CN116381440A - Multifunctional portable silicon carbide device characteristic tester - Google Patents
Multifunctional portable silicon carbide device characteristic tester Download PDFInfo
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- CN116381440A CN116381440A CN202310231470.8A CN202310231470A CN116381440A CN 116381440 A CN116381440 A CN 116381440A CN 202310231470 A CN202310231470 A CN 202310231470A CN 116381440 A CN116381440 A CN 116381440A
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- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 title claims abstract description 67
- 229910010271 silicon carbide Inorganic materials 0.000 title claims abstract description 67
- 238000012360 testing method Methods 0.000 claims abstract description 77
- 239000003990 capacitor Substances 0.000 claims abstract description 64
- 238000002474 experimental method Methods 0.000 claims abstract description 24
- 238000000034 method Methods 0.000 claims description 15
- 239000000523 sample Substances 0.000 claims description 12
- 238000011161 development Methods 0.000 claims description 6
- 239000008186 active pharmaceutical agent Substances 0.000 claims description 3
- 238000002955 isolation Methods 0.000 claims description 3
- 230000009977 dual effect Effects 0.000 claims description 2
- 238000001914 filtration Methods 0.000 claims description 2
- 238000012512 characterization method Methods 0.000 claims 1
- 238000011160 research Methods 0.000 abstract description 10
- 238000013461 design Methods 0.000 abstract description 6
- 238000011084 recovery Methods 0.000 abstract description 5
- 238000012795 verification Methods 0.000 abstract description 4
- 238000011156 evaluation Methods 0.000 abstract description 3
- 238000007599 discharging Methods 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 7
- 230000005611 electricity Effects 0.000 description 3
- 230000006978 adaptation Effects 0.000 description 2
- 238000004364 calculation method Methods 0.000 description 2
- 238000004146 energy storage Methods 0.000 description 2
- 238000000556 factor analysis Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
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- 230000000694 effects Effects 0.000 description 1
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- G—PHYSICS
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
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Abstract
The invention discloses a multifunctional portable silicon carbide device characteristic tester, which comprises a high-voltage direct current power supply and a double-pulse testing unit, wherein the high-voltage direct current source is electrically connected with the double-pulse testing unit, the high-voltage direct current source comprises an AC/DC charging module, an electrolytic capacitor and a discharging resistor which are connected in parallel, two ends of the AC/DC charging module are respectively connected into the direct current power supply and the alternating current power supply through a direct current power supply interface and an alternating current power supply interface, and a charging current limiting resistor is further arranged between the AC/DC charging module and the electrolytic capacitor; the multifunctional portable silicon carbide device characteristic tester can be used for carrying out performance verification tests on the conduction characteristic, the on/off characteristic, the reverse recovery characteristic, the short circuit characteristic, the loss/temperature rise and the like of a silicon carbide device, and experiments on design and evaluation of a driving circuit, analysis and research on influence factors of the device characteristic, full-working condition comparison selection of similar voltage/current quota, open-loop test of a Buck or Boost power circuit and the like.
Description
Technical Field
The invention relates to the technical field of power electronics and electricians, in particular to a multifunctional portable silicon carbide device characteristic tester.
Background
The characteristic test experiment capability of the power device is one of basic capabilities which a researcher who works on power electronics must have, but the traditional test instrument has huge volume, is difficult to carry and troublesome, leads to limited experiment places, has not enough price, and is difficult to popularize. And the design limitation of the traditional test instrument makes the traditional test instrument incapable of carrying out secondary development, has the problems of incompatibility of control platforms and the like, and leads to the fact that the contact experiment of power electronic staff or the smooth carrying out of the research work can not be carried out.
Disclosure of Invention
Aiming at the problems in the background technology, the invention discloses a multifunctional portable silicon carbide device characteristic tester which not only meets the basic power device test, but also can be subjected to secondary development to perform various performance verification tests of the silicon carbide device and research experiments of a driving circuit.
The multifunctional portable silicon carbide device characteristic tester is reasonably arranged in the light box body, and is convenient for relevant staff to carry.
The technical scheme is as follows: in order to achieve the above purpose, the invention adopts the following technical scheme:
the multifunctional portable silicon carbide device characteristic tester comprises a high-voltage direct current power supply for providing stable high-voltage electricity and a double-pulse test unit for testing the characteristics of the silicon carbide device, wherein the high-voltage direct current source is electrically connected with the double-pulse test unit,
the high-voltage direct current source comprises an AC/DC charging module, an electrolytic capacitor and a discharge resistor which are connected in parallel, wherein two ends of the AC/DC charging module are respectively connected with a direct current power supply and an alternating current power supply through a direct current power supply interface and an alternating current power supply interface, and a charging current limiting resistor is arranged between the AC/DC charging module and the electrolytic capacitor;
the double-pulse test unit comprises a drive plate and a power tube, wherein the drive plate outputs a drive signal to the silicon carbide device so as to control the on and off of the silicon carbide device.
Preferably, the peak voltage after overcharge of the electrolytic capacitor is:
wherein C is DC-link For the bus capacitor, deltaU is the overcharged voltage, and the selection of the electrolytic capacitor ensures that the test system is at the maximum test voltage value U max And maximum test current value I max When the peak voltage of capacitor charging is not higher than rated withstand voltage U of power device DS I.e. +.>
Preferably, the charging equation of the electrolytic capacitor is as follows:
wherein u is c For voltage across the capacitor, U DC For dc power supply, the time constant is τ=r charge ·C DC_Link According to this, the charging current-limiting resistor R is selected charge Resistance value of (2); the discharge equation of the electrolytic capacitor is as follows: />
) According to the selection of the discharge resistance R discharge Is a resistance value of (a).
Preferably, the input end of the double pulse test unit is also provided with a filter capacitor for filtering high-frequency components of the high-voltage direct current source.
Preferably, an isolation transformer is arranged between the AC/DC charging module and the AC power interface.
Preferably, the electrolytic capacitor is connected in parallel with a balance resistor at both ends.
Preferably, the tester further comprises an upper computer, and the upper computer observes and records waveforms of the silicon carbide device. The upper computer comprises a display, a voltage probe and a current probe, and the upper computer observes waveform data of the silicon carbide device in real time through the probe of the virtual oscilloscope, displays the waveform data on a screen and stores the waveform data.
The invention also discloses a working method of the multifunctional portable silicon carbide device tester,
s1, selecting a driving plate and a silicon carbide device which need to be evaluated for performance;
s2, judging whether a Buck/Boost experiment is needed, if so, performing secondary development according to an interface reserved by a test platform to deform a circuit of the double-pulse test unit into Buck or Boost, and then entering S3, otherwise, directly entering S3;
s3, starting an experiment: opening a charging switch of a high-voltage direct current source to charge the electrolytic capacitor, providing power for the double-pulse test unit, judging whether direct current input exists, closing a direct current power interface if the direct current input exists, otherwise closing an alternating current power interface,
starting a control chip after charging is completed, controlling the on and off of the silicon carbide device and recording related waveform data;
and S4, closing a discharge switch after the experiment is ended.
Preferably, the experiment is started: opening a charging switch of the high-voltage direct-current source, and charging the electrolytic capacitor by an external power supply through a current-limiting resistor, wherein the current-limiting resistor limits the charging current within a safe range until the charging is completed; pulse signals are respectively sent out to the upper tube driving plate and the lower tube driving plate, and the driving plates change the pulse signals into switching signals of the silicon carbide devices so as to control the on and off of the silicon carbide devices.
Preferably, after the experiment is finished, a discharge switch in the high-voltage direct current source is closed, the high-capacity electrolytic capacitor discharges the stored energy through a discharge resistor, and the discharge current is limited within a safe range by the discharge resistor in the discharge process until the discharge is finished.
Preferably, when the external power source is direct current, the direct current charging interface is connected after the direct current voltage is regulated to a preset voltage value U. When the external power supply is alternating current, the AC/DC module is connected with the alternating current charging interface, and the AC/DC module can adjust the voltage to a preset voltage value U. The ac charging interface and the dc charging interface cannot be connected at the same time. The charging switch is closed, and an external alternating current/direct current power supply charges the large electrolytic capacitor through the current limiting resistor. The charging current limiting resistor can limit the charging current within a safety range, and the balance resistor can ensure that the voltage of the two large-capacity electrolytic capacitors is consistent. After the large electrolytic capacitor is charged, the charging switch is turned off.
Preferably, the pulse switch of the control chip is turned on, and the control chip sends pulse signals to the upper tube driving plate and the lower tube driving plate respectively. The upper tube driving plate and the lower tube driving plate convert the pulse signals into switching signals of the silicon carbide device and control the on-off of the silicon carbide device.
Preferably, the upper computer completes the characteristic test of the silicon carbide device through the voltage probe and the current probe, and relevant waveforms are recorded and stored through the display, including on-state characteristics, on/off characteristics, reverse recovery characteristics, short-circuit characteristics and loss/temperature rise characteristics.
Preferably, after the silicon carbide device characteristic test is completed, a discharge switch of the high-voltage direct-current power supply is turned on, and the voltage stored in the large electrolytic capacitor is discharged through a discharge resistor. The discharge resistor may limit the discharge current within a safe range.
Preferably, if the performance of different driving boards needs to be evaluated, the driving boards with different models can be replaced for testing.
Preferably, if a research experiment such as a Buck or Boost power circuit open loop test needs to be carried out, secondary development can be carried out according to an interface reserved by a test platform, and the circuit of the double-pulse test unit is deformed into a Buck or Boost circuit for testing.
Preferably, the whole tester is arranged in the light suitcase body, and is convenient to carry.
Advantageous effects
(1) The invention can carry out performance verification tests of the silicon carbide device such as conduction characteristics, on/off characteristics, reverse recovery characteristics, short circuit characteristics, loss/temperature rise and the like, and research experiments such as drive circuit design and evaluation, device characteristic influence factor analysis research, full-working condition comparison selection of similar voltage/current quota, buck or Boost power circuit open-loop test and the like through the multifunctional portable silicon carbide device characteristic tester;
(2) The invention adopts modularized design and plug interface connection, is integrally arranged in the light box body, and is easy to be used in a portable way; the tester is compact in layout, the design of each unit module can fully utilize the space of the box body, and no surplus space allowance is reserved;
(3) The driving plate, the power device and the signal generating unit can be replaced by different types; the tester is disconnected from the power grid in the use process, the power is taken from the energy storage capacitor, and the capacitor is timely discharged after the experiment is completed, so that the possibility of safety accidents is reduced to the greatest extent, and the experiment safety is ensured;
(4) The high-voltage direct current source part disclosed by the invention is compatible with two input modes of alternating current and direct current; whether the external power supply is direct current or alternating current, the double-pulse test unit is not directly charged, and the large electrolytic capacitor is charged first and then provides electricity for double pulses, so that the safety and controllability of the experimental process are ensured.
Drawings
FIG. 1 is a circuit diagram of a multifunctional portable silicon carbide device characteristic tester provided by the invention;
FIG. 2 is a flow chart of a multi-functional portable silicon carbide device characteristic tester provided by the invention;
FIG. 3 is a flow chart of the power flow when DC is used as the external power source in the embodiment of the invention;
FIG. 4 is a flow chart of the power flow when the AC power is used as the external power source in the embodiment of the invention;
FIG. 5 is a circuit diagram of an AC/DC module in an embodiment of the invention;
FIG. 6 is a Buck variation circuit diagram of a double pulse test cell in an embodiment of the present invention;
FIG. 7 is a Boost variant circuit diagram of a dual pulse test cell in an embodiment of the present invention.
Detailed Description
The invention will be further described with reference to the accompanying drawings. It will be apparent that the described embodiments are some, but not all, embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
The circuit diagram of the multifunctional portable silicon carbide device characteristic tester provided by the invention is shown in figure 1, and comprises an upper computer, a high-voltage direct-current source and a double-pulse testing unit. The upper computer comprises a voltage probe, a current probe and a display, the high-voltage direct current source comprises an alternating current/direct current power interface, an alternating current/direct current power module, a charge/discharge switch and resistor, a high-capacity electrolytic capacitor and a balance resistor, and the double-pulse test unit comprises a filter capacitor, a load inductor, a power tube, a control chip and a drive plate.
The high-voltage direct current source is electrically connected with the double-pulse testing unit and provides stable high-voltage power required by the test for the double-pulse tester; the double-pulse testing unit tests the relevant characteristics of the tested silicon carbide device; and the upper computer observes and records the waveform of the silicon carbide device.
The high-voltage direct current source part comprises an AC/DC charging module, an electrolytic capacitor and a discharging resistor which are connected in parallel, wherein two ends of the AC/DC charging module are respectively connected with a direct current power supply and an alternating current power supply through a direct current power supply interface and an alternating current power supply interface; a charging current-limiting resistor is also arranged between the AC/DC charging module and the electrolytic capacitor; a discharge switch is also arranged on the discharge resistor branch; the electrolytic capacitors are large-capacity electrolytic capacitors, in this embodiment, two large-capacity electrolytic capacitors are connected in series, and two ends of each electrolytic capacitor are connected in parallel with a balance resistor.
The high-voltage direct current source part is compatible with two input modes of alternating current and direct current, and the working principle is as follows:
when the external power supply is direct current, the direct current voltage is regulated to a preset voltage value U, and then the direct current charging interface is connected. When the external power supply is alternating current, the AC/DC module is connected with the alternating current charging interface, and the AC/DC module can adjust the voltage to a preset voltage value U. The ac charging interface and the dc charging interface cannot be connected at the same time. The charging switch is closed, and an external alternating current/direct current power supply charges the large electrolytic capacitor through the current limiting resistor. The charging current limiting resistor can limit the charging current within a safety range, and the balance resistor can ensure that the voltage of the two large-capacity electrolytic capacitors is consistent. After the large electrolytic capacitor is charged, the charging switch is turned off. Whether the external power supply is direct current or alternating current, the double-pulse test unit is not directly charged, and the large electrolytic capacitor is charged first and then provides electricity for double pulses, so that the safety and controllability of the experimental process are ensured.
The double-pulse test unit part comprises a drive plate, a power tube and a control chip, wherein the control chip sends pulse signals to the drive plate, and the drive plate converts the pulse signals into output drive signals to the silicon carbide device so as to control the on and off of the silicon carbide device. The drive boards are replaceable, and if the performance of different drive boards needs to be evaluated, the drive boards with different models can be replaced for testing.
The silicon carbide device can be connected to the double-pulse test unit through a plug-in interface; the whole tester is arranged in the light suitcase body and is convenient to carry.
The invention also discloses a working method based on the multifunctional portable silicon carbide device characteristic tester, and different testing requirements are realized based on the replacement of a tester driving plate, the adjustment of Buck and Boost circuits, the adjustment of opening and closing of the silicon carbide device and the replacement of a silicon carbide testing device through a plug interface. Specifically, performance verification tests such as on-state characteristics, on/off characteristics, reverse recovery characteristics, short-circuit characteristics, loss/temperature rise and the like of the silicon carbide device can be performed, and research experiments such as driving circuit design and evaluation, device characteristic influence factor analysis and research, full-working condition comparison selection of similar voltage/current quota, buck or Boost power circuit open-loop test and the like can be performed.
As shown in fig. 2, the present invention is described in further detail below in connection with the examples:
when the external power supply is direct current, the alternating current power supply interface is disconnected, the direct current power supply interface is closed, the charging switch is closed, and the current diagram is shown in fig. 3. The direct current power supply charges the high-capacity electrolytic capacitor to a preset voltage value U through a charging current-limiting resistor, and the charging current-limiting resistor can limit the charging current to a safe value I charge And the balance resistor can ensure that the voltages of the two large-capacity electrolytic capacitors are U/2 respectively.
When the external power supply is alternating current, the direct current power supply interface is disconnected, the alternating current power supply interface is closed, the charging switch is closed, and the current flow chart is shown in fig. 4. The alternating current power supply is converted into direct current voltage V through an isolation transformer and an AC/DC module DC The AC/DC block circuit diagram is shown in FIG. 5, where D 1 、D 2 、D 3 、D 4 Is a rectifier diode, L is an energy storage inductor, D 5 Is a flywheel diode S 1 Is a switch tube C O The inductor is filtered for output. The AC/DC module charges the high-capacity electrolytic capacitor to a voltage of U, and the charging current-limiting resistor can limit the charging current at a safe value I charge And the balance resistor can ensure that the voltages of the two large-capacity electrolytic capacitors are U/2 respectively.
After the charging is finished, the charging switch is disconnected, the pulse switch of the control chip is turned on, and the control chip respectively sends pulse signals to the upper tube driving plate and the lower tube driving plate. The upper tube driving plate and the lower tube driving plate convert the pulse signals into switching signals of the silicon carbide device and control the on-off of the silicon carbide device.
The selection of each parameter and the circuit model in the invention are as follows:
(1) High capacity electrolytic capacitor selection
Because the voltage and current testing range of the testing system is wider, the bus capacitor C is used in the process of storing energy for the load inductance L DC-link The voltage variation amount needs to be considered; to compensate for this lost voltage, a margin needs to be reserved in advance, the charging voltage is raised in advance, and the overcharged voltage is denoted as Δu.
There is a partial energy loss on the capacitor, and this partial energy is actually passively transferred into the inductor, so that the inductor current increases, as shown in the formula:
the peak voltage after capacitor overcharging can be obtained as:
in order to ensure the safety of the power device, the test system needs to be ensured to be at a maximum test voltage value U max And maximum test current value I max When the peak voltage of capacitor charge is not higher than rated withstand voltage U of power device DS The method comprises the following steps:
(2) Charging current-limiting resistor R charge Selecting
In order to prevent the bridge arm circuit from being short-circuited or the electrolytic capacitor from being reversed in polarity before the circuit breaker is turned on, so that the platform is instantaneously destroyed, a charging current-limiting resistor needs to be added in front of the capacitor, a capacitor charging equation is shown in a formula (4), and the time constant is tau=R charge ·C DC_Link And selecting the charging current limiting resistance value according to the calculation.
(3) Discharge resistor R discharge Selection of
After the experiment is completed, the electric quantity in the capacitor is required to be discharged cleanly, so that the double-pulse test unit can be ensured to be in a safe state before the next experiment, and if the electric quantity in the capacitor is residual, the electric quantity is easy to cause damage to a platform and a human body. An appropriate discharge resistance value is selected based on the calculation formula (5).
The upper computer completes the characteristic test of the silicon carbide device through the voltage probe and the current probe, and observes the relevant waveforms of the silicon carbide device in four states of an on process, an off process and an off process to test the on characteristic, the off characteristic and the reverse recovery characteristic respectively; performing short-circuit characteristic test by simulating the incorrect opening of the silicon carbide device and observing the related waveform under the state; the temperature rise after turning on and off of the silicon carbide device was recorded to test the loss/temperature rise characteristics, and the relevant waveforms were recorded and saved by a display.
After the silicon carbide device characteristic test is finished, a discharge switch of the high-voltage direct-current power supply is turned on, and the voltage stored by the large electrolytic capacitor is discharged through a discharge resistor. The discharge resistor can limit the discharge current to a safe value I discharge Inside.
When a research experiment such as a Buck or Boost power circuit open-loop test needs to be conducted, secondary development can be conducted according to an interface reserved by a test platform, a circuit of the double-pulse test unit is deformed into a Buck circuit or a Boost circuit for further testing, and the Buck deformation circuit is shown in a figure 6, namely, two ends of a silicon carbide device are connected in parallel to a branch circuit formed by connecting an inductor and a load in series; the Boost variant is shown in fig. 7, where two silicon carbide devices are connected in series through a load and an inductor is added to the total branch.
When the research experiments such as the performance comparison test of the driving boards with different types are required to be carried out, the driving boards with different types can be replaced according to the interfaces reserved on the test platform, and then the test is carried out.
The foregoing is only a preferred embodiment of the invention, it being noted that: it will be apparent to those skilled in the art that various modifications and adaptations can be made without departing from the principles of the present invention, and such modifications and adaptations are intended to be comprehended within the scope of the invention.
Claims (10)
1. The multifunctional portable silicon carbide device characteristic tester is characterized by comprising a high-voltage direct current power supply for providing stable high voltage and a double-pulse test unit for testing the characteristics of the silicon carbide device, wherein the high-voltage direct current source is electrically connected with the double-pulse test unit,
the high-voltage direct current source comprises an AC/DC charging module, an electrolytic capacitor and a discharge resistor which are connected in parallel, wherein two ends of the AC/DC charging module are respectively connected with a direct current power supply and an alternating current power supply through a direct current power supply interface and an alternating current power supply interface, and a charging current limiting resistor is arranged between the AC/DC charging module and the electrolytic capacitor;
the double-pulse test unit comprises a drive plate and a silicon carbide device power tube, wherein the drive plate outputs a drive signal to the silicon carbide device so as to control the on and off of the silicon carbide device.
2. The multifunctional portable silicon carbide device property tester according to claim 1, wherein the electrolytic capacitor has a peak voltage after overcharging of:
wherein C is DC-link For the bus capacitor, deltaU is the overcharged voltage, and the selection of the electrolytic capacitor ensures that the test system is at the maximum test voltage value U max And maximum test current value I max When the peak voltage of capacitor charging is not higher than rated withstand voltage U of power device DS I.e. +.>
3. The multifunctional portable silicon carbide device property tester according to claim 2, wherein the charging equation of the electrolytic capacitor is as follows:
wherein u is c For voltage across the capacitor, U DC For dc power supply, the time constant is τ=r charge ·C DC_Link According to this, the charging current-limiting resistor R is selected charge Resistance value of (2); the discharge equation of the electrolytic capacitor is as follows: />
According to the selection of the discharge resistance R discharge Is a resistance value of (a).
4. The multifunctional portable silicon carbide device characteristic tester according to claim 3, wherein the electrolytic capacitor is connected with balance resistors in parallel at two ends.
5. The multifunctional portable silicon carbide device characteristic tester according to claim 4, wherein an isolation transformer is arranged between the AC/DC charging module and the AC power interface.
6. The multifunctional portable silicon carbide characteristic tester according to claim 1, wherein the input end of the double pulse test unit is further provided with a filter capacitor for filtering high frequency components of the high voltage direct current source.
7. The multifunctional portable silicon carbide device characterization tester according to claim 1, wherein the silicon carbide device is connectable to the dual pulse test unit through a pluggable interface.
8. The multifunctional portable silicon carbide device characteristic tester according to any one of claims 1 to 7, further comprising an upper computer, wherein the upper computer comprises a display, a voltage probe and a current probe, and the upper computer observes waveform data of the silicon carbide device in real time through a probe of a virtual oscilloscope, displays the waveform data on a screen and stores the waveform data.
9. A working method of a multifunctional portable silicon carbide device tester, which is characterized in that the tester as claimed in claim 8 is used, and the working method is as follows:
s1, selecting a driving plate and a silicon carbide device which need to be evaluated for performance;
s2, judging whether a Buck/Boost experiment is needed, if so, performing secondary development according to an interface reserved by a test platform to deform a circuit of the double-pulse test unit into Buck or Boost, and then entering S3, otherwise, directly entering S3;
s3, starting an experiment: opening a charging switch of a high-voltage direct current source, charging an electrolytic capacitor, providing power for a double-pulse test unit, judging whether direct current input exists, closing a direct current power interface if the direct current input exists, otherwise closing the alternating current power interface, opening a control chip after the charging is finished, controlling the on and off of a silicon carbide device, and recording related waveform data;
and S4, closing a discharge switch after the experiment is ended.
10. The method of claim 7, wherein the charging switch of the high-voltage direct current source is turned on at the beginning of the experiment, the external power supply charges the electrolytic capacitor through the current limiting resistor, and the current limiting resistor limits the charging current within a safe range until the charging is completed; respectively sending pulse signals to an upper tube driving plate and a lower tube driving plate of the silicon carbide device, wherein the driving plates change the pulse signals into switching signals of the silicon carbide device, and control the on-off of the silicon carbide device; and when the experiment is finished, a discharge switch in the high-voltage direct current source is closed, the electrolytic capacitor discharges the stored energy through a discharge resistor, and the discharge current is limited within a safe range by the discharge resistor in the discharge process until the discharge is finished.
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| CN202310231470.8A CN116381440A (en) | 2023-03-10 | 2023-03-10 | Multifunctional portable silicon carbide device characteristic tester |
| CN202322576866.4U CN221124768U (en) | 2023-03-10 | 2023-09-21 | Multifunctional portable silicon carbide device characteristic tester |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117686754A (en) * | 2024-02-01 | 2024-03-12 | 忱芯科技(上海)有限公司 | Current source for bipolar degradation test of silicon carbide power semiconductor device |
| CN117713322A (en) * | 2024-02-01 | 2024-03-15 | 杭州飞仕得科技股份有限公司 | Energy-recoverable charging and discharging device and method for double-pulse test system |
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