitance Co and the load resistance Ro form a test circuit load, so that the test circuit load has test flexibility for the convenience of disassembling the structure.
7. The isolated transient short circuit current test circuit of claim 1, wherein: the adjustable isolation test module comprises two groups of transformers with adjustable turns ratio, and the oscilloscope is not connected into a test loop.
8. The isolated transient short circuit current test circuit of claim 7, wherein: the number of turns of the end of the transformer connected with the test circuit is fixed, the number of turns of the end of the transformer connected with the oscilloscope is adjustable, and the transformation ratio comprises three gears of 2:1,1:1 and 2:3.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310592258.4A CN116539948A (en) | 2023-05-24 | 2023-05-24 | Isolated transient short-circuit current test circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310592258.4A CN116539948A (en) | 2023-05-24 | 2023-05-24 | Isolated transient short-circuit current test circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN116539948A true CN116539948A (en) | 2023-08-04 |
Family
ID=87452271
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202310592258.4A Pending CN116539948A (en) | 2023-05-24 | 2023-05-24 | Isolated transient short-circuit current test circuit |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN116539948A (en) |
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2023
- 2023-05-24 CN CN202310592258.4A patent/CN116539948A/en active Pending
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