CN116299032A - LED module testing system - Google Patents
LED module testing system Download PDFInfo
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- CN116299032A CN116299032A CN202310275392.1A CN202310275392A CN116299032A CN 116299032 A CN116299032 A CN 116299032A CN 202310275392 A CN202310275392 A CN 202310275392A CN 116299032 A CN116299032 A CN 116299032A
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- 238000012360 testing method Methods 0.000 title claims abstract description 30
- 238000001514 detection method Methods 0.000 claims abstract description 13
- 230000017525 heat dissipation Effects 0.000 claims description 8
- 238000000034 method Methods 0.000 claims description 7
- 238000009529 body temperature measurement Methods 0.000 claims description 6
- 230000008569 process Effects 0.000 claims description 6
- 230000000007 visual effect Effects 0.000 claims description 6
- 238000006243 chemical reaction Methods 0.000 claims description 3
- 230000009467 reduction Effects 0.000 abstract description 2
- 230000008859 change Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000004907 flux Effects 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 102100039435 C-X-C motif chemokine 17 Human genes 0.000 description 1
- 101000889048 Homo sapiens C-X-C motif chemokine 17 Proteins 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000009877 rendering Methods 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000011282 treatment Methods 0.000 description 1
- 238000012800 visualization Methods 0.000 description 1
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B45/00—Circuit arrangements for operating light-emitting diodes [LED]
- H05B45/30—Driver circuits
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/44—Testing lamps
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B45/00—Circuit arrangements for operating light-emitting diodes [LED]
- H05B45/10—Controlling the intensity of the light
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B45/00—Circuit arrangements for operating light-emitting diodes [LED]
- H05B45/30—Driver circuits
- H05B45/32—Pulse-control circuits
- H05B45/325—Pulse-width modulation [PWM]
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02B—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO BUILDINGS, e.g. HOUSING, HOUSE APPLIANCES OR RELATED END-USER APPLICATIONS
- Y02B20/00—Energy efficient lighting technologies, e.g. halogen lamps or gas discharge lamps
- Y02B20/40—Control techniques providing energy savings, e.g. smart controller or presence detection
Abstract
The invention provides an LED module testing system, comprising: the LED module driving power supply is connected with the LED module to be tested to supply power to the LED module to be tested; the detection device is connected with the LED module to be detected and is used for acquiring the brightness parameter of the LED module to be detected; the LED module control driving module is arranged between the LED module to be tested and the LED module driving power supply and used for controlling the output current of the LED module driving power supply; the LED module control driving module comprises a microcontroller and an LED controller, and under the control of the microcontroller, the LED controller controls the output current of the LED module driving power supply to be subdivided into set parts. According to the invention, the input current of the LED module to be tested can be subdivided into set parts, and then the input current is increased from small to large or reduced from large to small, and the linear increase or reduction of the current is realized every time the input current is increased or reduced by one part, so that the relation between the current and the brightness of the LED module is determined.
Description
Technical Field
The invention relates to an LED module testing system, in particular to an LED module testing system capable of testing the current of an LED module.
Background
The LED module is a product which is formed by arranging a certain number of light emitting diodes together according to a rule and then packaging the light emitting diodes and adding some waterproof treatments. At present, an LED module is mainly composed of a certain number of light emitting diodes, optical components and structural components. The modules need to be tested, and the current of each path of the LED module is mainly tested, so that parameters such as luminous flux, color temperature, color rendering index and the like of the module are tested, and meanwhile, the temperature change of the module and the control of a cooling fan of the corresponding module are monitored in real time.
At present, the testing equipment for testing the LED module is mainly a direct current power supply, and the LED module is carried out by setting the output voltage and the output current of the direct current power supply. The existing LED modules are tested through high-power adjustable direct current power supplies, when testing, along with the rising of power and LED module road number, the cost of test equipment is higher, the existing test equipment cannot subdivide current into 16 bits, namely, each path of current is subdivided into 65535 parts to carry out adjustment testing, the temperature change curve of the existing module cannot be accurately recorded when testing, and a tester is required to monitor temperature change at any moment when testing so as to prevent burning out the LED modules in the test process.
Disclosure of Invention
In view of the foregoing problems of the prior art, an object of the present invention is to provide an LED module testing system, in which the output current can be subdivided into 65535 parts by PWM technology.
In order to achieve the above object, the present invention provides an LED module testing system, comprising:
the LED module driving power supply is connected with the LED module to be tested to supply power to the LED module to be tested;
the detection device is connected with the LED module to be detected and is used for acquiring the brightness parameter of the LED module to be detected;
the LED module control driving module is arranged between the LED module to be tested and the LED module driving power supply and used for controlling the output current of the LED module driving power supply;
the LED module control driving module comprises a microcontroller and an LED controller, and under the control of the microcontroller, the LED controller controls the output current of the LED module driving power supply to be subdivided into set parts.
Further, in the above-mentioned LED module test system: the high-brightness LED controller adopts a chip with the model number of MAX20078, and the microcontroller adopts a chip with the model number of STM32F103 RCT; the microcontroller generates PWM output meeting 65535 subdivision through the setting of an internal timer, the PWM output is connected with VID pins of the high-brightness LED controller, and the high-brightness LED controller is finally connected to an LED module to be tested through RLED+ after internal logic conversion, and current meets 65535 subdivision.
Further, in the above-mentioned LED module test system: the LED module driving power supply is a 48VDC switching power supply.
Further, in the above-mentioned LED module test system: the LED module control driving module is used for outputting the current component and the brightness parameter of the LED module to be tested, and the current component and the brightness parameter of the LED module to be tested are obtained by the detection device to be processed, so that a curve corresponding to the current and the brightness is formed and displayed on the display.
Further, in the above-mentioned LED module test system: the detection device also comprises a temperature measurement module for measuring the temperature of the LED module, and the visual control module also processes the temperature parameter obtained by the temperature measurement module and the current component output by the LED module control driving module to form a curve corresponding to the temperature and the current to be displayed on the display.
Further, in the above-mentioned LED module test system: the intelligent energy-saving device also comprises a heat dissipation module, wherein the heat dissipation module is controlled by the microcontroller.
According to the invention, the input current of the LED module to be tested can be subdivided into set parts, and then the input current is increased from small to large or reduced from large to small, and the linear increase or reduction of the current is realized every time the input current is increased or reduced by one part, so that the relation between the current and the brightness of the LED module is determined.
Further, the relationship among the current, the brightness and the temperature can be measured.
The invention is further described below with reference to the drawings and detailed description.
Drawings
FIG. 1 is a system block diagram of an LED module testing system in an embodiment of the invention;
FIG. 2 is a circuit diagram of a control driving module of an LED module according to an embodiment of the present invention;
fig. 3 is a circuit diagram of an operating power supply in an embodiment of the invention.
Detailed Description
Fig. 1 shows a system for testing an LED module according to this embodiment, which includes:
the LED module driving power supply is connected with the LED module to be tested to supply power to the LED module to be tested; in this embodiment, a switching power supply is used, and a switching power supply outputting 48VDC is used as the driving power supply VDD of the LED module. The driving power supply of the LED module is the power supply of the LED module to be tested, and the driving power supply of the LED module to be tested can be directly used by selecting a proper driving power supply according to the LED module to be tested.
The detection device is connected with the LED module to be detected and is used for acquiring the brightness parameter of the LED module to be detected; the detection device is used for measuring the brightness of the LED module to be tested, and at present, many devices capable of measuring the brightness of the illuminant can be used. In practice, other brightness meters may be used. For example, a luminance meter uses a pair of light holes with a certain distance to receive luminous flux with a fixed solid angle and a fixed projected area, and the value is not changed with the distance of the luminous LED module, so long as the surface area of the LED module is large enough. In practice, in order to aim at the tested LED module, an imaging system is often adopted. The light of the LED module is imaged on a reflecting mirror with a hole (front light hole) after passing through an objective lens, wherein a part of the light is received by eyes of human through the reflecting mirror and an ocular lens so as to aim and monitor that a clear imaging surface coincides with the reflecting mirror with the hole; the other part of the light passes through the small hole on the reflector and then reaches the V (in) receiver through the back light hole. The luminance value is displayed with a pointer or a digital header.
The LED module control driving module is arranged between the LED module to be tested and the LED module driving power supply and used for controlling the output current of the LED module driving power supply.
In this embodiment, the LED module control driving module includes a microcontroller and an LED controller, and under the control of the microcontroller, the LED controller controls the output current of the LED module driving power supply to be subdivided into set parts. The high-brightness LED controller adopts a chip with the model number of MAX20078, and the microcontroller adopts a chip with the model number of STM32F103 RCT; the microcontroller generates PWM output meeting 65535 subdivision through the setting of an internal timer, and is connected with VID pins of the high-brightness LED controller, and the high-brightness LED controller is finally connected to an LED module to be tested through RLED+ after internal logic conversion, so that current meets 65535 subdivision.
In this embodiment, as shown in fig. 2, through the design of the internal circuit of the MAX20078A LED driving IC, the access port DIM of the IC can convert the PWM signal (RPWM) output by the micro controller chip STM32F103RCT through programming through the MAX20078A internal logic, and then finally connect to each current path of the LED module to be tested through rled+. In this embodiment, the microcontroller chip used by the LED module control driving module is an STM32F103RCT 32 bit computer, and PWM output satisfying 65535 subdivision can be generated through setting an internal timer. As shown in fig. 2, the 8 th pin of the chip U6 (MAX 20078A) is connected to a clamp circuit, which mainly provides an analog input voltage of 0-1.2V, and outputs the analog input voltage as a reference signal to the 8 th pin (REF 1). VCC1 is the voltage output of the 5V regulator in the figure, powering the chip U6 (MAX 20078A). VDD refers to 48V supply voltage input, and MOS transistors Q11 and Q12 form a driving circuit to drive a high-current LED module, which are n-channel MOSFET devices.
The microcontroller chip STM32F103RCT is a widely used microcontroller chip, the identification of each pin of the microcontroller chip STM32F103RCT is all main control signals, and PWM 1-PWM 6 values are PWM signals output by each path of current; FAN refers to control of each FAN; AD-AD 2 refers to a sampling interface of each path of temperature control sensor; S1-S4 and KEY 0-KEY 3 refer to KEY input signals of a control system; others are auxiliary functions such as a serial communication interface of a single chip microcomputer, an external memory interface, an external reset circuit interface and the like.
In this embodiment, the display device further includes a visual control module, where the visual control module is connected to the detection device and the LED module control driving module, and processes the current component output by the LED module control driving module and the luminance parameter of the LED module to be detected obtained by the detection device, so as to form a curve corresponding to the current and the luminance, and display the curve on the display. The detection device also comprises a temperature measurement module for measuring the temperature of the LED module, and the visual control module is used for processing the temperature parameter obtained by the temperature measurement module and the current component output by the LED module control driving module to form a curve corresponding to the temperature and the current to be displayed on the display.
In this embodiment, the processor used by the visual control module is also a microcontroller chip STM32F103RCT, which controls the display screen and processes the data, and processes and analyzes the data of the current output by the LED module control driving module, the brightness measured by the detection device, and the temperature, so that a current-brightness curve can be formed, or the LED module can measure the current-brightness curve at a constant temperature or measure the current-brightness curve at another temperature and display the curve on the display screen by controlling the heat dissipation module.
In addition, the embodiment also comprises a heat dissipation module, and the heat dissipation module is controlled by the microcontroller. The microcontroller heat dissipation module can enable the LED module to be tested at a constant temperature under a set temperature.
In addition, in this embodiment, the visualization control module and the LED module control driving module each use a dedicated power module, i.e., a DC/DC module, to convert the 48VDV output from the LED driving power supply into 12VDC for supplying power to the electronic devices, as shown in fig. 3.
Claims (6)
1. An LED module test system, comprising:
the LED module driving power supply is connected with the LED module to be tested to supply power to the LED module to be tested;
the detection device is connected with the LED module to be detected and is used for acquiring the brightness parameter of the LED module to be detected;
the LED module control driving module is arranged between the LED module to be tested and the LED module driving power supply and used for controlling the output current of the LED module driving power supply;
the method is characterized in that:
the LED module control driving module comprises a microcontroller and an LED controller, and under the control of the microcontroller, the LED controller controls the output current of the LED module driving power supply to be subdivided into set parts.
2. The LED module test system of claim 1, wherein: the high-brightness LED controller adopts a chip with the model number of MAX20078, and the microcontroller adopts a chip with the model number of STM32F103 RCT; the microcontroller generates PWM output meeting 65535 subdivision through the setting of an internal timer, the PWM output is connected with VID pins of the high-brightness LED controller, and the high-brightness LED controller is finally connected to an LED module to be tested through RLED+ after internal logic conversion, and current meets 65535 subdivision.
3. The LED module test system of claim 2, wherein: the LED module driving power supply is a 48VDC switching power supply.
4. The LED module test system of claim 3, wherein: the LED module control driving module is used for outputting the current component and the brightness parameter of the LED module to be tested, and the current component and the brightness parameter of the LED module to be tested are obtained by the detection device to be processed, so that a curve corresponding to the current and the brightness is formed and displayed on the display.
5. The LED module test system of claim 4, wherein: the detection device also comprises a temperature measurement module for measuring the temperature of the LED module, and the visual control module also processes the temperature parameter obtained by the temperature measurement module and the current component output by the LED module control driving module to form a curve corresponding to the temperature and the current to be displayed on the display.
6. The LED module test system of claim 5, wherein: the intelligent energy-saving device also comprises a heat dissipation module, wherein the heat dissipation module is controlled by the microcontroller.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310275392.1A CN116299032A (en) | 2023-03-18 | 2023-03-18 | LED module testing system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310275392.1A CN116299032A (en) | 2023-03-18 | 2023-03-18 | LED module testing system |
Publications (1)
| Publication Number | Publication Date |
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| CN116299032A true CN116299032A (en) | 2023-06-23 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202310275392.1A Pending CN116299032A (en) | 2023-03-18 | 2023-03-18 | LED module testing system |
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| CN (1) | CN116299032A (en) |
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2023
- 2023-03-18 CN CN202310275392.1A patent/CN116299032A/en active Pending
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