CN116467984A - Circuit schematic diagram inspection method, device, equipment and storage medium - Google Patents
Circuit schematic diagram inspection method, device, equipment and storage medium Download PDFInfo
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- CN116467984A CN116467984A CN202310451744.4A CN202310451744A CN116467984A CN 116467984 A CN116467984 A CN 116467984A CN 202310451744 A CN202310451744 A CN 202310451744A CN 116467984 A CN116467984 A CN 116467984A
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- 238000010586 diagram Methods 0.000 title claims abstract description 80
- 238000000034 method Methods 0.000 title claims abstract description 59
- 238000007689 inspection Methods 0.000 title claims abstract description 20
- 230000002159 abnormal effect Effects 0.000 claims abstract description 17
- 238000004806 packaging method and process Methods 0.000 claims description 12
- 238000004590 computer program Methods 0.000 claims description 5
- 238000000605 extraction Methods 0.000 claims description 5
- 230000005856 abnormality Effects 0.000 claims description 4
- 238000004364 calculation method Methods 0.000 claims description 3
- 239000000463 material Substances 0.000 description 7
- 238000012986 modification Methods 0.000 description 2
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- HEZMWWAKWCSUCB-PHDIDXHHSA-N (3R,4R)-3,4-dihydroxycyclohexa-1,5-diene-1-carboxylic acid Chemical compound O[C@@H]1C=CC(C(O)=O)=C[C@H]1O HEZMWWAKWCSUCB-PHDIDXHHSA-N 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 238000011960 computer-aided design Methods 0.000 description 1
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/30—Circuit design
- G06F30/36—Circuit design at the analogue level
- G06F30/367—Design verification, e.g. using simulation, simulation program with integrated circuit emphasis [SPICE], direct methods or relaxation methods
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02D10/00—Energy efficient computing, e.g. low power processors, power management or thermal management
Abstract
The invention discloses a circuit schematic diagram inspection method, a device, equipment and a storage medium. Wherein the method comprises the steps of: acquiring a circuit schematic diagram or a circuit schematic diagram netlist generated by the circuit schematic diagram; extracting feedback voltage values, required output voltages and voltage dividing resistance attributes of a power supply chip to be checked in the circuit schematic diagram or the netlist, wherein the voltage dividing resistance attributes comprise: the resistance of the voltage dividing resistor; calculating theoretical output voltage according to the resistance value of the voltage dividing resistor and the feedback voltage value; and recording abnormal voltage dividing resistance when the relation between the theoretical output voltage and the required output voltage does not meet the preset condition. The invention can accurately check the FB voltage dividing resistor of the power supply chip and provides convenience for a designer to check a circuit schematic diagram.
Description
Technical Field
The present invention relates to the technical field of computer aided design of circuits, and more particularly, to a method, an apparatus, a device and a storage medium for checking a schematic circuit diagram.
Background
EDA is an abbreviation for electronic design automation (Electronic Design Automation), with which electronic engineers can start designing electronic systems from concepts, algorithms, protocols, etc., a large number of tasks can be done by computer, and electronic products can be automatically processed from circuit design, performance analysis to the computer of the whole process of designing IC layout or PCB layout.
However, the output voltages of the power supply chips such as DCDC/LDO are realized by feedback voltage values FB/ADJ and voltage dividing resistors of the power supply chips except for fixed output. In circuit design, the voltage requirement is usually calculated by a designer according to a data manual, the existing resistance of a company and the actual requirement. In designing a schematic diagram, a designer may modify the output voltage required by the power supply network and miss modifying the resistance value of the voltage dividing resistor, resulting in abnormal voltage of the design circuit. The current schematic diagram is more and more complex, the number of power supply paths is more and more, the self-checking workload of the schematic diagram is large, and the FB voltage dividing resistor of the power supply chip is difficult to check accurately.
Disclosure of Invention
The invention provides a circuit schematic diagram checking method, a device, equipment and a storage medium, which are used for solving the technical problem that the FB voltage dividing resistor of a power chip is difficult to check accurately.
In a first aspect, the present invention provides a schematic circuit diagram inspection method, including:
acquiring a circuit schematic diagram or a circuit schematic diagram netlist generated by the circuit schematic diagram;
extracting feedback voltage values, required output voltages and voltage dividing resistance attributes of a power supply chip to be checked in the circuit schematic diagram or the netlist, wherein the voltage dividing resistance attributes comprise: the resistance of the voltage dividing resistor;
calculating theoretical output voltage according to the resistance value of the voltage dividing resistor and the feedback voltage value;
and recording abnormal voltage dividing resistance when the relation between the theoretical output voltage and the required output voltage does not meet the preset condition.
In one embodiment, the process of extracting the feedback voltage value of the power chip to be inspected includes:
extracting chip attribute information of a power chip to be checked in the circuit schematic diagram or the netlist;
comparing the chip attribute information with a database to obtain the bit number of the power supply chip to be checked;
and extracting the feedback voltage value of the power supply chip to be checked from a database according to the bit number of the power supply chip to be checked.
In one embodiment, the process of extracting the feedback voltage value of the power chip to be inspected includes:
reading a corresponding network name on a pin of a power chip to be checked;
and extracting a feedback voltage value of the power supply chip to be checked according to the network name.
In one embodiment, the divider resistance attribute further comprises: precision and packaging;
the circuit schematic diagram inspection method further includes:
recording abnormal voltage dividing resistance when the voltage dividing resistance attribute is not in a first preset range, wherein the first preset range is a design specification range.
In one embodiment, the divider resistance attribute further comprises: precision and packaging;
the circuit schematic diagram inspection method further includes:
recording abnormal voltage dividing resistance when the voltage dividing resistance attribute is not in a second preset range, wherein the second preset range is a part range in a preset database.
In a second aspect, the present invention provides a schematic circuit diagram inspection apparatus comprising:
the acquisition module is used for acquiring a circuit schematic diagram or a circuit schematic diagram netlist generated by the circuit schematic diagram;
the extraction module is used for extracting a feedback voltage value, a required output voltage and a divider resistance attribute of a power supply chip to be checked in the circuit schematic diagram or the netlist, wherein the divider resistance attribute comprises: the resistance of the voltage dividing resistor;
the calculation module is used for calculating theoretical output voltage according to the resistance value of the divider resistor and the feedback voltage value;
and the judging module is used for recording abnormal voltage dividing resistance when the relation between the theoretical output voltage and the required output voltage does not meet the preset condition.
In one embodiment, the process of extracting the feedback voltage value of the power chip to be inspected by the extracting module includes:
reading a network name on a pin number of a power chip to be checked;
and extracting a feedback voltage value of the power supply chip to be checked according to the network name.
In one embodiment, the divider resistance attribute further comprises: precision and packaging;
the judging module is further used for recording the abnormality of the voltage dividing resistor when the attribute of the voltage dividing resistor is not in a second preset range, wherein the second preset range is a range of parts in a preset database.
In a third aspect, the present invention provides a computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, the processor implementing the method of any of the above embodiments when executing the program.
In a fourth aspect, the present invention provides a computer readable storage medium having stored thereon a computer program, characterized in that the program when executed by a processor implements the method of any of the above embodiments.
In the invention, when the circuit diagram of the power supply chip is checked, the theoretical output voltage is calculated by acquiring the feedback voltage value and the voltage dividing resistance value matched with the feedback voltage value, then the theoretical output voltage is compared with the required output voltage actually acquired from the circuit, and whether the selection of the voltage dividing resistance is reasonable is judged according to the comparison result. The invention can accurately check the FB voltage dividing resistor of the power supply chip and provides convenience for a designer to check a circuit schematic diagram.
Drawings
Fig. 1 is a schematic flow chart of a first embodiment of the present invention.
Fig. 2 is a schematic circuit diagram of a method of checking with a first embodiment of the present invention.
Fig. 3 is a schematic overall structure of a second embodiment of the present invention.
Detailed Description
Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.
It should be noted that, the term "first\second\ … …" related to the embodiments of the present invention is merely to distinguish similar objects, and does not represent a specific order for the objects, it is to be understood that "first\second\ … …" may interchange a specific order or sequence where allowed. It is to be understood that the objects identified by "first\second\ … …" may be interchanged where appropriate to enable embodiments of the invention described herein to be practiced in sequences other than those illustrated or described herein.
Example 1
Referring to fig. 1, fig. 1 is a schematic flow chart of a schematic circuit diagram inspection method according to an embodiment of the invention, and the method includes step S110, step S120, step S130 and step S140. It should be noted that, step S110, step S120, step S130 and step S140 are only reference numerals for clearly explaining the correspondence between the embodiment and fig. 1, and do not represent the sequence limitation of the steps in the present embodiment.
Step S110, obtaining a circuit schematic diagram or a circuit schematic diagram netlist generated by the circuit schematic diagram;
step S120, extracting a feedback voltage value, a required output voltage and a voltage dividing resistance attribute of the power supply chip to be checked in the schematic circuit diagram or the netlist, where the voltage dividing resistance attribute includes: the resistance of the voltage dividing resistor;
step S130, calculating theoretical output voltage according to the resistance value of the divider resistor and the feedback voltage value;
and step S140, recording abnormal voltage dividing resistance when the relation between the theoretical output voltage and the required output voltage does not meet the preset condition.
The method is a method for automatically checking the voltage dividing resistance of the power supply chip of the circuit schematic diagram. In step S110, a schematic circuit diagram or a netlist derived from the schematic circuit diagram is obtained. The schematic circuit diagram is a graphical representation method for representing the connection relation between electronic components by using symbols and lines. The circuit schematic netlist is used for converting each component and signal connection relation in the circuit schematic into a digital model and a data format used in an actual circuit. In brief, the schematic netlist is obtained by representing each component in the schematic with a unique number and then using the numbers to list the connections between them in a table or file. Such a network table may be read by computer software for simulating, analyzing and designing the circuit. In step S110, a schematic circuit diagram or a schematic circuit diagram netlist derived from the schematic circuit diagram may be acquired.
Preferably, a schematic netlist is obtained. Because the circuit schematic is generally graphical, reading is convenient, but automatic checking and analysis are inconvenient, the netlist derived after the circuit schematic is designed is obtained, and the PCB design and analysis can be facilitated by using an EDA tool.
After the obtained schematic circuit diagram or schematic circuit diagram netlist is obtained, the attribute information of all the components can be extracted, including the bit numbers, material codes, pin numbers, pin names and the like of the components such as resistors, capacitors, inductors, chips and the like, so as to further analyze.
In the method, a feedback voltage value, a required output voltage and a voltage dividing resistance attribute corresponding to a power supply chip to be checked are extracted, wherein the voltage dividing resistance attribute comprises: the resistance of the voltage dividing resistor.
In one embodiment, the process of extracting the feedback voltage value of the power chip to be inspected includes: step S210, step S220, and step S230.
Step S210, extracting chip attribute information of a power chip to be checked in the circuit schematic diagram or the netlist;
step S220, comparing the chip attribute information with a database to obtain the bit number of the power chip to be checked;
step S230, extracting the feedback voltage value of the power chip to be checked from the database according to the bit number of the power chip to be checked.
The present embodiment relates to a method for extracting a feedback voltage value of a power chip to be inspected, wherein the feedback voltage value corresponding to the power chip to be inspected in a netlist is read from a set database while comparing the chip attribute information, such as a material number, a material code, etc., in the netlist with the set database to obtain a bit number corresponding to the power chip to be inspected in the netlist.
In one embodiment, the process of extracting the feedback voltage value of the power chip to be inspected includes: step S310 and step S320.
Step S310, reading the corresponding network name on the pin of the power chip to be checked;
step S320, extracting the feedback voltage value of the power supply chip to be checked according to the network name.
The present embodiment relates to another method for extracting a feedback voltage value of a power chip to be inspected. The method extracts the corresponding network name from the feedback pins of the chip, such as FB, ADJ and the like, and reads the corresponding network name from the pins, such as FB_0V6, and the feedback voltage value VFB=0.6V can be directly obtained. The method does not need to preset a database, and only needs to add a specific network name containing a voltage value to the feedback pin in the schematic diagram design stage.
By adopting the two methods or the combination, the feedback voltage values corresponding to the chip to be checked and the power chip to be checked can be extracted.
The output voltage required by the power chip is usually obtained by the output pin of the power chip, series connection of an inductor and a resistor or direct output. The network name is typically identified with a voltage value, such as 3V3. Specific network names containing voltage values may also be added for identification. The electric connection relation is analyzed through the netlist, so that the output voltage required by the power chip is easy to obtain. Thus, the extraction of the required output voltage of the power chip is completed.
And further extracting the voltage dividing resistance attribute such as resistance, precision, packaging and the like connected with the feedback voltage pin according to the extracted power chip to be checked. The voltage dividing resistor can be divided into three resistors: a series resistor, a pull-up resistor and a pull-down resistor. One end of the pull-up resistor is connected with the output voltage, the other end of the pull-up resistor is connected with the pull-down resistor, and the other end of the pull-down resistor is grounded. One end of the series resistor is connected with the connection point of the pull-up resistor and the pull-down resistor, and the other end of the series resistor is connected with a feedback voltage pin. The series resistor is a resistor connected in series between the feedback voltage pin and the pull-up resistor and the pull-down resistor. Part of the power supply chip needs to use the resistor for system stabilization, and the resistor does not influence the output voltage of the feedback loop. Some power chips have no series resistance or have a series resistance of 0 ohms. The series resistor, the pull-up resistor, the pull-down resistor and the like can be one resistor or the series-parallel equivalent of a plurality of resistors. And analyzing the netlist through the electric connection mode to obtain the properties of the series resistor, the pull-up resistor and the pull-down resistor.
And then, calculating theoretical output voltage according to the voltage dividing resistance and the feedback voltage value, judging whether the relation between the theoretical output voltage and the required output voltage meets a certain condition or not, and if not, recording the abnormality of the voltage dividing resistance. The condition here may be a condition including an error range. Because of the discontinuity of the resistance values, there is a certain error between the theoretical output voltage and the required output voltage, for example, the required output voltage is 3.3V, the theoretical output voltage is 3.31V, and the difference is smaller than a certain value, for example, 0.05%, which can be considered as meeting the condition. The specific conditions can be set by the person skilled in the art according to different situations.
The above is a process of checking one power chip, and for other power chips, the same method is also adopted to repeatedly check each power chip, record the abnormal result and output prompt errors one by one.
The method of the present invention will be described in detail below with reference to the circuit diagram example of fig. 2. And extracting attribute information of all components according to the netlist, such as information of bit numbers, material numbers, pin numbers, names and the like. And comparing the chip with the bit number U1 and the material number SY8089 with a database to confirm that the chip is a power supply chip, and reading a feedback voltage value corresponding to the material number SY8089 in the database to be vb=0.6V. The pin names of the chips and the network names on the corresponding pin numbers can be directly analyzed, and a preset database is not needed at this time. Taking the schematic diagram as an example, the pin name of the U1 chip includes the FB keyword, and then the network name vfb_0.6v on the corresponding pin number is extracted, and at this time, it can be determined that the feedback voltage value corresponding to U1 is vb=0.6v.
The output voltage required by the power chip U1 is extracted, the output pin of the power chip is connected with one end of the inductor in series, and the other end is the required output voltage. The network name of this point is acquired as 3V3, and the output voltage uo=3.3v required by the power supply chip U1 is recognized.
According to the extracted power supply chip U1 and the feedback voltage value 5 (FB), one end of the pull-up resistor is connected with the output voltage, the other end of the pull-up resistor is connected with the pull-down resistor, and the other end of the pull-down resistor is grounded. One end of the series resistor is connected with the connection point of the pull-up resistor and the pull-down resistor, and the other end of the series resistor is connected with a feedback voltage pin. The series resistor, the pull-up resistor, the pull-down resistor and the like can be one resistor or the series-parallel equivalent of a plurality of resistors. And analyzing the netlist by the electric connection method to obtain the properties of the series resistor, the pull-up resistor and the pull-down resistor.
In the example, the series resistor is not present, the pull-up resistor R1 has a resistance of 200K, and the pull-down resistor R2 has a resistance of 44.2K. According to the voltage dividing resistor and the feedback voltage value, calculating theoretical output voltage UA=vb (1+R2/R1) =0.6 (1+200/44.2) V=3.31V, wherein the error between the theoretical output voltage UA and the required output voltage Uo=3.3V is less than 0.5%, and the error can be set according to actual requirements. The current error is within an acceptable range, and the selected voltage dividing resistors R1 and R2 are considered to be correct.
In the method, when a circuit diagram of a power supply chip is checked, a theoretical output voltage is calculated by acquiring a feedback voltage value and a voltage dividing resistor resistance value matched with the feedback voltage value, then the theoretical output voltage is compared with a required output voltage actually acquired from a circuit, and whether the selection of the voltage dividing resistor is reasonable or not is judged according to a comparison result. The method can accurately check the FB voltage dividing resistor of the power supply chip, and provides convenience for a designer to check a circuit schematic diagram.
In one embodiment, the divider resistance attribute further comprises: precision and packaging;
the circuit schematic diagram inspection method further includes: and step S150.
And step S150, recording the abnormal voltage dividing resistance when the voltage dividing resistance attribute is not in a first preset range, wherein the first preset range is a design specification range.
This embodiment is for checking whether the voltage dividing resistance property is correct. Specifically, whether the resistance and the precision of the voltage dividing resistor are in a certain range or not can be checked, and whether the selected resistor package is wrong or not can also be checked. The method comprises checking the voltage dividing resistor, specifically including series resistor, pull-up resistor and pull-down resistor, and determining whether the accuracy is within a certain range, such as 10K-200K, and accuracy is not lower than 1%.
In one embodiment, the divider resistance attribute further comprises: precision and packaging;
the circuit schematic diagram inspection method further includes: step S160.
And step S160, recording the abnormal voltage dividing resistance when the voltage dividing resistance attribute is not in a second preset range, wherein the second preset range is a part range in a preset database.
The method comprises the steps of judging whether the voltage dividing resistor is abnormal or not by searching a preset database, and judging whether the selected resistor has a corresponding resistance value in the database or not, so that the situation that the selected resistor has a non-company conventional material or even has no resistance is avoided. In addition to checking the resistance value of the resistor, it is also possible to check whether the properties such as the package of the resistor are appropriate.
The above two embodiments will be described in detail with reference to the example of fig. 2. In the example, the series resistance is not present. The pull-up resistor is R1, and the resistance and the precision are 200K and 1%. The pull-down resistor R2 has a resistance value and precision of 44.2K and 1%. The resistance values of the analysis voltage dividing resistors R1 and R2 meet 10K-200K, the precision meets not more than 1%, and the resistance values of the voltage dividing resistors are considered to be in a reasonable range. Another analysis may compare the resistances of the common resistances to the predetermined database, such as searching the predetermined database for the resistances of 200K, 1%, 0402 and 44.2K, 1%, 0402, and the precision; based on this, it can be judged whether the selected resistance is reasonable. If the resistance value, the precision range, the packaging and the like are unreasonable, an error is recorded.
Example two
Corresponding to the method of the first embodiment, as shown in fig. 3, the present invention also provides a schematic circuit diagram inspection device 3, including: the device comprises an acquisition module 310, an extraction module 320, a calculation module 330 and a judgment module 340.
An obtaining module 310, configured to obtain a schematic circuit diagram or a schematic circuit diagram netlist generated from the schematic circuit diagram;
the extracting module 320 is configured to extract a feedback voltage value, a required output voltage, and a voltage dividing resistance attribute of a power supply chip to be inspected in the schematic circuit diagram or the netlist, where the voltage dividing resistance attribute includes: the resistance of the voltage dividing resistor;
the calculating module 330 is configured to calculate a theoretical output voltage according to the resistance value of the voltage dividing resistor and the feedback voltage value;
and the judging module 340 is configured to record that the voltage dividing resistance is abnormal when the relationship between the theoretical output voltage and the required output voltage does not meet the preset condition.
In one embodiment, the process of extracting the feedback voltage value of the power chip to be inspected by the extracting module includes:
extracting chip attribute information of a power chip to be checked in the circuit schematic diagram or the netlist;
comparing the chip attribute information with a database to obtain the bit number of the power supply chip to be checked;
and extracting the feedback voltage value of the power supply chip to be checked from a database according to the bit number of the power supply chip to be checked.
In one embodiment, the process of extracting the feedback voltage value of the power chip to be inspected by the extracting module includes:
reading a corresponding network name on a pin of a power chip to be checked;
and extracting a feedback voltage value of the power supply chip to be checked according to the network name.
In one embodiment, the divider resistance attribute further comprises: precision and packaging;
the judging module is further used for recording that the voltage dividing resistance is abnormal when the voltage dividing resistance attribute is not in a first preset range, wherein the first preset range is a design specification range.
In one embodiment, the divider resistance attribute further comprises: precision and packaging;
the judging module is further used for recording the abnormality of the voltage dividing resistor when the attribute of the voltage dividing resistor is not in a second preset range, wherein the second preset range is a range of parts in a preset database.
In the device, when a circuit diagram of a power supply chip is checked, a theoretical output voltage is calculated by acquiring a feedback voltage value and a voltage dividing resistor resistance value matched with the feedback voltage value, then the theoretical output voltage is compared with a required output voltage actually acquired from a circuit, and whether the selection of the voltage dividing resistor is reasonable or not is judged according to a comparison result. The device can accurately check the FB voltage dividing resistor of the power supply chip, and provides convenience for a designer to check a circuit schematic diagram.
Example III
The embodiment of the invention also provides a storage medium, on which computer instructions are stored, which when executed by a processor, implement the circuit schematic checking method of any of the above embodiments.
Those skilled in the art will appreciate that: all or part of the steps for implementing the above method embodiments may be implemented by hardware associated with program instructions, where the foregoing program may be stored in a computer readable storage medium, and when executed, the program performs steps including the above method embodiments; and the aforementioned storage medium includes: a mobile storage device, a random access Memory (RAM, random Access Memory), a Read-Only Memory (ROM), a magnetic disk or an optical disk, or the like, which can store program codes.
Alternatively, the above-described integrated units of the present invention may be stored in a computer-readable storage medium if implemented in the form of software functional modules and sold or used as separate products. Based on such understanding, the technical solution of the embodiments of the present invention may be essentially or part contributing to the related art, and the computer software product may be stored in a storage medium, and include several instructions to cause a computer device (which may be a personal computer, a terminal, or a network device) to execute all or part of the methods of the embodiments of the present invention. And the aforementioned storage medium includes: various media capable of storing program code, such as a removable storage device, RAM, ROM, magnetic or optical disk.
Corresponding to the above-mentioned computer storage medium, in one embodiment there is also provided a computer device comprising a memory, an encoder and a computer program stored on the memory and executable on the encoder, wherein the encoder implements the circuit schematic checking method according to any of the above-mentioned embodiments when executing the program.
When the computer equipment is used for checking the circuit diagram of the power supply chip, the theoretical output voltage is calculated by acquiring the feedback voltage value and the voltage dividing resistance value matched with the feedback voltage value, then the theoretical output voltage is compared with the required output voltage actually acquired from the circuit, and whether the selection of the voltage dividing resistance is reasonable or not is judged according to the comparison result. The computer equipment can accurately check the FB voltage dividing resistor of the power supply chip, and provides convenience for designers to check the circuit schematic diagram.
The technical features of the above-described embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above-described embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.
It is to be understood that the above examples of the present invention are provided by way of illustration only and not by way of limitation of the embodiments of the present invention. Other variations or modifications of the above teachings will be apparent to those of ordinary skill in the art. It is not necessary here nor is it exhaustive of all embodiments. Any modification, equivalent replacement, improvement, etc. which come within the spirit and principles of the invention are desired to be protected by the following claims.
Claims (10)
1. A schematic circuit diagram inspection method, comprising:
acquiring a circuit schematic diagram or a circuit schematic diagram netlist generated by the circuit schematic diagram;
extracting feedback voltage values, required output voltages and voltage dividing resistance attributes of a power supply chip to be checked in the circuit schematic diagram or the netlist, wherein the voltage dividing resistance attributes comprise: the resistance of the voltage dividing resistor;
calculating theoretical output voltage according to the resistance value of the voltage dividing resistor and the feedback voltage value;
and recording abnormal voltage dividing resistance when the relation between the theoretical output voltage and the required output voltage does not meet the preset condition.
2. The schematic circuit diagram inspection method according to claim 1, wherein the process of extracting the feedback voltage value of the power supply chip to be inspected includes:
extracting chip attribute information of a power chip to be checked in the circuit schematic diagram or the netlist;
comparing the chip attribute information with a database to obtain the bit number of the power supply chip to be checked;
and extracting the feedback voltage value of the power supply chip to be checked from a database according to the bit number of the power supply chip to be checked.
3. The schematic circuit diagram inspection method according to claim 1, wherein the process of extracting the feedback voltage value of the power supply chip to be inspected includes:
reading a corresponding network name on a pin of a power chip to be checked;
and extracting a feedback voltage value of the power supply chip to be checked according to the network name.
4. A schematic circuit diagram inspection method according to any one of claims 1 to 3, wherein the voltage dividing resistance attribute further includes: precision and packaging;
the circuit schematic diagram inspection method further includes:
recording abnormal voltage dividing resistance when the voltage dividing resistance attribute is not in a first preset range, wherein the first preset range is a design specification range.
5. A schematic circuit diagram inspection method according to any one of claims 1 to 3, wherein the voltage dividing resistance attribute further includes: precision and packaging;
the circuit schematic diagram inspection method further includes:
recording abnormal voltage dividing resistance when the voltage dividing resistance attribute is not in a second preset range, wherein the second preset range is a part range in a preset database.
6. A schematic circuit diagram inspection apparatus, comprising:
the acquisition module is used for acquiring a circuit schematic diagram or a circuit schematic diagram netlist generated by the circuit schematic diagram;
the extraction module is used for extracting a feedback voltage value, a required output voltage and a divider resistance attribute of a power supply chip to be checked in the circuit schematic diagram or the netlist, wherein the divider resistance attribute comprises: the resistance of the voltage dividing resistor;
the calculation module is used for calculating theoretical output voltage according to the resistance value of the divider resistor and the feedback voltage value;
and the judging module is used for recording abnormal voltage dividing resistance when the relation between the theoretical output voltage and the required output voltage does not meet the preset condition.
7. The schematic circuit diagram apparatus according to claim 6, wherein the process of extracting the feedback voltage value of the power supply chip to be inspected by the extraction module includes:
reading a network name on a pin number of a power chip to be checked;
and extracting a feedback voltage value of the power supply chip to be checked according to the network name.
8. The schematic circuit diagram inspection apparatus according to claim 6 or 7, wherein the voltage dividing resistance property further includes: precision and packaging;
the judging module is further used for recording the abnormality of the voltage dividing resistor when the attribute of the voltage dividing resistor is not in a second preset range, wherein the second preset range is a range of parts in a preset database.
9. A computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor implements the method of any of claims 1-5 when the program is executed by the processor.
10. A computer readable storage medium, on which a computer program is stored, characterized in that the program, when being executed by a processor, implements the method according to any of claims 1-5.
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| CN (1) | CN116467984A (en) |
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2023
- 2023-04-24 CN CN202310451744.4A patent/CN116467984A/en active Pending
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