CN116316039B - Method for testing ring laser - Google Patents
Method for testing ring laser Download PDFInfo
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- CN116316039B CN116316039B CN202310547128.9A CN202310547128A CN116316039B CN 116316039 B CN116316039 B CN 116316039B CN 202310547128 A CN202310547128 A CN 202310547128A CN 116316039 B CN116316039 B CN 116316039B
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/0014—Measuring characteristics or properties thereof
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/40—Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
- H01S5/4025—Array arrangements, e.g. constituted by discrete laser diodes or laser bar
- H01S5/4075—Beam steering
Abstract
The invention provides a testing method of a ring laser, which comprises a plurality of side rings, wherein each side ring is provided with a semiconductor laser, and the whole ring laser can be tested by switching through adjusting a reflection collecting device or the laser on a designated side ring of the ring laser can be tested. By using the testing method provided by the invention, on the premise of not replacing the testing device and not disassembling the ring laser, the whole light emitting parameter of the ring laser can be measured, the light emitting performance of the laser on each side ring can be measured in sequence, and the laser on the abnormal side ring can be found out and replaced in time. And moreover, a plurality of side rings of the ring laser do not need to be detached, the abnormal lasers are searched and confirmed one by one, the method is simple and convenient, and the whole module or the appointed side ring laser can be measured according to the requirement.
Description
Technical Field
The invention relates to the field of testing of semiconductor lasers, in particular to a testing method of a semiconductor ring laser.
Background
The conventional semiconductor ring laser consists of a plurality of side rings, as shown in fig. 1 of the specification, a four-side ring laser 1 is shown, a plurality of laser bars 3 can be arranged on each side ring 2, a gain medium crystal rod 4 is located on the central axis of the ring laser 1, and light emitted by the laser bars 3 on each side ring 2 side pumps the gain medium crystal rod 4.
As a pumping module, the luminescence line and the emergent light power are two of the most important parameters. The higher the matching degree between the emergent spectrum of the ring laser and the absorption spectrum of the gain medium, the higher the absorption efficiency of the gain medium to the pump light. The higher the output light power of the ring laser, the more pump light energy can be absorbed by the gain medium, so that the measurement of the light emission line and output power of the ring laser is crucial to further research on the light output performance of the solid laser.
For the ring laser, besides the light emitting performance of the whole module, the ring laser consists of polygonal rings, each side ring is provided with a semiconductor laser, and the working state of each laser influences the light emitting performance of the whole module. In the use process, when the laser on one or more side rings works abnormally to influence the light emitting parameters of the whole module, the light emitting parameters of the laser on each side ring are required to be tested, so that the laser with abnormal work is found out and replaced in time, and the light emitting performance of the solid laser is prevented from being influenced.
Therefore, it is highly desirable to provide a method that can test the overall light extraction parameters of the ring laser and the laser light extraction parameters on each edge ring.
Disclosure of Invention
The invention aims to provide a testing method of a ring laser, which can test the whole ring laser and also can test lasers on a designated side ring. The specific technical scheme is as follows.
A testing method of ring laser, the said ring laser includes a plurality of side rings, there are lasers on each side ring, through regulating the reflected collection device located in said ring laser, test the laser on the designated side ring of the ring laser;
the reflection collecting device comprises an intermediate body, wherein the intermediate body comprises an outer layer structure and an inner layer structure, and the outer layer structure and the inner layer structure are hollow members;
the outer layer structure is provided with a plurality of first light-passing holes at intervals around the central axis of the annular laser, and a reflecting part is arranged between two adjacent first light-passing holes;
the inner layer structure comprises a plurality of fins, each fin can expose or shade the first light through hole corresponding to the fin, and when a gap is formed between two adjacent fins, the gap forms a second light through hole;
the test method comprises the following steps:
the method comprises the steps of 1, adjusting the reflection collecting device to enable a first light-passing hole to avoid light beams emitted by the laser, and testing the whole annular laser;
and 2, adjusting the reflection collecting device to enable light beams emitted by the lasers on the appointed side ring to pass through the first light through hole and the second light through hole opposite to the light beams to enter the inner layer structure, and testing the lasers on the appointed side ring.
Further, the reflection collecting device further includes two light pipes, the two light pipes are respectively connected with two sides of the intermediate body, and the intermediate body and the two light pipes are coaxially arranged along a central axis of the ring laser, and the method 1 includes:
step 1.1, rotating an outer layer structure of a reflection collecting device to enable each first light-passing hole on the outer layer structure to be positioned between two lasers on side rings adjacent to the light-passing hole, wherein a plurality of reflection parts on the outer surface of the outer layer structure are used for carrying out diffuse reflection on light beams emitted by the lasers on each side ring;
step 1.2, rotating fins of an inner layer structure of the reflection collecting device to enable each fin of the inner layer structure to be hidden below the reflection part so as to expose the first light transmission hole;
step 1.3, connecting a light pipe of the reflection collecting device with a power testing device or a spectrum testing device through an optical fiber;
step 1.4, simultaneously electrifying lasers on all side rings of the ring laser, forming a first diffuse reflection space between the outer surface of the outer layer structure and the inner surface of the ring laser, reflecting light beams emitted by the lasers on each side ring in the first diffuse reflection space, and collecting the light beams by a reflection collecting device through a first light-passing hole of the outer layer structure and a second light-passing hole of the inner layer structure;
and 1.5, forming a second diffuse reflection space in the inner layer structure, reflecting the light beams collected through the first light through holes and the second light through holes to the light pipe in the second diffuse reflection space, transmitting the light beams to a spectrum testing device or a power testing device through optical fibers, and testing the overall spectrum curve or the power of the ring laser.
Further, in the step 1.1 and the step 1.2, the rotating reflection collecting device makes each first light-passing hole located at the middle of the lasers of the two side rings adjacent to the light-passing hole, and an included angle formed by the light-emitting center on the light-emitting cavity surface of the laser on each side ring and the connecting line of the two side edges of the reflecting part opposite to the light-emitting center is larger than the fast axis divergence angle of the laser.
Further, the method 2 comprises the steps of,
step 2.1, rotating the outer layer structure of the reflection collecting device to enable lasers on the appointed side ring to respectively face corresponding first light transmission holes on the outer layer structure;
and 2.2, exposing part of the first light through holes, and testing the lasers on the appointed edge ring.
Further, in the step 2.1, along the circumferential direction of the ring laser, an angle β formed by the two side edges of each first light-passing hole after rotation and a connecting line of the light emitting center on the light emitting cavity surface of the laser opposite to the two side edges is larger than the fast axis divergence angle of the laser.
Further, the reflection collecting device further comprises two light pipes, the two light pipes are respectively connected with two sides of the intermediate body, the intermediate body and the two light pipes are coaxially arranged along the central axis of the ring laser, the step 2.2 comprises,
2.2.1, keeping the fins which are anticlockwise adjacent to the lasers of the first appointed side ring hidden under the reflecting part of the outer layer structure, and exposing the first light through holes which are opposite to the lasers of the first appointed side ring;
step 2.2.2, rotating the fins which are adjacent to the lasers anticlockwise except the lasers of the first appointed side ring clockwise so as to shade a plurality of first light transmission holes of the outer layer structure which are opposite to the lasers except the first appointed side ring;
step 2.2.3, electrifying the laser of the first appointed side ring, and enabling the light beam emitted by the laser to enter the reflective collection device through a first light passing hole and a second light passing hole which are opposite to the laser on the reflective collection device, and reflecting in a second diffuse reflection space;
and 2.2.4, the light beams emitted by the lasers of the first designated side ring are collected by the light pipe after being reflected in the second diffuse reflection space, and are transmitted to the spectrum testing device or the power testing device through the optical fiber.
Further, the step 2.2 further comprises,
step 2.2.5, cutting off the power of the laser of the first appointed side ring after the test is finished, and rotating the fins which are anticlockwise adjacent to the first appointed side ring laser on the inner layer structure clockwise, so that the fins are screwed out to shield the first light transmission holes which are opposite to the first appointed side ring laser on the outer layer structure;
2.2.6, rotating the fin opposite to the second designated edge ring laser anticlockwise so as to expose a first light transmission hole opposite to the second designated edge ring laser, and measuring the light beam emitted by the second designated edge ring laser;
and 2.2.7, similar to the testing of the lasers on the first appointed side ring and the second appointed side ring, sequentially rotating the fins of the reflection collecting device, and testing the lasers from the third appointed side ring to the last appointed side ring to determine the lasers with abnormal work.
Further, in the test method, the reflection collection device can be rotated according to the identification limiting mechanism.
The invention provides a testing method of a ring laser through a set of testing device, namely the testing method provided by the invention can not only measure the integral light emitting parameter of the ring laser, but also measure the light emitting performance of a specified edge ring laser on the premise of not replacing the testing device and not disassembling the ring laser, thereby finding out the laser with abnormal work and replacing the laser in time. And moreover, a plurality of side rings of the ring laser do not need to be detached, the abnormal lasers are searched and confirmed one by one, the method is simple and convenient, and the whole module or the appointed side ring laser can be measured according to the requirement.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings that are needed in the description of the embodiments or the prior art will be briefly described, and it is obvious that the drawings in the description below are some embodiments of the present invention, and other drawings can be obtained according to the drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of an optical module according to an embodiment of the present invention;
fig. 2 is a cross-sectional view of the reflection-collection device 5 of the present embodiment along the central axis 13;
FIG. 3 is a diagram of a device for testing the whole laser in the fast axis direction of the laser by the reflection collecting device according to the embodiment;
fig. 4 and 5 are diagrams of the reflection collecting device according to the present embodiment, in which the designated edge ring is measured in the fast axis direction of the laser.
Icon: the laser comprises a ring laser 1, a side ring 3, a laser 4, a crystal rod 5, a reflection collecting device 6, an intermediate body 7, a light pipe 8, a truncated cone-shaped reflector 9, a reflecting part 10, a first light through hole 11, fins 12, a second light through hole 13 and a central axis.
Detailed Description
The technical solutions of the present invention will be clearly and completely described in connection with the embodiments, and it is apparent that the described embodiments are some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
The embodiment of the invention provides a method for testing a ring laser, which is carried out by using a testing system shown in fig. 2. The test system comprises a reflection collection means 5, an optical fiber and a power or spectrum test means.
The reflection and collection device 5 comprises an intermediate body 6 and two light pipes 7, the two light pipes 7 are respectively connected with two sides of the intermediate body 6, the intermediate body 6 and the two light pipes 7 are coaxially arranged along a central axis 13 of the annular laser, the intermediate body 6 comprises an outer layer structure and an inner layer structure, and the outer layer structure and the inner layer structure are hollow members. The outer layer structure is formed by splicing two identical round table-shaped diffuse reflectors 8 along the bottom surface thereof. On the outer surface of the outer layer structure of the intermediate body 6, a plurality of first light-passing holes 10 are provided at intervals around the central axis, and each first light-passing hole 10 extends from one truncated cone-shaped diffuse reflector to the other truncated cone-shaped diffuse reflector in the direction of the central axis of the ring laser 1. And on the outer layer structure, a reflecting part 9 is arranged between two adjacent first light transmission holes 10.
The inner layer structure includes a plurality of fins 11, each fin 11 being rotatable clockwise or counterclockwise along a central axis to expose or block the first light-passing hole 10 of the outer layer structure. When a gap is provided between two adjacent fins 11, the gap forms a second light passing hole 12; when each fin 11 of the inner layer structure is hidden under the reflecting portion 9 of the outer layer structure, all the first light-passing holes 10 of the outer layer structure are exposed, and light beams emitted by the semiconductor lasers on each side ring of the laser can pass through, so that the light beams emitted by the semiconductor lasers on each side ring of the laser are collected, and the total power or spectrum of the whole laser is tested. The inner layer structure can be opened by rotating the fins 11, so that the appointed first light-passing holes 10 on the outer layer structure are all blocked by the fins 11 of the inner layer structure, and therefore, the light beams emitted by the laser on the side ring opposite to the opened appointed first light-passing holes can be collected, and the power or the spectrum of the laser can be tested.
Preferably, the testing device provided in this embodiment further includes a mark limiting mechanism (not shown in the figure), and the outer layer structure and the inner layer structure of the intermediate body 6 can be rotated according to the mark limiting mechanism, so as to switch the system to test the whole ring laser or the designated edge ring laser.
In addition, the outer layer structure of the intermediate in this embodiment is not limited to a structure formed by splicing two identical round tables along the bottom surface thereof, the outer layer structure may also be a hollow member formed by spherical, conical or prismatic structures, a plurality of first light-passing holes are arranged on the outer layer structure at intervals, the inner layer structure is composed of a plurality of fins, and the outer surface of the intermediate outer layer structure and the inner surface of the fins of the inner layer structure can diffuse reflection the laser, so long as the collection of the laser emitted from each side ring can be realized.
In the following, a test system formed by two identical truncated cone-shaped diffuse reflectors is used as an example of an intermediate provided in this embodiment, and how to test the whole ring laser or a specified edge ring laser using the test system.
The method 1 is that the reflection collecting device 5 is regulated to enable the first light-transmitting hole 10 to avoid the light beam emitted by the laser, and the whole annular laser is tested.
The specific steps of method 1 are as follows.
Step 1.1, rotating an outer layer structure of the reflection collecting device 5 according to the mark limiting mechanism, so that each first light-passing hole 10 on the outer layer structure is positioned between lasers of two side rings adjacent to the light-passing hole, namely, the lasers 3 on the side rings 2 are respectively opposite to the reflection part 9 of the outer layer structure of the reflection collecting device 5, and are used for carrying out diffuse reflection on light beams emitted by the lasers 3 on each side ring 2;
step 1.2, rotating a plurality of fins 11 of an inner layer structure of the reflection collecting device 5 according to the mark limiting mechanism, so that each fin 11 of the inner layer structure is hidden under a reflection part 9 of an outer layer structure, and a first light through hole 10 is exposed, as shown in fig. 3;
step 1.3, connecting the light pipes 7 at two sides of the reflection collecting device 5 with a power testing device or a spectrum testing device through optical fibers;
step 1.4, simultaneously electrifying the lasers 3 on all the side rings 2 of the ring laser 1, forming a first diffuse reflection space between the outer surface of the outer layer structure of the reflection collecting device 5 and the inner surface of the ring laser, wherein the light beams emitted by the lasers 3 on each side ring 2 are reflected in the first diffuse reflection space and pass through the first light through holes 10 of the outer layer structure and the second light through holes 12 of the inner layer structure to be collected by the reflection collecting device 5;
and 1.5, forming a second diffuse reflection space in the inner layer structure of the reflection collecting device 5, reflecting the light beam to the light pipe 7 in the second diffuse reflection space, transmitting the light beam to a spectrum testing device or a power testing device through an optical fiber, and testing the whole spectrum curve or the power of the ring laser.
Preferably, during the test of the whole annular module, in order to enable the reflection and collection device 5 to uniformly collect the light beams emitted by the lasers on each side ring, the reflection and collection device is rotated to enable each first light-passing hole 10 to be located right between the lasers of two side rings adjacent to the light-passing hole, further, in order to avoid that the light beams emitted by the lasers 3 on each side ring on the fast axis directly enter the reflection and collection device 5 through the first light-passing holes 10 and the second light-passing holes 12, the accuracy and uniformity of the reflection and collection device 5 on the light emitted by the lasers on each side ring in the first diffuse reflection space are affected, and the included angle θ formed by the connection line between the light emitting center of the lasers 3 on the light emitting cavity surface of each side ring 2 and the two side edges of the reflecting portion 9 opposite to the light emitting center is larger than the divergence angle of the fast axis of the lasers, as shown in fig. 3.
In this embodiment, the overall parameters of the ring laser may be tested by the method 1, and the lasers on the designated edge ring of the ring laser may also be tested by the method 2, where the method 2 includes: and adjusting the reflection collecting device 5 to enable the light beams emitted by the lasers on the appointed side ring to pass through the first light through holes 10 and the second light through holes 12 opposite to the light beams to enter the inner layer structure, and testing the lasers on the appointed side ring.
The method 2 specifically comprises the following steps.
And 2.1, rotating the outer layer structure of the reflection and collection device 5 according to the identification limiting mechanism, so that the laser 3 on the laser appointed edge ring is opposite to the corresponding first light through hole 10 on the outer layer structure.
Preferably, after rotation, the angle β formed by the two edges of each first light-passing hole 10 and the connecting line of the light-emitting center on the opposite laser light-emitting cavity surface is larger than the fast axis divergence angle, as shown in fig. 4, so that the light emitted by the laser on each side ring in the fast axis direction can be more fully collected.
And 2.2, exposing part of the first light through holes, and testing the lasers on the appointed edge ring.
Step 2.2 specifically comprises the following steps.
Step 2.2.1, keeping the fins 11 of the inner layer structure adjacent to the lasers 3 of the first designated edge ring 2 anticlockwise hidden under the reflecting portions 9 of the outer layer structure to expose the first light-passing holes opposite to the lasers of the first designated edge ring, as shown in fig. 4;
step 2.2.2, rotating the fins 11 which are adjacent to the lasers anticlockwise except the lasers of the first appointed side ring clockwise through the identification limiting mechanism so as to shade a plurality of first light transmission holes 10 of the outer layer structure which are opposite to the lasers except the lasers of the first appointed side ring, as shown in fig. 5;
step 2.2.3, electrifying the laser of the first appointed side ring, and enabling the light beams emitted by the laser to enter the reflective collection device 5 through the outer layer first light through holes 10 and the inner layer second light through holes 12 which are opposite to the reflective collection device 5, and reflecting in the second diffuse reflection space;
and 2.2.4, reflecting the light beam emitted by the laser of the first designated side ring in a second diffuse reflection space, collecting the light beam by the light pipe 7, and transmitting the light beam to a spectrum testing device or a power testing device through an optical fiber.
In order to further determine which edge ring on the ring laser is abnormal, the following steps 2.2.5-2.2.7 may be further performed in step 2.2.
Step 2.2.5, the first appointed side ring laser which has finished the test is powered off, and the fins 11 which are anticlockwise adjacent to the first appointed side ring laser on the inner layer structure are rotated clockwise according to the identification limiting mechanism, so that the fins are screwed out to shield the first light through holes 10 which are opposite to the first appointed side ring laser on the outer layer structure;
step 2.2.6, performing anticlockwise rotation on the inner fin 11 opposite to the second designated edge ring laser according to the identification limiting mechanism so as to expose the first light through hole 10 opposite to the second designated edge ring laser, and measuring the light beam emitted by the second designated edge ring laser;
step 2.2.7, similar to the laser testing process on the first designated edge ring and the second designated edge ring, sequentially rotating the fins 11 of the reflection collecting device, and completing the test on the lasers from the third designated edge ring to the last designated edge ring to determine the lasers with abnormal work.
Through the set of test system that this embodiment provided, only through adjusting reflection collection device, both can measure ring laser's whole light-emitting parameter, can test the laser on each side ring again, avoided using two kinds of different test systems to measure ring laser's whole respectively to and every side ring laser respectively. The testing method provided by the invention can be used for sequentially measuring the light emitting performance of the lasers on each side ring on the premise of not disassembling the ring lasers, finding out the abnormal side ring lasers and replacing the lasers in time. The method avoids disassembling a plurality of side rings of the ring laser, searching and confirming the abnormal laser one by one, and reassembling the ring laser after replacing a new laser. Therefore, the testing method provided by the invention is simple and convenient, and can be used for measuring the whole module or the appointed edge ring laser according to the requirement.
Finally, it should be noted that: the above embodiments are only for illustrating the technical solution of the present invention, and not for limiting the same; although the invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some or all of the technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit of the invention.
Claims (8)
1. The method for testing the ring laser comprises a plurality of side rings, and each side ring is provided with a laser, and is characterized in that a reflection collecting device positioned in the ring laser is adjusted, the whole ring laser is tested by the method 1, and the laser on a designated side ring of the ring laser is tested by the method 2;
the reflection collecting device comprises an intermediate body, wherein the intermediate body comprises an outer layer structure and an inner layer structure, and the outer layer structure and the inner layer structure are hollow members;
the outer layer structure is provided with a plurality of first light-passing holes at intervals around the central axis of the annular laser, and a reflecting part is arranged between two adjacent first light-passing holes;
the inner layer structure comprises a plurality of fins, each fin can expose or shade the first light through hole corresponding to the fin, and when a gap is formed between two adjacent fins, the gap forms a second light through hole;
the outer surface of the outer layer structure diffusely reflects laser, and the inner surface of the fin diffusely reflects laser;
the reflection collecting device further comprises two light pipes, the two light pipes are respectively connected with two sides of the intermediate body, and the intermediate body and the two light pipes are coaxially arranged along the central axis of the ring laser;
the light pipe of the reflection collecting device is connected with the power testing device or the spectrum testing device through an optical fiber;
the test method comprises the following steps:
the method comprises the steps of 1, adjusting the reflection collecting device to enable a first light-passing hole to avoid light beams emitted by the laser, and enabling each fin to be hidden under the reflecting part so as to expose the first light-passing hole, and transmitting the first light-passing hole to the spectrum testing device or the power testing device through an optical fiber to test the whole annular laser;
and 2, adjusting the reflection collecting device to enable light beams emitted by the lasers on the appointed side ring to directly pass through the first light through hole and the second light through hole opposite to the light beams to enter the inner layer structure, and transmitting the light beams to the spectrum testing device or the power testing device through optical fibers to test the lasers on the appointed side ring.
2. A method of testing a ring laser as claimed in claim 1, wherein said method 1 comprises:
step 1.1, rotating an outer layer structure of a reflection collecting device to enable each first light-passing hole on the outer layer structure to be positioned between two lasers on side rings adjacent to the light-passing hole, wherein a plurality of reflection parts on the outer surface of the outer layer structure are used for carrying out diffuse reflection on light beams emitted by the lasers on each side ring;
step 1.2, rotating fins of an inner layer structure of the reflection collecting device to enable each fin of the inner layer structure to be hidden below the reflection part so as to expose the first light transmission hole;
step 1.3, connecting a light pipe of the reflection collecting device with a power testing device or a spectrum testing device through an optical fiber;
step 1.4, simultaneously electrifying lasers on all side rings of the ring laser, forming a first diffuse reflection space between the outer surface of the outer layer structure and the inner surface of the ring laser, reflecting light beams emitted by the lasers on each side ring in the first diffuse reflection space, and collecting the light beams by a reflection collecting device through a first light-passing hole of the outer layer structure and a second light-passing hole of the inner layer structure;
and 1.5, forming a second diffuse reflection space in the inner layer structure, reflecting the light beams collected through the first light through holes and the second light through holes to the light pipe in the second diffuse reflection space, transmitting the light beams to a spectrum testing device or a power testing device through optical fibers, and testing the overall spectrum curve or the power of the ring laser.
3. The method of claim 2, wherein in the step 1.1 and the step 1.2, the rotating reflection collecting device makes each first light-passing hole located at the middle of the two side rings adjacent to the light-passing hole, and an included angle formed by connecting the light emitting center of the light emitting cavity surface of the laser on each side ring with two opposite side edges of the reflecting portion is larger than a fast axis divergence angle of the laser.
4. A method for testing a ring laser as claimed in claim 1, wherein said method 2 comprises,
step 2.1, rotating the outer layer structure of the reflection collecting device to enable the laser on the appointed edge ring to face the corresponding first light-transmitting hole on the outer layer structure;
and 2.2, exposing the lasers on the appointed side ring to face the corresponding first light through holes on the outer layer structure, and testing the lasers on the appointed side ring.
5. The method of claim 4, wherein in step 2.1, an angle β formed by the two side edges of each first light-passing hole after rotation and a line connecting the light emitting center on the light emitting cavity surface of the laser opposite to the two side edges is larger than the fast axis divergence angle of the laser along the circumferential direction of the ring laser.
6. A method of testing a ring laser as claimed in claim 4, wherein step 2.2 comprises,
step 2.2.1, keeping the fins counterclockwise adjacent to the laser of the first designated edge ring hidden under the reflective portion of the outer layer structure;
step 2.2.2, rotating the fins which are adjacent to the lasers anticlockwise except the lasers of the first appointed side ring clockwise so as to shade a plurality of first light transmission holes of the outer layer structure which are opposite to the lasers except the first appointed side ring;
step 2.2.3, electrifying the laser of the first appointed side ring, and enabling the light beam emitted by the laser to enter the reflective collection device through a first light passing hole and a second light passing hole which are opposite to the laser on the reflective collection device, and reflecting in a second diffuse reflection space;
and 2.2.4, the light beams emitted by the lasers of the first designated side ring are collected by the light pipe after being reflected in the second diffuse reflection space, and are transmitted to the spectrum testing device or the power testing device through the optical fiber.
7. A method of testing a ring laser as in claim 6, wherein step 2.2 further comprises,
step 2.2.5, cutting off the power of the laser of the first appointed side ring after the test is finished, and rotating the fins which are anticlockwise adjacent to the first appointed side ring laser on the inner layer structure clockwise, so that the fins are screwed out to shield the first light transmission holes which are opposite to the first appointed side ring laser on the outer layer structure;
2.2.6, rotating the fin opposite to the second designated edge ring laser anticlockwise so as to expose the first light-passing hole opposite to the second designated edge ring laser, so that the light beam emitted by the second designated edge ring laser can pass through the first light-passing hole and the second light-passing hole opposite to the first light-passing hole and the second light-passing hole and be incident into the second diffuse reflection space, and measuring the light beam emitted by the second designated edge ring laser;
and 2.2.7, similar to the testing of the lasers on the first appointed side ring and the second appointed side ring, sequentially rotating the fins of the reflection collecting device, and testing the lasers from the third appointed side ring to the last appointed side ring to determine the lasers with abnormal work.
8. A method of testing a ring laser as claimed in any one of claims 1 to 7, wherein the reflective collection means is rotated in response to the mark limiting means.
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Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005318456A (en) * | 2004-04-30 | 2005-11-10 | Yamaha Corp | Optical microphone |
| CN101740999A (en) * | 2009-12-11 | 2010-06-16 | 广州安特激光技术有限公司 | Diode pumping ceramic cavity |
| JP2012068120A (en) * | 2010-09-24 | 2012-04-05 | Denso Wave Inc | Laser radar device |
| CN102581700A (en) * | 2012-02-28 | 2012-07-18 | 上海大学 | Online automatic detecting device for rotary tool fused with video and laser |
| CN104102087A (en) * | 2014-08-08 | 2014-10-15 | 深圳市世尊科技有限公司 | Testing device for micro voice coil motor |
| WO2019108766A1 (en) * | 2017-11-29 | 2019-06-06 | Vixar Inc. | Power monitoring approach for vcsels and vcsel arrays |
| CN115831429A (en) * | 2022-11-03 | 2023-03-21 | 中国科学院上海光学精密机械研究所 | Diffuse reflection device for pre-cooling magneto-optical trap and laser cooling method |
-
2023
- 2023-05-16 CN CN202310547128.9A patent/CN116316039B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005318456A (en) * | 2004-04-30 | 2005-11-10 | Yamaha Corp | Optical microphone |
| CN101740999A (en) * | 2009-12-11 | 2010-06-16 | 广州安特激光技术有限公司 | Diode pumping ceramic cavity |
| JP2012068120A (en) * | 2010-09-24 | 2012-04-05 | Denso Wave Inc | Laser radar device |
| CN102581700A (en) * | 2012-02-28 | 2012-07-18 | 上海大学 | Online automatic detecting device for rotary tool fused with video and laser |
| CN104102087A (en) * | 2014-08-08 | 2014-10-15 | 深圳市世尊科技有限公司 | Testing device for micro voice coil motor |
| WO2019108766A1 (en) * | 2017-11-29 | 2019-06-06 | Vixar Inc. | Power monitoring approach for vcsels and vcsel arrays |
| CN115831429A (en) * | 2022-11-03 | 2023-03-21 | 中国科学院上海光学精密机械研究所 | Diffuse reflection device for pre-cooling magneto-optical trap and laser cooling method |
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