CN116430159A - Multifunctional test system - Google Patents
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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- G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/28—Provision in measuring instruments for reference values, e.g. standard voltage, standard waveform
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
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Abstract
The invention relates to the technical field of testing, and particularly discloses a multifunctional testing system, which comprises the following components: the system comprises a system power supply, an open-loop control circuit and a closed-loop control circuit; the open loop control circuit includes: a voltage control element and a first current sampling circuit; the closed loop control circuit includes: the system comprises a current control element, a processor, a triode, a second current sampling circuit, a first current loop control circuit, a second current loop control circuit, a first voltage loop control circuit, a second voltage loop control circuit and a voltage following control circuit, wherein the current control element, the processor, the triode, the second current sampling circuit, the first current loop control circuit, the second current loop control circuit, the first voltage loop control circuit, the second voltage loop control circuit and the voltage following control circuit are used for controlling the voltage control element and the current control element according to the voltage and the current of the open loop control circuit, so that the open loop control circuit outputs test voltage and test current for testing; the multifunctional test system can reduce the error of the measurement result and improve the portability of the test system.
Description
Technical Field
The invention relates to the technical field of testing, in particular to a multifunctional testing system.
Background
In the research and development stage of electronic products and in the manufacturing process of the products, in order to ensure the qualification rate of the electronic products, test equipment is required to test the functions of the electronic products. Hardware testing is a measurement with experimental properties, i.e. a combination of measurement and experiment. The testing means is the instrument. The basic task of the test is to obtain useful information, and by means of special instruments and equipment, reasonable experimental methods are designed and necessary signal analysis and data processing are performed, so that information related to the tested object is obtained.
In the practical testing process, the common testing equipment comprises a power supply, an electronic load, a battery simulator, a battery capacity test, an output voltage waveform programming power supply and the like, and at least two devices are required to be combined together during the testing.
The test apparatus in the related art has mainly the following drawbacks:
first, because these test equipment is bulky, engineer and the test desktop of production line need occupy very big space, and various lines are very long and interweave together, lead to test engineer's maintenance degree of difficulty, and the line loss after the combination is great, further lead to present measuring result error great.
Second, because these test devices are bulky, they have limited use scenarios and poor portability. For example, when test engineers go on business or work at home, they cannot test without a specialized laboratory and corresponding equipment.
Disclosure of Invention
In view of the above problems, the present invention provides a multifunctional test system, which reduces errors of measurement results and improves portability of the test system.
The invention provides a multifunctional test system, which comprises: the system comprises a system power supply, an open-loop control circuit and a closed-loop control circuit;
The open loop control circuit includes: a voltage control element and a first current sampling circuit;
the closed loop control circuit includes: the device comprises a current control element, a processor, a triode, a second current sampling circuit, a first current loop control circuit, a second current loop control circuit, a first voltage loop control circuit, a second voltage loop control circuit and a voltage following control circuit, wherein the current control element, the processor, the triode, the second current sampling circuit, the first current loop control circuit, the second current loop control circuit, the first voltage loop control circuit, the second voltage loop control circuit and the voltage following control circuit are used for controlling the voltage control element and the current control element according to the voltage and the current of the open loop control circuit, so that the open loop control circuit outputs test voltage and test current for testing; the system power supply is connected with a first end of the voltage control element, a second end of the voltage control element is connected with an input end of the first current sampling circuit, an output end of the first current sampling circuit is connected with a first input end of the first current loop control circuit, an output end of the first current loop control circuit is connected with a first input end of the first voltage loop control circuit, an output end of the first voltage loop control circuit is respectively connected with a first end of the triode and an input end of the voltage following control circuit, an output end of the voltage following control circuit is connected with a first end of the current control element, and a second end of the current control element is connected with a second end of the voltage control element;
The input end of the second voltage loop control circuit is connected with the test output end of the first current sampling circuit and the processor respectively, and the output end of the second voltage loop control circuit is connected with the first input end of the first voltage loop control circuit; the second end of the triode is connected with the third end of the voltage control element;
the third end of the current control element is grounded, or the third end of the current control element is connected in series with the second current sampling circuit and then grounded, the output end of the second current sampling circuit is connected with the input end of the second current loop control circuit, and the output end of the second current loop control circuit is connected with the first end of the current control element.
In one possible implementation, the processor is configured to output a first programming current, a second programming current, and a programming voltage; the first current loop control circuit is used for comparing the test current with a first programming current and outputting a current control signal;
the first voltage loop control circuit is used for comparing the test voltage after voltage division with the programming voltage and outputting a voltage control signal;
the second voltage loop control circuit is used for taking the sum of the values of the current control signal and the voltage control signal as the value of a reference signal, comparing the reference signal with a voltage division signal and outputting a voltage element control signal so as to control the triode; the voltage division signal is a voltage division signal of the output end voltage of the voltage control element;
The triode is used for driving the voltage control element to be switched on or switched off according to the voltage element control signal;
the voltage following control circuit is used for outputting a first current element control signal according to the voltage element control signal and a preset constant voltage to control the current control element;
the second current loop control circuit is used for comparing the test current with a second programming current and outputting a second current element control signal for controlling the current control element to be turned on or turned off.
In one possible implementation, the multi-function test system further includes: a temperature acquisition module;
the temperature acquisition module is used for acquiring the temperatures of the voltage control element and the current control element and sending the temperatures to the processor;
the processor is further configured to output a temperature protection signal according to the temperatures of the voltage control element and the current control element and a preset temperature threshold, sum the temperature protection signal and the divided value of the test voltage, and output the voltage element control signal.
In a possible implementation manner, the processor is further configured to calculate the divided test voltage through a voltage drift compensation algorithm to obtain a compensation voltage, and sum the values of the compensation voltage, the temperature protection signal, and the divided test voltage to output the voltage element control signal.
In one possible implementation manner, when the multifunctional test system is used for a constant voltage and constant current power supply, the third end of the current control element is grounded;
when the temperature protection signal is normal and the test current is smaller than a preset constant current, the test voltage is regulated by the first current loop control circuit and the first voltage loop control circuit, and the voltage control element is controlled to output constant voltage;
when the temperature protection signal is normal and the test current is greater than or equal to a preset constant current, the test voltage is regulated by the first current loop control circuit, the first voltage loop control circuit and the first voltage loop control circuit, and the voltage control element is controlled to output the constant current.
In one possible implementation manner, when the multifunctional test system is used for an electronic load, the output end of the open loop control circuit is connected with the positive electrode of the device to be tested, and the negative electrode of the device to be tested is grounded; the third end of the current control element is connected with the second current sampling circuit in series and then grounded, the output end of the second current sampling circuit is connected with the input end of the second current loop control circuit, and the output end of the second current loop control circuit is connected with the first end of the current control element;
When the temperature protection signal is normal and the voltage of the electronic load is larger than the divided voltage of the preset constant voltage, the voltage following control circuit controls the current control element to be conducted, the electronic load is in a discharging state, and the second current loop control circuit outputs constant current;
when the temperature protection signal is normal and the voltage of the electronic load is smaller than or equal to the divided voltage of the preset constant voltage, the voltage following control circuit controls the current control element to cut off, and the electronic load is in an output constant voltage state.
In one possible implementation manner, when the multifunctional test system is used in a battery simulator, the output end of the open loop control circuit is connected with the positive electrode of a battery, and the negative electrode of the battery is grounded; the third end of the current control element is connected with the second current sampling circuit in series and then grounded, the output end of the second current sampling circuit is connected with the input end of the second current loop control circuit, and the output end of the second current loop control circuit is connected with the first end of the current control element;
when the multifunctional test system is used for charging a battery simulator, the second voltage loop control circuit outputs a voltage element control signal for controlling the voltage control element to cut off and outputting constant current;
When the multifunctional test system is used for discharging the battery simulator, the second current loop control circuit outputs a second current element control signal for controlling the current control element to be cut off and outputting constant current.
In one possible implementation manner, when the multifunctional test system is used for testing the battery capacity, the third end of the current control element is connected in series with the second current sampling circuit and then grounded, the output end of the second current sampling circuit is connected with the input end of the second current loop control circuit, and the output end of the second current loop control circuit is connected with the first end of the current control element; and the processor performs integral operation on the current on the open-loop control circuit to obtain the charge capacity or discharge capacity of the external battery.
In one possible implementation, when the multifunctional test system is used for voltage waveform output, the multifunctional test system further includes: one end of the capacitor is connected with the first input end of the current control element, and the other end of the capacitor is grounded; the third end of the current control element is connected with the second current sampling circuit in series and then grounded, the output end of the second current sampling circuit is connected with the input end of the second current loop control circuit, and the output end of the second current loop control circuit is connected with the first end of the current control element;
The processor is further used for converting the received programming waveform sequence into a voltage waveform, and the voltage following control circuit controls the current control element to charge and discharge the capacitor according to the voltage waveform, so that the open-loop control circuit outputs the programming voltage waveform.
In one possible implementation manner, the voltage control element and the current control element are MOS transistors;
the first current loop control circuit, the second current loop control circuit, the first voltage loop control circuit and the second voltage loop control circuit are error amplifiers;
the voltage following control circuit is an in-phase proportional amplifying open-drain circuit.
Based on the technical scheme, the invention has the following beneficial effects:
(1) The integrated test system can have multiple functions such as a constant voltage and constant current power supply, an electronic load, a battery simulator, a battery capacity test, a programming voltage waveform output and the like, so that the use amount of cables is reduced, the line loss is reduced, and the error of a measurement result is further reduced.
(2) The integrated multifunctional test system reduces the occupied volume of the test equipment, increases the use scene and improves the portability of the test system.
(3) The multifunctional testing system provided by the invention integrates multiple functions of a power supply, an electronic load, a battery simulator, a battery capacity tester and the like into one multifunctional module, rather than combining the mutually independent functional modules together, so that the complexity and cost of a circuit are greatly reduced; and ensure that the system can stably, reliably and safely run after various functions are fused into a multifunctional module; meanwhile, the stability and the safety of various complex scenes (dynamic load, overvoltage and overcurrent protection, temperature drift, programmable control of an upper computer and the like) in the actual use process are also met.
(4) The multifunctional test system of the invention realizes the following functions:
the constant voltage and constant current power supply can be regulated by a closed-loop control circuit to control the multifunctional test system to output constant voltage or constant current.
The constant-current charging circuit is used for an electronic load, can simulate to be charged or discharged, and is regulated by a closed-loop control circuit to realize constant-current discharge of an external charging circuit or constant-voltage charging of the external charging circuit.
The constant current charging circuit is used for a battery simulator, and constant current is charged or discharged through the regulation of a closed-loop control circuit.
The method is used for testing the capacity of the battery, can charge or discharge an external battery, and integrates the testing current through a processor to obtain the charging capacity or the discharging capacity.
The voltage waveform output circuit is used for outputting the programming voltage waveform, and can be regulated by a closed-loop control circuit, so that the output test voltage changes along with the voltage programmed by a user.
Drawings
FIG. 1 is a schematic diagram of a multifunctional test system according to the present invention;
FIG. 2 is a system block diagram of a multi-functional test system provided by the present invention;
FIG. 3 is a working block diagram of the constant voltage and constant current digital power supply provided by the invention;
FIG. 4 is a block diagram of the operation of the electronic load provided by the present invention;
FIG. 5 is a block diagram of the operation of the battery simulator provided by the present invention;
FIG. 6 is a block diagram illustrating the operation of the battery capacity test provided by the present invention;
FIG. 7 is a schematic circuit diagram of an error amplifier provided by the present invention;
FIG. 8 is a diagram of simulation results of the relationship between the power supply voltage output and the user-set voltage provided by the present invention;
FIG. 9 is a graph of simulation results of the stability of the error amplifier provided by the present invention;
FIG. 10 is a schematic diagram of a voltage follower control circuit provided by the present invention;
FIG. 11 is a schematic diagram of a working path of the multifunctional test system provided by the present invention;
FIG. 12 is a graph of the simulation result of the constant voltage and constant current output of the power supply provided by the invention;
FIG. 13 is a schematic diagram of an electronic load according to the present invention;
FIG. 14 is a graph of simulation results of constant voltage and constant current discharge of an electronic load provided by the invention;
FIG. 15 is a graph of simulation results of the battery simulator provided by the invention when the battery is charged;
FIG. 16 is a diagram showing the position of the output capacitor in the actual circuit for outputting constant voltage and constant current of the power supply provided by the invention;
FIG. 17 is a waveform diagram of voltage following simulation of constant voltage and constant current output of a common power supply under a large load;
FIG. 18 is a waveform diagram of a voltage following simulation of a constant voltage and constant current output of a common power supply under a small load;
fig. 19 is a waveform diagram of voltage following simulation of a constant voltage and constant current output of a power supply under a small load after the voltage following control circuit is added.
Detailed Description
Embodiments of the present invention are described in further detail below with reference to the accompanying drawings and examples. The following detailed description of the embodiments and the accompanying drawings are provided to illustrate the principles of the invention and are not intended to limit the scope of the invention, i.e. the invention is not limited to the preferred embodiments described, which is defined by the claims.
In the description of the present invention, it is to be noted that, unless otherwise indicated, the meaning of "plurality" is two or more. The terms "first," "second," and the like are used for descriptive purposes only and are not to be construed as indicating or implying relative importance. The specific meaning of the above terms in the present invention can be understood as appropriate by those of ordinary skill in the art.
As shown in fig. 1 and 2, the present invention provides a multi-functional test system, comprising: a system power Vin, an open loop control circuit 1 and a closed loop control circuit 2.
Fig. 1 shows a more specific internal structure of the first current loop control circuit 22, the second current loop control circuit 23, the first voltage loop control circuit 24, the second voltage loop control circuit 25, and the voltage following control circuit 26.
Fig. 2 schematically shows the positions and connection relations of the first current loop control circuit 22, the second current loop control circuit 23, the first voltage loop control circuit 24, the second voltage loop control circuit 25, and the voltage follower control circuit 26 in the multi-function test system.
The open loop control circuit 1 includes: a voltage control element Q1 and a first current sampling circuit 11. The closed-loop control circuit 2 includes: the current control element Q2, the processor MCU, the triode Q3, the second current sampling circuit 21, the first current loop control circuit 22, the second current loop control circuit 23, the first voltage loop control circuit 24, the second voltage loop control circuit 25 and the voltage following control circuit 26 are used for controlling the voltage control element Q1 and the current control element Q2 according to the voltage and the current of the open loop control circuit 1, so that the open loop control circuit 1 outputs a test voltage and a test current for testing.
The system power Vin is connected to a first end of the voltage control element Q1, a second end of the voltage control element Q1 is connected to an input end of the first current sampling circuit 11, an output end of the first current sampling circuit 11 is connected to a first input end of the first current loop control circuit 22, an output end of the first current loop control circuit 22 is connected to a first input end of the first voltage loop control circuit 24, an output end of the first voltage loop control circuit 24 is connected to a first end of the triode Q3 and an input end of the voltage following control circuit 26, an output end of the voltage following control circuit 26 is connected to a first end of the current control element Q2, and a second end of the current control element Q2 is connected to a second end of the voltage control element Q1.
An input end of the second voltage loop control circuit 25 is connected with a test output end of the first current sampling circuit 11 and the processor MCU respectively, and an output end of the second voltage loop control circuit 25 is connected with a first input end of the first voltage loop control circuit 24. The second terminal of the transistor Q3 is connected to the third terminal of the voltage control element Q1.
The third end of the current control element Q2 is grounded, or the third end of the current control element Q2 is connected in series with the second current sampling circuit 21 and then grounded, the output end of the second current sampling circuit 21 is connected with the input end of the second current loop control circuit 23, and the output end of the second current loop control circuit 23 is connected with the first end of the current control element Q2.
In one possible implementation, the open loop control circuit 1 further includes: and the overcurrent protection circuit PTC is used for preventing the open loop control circuit from overlarge current and damaging components.
The multifunctional test system further comprises a voltage divider K1 and a voltage divider K2, which are respectively used for dividing the output end voltage Vo and the test voltage Vout of the voltage control element Q1.
The processor MCU is also respectively connected with the first analog-to-digital converter ADC1, the second analog-to-digital converter ADC2, the third analog-to-digital converter ADC3, the first digital-to-analog converter DAC1, the second digital-to-analog converter DAC2, the third digital-to-analog converter DAC3, the display LCD and the serial UART.
The multifunctional testing system provided by the invention integrates multiple functions of a power supply, an electronic load, a battery simulator, a battery capacity tester and the like into one multifunctional module, rather than combining all mutually independent functional modules, so that the complexity and cost of a circuit are greatly reduced. After various functions are fused into a multifunctional module, the system can stably, reliably and safely run. Meanwhile, the stability and the safety of various complex scenes (dynamic load, overvoltage and overcurrent protection, temperature drift, programmable control of an upper computer and the like) in the actual use process are also met.
In one possible implementation, the processor MCU is configured to output a first programming current Aref, a second programming current Lref, and a programming voltage.
The first current loop control circuit 22 is used for comparing the test current AFB with the first programming current Aref and outputting a current control signal.
The first voltage loop control circuit 24 is used for comparing the divided test voltage with the programming voltage and outputting a voltage control signal.
The second voltage loop control circuit 25 is configured to compare the reference signal with the divided voltage signal using the sum of the values of the current control signal and the voltage control signal Vref as the value of the reference signal, and output a voltage element control signal to control the transistor Q3. The divided signal is a divided signal of the output terminal voltage of the voltage control element Q1.
The triode Q3 is used for driving the voltage control element Q1 to be turned on or turned off according to the voltage element control signal.
The voltage follower control circuit 26 is configured to output a first current element control signal for controlling the current control element Q2 according to the voltage element control signal and a preset constant voltage.
The second current loop control circuit 23 is configured to compare the test current AFB with the second programming current Lref, and output a second current element control signal for controlling the current control element Q2 to be turned on or off.
In one possible implementation, the multi-function test system further includes: and a temperature acquisition module.
The temperature acquisition module is used for acquiring the temperatures of the voltage control element Q1 and the current control element Q2 and sending the temperatures to the processor MCU.
The processor MCU is also used for outputting a temperature protection signal according to the temperatures of the voltage control element Q1 and the current control element Q2 and a preset temperature threshold value, and summing the temperature protection signal and the value of the divided test voltage to output a voltage element control signal.
In one possible implementation, the processor MCU is further configured to calculate the divided test voltage by a voltage drift compensation algorithm to obtain a compensation voltage, and sum the values of the compensation voltage, the temperature protection signal, and the divided test voltage to output a voltage element control signal.
In one possible implementation, when the multifunctional test system is used for a constant voltage and constant current power supply, the third terminal of the current control element Q2 is grounded.
When the temperature protection signal is normal and the test current AFB is smaller than the preset constant current, the test voltage is regulated by the first current loop control circuit 22 and the first voltage loop control circuit 24, and the voltage control element Q1 is controlled to output a constant voltage.
When the temperature protection signal is normal and the test current AFB is greater than or equal to the preset constant current, the test voltage is regulated by the first current loop control circuit 22, the first voltage loop control circuit 24 and the first voltage loop control circuit 24, and the voltage control element Q1 is controlled to output the constant current.
In one possible implementation, when the multifunctional test system is used for an electronic load, the output end of the open loop control circuit 1 is connected to the positive pole of the device under test, and the negative pole of the device under test is grounded. The third end of the current control element Q2 is connected in series with the second current sampling circuit 21 and then grounded, the output end of the second current sampling circuit 21 is connected with the input end of the second current loop control circuit 23, and the output end of the second current loop control circuit 23 is connected with the first end of the current control element Q2.
When the temperature protection signal is normal and the voltage of the electronic load is greater than the divided voltage of the preset constant voltage, the voltage follower control circuit 26 controls the current control element Q2 to be turned on, the electronic load is in a discharging state, and the second current loop control circuit 23 outputs a constant current.
When the temperature protection signal is normal and the voltage of the electronic load is less than or equal to the divided voltage of the preset constant voltage, the voltage follower control circuit 26 controls the current control element Q2 to be turned off, and the electronic load is in an output constant voltage state.
Through the above mode, the multifunctional test system provided by the invention can perform over-temperature protection on the voltage control element Q1 and the current control element Q2.
In one possible implementation, when the multifunctional test system is used in a battery simulator, the output of the open loop control circuit 1 is connected to the positive pole of the battery, and the negative pole of the battery is grounded. The third end of the current control element Q2 is connected in series with the second current sampling circuit 21 and then grounded, the output end of the second current sampling circuit 21 is connected with the input end of the second current loop control circuit 23, and the output end of the second current loop control circuit 23 is connected with the first end of the current control element Q2.
When the multifunctional test system is used for charging the battery simulator, the second voltage loop control circuit 25 outputs a voltage element control signal for controlling the voltage control element Q1 to be turned off and outputting a constant current.
When the multifunctional test system is used for discharging the battery simulator, the second current loop control circuit 23 outputs a second current element control signal for controlling the current control element Q2 to be cut off and outputting constant current.
In one possible implementation, when the multifunctional test system is used for testing the battery capacity, the third terminal of the current control element Q2 is connected in series with the second current sampling circuit 21 and then grounded, the output terminal of the second current sampling circuit 21 is connected to the input terminal of the second current loop control circuit 23, and the output terminal of the second current loop control circuit 23 is connected to the first terminal of the current control element Q2. The processor MCU performs integral operation on the current on the open loop control circuit 1 to obtain the charge capacity or discharge capacity of the external battery.
In one possible implementation, when the multifunctional test system is used for voltage waveform output, the multifunctional test system further includes: and one end of the capacitor Co is connected with the first input end of the current control element Q2, and the other end of the capacitor Co is grounded.
The processor MCU is further configured to convert the received programming waveform sequence into a voltage waveform, and the voltage follower control circuit 26 controls the current control element Q2 to charge and discharge the capacitor Co according to the voltage waveform, so that the open loop control circuit 1 outputs the programming voltage waveform.
In one possible implementation, the voltage control element Q1 and the current control element Q2 are MOS transistors.
The first current loop control circuit 22, the second current loop control circuit 23, the first voltage loop control circuit 24, and the second voltage loop control circuit 25 are error amplifiers.
The voltage follower control circuit 26 is an in-phase proportional amplifying open-drain circuit.
The above is the structure of the multifunctional test system of the present invention, and the following is the function and working principle of each circuit in the multifunctional test system.
As shown in fig. 7, the first input end of the error amplifier G1(s) is connected in series with the first resistor R1 and then connected with Vi, the second input end is connected in series with the second resistor R2 and then connected with Vref, and the first input end is also connected in series with the third resistor R3 and the first capacitor C1 in turn and then connected with the output end Vctl of the error amplifier.
The first voltage loop control circuit has the functions of: a constant voltage is achieved. The first voltage loop control circuit 24 outputs a level as follows equation (1):
wherein Vi-Vref is the error signal, and when the error signal is greater than a small value, the error amplifier outputs a low level. When Vi-Vref is less than a small value, the error amplifier will output a high level.
Vi=vo×k1, K1 is a voltage dividing ratio of the first voltage divider K1 dividing the output voltage of the voltage control element Q1. When the output voltage is higher than
When Vctl is output low, the voltage control element Q1 is turned off. When the output voltage is lower than
When Vctl is high, the voltage control element Q1 is turned on. The two states are repeatedly regulated on a tiny time slice to finally reach a balance, so that the output end voltage Vo of the voltage control element Q1 is constant and the output voltage is +.>
Thereby realizing the constant voltage output function of the power supply.
As shown in fig. 8, taking k1=0.5, the amplitude of vref is 1V, and the output waveform of Vo is simulated at a frequency of 2 Hz. From this figure it can be seen that the Vo output is
Thereby proving the validity of the error amplifier and the correctness of the constant voltage output function.
As shown in fig. 9, it can be seen that the crossover frequency point is about 30kHz and the phase margin is equal to 107 ° (greater than 45 °), the stability of the first voltage loop control circuit 24 can be ensured.
The first current loop control circuit 22 and the second current loop control circuit 23 function as: a constant current is achieved. Just as the principle of the second voltage loop control circuit 25 realizing a constant voltage, the RC parameters are different.
The second voltage loop control circuit 25 functions as: and compensating voltage drift caused by load change, temperature drift and the like under different scenes of a user. Meanwhile, the second voltage loop control circuit 25 is more focused on high accuracy of voltage, and a high accuracy analog-to-digital converter of 16 bits or more is required. Therefore, the second voltage loop control circuit 25 implements an error amplifier with high precision adjustment by software, and Vref in the second voltage loop control circuit 25 is a user-set voltage value, vi is a voltage value, referring to the above formula (1)
. K2 is the voltage division ratio of the second voltage divider dividing the test voltage.
The first voltage loop control circuit 24 is identical to the principle that the second voltage loop control circuit 25 realizes a constant voltage, and only the RC parameters are different.
As shown in fig. 10, the first input end of the in-phase proportional amplifying open-drain output circuit K(s) is connected in series with a first resistor R1 and then grounded, the second input end is connected in series with a second resistor R2 and then connected with a Vctl, the first input end is connected in series with a third resistor R3 and then connected with the output end Vctl2 of the error amplifier, the output end Vctl2 of the error amplifier is connected with the second input end of the current control element Q2, and the first capacitor C1 is connected in parallel with the third resistor R3.
The output level of the voltage follower control circuit is as follows (2)
When Vctl is low, the output of Vctl2 is low and q2_ctl1 is in a high-impedance state.
As shown in fig. 1, when the Vo voltage is higher than the constant voltage, the first voltage loop control circuit 24 outputs Vctl which will output a low level to control Q1 to be turned off, and no voltage is outputted. However, due to VThe voltage at the o-terminal is higher than a predetermined constant voltage, so a current path to GND is required to release energy and reduce the Vo voltage. When Vctl is low, q2_ctl1 is in a high resistance state, and q2_ctl1 controls Q2 to be turned on, thereby realizing a path for current to GND. The operating principle is repeatedly regulated on a tiny time slice, thereby realizing that the Vo voltage follows the constant voltage in real time
Is provided.
The multifunctional test system integrates the test equipment with the functions into a multifunctional test system through fusion of the existing test equipment, so that the use amount of cables is reduced, line loss is reduced, and the error of a measurement result is further reduced. The integrated multifunctional test system reduces the occupied volume of the test equipment, increases the use scene and improves the portability of the test system.
The invention integrates the functions of an electronic load, a battery simulator, a battery capacity test, an output voltage waveform and the like through a voltage follower control circuit based on a linear constant-voltage constant-current power supply, and realizes the stable control of a closed loop system through a specific serial-parallel architecture among a second voltage loop control circuit 25, a first voltage loop control circuit 24, a first current loop control circuit 22 and a second current loop control circuit 23. For ease of understanding, various test functions of the multi-function test system are enumerated below.
In the following embodiments, the voltage control element Q1 is a PMOS transistor, and the current control element Q2 is an NMOS transistor.
Example 1
Fig. 3 is a working block diagram of the constant voltage and constant current digital power supply provided by the invention, and as shown in fig. 3, one embodiment of the invention provides a constant voltage and constant current power supply, an open loop control circuit comprises an overcurrent protection circuit, a PMOS tube Q1 and a first current sampling resistor which are sequentially connected in series, an input power supply Vin outputs a voltage Vo after passing through the overcurrent protection circuit and the PMOS tube Q1, and outputs a test voltage Vout through the first current sampling resistor.
Vo is divided by a voltage divider K1 and connected to the first voltage loop control circuit 24 as an input of the closed loop control circuit 2. Vout is divided by a voltage divider K2, collected by an analog-to-digital converter ADC and used as an input signal of a voltage drift compensation algorithm, and the voltage drift compensation algorithm outputs a compensation voltage value and programming voltage to carry out addition operation to obtain a reference signal Vref. The first current loop control circuit 22 outputs a current control signal by comparing the programmable current value Aref with the current of the open loop control circuit. The current control signal and Vref are added to be used as a comparison signal of the closed-loop control circuit. After the input signal and the comparison signal are input to the first voltage loop control circuit 24 for comparison operation, a voltage control signal is output to control the NPN triode Q3, and the PMOS tube Q1 is driven to cut off by the NPN triode Q3, so that a constant voltage and constant current output power supply system with closed loop control is implemented.
Constant voltage and constant current output working principle of a power supply:
as shown in fig. 11, the constant voltage constant current output voltage negative feedback transfer function is:
G(s) ={ (Vout-Iout*R1)*K1-[Vout*G4(s)+T*GT(s)+Vusr+(Iout-Ausr)*G2(s)] }*G1(s)
when Iout is<Ausr and T<Tth (overtemperature protection threshold), G2(s) =0, gt(s) =0, where G(s) is controlled by G1(s) and G4(s) only. By regulating G1(s) and G4(s), it is possible to make
I.e. system constant->
And outputting voltage.
G4 (s) in the second voltage loop control circuit 25, not shown in the drawing.
The adjusting process is as follows: after Vout is regulated by G4(s), a Vref signal (vref=vout×g4(s) +vusr) is output, and then a feedback signal (Vout-iout×r1) ×k1 and Vref are input to G1(s) for error comparison and amplification.
Wherein the error signal is (Vout-Iout R1) K1) -Vout G4(s) -Vusr, and the control signal ((Vout-Iout) is output after the error signal is amplified by G1(s)R1) K1-Vout G4(s) -Vusr G1(s), and controlling the PMOS tube Q1 to output constant voltage
。
When Iout > =ausr and T < Tth (over-temperature protection threshold), GT(s) =0. At this time, G(s) is controlled by only G1(s), G2(s) and G4(s). With G1(s), G2(s) and G4(s) regulation, iout=ausr, i.e. the system constant Ausr current output, can be made.
The adjusting process is as follows: and (3) regulating the Iout by G2(s), outputting a signal (Iout-Ausr) by G2(s), and adding the regulated Iout with Vref to obtain Vout (G4(s) +Vusr+ (Iout-Ausr) by G2(s). Then, after the feedback signal (Vout-Iout R1) K1 is amplified by the G1(s) error, the output control signal ((Vout-Iout R1) K1) -Vout G4(s) -Vusr- (Iout-Ausr) G2 (s)) G1(s) control Q1 outputs a signal smaller than 
But the current is constant at Ausr. The output voltage varies with the load equivalent impedance RL, but the output current is a constant value Ausr, and the output voltage vout=ausr.
Fig. 12 shows simulation results of a constant voltage and constant current control system of a power supply, wherein vusr=4.2v is set, and ausr=100 mA is output. When the load resistance is less than 42 ohms, the Iout current will be constantly controlled at Ausr (100 mA) and Vout voltage less than Vusr (4.2V). When the load resistance is greater than 42 ohms, the Vout voltage is constantly controlled at Vusr (4.2V) and Iout current is less than Ausr (100 mA). According to the simulation result, the control system accurately realizes the constant voltage and constant current output function of the power supply.
Example two
One embodiment of the present invention provides an electronic load. As shown in fig. 1 and fig. 4, the electronic load function is implemented as follows: based on the implementation of the constant voltage and constant current power supply, the open loop control circuit is connected with the second current sampling resistor for the NMOS power tube Q2 and then connected to GND, and the GND is connected with the negative electrode of the product to be tested to realize a complete current loop. The closed-loop control circuit is controlled to output a control signal to the voltage following control circuit 26 for the first voltage loop control circuit 24, and the voltage following control circuit 26 outputs a control signal to control the NMOS tube Q2 to be turned on and off, so that a closed-loop constant-voltage discharge system is implemented.
The second current loop control circuit 23 outputs a control signal to control the NMOS power transistor Q2 to be turned on and off by comparing the programmable current Lref, thereby implementing a closed-loop constant current discharge system.
Constant voltage and constant current discharge working principle of electronic load: referring to fig. 13, the electronic load constant voltage constant current discharge negative feedback transfer function is as follows formula (3):
when (when)
And T is<At Tth (overtemperature protection threshold), Q2 is in a conductive discharge state, and the system is mainly operated by the second current loop control circuit 23, so G(s) = (Ild-lus) ×g3(s). At this time, the electronic load discharge system is related to G3(s) only, thereby realizing a constant ild=lus current discharge mode.
When (when)
And T is<At Tth (overtemperature protection threshold), Q2 is in an off state, ild=0, and the electronic load is in an off state. The battery will no longer be discharged and the VBAT voltage will no longer drop, thereby achieving a constant mode of constant battery voltage VBAT at Vusr.
Fig. 14 shows simulation results of a constant voltage and constant current control system of an electronic load as a battery, wherein vusr=3.0v and lus=100 mA are set. When the battery voltage VBAT >3.01V, the electronic load operates in a constant current lus (100 mA) discharge mode. When the battery voltage is discharged to 3.0V, the discharge current ild=0ma, the load stops discharging, and the battery voltage VBAT will stabilize in Vusr (3.0V) state. In practice, there is a discharge interval of VBAT 3.0v to 3.01v, and the discharge current in this interval gradually decreases, and no longer is in a constant current discharge mode. The reason for this is that Q2 is in an amplified state in the process of changing Q2 from an on state to an off state, and thus a section in which the discharge current gradually decreases occurs. In practical applications, the range of this interval is small, only 10mV, so that the influence on the electronic load function and performance is ignored.
Example III
An embodiment of the present invention provides a battery simulator, as shown in fig. 1 and fig. 5, where the battery simulator functions based on implementation of the above-mentioned constant voltage and constant current power supply and electronic load functions, the constant voltage and constant current power supply outputs a constant voltage as an initial voltage of the simulated battery, so as to simulate external discharge of the battery (power supply to the product to be tested), thereby implementing a discharge function of the simulated battery. The electronic load function sets a voltage value of constant voltage discharge, and when the charging circuit charges the analog battery, the electronic load NMOS power tube and the closed loop control circuit 2 are connected to the discharge loop of GND, so that the analog battery can be charged (the external charging circuit charges the analog battery), thereby implementing the charging function of the analog battery.
Battery simulator theory of operation: the battery simulator simulates the discharge of the battery and outputs a voltage corresponding to the power mode. According to the constant voltage output working principle, any battery voltage output can be simulated by only setting Vusr, and the voltage is output
。
When the battery simulator simulates battery charging, the battery simulator is equivalent to an electronic load constant voltage discharging mode, and the sampling resistor R1 simulates the internal resistance of the battery.
When simulating the output voltage of the battery
When the constant current charging interval of the external charging circuit is satisfied, the state of the charged battery (i.e. the constant current control of the external charging current is prioritized) can be simulated by setting the constant current discharging current value Lusr of the electronic load to be larger than the constant current charging current value of the charging circuit, and the charging current value of the battery simulator is equal to the constant current value of the external charger.
When simulating the output voltage of the battery
Greater than [ constant voltage charge voltage value-constant current charge current value R1 ]]And when the voltage is smaller than the constant voltage charging voltage value of the charging circuit, the battery simulator simulates that the battery is in a constant voltage charging state.
As shown in fig. 15, the external charger sets a constant voltage charging of 4.36V and a constant current charging of 100mA according to the simulation result of the battery simulator when the battery is charged, the battery simulator simulates the battery voltage VBAT to simulate the voltage change during the charging process, and Ild represents the simulated battery charged current. This result can be seen in: when the constant current is charged, the voltage of VBAT is gradually increased, the Ild charging current is constant 100mA, and the actual battery charging result is completely met. In the constant voltage charging stage, the Ild charging current is reduced, the voltage rise is slow, and the charging result of the actual battery is completely met. When the analog battery is fully charged, namely VBT is equal to the constant voltage charging voltage value of the external charger, the charging current is equal to 0, and the actual battery charging result is completely met.
Example IV
An embodiment of the present invention provides a multifunctional battery capacity testing system, as shown in fig. 1 and fig. 6, where the multifunctional battery capacity testing system is implemented by: based on implementation of the functions of the constant voltage and constant current power supply and the electronic load, the constant voltage and constant current power supply outputs a constant voltage and a constant current to charge the battery to be tested, and the battery charging capacity is tested through current integration operation acquired by the current sampling 1 circuit in real time. The constant voltage and constant current discharging function of the electronic load can realize constant voltage and constant current discharging on the battery, and the discharge capacity of the battery is tested by integrating and calculating the current collected by the current sampling 1 circuit in real time.
When the battery capacity multifunctional test system charges the external battery, the battery capacity multifunctional test system is equivalent to supplying power to the external battery as a constant voltage and a constant current of a power supply. Only need set up Vusr and Iusr, can charge for external battery constant voltage constant current. And then the Iout is acquired in real time, and the charging capacity of the external battery can be calculated after the MCU integrates the Iout.
The battery capacity multifunctional test system is equivalent to discharging an external battery as an electronic load when discharging the external battery. Only need set up Vusr and Ausr, can external battery constant voltage constant current discharge. And then collecting the Ild in real time, and calculating the discharge capacity of the external battery after the integral operation of the Ild by the MCU.
Example five
Based on implementation of the constant voltage and constant current power supply, an output control signal of the closed loop control circuit is input to the voltage following control circuit, and the voltage following control circuit outputs the control signal to control the NMOS power tube Q2 to timely discharge an output capacitor of the constant voltage and constant current power supply. The process realizes that Vo follows the comparison voltage change in the closed-loop control circuit in real time, so that the system response speed of the constant voltage and constant current power supply becomes very high. A user edits a waveform sequence (for example, 100Hz sine wave) at an upper computer, the waveform sequence is transmitted to an MCU through a UART in the system, the MCU controls a DAC1 to convert the waveform sequence into the Vref waveform sequence, and then a constant voltage and constant current system outputs an Vout waveform, so that a power supply system with an output voltage waveform programming function is implemented.
As shown in figure 16, the output voltage waveform programming is realized based on a programmable constant voltage and constant current power supply, and the function of the output voltage waveform programming is realized by adding a voltage following control circuit on the circuit structure of a common constant voltage and constant current power supply. The working principle of the constant voltage and constant current power supply and the working principle of voltage following control are consistent with the above.
As shown in fig. 16, when the constant voltage and constant current power supply supplies power to an external product, in order to reduce output ripple, a larger capacitor Co is actually connected in parallel, and the larger the power supply needs to provide driving current, the larger the parallel Co will be. However, the load current (the current absorbed by the power supply) of the product will be small or large in the case of different external products or different operation modes of the same product. When the product load current is large, the Co voltage will quickly follow the change when the power supply regulates the output voltage (FIG. 17). However, when the product load current is small, the voltage on Co will change very slowly when the power supply regulates (regulates Vusr) the output voltage, and cannot follow the voltage output requirement in real time (as shown in FIG. 18).
As shown in fig. 19, the voltage follower control circuit is added to simulate waveforms, and it can be seen that when the load is small, the voltage follower control circuit controls the Q2 to discharge Co, and the discharge current waveform is Id. Id is generated, so that the Vout output voltage can timely change along with the voltage (Vusr) change edited by a user, and the output voltage waveform programming function is realized.
According to the specific embodiment, the multifunctional test system provided by the invention has the following beneficial technical effects:
the integrated test system can have multiple functions such as a constant voltage and constant current power supply, an electronic load, a battery simulator, a battery capacity test, a programming voltage waveform output and the like, so that the use amount of cables is reduced, the line loss is reduced, and the error of a measurement result is further reduced.
The integrated multifunctional test system reduces the occupied volume of the test equipment, increases the use scene and improves the portability of the test system.
The multifunctional testing system provided by the invention integrates multiple functions of a power supply, an electronic load, a battery simulator, a battery capacity tester and the like into one multifunctional module, rather than combining the mutually independent functional modules together, so that the complexity and cost of a circuit are greatly reduced; and ensure that the system can stably, reliably and safely run after various functions are fused into a multifunctional module; meanwhile, the stability and the safety of various complex scenes (dynamic load, overvoltage and overcurrent protection, temperature drift, programmable control of an upper computer and the like) in the actual use process are also met.
The foregoing is merely illustrative of the present invention, and the present invention is not limited thereto, and any person skilled in the art will readily recognize that variations or substitutions are within the scope of the present invention. Therefore, the protection scope of the invention is subject to the protection scope of the claims.
Claims (10)
1. A multi-function test system, the multi-function test system comprising: the system comprises a system power supply, an open-loop control circuit and a closed-loop control circuit;
the open loop control circuit includes: a voltage control element and a first current sampling circuit;
the closed loop control circuit includes: the device comprises a current control element, a processor, a triode, a second current sampling circuit, a first current loop control circuit, a second current loop control circuit, a first voltage loop control circuit, a second voltage loop control circuit and a voltage following control circuit, wherein the current control element, the processor, the triode, the second current sampling circuit, the first current loop control circuit, the second current loop control circuit, the first voltage loop control circuit, the second voltage loop control circuit and the voltage following control circuit are used for controlling the voltage control element and the current control element according to the voltage and the current of the open loop control circuit, so that the open loop control circuit outputs test voltage and test current for testing;
the system power supply is connected with a first end of the voltage control element, a second end of the voltage control element is connected with an input end of the first current sampling circuit, an output end of the first current sampling circuit is connected with a first input end of the first current loop control circuit, an output end of the first current loop control circuit is connected with a first input end of the first voltage loop control circuit, an output end of the first voltage loop control circuit is respectively connected with a first end of the triode and an input end of the voltage following control circuit, an output end of the voltage following control circuit is connected with a first end of the current control element, and a second end of the current control element is connected with a second end of the voltage control element;
The input end of the second voltage loop control circuit is connected with the test output end of the first current sampling circuit and the processor respectively, and the output end of the second voltage loop control circuit is connected with the first input end of the first voltage loop control circuit; the second end of the triode is connected with the third end of the voltage control element;
the third end of the current control element is grounded, or the third end of the current control element is connected in series with the second current sampling circuit and then grounded, the output end of the second current sampling circuit is connected with the input end of the second current loop control circuit, and the output end of the second current loop control circuit is connected with the first end of the current control element.
2. The multi-purpose test system of claim 1, wherein the processor is configured to output a first programming current, a second programming current, and a programming voltage; the first current loop control circuit is used for comparing the test current with a first programming current and outputting a current control signal;
the first voltage loop control circuit is used for comparing the test voltage after voltage division with the programming voltage and outputting a voltage control signal;
The second voltage loop control circuit is used for taking the sum of the values of the current control signal and the voltage control signal as the value of a reference signal, comparing the reference signal with a voltage division signal and outputting a voltage element control signal so as to control the triode; the voltage division signal is a voltage division signal of the output end voltage of the voltage control element;
the triode is used for driving the voltage control element to be switched on or switched off according to the voltage element control signal;
the voltage following control circuit is used for outputting a first current element control signal according to the voltage element control signal and a preset constant voltage to control the current control element;
the second current loop control circuit is used for comparing the test current with a second programming current and outputting a second current element control signal for controlling the current control element to be turned on or turned off.
3. The multi-function test system of claim 2, further comprising: a temperature acquisition module;
the temperature acquisition module is used for acquiring the temperatures of the voltage control element and the current control element and sending the temperatures to the processor;
The processor is further configured to output a temperature protection signal according to the temperatures of the voltage control element and the current control element and a preset temperature threshold, sum the temperature protection signal and the divided value of the test voltage, and output the voltage element control signal.
4. A multifunctional test system according to claim 3 wherein said processor is further configured to calculate said divided test voltage by a voltage drift compensation algorithm to obtain a compensation voltage, and to sum the values of said compensation voltage, said temperature protection signal, and said divided test voltage to output said voltage element control signal.
5. A multi-function test system as claimed in claim 3 wherein the third end of the current control element is grounded when the multi-function test system is used in a constant voltage and constant current power supply;
when the temperature protection signal is normal and the test current is smaller than a preset constant current, the test voltage is regulated by the first current loop control circuit and the first voltage loop control circuit, and the voltage control element is controlled to output constant voltage;
When the temperature protection signal is normal and the test current is greater than or equal to a preset constant current, the test voltage is regulated by the first current loop control circuit, the first voltage loop control circuit and the second voltage loop control circuit, and the voltage control element is controlled to output the constant current.
6. A multi-function test system as claimed in claim 3, wherein when the multi-function test system is used for an electronic load, the output end of the open loop control circuit is connected with the positive electrode of the device to be tested, and the negative electrode of the device to be tested is grounded; the third end of the current control element is connected with the second current sampling circuit in series and then grounded, the output end of the second current sampling circuit is connected with the input end of the second current loop control circuit, and the output end of the second current loop control circuit is connected with the first end of the current control element;
when the temperature protection signal is normal and the voltage of the electronic load is larger than the divided voltage of the preset constant voltage, the voltage following control circuit controls the current control element to be conducted, the electronic load is in a discharging state, and the second current loop control circuit outputs constant current;
When the temperature protection signal is normal and the voltage of the electronic load is smaller than or equal to the divided voltage of the preset constant voltage, the voltage following control circuit controls the current control element to cut off, and the electronic load is in an output constant voltage state.
7. The multi-function test system of claim 2, wherein when the multi-function test system is used in a battery simulator, the output of the open loop control circuit is connected to the positive pole of a battery, the negative pole of which is grounded; the third end of the current control element is connected with the second current sampling circuit in series and then grounded, the output end of the second current sampling circuit is connected with the input end of the second current loop control circuit, and the output end of the second current loop control circuit is connected with the first end of the current control element;
when the multifunctional test system is used for charging a battery simulator, the second voltage loop control circuit outputs a voltage element control signal for controlling the voltage control element to cut off and outputting constant current;
when the multifunctional test system is used for discharging the battery simulator, the second current loop control circuit outputs a second current element control signal for controlling the current control element to be cut off and outputting constant current.
8. The multifunctional test system according to claim 2, wherein when the multifunctional test system is used for battery capacity test, a third end of the current control element is connected in series with the second current sampling circuit and then grounded, an output end of the second current sampling circuit is connected with an input end of the second current loop control circuit, and an output end of the second current loop control circuit is connected with a first end of the current control element; and the processor performs integral operation on the current on the open-loop control circuit to obtain the charge capacity or discharge capacity of the external battery.
9. The multi-function test system of claim 2, wherein when the multi-function test system is used for voltage waveform output, the multi-function test system further comprises: one end of the capacitor is connected with the first input end of the current control element, and the other end of the capacitor is grounded; the third end of the current control element is connected with the second current sampling circuit in series and then grounded, the output end of the second current sampling circuit is connected with the input end of the second current loop control circuit, and the output end of the second current loop control circuit is connected with the first end of the current control element;
The processor is further used for converting the received programming waveform sequence into a voltage waveform, and the voltage following control circuit controls the current control element to charge and discharge the capacitor according to the voltage waveform, so that the open-loop control circuit outputs the programming voltage waveform.
10. The multifunctional test system of any one of claims 1-9, wherein the voltage control element and the current control element are MOS transistors;
the first current loop control circuit, the second current loop control circuit, the first voltage loop control circuit and the second voltage loop control circuit are error amplifiers;
the voltage following control circuit is an in-phase proportional amplifying open-drain circuit.
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