CN116428991A - AR (augmented reality) glasses attaching uniformity detection method - Google Patents
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- CN116428991A CN116428991A CN202310183590.5A CN202310183590A CN116428991A CN 116428991 A CN116428991 A CN 116428991A CN 202310183590 A CN202310183590 A CN 202310183590A CN 116428991 A CN116428991 A CN 116428991A
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- 239000011521 glass Substances 0.000 title claims abstract description 96
- 238000001514 detection method Methods 0.000 title claims abstract description 62
- 230000003190 augmentative effect Effects 0.000 title abstract description 5
- 239000013307 optical fiber Substances 0.000 claims abstract description 34
- 238000001914 filtration Methods 0.000 claims abstract description 10
- 230000033001 locomotion Effects 0.000 claims abstract description 9
- 238000001228 spectrum Methods 0.000 claims description 44
- 238000000034 method Methods 0.000 claims description 28
- 238000003475 lamination Methods 0.000 claims description 25
- 238000004364 calculation method Methods 0.000 claims description 7
- 239000000463 material Substances 0.000 claims description 3
- 238000004422 calculation algorithm Methods 0.000 abstract description 3
- 238000010030 laminating Methods 0.000 abstract 1
- 239000010408 film Substances 0.000 description 48
- 239000010410 layer Substances 0.000 description 41
- 238000005259 measurement Methods 0.000 description 19
- 238000010586 diagram Methods 0.000 description 7
- 239000011159 matrix material Substances 0.000 description 6
- 238000004088 simulation Methods 0.000 description 6
- 230000003287 optical effect Effects 0.000 description 5
- 239000010409 thin film Substances 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 3
- 238000006073 displacement reaction Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 239000011888 foil Substances 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 238000002310 reflectometry Methods 0.000 description 3
- 238000005305 interferometry Methods 0.000 description 2
- 230000010287 polarization Effects 0.000 description 2
- 238000001179 sorption measurement Methods 0.000 description 2
- 230000003595 spectral effect Effects 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 238000002834 transmittance Methods 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 238000010009 beating Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000008033 biological extinction Effects 0.000 description 1
- 238000011549 displacement method Methods 0.000 description 1
- 230000001747 exhibiting effect Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000011229 interlayer Substances 0.000 description 1
- 239000005340 laminated glass Substances 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 238000010183 spectrum analysis Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/30—Computing systems specially adapted for manufacturing
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- General Physics & Mathematics (AREA)
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- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
The invention discloses an AR (augmented reality) eyeglass laminating uniformity detection method, which comprises the following steps of: fixing the attached AR glasses lens; turning on a light source, so that the light of the light source is beaten on the attached AR glasses lens through the optical fiber; driving the optical fiber to move along the surface of the attached AR glasses lens; setting a plurality of detection points according to the optical fiber movement track, and respectively acquiring and calculating film thickness data of the attached AR glasses lens; and calculating to obtain the attaching uniformity of the AR glasses. The detection method provided by the invention can be combined with equipment and software to realize accurate detection of the thickness of the air thin layer of the AR glasses lens. In the detection algorithm of the average peak distance, low-pass filtering is firstly utilized to filter signals, so that the influence of spectrometer noise on peak point positioning is avoided.
Description
Technical Field
The invention relates to the field of optics, in particular to a method for detecting lamination uniformity of AR (augmented reality) glasses.
Background
The optical waveguide type AR glasses utilize the principle of total reflection of light in glass lenses for image transmission, and the AR glasses of the principle are closest to the traditional glasses in weight and shape, so that the AR glasses are the most potential consumer-grade AR glasses schemes. As shown in fig. 1, such AR eyeglass designs require two or more pieces of glass to be attached in close proximity, typically adjacent glass distances on the order of tens of microns. The quality of lamination will directly affect the imaging quality of AR glasses, so uniformity detection of lamination distance is an important requirement. Referring to fig. 1, the following two main reasons for the non-uniformity of the glass bonding distance are: 1. the thickness of the adhesive glue is uneven; 2. the flatness of the glass is poor. In the prior art, for the lamination uniformity measurement in the AR glasses, the traditional method mostly uses vernier caliper measurement to see whether the thicknesses of the AR glasses at different points are consistent, the vernier caliper measurement has poor measurement precision and is inconvenient to perform in contact measurement; there are also some prior art attempts at optical interferometry measurements with high accuracy, but with limited measurement range, which cannot be measured for film layers greater than 10 microns thick (air film layer between two sheets of AR glasses).
Disclosure of Invention
In view of the above-mentioned drawbacks of the prior art, the present invention aims to provide an accurate and feasible method and apparatus for detecting lamination uniformity of AR glasses, which can be used for conveniently, accurately and adaptively detecting lamination uniformity of AR glasses with air film layers of different thicknesses.
Based on the technical problems, the invention provides an AR glasses attaching uniformity detection method, which comprises the following steps:
fixing the attached AR glasses lens;
turning on a light source, so that the light of the light source is beaten on the attached AR glasses lens through the optical fiber;
driving the optical fiber to move along the surface of the attached AR glasses lens;
setting a plurality of detection points according to the optical fiber movement track, and respectively acquiring and calculating film thickness data of the attached AR glasses lens;
and calculating to obtain the attaching uniformity of the AR glasses.
Preferably, when the film thickness data is collected, a plurality of random detection points are adopted to collect and calculate the film thickness data of the attached AR glasses lens.
Preferably, the optical fibers are driven to sequentially reciprocate along the surface intervals of the AR glasses, and the attached AR glasses are sequentially subjected to film thickness data acquisition and calculation.
Preferably, film thickness data acquisition is performed on the attached AR glasses lenses by adopting preset step length according to the motion trail of the optical fiber.
Preferably, when the film thickness data is collected and calculated, the film thickness of the detection point is calculated according to the following method: reflecting the light of the light source through the attached AR glasses lens, and obtaining a reflection spectrum through a spectrum analyzer; and calculating the thickness of the air film between the two AR glasses glass sheets attached at the detection point according to the reflection spectrum to obtain the thickness of the film at the detection point.
Preferably, the air film thickness h of the detection point is detected according to the following steps:
obtaining the relation between the air thickness and the average peak distance under the corresponding wave band according to the known refractive index of the lens, and obtaining an air thickness curve;
measuring the reflection spectrum of the actual AR lens by using a spectrometer;
performing low-pass filtering treatment on the actual reflection spectrum;
calculating the average peak distance of the actual reflection spectrum after the filtering in the wave band;
and according to the fitted relation curve of the air thickness and the average peak distance, the actual air film thickness h is obtained.
Preferably, the air thickness profile is obtained as follows:
setting the same material and the same refractive index of the AR glasses with fixed thickness as the first glass sheet and the second glass sheet;
the first glass sheet and the second glass sheet are arranged at intervals, and an air film layer C with the thickness being a set value is arranged in the middle;
measuring reflection spectrums of corresponding wave bands of the first glass sheet, the second glass sheet and the air film layer C;
keeping other conditions unchanged, continuously changing the thickness of the air film layer C, and measuring the reflection spectrum of the corresponding wave band;
and obtaining a curve between the thickness of the air thin layer and the average peak distance according to different values of the thickness of the air thin layer C and the reflection spectrum result.
Preferably, the corresponding wave band is set to 800-900nm.
Preferably, the lamination uniformity of the AR glasses is calculated according to the following method;
after the film thickness of each detection point is obtained, the film thicknesses of the detection points are sequentially sequenced, the maximum film thickness and the minimum film thickness of all the detection points are obtained, and when the difference between the maximum film thickness and the minimum film thickness is smaller than a preset value, the bonding uniformity is judged to be qualified.
The invention also provides a method for detecting the lamination uniformity of the multi-layer AR glasses, wherein when the lamination uniformity of the multi-layer laminated AR glasses is detected, the lamination is continued after the detection is carried out according to the method.
The beneficial effects of the invention are as follows:
(1) The detection method provided by the invention can be combined with equipment and software to realize accurate detection of the thickness of the air thin layer of the AR glasses lens. In the detection algorithm of the average peak distance, low-pass filtering is firstly utilized to filter signals, so that the influence of spectrometer noise on peak point positioning is avoided.
(2) According to the invention, different detection points of the AR lens lamination are detected respectively by controlling the optical fiber movement track, so that the accuracy and the universality of detection are improved effectively, the film thickness of the lens lamination position of different points can be detected and compared, and the whole detection error is smaller and has a certain universality.
(3) The invention can adopt a certain mechanical structure (for example, a stepping motor is adopted to drive the optical fiber to move according to a fixed path), realize the automatic operation detection of driving the optical fiber, and then realize the automatic and accurate detection of the uniformity of the VR glasses by the software programming according to the method of the invention, thereby avoiding the manual detection by a vernier caliper.
(4) According to the invention, the reflection spectrum calculation is adopted, before actual measurement, the reflection of the air thin layers with different thicknesses is measured, the relation between the thicknesses of the air thin layers and the peak of the reflection spectrum is fitted, the calculated ductility is greatly improved, the measurement can be carried out on the wide-range thickness variation of the air thin layers, and the thickness of the air thin layers can be effectively measured. The invention overcomes the limitation of other optical measurement methods on the thickness measurement of the air thin layer in the prior art, such as high measurement precision of the optical interferometry, but limited measurement range, and incapability of measuring the film layer with the thickness larger than 10 micrometers; the spectral confocal displacement method can be used for measuring the thickness of a transparent film layer of 100 micrometers to 2mm, but has the problems of extremely difficult measurement of the film thickness of 10-50 micrometers, and the like.
Drawings
Fig. 1 is a schematic structural view of an embodiment of the present invention.
FIG. 2 is a schematic diagram of a reflection spectrum of a thin film system of n layers.
Fig. 3 shows a reflection spectrum obtained by using the set values of this example when the preliminary fitting is performed.
Fig. 4 is a graph of the average peak distance and thickness of the air foil obtained by varying the thickness of the air foil a.
Fig. 5 is a diagram of reflection spectrum data of a certain detection point during detection, wherein the left diagram is an original reflection spectrum data diagram, and the right diagram is a low-pass filtered data diagram.
Fig. 6 is a diagram of the optical fiber movement path of the present embodiment.
Detailed Description
The present invention will be further described with reference to the drawings and examples, and it should be noted that in the description of the present invention, the terms "upper", "lower", "left", "right", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, only for convenience in describing the present invention and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be configured and operated in a specific manner, and thus should not be construed as limiting the present invention. The terms "first," "second," "third," and the like are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
Example 1:
as shown in fig. 1, the AR lens in this embodiment is schematically shown, wherein A, B is a laminated glass sheet, a first glass sheet is a, a second glass sheet is B, and C is an air film layer between A, B, and the AR lens can be regarded as a multi-layer film system for measuring and processing the reflection spectrum of the AR lens. For a multilayer thin film system, light can reflect and refract numerous times in the system. The reflected light of the same wavelength can generate interference phenomenon, and the light intensity is enhanced or reduced according to the difference of phase differences, and the phase differences are influenced by the thickness, the wavelength and the refractive index of the film. Eventually resulting in the overall reflectivity of the film system exhibiting periodic variations at different wavelengths. In this example, matrix optics was used to quantitatively analyze the multilayer thin film system.
As shown in FIG. 2, for an n-layer thin film system, there are (n-1) interfaces capable of changing the phase of an incident light wave and (n-2) dielectric layers capable of changing the propagation direction of the incident light wave. I.e. corresponding to (n-2) propagation matrices and (n-1) interface matrices. The interface matrix is associated with the reflection coefficient and transmission coefficient of each interface. The interface matrix H can be expressed by the following formula:
wherein H is n-1，n An interface matrix of an n-1 layer and an n-th interlayer interface, t n-1，n And r n-1，n The transmittance and reflectance of the interface between the n-1 layer and the n-th layer, respectively. The transmittance and the reflectance can be obtained by the fresnel formula. Assuming that the medium is uniform lossless medium, the light wave propagates in the lossless medium, and only changes the phase, so the transmission matrix L is
Wherein delta n For the n-th layer of optical wave phase, the total propagation matrix for the n-layer film system is
The total reflectivity and refractive index of the system is, where n n Refractive index of n-th layer, n 1 Refractive index of layer 1, θ n For the n-th layer incident angle, θ 1 For the first layer angle of incidence, real is taken as its Real part. (where refractive index is complex, i.e., n+ik, where n is refractive index, i is imaginary part, and k is extinction coefficient)
The total reflectivity of the film system passing through a certain parameter at a certain wavelength can be calculated according to the formula. And calculating a certain wavelength to obtain the reflection spectrum of the film system.
The above is the basic principle of measuring two attached AR spectacle lenses by using spectral reflection in the present embodiment, specifically, when measuring the uniformity of attaching AR spectacle lenses as shown in fig. 1, the following steps may be adopted:
firstly, fixing an attached AR spectacle lens; secondly, turning on a light source, and enabling light of the light source to strike the attached AR glasses lens through the optical fiber; driving the optical fiber to move along the surface of the attached AR glasses lens; according to the optical fiber motion track, a plurality of detection points are set, and the detection points can be set in various modes, such as random setting on an AR spectacle lens or setting according to a certain track rule, but the number and address distribution of the detection points should be enough as a whole and distributed as uniformly as possible so as to achieve the objective detection purpose, and the detection result can finally reflect the uniformity of bonding. After setting different detection points, respectively beating light on the detection points by using optical fibers, collecting reflected light of the attached AR glasses lenses by using the optical fibers, connecting the collected reflected light with a spectrometer for spectrum analysis, and finally obtaining measured film thickness data for collection and calculation;
and calculating and analyzing the reflected light of different detection points, sorting the thicknesses of the air film layers of the different detection points, finally calculating the difference between the maximum thickness and the minimum thickness, and setting a difference range to obtain the lamination uniformity of the AR glasses.
Example 2
In this embodiment, the positions of the inspection points on the bonded glass sheet are randomly distributed, but it should be noted that the positions of the bonding points should be relatively uniform for the bonded glass sheet itself. Otherwise, objective detection cannot be achieved, and the detection result cannot be finally reflected to uniformity of the bonding.
Example 3
In this embodiment, the optical fibers are driven to reciprocate along the attached glass sheets in a manner shown in fig. 6 at the positions on the attached glass sheets, so as to reciprocate along the surface intervals of the AR spectacle lenses in sequence, and the attached AR spectacle lenses are subjected to film thickness data acquisition and calculation in sequence. Specifically, according to the motion trail of the optical fiber, film thickness data acquisition is carried out on the attached AR glasses lens by adopting a preset step length. In this example, a monolithic glass having an area of 10cm was used 2 To explain the AR spectacle lens 1cm 2 The area measures 10 points, the maximum and minimum values of the thickness of the 10 points differ by less than 1 micron. 100 points were measured for the whole glass, the maximum and minimum of 100 points differing by less than 2 microns. And judging that the test is qualified.
Example 4
In embodiment 1, referring to the spectrum reflection measurement film thickness as the basic measurement principle of the present invention, based on the above principle, this example provides a specific calculation method for measuring the thickness of an air film after VR glasses are attached, and first simulation is performed to obtain the relationship between the thickness of the air film and the peak of the reflection spectrum with the same refractive index, where the simulation process is as follows: the reflection spectrum of the AR lens in the wavelength band of 800-900nm (or other wavebands) is measured (note that the material and refractive index of the AR lens are consistent with those of the AR lens to be tested and attached), the wavelength band can be selected according to the range of measuring the thickness of an air layer, in a film layer system with fixed parameters (refractive index and thickness of each layer, light incidence angle and light polarization property), as the wavelength increases, the resonance peak of the reflection spectrum becomes thinner (i.e. the average peak distance increases), and the resolution of the spectrometer in practical measurement (the resolution of the spectrometer in the wavelength range of 200-1000nm is about 1 nm) is considered, so that the spectrometer can more easily distinguish the wavebands close to 1000 nm. In consideration of error reasons, a larger wavelength range is generally selected for spectrum measurement and then the thickness is reversely calculated to obtain a more accurate measurement result, so that the embodiment adopts an AR lens reflection spectrum for measuring 800-900nm (or other wave bands), and in other embodiments, reflection spectrums of different wave bands can be adopted according to conditions.
In this embodiment, the following technique is adopted to select and complete the scheme simulation:
the glass thickness was 400 microns, the air film thickness was set to 60 microns, and the light incident angle was 0 degrees (0 degrees may not take into consideration the effect of light polarization properties). The reflection spectrum shown in fig. 3 was obtained. Filtering the reflection spectrum, taking out the outline of each wave crest, and testing for a plurality of times to obtain a conclusion that under a fixed wave band, the main factor influencing the periodicity rule of the reflection spectrum is only the thickness of an air thin layer.
The thickness of the air film was varied under other conditions, as measured in fig. 4. In fig. 4, the dot curve corresponds to the average peak distance, and the "+" curve corresponds to the peak number. It is evident that the average peak distance and the thickness of the air film exhibit a clear power function. The power function relationship and curve are thus fitted to the average peak distance and thickness relationship of the air foil.
In practice, the procedure for measuring AR spectacle air thin layers is as follows.
According to the known refractive index of the lens, using a simulation program such as matlab, the relationship between the air thickness and the average peak distance in the appropriate wavelength band (800-900 nm is used in this embodiment) is obtained according to the simulation procedure described above (the thickness of hundreds of microns or millimeter-sized ultra-thick glass in such a film system has little effect on the reflection spectrum, and the thickness of the air layer is a main influencing factor).
Firstly, measuring the reflection spectrum of an actual AR lens by utilizing a spectrometer;
secondly, due to resolution and noise of the spectrometer, low-pass filtering processing needs to be performed on the reflection spectrum, as shown in fig. 5, where the filtering processing needs to use a general existing filtering algorithm, and no description is repeated.
Fitting the simulated relation curve, and calculating the average peak distance of the measured reflection spectrum under a simulated wave band (such as 800-900 nm). See the method in example 1, and the simulation procedure described previously.
And obtaining the thickness of the air thin layer C according to the relation curve of the simulated air thickness and the average peak distance and the actually measured and filtered reflection spectrum peak distance.
As shown in fig. 5, the left graph is the original reflection spectrum data, the right graph is the low-pass filtered data, in this embodiment, the VR spectacle lens fitting condition similar to that in simulation is adopted for detection, and the thickness of the air thin layer at the detection point calculated according to the filtered data is 22 micrometers.
Example 5
In this embodiment, for the whole AR lens, the path shown in fig. 6 is used to scan the reflection spectrum, and at the same time, a certain step is used to collect the detection points according to the manner mentioned in the foregoing embodiment, so that the thickness uniformity of the air film of the whole AR lens can be measured (the step can be set according to the actual situation, for example, the step can be set by using 1cm as the step, and one detection point is set for each time the optical fiber moves along the path for 1 cm).
When the specific path planning automatic detection is adopted, a uniformity detection hardware system can be set in the following way. The fixing device comprises a vacuum pump, and is fixed by adding adsorption components such as a related vacuum suction head and the like, so as to realize better adsorption and fixation; the optical fiber is arranged above the fixing device, the optical fiber is fixed on a horizontal support, the horizontal support is provided with displacement devices in two directions perpendicular to each other along a horizontal plane, the displacement devices drive the optical fiber to move in horizontal plane coordinates, the horizontal support is simultaneously connected with a vertical displacement device, the horizontal support can be driven to integrally move up and down, one end of the optical fiber is aligned with an attached AR (augmented reality) spectacle lens, the other end of the optical fiber is scattered to form a first optical fiber interface and a second optical fiber interface, the first optical fiber interface is connected with a light source 6, and the second optical fiber interface is connected with a spectrum analyzer. The above is only one embodiment of the present AR eyeglass lens uniformity detection hardware system, and other embodiments may be modified. So as to achieve better uniformity detection effect.
Example 6
In this embodiment, when the uniformity of the laminated AR spectacle lenses is detected, each lamination is performed once, the lamination is continued after the detection according to the method of any one of claims 1 to 9. For example, after two pieces of glass are bonded and measured, we know all parameters of the whole film system, and when the next bonding is used for measuring the thickness, only the air thickness of the next bonding is used for fitting, and the measurement can still be performed by the method.
The foregoing describes in detail preferred embodiments of the present invention. It should be understood that numerous modifications and variations can be made in accordance with the concepts of the invention by one of ordinary skill in the art without undue burden. Therefore, all technical solutions which can be obtained by logic analysis, reasoning or limited experiments based on the prior art by the person skilled in the art according to the inventive concept shall be within the scope of protection defined by the claims.
Claims (10)
1. A detection method for the lamination uniformity of AR glasses is characterized by comprising the following steps:
the method comprises the following steps:
fixing the attached AR glasses lens;
turning on a light source, so that the light of the light source is beaten on the attached AR glasses lens through the optical fiber;
driving the optical fiber to move along the surface of the attached AR glasses lens;
setting a plurality of detection points according to the optical fiber movement track, and respectively acquiring and calculating film thickness data of the attached AR glasses lens;
and calculating to obtain the attaching uniformity of the AR glasses.
2. The method for detecting the lamination uniformity of the AR glasses according to claim 1, wherein: when the film thickness data are collected, a plurality of random detection points are adopted to collect and calculate the film thickness data of the attached AR glasses lenses respectively.
3. The method for detecting the lamination uniformity of the AR glasses according to claim 1, wherein: the optical fibers are driven to sequentially reciprocate along the surface interval of the AR glasses lens, and the attached AR glasses lens is sequentially subjected to film thickness data acquisition and calculation.
4. The AR eyeglass lamination uniformity detection method according to claim 3, wherein: and respectively acquiring film thickness data of the attached AR glasses lenses by adopting a preset step length according to the movement track of the optical fiber.
5. The method for detecting the lamination uniformity of the AR glasses according to claim 1, wherein: when film thickness data acquisition and calculation are carried out, the film thickness of the detection point is calculated according to the following method:
reflecting the light of the light source through the attached AR glasses lens, and obtaining a reflection spectrum through a spectrum analyzer; and calculating the thickness of the air film between the two AR glasses glass sheets attached at the detection point according to the reflection spectrum to obtain the thickness of the film at the detection point.
6. The method for detecting the lamination uniformity of the AR glasses according to claim 5, wherein:
the thickness h of the air film at the detection point is detected according to the following steps:
obtaining the relation between the air thickness and the average peak distance under the corresponding wave band according to the known refractive index of the lens, and obtaining an air thickness curve;
measuring the reflection spectrum of the actual AR lens by using a spectrometer;
performing low-pass filtering treatment on the actual reflection spectrum;
calculating the average peak distance of the actual reflection spectrum after the filtering in the wave band;
and according to the fitted relation curve of the air thickness and the average peak distance, the actual air film thickness h is obtained.
7. The method for detecting the lamination uniformity of the AR glasses according to claim 6, wherein:
the air thickness profile was obtained as follows:
setting the same material and the same refractive index of the AR glasses with fixed thickness as the first glass sheet and the second glass sheet;
the first glass sheet and the second glass sheet are arranged at intervals, and an air film layer C with the thickness being a set value is arranged in the middle;
measuring reflection spectrums of corresponding wave bands of the first glass sheet, the second glass sheet and the air film layer C;
keeping other conditions unchanged, continuously changing the thickness of the air film layer C, and measuring the reflection spectrum of the corresponding wave band;
and obtaining a curve between the thickness of the air thin layer and the average peak distance according to different values of the thickness of the air thin layer C and the reflection spectrum result.
8. The method for detecting the lamination uniformity of the AR glasses according to claim 7, wherein:
the corresponding band is set to 800-900nm.
9. The method for detecting the lamination uniformity of the AR glasses according to claim 1, wherein:
calculating the attaching uniformity of the AR glasses according to the following method;
after the film thickness of each detection point is obtained, the film thicknesses of the detection points are sequentially sequenced, the maximum film thickness and the minimum film thickness of all the detection points are obtained, and when the difference between the maximum film thickness and the minimum film thickness is smaller than a preset value, the bonding uniformity is judged to be qualified.
10. A method for detecting lamination uniformity of multi-layer AR glasses is characterized by comprising the following steps: in the detection of the uniformity of AR spectacle lenses bonded in multiple layers, each bonding is performed by first detecting according to the method of any one of claims 1 to 9, and then bonding is continued.
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| CN202310183590.5A CN116428991A (en) | 2023-03-01 | 2023-03-01 | AR (augmented reality) glasses attaching uniformity detection method |
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| CN202310183590.5A CN116428991A (en) | 2023-03-01 | 2023-03-01 | AR (augmented reality) glasses attaching uniformity detection method |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117109453A (en) * | 2023-08-21 | 2023-11-24 | 深圳市核心装备科技有限公司 | VR lens automated inspection machine |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117109453A (en) * | 2023-08-21 | 2023-11-24 | 深圳市核心装备科技有限公司 | VR lens automated inspection machine |
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