CN116380388A - Bare chip vibration testing device - Google Patents
Bare chip vibration testing device Download PDFInfo
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- CN116380388A CN116380388A CN202310651281.6A CN202310651281A CN116380388A CN 116380388 A CN116380388 A CN 116380388A CN 202310651281 A CN202310651281 A CN 202310651281A CN 116380388 A CN116380388 A CN 116380388A
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- 238000012360 testing method Methods 0.000 title claims abstract description 64
- 239000000758 substrate Substances 0.000 claims abstract description 56
- 238000003825 pressing Methods 0.000 claims description 82
- 230000001360 synchronised effect Effects 0.000 claims description 14
- 238000006073 displacement reaction Methods 0.000 claims description 12
- 230000002457 bidirectional effect Effects 0.000 claims description 9
- 238000005096 rolling process Methods 0.000 claims description 3
- 230000000149 penetrating effect Effects 0.000 claims description 2
- 230000001681 protective effect Effects 0.000 claims description 2
- 238000000034 method Methods 0.000 abstract description 11
- 230000015556 catabolic process Effects 0.000 abstract description 5
- 238000006731 degradation reaction Methods 0.000 abstract description 5
- 238000001514 detection method Methods 0.000 abstract description 4
- 239000007787 solid Substances 0.000 abstract description 2
- 230000000694 effects Effects 0.000 description 4
- 239000011090 solid board Substances 0.000 description 4
- 238000005538 encapsulation Methods 0.000 description 2
- 230000005484 gravity Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000000994 depressogenic effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M7/00—Vibration-testing of structures; Shock-testing of structures
- G01M7/02—Vibration-testing by means of a shake table
- G01M7/06—Multidirectional test stands
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M7/00—Vibration-testing of structures; Shock-testing of structures
- G01M7/02—Vibration-testing by means of a shake table
- G01M7/022—Vibration control arrangements, e.g. for generating random vibrations
Abstract
The invention relates to the technical field of bare chip vibration test, and in particular provides a bare chip vibration test device, which comprises: test base, support solid mechanism and vibration test mechanism. According to the invention, the distance between the two side bearing seats is adjusted by the adjusting group in the supporting and fixing mechanism, so that the substrates with different sizes are fixed, the application range of the vibration testing equipment is enlarged, meanwhile, the substrates with chips with different sizes are also convenient to fix, then the vibration testing mechanism is used for vibration testing of the substrates, and the substrates are comprehensively vibrated under the cooperation of the upper and lower vibration driving groups and the arc-shaped poking teeth for the two poking plates, so that the chips on the substrates are subjected to single vibration and multidirectional vibration, various vibration environments encountered by the chips in the working and transportation processes are conveniently and accurately simulated, and the accuracy of the performance degradation detection of the chips is improved.
Description
Technical Field
The invention relates to the technical field of chip vibration testing, and particularly provides a bare chip vibration testing device.
Background
Bare chips refer to the product form of the semiconductor component before the manufacture and encapsulation, usually in the form of a large wafer or a single chip, and the chips are mounted on a substrate and become semiconductor elements, integrated circuits or more complex circuits (hybrid circuits) after encapsulation.
When the chip is used or the vibration environment that runs into in the transportation, easily drop from the base plate under the effect of vibration, cause the unable normal work of components and parts, consequently now need a bare chip vibration testing arrangement, install the chip base plate with unpacking and fix, then carry out vibration test to the chip, simulate the multiple vibration environment that the chip runs into in use or transportation, improve the precision of chip vibration test to avoid appearing foretell problem.
Disclosure of Invention
In view of the above problems, embodiments of the present application provide a bare chip vibration testing device to solve the technical problem that in the related art, multiple vibration environments encountered in the chip working and transporting process need to be simulated.
In order to achieve the above purpose, the embodiment of the present application provides the following technical solutions: a bare chip vibration testing apparatus comprising: the test base, the fixed extension board of following its length direction symmetrical arrangement is installed at the top of test base, and the support box is installed at the top of fixed extension board, and two openings that support the box are relative, are provided with the connecting plate on the support box, and even solid board is all installed to the opposite face of two connecting plates, is provided with between two even solid boards and carries out fixed support and solid mechanism to the base plate.
And a vibration testing mechanism for driving the base plate and the chip arranged on the base plate to vibrate through the driving connecting plate is arranged between the two supporting boxes.
The supporting and fixing mechanism comprises an L-shaped end bearing seat connected between two connecting and fixing plates and L-shaped side bearing seats which are connected with the horizontal sections of the end bearing seat and symmetrically arranged along the length direction of the L-shaped end bearing seat, an adjusting group for adjusting the distance between the two side bearing seats is arranged on the end bearing seat, a first pressing plate is arranged on the end face, close to the side bearing seat, of the vertical section of the end bearing seat in a sliding mode, a second pressing plate which slides up and down is arranged on the opposite faces of the vertical sections of the two side bearing seats, and a pressing driving group for driving the first pressing plate and the second pressing plate to synchronously move downwards to support and press a substrate is arranged on the end bearing seat.
The side bearing seat and the end bearing seat fix the base plates with different sizes under the cooperation of the pressing driving group and the adjusting group.
The vibration testing mechanism comprises a driving shaft which is rotationally connected between two fixed support plates, an upper vibration driving group and a lower vibration driving group which drive a connecting plate to vibrate up and down are jointly arranged on the driving shaft and a supporting box, an H-shaped plate is installed between the two fixed plates and close to the lower end, the top of a testing base is rotationally connected with a rotating shaft, bevel gears are installed on the rotating shaft and the driving shaft, the two bevel gears are meshed and driven, a rotating disk is installed on the rotating shaft, arc-shaped poking teeth are installed on the side wall of the rotating disk, two poking push plates which are circumferentially arranged along the rotating disk and vertically arranged are installed in the middle of the H-shaped plate, a rotating roller is rotationally connected with the end face of the poking push plate close to the rotating disk and used for reducing friction force between the poking push plates and the arc-shaped poking teeth, and an elastic group which is used for multi-directionally testing vibration of the base plate is arranged in the supporting box.
In a possible implementation mode, the up-down vibration driving set comprises a cam which is fixedly sleeved on the driving shaft and is symmetrically arranged along the axial direction of the cam, a limiting through groove is formed in the middle of the end face, close to the connecting plate, of the lower side of the supporting box, a sliding groove is formed in the end face, far away from the connecting plate, of the limiting through groove, a guide plate is connected in the sliding groove in a sliding mode, a fixing column is arranged at the bottom of the connecting plate, a jacking plate located right above the cam is arranged at the bottom of the fixing column after the fixing column penetrates through the guide plate in a sliding mode, a bearing plate closely attached to the bottom of the connecting plate is arranged at the bottom of the inner wall of the supporting box through a supporting spring rod, and the cam and the jacking plate and the supporting spring rod are matched to perform up-down vibration test on the substrate.
In one possible implementation, the elastic set includes a limiting push plate installed on the inner side wall of the supporting box through a reset spring rod, the limiting push plate located on one side of the connecting plate far away from the connecting plate is contacted with the middle part of the connecting plate, and the rest of limiting push plates are contacted with one end of the side wall of the connecting plate far away from the connecting plate.
In a possible implementation manner, the adjusting group comprises a displacement groove symmetrically arranged along the length direction of the end bearing seat on the end surface of the horizontal section of the end bearing seat, which is close to the side bearing seat, the side bearing seat is connected with a moving block in sliding connection with the corresponding displacement groove, a bidirectional screw rod is rotationally connected between the two displacement grooves, and the bidirectional screw rod is connected with the moving block in a threaded fit manner.
In a possible implementation mode, the pushing down driving group includes the balanced spout of evenly arranging along its length direction that sets up at the vertical section of end socket, the connecting groove has been seted up at the vertical section middle part of end socket, install the support bar jointly between two even fixed plates, rotate the rotary rod that is connected with the through-connection groove on the support bar, be connected through screw-thread fit's mode between rotary rod and the clamp plate, the spring groove of evenly arranging along its length direction has been seted up to the vertical section of side socket, be connected through the jack spring between spring groove and the clamp plate, the lower briquetting of parallel and level with its bottom is all installed along its length direction's both sides to the clamp plate, the lid parallel and level with clamp plate top is installed to the clamp plate terminal surface near one, the lid layering is located the lower briquetting top that is adjacent to it, be connected with the T type carrier plate that slides from top to bottom between two even fixed plates, T type carrier plate and rotary rod are connected through screw-thread fit's mode, the vertical section of one side of keeping away from the end socket is connected with the synchronous layering of the L type of upper and lower gliding, the horizontal section of synchronous layering is located the lower adjacent lower briquetting of clamp plate along its length direction, the upper side of synchronous layering is located the synchronous briquetting of the synchronous depression bar.
In one possible implementation mode, the opposite faces of the two connecting and fixing plates are provided with balance support plates, the balance support plates are located on one side, away from the end bearing, of the side bearing, the end faces, close to the side bearing, of the balance support plates are provided with bearing grooves, the horizontal sections of the side bearing are rotationally connected with bearing rollers which are uniformly distributed, and the bearing rollers are in rolling connection with the bearing grooves.
In one possible implementation manner, the top of the horizontal section of the side bearing seat and the end bearing seat and the lower end surfaces of the first pressing plate and the second pressing plate are respectively provided with a protection gasket.
The above technical solutions in the embodiments of the present invention have at least one of the following technical effects: 1. according to the bare chip vibration testing device designed by the invention, the distance between the two side bearing seats is adjusted through the adjusting group in the supporting and fixing mechanism, so that the fixing of substrates with different sizes is realized, the application range of vibration testing equipment is enlarged, meanwhile, the substrates with chips with different sizes are also convenient to fix, then the substrates are subjected to vibration testing through the vibration testing mechanism, and the substrates are subjected to comprehensive vibration under the matching action of the upper and lower vibration driving groups and the arc-shaped poking teeth for the two poking plates, so that the chips on the substrates are subjected to single vibration and multidirectional vibration, various vibration environments encountered by the chips in the working and transportation processes are accurately simulated, and the accuracy of the performance degradation detection of the chips is improved.
2. The pressing driving group in the invention can realize the synchronous downward movement function of the first pressing plate and the second pressing plate by only rotating the rotating rod when in operation, thereby avoiding the problem of complicated steps when the first pressing plate and the second pressing plate are required to be respectively driven to move downward when the substrate is fixed, and improving the convenience of substrate fixing.
3. According to the invention, multidirectional vibration test of the substrate is realized under the cooperation of the arc-shaped poking teeth and the two poking pushing plates, the comprehensiveness of the vibration test of the substrate is increased, the substrate is prevented from being vibrated up and down, and the performance degradation of the chip after being vibrated is difficult to accurately detect.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings that are required to be used in the embodiments or the description of the prior art will be briefly described below, and it is obvious that the drawings in the following description are only embodiments of the present invention, and that other drawings can be obtained according to the provided drawings without inventive effort for a person skilled in the art.
Fig. 1 is a schematic view of a main perspective structure of the present invention.
Fig. 2 is a partial perspective view of the present invention.
Fig. 3 is a schematic view of a partial perspective structure of the abutting mechanism of the present invention.
Fig. 4 is a schematic perspective view of the inside of the support case of the present invention.
Fig. 5 is a front view of the present invention.
Fig. 6 is a cross-sectional view taken along A-A of fig. 5 in accordance with the present invention.
Fig. 7 is a B-B cross-sectional view of fig. 5 in accordance with the present invention.
Fig. 8 is a schematic structural diagram of a chip and a substrate.
Reference numerals: 1. a test base; 2. fixing the support plate; 3. a support box; 4. a connecting plate; 5. a connecting plate; 6. a propping and fixing mechanism; 7. a vibration testing mechanism; 8. a substrate.
50. Balance support plates; 51. a receiving groove; 52. and a receiving roller.
60. An end socket; 601. a protective gasket; 61. a side socket; 62. an adjustment group; 63. a first pressing plate; 64. a second pressing plate; 65. the drive group is depressed.
620. A displacement groove; 621. a moving block; 622. a bidirectional screw.
650. Balance sliding grooves; 651. a support bar; 652. a rotating rod; 653. a spring groove; 654. a jack spring; 655. pressing the block; 656. covering and pressing the strip; 657. t-shaped carrier plate; 658. and (5) synchronizing the pressing strips.
70. A drive shaft; 71. a vertical vibration driving group; 72. h-shaped plates; 73. a rotating shaft; 74. a rotating disc; 75. arc-shaped shifting teeth; 76. a push plate; 77. a rotating roller; 78. an elastic group.
710. A cam; 711. limiting through grooves; 712. a slip groove; 713. a guide plate; 714. fixing the column; 715. a jacking plate; 716. supporting a spring rod; 717. and a receiving plate.
780. A reset spring lever; 781. and a limit push plate.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
In order that those skilled in the art will better understand the present invention, the following description will be given in detail with reference to the accompanying drawings and specific embodiments.
Referring to fig. 1 and 5, a bare chip vibration testing apparatus includes: the test base 1, the fixed extension board 2 along its length direction symmetrical arrangement is installed at the top of test base 1, and support box 3 is installed at the top of fixed extension board 2, and the opening of two support boxes 3 is relative, is provided with connecting plate 4 on the support box 3, and even solid board 5 is all installed to the opposite face of two connecting plates 4, is provided with between two even solid board 5 and carries out fixed support mechanism 6 to base plate 8.
Referring to fig. 8, a vibration testing mechanism 7 for driving the substrate 8 and the chip mounted on the substrate 8 to vibrate by driving the connection board 4 is disposed between the two support boxes 3.
Referring to fig. 1, the propping and fixing mechanism 6 includes an L-shaped end socket 60 connected between two connecting and fixing plates 5, and L-shaped side sockets 61 symmetrically arranged along the length direction of the L-shaped end socket 60 and connected with the horizontal section of the end socket 60, an adjusting set 62 for adjusting the distance between the two side sockets 61 is provided on the end socket 60, a first pressing plate 63 sliding up and down is provided on the vertical section of the end socket 60 near the end surface of the side socket 61, a second pressing plate 64 sliding up and down is provided on the opposite surfaces of the vertical sections of the two side sockets 61, and a pressing driving set 65 for driving the first pressing plate 63 and the second pressing plate 64 to move down synchronously to prop against the substrate 8 is provided on the end socket 60.
The side bearing seat 61 and the end bearing seat 60 fix the base plates 8 with different sizes under the cooperation of the pressing driving group 65 and the adjusting group 62.
The substrate 8 is inserted on the end bearing seat 60 and the side bearing seat 61, and then the first pressing plate 63 and the second pressing plate 64 are simultaneously driven to move downwards through the pressing driving group 65 until the first pressing plate 63 and the second pressing plate 64 press the substrate 8 on the end bearing seat 60 and the side bearing seat 61, so that the substrate 8 is fixed, the side bearing seat 61 and the end bearing seat 60 are matched with each other in the pressing driving group 65 and the adjusting group 62 to fix the substrates 8 with different sizes, the application range of the chip vibration test is improved, meanwhile, the substrate 8 is fixed in a clamping mode on the edge of the substrate 8, the fixing stability of the substrate 8 is improved, and the substrate 8 is prevented from falling in the vibration test process.
Referring to fig. 2, 3 and 7, the adjusting set 62 includes a displacement groove 620 formed in a horizontal section of the end socket 60 near an end surface of the side socket 61, the displacement groove 620 is symmetrically arranged along a length direction of the end socket 60, a moving block 621 slidably connected with the corresponding displacement groove 620 is mounted on the side socket 61, a bidirectional screw 622 is rotatably connected between the two displacement grooves 620, and the bidirectional screw 622 is connected with the moving block 621 by a threaded fit manner.
The bidirectional screw 622 is rotated, the bidirectional screw 622 is matched with the moving block 621 through threads, so that the moving block 621 is controlled to move, and the moving block 621 drives the side bearing blocks 61 to move, so that the distance between the two side bearing blocks 61 is adjusted, and the two side bearing blocks 61 can bear and fix substrates 8 with different sizes conveniently.
Referring to fig. 1 and 7, the opposite surfaces of the two connecting and fixing plates 5 are respectively provided with a balance support plate 50, the balance support plates 50 are positioned on one side of the side bearing seat 61 away from the end bearing seat 60, the end surfaces of the balance support plates 50 close to the side bearing seat 61 are provided with bearing grooves 51, the horizontal sections of the side bearing seats 61 are rotatably connected with bearing rollers 52 which are uniformly distributed, and the bearing rollers 52 are in rolling connection with the bearing grooves 51.
Under the cooperation of the receiving roller 52 and the receiving groove 51, one end of the side bearing seat 61 away from the end bearing seat 60 is supported, so that one side of the side bearing seat 61 away from the end bearing seat 60 is prevented from tilting under the gravity action of the side bearing seat 61, and then when the side bearing seat 61 moves, the side bearing seat 61 drives the receiving roller 52 to roll along the receiving groove 51.
Referring to fig. 3, the protection gaskets 601 are mounted on the top of the horizontal sections of the side bearing seat 61 and the end bearing seat 60 and the lower end surfaces of the first pressing plate 63 and the second pressing plate 64, and the protection gaskets 601 protect the substrate 8, so that the substrate 8 is prevented from being damaged due to the large pressing force when the first pressing plate 63 and the second pressing plate 64 are pressed downwards.
Referring to fig. 3, 6 and 7, the pressing driving set 65 includes a balancing chute 650 which is formed on a vertical section of the end socket 60 and is uniformly distributed along a length direction thereof, the balancing chute 650 is slidably connected with a first pressing plate 63, a connecting groove is formed in a middle of the vertical section of the end socket 60, a supporting bar 651 is mounted between the two connecting plates 5 together, a rotating rod 652 penetrating the connecting groove is rotatably connected to the supporting bar 651, the rotating rod 652 is connected with the first pressing plate 63 through a threaded fit manner, a spring groove 653 which is uniformly distributed along a length direction thereof is formed on a vertical section of the side socket 61, the spring groove 653 is connected with a second pressing plate 64 through a supporting spring 654, lower pressing plates 655 which are flush with bottoms of the second pressing plate 64 are mounted on two sides of the second pressing plate 64, a cover pressing bar 656 which is flush with a top of the first pressing plate 63 is mounted near an end surface of the side socket 61, a T-shaped supporting plate 657 which slides up and down is connected between the two connecting plates 651, the T-shaped plate 652 is connected with the rotating rod 652 through a threaded fit manner, and the upper pressing plate 658 is connected with the upper pressing plate 6561 of the upper pressing plate and the lower pressing plate 6561 through the threaded fit manner, and the lower pressing plate is connected with the upper pressing plate 65658 of the lower pressing plate 6561 in a synchronous manner.
After substrate 8 is placed and is accomplished, rotate rotary rod 652, rotary rod 652 passes through screw-thread fit's mode and drives clamp plate 63 and T type carrier 657 downwardly moving, T type carrier 657 downwardly moving drives synchronous layering 658 downwardly moving, clamp plate 63 drives lid layering 656 downwardly moving, synchronous layering 658 and lid layering 656 downwardly moving support pressing block 655 and drive clamp plate 64 downwardly moving simultaneously, thereby realize clamp plate 63 and clamp plate 64 downwardly moving's function in step, avoid when fixing substrate 8, the step is loaded down with trivial details problem when needs to drive clamp plate 63 and clamp plate 64 downwardly moving respectively, the convenience to substrate 8 is fixed has been improved.
When the substrate 8 is removed after the test, the rotating rod 652 is rotated, the rotating rod 652 drives the T-shaped bearing plate 657 and the first pressing plate 63 to move upwards, the cover pressing bar 656 and the synchronous pressing bar 658 do not press the lower pressing block 655 any more, and the second pressing plate 64 moves upwards under the elastic force reset action of the top supporting spring 654.
Referring to fig. 1, 5 and 6, the vibration testing mechanism 7 includes a driving shaft 70 rotatably connected between two fixed support plates 2, an up-and-down vibration driving set 71 for driving the connection plate 4 to vibrate up and down is jointly arranged on the driving shaft 70 and the supporting box 3, an H-shaped plate 72 is installed between the two fixed support plates 5 near the lower end, a rotating shaft 73 is rotatably connected to the top of the testing base 1, bevel gears are installed on the rotating shaft 73 and the driving shaft 70, two bevel gears are meshed and driven, a rotating disk 74 is installed on the rotating shaft 73, arc-shaped shifting teeth 75 are installed on the side wall of the rotating disk 74, two shifting push plates 76 which are circumferentially arranged along the rotating disk 74 and vertically arranged are installed in the middle of the H-shaped plate 72, a rotating roller 77 is rotatably connected to the end face of the shifting push plates 76 near the rotating disk 74, the rotating roller 77 is used for reducing friction force between the shifting push plates 76 and the arc-shaped shifting teeth 75, an elastic set 78 for conducting vibration testing on the substrate 8 in a matching manner with the shifting push plates 76, and the length of the arc-shaped shifting teeth 75 and the arc-shaped push plates 76 does not separate from the shifting plates 76 when the H72 vibrate up and down.
Through the rotation of the driving shaft 70 connected with an external motor, the driving shaft 70 drives the connecting and fixing plate 5 and the base plate 8 fixed on the supporting and fixing mechanism 6 to realize the function of up-down vibration through the up-down vibration driving group 71 in the rotating process, meanwhile, the rotating shaft 73 is driven to rotate through the meshing of the bevel gears on the driving shaft 70 and the bevel gears on the rotating shaft 73, the rotating shaft 73 drives the rotating disk 74 to rotate with the arc-shaped poking teeth 75 in the rotating process, when the arc-shaped surface of the arc-shaped poking teeth 75 is contacted with the poking plate 76 parallel to the side bearing seat 61, the arc-shaped poking teeth 75 push the poking plate 76 and the H-shaped plate 72, the connecting and fixing plate 5 and the base plate 8 to move along the width direction of the test base 1, and when the arc-shaped poking teeth 75 are separated from the poking plate 76, the H-shaped plate 72, the connecting and the base plate 5 and the base plate 8 are reset under the elastic action of the elastic group 78, so that the reciprocating vibration function of the base plate 8 along the width direction of the test base 1 is realized.
When the arc surface of the arc poking tooth 75 is in contact with the poking plate 76 perpendicular to the bearing seat 61 at the same side, the arc poking tooth 75 pushes the poking plate 76, the H-shaped plate 72, the connecting plate 5 and the base plate 8 to move along the length direction of the test base 1, and when the arc poking tooth 75 is separated from the poking plate 76, the H-shaped plate 72, the connecting plate 5 and the base plate 8 reset under the elastic force of the elastic group 78, so that the reset vibration function of the base plate 8 along the length direction of the test base 1 is realized, and the base plate 8 realizes comprehensive vibration under the matching effect of the upper and lower vibration driving groups 71, the arc poking tooth 75 and the two poking plates 76, so that a chip on the base plate 8 is subjected to multi-directional vibration, and the vibration environment encountered by the chip in the working and transportation can be simulated accurately, and the accuracy of the degradation detection of the chip performance is improved.
Referring to fig. 2, 4 and 6, the up-down vibration driving set 71 includes a cam 710 fixedly sleeved on the driving shaft 70 and symmetrically arranged along the axial direction thereof, a limit through slot 711 is provided at the middle of the end surface of the lower side of the supporting box 3 near the connecting plate 5, a sliding slot 712 is provided at the end surface of the limit through slot 711 far away from the connecting plate 5, a guide plate 713 is slidably connected in the sliding slot 712, a fixing column 714 is mounted at the bottom of the connecting plate 4, a lifting plate 715 located right above the cam 710 is mounted after the fixing column 714 slides through the guide plate 713, a bearing plate 717 closely attached to the bottom of the connecting plate 4 is mounted at the bottom of the inner wall of the supporting box 3 through a supporting spring rod 716, and the cam 710 and the lifting plate 715 cooperate with the supporting spring rod 716 to perform up-down vibration test on the substrate 8.
The driving shaft 70 drives the cam 710 to rotate in the rotating process, the protruding part of the cam 710 pushes the jacking plate 715 and the fixing post 714 to move upwards in the rotating process, the fixing post 714 pushes the connecting plate 4, the connecting plate 5 and the connecting plate 5 to move upwards when moving upwards, the connecting plate 5 moves upwards through the base plate 8 fixed by the abutting mechanism 6, when the protruding part of the cam 710 is separated from the jacking plate 715, the connecting plate 4 and the connecting plate 5 drive the base plate 8 to move downwards under the action of self gravity, at the moment, the connecting plate 717 and the supporting spring rod 716 bear the connecting plate 4, and the cam 710 pushes the jacking plate 715 to move upwards in a reciprocating mode, so that the up-down vibration test of the base plate 8 is realized.
Referring to fig. 2 and 4, the elastic set 78 includes a limit push plate 781 mounted on the inner side wall of the support box 3 through a return spring lever 780, the limit push plate 781 located on one side of the connecting plate 4 far from the connecting plate 5 contacts with the middle of the connecting plate 4, and the rest of limit push plates 781 contact with one end of the side wall of the connecting plate 4 far from the connecting plate 5.
When the rotating disc 74 drives the arc-shaped poking teeth 75 to push the poking plate 76 to drive the substrate 8 to move in multiple directions, the reset spring lever 780 pushes the connecting plate 4, the connecting plate 5 and the substrate 8 fixed by the supporting and fixing mechanism 6 to reset through the limiting push plate 781, so that the multidirectional reciprocating movement function of the substrate 8 is realized, and the comprehensiveness of chip vibration simulation is improved.
During operation, the distance between the two side bearing seats 61 is adjusted by the adjusting group 62 according to the size of the substrate 8, then the substrate 8 is inserted into the end bearing seat 60, between the horizontal section of the side bearing seat and the first pressing plate 63 and the second pressing plate 64, and then the first pressing plate 63 and the second pressing plate 64 are simultaneously driven to move downwards by the pressing driving group 65 until the first pressing plate 63 and the second pressing plate 64 press the substrate 8 on the end bearing seat 60 and the side bearing seat 61, so that the substrate 8 is fixed, the side bearing seat and the end bearing seat 60 are matched with the adjusting group 62 in the pressing driving group 65 to fix the substrates 8 with different sizes, the application range of the chip vibration test is improved, the substrate 8 is fixed in a clamping mode on the edge of the substrate 8, the stability of the substrate 8 is improved, and the substrate 8 is prevented from falling in the vibration test process.
Finally, through the rotation of the driving shaft 70 connected with an external motor, the driving shaft 70 drives the connecting and fixing plate 5 and the substrate 8 fixed on the supporting and fixing mechanism 6 through the up-and-down vibration driving group 71 in the rotating process, meanwhile, the rotating shaft 73 is driven to rotate through the meshing of the bevel gears on the driving shaft 70 and the bevel gears on the rotating shaft 73, the rotating shaft 73 drives the rotating disc 74 and the arc-shaped poking teeth 75 to rotate in the rotating process, and the substrate 8 realizes multidirectional vibration under the matching effect of the arc-shaped poking teeth 75 and the two poking push plates 76, so that chips on the substrate 8 are subjected to single vibration and multidirectional vibration, vibration environments encountered by the chips in the working and transportation can be simulated accurately, and the accuracy of chip performance degradation detection is improved.
In the description of the present invention, it should be understood that the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings are merely for convenience in describing the present invention and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present invention.
In the description of the present invention, it should also be noted that, unless explicitly specified and limited otherwise, the terms "disposed," "connected," "mounted," and "connected" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in the present invention will be understood in specific cases by those of ordinary skill in the art.
The embodiments of the present invention are all preferred embodiments of the present invention, and are not limited in scope by the present invention, so that all equivalent changes according to the structure, shape and principle of the present invention are covered in the scope of the present invention.
Claims (7)
1. A bare chip vibration testing apparatus, comprising:
the device comprises a test base (1), wherein a fixed support plate (2) symmetrically arranged along the length direction of the test base (1) is arranged at the top of the test base (1), a support box (3) is arranged at the top of the fixed support plate (2), openings of the two support boxes (3) are opposite, a connecting plate (4) is arranged on the support box (3), connecting plates (5) are arranged on opposite sides of the two connecting plates (4), and a supporting and fixing mechanism (6) for fixing a base plate (8) is arranged between the two connecting plates (5);
a vibration testing mechanism (7) for driving the base plate (8) and a chip arranged on the base plate (8) to vibrate through a driving connecting plate (4) is arranged between the two supporting boxes (3);
the supporting and fixing mechanism (6) comprises an L-shaped end bearing seat (60) connected between two connecting and fixing plates (5), and L-shaped side bearing seats (61) which are symmetrically arranged along the length direction and are connected with the horizontal section of the end bearing seat (60), an adjusting group (62) for adjusting the distance between the two side bearing seats (61) is arranged on the end bearing seat (60), a first pressing plate (63) which slides up and down is arranged on the end face, close to the side bearing seat (61), of the vertical section of the end bearing seat (60), a second pressing plate (64) which slides up and down is arranged on the opposite face of the vertical section of the two side bearing seats (61), a pressing driving group (65) which drives the first pressing plate (63) and the second pressing plate (64) to synchronously move downwards to support and press the base plate (8) is arranged on the end bearing seat (60), and the base plates (8) with different sizes are fixed under the matching operation of the pressing driving group (65) and the adjusting group (62);
the vibration testing mechanism (7) comprises a driving shaft (70) which is rotationally connected between two fixed support plates (2), the driving shaft (70) and a supporting box (3) are jointly provided with an up-down vibration driving group (71) which drives a connecting plate (4) to vibrate up and down, an H-shaped plate (72) is installed between two connecting plates (5) near the lower end, the top of a test base (1) is rotationally connected with a rotating shaft (73), a rotating disc (74) is installed on the rotating shaft (73), arc-shaped poking teeth (75) are installed on the side wall of the rotating disc (74), two poking plates (76) which are circumferentially distributed along the rotating disc (74) and are vertically arranged are installed in the middle of the H-shaped plate (72), the end face of each poking plate (76) near the rotating disc (74) is rotationally connected with a rotating roller (77), and an elastic group (78) which is matched with the poking plates (76) and the arc-shaped poking teeth (75) to perform multidirectional vibration testing on a substrate (8) is arranged in the supporting box (3).
2. The bare chip vibration testing device according to claim 1, wherein: the up-down vibration driving set (71) comprises a cam (710) fixedly sleeved on the driving shaft (70) and symmetrically arranged along the axial direction of the cam, a limiting through groove (711) is formed in the middle of the end face of the lower side of the supporting box (3) close to the connecting plate (5), a sliding groove (712) is formed in the end face of the limiting through groove (711), which is far away from the connecting plate (5), a guide plate (713) is slidably connected in the sliding groove (712), a fixing column (714) is mounted at the bottom of the connecting plate (4), a jacking plate (715) located right above the cam (710) is mounted at the bottom of the fixing column (714) after the fixing column (714) slides through the guide plate (713), a bearing plate (717) tightly attached to the bottom of the connecting plate (4) is mounted at the bottom of the supporting spring rod (716), and the cam (710) and the jacking plate (715) and the supporting spring rod (716) cooperate to perform up-down vibration testing on the base plate (8).
3. The bare chip vibration testing device according to claim 1, wherein: the lower pressure driving group (65) comprises a balance chute (650) which is arranged on the vertical section of the end bearing seat (60) and uniformly distributed along the length direction of the balance chute, the balance chute (650) is in sliding connection with a first pressure plate (63), a connecting groove is arranged in the middle of the vertical section of the end bearing seat (60), a supporting bar (651) is jointly arranged between the two connecting plates (5), a rotating rod (652) penetrating the connecting groove is rotationally connected on the supporting bar (651), the rotating rod (652) is connected with the first pressure plate (63) in a threaded fit manner, a spring groove (653) which is uniformly distributed along the length direction of the spring groove is arranged on the vertical section of the side bearing seat (61), the spring groove (653) is connected with a second pressure plate (64) in a propping spring (654), a lower pressing block (655) which is flush with the bottom of the second pressure plate (64) is arranged on two sides of the length direction of the second pressure plate (64), a cover pressing bar (656) which is flush with the top of the first pressure plate (63) is arranged on the end face of the first pressure plate (63), the cover pressing bar (655) is positioned above the lower pressing block (655) which is adjacent to the first pressure plate (63), the two lower pressure plates (657) are fixedly connected with the upper pressure plate (657) in a threaded fit manner, the vertical section of one side of the side bearing seat (61) far away from the end bearing seat (60) is connected with an inverted L-shaped synchronous pressing strip (658) which slides up and down, the horizontal section of the synchronous pressing strip (658) is positioned above a lower pressing block (655) adjacent to the synchronous pressing strip, and the vertical section of the synchronous pressing strip (658) is connected to a T-shaped bearing plate (657) in a sliding manner.
4. The bare chip vibration testing device according to claim 1, wherein: the elastic group (78) comprises a limit push plate (781) arranged on the inner side wall of the supporting box (3) through a reset spring rod (780), the limit push plate (781) positioned on one side of the connecting plate (4) away from the connecting plate (5) is contacted with the middle part of the connecting plate (4), and the rest of limit push plates (781) are contacted with one end of the side wall of the connecting plate (4) away from the connecting plate (5).
5. The bare chip vibration testing device according to claim 1, wherein: the adjusting group (62) comprises displacement grooves (620) formed in the end face, close to the side bearing seat (61), of the horizontal section of the end bearing seat (60), the displacement grooves (620) are symmetrically arranged along the length direction of the end bearing seat (60), the side bearing seat (61) is connected with a moving block (621) in sliding connection with the corresponding displacement groove (620), a bidirectional screw (622) is rotatably connected between the two displacement grooves (620), and the bidirectional screw (622) is connected with the moving block (621) in a threaded fit mode.
6. The bare chip vibration testing device according to claim 1, wherein: the balance support plates (50) are arranged on opposite surfaces of the two connecting and fixing plates (5), the balance support plates (50) are located on one side, far away from the end bearing seat (60), of the side bearing seat (61), the end faces, close to the side bearing seat (61), of the balance support plates (50) are provided with bearing grooves (51), the horizontal sections of the side bearing seats (61) are rotationally connected with bearing rollers (52) which are uniformly distributed, and the bearing rollers (52) are in rolling connection with the bearing grooves (51).
7. The bare chip vibration testing device according to claim 1, wherein: protective gaskets (601) are arranged on the tops of the horizontal sections of the side bearing seat (61) and the end bearing seat (60) and on the lower end surfaces of the first pressing plate (63) and the second pressing plate (64).
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| Application Number | Priority Date | Filing Date | Title |
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| CN202310651281.6A CN116380388B (en) | 2023-06-05 | 2023-06-05 | Bare chip vibration testing device |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202310651281.6A CN116380388B (en) | 2023-06-05 | 2023-06-05 | Bare chip vibration testing device |
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| CN116380388B CN116380388B (en) | 2023-09-22 |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN116625621A (en) * | 2023-07-25 | 2023-08-22 | 合肥沛顿存储科技有限公司 | Bare chip vibration detection equipment |
| CN117741497A (en) * | 2024-02-21 | 2024-03-22 | 临沂衍庆电器有限公司 | Engineering machinery LED lamp service life detection device |
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| WO2021068332A1 (en) * | 2019-10-10 | 2021-04-15 | 苏州电器科学研究院股份有限公司 | Anti-vibration performance test device for circuit board |
| CN113805043A (en) * | 2021-10-09 | 2021-12-17 | 南通芯盟测试研究院运营管理有限公司 | Vehicle gauge chip test bench |
| CN216132655U (en) * | 2021-07-09 | 2022-03-25 | 浙江树人学院（浙江树人大学） | Vibration testing device |
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| WO2021068332A1 (en) * | 2019-10-10 | 2021-04-15 | 苏州电器科学研究院股份有限公司 | Anti-vibration performance test device for circuit board |
| CN211651999U (en) * | 2020-04-20 | 2020-10-09 | 南京微客力科技有限公司 | Chip test vibrations controlling means |
| CN216132655U (en) * | 2021-07-09 | 2022-03-25 | 浙江树人学院（浙江树人大学） | Vibration testing device |
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| CN116625621A (en) * | 2023-07-25 | 2023-08-22 | 合肥沛顿存储科技有限公司 | Bare chip vibration detection equipment |
| CN116625621B (en) * | 2023-07-25 | 2023-09-26 | 合肥沛顿存储科技有限公司 | Bare chip vibration detection equipment |
| CN117741497A (en) * | 2024-02-21 | 2024-03-22 | 临沂衍庆电器有限公司 | Engineering machinery LED lamp service life detection device |
| CN117741497B (en) * | 2024-02-21 | 2024-04-30 | 临沂衍庆电器有限公司 | Engineering machinery LED lamp service life detection device |
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|---|---|
| CN116380388B (en) | 2023-09-22 |
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