CN116225331A - Solid state disk performance optimization method and device, electronic equipment and storage medium - Google Patents
Solid state disk performance optimization method and device, electronic equipment and storage medium Download PDFInfo
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- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/06—Digital input from, or digital output to, record carriers, e.g. RAID, emulated record carriers or networked record carriers
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- G06F3/06—Digital input from, or digital output to, record carriers, e.g. RAID, emulated record carriers or networked record carriers
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Abstract
The invention provides a solid state disk performance optimization method, a device, electronic equipment and a storage medium, wherein the method comprises the following steps: when the wafer in the solid state disk is detected to reach the write empty data period, determining whether the working time of the data block corresponding to the data block in the wafer exceeds the ending time threshold value of the write empty data period; if not, modifying the write periodicity threshold and modifying the write empty data concurrency to a first concurrency threshold; when the processor in the solid state disk is detected to reach a temperature reading period, determining whether the temperatures of all the temperature sensors in the solid state disk reach a high temperature threshold value in the last temperature reading period; if not, modifying the scanning periodic threshold of the temperature sensor, modifying the read temperature concurrency of the processor into a second concurrency threshold, and reducing the influence on the hard disk work by controlling the serial writing of null data of the wafer and controlling the discretization acquisition of the processor.
Description
Technical Field
The present invention relates to the field of computer technologies, and in particular, to a method and apparatus for optimizing performance of a solid state disk, an electronic device, and a storage medium.
Background
In the prior art, in order to enhance data reliability, internal data storage of an SSD (solid state disk) is protected by RAID5 (Redundant ArraysofIndependentDisks disk array), for example, 31+1 mode, i.e. every 31 pieces of user data written, corresponds to 1 piece of check data. Such as superBLOCK0, is made up of BLOCKs 0 (data BLOCKs) on each DIE. For example, superPAGE0 in superBLOCK0 is composed of PAGE0 of all BLOCKs 0.
In view of the nantopenck characteristic requirement, the openBLOCK needs to be closed within a specified time, and in the case that the SSD reads randomly, i.e. no user writes, the background closes the BLOCK by periodically filling dummy (null data), because the BLOCKs on multiple DIE in the same RAID are parallel. Since only one of the read/write/erase actions can be performed on NANDDIE at the same time, the write action of empty data can stall the read operation on the corresponding did. To reduce the impact on random read performance, the current approach is to reduce the number of dummy page per write per DIE, e.g., 4 per write, 1 minute write. But since multiple DIE are parallel, there is a relatively large impact on read performance.
In addition, multiple sensors (temperature sensors) inside the SSD are in serial communication through I2C, if temperatures of the multiple sensors are acquired at the same time, such as 5 sensors every 15 seconds, if there is no time interval, the CPU (central processing unit) load is increased, and SSD performance is affected.
Disclosure of Invention
Based on the above, it is necessary to provide a solid state disk performance optimization method, device, electronic equipment and storage medium capable of improving the performance of the solid state disk during random reading.
In a first aspect, a method for optimizing performance of a solid state disk is provided, where the method includes:
when the wafer in the solid state disk is detected to reach a write empty data period, determining whether the working time of a data block corresponding to the data block in the wafer exceeds the ending time threshold of the write empty data period;
if not, modifying the write periodicity threshold and modifying the write empty data concurrency to a first concurrency threshold;
when the processor in the solid state disk reaches a temperature reading period, determining whether the temperatures of all the temperature sensors in the solid state disk reach a high temperature threshold value in the last temperature reading period;
if not, modifying the scanning periodic threshold of the temperature sensor and modifying the read temperature concurrency of the processor to a second concurrency threshold.
In one embodiment, the modifying the write periodicity threshold and modifying the write empty data concurrency to a first concurrency threshold includes:
Determining whether the solid state disk receives a write request sent by a user in the last write empty data period;
if yes, modifying the write periodicity threshold to be a first write periodicity threshold and modifying the write empty data concurrency to be a first concurrency threshold;
if not, determining whether the solid state disk receives a read request sent by a user in the last write empty data period and modifying the write empty data concurrency into a first concurrency threshold.
In one embodiment, the determining whether the solid state disk receives the read request sent by the user in the last write empty data period and modifying the write empty data concurrency to the first concurrency threshold includes:
if yes, modifying the write periodicity threshold to be a second write periodicity threshold;
and if not, modifying the write periodicity threshold to be the first write periodicity threshold.
In one embodiment, the modifying the write periodicity threshold to be the first write periodicity threshold and the write empty data concurrency to be the first concurrency threshold includes:
generating a wafer writing period corresponding to the wafer according to the wafer number and the first writing period threshold;
And controlling the wafer to execute the blank data writing operation according to the wafer writing period and the first concurrency threshold.
In one embodiment, the modifying the scan periodicity threshold of the temperature sensor and modifying the read temperature concurrency of the processor to a second concurrency threshold comprises:
determining whether the temperature of the temperature sensor reaches the high temperature threshold value in the last temperature reading period;
if yes, determining a temperature sensor which does not reach the high temperature threshold as a target sensor and modifying a target scanning periodic threshold of the target sensor into a long scanning periodic threshold;
if not, modifying the scanning periodic threshold values of all the temperature sensors into the long scanning periodic threshold value and modifying the read temperature concurrency into a second concurrency threshold value.
In one embodiment, the modifying the scan periodicity threshold of all temperature sensors to the long scan periodicity threshold and the read temperature concurrency to the second concurrency threshold comprises:
determining whether the solid state disk receives a read request sent by a user in a last temperature reading period;
if yes, the read temperature concurrency is modified to a second concurrency threshold.
In one embodiment, the modifying the read temperature concurrency to the second concurrency threshold includes:
generating scanning temperature periods corresponding to all the temperature sensors according to the temperature reading period and the long scanning periodicity threshold;
and controlling the processor to read all the temperature sensors according to the scanning temperature period and the second concurrency threshold.
In another aspect, a solid state disk performance optimization apparatus is provided, the apparatus comprising:
the time determining module is used for determining whether the working time of the data block corresponding to the data block in the wafer exceeds the ending time threshold of the write empty data period when the wafer in the solid state disk is detected to reach the write empty data period;
the write modification module is used for modifying the write periodicity threshold and modifying the write empty data concurrency into a first concurrency threshold if not;
the temperature determining module is used for determining whether the temperatures of all the temperature sensors in the solid state disk reach a high temperature threshold value in the last temperature reading period when the processor in the solid state disk reaches the temperature reading period;
and the scanning modification module is used for modifying the scanning periodicity threshold value of the temperature sensor and modifying the read temperature concurrency of the processor into a second concurrency threshold value if the scanning periodicity threshold value of the temperature sensor is not equal to the second concurrency threshold value.
In one embodiment, the write modification module modifying the write periodicity threshold and modifying the write empty data concurrency to a first concurrency threshold includes:
determining whether the solid state disk receives a write request sent by a user in the last write empty data period;
if yes, modifying the write periodicity threshold to be a first write periodicity threshold and modifying the write empty data concurrency to be a first concurrency threshold;
if not, determining whether the solid state disk receives a read request sent by a user in the last write empty data period and modifying the write empty data concurrency into a first concurrency threshold.
In one embodiment, the determining, by the write modification module, whether the solid state disk receives a read request sent by a user in a last write empty data period and modifying the write empty data concurrency to a first concurrency threshold includes:
if yes, modifying the write periodicity threshold to be a second write periodicity threshold;
and if not, modifying the write periodicity threshold to be the first write periodicity threshold.
In one embodiment, the write modification module after modifying the write periodicity threshold to a first write periodicity threshold and modifying the write empty data concurrency to a first concurrency threshold includes:
Generating a wafer writing period corresponding to the wafer according to the wafer number and the first writing period threshold;
and controlling the wafer to execute the blank data writing operation according to the wafer writing period and the first concurrency threshold.
In one embodiment, the modifying the scan periodicity threshold of the modified temperature sensor and modifying the read temperature concurrency of the processor to a second concurrency threshold comprises:
determining whether the temperature of the temperature sensor reaches the high temperature threshold value in the last temperature reading period;
if yes, determining a temperature sensor which does not reach the high temperature threshold as a target sensor and modifying a target scanning periodic threshold of the target sensor into a long scanning periodic threshold;
if not, modifying the scanning periodic threshold values of all the temperature sensors into the long scanning periodic threshold value and modifying the read temperature concurrency into a second concurrency threshold value.
In one embodiment, the modifying the scan periodicity threshold of all temperature sensors to the long scan periodicity threshold and modifying the read temperature concurrency to a second concurrency threshold comprises:
Determining whether the solid state disk receives a read request sent by a user in a last temperature reading period;
if yes, the read temperature concurrency is modified to a second concurrency threshold.
In one embodiment, the scan modification module modifies the read temperature concurrency to a second concurrency threshold, including:
generating scanning temperature periods corresponding to all the temperature sensors according to the temperature reading period and the long scanning periodicity threshold;
and controlling the processor to sequentially read all the temperature sensors according to the scanning temperature period.
In yet another aspect, an electronic device is provided comprising a memory, a processor, and a computer program stored on the memory and executable on the processor, the processor implementing the following steps when executing the computer program:
when the wafer in the solid state disk is detected to reach a write empty data period, determining whether the working time of a data block corresponding to the data block in the wafer exceeds the ending time threshold of the write empty data period;
if not, modifying the write periodicity threshold and modifying the write empty data concurrency to a first concurrency threshold;
When the processor in the solid state disk reaches a temperature reading period, determining whether the temperatures of all the temperature sensors in the solid state disk reach a high temperature threshold value in the last temperature reading period;
if not, modifying the scanning periodic threshold of the temperature sensor and modifying the read temperature concurrency of the processor to a second concurrency threshold.
In one embodiment, the processor, when executing the computer program, performs the steps of:
the modifying the write periodicity threshold and modifying the write empty data concurrency to a first concurrency threshold includes:
determining whether the solid state disk receives a write request sent by a user in the last write empty data period;
if yes, modifying the write periodicity threshold to be a first write periodicity threshold and modifying the write empty data concurrency to be a first concurrency threshold;
if not, determining whether the solid state disk receives a read request sent by a user in the last write empty data period and modifying the write empty data concurrency into a first concurrency threshold.
In one embodiment, the processor, when executing the computer program, performs the steps of:
The determining whether the solid state disk receives the read request sent by the user in the last write empty data period and modifying the write empty data concurrency into a first concurrency threshold value comprises the following steps:
if yes, modifying the write periodicity threshold to be a second write periodicity threshold;
and if not, modifying the write periodicity threshold to be the first write periodicity threshold.
In one embodiment, the processor, when executing the computer program, performs the steps of:
the modifying the write periodicity threshold to a first write periodicity threshold and the writing null data concurrency to a first concurrency threshold includes:
generating a wafer writing period corresponding to the wafer according to the wafer number and the first writing period threshold;
and controlling the wafer to execute the blank data writing operation according to the wafer writing period and the first concurrency threshold.
In one embodiment, the processor, when executing the computer program, performs the steps of: the modifying the scan periodicity threshold of the temperature sensor and modifying the read temperature concurrency of the processor to a second concurrency threshold includes:
determining whether the temperature of the temperature sensor reaches the high temperature threshold value in the last temperature reading period;
If yes, determining a temperature sensor which does not reach the high temperature threshold as a target sensor and modifying a target scanning periodic threshold of the target sensor into a long scanning periodic threshold;
if not, modifying the scanning periodic threshold values of all the temperature sensors into the long scanning periodic threshold value and modifying the read temperature concurrency into a second concurrency threshold value.
In one embodiment, the processor, when executing the computer program, performs the steps of:
the modifying the scan periodicity threshold of all temperature sensors to the long scan periodicity threshold and the read temperature concurrency to a second concurrency threshold includes:
determining whether the solid state disk receives a read request sent by a user in a last temperature reading period;
if yes, the read temperature concurrency is modified to a second concurrency threshold.
In one embodiment, the processor, when executing the computer program, performs the steps of:
the modifying the read temperature concurrency to a second concurrency threshold includes:
generating scanning temperature periods corresponding to all the temperature sensors according to the temperature reading period and the long scanning periodicity threshold;
And controlling the processor to read all the temperature sensors according to the scanning temperature period and the second concurrency threshold.
In yet another aspect, a computer readable storage medium is provided, having stored thereon a computer program which when executed by a processor performs the steps of:
when the wafer in the solid state disk is detected to reach a write empty data period, determining whether the working time of a data block corresponding to the data block in the wafer exceeds the ending time threshold of the write empty data period;
if not, modifying the write periodicity threshold and modifying the write empty data concurrency to a first concurrency threshold;
when the processor in the solid state disk reaches a temperature reading period, determining whether the temperatures of all the temperature sensors in the solid state disk reach a high temperature threshold value in the last temperature reading period;
if not, modifying the scanning periodic threshold of the temperature sensor and modifying the read temperature concurrency of the processor to a second concurrency threshold.
In one embodiment, the modifying the write periodicity threshold and modifying the write empty data concurrency to a first concurrency threshold includes:
Determining whether the solid state disk receives a write request sent by a user in the last write empty data period;
if yes, modifying the write periodicity threshold to be a first write periodicity threshold and modifying the write empty data concurrency to be a first concurrency threshold;
if not, determining whether the solid state disk receives a read request sent by a user in the last write empty data period and modifying the write empty data concurrency into a first concurrency threshold.
In one embodiment, the determining whether the solid state disk receives the read request sent by the user in the last write empty data period and modifying the write empty data concurrency to the first concurrency threshold includes:
if yes, modifying the write periodicity threshold to be a second write periodicity threshold;
and if not, modifying the write periodicity threshold to be the first write periodicity threshold.
In one embodiment, the modifying the write periodicity threshold to be the first write periodicity threshold and the write empty data concurrency to be the first concurrency threshold includes:
generating a wafer writing period corresponding to the wafer according to the wafer number and the first writing period threshold;
And controlling the wafer to execute the blank data writing operation according to the wafer writing period and the first concurrency threshold.
In one embodiment, the modifying the scan periodicity threshold of the temperature sensor and modifying the read temperature concurrency of the processor to a second concurrency threshold comprises:
determining whether the temperature of the temperature sensor reaches the high temperature threshold value in the last temperature reading period;
if yes, determining a temperature sensor which does not reach the high temperature threshold as a target sensor and modifying a target scanning periodic threshold of the target sensor into a long scanning periodic threshold;
if not, modifying the scanning periodic threshold values of all the temperature sensors into the long scanning periodic threshold value and modifying the read temperature concurrency into a second concurrency threshold value.
In one embodiment, the modifying the scan periodicity threshold of all temperature sensors to the long scan periodicity threshold and the read temperature concurrency to the second concurrency threshold comprises:
determining whether the solid state disk receives a read request sent by a user in a last temperature reading period;
if yes, the read temperature concurrency is modified to a second concurrency threshold.
In one embodiment, the modifying the read temperature concurrency to the second concurrency threshold includes:
generating scanning temperature periods corresponding to all the temperature sensors according to the temperature reading period and the long scanning periodicity threshold;
and controlling the processor to read all the temperature sensors according to the scanning temperature period and the second concurrency threshold.
When the wafer in the solid state disk is detected to reach a write empty data period, determining whether the working time of a data block corresponding to the data block in the wafer exceeds the ending time threshold of the write empty data period; if not, modifying the write periodicity threshold and modifying the write empty data concurrency to a first concurrency threshold; when the processor in the solid state disk reaches a temperature reading period, determining whether the temperatures of all the temperature sensors in the solid state disk reach a high temperature threshold value in the last temperature reading period; if not, modifying the scanning periodic threshold of the temperature sensor and modifying the read temperature concurrency of the processor to a second concurrency threshold. The method for writing the empty data in parallel by the wafer is changed into a method for writing the empty data in serial by the wafer, and the temperature of the temperature sensor is obtained in a discretization mode to reduce the influence on the solid state disk when receiving the read-write operation of a user, so that the performance of the solid state disk is improved.
Drawings
FIG. 1 is a schematic flow chart of a method for optimizing the performance of a solid state disk;
FIG. 2 is a schematic diagram illustrating steps of a method for optimizing performance of a solid state disk;
FIG. 3 is a schematic diagram of a solid state disk performance optimization device;
fig. 4 is an internal structural diagram of a computer device in an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application will be further described in detail with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the present application.
As shown in fig. 1, when a wafer in a solid state disk is detected to reach a write empty data period, determining whether the working time of a data block exceeds the ending time threshold of the write empty data period; if not, determining whether the solid state disk receives a write request sent by a user in the last write empty data period; and finally, determining whether the solid state disk receives a read request sent by a user in the last write empty data period. When the processor in the solid state disk is detected to reach a temperature reading period, determining whether the temperatures of all temperature sensors reach a high temperature threshold value in the last temperature reading period; then determining whether the temperature of the temperature sensor reaches the high temperature threshold value in the last temperature reading period; and finally, determining whether the solid state disk receives a read request sent by a user in the last temperature reading period. The wafer detection and the processor detection in the solid state disk can be synchronously executed without sequence.
In one embodiment, as shown in fig. 2, the present invention provides a method for optimizing performance of a solid state disk, where the method includes:
s201, when a wafer in a solid state disk is detected to reach a write empty data period, determining whether the working time of a data block corresponding to the data block in the wafer exceeds the ending time threshold of the write empty data period;
s202, if not, modifying the write periodicity threshold and modifying the write empty data concurrency to a first concurrency threshold;
s203, when the processor in the solid state disk is detected to reach a temperature reading period, determining whether the temperatures of all the temperature sensors in the solid state disk reach a high temperature threshold value in the last temperature reading period;
s204, if not, modifying a scanning periodicity threshold of the temperature sensor and modifying the read temperature concurrency of the processor into a second concurrency threshold.
Specifically, taking the solid state disk filling period as 1 minute, RAID takes 31+1 as an example, when the working time of a data BLOCK with DIE (wafer) in the solid state disk reaches the end time threshold value in the 1 minute period, for example, when there is a BLOCK (data BLOCK) working at the last 10s, as in the prior art, the solid state disk itself will modify the write empty data concurrency to the maximum, that is, allow the maximum DIE to execute the write dummy operation in parallel, and modify the write periodicity threshold value corresponding to the DIE, the more blocs that remain to be closed, the larger the write periodicity threshold value, for example, when 32 blocs are not closed in the last 2s, the write empty data concurrency is modified to the maximum 4, and the write periodicity threshold value is modified to 0.25s, so that all blocs are closed at the last moment under the condition of parallel writing of every 4 DIE.
In one embodiment, the modifying the write periodicity threshold and modifying the write empty data concurrency to a first concurrency threshold includes:
determining whether the solid state disk receives a write request sent by a user in the last write empty data period;
if yes, modifying the write periodicity threshold to be a first write periodicity threshold and modifying the write empty data concurrency to be a first concurrency threshold;
if not, determining whether the solid state disk receives a read request sent by a user in the last write empty data period and modifying the write empty data concurrency into a first concurrency threshold.
Specifically, as described above, when it is detected that the solid state disk receives the write request sent by the user in the previous minute, the write periodicity threshold corresponding to all the DIE is modified to be the first write periodicity threshold, so that all the DIE completes its own write dummy operation as soon as possible, where the first write periodicity threshold may be set by the user through the background, for example, the user hopes that all the DIE can complete its own write dummy operation within the previous 20s, the first write periodicity threshold may be set to be 0.625s, that is, it is required that each DIE completes its own write dummy operation within 0.625s, and after the concurrency of write empty data is modified to be 1 (when the first concurrency threshold is 1 is optimal), only one DIE is used at the same time to perform its own write dummy operation, so that the solid state disk does not affect the write request sent by the user at this time when it is randomly read, in the prior art, that the write empty data concurrency settings may be relatively large, that is, if multiple DIE's may exist at the same time, the solid state disk may delay the write operation performed by the user.
In one embodiment, the determining whether the solid state disk receives the read request sent by the user in the last write empty data period and modifying the write empty data concurrency to the first concurrency threshold includes:
if yes, modifying the write periodicity threshold to be a second write periodicity threshold;
and if not, modifying the write periodicity threshold to be the first write periodicity threshold.
Specifically, as described above, when it is determined that the solid state disk does not receive the user write request within the previous minute, it is further determined whether a user read request is received, if only the user read request is received, this indicates that, on the basis that the write empty data concurrency is also modified to be 1, the DIE in the solid state disk is controlled to complete the own write dummy operation with a longer second write periodicity threshold, for example, the second write periodicity threshold is set to be 1.25s, that is, all DIE write dummy operations are controlled to be completed within the first 40s in the write empty data period of 1 minute. If no user read request is received, preventing the user from being affected to complete the user write when a write request sent by the user is suddenly received during the current write empty data period, the write periodicity threshold is also set to the first periodicity threshold, which is 0.625s as described above.
In one embodiment, the modifying the write periodicity threshold to be the first write periodicity threshold and the write empty data concurrency to be the first concurrency threshold includes:
generating a wafer writing period corresponding to the wafer according to the wafer number and the first writing period threshold;
and controlling the wafer to execute the blank data writing operation according to the wafer writing period and the first concurrency threshold.
Specifically, as described above, DIE in the solid state disk are sequentially ordered from 0 to 31, at this time, a wafer writing period is generated according to the set wafer numbers of 0.625s and DIE0, that is, a timer period corresponding to the DIE is generated, then DIE0 is controlled to start to execute dummy writing to generate PADE0, after PAGE0 is written, on the basis that the wafer writing period of the laundry song is calculated to be 0.626s to 1.25s, timer is started to control DIE1 to execute dummy writing to generate PAGE1, and so on until 32 PAGEs are written. Thus, at the same time, only 1 DIE is performing a write operation, and the open block, i.e., the closing time of the working data block, is guaranteed.
In one embodiment, the modifying the scan periodicity threshold of the temperature sensor and modifying the read temperature concurrency of the processor to a second concurrency threshold comprises:
Determining whether the temperature of the temperature sensor reaches the high temperature threshold value in the last temperature reading period;
if yes, determining a temperature sensor which does not reach the high temperature threshold as a target sensor and modifying a target scanning periodic threshold of the target sensor into a long scanning periodic threshold;
if not, modifying the scanning periodic threshold values of all the temperature sensors into the long scanning periodic threshold value and modifying the read temperature concurrency into a second concurrency threshold value.
Specifically, when the processor in the solid state disk is detected to reach the temperature reading period, taking the temperature reading period of 15s as an example, determining whether the temperatures of all temperature sensors in the solid state disk reach the high temperature threshold value in the last 15s, if the temperatures reach the high temperature threshold value, the CPU does not need to operate, in the prior art, the CPU can modify the scanning periodic threshold value of each sensor into a short scanning periodic threshold value such as 1s (which can be set by a user), namely, the CPU can acquire 5 sensor temperatures in parallel every 1s at the same time in 15s, the time for acquiring 1 sensor temperature is 1ms, namely, 5ms of jitter is generated because of the parallel acquisition of 5 sensors every 1s at the moment, and if the solid state disk receives user reading at the moment, the pen reading operation can inevitably affect 5ms. However, if only 2 sensor temperatures reached the high temperature threshold within the last 15s, then the 2 sensor scan periodicity threshold is modified to 1s and the other 3 sensors scan periodicity threshold is determined to be a long scan periodicity threshold, such as 3s, where only five times during a 15s temperature reading period when there is a user reading occurrence may be affected by 5ms.
In one embodiment, the modifying the scan periodicity threshold of all temperature sensors to the long scan periodicity threshold and the read temperature concurrency to the second concurrency threshold comprises:
determining whether the solid state disk receives a read request sent by a user in a last temperature reading period;
if yes, the read temperature concurrency is modified to a second concurrency threshold.
Specifically, when the sensors in the solid state disk do not reach the high temperature threshold, determining whether random reads sent by the user are received within the last 15s, if yes, modifying the scanning periodicity threshold of all the sensors to 3s and modifying the concurrency of the reading temperature corresponding to the CPU to 1 (the effect when the second concurrency threshold is 1 is optimal), so that each read sent by the user is influenced by at most 1 sensor scanning temperature (1 ms) within 300 ms. If not, the scanning periodicity threshold of all the sensors is only modified to 3s, but the read temperature concurrency is not modified, i.e. the 5 sensor temperatures are still acquired in parallel.
In one embodiment, the modifying the read temperature concurrency to the second concurrency threshold includes:
Generating scanning temperature periods corresponding to all the temperature sensors according to the temperature reading period and the long scanning periodicity threshold;
and controlling the processor to read all the temperature sensors according to the scanning temperature period and the second concurrency threshold.
Specifically, when the scanning periodic threshold value of all the sensors is modified to 3s and the concurrency of the reading temperature corresponding to the CPU is modified to 1, a scanning temperature period similar to 0-3s is generated according to the scanning periodic threshold value of 3s and the temperature reading period of 15s, the CPU is controlled to read only 1 sensor in the period, the next sensor temperature is read in the next scanning temperature period after the reading is finished, namely, when the user reading is generated in the last 15s, when the sensor in the solid state disk is not abnormal, in order to reduce the influence on the user reading caused by the current 15s CPU reading temperature, the CPU is controlled to serially acquire the sensor temperature in a long period.
The scheme of the application has the following beneficial effects:
1) The method for writing the empty data in parallel by the wafer is changed into a method for writing the empty data in serial by the wafer, so that the performance of the solid state disk is improved;
2) The influence on the processing of the received user read-write request of the solid state disk is relieved by discretizing the temperature of the temperature sensor.
It should be understood that, although the steps in the flowchart of fig. 2 are shown in sequence as indicated by the arrows, the steps are not necessarily performed in sequence as indicated by the arrows. The steps are not strictly limited to the order of execution unless explicitly recited herein, and the steps may be executed in other orders. Moreover, at least some of the steps in fig. 2 may include multiple sub-steps or stages that are not necessarily performed at the same time, but may be performed at different times, nor do the order in which the sub-steps or stages are performed necessarily performed in sequence, but may be performed alternately or alternately with at least a portion of the sub-steps or stages of other steps or other steps.
In one embodiment, as shown in fig. 3, there is provided a solid state disk performance optimization apparatus, the apparatus including:
the time determining module 301 is configured to determine, when it is detected that a wafer in a solid state disk reaches a write empty data period, whether a working time of a data block corresponding to a data block in the wafer exceeds an end time threshold of the write empty data period;
a write modification module 302, if not, configured to modify the write periodicity threshold and modify the write empty data concurrency to a first concurrency threshold;
The temperature determining module 303 is configured to determine, when it is detected that the processor in the solid state disk reaches a temperature reading period, whether temperatures of all temperature sensors in the solid state disk reach a high temperature threshold in a last temperature reading period;
and a scan modification module 304, if not, configured to modify a scan periodicity threshold of the temperature sensor and modify read temperature concurrency of the processor to a second concurrency threshold.
In one embodiment, the write modification module modifies the write periodicity threshold and modifies the write empty data concurrency to include:
determining whether the solid state disk receives a write request sent by a user in the last write empty data period;
if yes, modifying the write periodicity threshold to be a first write periodicity threshold and modifying the write empty data concurrency to be a first concurrency threshold;
if not, determining whether the solid state disk receives a read request sent by a user in the last write empty data period and modifying the write empty data concurrency into a first concurrency threshold.
In one embodiment, the determining, by the write modification module, whether the solid state disk receives a read request sent by a user in a last write empty data period and modifying the write empty data concurrency to a first concurrency threshold includes:
If yes, modifying the write periodicity threshold to be a second write periodicity threshold;
and if not, modifying the write periodicity threshold to be the first write periodicity threshold.
In one embodiment, the write modification module modifying the write periodicity threshold to a first write periodicity threshold and modifying the write empty data concurrency to a first concurrency threshold includes:
generating a wafer writing period corresponding to the wafer according to the wafer number and the first writing period threshold value, and controlling the wafer to sequentially execute blank data writing operation according to the wafer writing period;
and after the execution of the blank data writing operation by the previous wafer is completed, generating a wafer writing period corresponding to the next wafer according to the first writing period threshold and the wafer number, and controlling the next wafer to execute the blank data writing operation.
In one embodiment, the modifying the scan periodicity threshold of the modified temperature sensor and modifying the read temperature concurrency of the processor to a second concurrency threshold comprises:
determining whether the temperature of the temperature sensor reaches the high temperature threshold value in the last temperature reading period;
If yes, determining a temperature sensor which does not reach the high temperature threshold as a target sensor and modifying a target scanning periodic threshold of the target sensor into a long scanning periodic threshold;
if not, modifying the scanning periodic threshold values of all the temperature sensors into the long scanning periodic threshold value and modifying the read temperature concurrency into a second concurrency threshold value.
In one embodiment, the modifying the scan periodicity threshold of all temperature sensors to the long scan periodicity threshold and modifying the read temperature concurrency to a second concurrency threshold comprises:
determining whether the solid state disk receives a read request sent by a user in a last temperature reading period;
if yes, the read temperature concurrency is modified to a second concurrency threshold.
In one embodiment, the modifying the read temperature concurrency to the second concurrency threshold includes:
generating scanning temperature periods corresponding to all the temperature sensors according to the temperature reading period and the long scanning periodicity threshold;
and controlling the processor to sequentially read all the temperature sensors according to the scanning temperature period.
For specific limitation of the solid state disk performance optimization device, reference may be made to the limitation of the solid state disk performance optimization method hereinabove, and no further description is given here. All or part of each module in the solid state disk performance optimization device can be realized by software, hardware and a combination thereof. The above modules may be embedded in hardware or may be independent of a processor in the computer device, or may be stored in software in a memory in the computer device, so that the processor may call and execute operations corresponding to the above modules.
In one embodiment, a computer device is provided, which may be a terminal, and the internal structure of which may be as shown in fig. 4. The computer device includes a processor, a memory, a network interface, a display screen, and an input device connected by a system bus. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and computer programs in the non-volatile storage media. The network interface of the computer device is used for communicating with an external terminal through a network connection. The computer program, when executed by a processor, implements an alert information processing method. The display screen of the computer equipment can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer equipment can be a touch layer covered on the display screen, can also be keys, a track ball or a touch pad arranged on the shell of the computer equipment, and can also be an external keyboard, a touch pad or a mouse and the like.
Those skilled in the art will appreciate that the structures shown in FIG. 4 are block diagrams only and do not constitute a limitation of the computer device on which the present aspects apply, and that a particular computer device may include more or less components than those shown, or may combine some of the components, or have a different arrangement of components.
In one embodiment, an electronic device is provided that includes a memory, a processor, and a computer program stored on the memory and executable on the processor, the processor implementing the steps of:
when the wafer in the solid state disk is detected to reach a write empty data period, determining whether the working time of a data block corresponding to the data block in the wafer exceeds the ending time threshold of the write empty data period;
if not, modifying the write periodicity threshold and modifying the write empty data concurrency to a first concurrency threshold;
when the processor in the solid state disk reaches a temperature reading period, determining whether the temperatures of all the temperature sensors in the solid state disk reach a high temperature threshold value in the last temperature reading period;
If not, modifying the scanning periodic threshold of the temperature sensor and modifying the read temperature concurrency of the processor to a second concurrency threshold.
In one embodiment, the processor, when executing the computer program, performs the steps of:
the modifying the write periodicity threshold and modifying the write empty data concurrency to a first concurrency threshold includes:
determining whether the solid state disk receives a write request sent by a user in the last write empty data period;
if yes, modifying the write periodicity threshold to be a first write periodicity threshold and modifying the write empty data concurrency to be a first concurrency threshold;
if not, determining whether the solid state disk receives a read request sent by a user in the last write empty data period and modifying the write empty data concurrency into a first concurrency threshold.
In one embodiment, the processor, when executing the computer program, performs the steps of:
the determining whether the solid state disk receives the read request sent by the user in the last write empty data period and modifying the write empty data concurrency into a first concurrency threshold value comprises the following steps:
If yes, modifying the write periodicity threshold to be a second write periodicity threshold;
and if not, modifying the write periodicity threshold to be the first write periodicity threshold.
In one embodiment, the processor, when executing the computer program, performs the steps of:
the modifying the write periodicity threshold to a first write periodicity threshold and the writing null data concurrency to a first concurrency threshold includes:
generating a wafer writing period corresponding to the wafer according to the wafer number and the first writing period threshold;
controlling the wafer to execute blank data writing operation according to the wafer writing period and the first concurrency threshold;
in one embodiment, the processor, when executing the computer program, performs the steps of: the modifying the scan periodicity threshold of the temperature sensor and modifying the read temperature concurrency of the processor to a second concurrency threshold includes:
determining whether the temperature of the temperature sensor reaches the high temperature threshold value in the last temperature reading period;
if yes, determining a temperature sensor which does not reach the high temperature threshold as a target sensor and modifying a target scanning periodic threshold of the target sensor into a long scanning periodic threshold;
If not, modifying the scanning periodic threshold values of all the temperature sensors into the long scanning periodic threshold value and modifying the read temperature concurrency into a second concurrency threshold value.
In one embodiment, the processor, when executing the computer program, performs the steps of:
the modifying the scan periodicity threshold of all temperature sensors to the long scan periodicity threshold and the read temperature concurrency to a second concurrency threshold includes:
determining whether the solid state disk receives a read request sent by a user in a last temperature reading period;
if yes, the read temperature concurrency is modified to a second concurrency threshold.
In one embodiment, the processor, when executing the computer program, performs the steps of:
the modifying the read temperature concurrency to a second concurrency threshold includes:
generating scanning temperature periods corresponding to all the temperature sensors according to the temperature reading period and the long scanning periodicity threshold;
and controlling the processor to read all the temperature sensors according to the scanning temperature period and the second concurrency threshold.
In one embodiment, a computer readable storage medium is provided having stored thereon a computer program which when executed by a processor performs the steps of:
when the wafer in the solid state disk is detected to reach a write empty data period, determining whether the working time of a data block corresponding to the data block in the wafer exceeds the ending time threshold of the write empty data period;
if not, modifying the write periodicity threshold and modifying the write empty data concurrency to a first concurrency threshold;
when the processor in the solid state disk reaches a temperature reading period, determining whether the temperatures of all the temperature sensors in the solid state disk reach a high temperature threshold value in the last temperature reading period;
if not, modifying the scanning periodic threshold of the temperature sensor and modifying the read temperature concurrency of the processor to a second concurrency threshold.
In one embodiment, the modifying the write periodicity threshold and modifying the write empty data concurrency to a first concurrency threshold includes:
determining whether the solid state disk receives a write request sent by a user in the last write empty data period;
If yes, modifying the write periodicity threshold to be a first write periodicity threshold and modifying the write empty data concurrency to be a first concurrency threshold;
if not, determining whether the solid state disk receives a read request sent by a user in the last write empty data period and modifying the write empty data concurrency into a first concurrency threshold.
In one embodiment, the determining whether the solid state disk receives the read request sent by the user in the last write empty data period and modifying the write empty data concurrency to the first concurrency threshold includes:
if yes, modifying the write periodicity threshold to be a second write periodicity threshold;
and if not, modifying the write periodicity threshold to be the first write periodicity threshold.
In one embodiment, the modifying the write periodicity threshold to be the first write periodicity threshold and the write empty data concurrency to be the first concurrency threshold includes:
generating a wafer writing period corresponding to the wafer according to the wafer number and the first writing period threshold;
controlling the wafer to execute blank data writing operation according to the wafer writing period and the first concurrency threshold;
In one embodiment, the modifying the scan periodicity threshold of the temperature sensor and modifying the read temperature concurrency of the processor to a second concurrency threshold comprises:
determining whether the temperature of the temperature sensor reaches the high temperature threshold value in the last temperature reading period;
if yes, determining a temperature sensor which does not reach the high temperature threshold as a target sensor and modifying a target scanning periodic threshold of the target sensor into a long scanning periodic threshold;
if not, modifying the scanning periodic threshold values of all the temperature sensors into the long scanning periodic threshold value and modifying the read temperature concurrency into a second concurrency threshold value.
In one embodiment, the modifying the scan periodicity threshold of all temperature sensors to the long scan periodicity threshold and the read temperature concurrency to the second concurrency threshold comprises:
determining whether the solid state disk receives a read request sent by a user in a last temperature reading period;
if yes, the read temperature concurrency is modified to a second concurrency threshold.
In one embodiment, the modifying the read temperature concurrency to the second concurrency threshold includes:
Generating scanning temperature periods corresponding to all the temperature sensors according to the temperature reading period and the long scanning periodicity threshold;
and controlling the processor to read all the temperature sensors according to the scanning temperature period and the second concurrency threshold.
Those skilled in the art will appreciate that implementing all or part of the above described methods may be accomplished by way of a computer program stored on a non-transitory computer readable storage medium, which when executed, may comprise the steps of the embodiments of the methods described above. Any reference to memory, storage, database, or other medium used in the various embodiments provided herein may include non-volatile and/or volatile memory. The nonvolatile memory can include Read Only Memory (ROM), programmable ROM (PROM), electrically Programmable ROM (EPROM), electrically Erasable Programmable ROM (EEPROM), or flash memory. Volatile memory can include Random Access Memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in a variety of forms such as Static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double Data Rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous Link DRAM (SLDRAM), memory bus direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM), among others.
The technical features of the above embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.
The above examples merely represent a few embodiments of the present application, which are described in more detail and are not to be construed as limiting the scope of the invention. It should be noted that it would be apparent to those skilled in the art that various modifications and improvements could be made without departing from the spirit of the present application, which would be within the scope of the present application. Accordingly, the scope of protection of the present application is to be determined by the claims appended hereto.
Claims (10)
1. A method for optimizing performance of a solid state disk, the method comprising:
when the wafer in the solid state disk is detected to reach a write empty data period, determining whether the working time of a data block corresponding to the data block in the wafer exceeds the ending time threshold of the write empty data period;
if not, modifying the write periodicity threshold and modifying the write empty data concurrency to a first concurrency threshold;
When the processor in the solid state disk reaches a temperature reading period, determining whether the temperatures of all the temperature sensors in the solid state disk reach a high temperature threshold value in the last temperature reading period;
if not, modifying the scanning periodic threshold of the temperature sensor and modifying the read temperature concurrency of the processor to a second concurrency threshold.
2. The method of claim 1, wherein the modifying the write periodicity threshold and modifying the write empty data concurrency to a first concurrency threshold comprises:
determining whether the solid state disk receives a write request sent by a user in the last write empty data period;
if yes, modifying the write periodicity threshold to be a first write periodicity threshold and modifying the write empty data concurrency to be a first concurrency threshold;
if not, determining whether the solid state disk receives a read request sent by a user in the last write empty data period and modifying the write empty data concurrency into a first concurrency threshold.
3. The method of claim 2, wherein determining whether the solid state disk received a read request sent by a user in a last write empty data period and modifying the write empty data concurrency to a first concurrency threshold comprises:
If yes, modifying the write periodicity threshold to be a second write periodicity threshold;
and if not, modifying the write periodicity threshold to be the first write periodicity threshold.
4. The method of claim 2, wherein after modifying the write periodicity threshold to a first write periodicity threshold and modifying the write null data concurrency to a first concurrency threshold comprises:
generating a wafer writing period corresponding to the wafer according to the wafer number and the first writing period threshold;
and controlling the wafer to execute the blank data writing operation according to the wafer writing period and the first concurrency threshold.
5. The method of claim 1, wherein modifying the scan periodicity threshold of the temperature sensor and modifying the read temperature concurrency of the processor to a second concurrency threshold comprises:
determining whether the temperature of the temperature sensor reaches the high temperature threshold value in the last temperature reading period;
if yes, determining a temperature sensor which does not reach the high temperature threshold as a target sensor and modifying a target scanning periodic threshold of the target sensor into a long scanning periodic threshold;
If not, modifying the scanning periodic threshold values of all the temperature sensors into the long scanning periodic threshold value and modifying the read temperature concurrency into a second concurrency threshold value.
6. The method of claim 5, wherein modifying the scan periodicity threshold for all temperature sensors to the long scan periodicity threshold and modifying the read temperature concurrency to a second concurrency threshold comprises:
determining whether the solid state disk receives a read request sent by a user in a last temperature reading period;
if yes, the read temperature concurrency is modified to a second concurrency threshold.
7. The method of claim 6, wherein modifying the read temperature concurrency to a second concurrency threshold comprises:
generating scanning temperature periods corresponding to all the temperature sensors according to the temperature reading period and the long scanning periodicity threshold;
and controlling the processor to read all the temperature sensors according to the scanning temperature period and the second concurrency threshold.
8. A solid state disk performance optimization apparatus, the apparatus comprising:
The time determining module is used for determining whether the working time of the data block corresponding to the data block in the wafer exceeds the ending time threshold of the write empty data period when the wafer in the solid state disk is detected to reach the write empty data period;
the write modification module is used for modifying the write periodicity threshold and modifying the write empty data concurrency into a first concurrency threshold if not;
the temperature determining module is used for determining whether the temperatures of all the temperature sensors in the solid state disk reach a high temperature threshold value in the last temperature reading period when the processor in the solid state disk reaches the temperature reading period;
and the scanning modification module is used for modifying the scanning periodicity threshold value of the temperature sensor and modifying the read temperature concurrency of the processor into a second concurrency threshold value if the scanning periodicity threshold value of the temperature sensor is not equal to the second concurrency threshold value.
9. An electronic device, comprising:
one or more processors; and a memory associated with the one or more processors, the memory for storing program instructions that, when read for execution by the one or more processors, perform the method of any of claims 1-7.
10. A computer storage medium, characterized in that it has stored thereon a computer program, wherein the program, when executed by a processor, implements the method according to any of claims 1-7.
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