CN116451911A - Equipment technical system evaluation method and system based on capability gap - Google Patents
Equipment technical system evaluation method and system based on capability gap Download PDFInfo
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Abstract
The invention relates to the technical field of equipment technical system evaluation analysis, and particularly discloses an equipment technical system evaluation method and system based on capability gaps, wherein the method comprises the steps of constructing an equipment capability index vector model; acquiring an equipment capability gap based on an equipment capability index vector model; constructing an equipment technical system list based on the equipment capability gap, and analyzing the mapping relation between equipment and key technology and the mapping relation between capability and key technology based on the equipment technical system list; constructing a multi-dimensional equipment technical system evaluation model according to the mapping relation; evaluating the key technology based on a multidimensional equipment technology system evaluation model to obtain an evaluation result; comprehensively evaluating each key technology based on the evaluation result; the method scientifically and comprehensively evaluates and analyzes the equipment technical system.
Description
Technical Field
The invention relates to the technical field of equipment technical system evaluation and analysis, in particular to an equipment technical system evaluation method and system based on capability gaps.
Background
The requirement traction and technology promotion are main rules of the construction and development of equipment systems, and scientific determination and quantitative evaluation of key technologies in the field of military equipment are serious difficulties in macroscopic demonstration of the systems. The technical system is a canonical architecture for describing the composition structure and development evolution of the technology. In the military field, an equipment technology system is an important foundation for weapon equipment construction, how to scientifically and reasonably determine and evaluate various technologies, and especially the development of key technologies with important influence on equipment capacity requirements has an important role in the construction of equipment in informatization and intelligent contexts.
The equipment technical system is an important foundation for equipment construction and is a key core element for forming system capacity; the technical architecture research of equipment mainly focuses on technical architecture research and architecture framework research (DoDAF (Department of Defense Architecture Framework, doDAF), and the demonstration analysis of the technical architecture is guided from the multi-view angle, and the architecture framework only gives two view models describing the technical architecture, namely a technical standard list view TV-1 and a technical standard forecast view TV-2 of the architecture.
Technical evaluation was first proposed by the U.S. He's Daniel Bell, which is a method for fully evaluating and estimating the performance level and economic benefit of a technology and the possible effects of the technology on environmental ecology, and even on the whole socioeconomic political culture and psychology, and the like, and for making a reasonable choice by comprehensively and systematically analyzing and balancing the advantages and disadvantages of the technology before it is applied. The existing equipment technology evaluation method is mainly embodied in technology maturity evaluation (TRL), has certain subjectivity, and the evaluation index is not comprehensive enough and cannot embody the development characteristics of the information technology, cannot meet the requirements for equipment technology system evaluation under informatization conditions, and is required to study the multi-dimensional evaluation problem of the equipment technology system.
Disclosure of Invention
In view of the above problems, an object of the present invention is to provide an equipment technical system evaluation method based on capability gaps, which starts from the task demands of equipment missions, analyzes and measures the capability gaps of equipment, correlates the mapping relationship of analysis capability-system-technology, extracts multi-attribute evaluation indexes of equipment technologies, constructs an equipment technical system evaluation model, and scientifically and comprehensively evaluates and analyzes the equipment technical system.
A second object of the present invention is to provide an equipment technical system evaluation system based on capability gap.
The first technical scheme adopted by the invention is as follows: an equipment technical system evaluation method based on capability gap comprises the following steps:
s100: constructing an equipment capacity index vector model;
s200: acquiring an equipment capability gap based on the equipment capability index vector model;
s300: constructing an equipment technical system list based on the equipment capability gap, and analyzing the mapping relation between equipment and key technology and the mapping relation between capability and key technology based on the equipment technical system list;
s400: constructing a multi-dimensional equipment technical system evaluation model according to the mapping relation between the equipment and the key technology and the mapping relation between the capability and the key technology; evaluating the key technology based on the multi-dimensional equipment technology system evaluation model to obtain a key technology evaluation result;
s500: and comprehensively evaluating each key technology based on the key technology evaluation result.
Preferably, the equipment capability index vector model in the step S100 is expressed by the following formula:
；
in the method, in the process of the invention,providing a capability index vector model; />Is the first of the capability index systemkLayer capability index metric vectors; />Is the first of the capability index systemk-a layer 1 capability index metric vector; />The capacity index system is a layer 1 capacity index measurement vector.
Preferably, the equipment capability gap in the step S200 is calculated by the following formula:
；
in the method, in the process of the invention,is the first of the capability index systemkLayer capability indexiIs a gap in equipment capability; />Is the first of the capability index systemkLayer capability indexiA weighted metric of target demand; />Is the first of the capability index systemkLayer capability indexiIs a real-world weighted metric.
Preferably, the technical system list of equipment in step S300 includes technical lists of technical categories, technical fields, technical directions and key technologies related to equipment.
Preferably, the step S300 includes:
and analyzing the mapping relation between the equipment and the key technology and the mapping relation between the capability and the key technology by adopting a quality function unfolding method based on the equipment technology system list.
Preferably, the multi-dimensional equipment technical system evaluation model in step S400 includes a technical requirement satisfaction index model, a technical maturity index model, a technical advancement index model, and a technical urgency index model.
Preferably, the step S500 includes the following sub-steps:
s510: constructing a decision matrix based on the key technology evaluation result;
s520: calculating the relative proximity of each key technology relative to the positive ideal point and the negative ideal point based on the decision matrix;
s530: the key technologies are ranked according to the magnitude of the relative proximity.
Preferably, the decision matrix is expressed by the following formula:
；
in the method, in the process of the invention,is a decision matrix; />Is the firstjItem key technology firstbPersonal evaluationA price index value;mis the number of key technologies;pis the number of decision targets.
Preferably, the relative proximity of each key technique to the positive and negative ideal points is calculated by the following formula:
；
in the method, in the process of the invention,the relative proximity of each key technology to the positive ideal point and the negative ideal point; />Distance from each key technology to the ideal point; />The distance to the negative ideal point is for each key technology.
The second technical scheme adopted by the invention is as follows: an equipment technical system evaluation system based on capability gap comprises an equipment capability gap measurement module, a capability-system-technology association mapping module, a multi-attribute evaluation index model construction module and an equipment technology comprehensive evaluation module;
the equipment capability gap measurement module is used for constructing an equipment capability index vector model; acquiring an equipment capability gap based on the equipment capability index vector model;
the capability-system-technology association mapping module is used for constructing an equipment technology system list based on the equipment capability gap, and analyzing the mapping relationship between equipment and key technology and the mapping relationship between capability and key technology based on the equipment technology system list;
the multi-attribute evaluation index model construction module is used for constructing a multi-dimensional equipment technical system evaluation model according to the mapping relation between the equipment and the key technology and the mapping relation between the capacity and the key technology; evaluating the key technology based on the multi-dimensional equipment technology system evaluation model to obtain a key technology evaluation result;
the equipment technology comprehensive evaluation module is used for comprehensively evaluating each key technology based on the key technology evaluation result.
The beneficial effects of the technical scheme are that:
(1) The equipment technical system is an important foundation for equipment construction, and the most central problem of equipment construction and technical development is to find the gap between the existing capability and the target capability of the equipment; the invention starts from the difference of analyzing and measuring equipment capability, and provides an equipment technical system evaluation analysis method from the multi-dimensions of technical requirement satisfaction, maturity, advancement, urgency and the like.
(2) The equipment technical system evaluation method based on the capability gap disclosed by the invention starts from the task demands of equipment missions, analyzes and measures the capability gap of equipment, associates the mapping relation of analysis capability-system-technology, extracts multi-attribute evaluation indexes of the equipment technology, builds an equipment technical system evaluation model, and scientifically and comprehensively evaluates and analyzes the equipment technical system.
(3) The invention can well determine the mapping relation between each technology and capability requirement in the equipment technical system, define equipment technical evaluation indexes and models, and provide decision support for the related technical development demonstration from the comprehensive requirement degree of the multi-dimensional evaluation equipment technology.
Drawings
FIG. 1 is a schematic flow chart of an equipment technical system evaluation method based on capability gap according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of an equipment capability requirement index according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of an equipment technical architecture list provided in one embodiment of the present invention;
fig. 4 is a schematic structural diagram of an equipment technical system evaluation system based on capability gap according to an embodiment of the present invention.
Detailed Description
Embodiments of the present invention are described in further detail below with reference to the accompanying drawings and examples. The following detailed description of the embodiments and the accompanying drawings are provided to illustrate the principles of the invention and are not intended to limit the scope of the invention, i.e. the invention is not limited to the preferred embodiments described, which is defined by the claims.
In the description of the present invention, it is to be noted that, unless otherwise indicated, the meaning of "plurality" means two or more; the terms "first," "second," and the like are used for descriptive purposes only and are not to be construed as indicating or implying relative importance; the specific meaning of the above terms in the present invention can be understood as appropriate by those of ordinary skill in the art.
Example 1
As shown in fig. 1, one embodiment of the present invention provides an equipment technical architecture assessment method based on capability gap, which includes the following steps:
s100: constructing an equipment capacity index vector model;
determining a mission task and a capability attribute of the equipment through system analysis of the evaluation object, and determining a capability requirement index, wherein the capability requirement index is shown in figure 2; and constructing an equipment capability index vector model based on the capability requirement index. The capability index system (i.e. capability requirement index) is a capability evaluation standard, and can evaluate whether the capability reaches the expected target and the development direction of the capability in the next step through indexes.
The formalized description model of the capability index system is represented by the following formula:
；
in the method, in the process of the invention,is a capability index system; />Is the unique identification of the capability index; />Is a type of capability indicator (e.g., cost-effective or benefit-effective); />Is the name of the capability index; />A level hierarchy to which the capability index belongs in the whole index system; />Calculating a description of the model for the capacity index metrics; />A sub-index mark contained in the capability index; />Is a related description of the capability index.
Based on the formal description model of the capability index system, the capability index system can be described as a vector group (i.e., a capability index description model):
；
in the method, in the process of the invention,is a capability index system vector group; />Is the first of the capability index systemkLayer capability index description vectors; />Is the first of the capability index systemk-a layer 1 capability index description vector; />The vector is described for the capability index system layer 1 capability index.
The model of each index is different, and the description of the capacity index measurement calculation model (namely the quantitative calculation model of the single index) in each capacity index description model is synthesizedThe capacity metrics in the capacity index system are described by adopting matrix vectors to obtain an equipment capacity index vector model, and the equipment capacity index vector model is expressed by the following formula:
；
in the method, in the process of the invention,providing a capability index vector model; />Is the first of the capability index systemkLayer capability index metric vectors; />Is the first of the capability index systemk-a layer 1 capability index metric vector; />The capacity index system is a layer 1 capacity index measurement vector.
；
Wherein, the liquid crystal display device comprises a liquid crystal display device,is the first of the capability index systemkLayer capability index metric vectors; />Is the first of the capability index systemkLayer capability index weight vector; />Is the capability index system without weightkLayer capability index metric vectors; the invention adopts the fuzzy analytic hierarchy process to calculate the importance of the ability and determine the weight +.>。
S200: acquiring an equipment capability gap based on an equipment capability index vector model;
developing a gap measure of equipment capability for the demand: capability index System without weightkLayer capability index metric vectorMiddle (f)kLayer capability indexiThe measure of (2) is +.>，fRepresenting a metric function after index quantization; for benefit index, define capability index systemkLayer capability indexiThe equipment Capability gap (Capability gap) is:
；
in the method, in the process of the invention,is the first of the capability index systemkLayer capability indexiIs a gap in equipment capability; />Is the first of the capability index systemkLayer capability indexiA weighted metric of target demand; />Is the first of the capability index systemkLayer capability indexiThe weighted metric value in the real situation; wherein, the liquid crystal display device comprises a liquid crystal display device,
；
；
in the method, in the process of the invention,is the firstkLayer capability indexiWeights of (2); />A metric function quantized for the capacity target demand index; />The measurement function is a measurement function after index quantization in the actual situation; />Is the firstkLayer capability indexiIs a measure of (a).
In the capability index systemkLayer capability indexiIf the existing capability measure of a capability requirement index is 0 in the capability gap formula of (1)Representing the capability shortage of the item, and making up for the urgent need; thus, the capacity gap->The larger the specification, the more urgent is the development of critical equipment technology to make up for this capability gap, with a corresponding higher level of technical urgency.
Similarly, for the cost index, define the capability index systemkLayer capability indexiThe capability gap of (2) is:
；
capacity gapThe measurement of (2) lays a foundation for the determination of equipment key technology.
S300: constructing an equipment technical system list based on equipment capability gaps, and analyzing mapping relation between equipment and key technology and mapping relation between capability and key technology based on the equipment technical system list;
determining system components of equipment according to equipment capability gap analysis, and constructing an equipment technical system list; the equipment technical system list includes technical lists of equipment related technical categories, technical fields, technical directions and key technologies, and the equipment technical system list (for example, satellite equipment technical system) is shown in fig. 3.
The method is characterized in that QFD (quality function expansion) method is adopted to analyze the mapping relation between equipment and key technology and the mapping relation between capacity and key technology based on an equipment technical system list, namely QFD method is adopted to analyze the mapping relation between equipment capacity and equipment (component system) -technology, the capacity demand is used as a drive, a series of matrix tables are adopted to conduct multi-level deduction, decomposition and mapping analysis on the capacity demand, the capacity demand is converted into equipment subsystem demand, and finally, all key technologies for realizing system functions are realized, the mapping of the capacity to the key technologies is realized, and the relation between the capacity demand and the key technologies is quantized and analyzed.
The process mainly requires constructing a quality requirement expansion table, a capability-composition system matrix table, a composition system-key technology matrix table, and a capability-key technology matrix table, for example, table 1.
TABLE 1 equipment capability-Key technology matrix Table
Wherein, in Table 1, the term "as used herein" is a strong correlation (score 3), the term "as used herein" is a medium correlation (score 2), the term "as used herein" is a weak correlation (score 1), the demand importance of various key technologies can be obtained through the correlation degree and the weight of each demand.
S400: constructing a multi-dimensional equipment technical system evaluation model according to the mapping relation between equipment and key technology and the mapping relation between capacity and key technology (namely equipment technical characteristics); and evaluating the key technology based on the multi-dimensional equipment technology system evaluation model to obtain a key technology evaluation result.
The multi-dimensional equipment technical system evaluation model (namely the equipment technical system evaluation model) comprises a technical demand satisfaction index model, a technical maturity index model, a technical advancement index model and a technical urgency index model;
the evaluation of the key technology based on the multi-dimensional equipment technology system evaluation model comprises the following steps:
and respectively evaluating the key technologies according to the technical requirement satisfaction index model, the technical maturity index model, the technical advancement index model and the technical urgency index model to obtain evaluation results of the key technical requirement satisfaction, the maturity, the advancement and the urgency.
(1) Technical demand satisfaction index model TDS
The technical demand satisfaction index model TDS is expressed by the following formula:
；
in the method, in the process of the invention,is the firstjDemand satisfaction of key technologies; />Is a key technologyjRelative to equipment capability indicatorsiIs (according to the association relation +.>Taking 1, 2 or 3 to represent "strong correlation", "medium correlation" or "weak correlation", respectively); />Importance weight (value 0-1) for equipment capability;mis the number of key technologies.
(2) Technical maturity index model TRL
The technical maturity index model TRL is rated according to the requirements of the prior art maturity according to the technical maturity TRL1-TRL9 scale, as shown in table 2 below.
TABLE 2 technical maturity level hierarchy
| Technology maturity rating | Hierarchical division |
| TRL1 | Clear basic principle |
| TRL2 | Technical concepts and application concepts are clear (concepts and military application concepts are proposed) |
| TRL3 | Technical and application assumptions are demonstrated by feasibility demonstration |
| TRL4 | Technical scheme and route pass laboratory verification |
| TRL5 | Component and functional module verification through a typical simulation environment |
| TRL6 | Verification by using demonstration model machine as carrier through typical environment |
| TRL7 | Verification by using engineering prototype as carrier through typical environment |
| TRL8 | Verification by typical environment using production prototype as carrier |
| TRL9 | The product is taken as a carrier to pass through the practical application |
(3) Technical advanced index model TAL
In order to compare the research status and foresight of the corresponding technology at home and abroad, the advanced degree is described, and the achievement level of the technology is not the current achievement level; the technical advance index model TAL is rated on five scales TAL1 to TAL5 as shown in table 3 below.
TABLE 3 technical Advance hierarchical division
| Advanced technology | Hierarchical division |
| TAL1 | General techniques |
| TAL2 | Advanced technology in China |
| TAL3 | Domestic leading technology |
| TAL4 | International advanced technology |
| TAL5 | International leading technology |
(4) Technical urgency index model TUL
Aiming at the development requirements of the subject technology development and the information equipment, the urgency of the key technology is solved; the technical urgency index model TUL was assessed using TUL1-TUL5, as shown in Table 4.
Table 4 technology urgency level hierarchy
| Technology urgency grade | Evaluation value of technical urgency |
| TUL1 | 1-3 |
| TUL2 | 3-4 |
| TUL3 | 4-5 |
| TUL4 | 5-7 |
| TUL5 | More than 7 |
Key technologyjThe urgency evaluation value of (2) is represented by the following formula:
；
in the method, in the process of the invention,is a key technologyjUrgency evaluation value of (2); />Is the key technologyjMapped capability indexiA gap metric value of (2); />Is a key technologyjRelative to equipment capability indicatorsiIs (according to the association relation +.>Taking 1, 2 or 3 to represent "strong correlation", "medium correlation" or "weak correlation", respectively); />Is a key technologyjIs used for the urgency assessment factor of the (a),the technical value for long-term demand is 1, < >>The technical value required to be mastered within fifteen years is 2 # ->The technical value to be mastered in ten years is 3 +.>The technical value required to be mastered within five years is 4 ++>The value of the technology to be mastered is 5; />Is the capacity index number.
S500: and comprehensively evaluating each key technology based on the key technology evaluation result.
Based on the key technology evaluation result, adopting a multi-attribute decision method to comprehensively evaluate each key technology, namely comprehensively evaluating the key technology based on multiple attributes, specifically comprising the following sub-steps:
s510: constructing a decision matrix based on the key technology evaluation result;
regarding each key technology in the equipment technical system as a scheme, the requirement satisfaction degree, the maturity degree, the advancement and the urgency of each key technology are taken as the attributes of the scheme, in the multi-attribute (index) scheme evaluation selection, if a certain related factor (a certain index) is considered, the scheme with relatively good index value can be initially selected, if the concerned points are scattered or need to be comprehensively considered (not a certain target is specified), and when the scheme is finally evaluated and selected, each factor needs to be comprehensively considered, and a comprehensive scheme which enables each target to be better is selected.
The core of comprehensively evaluating each key technology by comprehensively considering each factor is to construct a decision matrix, wherein the decision matrix is expressed by the following formula:
；
in the method, in the process of the invention,is a decision matrix; />Is the firstjItem key technology firstbThe number of evaluation index values (i.e., the evaluation value of the evaluation index);mthe number of each key technology (namely, the number of schemes is provided with the total number of each key technology in the technical system);pfor the number of decision targets (i.e., the number of evaluation index values, the evaluation index values include the key technical requirement satisfaction, maturity, advancement and urgency evaluation results, i.e., 4).
S520: calculating the relative proximity of each key technology relative to the positive ideal point and the negative ideal point based on the decision matrix;
defining positive ideal points for multi-objective decision questions based on decision matricesAnd negative ideal point->And calculating the relative proximity of key technologies (schemes) to positive and negative ideal points +.>(i.e., each key technology proximity).
(1) The positive ideal point and the negative ideal point are respectively:
；
；
in the method, in the process of the invention,is a positive ideal point; />Is a negative ideal point; />Is a decision matrix;jis the firstjKey technology;bto evaluate the index value;Sand->The method comprises the steps of respectively obtaining a benefit type attribute evaluation value and a cost type attribute evaluation value in a decision matrix; />The 1 st evaluation index value in all key technologies is the best value; />Is the first of all key technologiespThe best value of each evaluation index value.
(2) Calculating the relative proximity of each key technology (scheme) relative to the positive ideal point and the negative ideal point;
calculating the distance from each key technology (scheme) to a positive ideal point and the distance from each key technology (scheme) to a negative ideal point:
；
；
in the method, in the process of the invention,distance from each key technology to the ideal point; />The distance from each key technology to the negative ideal point;bto evaluate the index value;pfor the number of decision targets (i.e., the number of evaluation index values, the evaluation index values include the key technical requirement satisfaction, maturity, advancement and urgency evaluation results, i.e., 4); />Is a decision matrix; />Is a positive ideal point;is a negative ideal point.
Calculating the relative proximity of each key technology (scheme) relative to the positive ideal point and the negative ideal point:
；
in the method, in the process of the invention,the relative proximity of each key technology to the positive ideal point and the negative ideal point; />Distance from each key technology to the ideal point; />The distance to the negative ideal point is for each key technology.
S530: the key technologies are ranked according to the relative proximity, so that support can be provided for determining the priority development sequence and development route of the key technologies as a whole.
Example two
As shown in fig. 4, an embodiment of the present invention provides an equipment technical architecture evaluation system based on capability gap, which includes an equipment capability gap measurement module, a capability-system-technology association mapping module, a multi-attribute evaluation index model construction module and an equipment technology comprehensive evaluation module;
the equipment capability gap measurement module is used for constructing an equipment capability index vector model; acquiring an equipment capability gap based on the equipment capability index vector model; the equipment capability gap measurement module analyzes the requirements of mission tasks of equipment battles, builds an equipment capability index vector model and develops equipment capability gap measurement aiming at the requirements.
The capability-system-technology association mapping module is used for constructing an equipment technology system list based on the equipment capability gap, and analyzing the mapping relationship between equipment and key technology and the mapping relationship between capability and key technology based on the equipment technology system list; the capability-system-technology association mapping module analyzes and determines subsystem systems needing to be developed according to capability requirements and capability gaps, initially builds capability and equipment mapping relations, determines technical lists of various technical fields, technical directions, key technologies and the like of equipment, and analyzes the equipment and technology mapping relations and the capability and technology mapping relations on the basis.
The multi-attribute evaluation index model construction module is used for constructing a multi-dimensional equipment technical system evaluation model according to the mapping relation between the equipment and the key technology and the mapping relation between the capacity and the key technology; and evaluating the key technology based on the multi-dimensional equipment technology system evaluation model to obtain a key technology evaluation result.
The equipment technology comprehensive evaluation module is used for comprehensively evaluating each key technology based on the key technology evaluation result; the comprehensive evaluation module of the equipment technology introduces a multi-attribute decision method to evaluate the overall importance degree of each key technology in the current and future time aiming at the satisfaction degree, maturity, advancement and urgency evaluation result of each key technology in the equipment technology system, and provides a reference for determining the priority development sequence and development route of each key technology.
In the embodiments provided in the present application, it should be understood that the disclosed apparatus and method may be implemented in other manners. For example, the apparatus embodiments described above are merely illustrative, e.g., the division of the units is merely a logical function division, and there may be additional divisions when actually implemented, e.g., multiple units or components may be combined or integrated into another system, or some features may be omitted or not performed. Alternatively, the coupling or direct coupling or communication connection shown or discussed with each other may be an indirect coupling or communication connection via some interfaces, devices or units, which may be in electrical, mechanical or other form.
The units described as separate units may or may not be physically separate, and units shown as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.
In addition, each functional unit in the embodiments of the present invention may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit.
The functions, if implemented in the form of software functional units and sold or used as a stand-alone product, may be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention may be embodied essentially or in a part contributing to the prior art or in a part of the technical solution, in the form of a software product stored in a storage medium, comprising several instructions for causing a computer device (which may be a personal computer, a server, a network device, etc.) to perform all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a usb disk, a removable hard disk, a ROM, a RAM, a magnetic disk, or an optical disk, etc.
The foregoing is merely illustrative of the present invention, and the present invention is not limited thereto, and any person skilled in the art will readily recognize that variations or substitutions are within the scope of the present invention. Therefore, the protection scope of the invention is subject to the protection scope of the claims.
Claims (10)
1. The equipment technical system evaluation method based on the capability gap is characterized by comprising the following steps of:
s100: constructing an equipment capacity index vector model;
s200: acquiring an equipment capability gap based on the equipment capability index vector model;
s300: constructing an equipment technical system list based on the equipment capability gap, and analyzing the mapping relation between equipment and key technology and the mapping relation between capability and key technology based on the equipment technical system list;
s400: constructing a multi-dimensional equipment technical system evaluation model according to the mapping relation between the equipment and the key technology and the mapping relation between the capability and the key technology; evaluating the key technology based on the multi-dimensional equipment technology system evaluation model to obtain a key technology evaluation result;
s500: and comprehensively evaluating each key technology based on the key technology evaluation result.
2. The equipment technical architecture evaluation method according to claim 1, wherein the equipment capability index vector model in step S100 is expressed by the following formula:
；
in the method, in the process of the invention,providing a capability index vector model; />Is the first of the capability index systemkLayer capability index metric vectors;is the first of the capability index systemk-a layer 1 capability index metric vector; />The capacity index system is a layer 1 capacity index measurement vector.
3. The equipment technical system evaluation method according to claim 1, wherein the equipment capability gap in step S200 is calculated by the following formula:
；
in the method, in the process of the invention,is the first of the capability index systemkLayer capability indexiIs a gap in equipment capability; />Is the first of the capability index systemkLayer capability indexiA weighted metric of target demand; />Is the first of the capability index systemkLayer capability indexiIs a real-world weighted metric.
4. The equipment technical system evaluation method according to claim 1, wherein the equipment technical system list in step S300 includes technical lists of equipment-related technical categories, technical fields, technical directions, and key technologies.
5. The equipment technical system evaluation method according to claim 1, wherein the step S300 includes:
and analyzing the mapping relation between equipment and key technology, and the mapping relation between capability and key technology by adopting a quality function unfolding method based on the equipment technology system list.
6. The equipment technical system evaluation method according to claim 1, wherein the multi-dimensional equipment technical system evaluation model in step S400 includes a technical demand satisfaction index model, a technical maturity index model, a technical advancement index model, and a technical urgency index model.
7. The equipment technical system evaluation method according to claim 1, wherein the step S500 includes the sub-steps of:
s510: constructing a decision matrix based on the key technology evaluation result;
s520: calculating the relative proximity of each key technology relative to the positive ideal point and the negative ideal point based on the decision matrix;
s530: the key technologies are ranked according to the magnitude of the relative proximity.
8. The equipment technology architecture evaluation method of claim 7, wherein the decision matrix is represented by the following formula:
；
in the method, in the process of the invention,is a decision matrix; />Is the firstjItem key technology firstbEach evaluation index value;mis the number of key technologies;pis the number of decision targets.
9. The equipment technology architecture assessment method of claim 8, wherein the relative proximity of each key technology to positive and negative ideal points is calculated by the following formula:
；
in the method, in the process of the invention,the relative proximity of each key technology to the positive ideal point and the negative ideal point; />Distance from each key technology to the ideal point; />The distance to the negative ideal point is for each key technology.
10. The equipment technical system evaluation system based on the capability gap is characterized by comprising an equipment capability gap measurement module, a capability-system-technology association mapping module, a multi-attribute evaluation index model construction module and an equipment technology comprehensive evaluation module;
the equipment capability gap measurement module is used for constructing an equipment capability index vector model; acquiring an equipment capability gap based on the equipment capability index vector model;
the capability-system-technology association mapping module is used for constructing an equipment technology system list based on the equipment capability gap, and analyzing the mapping relationship between equipment and key technology and the mapping relationship between capability and key technology based on the equipment technology system list;
the multi-attribute evaluation index model construction module is used for constructing a multi-dimensional equipment technical system evaluation model according to the mapping relation between equipment and key technology and the mapping relation between capacity and key technology; evaluating the key technology based on the multi-dimensional equipment technology system evaluation model to obtain a key technology evaluation result;
the equipment technology comprehensive evaluation module is used for comprehensively evaluating each key technology based on the key technology evaluation result.
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