CN116227395B - 数字芯片的仿真测试方法、装置及电子设备 - Google Patents
数字芯片的仿真测试方法、装置及电子设备 Download PDFInfo
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- CN116227395B CN116227395B CN202211676853.8A CN202211676853A CN116227395B CN 116227395 B CN116227395 B CN 116227395B CN 202211676853 A CN202211676853 A CN 202211676853A CN 116227395 B CN116227395 B CN 116227395B
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- 238000004088 simulation Methods 0.000 title claims abstract description 146
- 238000010998 test method Methods 0.000 title abstract description 25
- 238000012360 testing method Methods 0.000 claims abstract description 230
- 238000013142 basic testing Methods 0.000 claims abstract description 101
- 238000013461 design Methods 0.000 claims abstract description 47
- 238000000034 method Methods 0.000 claims abstract description 46
- 238000012795 verification Methods 0.000 claims abstract description 41
- 238000012545 processing Methods 0.000 claims abstract description 40
- 230000008569 process Effects 0.000 claims abstract description 26
- 238000009795 derivation Methods 0.000 claims abstract description 14
- 230000006870 function Effects 0.000 claims description 28
- 239000000758 substrate Substances 0.000 claims 1
- 230000005540 biological transmission Effects 0.000 description 11
- 238000010586 diagram Methods 0.000 description 8
- 238000004590 computer program Methods 0.000 description 5
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- 238000003491 array Methods 0.000 description 3
- 238000012546 transfer Methods 0.000 description 3
- 230000005284 excitation Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 238000004891 communication Methods 0.000 description 1
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/30—Circuit design
- G06F30/32—Circuit design at the digital level
- G06F30/33—Design verification, e.g. functional simulation or model checking
- G06F30/3308—Design verification, e.g. functional simulation or model checking using simulation
- G06F30/331—Design verification, e.g. functional simulation or model checking using simulation with hardware acceleration, e.g. by using field programmable gate array [FPGA] or emulation
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02D10/00—Energy efficient computing, e.g. low power processors, power management or thermal management
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CN202211676853.8A CN116227395B (zh) | 2022-12-26 | 2022-12-26 | 数字芯片的仿真测试方法、装置及电子设备 |
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CN202211676853.8A CN116227395B (zh) | 2022-12-26 | 2022-12-26 | 数字芯片的仿真测试方法、装置及电子设备 |
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CN116227395B true CN116227395B (zh) | 2023-09-29 |
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Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102004052197A1 (de) * | 2004-10-27 | 2006-05-04 | Giesecke & Devrient Gmbh | Verfahren zum Testen der Funktion einer datenverarbeitenden Schaltung |
US9558307B1 (en) * | 2014-12-31 | 2017-01-31 | Cadence Design Systems, Inc. | System and method for providing a scalable server-implemented regression query environment for remote testing and analysis of a chip-design model |
US9916230B1 (en) * | 2016-09-26 | 2018-03-13 | International Business Machines Corporation | White box testing |
CN111123888A (zh) * | 2019-12-19 | 2020-05-08 | 江苏中天科技软件技术有限公司 | 一种工控协议测试方法、系统及电子设备和存储介质 |
CN111832236A (zh) * | 2020-06-29 | 2020-10-27 | 山东云海国创云计算装备产业创新中心有限公司 | 一种芯片回归测试方法、系统、电子设备及存储介质 |
CN112416800A (zh) * | 2020-12-03 | 2021-02-26 | 网易(杭州)网络有限公司 | 智能合约的测试方法、装置、设备及存储介质 |
CN114090423A (zh) * | 2021-10-11 | 2022-02-25 | 芯河半导体科技(无锡)有限公司 | 一种芯片验证自动化控制方法 |
CN114398286A (zh) * | 2022-01-19 | 2022-04-26 | 腾讯科技(深圳)有限公司 | 自动化测试方法、装置、电子设备及存储介质 |
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- 2022-12-26 CN CN202211676853.8A patent/CN116227395B/zh active Active
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102004052197A1 (de) * | 2004-10-27 | 2006-05-04 | Giesecke & Devrient Gmbh | Verfahren zum Testen der Funktion einer datenverarbeitenden Schaltung |
US9558307B1 (en) * | 2014-12-31 | 2017-01-31 | Cadence Design Systems, Inc. | System and method for providing a scalable server-implemented regression query environment for remote testing and analysis of a chip-design model |
US9916230B1 (en) * | 2016-09-26 | 2018-03-13 | International Business Machines Corporation | White box testing |
CN111123888A (zh) * | 2019-12-19 | 2020-05-08 | 江苏中天科技软件技术有限公司 | 一种工控协议测试方法、系统及电子设备和存储介质 |
CN111832236A (zh) * | 2020-06-29 | 2020-10-27 | 山东云海国创云计算装备产业创新中心有限公司 | 一种芯片回归测试方法、系统、电子设备及存储介质 |
CN112416800A (zh) * | 2020-12-03 | 2021-02-26 | 网易(杭州)网络有限公司 | 智能合约的测试方法、装置、设备及存储介质 |
CN114090423A (zh) * | 2021-10-11 | 2022-02-25 | 芯河半导体科技(无锡)有限公司 | 一种芯片验证自动化控制方法 |
CN114398286A (zh) * | 2022-01-19 | 2022-04-26 | 腾讯科技(深圳)有限公司 | 自动化测试方法、装置、电子设备及存储介质 |
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Address after: Room 59, 17th Floor, Science and Technology Innovation Building, No. 777 Zhongguan West Road, Zhuangshi Street, Ningbo City, Zhejiang Province, 315200 Patentee after: Aixin Yuanzhi Semiconductor Co.,Ltd. Country or region after: China Address before: Room 59, 17th Floor, Science and Technology Innovation Building, No. 777 Zhongguan West Road, Zhuangshi Street, Zhenhai District, Ningbo City, Zhejiang Province, 315200 Patentee before: Aixin Yuanzhi Semiconductor (Ningbo) Co.,Ltd. Country or region before: China Address after: Room 59, 17th Floor, Science and Technology Innovation Building, No. 777 Zhongguan West Road, Zhuangshi Street, Zhenhai District, Ningbo City, Zhejiang Province, 315200 Patentee after: Aixin Yuanzhi Semiconductor (Ningbo) Co.,Ltd. Country or region after: China Address before: 201702 room 1190, zone B, floor 11, building 1, No. 158 Shuanglian Road, Qingpu District, Shanghai Patentee before: Aisin Yuanzhi semiconductor (Shanghai) Co.,Ltd. Country or region before: China |
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