CN116499781B - Muffler testing method, system, device and medium - Google Patents
Muffler testing method, system, device and medium Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M99/00—Subject matter not provided for in other groups of this subclass
- G01M99/008—Subject matter not provided for in other groups of this subclass by doing functionality tests
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02T—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO TRANSPORTATION
- Y02T90/00—Enabling technologies or technologies with a potential or indirect contribution to GHG emissions mitigation
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Abstract
The embodiment of the specification provides a muffler testing method, a system, a device and a medium, wherein the method comprises the following steps: obtaining silencer parameters of the silencer; determining a test plan based on the muffler parameters; the test scheme includes gas generation parameters of the gas generating device; based on the sound parameter that data acquisition device gathered, confirm the amortization result of muffler to test scheme, amortization result includes: insertion loss and transfer loss; determining a performance of the muffler based on the silencing result, the performance including a silencing performance; wherein determining the test plan based on the muffler parameters comprises: obtaining a plurality of groups of candidate test schemes and candidate silencer feature vectors corresponding to each group of candidate test schemes; constructing a muffler feature vector based on the muffler parameters; a test scheme is determined based on the vector matching of the muffler feature vector and the candidate muffler feature vector.
Description
Description of the division
The application provides a divisional application for China application with the application date of 2022, 05-20 and the application number of 202210548805.4, which is named as a method and a system for testing a silencer based on a silencing testing device.
Technical Field
The present disclosure relates to the field of muffler technologies, and in particular, to a method, a system, a device, and a medium for testing a muffler.
Background
The silencer is a device which can allow air flow to pass through and effectively reduce noise transmission in a pipeline, and silencing performance detection is usually required after production, and the same silencing performance detection method cannot be adopted because different types of silencers are required to be used in different scenes and have different requirements on silencing performance. Accordingly, there is a need to provide a method that can employ targeted testing for different silencers.
Disclosure of Invention
One of the embodiments of the present specification provides a muffler testing method, the method including: obtaining silencer parameters of the silencer; determining a test scheme based on the muffler parameters; the test protocol includes gas generation parameters of the gas generating apparatus; based on the sound parameters collected by the data collection device, determining a silencing result of the silencer on the test scheme, wherein the silencing result comprises the following steps: insertion loss and transfer loss; determining a performance of the muffler based on the muffling result, the performance including a muffling performance; wherein said determining a test plan based on said muffler parameters comprises: obtaining a plurality of groups of candidate test schemes and candidate silencer feature vectors corresponding to each group of candidate test schemes; constructing a muffler feature vector based on the muffler parameters; the test scheme is determined based on a vector match of the muffler feature vector and a candidate muffler feature vector.
One of the embodiments of the present specification provides a noise abatement test system, comprising: the first acquisition module is used for acquiring silencer parameters of the silencer; a first determination module for determining a test scheme based on the muffler parameters; the test protocol includes gas generation parameters of the gas generating apparatus; the second acquisition module is used for acquiring sound parameters; the second determining module is configured to determine, based on the sound parameter, a silencing result of the test scheme by the silencer, where the silencing result includes: insertion loss and transfer loss; a third determining module for determining a performance of the muffler based on the silencing result, the performance including a silencing performance; wherein the first determination module is further configured to: obtaining a plurality of groups of candidate test schemes and candidate silencer feature vectors corresponding to each group of candidate test schemes; constructing a muffler feature vector based on the muffler parameters; the test scheme is determined based on a vector match of the muffler feature vector and a candidate muffler feature vector.
One of the embodiments of the present specification provides a muffler testing apparatus, including: the device comprises a test pipeline, a processor, a gas generating device, a silencer and a data acquisition device; the processor is configured to perform the following operations: obtaining silencer parameters of the silencer; determining a test scheme based on the muffler parameters; the test protocol includes gas generation parameters of the gas generating apparatus; based on the sound parameters collected by the data collection device, determining a silencing result of the silencer on the test scheme, wherein the silencing result comprises the following steps: insertion loss and transfer loss; determining a performance of the muffler based on the muffling result, the performance including a muffling performance; wherein said determining a test plan based on said muffler parameters comprises: obtaining a plurality of groups of candidate test schemes and candidate silencer feature vectors corresponding to each group of candidate test schemes; constructing a muffler feature vector based on the muffler parameters; the test scheme is determined based on a vector match of the muffler feature vector and a candidate muffler feature vector.
One of the embodiments of the present description provides a non-transitory computer-readable medium for storing instructions that, when executed by at least one processor, cause the at least one processor to implement a method of muffler testing based on a muffler testing device.
Drawings
The present specification will be further elucidated by way of example embodiments, which will be described in detail by means of the accompanying drawings. The embodiments are not limiting, in which like numerals represent like structures, wherein:
FIG. 1 is a diagram of an application scenario of a silencing test system according to some embodiments of the present description.
FIG. 2 is an exemplary frame diagram of a noise abatement test apparatus according to some embodiments of the present disclosure.
FIG. 3 is an exemplary flow chart of a muffler testing method according to some embodiments of the present description.
FIG. 4 is an exemplary flow chart for determining a test scenario according to some embodiments of the present description.
FIG. 5 is an exemplary flow chart for determining performance of a muffler based on a result of sound attenuation according to some embodiments of the present description.
FIG. 6 is a schematic diagram of a predictive model of sound deadening properties according to some embodiments of the present disclosure.
Detailed Description
In order to more clearly illustrate the technical solutions of the embodiments of the present specification, the drawings that are required to be used in the description of the embodiments will be briefly described below. It is apparent that the drawings in the following description are only some examples or embodiments of the present specification, and it is possible for those of ordinary skill in the art to apply the present specification to other similar situations according to the drawings without inventive effort. Unless otherwise apparent from the context of the language or otherwise specified, like reference numerals in the figures refer to like structures or operations.
It will be appreciated that "system," "apparatus," "unit" and/or "module" as used herein is one method for distinguishing between different components, elements, parts, portions or assemblies at different levels. However, if other words can achieve the same purpose, the words can be replaced by other expressions.
As used in this specification and the claims, the terms "a," "an," "the," and/or "the" are not specific to a singular, but may include a plurality, unless the context clearly dictates otherwise. In general, the terms "comprises" and "comprising" merely indicate that the steps and elements are explicitly identified, and they do not constitute an exclusive list, as other steps or elements may be included in a method or apparatus.
A flowchart is used in this specification to describe the operations performed by the system according to embodiments of the present specification. It should be appreciated that the preceding or following operations are not necessarily performed in order precisely. Rather, the steps may be processed in reverse order or simultaneously. Also, other operations may be added to or removed from these processes.
FIG. 1 is a diagram of an application scenario of a silencing test system according to some embodiments of the present description. As shown in fig. 1, the noise abatement test system 100 may include a processing device 110, a network 120, a storage device 130, and a noise abatement test apparatus 140.
Processing device 110 may be used to process information and/or data related to noise abatement test system 100. For example, processing device 110 may determine a test plan based on muffler parameters; for another example, the processing device 110 may determine the silencing result of the silencer to the test plan based on the sound parameters and determine the performance of the silencer based on the silencing result.
Storage device 130 may be used to store data and/or instructions. In some embodiments, the memory device 130 may store data and/or instructions that the processing device 110 uses to execute or use to perform the exemplary silencing test methods described in this specification.
In some embodiments, one or more components in the noise abatement test system 100 may be connected to and/or in communication with each other via the network 120. For example, processing device 110 may be coupled to storage device 130 via network 120 such that processing device 110 may obtain data and/or instructions stored in storage device 130 that are related to the mute test. As another example, processing device 110 may be coupled to noise abatement test apparatus 140 via network 120 to enable processing device 110 to analyze and process information acquired by noise abatement test apparatus 140. In some embodiments, the network 120 may be a wired network or a wireless network, or the like, or any combination thereof.
The noise reduction testing device 140 refers to a device that may be used to test the noise reduction performance of a muffler, wherein the noise reduction testing device 140 may include a first acquisition module, a first determination module, a second acquisition module, a second determination module, and a third determination module.
The first acquisition module may be used to acquire muffler parameters of the muffler, and a detailed description of acquiring muffler parameters of the muffler may be found in fig. 3.
The first determination module may be to determine a test scheme based on the muffler parameters; the test scheme includes gas generation parameters of the gas generating apparatus, and a detailed description of determining the test scheme based on muffler parameters may be found in fig. 3 and 4.
The second acquisition module may be used to acquire sound parameters, and a detailed description of the acquisition of sound parameters may be found in fig. 3.
The second determining module may be configured to determine a silencing result of the test solution by the silencer based on the sound parameters, and a detailed description of determining the silencing result of the test solution by the silencer based on the sound parameters may be found in fig. 3.
The third determination module may be configured to determine the performance of the muffler based on the silencing result, the performance including the silencing performance, and a detailed description of the performance of the muffler based on the silencing result may be found in fig. 3, 5, and 6.
It should be noted that the application scenario is provided for illustrative purposes only and is not intended to limit the scope of the present description. Many modifications and variations will be apparent to those of ordinary skill in the art in light of the present description. For example, the application scenario may also include a database. As another example, application scenarios may be implemented on other devices to implement similar or different functionality. However, variations and modifications do not depart from the scope of the present description.
FIG. 2 is an exemplary frame diagram of a noise abatement test apparatus according to some embodiments of the present disclosure. As shown in fig. 2, noise abatement test apparatus 200 includes a muffler 240, a test pipe 210, a gas generating device 230, a data acquisition device 250, and a processor 220. Test line 210 is the basic structure of a test device for muffler 240, muffler 240 being disposed within test line 210. In some embodiments, the gas generating apparatus 230 may be disposed within the test tube 210.
The gas generating means 230 refers to a means for generating gas. In some embodiments, the gas generating apparatus 230 may generate different gases with reference to different gas generation parameters to simulate exhaust gas generated by an apparatus such as an engine. In some embodiments, the gas generating apparatus 230 may provide a sound source for the sound deadening test apparatus 200.
In some embodiments, noise abatement test apparatus 200 may further include a muffler 240 replacement apparatus that may be deployed on a section of test pipe 210 for installing muffler 240 of a certain type, parameter, on that section of test pipe 210 at a particular time; muffler 240 replacement means may also remove an installed muffler 240 to replace another type or parameter of muffler 240.
In some embodiments, the replacing device for the gas generating device 230 and the muffler 240 can be used as an execution platform of the muffler testing device 200, and when the testing scheme is received, the parameters of the gas generating device 230 can be adjusted according to each testing case of the testing scheme, so that the parameters are matched with the environmental parameters required in the testing case; and controlling the muffler 240 replacing means to install the muffler 240 required in the test case on the test pipe 210 at a specific time according to each test case of the test scheme.
The data collection device 250 refers to a device for collecting various types of data. In some embodiments, the data acquisition device 250 may be implemented by various types of sensors to acquire corresponding gas parameters or sound parameters of the gas. In some embodiments, the data acquisition device 250 may include, for example, a temperature and humidity sensor, a flow rate and flow sensor, a decibel meter, a pressure sensor, a sound frequency meter, and the like. Based on a temperature and humidity sensor and a flow rate and flow velocity sensor, the device can be used for collecting generated gas parameters and confirming that the generated gas parameters meet the requirements of test cases. A sound frequency based tester may be used to collect sound frequencies inside muffler 240, such as the center frequency of sound pressure signals inside muffler 240. A decibel-based tester may be used to collect sound pressure levels. The pressure sensor can be used for collecting data such as exhaust back pressure.
The data collected based on the data collection device 250 may be used to determine the silencing result or to determine whether the environmental parameters are consistent with the test protocol. For example, gas parameters (e.g., temperature, humidity, flow rate, etc.) collected by the data collection device 250 may be used to determine whether the environmental parameters are consistent with the test plan, and, for example, sound parameters collected by the data collection device 250 may be used to determine the silencing result of the silencing test device 200. For example only, a decibel meter may collect sound pressure levels at predetermined points in sound deadening test device 200, may be used to calculate sound deadening effects, and a sound frequency meter may collect sound frequencies inside muffler 240 (e.g., may be a center frequency of a sound pressure signal inside muffler 240) may be used to determine sound frequencies corresponding to sound deadening by muffler 240.
For a detailed description of the various functions of muffler 240, test line 210, gas generator 230, data acquisition device 250, reference may be made to other portions of the specification, such as fig. 3, 4, 5 and 6, and their associated descriptions, etc.
Processor 220 may be used to perform muffler testing methods. In some embodiments, processor 220 may be coupled to and/or in communication with muffler 240, gas-generating device 230, and data collection device 250 via a network (e.g., a wired network or a wireless network). In some embodiments, the processor 220 may act as a control center of the noise abatement test apparatus 200 to remotely issue instructions to control the execution platform to perform the execution of the actual test. For example, processor 220 may generate or retrieve test patterns, issue test patterns to an execution platform, collect test results for the test patterns (i.e., collected data transmitted back by data collection device 250), and calculate muffler 240 performance.
In some embodiments, processor 220 may obtain muffler parameters from muffler 240. In some embodiments, processor 220 may determine a test scheme based on muffler parameters. In some embodiments, the processor 220 may send the gas generation parameters included in the test protocol to the gas generator 230, causing the gas generator 230 to generate a parameter-compliant gas. In some embodiments, processor 220 may determine muffler 240 to mute the test plan based on sound parameters collected by data collection device 250. In some embodiments, processor 220 may determine the performance of muffler 240 based on the silencing results. For a detailed description of the muffler testing method performed by the processor 220, reference may be made to other parts of the specification, such as fig. 3, 4, 5 and 6, and their associated descriptions, etc.
It should be noted that the above description of the system and its components is for descriptive convenience only and is not intended to limit the present disclosure to the scope of the illustrated embodiments. It will be understood by those skilled in the art that, given the principles of the system, it is possible to combine the individual components arbitrarily or to connect the constituent subsystems with other components without departing from such principles. For example, the individual components may share a single memory device, or the individual components may each have a separate memory device. Such variations are within the scope of the present description.
FIG. 3 is an exemplary flow chart of a muffler testing method according to some embodiments of the present description. As shown in fig. 3, the process 300 includes the following steps. In some embodiments, the process 300 may be performed by a processor.
At step 310, muffler parameters of the muffler are obtained.
Muffler parameters refer to parameters related to the muffler tested. For example, the muffler parameter may be a parameter that affects the muffling frequency (muffling sound frequency range) of the muffler. As another example, the muffler parameter may be a parameter that affects the amount of sound deadening (magnitude of sound deadening) of the muffler.
In some embodiments, the sound attenuation parameters may include structural parameters, material parameters, functional parameters, and the like. For example, when the muffler is a resistive sheet muffler, muffler parameters include external dimensions (length×width×height), number of muffler sheets, thickness of muffler sheets, muffler sheet interval, sound absorbing material (fiberglass filaments, mild steel wire mesh, felt, etc.), and the like. For another example, when the muffler is a microperforated panel muffler, the muffler parameters include pore size, pore spacing, cavity size, sheet thickness, and porosity.
In some embodiments, the sound deadening volume and sound deadening frequency of sound deadening devices having different sound deadening parameters may be different. For example, the muffler is a resistive muffler with a muffling frequency of about 10dB/m-20dB/m for mid-to low-frequency noise (e.g., 20Hz-2KHz noise frequency); for example, the muffler is a resistive muffler with a muffling frequency of about 10-20dB at mid-to high-frequency noise (e.g., 500Hz-16KHz noise frequency); for another example, the muffler is an impedance composite muffler, and the noise reduction frequency covers the low frequency to the high frequency of noise, and the noise reduction amount is experimentally measured.
In some embodiments, the corresponding muffler parameters may be pre-stored in the muffler from which the processor obtains the muffler parameters. In some embodiments, muffler parameters of the muffler may be pre-measured, tested, and obtained.
Step 320, determining a test scheme based on the muffler parameters; the test protocol includes gas generation parameters of the gas generating apparatus.
The test protocol refers to a protocol for testing silencers. In some embodiments, the test protocol may include gas generation parameters of the gas generating apparatus. The gas generation parameter refers to reference data of the gas generation device for generating the corresponding parameter gas. In some embodiments, the gas generation parameters include, but are not limited to, data of flow rate, flow velocity, temperature, pressure, etc. of the gas, the gas generating device can generate corresponding gas with reference to the gas generation parameters, and the gas with different gas generation parameters can generate sounds with different frequencies (the sound frequency is determined by vibration) when passing through the test pipeline. The frequency bands of sound attenuation are different due to different silencers. The frequency of the generated sound can be controlled by adjusting the gas generation parameters of the gas generating device so as to test the sound attenuation results of different silencers on sounds with different frequencies. For more description of the gas generating apparatus, see fig. 2 and its associated content.
In some embodiments, the test scheme may be determined based on the muffling frequency determined by the muffler parameters. For example, the test protocol may include gas generation parameters that are compatible with the muffling frequency. The processor may send the gas generation parameters included in the test protocol to a gas generator that in turn generates a gas in response. In some embodiments, the gas generated by the gas generating device may generate sound within the test tube at a frequency that matches the muffling frequency of the muffler. For example, the muffler has a muffling frequency of 50Hz-1KHz, and the gas generated by the gas generating means generates a sound frequency of 500Hz in the test pipe, which falls within the muffling frequency range.
In some embodiments, where the muffling frequency of the muffler is a range of values, for accurately testing muffler performance over a range of sound frequencies corresponding to the muffling frequency, the test plan may include a plurality of gas generating parameters, one gas generating parameter corresponding to each test case in a set of test plans. For example, a set of test patterns includes 3 test cases, each of which has gas generation parameters of: gas temperature a, gas flow b, gas flow c … …. For more on determining a test scheme based on muffler parameters, see fig. 4 and its related content.
And 330, determining the silencing result of the silencer on the test scheme based on the sound parameters acquired by the data acquisition device.
Sound parameters refer to parameters that measure sound. In some embodiments, the sound parameters may include a volume (sound pressure level) that is used to determine the silencing result. In some embodiments, the data acquisition device may acquire the volume of sound through a decibel meter. In some embodiments, the decibel tester may detect the volume before and after silencing for determining the silencing result. In some embodiments, the db tester may detect the volume of a first preset point in the test pipe, the first preset point being on the side where sound enters the muffler, the volume of the first preset point being the volume before the sound is silenced, and the volume of a second preset point being on the side where sound leaves the muffler, the volume of the second preset point being the volume after the sound is silenced.
In some embodiments, the data acquisition device may acquire a sound frequency inside the muffler for determining a sound deadening frequency of the muffler. In some embodiments, the sound frequency inside the muffler may be a center frequency of the sound pressure signal.
In some embodiments, it may be determined whether the gas actually generated in the test pipeline is consistent with the gas generation parameters provided by the test scheme based on the gas parameters collected by the data collection device, and the test scheme may be corrected or errors may be found and compensated for in time. The gas parameters may include, but are not limited to, gas flow, flow rate, temperature, pressure, etc. within the test environment (within the test tubing).
The silencing result refers to the change of sound before and after silencing. In some embodiments, the silencing result may include the degree of change in volume before and after silencing. For example, the sound deadening result may refer to a reduction ratio of the sound volume after sound deadening relative to the sound volume before sound deadening. As another example, the sound deadening result may refer to a decrease in sound volume after sound deadening relative to sound volume before sound deadening. For example, the sound volume before sound attenuation is 100dB, the sound volume after sound attenuation is 30dB, the sound volume reduction is 70dB of the sound volume difference between the front and rear of the muffler, and the sound volume reduction ratio is 70% of the sound volume before sound attenuation.
In some embodiments, the processor may obtain the pre-mute volume and the post-mute volume detected by the decibel meter from the data acquisition device to determine the mute result, e.g., 100dB pre-mute volume and 30dB post-mute volume, then the mute result may be expressed as 70% or 70dB. For more description of the data acquisition device, see fig. 2 and its associated content.
Step 340, determining performance of the muffler based on the silencing result, the performance including silencing performance.
In some embodiments, the sound deadening performance of the muffler may be determined based on the sound deadening result. The silencing performance of the silencer can measure the silencing effect of the silencer. In some embodiments, the sound deadening performance may include a sound deadening volume that is consistent with the value of the sound deadening result, where the sound deadening result refers to the amount of reduction in sound volume after sound deadening relative to sound volume before sound deadening. In some embodiments, the sound deadening properties may include a sound deadening ratio that is consistent with sound deadening results, which herein may refer to a rate of reduction in sound volume after sound deadening relative to sound volume before sound deadening. See fig. 5 for a more description of determining the performance of the muffler based on the muffling result.
According to one or more embodiments of the specification, the testing scheme is determined based on the silencer parameters, so that a more targeted testing scheme can be adopted for different silencers, unnecessary redundancy tests are reduced, and testing efficiency is improved. One or more embodiments of the present disclosure also control the frequency of sound generated by adjusting the gas generation parameters of the gas generator to adapt to the frequency of sound attenuation of the muffler, and can accurately obtain the sound attenuation result to determine the performance of the muffler.
FIG. 4 is an exemplary flow chart for determining a test scenario according to some embodiments of the present description. As shown in fig. 4, a flow 400 of determining a test scheme based on muffler parameters includes the following steps.
Step 410, obtaining multiple sets of candidate test schemes and candidate muffler feature vectors corresponding to each set of candidate test schemes.
Candidate test patterns refer to pre-stored test patterns. In some embodiments, candidate test patterns may be determined based on possible or common (candidate) muffler parameters. In some embodiments, different candidate test patterns may be determined based on different muffler parameters.
The candidate muffler feature vector refers to a muffler feature vector corresponding to a pre-stored candidate test scheme. In some embodiments, the candidate muffler feature vector may measure candidate muffler parameters for which the corresponding candidate test scheme is intended. In some embodiments, candidate muffler feature vectors may be obtained through a pre-determined muffler test. In some embodiments, the candidate muffler feature vector is directly related to candidate muffler parameters employed by the pre-amortization test. In some embodiments, candidate muffler feature vectors may be constructed by processing or calculating candidate muffler parameters. In some embodiments, candidate muffler feature vectors may be mapped to candidate test patterns based on candidate muffler parameters.
In some embodiments, candidate muffler feature vectors may be stored corresponding to candidate test patterns. In some embodiments, the processor may directly obtain pre-stored candidate test patterns and corresponding candidate muffler feature vectors.
Step 420, constructing a muffler feature vector based on the muffler parameters.
Muffler feature vectors refer to feature vectors that measure muffler parameters. In some embodiments, muffler feature vectors may be constructed by processing or calculating muffler parameters. For example, a feature vector of the microperforated panel silencer of (1, 50, 10, 10, 85) means a pore diameter of 1mm, a pore spacing of 1mm, a cavity size of 50cm 3, a panel thickness of 10mm, and a penetration rate of 85%.
At step 430, a test scheme is determined based on the vector matching of the muffler feature vector and the candidate muffler feature vector.
In some embodiments, the muffler feature vector of the muffler to be tested is vector-aligned with the candidate muffler feature vector corresponding to each set of candidate test patterns, and the candidate test pattern corresponding to the candidate muffler feature vector closest or equal to the muffler feature vector is taken as the test pattern of the muffler to be tested. The candidate muffler feature vector closest to the muffler feature vector may refer to a vector distance from the muffler feature vector within a preset threshold range.
In some embodiments, the test protocol may be a sequence of time-series arrangement of gas generation parameters. The time series refers to a series in which gas generation times (times at which gases conforming to gas generation parameters are generated) are arranged in a regular manner. For example, the gas generation times are arranged at intervals of 5 minutes to form a time series. In some embodiments, the gas generation parameters included in the test protocol may vary based on a time series.
In some embodiments, the sound generated by the gas conforming to the gas generation parameters within the test tube may be used to test the muffler, the sound frequency of the generated sound corresponding to the gas generation parameters, i.e., the gas generation parameters may correspond to the sound frequency of the test. In some embodiments, the sequence of test schemes may include time intervals, frequency variation magnitudes, frequency test ranges. For example, to test sound frequencies between 1000Hz-2000Hz for a muffler, the sequence of test patterns is 1000Hz, 1100Hz, 1200Hz … … Hz arranged every 5 minutes, wherein the time interval is 5 minutes, the frequency variation amplitude of the sound frequency tested at 5 minutes interval is 100Hz, and the frequency test range is 1000Hz-2000Hz. In some embodiments, the time interval, frequency variation amplitude, frequency test range of the sequence may be preset.
In some embodiments of the present disclosure, a sequence in which gas generation parameters are arranged in time series is used as a test scheme, so that a test scheme that varies according to a preset frequency variation range based on a preset time interval in a preset test range can be more accurately designed, so that the test is more standardized and streamlined.
In some embodiments, silencers of different types (e.g., different types or silencer parameters) are tested, and the test schemes employed may be different.
In some embodiments, silencers with different silencer parameters may differ in their test schemes. The frequency variation amplitude and frequency test range of the sequence of gas generation parameters in the test scheme may be determined by the muffler parameters. The frequency variation amplitude may be different for different muffler parameter test schemes.
For example, with respect to different silencers a and B, there was little change in the silencing performance measured by silencer a at frequency test ranges of 1000Hz and 1050Hz, indicating that silencer a is insensitive to changes in sound frequency; for muffler B, there was a large difference in the measured sound deadening properties for muffler B at frequency test ranges of 1000Hz and 1050Hz, indicating that muffler B is relatively sensitive to changes in sound frequency; therefore, the frequency variation amplitude of the test scheme of the muffler a is not required to be too small, and the frequency variation amplitude of the test scheme of the muffler B is required to be smaller so as to more accurately test the silencing performance of the muffler B at different sound frequencies.
In some embodiments, the frequency test ranges may be different for different muffler parameter test schemes. For example, different silencers C and D are typically adapted to eliminate mid-to-low frequency noise and mid-to-high frequency noise, respectively, so that the frequency test range of silencer C is primarily mid-to-low frequency and the frequency test range of silencer D is primarily mid-to-high frequency.
Some embodiments in this specification can adjust the frequency variation amplitude and the frequency test range to be whole for testing different silencers, and reduce unnecessary testing processes.
In some embodiments, it may be determined whether the number of test cases needs to be increased based on the magnitude of the difference between the measured muffler performance value and the predicted test plan value for each test to saturate the test. The actual measurement refers to the actual muffler performance measured during this test. The predicted value refers to the predicted muffler performance. In some embodiments, a large amount of historical silencer test data exists for each test scheme to support, and the historical average of silencer performance measured by the historical silencer test data corresponding to the test scheme adopted by the test can be used as the predicted value of the test scheme adopted by the test.
In some embodiments, if the difference between the measured muffler performance value and the predicted value of the test pattern exceeds a predetermined value, the gas generation parameter (e.g., test frequency) of the test pattern may be increased, i.e., the test case of the test pattern may be increased, so as to achieve the saturation test. In some embodiments, the preset magnitude may be determined from the variance of the historical average of muffler performance plus a preset error range.
In some embodiments, if the difference between the measured value and the predicted value of a certain test case in the test scheme exceeds the preset amplitude, new test frequencies may be added on the left and right sides of the test frequency corresponding to the test case. For example, the frequency test range of the test scheme is 1000Hz-2000Hz, the frequency change range is 100Hz, the actual measurement value under the test case with the test frequency of 1200Hz and the predicted value under 1200Hz are different from each other by more than the preset range, and the actual measurement value under 1100Hz and 1300Hz are both in the normal range (i.e. the difference from the predicted value does not exceed the preset range), then the frequency value can be selected as a new test frequency to be tested, for example, the new test frequency can be 1150Hz, 1250Hz, etc. In some embodiments, if the differences between the measured values and the predicted values of the plurality of test cases in the test scheme exceed the preset amplitude, new test frequencies may be added to the left and right sides of the test frequencies corresponding to the plurality of test cases, respectively.
Some embodiments of the present disclosure determine whether to increase the number of test cases based on the magnitude of the difference between the measured value of the muffler performance and the predicted value of the test scheme, which may improve the accuracy of the test and make the test more reliable.
In some embodiments, the confidence in the measured muffler performance for each test case in the test plan may be obtained. Reliability refers to the reliability used to evaluate the measured muffler performance. In some embodiments, to test more accurately, a test case may be executed multiple times, and the confidence of the test case may be related to the number of executions of the test case and the variance of the test data resulting from the executions. For example, the more the test cases are executed, the smaller the variance, the higher the reliability. In some embodiments, test cases that are not sufficiently trusted may be retested or retested.
By way of example only, a test case is executed 5 times to obtain 5 test data, which are respectively: 10,9, 12, 10,8; the data averaged 10, the variance 1.8, and the standard deviation about 1.34. The average value of the test data is closer to the true average when the number of executions is larger, and thus the number of executions can be regarded as a weight, the weight is 1 when the number of executions is +.and is a monotonically increasing function, for example, a weight function = (2/pi) arctan (number of executions), weight +.0.5 when the number of executions = 1, weight ≡0.7 when the number of executions = 2, weight ≡0.87 when the number of executions = 5, and weight = 1 when the number of executions +.. Then confidence = 0.87× (10-1.34)/10 ≡75%.
Some embodiments of the present disclosure may increase the ability of a test protocol to self-evaluate by obtaining the credibility of the test protocol, while also giving the test personnel more information of reference.
By determining multiple groups of candidate test schemes and determining the test scheme used for the test from the candidate test schemes, the fault tolerance can be improved, and meanwhile, the test schemes are matched based on the feature vectors of the silencers, so that the test schemes are more accurately selected.
FIG. 5 is an exemplary flow chart for determining performance of a muffler based on a result of sound attenuation according to some embodiments of the present description. As shown in fig. 5, the process 500 includes the following steps.
Step 510, determining a first silencing frequency band of the silencer based on whether the silencing result meets a preset condition.
In some embodiments, the silencing result may include insertion loss and transmission loss. Insertion loss refers to the change in sound pressure level or sound power level before and after installation of the muffler measured at a fixed point within the test environment. The transmission loss refers to a change in sound pressure level or sound power level at the inlet and outlet of the muffler. In some embodiments, the sound deadening performance may be determined based on the insertion loss, the transmission loss, and the amount of decrease or the rate of decrease in the sound volume before and after the sound deadening. In some embodiments, the silencing performance may include a first silencing band where the silencer is better. The first silencing frequency band is a corresponding sound frequency range in which a silencing result meets a preset condition.
In some embodiments, the silencing result at a certain sound frequency can meet the preset condition, where the sound frequency is defined as a first silencing frequency, and the first silencing frequency band can be determined by acquiring a plurality of or all the first silencing frequencies. In some embodiments, among the acquired plurality of first silencing frequencies, a silencing frequency interval formed by two adjacent first silencing frequencies may be regarded as a monotone interval, and such a silencing frequency interval is one first silencing sub-band, and all the first silencing sub-bands are integrated to form a first silencing frequency band. For example, 1000Hz and 1100Hz are both the first silencing frequencies, and frequencies between 1000Hz and 1100Hz are not tested, but the frequency interval [1000, 1100] can be directly considered as a first silencing sub-band.
The preset condition is a constraint on the sound-cancellation result. The sound frequency of the silencing result meeting the preset condition is the first silencing frequency. In some embodiments, the preset condition may be a defined condition for insertion loss. For example, the preset condition may be that the insertion loss is greater than a preset value. If the preset condition is that the insertion loss is greater than 30dB, the sound frequency corresponding to the insertion loss of 40dB is the first noise reduction frequency. By way of example only, the preset condition is that the sound frequency corresponding to greater than 30dB is the first muffling frequency, the sound pressure level of the measured fixed point reaches 100dB for sound with a frequency of 2000Hz before the muffler is installed, and after the muffler is installed, the sound pressure level of the measured fixed point becomes 60dB, and the insertion loss is 40dB, so 2000Hz is one of the first muffling frequencies.
In some embodiments, the preset condition may be a defined condition for the reduction ratio. For example, the preset condition may be that the reduction ratio is greater than a preset value. If the preset condition is that the reduction ratio is greater than 30%, the sound frequency corresponding to the reduction ratio of 35% is the first silencing frequency. In some embodiments, the preset condition may also be a limiting condition for the transfer loss or the like. By way of example only, the preset condition is that the sound frequency corresponding to a reduction ratio greater than 30% is the first sound damping frequency, the sound pressure level of the measured fixed point reaches 100dB for sound with a frequency of 2500Hz before the muffler is installed, and after the muffler is installed, the sound pressure level of the measured fixed point becomes 65dB, the sound damping ratio is 35%, and thus 2500Hz is the first sound damping frequency.
In some embodiments, the first muffling frequency may be determined by taking into account (e.g., weighted calculation) an insertion loss, a transmission loss, a reduction ratio, or a reduction amount. For example, the preset conditions are an insertion loss > 20dB, a transmission loss greater than 20dB, and a sound deadening ratio > 30%.
One or more embodiments of the present disclosure may further define suitable operating frequencies of different silencers by determining the first silencing frequency band, which may be determined based on insertion loss, transmission loss, etc., so that the evaluation may be more scientific and accurate.
In some embodiments, the preset condition may be related to a sound pressure level before installing the muffler. In some embodiments, where the sound pressure level before installation of the muffler is small, the predetermined condition may be that the insertion loss is greater than a predetermined ratio. For example, the sound pressure level before installation of the muffler is 20dB, it is impossible to make the insertion loss > 20dB (20 dB is at most muffled to 0 dB), and for this case, it is inconvenient to use an insertion loss larger than a preset value as a preset condition, and it is preferable to use an insertion loss larger than a preset ratio (70%) as a preset condition.
The specific condition judgment adopts the preset condition that is larger than the preset value or the preset ratio, so that the determination of the first silencing frequency is more reasonable, and the evaluation of silencing performance is more perfect.
In some embodiments, the silencing performance may also include a first silencing bandwidth.
The first audio cancellation bandwidth refers to the bandwidth of the first noise cancellation frequency band. For example, the test frequency range is 5000 Hz-10000 Hz, wherein 6000 Hz-8000 Hz is the first silencing frequency band, and the first silencing frequency band is 2000Hz. The first silencing bandwidth can also define silencing performance, represents silencing bandwidth, and can enable silencing performance concept to be more stereoscopic and perfected by defining silencing performance from more angles.
Step 520, determining whether the silencing performance is acceptable based on the average and variance of the first silencing frequency band and the first silencing bandwidth of the same type of parameter and the reliability.
In some embodiments, if the difference between the average value of the first noise reduction frequency band and the first small audio frequency bandwidth of the silencer obtained by the test and the historical measurement data of the same type of the same parameter silencer is larger, the variance is larger, and the reliability of the test scheme adopted by the test is higher, the noise reduction performance of the silencer tested by the test can be judged as unqualified, and the description of the reliability can be referred to fig. 4.
In some embodiments, if the reliability of the test scheme adopted at this time is not high enough, the test can be performed again.
The judgment on whether the silencing performance of the target silencer is qualified or not can be made more scientific and convincing by referring to the relevant historical measurement data of the same-parameter silencers of the same type.
It should be noted that the descriptions above with respect to the flow 300, the flow 400, and the flow 500 are for illustration and description only, and are not intended to limit the scope of applicability of the present description. Various modifications and changes to the above-described procedures may be made by those skilled in the art under the guidance of this specification. However, such modifications and variations are still within the scope of the present description.
In some embodiments, muffler performance may also be determined based on the muffler type, the plurality of baseline test point data, and the muffler parameters processed by the muffler performance prediction model.
FIG. 6 is a schematic diagram of a predictive model of sound deadening properties according to some embodiments of the present disclosure. As shown in fig. 6, the muffler type, the plurality of reference test point data, and the muffler parameters are input to the muffler performance prediction model 600, and the muffler performance prediction model 600 outputs the first muffler frequency band.
The reference test point data refers to test data at reference test frequencies (reference points), for example, 5 reference test frequencies are taken in the range of 1000Hz-2000Hz of the silencing frequency band of the silencer, namely 1100Hz, 1300Hz, 1500Hz, 1700Hz and 1900Hz, and the reference test point data is the sound pressure level at the 5 reference test frequencies. Since the silencing result (see fig. 3) can be determined by the test data, and the first silencing frequency band of the silencer (see fig. 5) can be determined based on whether the silencing result satisfies the preset condition, the trained silencing performance prediction model 600 can predict the first silencing frequency band based on the plurality of reference test point data of the silencer to be tested, the silencer type, and the silencer parameters.
In some embodiments, the acoustic abatement performance prediction model 600 model may be trained from a large number of historical test data for the muffler. For example, historical test data of the muffler is used as training samples, the training samples with the labels are input into an initial noise reduction performance prediction model, a loss function is constructed through the labels and the results of the initial error prediction model, and parameters of the initial noise reduction performance prediction model are updated based on the loss function in an iterative mode. And when the loss function of the initial silencing performance prediction model meets the preset condition, model training is completed, and a trained silencing performance prediction model is obtained. The preset condition may be that the loss function converges, the number of iterations reaches a threshold value, etc. The training sample may be a type, a parameter, and corresponding benchmark test point data of the historically tested muffler, and the label of the training sample may be a first muffling frequency band of the historically tested muffler.
In some embodiments, the selection of the reference points may be determined based on the frequency variation amplitude of the sequence of the test scheme, and if the variation amplitude is large, the number of the selected reference points may be small, or vice versa. Reference may be made to fig. 4 for an illustration of the sequence of the test protocol.
The selection of the reference points is dynamically adjusted according to the frequency variation amplitude of the sequence, but not invariable, so that the universality of the noise reduction performance prediction model 600 is stronger.
In some embodiments, the muffler with a certain service life will wear under the strong temperature and pressure air flow environment for a long time, and the muffler performance will be affected to a certain extent, so that the service life of the muffler needs to be considered when predicting the performance of the muffler.
In some embodiments, the sound deadening performance prediction model 600 may also include an embedded layer, and the input to the embedded layer may include a muffler age, the input muffler age being a precondition for predicting muffler performance. In some embodiments, when the sound deadening performance prediction model 600 is used to predict a newly produced muffler, the input muffler life may be 0.
The silencer service life is used as a premise of prediction, so that the silencing performance prediction model 600 is higher in generalization capability, and the model can be used for predicting not only newly produced silencers but also silencers with a certain service life.
In some embodiments, the output of the silencing performance prediction model 600 may also include the confidence of the present prediction.
The reliability here refers to reliability for evaluating the performance of the silencer predicted this time. In some embodiments, the confidence level may be obtained through historical training. For example only, during training, a certain sample silencer is predicted, a sound-deadening frequency is selected in a predicted first sound-deadening frequency band to perform an actual test, for example, 20 sound-deadening frequencies are selected to perform an actual test, wherein sound-deadening results of 15 sound-deadening frequencies meet a preset condition (for a description of the preset condition, see fig. 5), and the remaining 5 sound-deadening frequencies are not met, so that the coincidence degree is 15/20=75%, and the credibility of the sample label is also marked as 75%.
The reliability as feedback of the prediction result may improve the self-evaluation ability of the noise cancellation performance prediction model 600.
In some embodiments, the confidence may be related to the number of reference test points. For example, the fewer the number of reference test points, the lower the reliability. Thus, the reliability determination can be more reasonable.
In some embodiments, a threshold may be preset for confidence. In some embodiments, if the confidence level is greater than the threshold, the predicted value output by the noise abatement performance prediction model 600 is used as the actual test data. If the reliability is less than the threshold, based on the predicted first silencing frequency band output by the silencing performance prediction model 600, selecting a silencing frequency from the predicted first silencing frequency band for testing to determine whether the predicted value of the silencing performance prediction model is accurate.
For example only, if the noise reduction performance prediction model 600 predicts that the output predicted first noise reduction frequency band is 4000Hz to 5000Hz and the reliability is 75% or less than the threshold (e.g., 80%), then a plurality of frequencies may be selected from 4000Hz to 5000Hz for testing, and the noise reduction result of the test is used to determine whether the model predicted first noise reduction frequency band is sufficiently accurate.
For the prediction of low reliability of the noise reduction performance prediction model 600, a supplementary test of spam is introduced instead of completely relying on model prediction, so that the whole silencer test scheme is more perfect.
Some embodiments of the present disclosure provide a model for predicting silencing performance, which only needs to obtain a small amount of test data for a newly produced silencer, while other data (such as silencing performance) can be obtained through model prediction instead of actual test, so that the number of tests can be greatly reduced, the cost can be saved, and the efficiency can be improved.
While the basic concepts have been described above, it will be apparent to those skilled in the art that the foregoing detailed disclosure is by way of example only and is not intended to be limiting. Although not explicitly described herein, various modifications, improvements, and adaptations to the present disclosure may occur to one skilled in the art. Such modifications, improvements, and modifications are intended to be suggested within this specification, and therefore, such modifications, improvements, and modifications are intended to be included within the spirit and scope of the exemplary embodiments of the present invention.
Meanwhile, the specification uses specific words to describe the embodiments of the specification. Reference to "one embodiment," "an embodiment," and/or "some embodiments" means that a particular feature, structure, or characteristic is associated with at least one embodiment of the present description. Thus, it should be emphasized and should be appreciated that two or more references to "an embodiment" or "one embodiment" or "an alternative embodiment" in various positions in this specification are not necessarily referring to the same embodiment. Furthermore, certain features, structures, or characteristics of one or more embodiments of the present description may be combined as suitable.
Furthermore, the order in which the elements and sequences are processed, the use of numerical letters, or other designations in the description are not intended to limit the order in which the processes and methods of the description are performed unless explicitly recited in the claims. While certain presently useful inventive embodiments have been discussed in the foregoing disclosure, by way of various examples, it is to be understood that such details are merely illustrative and that the appended claims are not limited to the disclosed embodiments, but, on the contrary, are intended to cover all modifications and equivalent arrangements included within the spirit and scope of the embodiments of the present disclosure. For example, while the system components described above may be implemented by hardware devices, they may also be implemented solely by software solutions, such as installing the described system on an existing server or mobile device.
Likewise, it should be noted that in order to simplify the presentation disclosed in this specification and thereby aid in understanding one or more inventive embodiments, various features are sometimes grouped together in a single embodiment, figure, or description thereof. This method of disclosure does not imply that the subject matter of the present description requires more features than are set forth in the claims. Indeed, less than all of the features of a single embodiment disclosed above.
In some embodiments, numbers describing the components, number of attributes are used, it being understood that such numbers being used in the description of embodiments are modified in some examples by the modifier "about," approximately, "or" substantially. Unless otherwise indicated, "about," "approximately," or "substantially" indicate that the number allows for a 20% variation. Accordingly, in some embodiments, numerical parameters set forth in the specification and claims are approximations that may vary depending upon the desired properties sought to be obtained by the individual embodiments. In some embodiments, the numerical parameters should take into account the specified significant digits and employ a method for preserving the general number of digits. Although the numerical ranges and parameters set forth herein are approximations that may be employed in some embodiments to confirm the breadth of the range, in particular embodiments, the setting of such numerical values is as precise as possible.
Each patent, patent application publication, and other material, such as articles, books, specifications, publications, documents, etc., referred to in this specification is incorporated herein by reference in its entirety. Except for application history documents that are inconsistent or conflicting with the content of this specification, documents that are currently or later attached to this specification in which the broadest scope of the claims to this specification is limited are also. It is noted that, if the description, definition, and/or use of a term in an attached material in this specification does not conform to or conflict with what is described in this specification, the description, definition, and/or use of the term in this specification controls.
Finally, it should be understood that the embodiments described in this specification are merely illustrative of the principles of the embodiments of this specification. Other variations are possible within the scope of this description. Thus, by way of example, and not limitation, alternative configurations of embodiments of the present specification may be considered as consistent with the teachings of the present specification. Accordingly, the embodiments of the present specification are not limited to only the embodiments explicitly described and depicted in the present specification.
Claims (7)
1. A muffler testing method, comprising:
Obtaining silencer parameters of the silencer;
determining a test scheme based on the muffler parameters; the test protocol includes gas generation parameters of a gas generating device;
Based on the sound parameters collected by the data collection device, determining the silencing result of the silencer on the test scheme, wherein the silencing result comprises the following steps: insertion loss and transfer loss;
determining the performance of the silencer based on the silencing result, wherein the performance comprises silencing performance, the silencing performance comprises a first silencing frequency band and a first silencing frequency band, the first silencing frequency band refers to a corresponding sound frequency range of which the silencing result meets a preset condition, and the first silencing frequency band refers to the bandwidth of the first silencing frequency band;
Wherein said determining a test plan based on said muffler parameters comprises:
obtaining a plurality of groups of candidate test schemes and candidate silencer feature vectors corresponding to each group of candidate test schemes;
Constructing a silencer feature vector based on the silencer parameters, wherein the silencer feature vector refers to a feature vector used for measuring the silencer parameters;
determining the test scheme based on the vector matching of the muffler feature vector and the candidate muffler feature vector, the test scheme including a sequence of gas generation parameters arranged in time series;
The determining the test scheme based on the vector matching of the muffler feature vector and the candidate muffler feature vector comprises:
determining a reference point based on the frequency variation amplitude of the sequence of test protocols; and
Processing the type of the silencer, the data of a plurality of reference test points and the parameters of the silencer based on a silencing performance prediction model, and determining the performance and the reliability of the silencer, wherein the reliability is used for evaluating the reliability of the performance of the silencer predicted at this time, the silencing performance prediction model comprises an embedded layer, and the input of the embedded layer comprises the service life of the silencer;
Responding to the reliability being greater than a threshold value, and taking a first silencing frequency band output by the silencing performance prediction model as actual test data;
And responding to the credibility being smaller than the threshold value, and selecting a sound canceling frequency from the first sound canceling frequency range to test based on the first sound canceling frequency range output by the sound canceling performance prediction model.
2. The method of claim 1, wherein the frequency variation amplitude, frequency test range of the sequence of gas generation parameters in the test scheme is determined by the muffler parameters.
3. The method according to claim 1, wherein the method further comprises:
and judging whether the silencing performance is qualified or not based on the average value and the variance of the first silencing frequency band and the first silencing frequency bandwidth of the silencers with the same type and the same parameters and the credibility.
4. The method of claim 1, wherein the determining the performance of the muffler based on the muffling result comprises:
And determining a first silencing frequency band of the silencer based on whether the silencing result meets a preset condition.
5. A muffler testing system for implementing the muffler testing method of claim 1, comprising:
the first acquisition module is used for acquiring silencer parameters of the silencer;
a first determination module for determining a test scheme based on the muffler parameters; the test protocol includes gas generation parameters of a gas generating device;
The second acquisition module is used for acquiring sound parameters;
The second determining module is configured to determine, based on the sound parameter, a silencing result of the test scheme by the silencer, where the silencing result includes: insertion loss and transfer loss;
The third determining module is used for determining the performance of the silencer based on the silencing result, wherein the performance comprises silencing performance, the silencing performance comprises a first silencing frequency band and a first silencing frequency band, the first silencing frequency band refers to a corresponding sound frequency range of which the silencing result meets a preset condition, and the first silencing frequency band refers to the bandwidth of the first silencing frequency band;
wherein the first determination module is further configured to:
obtaining a plurality of groups of candidate test schemes and candidate silencer feature vectors corresponding to each group of candidate test schemes;
Constructing a silencer feature vector based on the silencer parameters, wherein the silencer feature vector refers to a feature vector used for measuring the silencer parameters;
The test plan is determined based on the vector matching of the muffler feature vector and the candidate muffler feature vector, the test plan including a sequence of gas generation parameters arranged in time series.
6. A muffler testing apparatus for implementing the muffler testing method of claim 1, the muffler testing apparatus comprising: the device comprises a test pipeline, a processor, a gas generating device, a silencer and a data acquisition device;
the processor is configured to perform the following operations:
Obtaining silencer parameters of the silencer;
determining a test scheme based on the muffler parameters; the test protocol includes gas generation parameters of the gas generating apparatus;
based on the sound parameters collected by the data collection device, determining a silencing result of the silencer on the test scheme, wherein the silencing result comprises the following steps: insertion loss and transfer loss;
determining the performance of the silencer based on the silencing result, wherein the performance comprises silencing performance, the silencing performance comprises a first silencing frequency band and a first silencing frequency band, the first silencing frequency band refers to a corresponding sound frequency range of which the silencing result meets a preset condition, and the first silencing frequency band refers to the bandwidth of the first silencing frequency band;
Wherein said determining a test plan based on said muffler parameters comprises:
obtaining a plurality of groups of candidate test schemes and candidate silencer feature vectors corresponding to each group of candidate test schemes;
Constructing a silencer feature vector based on the silencer parameters, wherein the silencer feature vector refers to a feature vector used for measuring the silencer parameters;
The test plan is determined based on the vector matching of the muffler feature vector and the candidate muffler feature vector, the test plan including a sequence of gas generation parameters arranged in time series.
7. A non-transitory computer-readable medium storing instructions which, when executed by at least one processor, cause the at least one processor to implement the method of any one of claims 1-4.
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| CN114813193A (en) | 2022-07-29 |
| CN114813193B (en) | 2023-04-11 |
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