CN116312682B - Eye pattern center determining method and device, electronic equipment and storage medium - Google Patents

Eye pattern center determining method and device, electronic equipment and storage medium Download PDF

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CN116312682B
CN116312682B CN202310561904.0A CN202310561904A CN116312682B CN 116312682 B CN116312682 B CN 116312682B CN 202310561904 A CN202310561904 A CN 202310561904A CN 116312682 B CN116312682 B CN 116312682B
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eye
center
calibration
target
eye pattern
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CN116312682A (en
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易雨农
柳阳
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Niuxin Semiconductor Shenzhen Co ltd
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Niuxin Semiconductor Shenzhen Co ltd
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    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/4072Circuits for initialization, powering up or down, clearing memory or presetting
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/409Read-write [R-W] circuits 
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/44Indication or identification of errors, e.g. for repair
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/52Protection of memory contents; Detection of errors in memory contents

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  • Computer Hardware Design (AREA)
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Abstract

The application discloses a method and a device for determining an eye pattern center, electronic equipment and a storage medium, wherein the method comprises the following steps: acquiring adjacent reference eye patterns before the current moment; the reference eye diagram is obtained after DQS-DQ phase calibration; determining a calibration point corresponding to the right boundary of the reference eye pattern based on the reference eye pattern; calibrating the DQS-DQ phase from the calibration point to obtain a target eye diagram corresponding to the current moment; the center of the target eye pattern is determined based on an offset relationship between the target eye pattern and the reference eye pattern. By using the right boundary of the reference eye diagram as the calibration point to start calibrating the writing DQS-DQ phase, the method and the device can greatly reduce the calibration time length.

Description

Eye pattern center determining method and device, electronic equipment and storage medium
Technical Field
The present disclosure relates to the field of communications technologies, and in particular, to a method and apparatus for determining an eye center, an electronic device, and a storage medium.
Background
The memory is a semiconductor pillar industry, and SDRAM (synchronous dynamic random access memory) is a product with the largest camping rate among memory subdivision products. In the application scenario of SDRAM, DQS (bidirectional data filtering) phase delay technology is an important technical point, and needs to initialize and periodically calibrate the write DQS-DQ phase to compensate the influence of environmental changes such as temperature and voltage on the write DQS-DQ phase, so as to ensure that DQS is in the center of an effective data window and ensure the stability and accuracy of data reading.
The current DQS-DQ phase calibration scheme is based on a mode register for reading and writing comparison so as to finish the DQS-DQ delay calibration adjustment, the delay unit for writing DQS-DQ is cleared in the calibration process, then the delay is gradually increased to scan to obtain the whole writing eye pattern and relocate the whole writing eye pattern to the eye pattern center, during which the host computer needs to pause the reading and writing access to the SDRAM, so that the whole calibration time is long, and the reading and writing performance is reduced.
Disclosure of Invention
To solve the above technical problems, embodiments of the present application provide a method and apparatus for determining an eye center, an electronic device, a computer readable storage medium, and a computer program product.
According to an aspect of an embodiment of the present application, there is provided a method for determining an eye center, including: acquiring adjacent reference eye patterns before the current moment; the reference eye diagram is obtained after DQS-DQ phase calibration; determining a calibration point corresponding to the right boundary of the reference eye pattern based on the reference eye pattern; calibrating the DQS-DQ phase from the calibration point to obtain a target eye diagram corresponding to the current moment; a center of the target eye pattern is determined based on an offset relationship between the target eye pattern and the reference eye pattern.
According to an aspect of an embodiment of the present application, there is provided an apparatus for determining an eye center, including: the acquisition unit is used for acquiring the adjacent reference eye patterns before the current moment; the reference eye diagram is obtained after DQS-DQ phase calibration; a preprocessing unit, configured to determine a calibration point corresponding to a right boundary of the reference eye pattern based on the reference eye pattern; the calibration unit is used for calibrating the DQS-DQ phase from the calibration point to obtain a target eye diagram corresponding to the current moment; and the processing unit is used for determining the center of the target eye diagram based on the offset relation between the target eye diagram and the reference eye diagram.
In another exemplary embodiment, the determining the center of the target eye pattern based on the offset relationship between the target eye pattern and the reference eye pattern includes: detecting an offset relationship between a calibration point corresponding to the right boundary of the reference eye pattern and the right boundary of the target eye pattern; if the right boundary of the target eye diagram is detected to be on the right side of the calibration point, determining that right shift calibration occurs, and obtaining the center of the target eye diagram based on the position information corresponding to the center of the reference eye diagram and the right shift offset corresponding to the right shift calibration; if the right boundary of the target eye diagram is detected to be at the left side of the calibration point, determining that left shift calibration occurs, and obtaining the center of the target eye diagram based on the position information corresponding to the center of the reference eye diagram and the left shift offset corresponding to the left shift calibration.
In another exemplary embodiment, the position information corresponding to the center of the reference eye pattern includes an abscissa and an ordinate; the obtaining the center of the target eye pattern based on the position information corresponding to the center of the reference eye pattern and the right shift offset corresponding to the right shift calibration includes: summing the abscissa corresponding to the center of the reference eye pattern and the right shift offset to obtain the abscissa corresponding to the center of the target eye pattern; and taking the ordinate corresponding to the center of the reference eye diagram as the ordinate corresponding to the center of the target eye diagram.
In another exemplary embodiment, the position information corresponding to the center of the reference eye pattern includes an abscissa and an ordinate; the obtaining the center of the target eye pattern based on the position information corresponding to the center of the reference eye pattern and the left shift offset corresponding to the left shift calibration includes: performing difference operation on the abscissa corresponding to the center of the reference eye pattern and the left shift offset to obtain the abscissa corresponding to the center of the target eye pattern; and taking the ordinate corresponding to the center of the reference eye diagram as the ordinate corresponding to the center of the target eye diagram.
In another exemplary embodiment, the calibrating the write DQS-DQ phase from the calibration point to obtain the target eye diagram corresponding to the current time includes: estimating an offset value generated by the influence of the environment on the right boundary of the reference eye diagram to obtain an estimated offset value; performing compensation processing for the calibration duration on the right boundary of the reference eye diagram based on the estimated offset value to obtain a compensated right boundary; and calibrating the DQS-DQ phase from the calibration point corresponding to the compensated right boundary to obtain a target eye diagram corresponding to the current moment.
In another exemplary embodiment, after the determining the center of the target eye pattern based on the offset relationship between the target eye pattern and the reference eye pattern, the method further comprises: if the consistency of writing and reading aiming at the target eye diagram is detected, storing the target eye diagram into a designated storage area; if the write-read inconsistency for the target eye diagram is detected but the calibration is not abnormal, the target eye diagram is stored in a designated storage area.
In another exemplary embodiment, the method further comprises: if the write-read inconsistency aiming at the target eye diagram is detected, acquiring a right boundary and a center corresponding to the target eye diagram; performing eye width inspection on the target eye pattern based on the right boundary and the center corresponding to the target eye pattern to obtain an eye width inspection result; if the eye width check result indicates that the eye width of the target eye diagram is larger than a preset eye width threshold value, a detection result used for indicating that calibration is not abnormal is obtained; and if the eye width check result indicates that the eye width of the target eye diagram is smaller than or equal to the preset eye width threshold value and the right boundary of the target eye diagram is detected not to exceed the preset boundary threshold value, a detection result used for indicating that calibration is not abnormal is obtained.
According to one aspect of an embodiment of the present application, an electronic device includes: one or more processors; and a storage device for storing one or more programs which, when executed by the one or more processors, cause the electronic device to implement the method of eye center determination as described previously.
According to one aspect of embodiments of the present application, a computer-readable storage medium has stored thereon computer-readable instructions, which when executed by a processor of a computer, cause the computer to perform a method of determining an eye center as described above.
According to an aspect of embodiments of the present application, there is provided a computer program product or computer program comprising computer instructions stored in a computer readable storage medium. The processor of the computer device reads the computer instructions from the computer-readable storage medium, and the processor executes the computer instructions, so that the computer device performs the method of determining the center of an eye pattern provided in the above-described various alternative embodiments.
In the technical scheme provided by the embodiment of the application, the calibration point corresponding to the right boundary of the reference eye pattern is determined through the acquired reference eye patterns adjacent to the current moment; the reference eye diagram is obtained after DQS-DQ phase calibration, and the DQS-DQ phase calibration is carried out based on the determined calibration point, so that the scanning identification of the whole diagram of the target eye diagram can be avoided, and the calibration time length is greatly reduced; after the calibration point is determined, calibrating the DQS-DQ phase from the calibration point to obtain a target eye diagram corresponding to the current moment; and determining the center of the target eye diagram based on the offset relation between the target eye diagram and the reference eye diagram so as to finish the DQS-DQ phase calibration in a short time, and shortening the time for suspending the read-write access to the memory by reducing the calibration time length, thereby improving the read-write performance of the applied memory.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the application.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the application and together with the description, serve to explain the principles of the application. It is apparent that the drawings in the following description are only some embodiments of the present application, and that other drawings may be obtained from these drawings without inventive effort for a person of ordinary skill in the art.
Fig. 1 is a schematic diagram of an implementation environment to which the present application relates.
Fig. 2 is a flow chart illustrating a method of determining an eye center according to an exemplary embodiment of the present application.
Fig. 3 is a flow chart of step S204 in the embodiment shown in fig. 2 in an exemplary embodiment.
Fig. 4 is a flow chart of step S302 in the embodiment shown in fig. 3 in an exemplary embodiment.
Fig. 5 is a flow chart of step S303 in the embodiment shown in fig. 3 in an exemplary embodiment.
Fig. 6 is a flow chart of step S203 in the embodiment shown in fig. 2 in an exemplary embodiment.
FIG. 7 is a schematic diagram illustrating the initiation of calibration of the write DQS-DQ phase after compensation processing for the calibration point, according to an exemplary embodiment of the present application.
Fig. 8 is a flowchart of the steps following step S204 in the embodiment shown in fig. 2 in an exemplary embodiment.
FIG. 9 is a flow chart of steps in an exemplary embodiment after detecting a write-read inconsistency for a target eye pattern in the embodiment of FIG. 8.
FIG. 10 is a diagram illustrating the detection of the right boundary of the target eye exceeding a preset boundary threshold in the calibration of the write DQS-DQ phase according to an exemplary embodiment of the present application.
FIG. 11 is a flow chart illustrating a method of determining application eye centers for cyclic write DQS-DQ phase calibration as shown in one exemplary embodiment of the present application.
Fig. 12 is a block diagram of an eye center determination apparatus according to an exemplary embodiment of the present application.
Fig. 13 is a schematic diagram of a computer system suitable for use in implementing embodiments of the present application.
Detailed Description
Reference will now be made in detail to exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, the same numbers in different drawings refer to the same or similar elements, unless otherwise indicated. The implementations described in the following exemplary examples are not representative of all implementations consistent with the present application. Rather, they are merely examples of apparatus and methods consistent with some aspects of the present application as detailed in the accompanying claims.
The block diagrams depicted in the figures are merely functional entities and do not necessarily correspond to physically separate entities. That is, the functional entities may be implemented in software, or in one or more hardware modules or integrated circuits, or in different networks and/or processor devices and/or microcontroller devices.
The flow diagrams depicted in the figures are exemplary only, and do not necessarily include all of the elements and operations/steps, nor must they be performed in the order described. For example, some operations/steps may be decomposed, and some operations/steps may be combined or partially combined, so that the order of actual execution may be changed according to actual situations.
Reference to "a plurality" in this application means two or more than two. "and/or" describes an association relationship of an association object, meaning that there may be three relationships, e.g., a and/or B may represent: a exists alone, A and B exist together, and B exists alone. The character "/" generally indicates that the context-dependent object is an "or" relationship.
In the related art, a memory is a semiconductor pillar industry, and SDRAM (synchronous dynamic random access memory) is a product with the largest camping rate among memory subdivision products. In the application scenario of SDRAM, DQS (bidirectional data filtering) phase delay technology is an important technical point on DDR (double datarate SDRAM, which belongs to one branch in SDRAM), and needs to initialize and periodically calibrate the write DQS-DQ phase to compensate the influence of environmental changes such as temperature and voltage on the write DQS-DQ phase, so as to ensure that DQS is in the center of an effective data window and ensure the stability and accuracy of data reading.
The common DQS-DQ phase calibration scheme is that read-write comparison is performed based on a mode register to finish the DQS-DQ delay calibration adjustment, the delay unit for writing DQS-DQ is cleared in the calibration process, then the delay is gradually increased to scan to obtain the whole write eye pattern to be relocated to the eye pattern center, and the host computer is required to pause the read-write access to the SDRAM during the period, so that the whole calibration time is long, and the whole read-write performance is reduced.
The eye diagram is actually a display of a series of different binary codes of a digital signal accumulated on an oscilloscope screen according to a certain rule, and in short, since the oscilloscope has an afterglow function, all captured waveforms are accumulated according to the superposition of every three bits respectively, so that the eye diagram is formed. The eye diagram contains abundant information, can embody the integral characteristics of the digital signal, and usually has common measurement indexes such as eye height, eye width, jitter, duty ratio and the like when the eye diagram is evaluated well and poorly, and the problem of signal can be rapidly judged and qualitatively determined through characterization of different parts of the eye.
In order to solve the above problems, embodiments of the present application provide a method and apparatus for determining an eye center, an electronic device, and a computer readable storage medium, which mainly relate to a write DQS-DQ phase calibration technology included in a communication technology, and these embodiments will be described in detail below.
Referring first to fig. 1, fig. 1 is a schematic diagram of an implementation environment according to the present application. The implementation environment includes a terminal 101 and a storage device 102, where the terminal 101 and the storage device 102 communicate over a wired or wireless network.
Terminal 101 acquires, from storage device 102, the reference eye diagrams adjacent to the current time through the register; the reference eye diagram is obtained after DQS-DQ phase calibration; determining a calibration point corresponding to the right boundary of the reference eye pattern based on the reference eye pattern; calibrating the DQS-DQ phase from the calibration point to obtain a target eye diagram corresponding to the current moment; the center of the target eye pattern is determined based on the offset relationship between the target eye pattern and the reference eye pattern, and the resulting target eye pattern is transferred to the memory device 102 for storage. Compared with the determination scheme of the eye pattern center in the prior art, the determination method of the eye pattern center provided by the implementation environment can greatly reduce the calibration time length and improve the read-write performance of data.
It should be noted that, the memory device 102 in the implementation environment shown in fig. 1 may be a synchronous dynamic random access memory SDRAM, and the register of the terminal 101 is a mode register in an application scenario of the SDRAM, and the writing DQS-DQ phase calibration is performed based on the mode register.
Fig. 2 is a flow chart illustrating a method of determining an eye center according to an exemplary embodiment of the present application. The method may be applied to the implementation environment shown in fig. 1 and is specifically performed by the terminal 101 in the embodiment environment shown in fig. 1. In other embodiments, the method may be performed by a device in other embodiments, which is not limited by the present embodiment.
As shown in fig. 2, in an exemplary embodiment, the method for determining the center of the eye pattern may include steps S201 to S204, which are described in detail as follows:
step S201, acquiring adjacent reference eye patterns before the current moment; wherein the reference eye diagram is obtained after DQS-DQ phase calibration.
The reference eye is characterized as a calibrated eye for the current time, after which the calibration of the write DQS-DQ phase was last performed. Because the temperature, the voltage and other environmental changes affect the writing DQS-DQ phase, writing DQS-DQ phase deviation can affect the eye diagram center point and the eye diagram right boundary at the same time, and the corresponding eye diagram is shifted, so that the eye diagram after the current time shifting is obtained based on the shift of the reference eye diagram obtained by the last calibration.
Step S202, determining a calibration point corresponding to the right boundary of the reference eye pattern based on the reference eye pattern.
The corresponding calibration point is determined based on the reference eye pattern to calibrate the writing DQS-DQ phase, specifically, because whether the corresponding position is the right boundary of the eye pattern can be determined through the writing and reading result obtained by writing the DQS-DQ, in the embodiment provided by the application, the right boundary of the reference eye pattern is used as the calibration point corresponding to the calibration of the writing DQS-DQ phase.
And step S203, calibrating the DQS-DQ phase from the calibration point to obtain a target eye diagram corresponding to the current moment.
The process of writing DQS-DQ phase calibration processing from the calibration point of the reference eye diagram to obtain the target eye diagram at the current moment, wherein the calibration point corresponds to the right boundary of the reference eye diagram, so that the process of obtaining the target eye diagram by calibrating the DQS-DQ phase from the calibration point is concretely represented by writing DQS-DQ phase calibration based on the right boundary of the reference eye diagram, and the right boundary after calibration is obtained as the right boundary of the target eye diagram, thereby avoiding scanning and identifying the whole diagram of the target eye diagram and greatly reducing the calibration time length.
Step S204, the center of the target eye diagram is determined based on the offset relation between the target eye diagram and the reference eye diagram.
The eye pattern determining method provided by the embodiment of the application is implemented after the temperature, the voltage and other environmental changes affect the writing DQS-DQ phase, namely, the target eye pattern obtained through the writing DQS-DQ phase calibration is formed by shifting after the reference eye pattern is affected, so that the shifting relation between expiration and the reference eye pattern paper can be obtained after the target eye pattern is obtained, and the center of the target eye pattern is obtained based on the shifting relation after the right boundary of the calibrated target eye pattern is obtained, so that the complete target eye pattern is obtained.
As can be seen from the above, in the method provided in the present embodiment, the calibration point corresponding to the right boundary of the reference eye pattern is determined by the acquired reference eye pattern adjacent before the current time; after the calibration point is determined, calibrating the DQS-DQ phase from the calibration point to obtain a target eye diagram corresponding to the current moment; DQS-DQ phase calibration is carried out based on the determined calibration points, so that scanning identification of the whole diagram of the target eye diagram can be avoided, and the calibration time length is greatly reduced; and finally, based on the offset relation between the target eye diagram and the reference eye diagram, determining the center of the target eye diagram so as to finish the DQS-DQ phase calibration in a short time to obtain a complete target eye diagram, and shortening the time for suspending the read-write access to the memory by reducing the calibration time length, thereby improving the read-write performance of the memory applied by the terminal.
Referring to fig. 3, fig. 3 is a flowchart of step S204 in the embodiment shown in fig. 2 in an exemplary embodiment. As shown in fig. 3, step S204 may specifically include steps S301 to S303, where the center of the target eye pattern is determined through the above steps, which are described in detail as follows:
in step S301, an offset relationship between the calibration point corresponding to the right boundary of the reference eye pattern and the right boundary of the target eye pattern is detected.
The right boundary of the target eye diagram is formed by shifting the calibration points corresponding to the right boundary of the reference eye diagram after being influenced by the environment, so that the shifting of the right boundary of the target eye diagram compared with the calibration points corresponding to the right boundary of the reference eye diagram also represents the cheapness of the target eye diagram compared with the reference eye diagram. Therefore, in order to determine the center of the target eye, it is first necessary to detect the offset relationship between the calibration point corresponding to the right boundary of the reference eye and the right boundary of the target eye, that is, to obtain the offset relationship between the target eye and the reference eye.
In step S302, if it is detected that the right boundary of the target eye is on the right side of the calibration point, it is determined that the right shift calibration has occurred, and the center of the target eye is obtained based on the position information corresponding to the center of the reference eye and the right shift offset corresponding to the right shift calibration.
The right boundary of the target eye pattern may be shifted to the right or left with respect to the calibration point, and if the right boundary of the target eye pattern is detected to be on the right side of the calibration point, it is determined that the right shift calibration has occurred, that is, the target eye pattern is shifted to the right with respect to the reference eye pattern through the right shift calibration. After the offset direction is determined, position information corresponding to the center of the reference eye pattern and offset corresponding to right shift calibration are acquired to obtain the center of the target eye pattern, and if the target eye pattern is shifted to the right compared with the reference eye pattern, the center of the target eye pattern is obtained based on the right shift offset.
In another exemplary embodiment of the present application, the position information corresponding to the center of the reference eye pattern includes an abscissa and an ordinate, and the eye pattern is a statistical distribution pattern formed by naturally overlapping data of different positions of the high-speed digital signal according to the clock interval, so that the abscissa included in the position information corresponding to the center of the quasi-eye pattern represents the energy intensity of the signal, the ordinate represents the time information corresponding to the clock, and the offset of the reference eye pattern caused by the environmental influence is the offset in the abscissa direction. Referring to fig. 4, fig. 4 is a flow chart of step S302 in an exemplary embodiment in the embodiment shown in fig. 3. As shown in fig. 4, step S302 may specifically include steps S401 to S402, where the center of the right-shift calibrated target eye is determined through the above steps, which is described in detail below:
S401, summing the abscissa corresponding to the center of the reference eye pattern and the right shift offset to obtain the abscissa corresponding to the center of the target eye pattern.
After right shift calibration is determined, the offset between the calibration point corresponding to the right boundary of the reference eye pattern and the right boundary of the target eye pattern is obtained and used as the right shift offset, and then the abscissa corresponding to the center of the reference eye pattern and the right shift offset are summed, that is, the center of the reference eye pattern is calibrated to the right based on the right shift offset, so that the abscissa corresponding to the center of the target eye pattern is obtained.
And S402, taking the ordinate corresponding to the center of the reference eye diagram as the ordinate corresponding to the center of the target eye diagram.
The reference eye pattern is offset in the abscissa direction due to the influence of the environment, so that the corresponding ordinate after the eye pattern offset is unchanged, and after the abscissa corresponding to the center of the target eye pattern is obtained, the ordinate corresponding to the center of the reference eye pattern is taken as the ordinate corresponding to the center of the target eye pattern, so that the center of the target eye pattern is obtained, and the complete target eye pattern is formed with the right boundary obtained by writing DQS-DQ phases based on the calibration points.
In step S303, if it is detected that the right boundary of the target eye is at the left side of the calibration point, it is determined that the left shift calibration has occurred, and the center of the target eye is obtained based on the position information corresponding to the center of the reference eye and the left shift offset corresponding to the left shift calibration.
The right boundary of the target eye pattern may be shifted to the right or left compared to the calibration point, and if the right boundary of the target eye pattern is detected to be on the left side of the calibration point, it is determined that the left shift calibration has occurred, that is, the target eye pattern is shifted to the left compared to the reference eye pattern through the left shift calibration. After the offset direction is determined, position information corresponding to the center of the reference eye pattern and offset corresponding to left shift calibration are acquired to obtain the center of the target eye pattern, and if the target eye pattern is offset to the left compared with the reference eye pattern, the center of the target eye pattern is obtained based on the left shift offset.
In another embodiment, referring to fig. 5, fig. 5 is a flowchart of step S303 in the embodiment shown in fig. 3 in an exemplary embodiment. As shown in fig. 5, step S303 may specifically include steps S501 to S502, where the center of the left-shift calibrated target eye diagram is determined through the above steps, which is described in detail below:
s501, performing difference operation on the abscissa corresponding to the center of the reference eye pattern and the left shift offset to obtain the abscissa corresponding to the center of the target eye pattern.
After the left shift calibration is determined, the offset between the calibration point corresponding to the right boundary of the reference eye pattern and the right boundary of the target eye pattern is obtained and used as the left shift offset, and then the abscissa corresponding to the center of the reference eye pattern and the right shift offset are subjected to difference operation, namely, the center of the reference eye pattern is calibrated to the left based on the left shift offset, so that the abscissa corresponding to the center of the target eye pattern is obtained.
And S502, taking the ordinate corresponding to the center of the reference eye diagram as the ordinate corresponding to the center of the target eye diagram.
The reference eye pattern is offset in the abscissa direction due to the influence of the environment, so that the corresponding ordinate after the eye pattern offset is unchanged, and after the abscissa corresponding to the center of the target eye pattern is obtained, the ordinate corresponding to the center of the reference eye pattern is taken as the ordinate corresponding to the center of the target eye pattern, so that the center of the target eye pattern is obtained, and the complete target eye pattern is formed with the right boundary obtained by writing DQS-DQ phases based on the calibration points.
Therefore, according to the above embodiment, the center of the target eye diagram is determined according to the offset relationship between the calibration point corresponding to the right boundary of the reference eye diagram and the right boundary of the target eye diagram, so that the whole diagram of the target eye diagram can be prevented from being scanned and identified, and the calibration time length is greatly reduced.
In the method for determining the center of the eye diagram provided by the embodiment of the application, after the calibration point corresponding to the right boundary of the reference eye diagram is determined, the calibration point is compensated by adopting the estimated offset value, that is, the distance between the calibration point and the right boundary of the target eye diagram is compensated, so that the time from the calibration point to the right boundary is further reduced, and the calibration time is further shortened. Referring to fig. 6, fig. 6 is a flowchart of step S203 in the embodiment shown in fig. 2 in an exemplary embodiment. As shown in fig. 6, step S203 may specifically include steps S601 to S603, by which calibration of the write DQS-DQ phase is started after the compensation process for the calibration point, which is described in detail below:
In step S601, an offset value generated by the influence of the environment on the right boundary of the reference eye is estimated, so as to obtain an estimated offset value.
Environmental information which can influence the DQS-DQ phase writing in a time period from the moment of obtaining the reference eye diagram to the current moment is obtained, DQS-DQ phase calibration is simulated based on the environmental information, and an estimated target eye diagram is obtained, so that an offset value between the right boundary of the reference eye diagram, which is influenced by the environment, and the estimated target eye diagram can be obtained, and the estimated offset value is obtained.
Step S602, performing compensation processing for the calibration duration on the right boundary of the reference eye diagram based on the estimated offset value to obtain a compensated right boundary.
The compensation process specifically refers to estimating an offset value generated by the influence of the environment on the right boundary of the reference eye to obtain an estimated offset value, estimating an offset calibration direction, and then performing the compensation process of estimating the offset calibration direction on the right boundary of the reference eye based on the estimated offset value to obtain a compensated right boundary. The distance between the right boundary after compensation and the right boundary of the estimated target eye diagram in the direction of the abscissa system is smaller than the distance between the right boundary of the estimated target eye diagram in the right boundary of the reference eye diagram before compensation in the direction of the abscissa system, and the process of writing DQS-DQ phase for calibration is to gradually increase delay to complete writing and reading, and the corresponding calibration time length is shortened due to the shortening of the distance.
And step S603, starting to calibrate the writing DQS-DQ phase from the calibration point corresponding to the compensated right boundary, and obtaining a target eye diagram corresponding to the current moment.
The process of correcting the writing DQS-DQ phase from the corrected point corresponding to the corrected right boundary to obtain the target eye diagram at the current moment is specifically performed in the embodiment, namely, correcting the writing DQS-DQ phase based on the corrected right boundary to obtain the corrected right boundary serving as the right boundary of the target eye diagram, so that the scanning identification of the whole diagram of the target eye diagram can be avoided, and the correcting time is further greatly reduced.
As shown in FIG. 7, FIG. 7 is a schematic diagram illustrating the beginning of calibration of the write DQS-DQ phase after compensation processing for the calibration point in accordance with an exemplary embodiment of the present application. N is represented as a calibration point corresponding to the right boundary of the reference eye, offset is represented as a pre-estimated offset value, so n-offset is represented as a compensated right boundary, updated_right_edge is represented as a right boundary of the target eye corresponding to the current moment after the DQS-DQ phase is calibrated from the calibration point, and updated_center_delay is represented as determining the center of the target eye based on the offset relation between the target eye and the reference eye.
It should be noted that, the estimated offset value offset may be a positive value or a negative value, and if the estimated offset value offset is a positive value, it indicates that the reference eye pattern is offset to the left due to environmental influence; if negative, it is indicated that the reference eye pattern is shifted to the right by the environmental influence, and the specific limitation is not made here.
According to the embodiment, the reference point is compensated through the estimated offset value, and the distance between the right boundary of the compensated reference point and the right boundary of the estimated target eye is smaller than the distance between the right boundary of the estimated target eye and the right boundary of the estimated target eye, so that the calibration time can be further shortened.
In the method for determining the eye pattern center provided by the embodiment of the application, the writing DQS-DQ phase is calibrated from the calibration point, namely, the writing and reading result is obtained by gradually increasing the writing DQS-DQ delay from the calibration point, wherein the writing and reading result of each time of increasing the writing DQS-DQ delay corresponds to a right boundary, but whether the corresponding right boundary can be used as the calibration point of the next writing DQS-DQ phase calibration or not is further judged through the writing and reading result, namely, whether the writing DQS-DQ phase calibration at the current moment is successful or not is judged. Referring to fig. 8, fig. 8 is a flow chart of steps following step S204 in the embodiment shown in fig. 2 in an exemplary embodiment. As shown in fig. 8, it may specifically include steps S801 to S802, by which it is determined whether the DQS-DQ phase calibration is successful or not by the write-read processing result, which is described in detail below:
In step S801, if the coincidence of writing and reading with respect to the target eye pattern is detected, the target eye pattern is stored in the designated storage area.
And detecting that the writing and reading of the target eye diagram are consistent, and indicating that the writing DQS-DQ delay is increased at the time of correcting the writing DQS-DQ phase and does not correspond to the right boundary of the eye diagram after the reference eye diagram is deviated by the environmental influence, and continuously increasing the writing DQS-DQ delay to correct the writing DQS-DQ phase until the writing DQS-DQ phase reaches the right boundary of the eye diagram after the reference eye diagram is deviated by the environmental influence so as to finish the writing DQS-DQ phase correction. And for the purpose of reducing the calibration duration of the present application, the present embodiment stores the target eye pattern with consistent writing and reading into the designated memory area as the initial value of the next increment of the write DQS-DQ delay.
In the process of detecting whether the writing and reading for the target eye pattern are consistent, the detected target eye pattern is the right boundary of the target eye pattern, which is obtained by calibrating the writing DQS-DQ phase from the calibration point in step S203 in the embodiment shown in fig. 2.
In step S802, if it is detected that the writing and reading for the target eye pattern are inconsistent but the calibration is not abnormal, the target eye pattern is stored in the designated storage area.
And detecting that the writing and reading of the target eye diagram are inconsistent but the calibration is not abnormal, and indicating that the right boundary of the eye diagram after the deviation of the reference eye diagram due to the environmental influence is successfully corresponding to the increasing writing DQS-DQ delay of the writing DQS-DQ phase after the calibration is performed, and storing the target eye diagram to serve as the reference eye diagram for the next writing DQS-DQ phase calibration.
Correspondingly, if the write-read inconsistency of the target eye diagram is detected but the calibration is abnormal, the right boundary corresponding to the write-read result of increasing the write DQS-DQ delay is indicated to be abnormal, the write DQS-DQ phase calibration is ended, and the right boundary corresponding to the write-read result cannot be used as the calibration point at the next moment.
In this embodiment, whether the right boundary corresponding to the target eye pattern can be used as the calibration point for the next DQS-DQ phase calibration is determined according to the writing and reading results, that is, whether the DQS-DQ phase calibration is successful at the current moment is determined.
Referring to fig. 9, fig. 9 is a flow chart of steps in an exemplary embodiment after detecting a write-read inconsistency for a target eye pattern in the embodiment of fig. 8. As shown in fig. 9, it may include steps S901 to S904, by which it is determined whether an abnormality occurs in calibration, as described in detail below:
In step S901, if the write-read inconsistency for the target eye pattern is detected, the right boundary and the center corresponding to the target eye pattern are obtained.
When the write-read inconsistency aiming at the target eye diagram is detected, the right boundary of the eye diagram after the reference eye diagram is deviated by the environmental influence is successfully corresponding to the increased write DQS-DQ delay under the calibration of the write DQS-DQ phase. In order to accurately judge whether the target eye pattern has abnormal calibration, after detecting write-read inconsistency, acquiring the right boundary and the center corresponding to the target eye pattern to form a complete target eye pattern image so as to perform eye width inspection on the target eye pattern.
And step S902, performing eye width inspection on the target eye pattern based on the right boundary and the center corresponding to the target eye pattern, and obtaining an eye width inspection result.
The eye width inspection is to obtain the eye width of the target eye pattern based on the right boundary and the center corresponding to the target eye pattern, and compare the eye width of the target eye pattern with a preset eye width, and the obtained eye width inspection result may be characterized in that the eye width of the target eye pattern is greater than a preset eye width threshold, or the eye width of the target eye pattern is less than or equal to the preset eye width threshold.
Step S903, if the eye width of the eye width inspection result indicates that the eye width of the target eye diagram is greater than the preset eye width threshold, a detection result for indicating that no abnormality occurs in calibration is obtained.
If the eye width check result indicates that the eye width of the target eye diagram is larger than the preset eye width threshold value, the target eye diagram is not a cavity formed by signal sampling errors, and the target eye diagram is represented to pass the eye width check. The preset eye width threshold can be used for representing that a target eye pattern corresponding to an eye width check result larger than the preset eye width threshold meets the eye width standard of the preset eye pattern, otherwise, the target eye pattern does not meet the eye width standard, and specific numerical values of the target eye pattern are not limited.
Step S904, if the eye width of the eye width inspection result indicates that the eye width of the target eye diagram is less than or equal to the preset eye width threshold, and the right boundary of the target eye diagram is detected not to exceed the preset boundary threshold, a detection result for indicating that no abnormality occurs in calibration is obtained.
In this embodiment, whether the calibration is abnormal is determined by checking the orbit of the target eye pattern, if the eye pattern passes the eye pattern checking, it is indicated that the right boundary and the center corresponding to the target eye pattern meet the eye pattern standard of the preset eye pattern, and the error sampling or the calibration is not abnormal; in the case where the eye width check is not passed, it is also necessary to further determine the cause of the target eye pattern not passing the eye width check.
If the right boundary corresponding to the target eye pattern is detected to be located at a position exceeding the preset boundary threshold value on the premise that the target eye pattern fails to pass the eye width inspection, continuously increasing the DQS-DQ delay only causes the difference value between the DQS-DQ delay and the preset boundary threshold value to be larger and larger, characterizing the calibration abnormality, ending the calibration and continuously taking the right boundary of the reference eye pattern as the calibration point of the next calibration, namely returning the reference eye pattern; if the position of the right boundary corresponding to the target eye pattern is detected not to exceed the preset boundary threshold value, the signal is in a cavity formed by sampling by mistake, and the delay is further increased to continue the writing DQS-DQ phase calibration until writing and reading are inconsistent and the eye width check is passed, or the calibration abnormality is determined.
The reason why the position of the right boundary corresponding to the target eye pattern exceeds the preset boundary threshold in the above embodiment may be that when the compensation process for the calibration duration is performed by estimating the offset value, the environmental influence is too large to compensate the offset caused by the environmental factor on the eye pattern, as shown in fig. 10, fig. 10 is a schematic diagram illustrating that the right boundary of the target eye pattern is detected to exceed the preset boundary threshold in the calibration of the write DQS-DQ phase in an exemplary embodiment of the present application. Wherein n is represented as a calibration point corresponding to the right boundary of the reference eye, offset is represented as a pre-estimated offset value, so n-offset is represented as a calibration point corresponding to the compensated right boundary, max_porous_delay is represented as a reference eye adjacent to the right boundary of the target eye before the target eye returns to the current time, and last_center_delay is represented as a reference eye adjacent to the right boundary of the target eye after the target eye exceeds a preset boundary threshold.
It should be noted that, the estimated offset value offset may be a positive value or a negative value, and if the estimated offset value offset is a positive value, it indicates that the reference eye pattern is offset to the left due to environmental influence; if negative, it is indicated that the reference eye pattern is shifted to the right by the environmental influence, and the specific limitation is not made here.
As can be seen from the above, in the method provided in this embodiment, firstly, the orbit of the target eye pattern is checked, if the eye width check is passed, it is indicated that the right boundary and the center corresponding to the target eye pattern meet the eye width standard of the preset eye pattern, and the error sampling or the calibration abnormality is not occurred; in the case of failing the eye width check, it is further necessary to determine the reason why the target eye pattern fails the eye width check, and determine whether the calibration is abnormal, so as to improve the efficiency of writing DQS-DQ phase calibration.
Referring to fig. 11, fig. 11 is a schematic flow chart illustrating a method for determining an application eye center for cyclic writing DQS-DQ phase calibration according to an exemplary embodiment of the present application, which may include the following steps:
step 1101, acquiring adjacent reference eye diagrams before the current moment and determining corresponding calibration points;
step S1102, starting to calibrate the writing DQS-DQ phase to obtain a target eye diagram and a writing and reading result corresponding to the current moment;
step S1103, judging whether the writing and reading results are consistent, if yes, proceeding to step S1104, otherwise proceeding to step S1105;
step S1104, increasing the DQS-DQ delay, and returning to step S1102 to continue the DQS-DQ phase calibration, so as to determine whether the writing and reading results are consistent in step S1103;
step S1105, performing eye width inspection based on the right boundary and the center corresponding to the target eye pattern to obtain an eye width inspection result, judging whether the target eye pattern passes the eye width inspection based on the eye width inspection result, if the eye width inspection result indicates that the eye width of the target eye pattern is larger than a preset eye width threshold value, the target eye pattern passes the eye width inspection and enters step S1106, and if the eye width inspection result indicates that the eye width of the target eye pattern is smaller than or equal to the preset eye width threshold value, the target eye pattern does not pass the eye width inspection and enters step S1107;
Step S1106, determining that calibration is successful, and storing the target eye pattern into a designated storage area to serve as a reference eye pattern for the next DQS-DQ phase calibration;
step S1107, judging whether the right boundary of the target eye diagram exceeds a preset boundary threshold, if so, entering step S1108, otherwise, returning to step S1104;
step S1108, determining that calibration is abnormal, and continuously storing the reference eye pattern into a designated storage area to be used as the reference eye pattern for the next DQS-DQ phase calibration;
in step S1109, write DQS-DQ phase calibration is exited.
Fig. 12 is a block diagram of an eye center determination apparatus 1200 according to an exemplary embodiment of the present application. As shown in fig. 12, the apparatus includes:
an acquiring unit 1201, configured to acquire a reference eye pattern adjacent to the current time; the reference eye diagram is obtained after DQS-DQ phase calibration; a preprocessing unit 1202, configured to determine a calibration point corresponding to a right boundary of a reference eye pattern based on the reference eye pattern; the calibration unit 1203 is configured to calibrate the write DQS-DQ phase from the calibration point, to obtain a target eye diagram corresponding to the current time; a processing unit 1204, configured to determine a center of the target eye pattern based on an offset relationship between the target eye pattern and the reference eye pattern.
The device applies the method for determining the center of the eye pattern, and the preprocessing unit 1202 determines the calibration point corresponding to the right boundary of the reference eye pattern through the reference eye pattern adjacent to the current moment acquired by the acquisition unit 1201; after determining the calibration point, the calibration unit 1203 calibrates the writing DQS-DQ phase from the calibration point to obtain a target eye diagram corresponding to the current moment; DQS-DQ phase calibration is carried out based on the determined calibration points, so that scanning identification of the whole diagram of the target eye diagram can be avoided, and the calibration time length is greatly reduced; finally, the processing unit 1204 determines the center of the target eye pattern based on the offset relationship between the target eye pattern and the reference eye pattern, so as to complete the calibration of the DQS-DQ phase in a short time, and obtain a complete target eye pattern, so that the time for suspending the read-write access to the memory is shortened by reducing the calibration time, and further, the read-write performance of the memory applied by the terminal is improved.
In another exemplary embodiment, the calibration unit 1203 is further configured to detect an offset relationship between a calibration point corresponding to a right boundary of the reference eye pattern and a right boundary of the target eye pattern; if the right boundary of the target eye diagram is detected to be on the right side of the calibration point, determining that right shift calibration occurs, and obtaining the center of the target eye diagram based on the position information corresponding to the center of the reference eye diagram and the right shift offset corresponding to the right shift calibration; if the right boundary of the target eye pattern is detected to be at the left side of the calibration point, determining that left shift calibration occurs, and obtaining the center of the target eye pattern based on the position information corresponding to the center of the reference eye pattern and the left shift offset corresponding to the left shift calibration.
In another exemplary embodiment, the position information corresponding to the center of the reference eye pattern includes an abscissa and an ordinate, and the calibration unit 1203 is further configured to perform a summation operation on the abscissa corresponding to the center of the reference eye pattern and the right shift offset to obtain the abscissa corresponding to the center of the target eye pattern; and taking the ordinate corresponding to the center of the reference eye pattern as the ordinate corresponding to the center of the target eye pattern.
In another exemplary embodiment, the position information corresponding to the center of the reference eye pattern includes an abscissa and an ordinate, and the calibration unit 1203 is further configured to perform a difference operation on the abscissa corresponding to the center of the reference eye pattern and the left shift offset to obtain the abscissa corresponding to the center of the target eye pattern; and taking the ordinate corresponding to the center of the reference eye pattern as the ordinate corresponding to the center of the target eye pattern.
In another exemplary embodiment, the calibration unit 1203 is further configured to predict an offset value generated by the right boundary of the reference eye affected by the environment, to obtain a predicted offset value; performing compensation processing for the calibration time length on the right boundary of the reference eye diagram based on the estimated offset value to obtain a compensated right boundary; and calibrating the writing DQS-DQ phase from the calibration point corresponding to the compensated right boundary to obtain a target eye diagram corresponding to the current moment.
In another exemplary embodiment, the apparatus further comprises:
an anomaly detection unit configured to store the target eye pattern in a specified storage area if consistency of writing and reading for the target eye pattern is detected after determining the center of the target eye pattern based on an offset relationship between the target eye pattern and the reference eye pattern; if the write-read inconsistency for the target eye pattern is detected but the calibration is not abnormal, the target eye pattern is stored in a designated storage area.
In another exemplary embodiment, the anomaly detection unit is further configured to obtain a right boundary and a center corresponding to the target eye pattern if write-read inconsistencies for the target eye pattern are detected; performing eye width inspection on the target eye pattern based on the right boundary and the center corresponding to the target eye pattern to obtain an eye width inspection result; if the eye width of the eye width check result representing the target eye pattern is larger than a preset eye width threshold value, a detection result used for representing that no abnormality occurs in calibration is obtained; if the eye width check result indicates that the eye width of the target eye diagram is smaller than or equal to the preset eye width threshold value and the right boundary of the target eye diagram is detected not to exceed the preset boundary threshold value, a detection result used for indicating that the calibration is not abnormal is obtained.
It should be noted that, the apparatus for determining an eye center provided in the foregoing embodiment and the method for determining an eye center provided in the foregoing embodiment belong to the same concept, and the specific manner in which each module and unit perform the operation has been described in detail in the method embodiment, which is not repeated herein. In practical application, the eye diagram center determining device provided in the above embodiment may allocate the functions to different functional modules according to needs, that is, the internal structure of the device is divided into different functional modules to complete all or part of the functions described above, which is not limited herein.
The embodiment of the application also provides electronic equipment, which comprises: one or more processors; and a storage device for storing one or more programs, which when executed by the one or more processors, cause the electronic device to implement the method for determining an eye center provided in the above embodiments.
Fig. 13 shows a schematic diagram of a computer system suitable for use in implementing the electronic device of the embodiments of the present application. It should be noted that, the computer system 1300 of the electronic device shown in fig. 13 is only an example, and should not impose any limitation on the functions and the application scope of the embodiments of the present application.
As shown in fig. 13, the computer system 1300 includes a central processing unit (CentralProcessingUnit, CPU) 1301, which can perform various appropriate actions and processes, such as performing the methods in the above-described embodiments, according to a program stored in a Read-only memory (ROM) 1302 or a program loaded from a storage portion 1308 into a random access memory (RandomAccessMemory, RAM) 1303. In the RAM1303, various programs and data required for system operation are also stored, and the RAM1303 may be a high-speed SDRAM to which the eye pattern center determination method provided in the present application is applied. The CPU1301, ROM1302, and RAM1303 are connected to each other through a bus 1304. An Input/Output (I/O) interface 1305 is also connected to bus 1304.
The following components are connected to the I/O interface 1305: an input section 1306 including a keyboard, a mouse, and the like; an output portion 1307 including a cathode ray tube (CathodeRayTube, CRT), a liquid crystal display (LiquidCrystalDisplay, LCD), and the like, a speaker, and the like; a storage portion 1308 including a hard disk or the like; and a communication section 1309 including a network interface card such as a LAN (local area network) card, a modem, or the like. The communication section 1309 performs a communication process via a network such as the internet. The drive 1310 is also connected to the I/O interface 1305 as needed. Removable media 1311, such as magnetic disks, optical disks, magneto-optical disks, semiconductor memory, and the like, is mounted on drive 1310 as needed so that a computer program read therefrom is mounted into storage portion 1308 as needed.
In particular, according to embodiments of the present application, the processes described above with reference to flowcharts may be implemented as computer software programs. For example, embodiments of the present application include a computer program product comprising a computer program embodied on a computer readable medium, the computer program comprising a computer program for performing the method shown in the flowchart. In such embodiments, the computer program may be downloaded and installed from a network via the communication portion 1309 and/or installed from the removable medium 1311. When executed by a Central Processing Unit (CPU) 1301, performs the various functions defined in the system of the present application.
It should be noted that, the computer readable medium shown in the embodiments of the present application may be a computer readable signal medium or a computer readable storage medium, or any combination of the two. The computer readable storage medium may be, for example, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination thereof. More specific examples of the computer-readable storage medium may include, but are not limited to: an electrical connection having one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (ErasableProgrammableReadOnlyMemory, EPROM), a flash memory, an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing. In the present application, a computer-readable signal medium may include a data signal propagated in baseband or as part of a carrier wave, with a computer-readable computer program embodied therein. Such a propagated data signal may take any of a variety of forms, including, but not limited to, electro-magnetic, optical, or any suitable combination of the foregoing. A computer readable signal medium may also be any computer readable medium that is not a computer readable storage medium and that can communicate, propagate, or transport a program for use by or in connection with an instruction execution system, apparatus, or device. A computer program embodied on a computer readable medium may be transmitted using any appropriate medium, including but not limited to: wireless, wired, etc., or any suitable combination of the foregoing.
The flowcharts and block diagrams in the figures illustrate the architecture, functionality, and operation of possible implementations of systems, methods and computer program products according to various embodiments of the present application. Where each block in the flowchart or block diagrams may represent a module, segment, or portion of code, which comprises one or more executable instructions for implementing the specified logical function(s). It should also be noted that, in some alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved. It will also be noted that each block of the block diagrams or flowchart illustration, and combinations of blocks in the block diagrams or flowchart illustration, can be implemented by special purpose hardware-based systems which perform the specified functions or acts, or combinations of special purpose hardware and computer instructions.
The units involved in the embodiments of the present application may be implemented by means of software, or may be implemented by means of hardware, and the described units may also be provided in a processor. Wherein the names of the units do not constitute a limitation of the units themselves in some cases.
Another aspect of the present application also provides a computer readable storage medium having stored thereon a computer program which, when executed by a processor, implements a method of determining an eye pattern center as before. The computer-readable storage medium may be included in the electronic device described in the above embodiment or may exist alone without being incorporated in the electronic device.
Another aspect of the present application also provides a computer program product or computer program comprising computer instructions stored in a computer readable storage medium. The processor of the computer device reads the computer instructions from the computer-readable storage medium, and the processor executes the computer instructions, so that the computer device performs the method of determining the center of an eye pattern provided in the above-described respective embodiments.
The foregoing description of the preferred embodiment of the present invention is provided for the purpose of illustration only, and is not intended to limit the invention to the particular form disclosed, but on the contrary, the intention is to cover all modifications, equivalents, and alternatives falling within the spirit and scope of the invention.

Claims (9)

1. A method of determining the center of an eye pattern, the method comprising:
Acquiring adjacent reference eye patterns before the current moment; the reference eye diagram is obtained after DQS-DQ phase calibration;
determining a calibration point corresponding to the right boundary of the reference eye pattern based on the reference eye pattern;
estimating an offset value generated by the influence of the environment on the right boundary of the reference eye diagram to obtain an estimated offset value;
performing compensation processing for the calibration duration on the right boundary of the reference eye diagram based on the estimated offset value to obtain a compensated right boundary;
calibrating the DQS-DQ phase from the calibration point corresponding to the compensated right boundary to obtain a target eye diagram corresponding to the current moment;
a center of the target eye pattern is determined based on an offset relationship between the target eye pattern and the reference eye pattern.
2. The method of claim 1, wherein the determining the center of the target eye pattern based on the offset relationship between the target eye pattern and the reference eye pattern comprises:
detecting an offset relationship between a calibration point corresponding to the right boundary of the reference eye pattern and the right boundary of the target eye pattern;
if the right boundary of the target eye diagram is detected to be on the right side of the calibration point, determining that right shift calibration occurs, and obtaining the center of the target eye diagram based on the position information corresponding to the center of the reference eye diagram and the right shift offset corresponding to the right shift calibration;
If the right boundary of the target eye diagram is detected to be at the left side of the calibration point, determining that left shift calibration occurs, and obtaining the center of the target eye diagram based on the position information corresponding to the center of the reference eye diagram and the left shift offset corresponding to the left shift calibration.
3. The method of claim 2, wherein the location information corresponding to the center of the reference eye pattern includes an abscissa and an ordinate;
the obtaining the center of the target eye pattern based on the position information corresponding to the center of the reference eye pattern and the right shift offset corresponding to the right shift calibration includes:
summing the abscissa corresponding to the center of the reference eye pattern and the right shift offset to obtain the abscissa corresponding to the center of the target eye pattern; and
and taking the ordinate corresponding to the center of the reference eye diagram as the ordinate corresponding to the center of the target eye diagram.
4. The method of claim 2, wherein the location information corresponding to the center of the reference eye pattern includes an abscissa and an ordinate;
the obtaining the center of the target eye pattern based on the position information corresponding to the center of the reference eye pattern and the left shift offset corresponding to the left shift calibration includes:
Performing difference operation on the abscissa corresponding to the center of the reference eye pattern and the left shift offset to obtain the abscissa corresponding to the center of the target eye pattern; and
and taking the ordinate corresponding to the center of the reference eye diagram as the ordinate corresponding to the center of the target eye diagram.
5. The method of claim 1, wherein after the determining the center of the target eye pattern based on the offset relationship between the target eye pattern and the reference eye pattern, the method further comprises:
if the consistency of writing and reading aiming at the target eye diagram is detected, storing the target eye diagram into a designated storage area;
if the write-read inconsistency for the target eye diagram is detected but the calibration is not abnormal, the target eye diagram is stored in a designated storage area.
6. The method of claim 5, wherein the method further comprises:
if the write-read inconsistency aiming at the target eye diagram is detected, acquiring a right boundary and a center corresponding to the target eye diagram;
performing eye width inspection on the target eye pattern based on the right boundary and the center corresponding to the target eye pattern to obtain an eye width inspection result;
if the eye width check result indicates that the eye width of the target eye diagram is larger than a preset eye width threshold value, a detection result used for indicating that calibration is not abnormal is obtained;
And if the eye width check result indicates that the eye width of the target eye diagram is smaller than or equal to the preset eye width threshold value and the right boundary of the target eye diagram is detected not to exceed the preset boundary threshold value, a detection result used for indicating that calibration is not abnormal is obtained.
7. An eye center determining apparatus, comprising:
the acquisition unit is used for acquiring the adjacent reference eye patterns before the current moment; the reference eye diagram is obtained after DQS-DQ phase calibration;
a preprocessing unit, configured to determine a calibration point corresponding to a right boundary of the reference eye pattern based on the reference eye pattern;
the calibration unit is used for estimating an offset value generated by the influence of the environment on the right boundary of the reference eye diagram to obtain an estimated offset value; performing compensation processing for the calibration duration on the right boundary of the reference eye diagram based on the estimated offset value to obtain a compensated right boundary; calibrating the DQS-DQ phase from the calibration point corresponding to the compensated right boundary to obtain a target eye diagram corresponding to the current moment;
and the processing unit is used for determining the center of the target eye diagram based on the offset relation between the target eye diagram and the reference eye diagram.
8. An electronic device, comprising:
one or more processors;
storage means for storing one or more programs which, when executed by the one or more processors, cause the electronic device to implement the method of determining eye center of any of claims 1 to 6.
9. A computer readable storage medium having stored thereon computer readable instructions which, when executed by a processor of a computer, cause the computer to perform the method of determining the center of an eye diagram of any of claims 1 to 6.
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Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102834867A (en) * 2010-06-08 2012-12-19 拉姆伯斯公司 Integrated circuit device timing calibration
CN106201949A (en) * 2016-07-04 2016-12-07 北京交通大学 The analysis method of eye pattern shake
JP2017142090A (en) * 2016-02-08 2017-08-17 アンリツ株式会社 Eye diagram display device and eye diagram display method
CN112328305A (en) * 2020-10-30 2021-02-05 歌尔光学科技有限公司 Eye pattern testing method and device, electronic equipment and readable storage medium
CN114255819A (en) * 2020-09-24 2022-03-29 长鑫存储技术有限公司 Method for evaluating performance of interface circuit and related equipment
CN115114199A (en) * 2022-06-30 2022-09-27 腾讯科技(深圳)有限公司 Data transmission configuration method and device, electronic equipment and storage medium
CN115206364A (en) * 2021-04-08 2022-10-18 美光科技公司 Asymmetric decision feedback equalization
CN115691633A (en) * 2022-09-07 2023-02-03 长鑫存储技术有限公司 Dynamic memory parameter calibration method, device, equipment, medium and program product

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6691214B1 (en) * 2000-08-29 2004-02-10 Micron Technology, Inc. DDR II write data capture calibration
US8532240B2 (en) * 2011-01-03 2013-09-10 Lsi Corporation Decoupling sampling clock and error clock in a data eye

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102834867A (en) * 2010-06-08 2012-12-19 拉姆伯斯公司 Integrated circuit device timing calibration
JP2017142090A (en) * 2016-02-08 2017-08-17 アンリツ株式会社 Eye diagram display device and eye diagram display method
CN106201949A (en) * 2016-07-04 2016-12-07 北京交通大学 The analysis method of eye pattern shake
CN114255819A (en) * 2020-09-24 2022-03-29 长鑫存储技术有限公司 Method for evaluating performance of interface circuit and related equipment
CN112328305A (en) * 2020-10-30 2021-02-05 歌尔光学科技有限公司 Eye pattern testing method and device, electronic equipment and readable storage medium
CN115206364A (en) * 2021-04-08 2022-10-18 美光科技公司 Asymmetric decision feedback equalization
CN115114199A (en) * 2022-06-30 2022-09-27 腾讯科技(深圳)有限公司 Data transmission configuration method and device, electronic equipment and storage medium
CN115691633A (en) * 2022-09-07 2023-02-03 长鑫存储技术有限公司 Dynamic memory parameter calibration method, device, equipment, medium and program product

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