CN116338412A - Test method and device for silicon controlled rectifier - Google Patents
Test method and device for silicon controlled rectifier Download PDFInfo
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- CN116338412A CN116338412A CN202310605119.0A CN202310605119A CN116338412A CN 116338412 A CN116338412 A CN 116338412A CN 202310605119 A CN202310605119 A CN 202310605119A CN 116338412 A CN116338412 A CN 116338412A
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- controlled rectifier
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/263—Circuits therefor for testing thyristors
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
Abstract
The invention discloses a method and a device for testing a silicon controlled rectifier, in particular to the field of silicon controlled rectifier testing, and relates to a device for testing the silicon controlled rectifier. According to the invention, the driving press seat and the top seat are close to each other, the pin contacts are stably contacted with the pin contact structure in a plane manner under the extrusion of the positioning convex strips, the pin can be stably and tightly connected, friction or interference bending between other structures is avoided, and after the test is finished, the silicon controlled rectifier can still be used as a new product, so that waste is avoided.
Description
Technical Field
The invention relates to the technical field of silicon controlled rectifier testing, in particular to a method and a device for testing silicon controlled rectifier.
Background
The thyristors are also called thyristors. Since the advent of the 50 s of the 20 th century, a large family has been developed whose main members are unidirectional thyristors, bidirectional thyristors, photo-controlled thyristors, reverse-conducting thyristors, turn-off thyristor thyristors, fast thyristors, etc.
The unidirectional thyristors are provided with three pins, and the three pins correspond to the anode, the cathode and the control electrode respectively; when the test device is used for testing products, the existing majority of test devices are connected with the pins by adopting socket interfaces corresponding to the pins for improving the test efficiency, the pins of the silicon controlled rectifier are required to be inserted into the socket interfaces for connection during the test, and the pins are made of copper or aluminum materials, so that the test device is softer in texture, small in structure and easy to bend, and therefore when the pins are inserted into the socket interfaces, the pins are easy to bend or break due to errors, particularly in the plugging process, the surfaces of the pins are subjected to friction damage, the plating is affected, and the test device cannot be used as a new product after the test is finished, so that certain waste is caused.
Disclosure of Invention
The invention provides a method and a device for testing a silicon controlled rectifier, which aims to solve the problems that: the existing test equipment is connected with the pins of the silicon controlled product in a plugging and pulling way, so that the pins are easy to damage.
In order to achieve the above purpose, the present invention provides the following technical solutions: the utility model provides a testing arrangement of silicon controlled rectifier, including the test instrument group, be provided with the test location platform on the test instrument group, slidable mounting has the pusher that is used for promoting the silicon controlled rectifier and removes on the test location platform, be provided with the location guide slot on the test location platform, the end of location guide slot is provided with presses seat and footstock, be provided with the pin constant head tank on the footstock, install pin contact structure in the pin constant head tank, the position department that corresponds the pin constant head tank of pressing seat bottom all is provided with the location sand grip, during the test, the pin removes to between pressing seat and the footstock, pressing seat and footstock make pin and location sand grip and pin contact structure contact laminating through opposite movement.
In a preferred embodiment, fixed mounting has the riser on the test instrument group, test positioning table level sets up, the riser is vertical to be set up, press seat and footstock all slidable mounting on the riser, install first linear drive between pusher and the positioning guide groove, be provided with on the pusher and extend to the positioning guide groove in carry out the structure of block propelling movement to the silicon controlled rectifier, the terminal inside of positioning guide groove is provided with the limit structure who prevents that the silicon controlled rectifier from shifting out, the riser middle part corresponds the region between seat and the footstock and is provided with first negative pressure formation chamber, first negative pressure formation chamber connects evacuating equipment.
In a preferred embodiment, the pin contact structure is a metal contact, the metal contact is a flat metal sheet structure, the hardness of the metal contact is greater than that of the pin, two groups of air cylinders are fixedly mounted on the vertical plate and are respectively located on the upper side and the lower side of the first negative pressure forming cavity, the first negative pressure forming cavity is communicated with the air cylinders, pistons are connected to the pressing seat and the top seat through piston rods, and the two groups of pistons are respectively and slidably mounted in the two groups of air cylinders.
In a preferred embodiment, the pin contact structure is a soft metal block, the pin contact structure is clamped in the pin positioning groove, the hardness of the soft metal block is lower than that of the pin, two groups of second linear drivers are fixedly arranged on the vertical plate, and the movable end parts of the two groups of second linear drivers are fixedly connected with the pressing seat and the top seat respectively.
In a preferred embodiment, the inside of pin constant head tank port department is provided with the transverse pressure piece, is provided with the spout in the diapire of pin constant head tank, and the bottom of transverse pressure piece is provided with the slider structure that extends to the spout inside and with spout sliding fit, is provided with the protrusion structure that imbeds in soft metal piece in the pin constant head tank inner wall.
In a preferred embodiment, the area of the first negative pressure forming cavity near the middle of the pressing seat and the top seat is provided with an air suction hole, the area of the positioning convex strip located between the pin and the first negative pressure forming cavity is provided with an air suction slot, and one ends of the positioning convex strip and the pin positioning slot near the root of the pin are provided with sealing structures which are mutually extruded and sealed.
In a preferred embodiment, the testing device further comprises a shaping pressing frame, the shaping pressing frame is located at the bottom of the testing positioning table and slides along the horizontal direction, a third linear driver is fixedly installed at the bottom of the testing positioning table, the shaping pressing frame is fixedly connected with the movable end of the third linear driver, a longitudinal pressing plate is installed in the shaping pressing frame and is connected with the shaping pressing frame through a pressing driver, the pressing driver is fixedly installed on the shaping pressing frame, the longitudinal pressing plate is fixedly connected with the movable end of the pressing driver, longitudinal pressing convex strips corresponding to the pin positioning grooves are fixedly connected to the bottom of the longitudinal pressing plate, and a transverse pressing part which is mutually embedded with the transverse pressing block is arranged at the position, corresponding to the transverse pressing block, of the shaping pressing frame.
In a preferred embodiment, the width of the vertical pressing raised line is the same as the width of the pin positioning groove, the width of the transverse pressing portion is also the same as the width of the pin positioning groove, the inner pressing portions are formed at the bottoms of the two sides of the vertical pressing raised line, the inner pressing portions are in sliding fit with the side walls of the pin positioning groove, and the joint of the inner pressing portions and the bottom wall of the vertical pressing raised line is a smooth curved surface.
In a preferred embodiment, the top of the pusher is fixedly provided with a second negative pressure forming cavity, the second negative pressure forming cavity is connected with a vacuumizing device, a negative pressure hole positioned above the silicon controlled rectifier is arranged in the pusher, the bottom wall of the second negative pressure forming cavity is communicated with the negative pressure hole, a movable plate is embedded in the test positioning table, a positioning guide groove penetrates through the movable plate, and handles are fixedly connected to two ends of the movable plate.
A test method of a test device of a silicon controlled rectifier comprises the following steps:
firstly, putting the silicon controlled rectifier into a positioning guide groove with the right side facing upwards, and pushing the silicon controlled rectifier to the tail end of the positioning guide groove by using a pusher so that a pin is positioned in a test area between a press seat and a top seat;
step two, driving the press seat and the top seat to be mutually close to enable the pins to gradually enter the pin positioning grooves, enabling the pins to be tightly attached to the pin contact structures under downward extrusion of the positioning convex strips, and enabling three pins corresponding to the silicon controlled anode, the cathode and the control electrode to be respectively connected with the corresponding pin contact structures;
thirdly, selecting a universal meter as main testing equipment, adjusting the universal meter to an R1K grade, controlling a first meter pen and a second meter pen of the universal meter to be respectively conducted with pin contact structures corresponding to an anode and a cathode of the silicon controlled rectifier, testing the forward resistance and the reverse resistance between the anode and the cathode of the silicon controlled rectifier, shorting the anode and the control electrode of the silicon controlled rectifier by using a shorting control circuit if the resistance of the silicon controlled rectifier is detected to be infinite, and indicating that the silicon controlled rectifier has good performance if a pointer of the universal meter is detected to deflect rightwards; if the positive resistance value and the reverse resistance value between the anode and the cathode of the controlled silicon are measured to be zero or smaller, the internal breakdown short circuit or electric leakage of the controlled silicon is indicated;
and fourthly, after the test is finished, controlling the pressing seat and the top seat to be mutually far away, controlling the pusher to retract, and taking out the silicon controlled rectifier.
The invention has the technical effects and advantages that:
1. according to the invention, the pin gradually enters the pin positioning groove through the mutual approaching of the driving pressing seat and the top seat, and is stably and planarly contacted with the pin contact structure under the extrusion of the positioning convex strips, so that the pin can be stably and tightly connected, friction or interference bending between other structures is avoided, and damage is avoided, therefore, after the test is finished, the silicon controlled rectifier can still be used as a new product, and waste is avoided;
2. according to the invention, the soft metal block is arranged as the pin contact structure, when the footstock and the pressing seat are extruded, the pins can extrude the surface of the soft metal block to generate deformation, so that the contact area of the pins and the soft metal block is further increased, the conducting effect is improved, the pins are not pressed to be deformed, the protection effect on the pins is improved, and the safety of the test is further improved.
Drawings
FIG. 1 is a schematic diagram of the overall structure of the present invention;
FIG. 2 is a schematic structural diagram of a testing device according to embodiment 1 of the present invention;
FIG. 3 is a schematic diagram showing the testing state of the testing device according to embodiment 1 of the present invention;
FIG. 4 is an enlarged view of a part of the structure of the press seat and the top seat of FIG. 3 according to the present invention;
FIG. 5 is a schematic diagram showing the testing state of the testing device according to embodiment 2 of the present invention;
FIG. 6 is an enlarged view of a part of the structure of the press seat and the top seat of FIG. 5 according to the present invention;
FIG. 7 is a left side view of the press seat and the top seat in embodiment 2 of the present invention;
FIG. 8 is a schematic view of the structure of the portion A in FIG. 7 according to the present invention;
FIG. 9 is a state diagram of the shaping and pressing of a flexible metal block in embodiment 3 of the present invention;
fig. 10 is a left side view showing a state where the longitudinal pressing protrusions press the flexible metal block in embodiment 3 of the present invention;
FIG. 11 is a schematic view of the structure of portion B in FIG. 10 according to the present invention;
FIG. 12 is a schematic view of the pusher structure of the present invention after the second negative pressure forming chamber is added;
FIG. 13 is a schematic view of the overall structure of a test positioning table with a movable plate according to the present invention;
FIG. 14 is a block diagram of a test product of the present invention;
FIG. 15 is a test flow chart of the present invention.
The reference numerals are: 1. a test instrument set; 11. a display screen; 2. a test positioning table; 21. positioning guide grooves; 22. a pusher; 221. a first linear driver; 222. a negative pressure hole; 23. a movable plate; 3. pressing a base; 31. positioning convex strips; 32. an air pumping slot; 4. a top base; 41. pin positioning grooves; 42. a transverse pressing block; 5. a pin contact structure; 51. a metal contact; 52. a soft metal block; 6. a vertical plate; 61. a first negative pressure forming chamber; 611. an air suction hole; 62. an air cylinder; 63. a piston; 64. a second linear driver; 7. shaping and pressing frames; 71. a third linear driver; 72. a longitudinal pressing plate; 73. longitudinally pressing the convex strips; 731. an internal pressure section; 74. a lateral pressing portion; 75. a push-down driver; 8. a second negative pressure forming chamber;
a. a silicon controlled rectifier; a1, pins.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Example 1
Referring to fig. 1-4 of the specification, a testing device for a silicon controlled rectifier includes a testing instrument set 1, the testing instrument set 1 is composed of testing instruments, according to the required testing performance, a voltmeter, an ammeter, a corresponding circuit and the like are commonly used, and according to the requirement, a display screen 11 is additionally arranged, so that the system is convenient to observe, but the specific selection is the prior art, the testing instrument set 1 is provided with a testing positioning table 2, the testing positioning table 2 is slidingly provided with a pusher 22 for pushing the silicon controlled rectifier a to move in a positioning guide slot 21, the testing positioning table 2 is provided with a positioning guide slot 21 for placing the silicon controlled rectifier a and guiding the silicon controlled rectifier a, the invention takes a BT151-500R type thyristor as an example for testing, the structure of the silicon controlled rectifier a is as shown in fig. 14, the silicon controlled rectifier a has three pins a1, the end of the positioning guide groove 21 is provided with a pressing seat 3 and a top seat 4 which move in a vertical plane, three pin positioning grooves 41 which are distributed corresponding to three pins a1 on the silicon controlled rectifier a are respectively arranged in a test connection area corresponding to each silicon controlled rectifier a on the top seat 4, the width value of each pin positioning groove 41 is larger than the width value of each pin a1, a pin contact structure 5 for conducting contact to each pin a1 on the silicon controlled rectifier a is arranged in each pin positioning groove 41, positioning convex strips 31 are respectively arranged at the positions corresponding to the pin positioning grooves 41 at the bottom of the pressing seat 3, the shape of the positioning convex strips 31 is corresponding to the pin positioning grooves 41, the pin contact structure 5 is used as a connection contact for connecting the pin a1 with a test instrument in the test instrument group 1, the three pin contact structures 5 respectively correspond to the three pins a1 during test, the pusher 22 pushes the silicon controlled rectifier a to the tail end of the positioning guide groove 21, the pin a1 is located in the area between the pressing seat 3 and the top seat 4, the pressing seat 3 and the top seat 4 enable the pin a1 to enter the pin positioning groove 41 and be located between the positioning convex strip 31 and the pin contact structure 5 through opposite movement, and under the pressing of the positioning convex strip 31, the pin a1 is contacted and attached with the positioning convex strip 31 and the pin contact structure 5, and then testing can be started.
Further, in the above technical scheme, the test instrument set 1 is fixedly provided with the vertical plate 6, the test positioning table 2 is horizontally arranged, the vertical plate 6 is vertically arranged, the pressing seat 3 and the top seat 4 are slidably arranged on the vertical plate 6, the first linear driver 221 is installed between the pusher 22 and the positioning guide groove 21, the first linear driver 221 is preferably an air cylinder component, a hydraulic cylinder or a linear motor and other driving devices are also selected and used for driving the pusher 22 to move on the surface of the test positioning table 2, the pusher 22 is provided with a structure extending into the positioning guide groove 21 to carry out clamping pushing on the silicon controlled rectifier a, when the silicon controlled rectifier a is pushed, the stable sliding of the silicon controlled rectifier a is ensured, meanwhile, the limiting structure for preventing the silicon controlled rectifier a from moving out is arranged inside the tail end of the positioning guide groove 21, excessive pushing is avoided, a first negative pressure forming cavity 61 is arranged in the middle of the vertical plate 6 corresponding to the area between the pressing seat 3 and the top seat 4, and the first negative pressure forming cavity 61 is connected with a vacuumizing device.
Specifically, the pin contact structure 5 is a metal contact piece 51, the metal contact piece 51 is a flat metal piece structure, the hardness of the metal contact piece 51 is greater than that of the pin a1, and after being extruded by the positioning convex strip 31, the pin a1 can be guaranteed to be attached to the metal contact piece 51 in the largest area.
Further, this embodiment provides a driving mode of the pressing seat 3 and the top seat 4, two sets of air cylinders 62 are fixedly installed on the vertical plate 6, the two sets of air cylinders 62 are respectively located at two sides of the first negative pressure forming cavity 61, the first negative pressure forming cavity 61 is communicated with the air cylinders 62, the pressing seat 3 and the top seat 4 are connected with pistons 63 through piston rods, the two sets of pistons 63 are respectively slidably installed in the two sets of air cylinders 62, so as to form a cylinder structure, when the first negative pressure forming cavity 61 is vacuumized, negative pressure is formed in the two sets of air cylinders 62, so that the two sets of pistons 63 are driven to move close to each other, the pressing seat 3 and the top seat 4 are driven to approach each other, for resetting of the pressing seat 3 and the top seat 4, a scheme of inflating the vertical plate 6 can be adopted, and a scheme of installing a spring structure for driving the pistons 63 to reset can also be adopted inside the air cylinders 62.
In the above technical solution, as shown in fig. 12, the top of the pusher 22 is fixedly provided with a second negative pressure forming cavity 8, the second negative pressure forming cavity 8 is connected with a vacuum pumping device, a negative pressure hole 222 located above the silicon controlled rectifier a is provided in the pusher 22, and the bottom wall of the second negative pressure forming cavity 8 is communicated with the negative pressure hole 222.
In order to facilitate placement and removal of the silicon controlled rectifier a, the present embodiment provides the following technical solutions: the movable plate 23 is embedded and installed in the test positioning table 2, the positioning guide groove 21 penetrates through the movable plate 23, and handles are fixedly connected to two ends of the movable plate 23.
In this embodiment, the implementation scenario specifically includes: during testing, each silicon controlled rectifier a is put into the positioning guide groove 21 on the movable plate 23 in a right-side up manner, then the movable plate 23 is placed in the test positioning table 2, the silicon controlled rectifier a is pushed to the tail end of the positioning guide groove 21 by the pusher 22, so that the pin a1 is positioned in the area between the pressing seat 3 and the top seat 4, then the first negative pressure forming cavity 61 is vacuumized, the pressing seat 3 and the top seat 4 are driven to be close to each other, the pin a1 also gradually enters the pin positioning groove 41 and is extruded downwards by the positioning convex strips 31, so that the pin a1 is tightly attached to the pin contact structure 5, the positioning convex strips 31 also enter the pin positioning groove 41, the empty space around the pin a1 is reduced, the pin a1 can maintain stable and tight connection, friction or interference between other structures is not generated, the pin a1 is stably tested, the method can not damage the pin a, therefore, after the test is finished, the silicon controlled rectifier a can still be used as a new product, when the silicon controlled rectifier a with slightly bent pin a1 is encountered, the bent pin a1 can be restored and straightened under the up-down extrusion of the press seat 3 and the top seat 4 during the test, and then the subsequent test is carried out, but the pneumatic drive is adopted in the embodiment, the driving force is weaker, the pin a1 can not be subjected to strong pressure damage after the pin contact structure 5 is bonded with the pin a1, the conduction efficiency can be improved due to the fact that the pin a1 can be bonded with the metal contact piece 51 in the largest area, poor contact is avoided, and the test is started only after the pin a1 is completely bonded, the air between the pin a1 and the metal contact piece 51 can be reduced on the basis that the positioning convex strip 31 enters the pin positioning groove 41 to fill the space around the pin a1, the probability of generating an arc can be further reduced, and the damage rate to the pin a1 is reduced; after the test is finished, the pusher 22 is controlled to retract, at this time, the vacuumizing device can be started to form negative pressure in the second negative pressure forming cavity 8, so that the negative pressure hole 222 adsorbs the silicon controlled rectifier a, and then when the pusher 22 is reset, the silicon controlled rectifier a after the test is finished can be pulled back, after the silicon controlled rectifier a reaches the movable plate 23, the negative pressure of the second negative pressure forming cavity 8 is canceled, so that the silicon controlled rectifier a can stay on the movable plate 23, and then the movable plate 23 is taken out, and all the silicon controlled rectifiers a can be taken out as shown in fig. 13.
Example 2
Referring to fig. 5-8 of the specification, unlike embodiment 1, the pin contact structure 5 of this embodiment is a soft metal block 52, the pin contact structure 5 is clamped in the pin positioning groove 41, the hardness of the soft metal block 52 is lower than that of the pin a1, the soft metal block 52 can be made of tin, silver, gold or other metals, if the pin a1 is copper, the soft metal block 52 can be made of aluminum, unlike the metal contact piece 51, the metal contact piece 51 only needs to be welded or contacted with the wires in the test instrument set 1, and as the deformation of the soft metal block 52 during long-term use is increased, the end of the wires needs to be connected with a probe structure capable of being inserted into the soft metal block 52 so as to keep long-term stable use; unlike the pneumatic driving mode of embodiment 1, in which two sets of second linear drivers 64 are fixedly mounted on the vertical plate 6, the movable ends of the two sets of second linear drivers 64 are fixedly connected with the pressing seat 3 and the top seat 4, and the second linear drivers 64 can be standard components, preferably hydraulic cylinder components, so that larger pressure can be provided for the pressing seat 3 and the top seat 4.
In the above technical solution, since the soft metal block 52 will generate micro deformation after long-term use, and the soft metal block 52 cannot expand to two sides under the limitation of the pin positioning groove 41, so the soft metal block 52 needs to reserve deformation space at the port of the pin positioning groove 41, therefore, the inside of the port (the top seat 4 is close to one end of the test positioning table 2) of the pin positioning groove 41 is provided with the transverse pressing block 42, the bottom wall of the pin positioning groove 41 is provided with the sliding groove, the bottom of the transverse pressing block 42 is provided with the sliding block structure extending into the sliding groove and sliding fit with the sliding groove, meanwhile, the inner wall of the pin positioning groove 41 is provided with the protruding structure embedded into the soft metal block 52, and further, under the condition that the soft metal block 52 is ensured to have deformation space, the soft metal block 52 can not fall off in the top seat 4.
Further, in the above technical solution, the area of the first negative pressure forming cavity 61 near the middle of the press seat 3 and the top seat 4 is provided with the air suction hole 611, the area of the positioning convex strip 31 located between the pin a1 and the first negative pressure forming cavity 61 is provided with the air suction slot 32, one end of the positioning convex strip 31 and the pin positioning slot 41 near the root of the pin a1 (the connection part of the pin a1 and the silicon controlled rectifier a) is provided with a sealing structure which is mutually pressed and sealed, when the press seat 3 and the top seat 4 are close, the first negative pressure forming cavity 61 starts to suck air, so that the air between the positioning convex strip 31 and the pin positioning slot 41 is gradually reduced.
In this embodiment, the implementation scenario specifically includes: after the pin a1 reaches the test connection area, the press seat 3 and the top seat 4 are driven to approach each other, and at the same time, the vacuumizing device is started, the air flow between the press seat 3 and the top seat 4 is driven until the positioning convex strips 31, the pin a1 and the soft metal block 52 are mutually attached, the second linear driver 64 provides larger pressure for the press seat 3 and the top seat 4, so that the soft metal block 52 can be ensured to forcefully squeeze the pin a1, meanwhile, as the hardness of the soft metal block 52 is lower than a2, when the press seat 4 and the press seat 3 squeeze, the pin a1 can squeeze the soft metal block 52 to generate deformation, the soft metal block 52 can be slightly embedded into the soft metal block 52, the contact area between the pin a1 and the soft metal block 52 is further increased, the conduction effect is improved, meanwhile, the soft metal block 52 and the pin a1 can be stably connected with the pin a1 under strong pressure, the protection effect on the pin a1 is improved, and the suction current can be further reduced by the first negative pressure forming cavity 61, or the floating structure can be attached to the vicinity of the surface of the pin a can be pressed, the surface can be influenced by the soft metal block 52, and the contact area of the soft metal block 52 can be further increased, the contact area can be sealed by the soft metal block 52, and the contact area can be positioned around the soft metal block 52, and the current can be positioned around the pin can be further reduced, and the positioning convex strip can be positioned on the surface 31, and the current can be further reduced, and the current can be influenced by the current can be measured and the position can be measured.
Example 3
Referring to fig. 5 and fig. 9-11 of the specification, in embodiment 2, the soft metal block 52 is deformed, and the deformation is increased when the soft metal block 52 is used for a long time, so that the subsequent use is affected, so that this embodiment provides a mechanism capable of regularly pressing and shaping the soft metal block 52, including a shaping pressing frame 7, the shaping pressing frame 7 is located at the bottom of the test positioning table 2 and slides along the horizontal direction, a third linear actuator 71 is fixedly installed at the bottom of the test positioning table 2, the shaping pressing frame 7 is fixedly connected with the movable end of the third linear actuator 71, the third linear actuator 71 is preferably a hydraulic cylinder, a vertical pressing plate 72 is installed in the shaping pressing frame 7, the vertical pressing plate 72 is connected with the shaping pressing frame 7 through a pressing actuator 75, and the pressing actuator 75 is preferably a micro hydraulic cylinder, or other structures capable of driving the pressing and shaping pressing plate 72 to press down can be used, the pressing actuator 75 is fixedly installed on the pressing frame 7, the vertical pressing plate 72 is fixedly connected with the movable end of the pressing actuator 75, the bottom of the vertical pressing plate 72 is fixedly connected with the vertical pressing plate 72, and the horizontal pressing block 74 is provided at the position corresponding to the vertical pressing block position of the horizontal pressing block 42 corresponding to the pin positioning groove 41.
Further, in the above technical solution, the width of the vertical pressing raised line 73 is the same as the width of the pin positioning groove 41, the width of the lateral pressing portion 74 is the same as the width of the pin positioning groove 41, the inner pressing portions 731 are formed at the bottoms of both sides of the vertical pressing raised line 73, the inner pressing portions 731 are slidably attached to the side walls of the pin positioning groove 41, and the junction between the inner pressing portions 731 and the bottom wall of the vertical pressing raised line 73 is a smooth curved surface, so that when the vertical pressing raised line 73 is pressed down, the middle portion of the soft metal block 52 is favorable to be deformed upwards under the pressing of the inner pressing portions 731 at both sides, and the indentation is supplemented.
In this embodiment, the implementation scenario specifically includes: after the test is finished, the top seat 4 is controlled to move downwards for resetting, in order to improve the supporting strength of the top seat 4, a supporting structure can be arranged below the vertical plate 6 to fixedly support the bottom of the top seat 4, then the third linear driver 71 is driven to push the shaping pressing frame 7 to the top seat 4 integrally, the transverse pressing part 74 enters the pin positioning groove 41 and is integrated with the transverse pressing block 42, the transverse movement is continued to transversely press the soft metal block 52, and then the pressing driver 75 is driven to move downwards to enable the longitudinal pressing protruding strip 73 to enter the pin positioning groove 41 and longitudinally press the soft metal block 52, so that the soft metal block 52 is subjected to recovery deformation, and the subsequent use is facilitated.
Example 4
As shown in fig. 15, the present embodiment provides a method for testing a thyristor by taking a conventional method for testing a thyristor (refer to a chinese patent of patent publication No. CN114966357a, which discloses a thyristor testing device and a testing method, and describes a more general method for testing a thyristor) in combination with a testing device adopted in the present invention, and the method comprises the following steps:
firstly, putting the silicon controlled rectifier a into a positioning guide groove 21 with the right side facing upwards, pushing the silicon controlled rectifier a to the tail end of the positioning guide groove 21 by using a pusher 22, and enabling a pin a1 to be positioned in a test area between a press seat 3 and a top seat 4;
step two, driving the pressing seat 3 and the top seat 4 to be close to each other, enabling the pin a1 to gradually enter the pin positioning groove 41, enabling the pin a1 to be tightly attached to the pin contact structure 5 under downward extrusion of the positioning convex strip 31, and enabling three pins a1 corresponding to the anode, the cathode and the control electrode of the silicon controlled rectifier a to be respectively connected with the corresponding pin contact structure 5;
step three, a universal meter is selected as main testing equipment, the testing instrument set 1 is set to be in a storage rack structure, the universal meter is placed in the testing instrument set 1, wires are led out corresponding to each pin contact structure 5, a circuit used for being connected with two meter pens of the universal meter and a short circuit used for controlling the anode and the control electrode of the silicon controlled rectifier a to be short-circuited are arranged, the universal meter is adjusted to R1K, the first meter pen and the second meter pen of the universal meter are firstly controlled to be respectively conducted with the pin contact structures 5 corresponding to the anode and the cathode of the silicon controlled rectifier a, the positive resistance and the negative resistance of the silicon controlled rectifier a are tested, if the resistance of the silicon controlled rectifier a at the moment is detected to be infinite, the anode and the control electrode of the silicon controlled rectifier a are short-circuited by using the short circuit control circuit, and if the pointer of the universal meter is detected to deflect rightwards, the silicon controlled rectifier a is indicated to have good performance; if the positive and negative resistance values between the anode and the cathode of the controlled silicon a are zero or smaller, the internal breakdown short circuit or electric leakage of the controlled silicon a is indicated;
and step four, after the test is finished, controlling the pressing seat 3 and the top seat 4 to be away from each other, controlling the pusher 22 to retract, and taking out the silicon controlled rectifier a.
Finally: the foregoing description of the preferred embodiments of the invention is not intended to limit the invention to the precise form disclosed, and any such modifications, equivalents, and alternatives falling within the spirit and principles of the invention are intended to be included within the scope of the invention.
Claims (10)
1. The utility model provides a testing arrangement of silicon controlled rectifier, includes test instrument group (1), its characterized in that: the testing instrument group (1) is provided with a testing positioning table (2), a pusher (22) for pushing the silicon controlled rectifier (a) to move is slidably mounted on the testing positioning table (2), the testing positioning table (2) is provided with a positioning guide groove (21), the tail end of the positioning guide groove (21) is provided with a pressing seat (3) and a top seat (4), the top seat (4) is provided with a pin positioning groove (41), a pin contact structure (5) is mounted in the pin positioning groove (41), positioning raised strips (31) are arranged at positions, corresponding to the pin positioning groove (41), of the bottom of the pressing seat (3), during testing, the pin (a 1) moves between the pressing seat (3) and the top seat (4), and the pressing seat (3) and the top seat (4) enable the pin (a 1) to be in contact fit with the positioning raised strips (31) and the pin contact structure (5) through opposite movement.
2. The device for testing a silicon controlled rectifier according to claim 1, wherein: the testing instrument comprises a testing instrument group (1), wherein a vertical plate (6) is fixedly installed on the testing instrument group (1), a test positioning table (2) is horizontally arranged, the vertical plate (6) is vertically arranged, a pressing seat (3) and a top seat (4) are slidably installed on the vertical plate (6), a first linear driver (221) is installed between a pusher (22) and a positioning guide groove (21), a structure which extends into the positioning guide groove (21) and is used for clamping and pushing a silicon controlled rectifier (a) is arranged on the pusher (22), a limiting structure which is used for preventing the silicon controlled rectifier (a) from moving out is arranged inside the tail end of the positioning guide groove (21), a first negative pressure forming cavity (61) is arranged in the middle of the vertical plate (6) and corresponds to an area between the pressing seat (3) and the top seat (4), and the first negative pressure forming cavity (61) is connected with a vacuumizing device.
3. The device for testing a silicon controlled rectifier according to claim 2, wherein: the pin contact structure (5) is a metal contact piece (51), the metal contact piece (51) is of a straight type metal piece structure, the hardness of the metal contact piece (51) is greater than that of a pin (a 1), two groups of air cylinders (62) are fixedly mounted on the vertical plate (6), the two groups of air cylinders (62) are respectively located on the upper side and the lower side of the first negative pressure forming cavity (61), the first negative pressure forming cavity (61) is communicated with the air cylinders (62), pistons (63) are connected to the pressing seat (3) and the top seat (4) through piston rods, and the two groups of pistons (63) are respectively and slidably mounted in the two groups of air cylinders (62).
4. The device for testing a silicon controlled rectifier according to claim 2, wherein: the pin contact structure (5) is a soft metal block (52), the pin contact structure (5) is clamped in the pin positioning groove (41), the hardness of the soft metal block (52) is lower than that of the pin (a 1), two groups of second linear drivers (64) are fixedly arranged on the vertical plate (6), and the movable end parts of the two groups of second linear drivers (64) are fixedly connected with the pressing seat (3) and the top seat (4) respectively.
5. The device for testing a silicon controlled rectifier according to claim 4, wherein: the inside of pin constant head tank (41) port department is provided with transverse pressure piece (42), be provided with the spout in the diapire of pin constant head tank (41), the bottom of transverse pressure piece (42) is provided with and extends to the spout inside and with spout sliding fit's slider structure, be provided with the protrusion structure of embedding in soft metal piece (52) in pin constant head tank (41) inner wall.
6. The device for testing a silicon controlled rectifier according to claim 5, wherein: the area that first negative pressure formed chamber (61) is close to in the middle of pressure seat (3) and footstock (4) is provided with gas vent (611), the area that is located between pin (a 1) and first negative pressure formed chamber (61) on location sand grip (31) is provided with gas vent (32), the one end that location sand grip (31) and pin constant head tank (41) are close to pin (a 1) root is provided with the seal structure of mutual extrusion seal.
7. The device for testing a silicon controlled rectifier according to claim 6, wherein: the testing device further comprises a shaping pressing frame (7), the shaping pressing frame (7) is located at the bottom of the testing positioning table (2) and slides along the horizontal direction, a third linear driver (71) is fixedly installed at the bottom of the testing positioning table (2), the shaping pressing frame (7) is fixedly connected with the movable end of the third linear driver (71), a longitudinal pressing plate (72) is installed in the shaping pressing frame (7), the longitudinal pressing plate (72) is connected with the shaping pressing frame (7) through a pressing driver (75), the pressing driver (75) is fixedly installed on the shaping pressing frame (7), the longitudinal pressing plate (72) is fixedly connected with the movable end of the pressing driver (75), longitudinal pressing ribs (73) corresponding to pin positioning grooves (41) are fixedly connected to the bottom of the longitudinal pressing plate (72), and transverse pressing parts (74) which are mutually embedded with transverse pressing blocks (42) are arranged at positions corresponding to the transverse pressing blocks (42) on the shaping pressing frame (7).
8. The device for testing a silicon controlled rectifier according to claim 7, wherein: the width of the vertical pressing raised strips (73) is the same as the width of the pin positioning grooves (41), the width of the transverse pressing parts (74) is also the same as the width of the pin positioning grooves (41), inner pressing parts (731) are formed at the bottoms of two sides of the vertical pressing raised strips (73), the inner pressing parts (731) are in sliding fit with the side walls of the pin positioning grooves (41), and the joint of the inner pressing parts (731) and the bottom walls of the vertical pressing raised strips (73) is a smooth curved surface.
9. A device for testing a silicon controlled rectifier according to any one of claims 1 to 8, wherein: the top fixed mounting of pusher (22) has second negative pressure to form chamber (8), evacuation equipment is connected in second negative pressure formation chamber (8), be provided with negative pressure hole (222) that are located silicon controlled rectifier (a) top in pusher (22), the diapire and the negative pressure hole (222) intercommunication of second negative pressure formation chamber (8), fly leaf (23) are installed in the inside embedding of test locating bench (2), locating guide slot (21) run through fly leaf (23), the both ends fixedly connected with handle of fly leaf (23).
10. A method of testing a device for testing a silicon controlled rectifier as defined in claim 1, comprising the steps of:
firstly, putting the silicon controlled rectifier (a) into a positioning guide groove (21) with the right side facing upwards, and pushing the silicon controlled rectifier (a) to the tail end of the positioning guide groove (21) by using a pusher (22) to enable a pin (a 1) to be positioned in a test area between a press seat (3) and a top seat (4);
step two, driving the pressing seat (3) and the top seat (4) to be mutually close, enabling the pin (a 1) to gradually enter the pin positioning groove (41), enabling the pin (a 1) to be tightly attached to the pin contact structure (5) under downward extrusion of the positioning convex strip (31), and enabling three pins (a 1) corresponding to the anode, the cathode and the control electrode of the silicon controlled rectifier (a) to be respectively connected with the corresponding pin contact structure (5);
step three, a universal meter is selected as main testing equipment, the universal meter is adjusted to R1K, a first meter pen and a second meter pen of the universal meter are controlled to be respectively conducted with pin contact structures (5) corresponding to anodes and cathodes of the thyristors (a), the positive resistance and the reverse resistance between the anodes and the cathodes of the thyristors (a) are tested, if the resistance of the thyristors (a) at the moment is measured to be infinite, the anodes and the control electrodes of the thyristors (a) are shorted by a shorting control circuit, and if the pointer of the universal meter is measured to deflect rightwards, the performance of the thyristors (a) is good; if the positive and negative resistance values between the anode and the cathode of the silicon controlled rectifier (a) are measured to be zero, the internal breakdown short circuit or electric leakage of the silicon controlled rectifier (a) is indicated;
and fourthly, after the test is finished, controlling the pressing seat (3) and the top seat (4) to be away from each other, controlling the pusher (22) to retract, and taking out the silicon controlled rectifier (a).
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| CN202310605119.0A CN116338412B (en) | 2023-05-26 | 2023-05-26 | Test method and device for silicon controlled rectifier |
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