CN116208273A - Analog-digital mixed radio frequency receiver group delay test platform and method - Google Patents
Analog-digital mixed radio frequency receiver group delay test platform and method Download PDFInfo
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- CN116208273A CN116208273A CN202211059086.6A CN202211059086A CN116208273A CN 116208273 A CN116208273 A CN 116208273A CN 202211059086 A CN202211059086 A CN 202211059086A CN 116208273 A CN116208273 A CN 116208273A
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Abstract
The invention discloses a group delay test platform and method of an analog-digital mixed radio frequency receiver, wherein the group delay test platform comprises a first vector signal source, a second vector signal source, a first power divider, a second power divider, an excitation signal generator, a combiner, the analog-digital mixed radio frequency receiver, a digital adapter plate and a logic analyzer; the first vector signal source is simultaneously provided for a second vector signal source and an analog-digital mixed radio frequency receiver reference clock, the second vector signal source generates an OFDM modulation signal, an excitation signal is sent to the logic analyzer through one end of the second power divider, the logic analyzer is triggered to prepare to accept a test signal, the excitation signal is sent to the second vector signal source through the other end of the second power divider, and the excitation signal and the OFDM modulation signal are superimposed and input to the radio frequency receiver through the combiner and are connected to the logic analyzer through the digital adapter plate. After the logic analyzer receives the excitation signal again, the logic analyzer demodulates the I/Q data information of the test signal and calculates the group delay result. The invention solves the problem of accurate group delay measurement of the analog-digital mixed radio frequency receiver.
Description
Technical Field
The invention relates to the technical field of testing, in particular to a group delay testing platform and method for an analog-digital mixed radio frequency receiver.
Background
Radio frequency technology has a wide range of non-alternative roles in the wireless communications field. In all radio frequency receivers, the system is required to have good group delay characteristics for transmitting signals without distortion, the group delay is a transmission characteristic parameter inherent to a linear system and a network, the group delay is defined as delay generated by the system or the network on the whole of the signals when the group signals pass through the linear system or the network, and the fluctuation of the group delay in a certain signal bandwidth under a fixed frequency reflects the stability of the radio frequency receiving system to be tested. Along with the wide application and development of navigation positioning, aerospace measurement and control, modern communication and other technologies, an electronic system also evolves towards a digital direction, and a radio frequency receiver tends to be in an integrated and miniaturized state.
Aiming at the group delay measurement of the radio frequency receiver, the effective methods which can be adopted at home and abroad are mainly static test based on a vector network analyzer and dynamic test method based on carrier modulation. The vector network analyzer static test method adopts a relative measurement method to measure, requires an effective measurement method to accurately describe the phase reciprocity degree of the frequency conversion device in the calibration process, and has no known effective measurement method at home and abroad so far, so the method has great difficulty. The group delay measurement based on carrier modulation is applicable to a frequency conversion receiver which cannot be accessed by an internal local oscillator, and is the only choice for measurement. Furthermore, there is a method of using a measurement time interval instead of the phase measurement, which is lower in measurement accuracy than the conventional modulation method. The group delay test is directed to a purely analog radio frequency receiver system, and is directed to an analog-digital mixed radio frequency receiver, so that the problem of how to directly realize the group delay test is still to be solved at present.
Therefore, how to provide a brand new group delay test platform and method for an analog-digital hybrid radio frequency receiver is a problem that needs to be solved by those skilled in the art at present.
Disclosure of Invention
The technical solution of the invention is as follows: the platform and the method for realizing the group delay test of the radio frequency receiver aiming at the analog-digital mixing are provided for overcoming the defects of the prior art, and the problem of directly acquiring the group delay characteristic curve of the radio frequency receiver of the analog-digital mixing is solved.
The technical scheme of the invention is as follows: a group delay test platform of an analog-digital mixed radio frequency receiver comprises a first vector signal source, a second vector signal source, a first power divider, a second power divider, an excitation signal generator, a combiner, a digital adapter plate and a logic analyzer;
the first vector signal source provides the same reference clock for the second vector signal source and the analog-to-digital mixed radio frequency receiver through the first power divider, the second vector signal source generates an OFDM modulation signal, the center frequency of the OFDM modulation signal is consistent with the center frequency of the analog-to-digital mixed radio frequency receiver, and the bandwidth of the OFDM modulation signal is set in the range supported by the bandwidth of the radio frequency receiver; the output end of the excitation signal generator is connected with the second power divider, the pulse signal is sent to the logic analyzer through one end of the second power divider and used for triggering the logic analyzer to prepare to receive the test signal, the pulse signal is input to the second vector signal source through the other end of the second power divider, the pulse signal is converted from a digital signal to an analog signal through the second vector signal source and is output, the output of the second vector signal source is connected with the joint circuit, and the combiner is used for superposing the OFDM modulation signal and the pulse signal to obtain the test signal A; the test signal A is led out by the digital adapter plate after being input into the analog-digital mixed radio frequency receiver through a connecting wire, the test signal B is output, the digital adapter plate is connected with the test signal B to the logic analyzer, the logic analyzer is triggered by the test signal B, I/Q path data of the test signal B are demodulated, phase and frequency information of different frequencies in a fixed bandwidth are calculated, and a group delay curve corresponding to each frequency of the test signal B in the fixed bandwidth is directly displayed when the analog-digital mixed radio frequency receiver is in the center frequency of an input frequency band.
Further, in the present invention, the reference clock provided by the first vector signal source is a sine wave in the range of 10-80 MHz, and typically 40MHz is adopted.
Further, the test signal A is a signal synthesized by overlapping a pulse signal and an OFDM modulation signal in a time domain of a combiner, and the test signal A is an analog signal; the test signal B is a signal with the 0MHz as the center frequency and the same bandwidth as the test bandwidth of the OFDM modulation signal, and the phase of the test signal B is changed compared with that of the test signal A.
Further, in the invention, the pulse signal generated by the excitation signal generator is a positive pulse signal, and the rising edge triggers the logic analyzer.
Furthermore, the digital adapter plate transmits the test signal B to the circuit board of the logic analyzer through the connecting wire, so that the digital signal transfer function is realized.
Further, in the invention, the digital adapter plate is connected with the radio frequency receiver through a flat cable, and the digital adapter plate is connected with the logic analyzer through a DuPont line.
Further, the logic analyzer of the present invention needs to be configured as follows: the clock and pod voltage are both LVCMOS3.3V, and the sampling clock is set to be greater than or equal to 2 times of the bandwidth of the measured signal.
Furthermore, the logic analyzer of the invention needs to install VSA vector signal analysis software, and the VSA vector signal analysis software is utilized to directly calculate the phase and frequency information and group delay test curves at different frequencies in the fixed bandwidth of the test signal B.
The method for carrying out group delay measurement on the analog-digital mixed radio frequency receiver by utilizing the analog-digital mixed radio frequency receiver group delay test platform comprises the following steps:
the first vector signal is simultaneously provided to the same reference clock of the second vector signal source and the analog-digital mixed radio frequency receiver;
the second vector signal source generates an OFDM modulation signal, the excitation signal generator generates a pulse signal, the pulse signal is respectively sent to the logic analyzer and the second vector signal source, the output of the second vector signal source is connected with the joint circuit, and the joint circuit overlaps the OFDM modulation signal and the pulse signal to obtain a test signal A;
the logic analyzer is triggered after receiving the pulse signal, and starts to prepare to receive the test signal B; the test signal A is input to an analog-digital mixed radio frequency receiver through a connecting wire;
the test signal A is converted into a test signal B through an analog-to-digital ADC link in the radio frequency receiver, and the test signal B is transferred to a logic analyzer through a digital transfer board;
when the logic analyzer receives the test signal B, the logic analyzer starts to demodulate the I/Q path data of the test signal B, and the group delay characteristic curve of the test signal B at each signal frequency in the set bandwidth is directly obtained through VSA vector signal analysis software.
Compared with the prior art, the invention has the advantages that:
1. the invention breaks through the traditional method for testing the group delay of the analog radio frequency receiver by the network analyzer, adopts the combination of the logic analyzer and the vector signal analysis software, and can test the group delay system index of the complete radio frequency to digital link through the digital testing scheme.
2. The invention can test the group delay fluctuation curve of the modulation signal under different carrier frequencies and different bandwidths, namely the group delay fluctuation condition; from the test perspective, the method is convenient and easy to operate, and can meet the test requirements of all communication and radar radio frequency receivers.
3. Because the excitation signal is used as the trigger signal, the group delay information takes the phase of each frequency of the OFDM signal triggered by the excitation signal as a final calculation condition, so that the group delay characteristics of other devices in the system except the radio frequency receiver do not influence the test precision, and the system has the advantages of high test precision and no need of considering errors outside the tested system.
Drawings
Fig. 1 is a schematic diagram of a group delay test platform of a mixed-mode radio frequency receiver according to the present invention.
Fig. 2 is a schematic diagram of signal demodulation in a logic analyzer according to an embodiment of the present invention.
Fig. 3 is a schematic diagram of a group delay calculation principle in an embodiment of the present invention.
Detailed Description
As shown in fig. 1, in order to solve the problem that the existing test method and apparatus cannot directly test the group delay of the analog-to-digital mixed radio frequency receiver, the invention provides a group delay test platform of the analog-to-digital mixed radio frequency receiver, which comprises a first vector signal source, a second vector signal source, a first power divider, a second power divider, an excitation signal generator, a combiner, a digital adapter plate and a logic analyzer; in the embodiment, two purchased power dividers have the same model; the first vector signal source provides the same reference clock for the second vector signal source and the analog-digital mixed radio frequency receiver through the first power divider at the same time so as to ensure that the reference clocks of the second vector signal source and the analog-digital mixed radio frequency receiver are homologous, and avoid clock errors, and the reference clock in the embodiment is a sine wave of 40MHz. The second vector signal source generates an OFDM modulation signal, the center frequency of the generated OFDM modulation signal is consistent with that of the radio frequency receiver, the bandwidth of the OFDM modulation signal is set according to the bandwidth to be tested, and the test bandwidth is in the range of the bandwidth which can be supported by the radio frequency receiver.
The excitation signal generator generates an excitation signal, which in this embodiment is a positive pulse signal. Transmitting an excitation signal generated by the pulse signal generator to the logic analyzer through one end of the second power divider, and triggering the logic analyzer to prepare for receiving a test signal; the pulse signal is input to the second vector signal source through the other end of the second power divider, and after the pulse signal passes through the second vector signal source, the signal form is converted from a digital signal to an analog signal. The output signal of the second vector signal source comprises an OFDM modulation signal and a pulse signal, the output of the second vector signal source is connected with a combiner, the combiner overlaps the OFDM modulation signal and the pulse signal to obtain a test signal A, and the test signal A is an analog signal; the carrier frequency of the test signal A is WMHz, and the bandwidth is BMHz. The test signal A is output from the combiner to the analog-digital mixed radio frequency receiver through a connecting wire, and is output after analog-digital conversion through an ADC link integrated by the radio frequency receiver, so that a test signal B is obtained, and the phase of the test signal B is changed compared with that of the test signal A.
Because the digital signal part of the analog-digital mixed radio frequency receiver cannot be directly led out, in order to enable the logic analyzer to receive the test signal B, the digital adapter plate is used as a bridge for transferring the digital signal, the digital adapter plate is connected with the radio frequency receiver through a flat cable, and pins of the digital adapter plate and the logic analyzer are connected through a DuPont line.
The logic analyzer is provided with VSA vector signal analysis software, and in this embodiment, the logic analyzer is set up as follows: both the clock and pod voltages were chosen LVCMOS3.3V and the sampling clock was set to 61.44MHz.
The method for carrying out group delay measurement by utilizing the invention comprises the following steps:
the first vector signal source provides the same reference clock for the second vector signal source and the analog-digital mixed radio frequency receiver through the first power divider;
the second vector signal source generates an OFDM modulation signal, the excitation signal generator generates a pulse signal, the pulse signal is sent to the logic analyzer through one end of the second power divider, the pulse signal is sent to the second vector signal source through the other end of the second power divider, the output of the second vector signal source is connected with the joint circuit, and the joint circuit overlaps the OFDM modulation signal and the pulse signal to obtain a test signal A;
the logic analyzer is triggered after receiving the pulse signal sent by the excitation signal generator, and starts to prepare to receive the test signal B; the test signal A is input to an analog-digital mixed radio frequency receiver through a connecting wire;
the test signal A is converted through an ADC link in the radio frequency receiver to obtain a test signal B, and the test signal B is converted to a logic analyzer through a digital adapter plate;
when the logic analyzer receives the test signal B, the logic analyzer starts to demodulate the I/Q path data of the test signal B, and the group delay characteristic curve of the test signal B at each signal frequency in the bandwidth set at this time is directly obtained through VSA vector signal analysis software.
Fig. 2 is a schematic diagram of signal demodulation in a logic analyzer capable of receiving and processing digital signals. In this embodiment, the receiving local oscillator of the analog-digital mixed radio frequency receiver is W, the value range of W is 70 MHz-6 GHz, the center frequency of the analog-digital mixed radio frequency receiver is 2400MHz, and the bandwidth of the ofdm modulation signal is set to 20MHz according to the test requirement. After the test signal A passes through an analog-to-digital ADC link of a radio frequency receiver, a test signal B is obtained, the test signal B is a broadband signal with the bandwidth of 20MHz and the center frequency of 0MHz after frequency mixing down-conversion, and the test signal B is the broadband signal with group delay and excitation information which needs to be analyzed by a logic analyzer; the test signal B is forwarded to the logic analyzer via the digital patch panel.
And after the logic analyzer receives the trigger of the excitation information in the test signal B, demodulating the I/Q path data of the test signal B. The signal frequencies obtained at this time are:
w 1 ＝I 1 +j*Q 1
w 2 ＝I 2 +j*Q 2
…
w N ＝I N +j*Q N
in the above, w 1 ，…，w N For complex representation of each signal frequency, I 1 ，…，I N 1-N paths of data of I channel, Q 1 ，…，Q N 1-N paths of data of Q channels.
Then, the phases of the signals with different frequencies are respectively obtained by VSA vector signal analysis software:
frequency 1 phase:
frequency 2 phase:
…
frequency N phase:
fig. 3 is a schematic diagram of a group delay calculation principle. In VSA vector signal analysis software, w is calculated 1 The group delay characteristic principle of the signal frequency is as follows:
in the above, τ e Alpha is the frequency variation quantity and is the group delay characteristic parameter; through the calculation of the formula, w can be obtained 1 Group delay information at the signal frequency. Will w 1 ，w 2 ，...w N The group delay information of different frequencies when the bandwidth of the modulation signal is 20MHz under the condition of fixed receiving local oscillation frequency is obtained by substituting the above formulas in turn. And drawing a group delay fluctuation curve according to the group delay parameters at each frequency, so as to obtain the group delay fluctuation condition. And the VSA vector signal analysis software is utilized to directly display the group delay characteristic curve of the test signal B at each signal frequency in the bandwidth set at this time.
In the test, please note that when setting the parameters of the rf receiver of the analog-to-digital mixing: the group delay will change with the bandwidth of the digital filter set by the radio frequency receiver, so that if the bandwidth of the analog and digital filters is not changed under the condition of unchanged receiving channel characteristics, the group delay of the receiving channel of the radio frequency receiver is not changed, i.e. the group delay is not related to how wide the signal is transmitted. For the analog-digital mixed radio frequency receiver, when the bandwidth of the digital filter is changed, the overall delay of the receiving channel is changed, so that the selected digital filter is required to be consistent in bandwidth during testing, and testing errors are avoided.
What is not described in detail in the present specification is a well known technology to those skilled in the art.
The described embodiments are only some, but not all, embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Claims (9)
1. The utility model provides a radio frequency receiver group delay test platform of modulus mixture which characterized in that: the device comprises a first vector signal source, a second vector signal source, a first power divider, a second power divider, an excitation signal generator, a combiner, a digital adapter plate and a logic analyzer;
the first vector signal source provides the same reference clock for the second vector signal source and the analog-to-digital mixed radio frequency receiver through the first power divider, the second vector signal source generates an OFDM modulation signal, the center frequency of the OFDM modulation signal is consistent with the center frequency of the analog-to-digital mixed radio frequency receiver, and the bandwidth of the OFDM modulation signal is set in the range supported by the bandwidth of the radio frequency receiver; the output end of the excitation signal generator is connected with the second power divider, the pulse signal is sent to the logic analyzer through one end of the second power divider and used for triggering the logic analyzer to prepare to receive the test signal, the pulse signal is input to the second vector signal source through the other end of the second power divider, the pulse signal is converted from a digital signal to an analog signal through the second vector signal source and is output, the output of the second vector signal source is connected with the joint circuit, and the combiner is used for superposing the OFDM modulation signal and the pulse signal to obtain the test signal A; the test signal A is led out by the digital adapter plate after being input into the analog-digital mixed radio frequency receiver through a connecting wire, the test signal B is output, the digital adapter plate is connected with the test signal B to the logic analyzer, the logic analyzer is triggered by the test signal B, I/Q path data of the test signal B are demodulated, phase and frequency information of different frequencies in a fixed bandwidth are calculated, and a group delay curve corresponding to each frequency of the test signal B in the fixed bandwidth is directly displayed when the analog-digital mixed radio frequency receiver is in the center frequency of an input frequency band.
2. The analog-to-digital hybrid radio frequency receiver group delay test platform of claim 1, wherein: the reference clock provided by the first vector signal source is a sine wave in the range of 10-80 MHz, and 40MHz is usually taken.
3. The analog-to-digital hybrid radio frequency receiver group delay test platform of claim 1, wherein: the test signal A is a signal synthesized by overlapping a pulse signal and an OFDM modulation signal in the time domain of a combiner, and the test signal A is an analog signal; the test signal B is a signal with the same bandwidth as the test bandwidth of the OFDM modulation signal by taking 0MHz as the center frequency after frequency mixing and frequency down conversion.
4. The analog-to-digital hybrid radio frequency receiver group delay test platform of claim 1, wherein: the pulse signal generated by the excitation signal generator is a positive pulse signal, and the rising edge triggers the logic analyzer.
5. The analog-to-digital hybrid radio frequency receiver group delay test platform of claim 1, wherein: the digital adapter board transmits the test signal B to a circuit board of the logic analyzer through a connecting wire, so that the digital signal transfer function is realized.
6. The analog-to-digital hybrid radio frequency receiver group delay test platform of claim 5, wherein: the digital adapter plate is connected with the analog-digital mixed radio frequency receiver through an FMC interface, and the digital adapter plate is connected with the logic analyzer through a special adapter wire of the logic analyzer.
7. The analog-to-digital hybrid radio frequency receiver group delay test platform of claim 1, wherein: the logic analyzer needs to set up as follows: the clock and pod voltage are both LVCMOS3.3V, and the sampling clock is set to be greater than or equal to 2 times of the bandwidth of the measured signal.
8. The analog-to-digital hybrid radio frequency receiver group delay test platform of claim 1, wherein: the logic analyzer needs to install VSA vector signal analysis software, and phase and frequency information and a group delay test curve at different frequencies in a fixed bandwidth of the test signal B are directly calculated by utilizing the VSA vector signal analysis software.
9. A method for group delay measurement of an analog-to-digital mixed radio frequency receiver based on a test platform as claimed in claim 1, comprising the steps of:
the first vector signal is simultaneously provided to the same reference clock of the second vector signal source and the analog-digital mixed radio frequency receiver;
the second vector signal source generates an OFDM modulation signal, the excitation signal generator generates a pulse signal, the pulse signal is respectively sent to the logic analyzer and the second vector signal source, the output of the second vector signal source is connected with the joint circuit, and the joint circuit overlaps the OFDM modulation signal and the pulse signal to obtain a test signal A;
the logic analyzer is triggered after receiving the pulse signal, and starts to prepare to receive the test signal B; the test signal A is input to an analog-digital mixed radio frequency receiver through a connecting wire;
the test signal A is converted into a test signal B through an analog-to-digital ADC link in the radio frequency receiver, and the test signal B is transferred to a logic analyzer through a digital transfer board;
when the logic analyzer receives the test signal B, the logic analyzer starts to demodulate the I/Q path data of the test signal B, and the group delay characteristic curve of the test signal B at each signal frequency in the set bandwidth is directly obtained through VSA vector signal analysis software.
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