CN116192299B - Communication interface test circuit - Google Patents
Communication interface test circuit Download PDFInfo
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- CN116192299B CN116192299B CN202310450704.8A CN202310450704A CN116192299B CN 116192299 B CN116192299 B CN 116192299B CN 202310450704 A CN202310450704 A CN 202310450704A CN 116192299 B CN116192299 B CN 116192299B
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/30—Monitoring; Testing of propagation channels
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L12/00—Data switching networks
- H04L12/28—Data switching networks characterised by path configuration, e.g. LAN [Local Area Networks] or WAN [Wide Area Networks]
- H04L12/40—Bus networks
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L43/00—Arrangements for monitoring or testing data switching networks
- H04L43/08—Monitoring or testing based on specific metrics, e.g. QoS, energy consumption or environmental parameters
- H04L43/0805—Monitoring or testing based on specific metrics, e.g. QoS, energy consumption or environmental parameters by checking availability
- H04L43/0817—Monitoring or testing based on specific metrics, e.g. QoS, energy consumption or environmental parameters by checking availability by checking functioning
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L12/00—Data switching networks
- H04L12/28—Data switching networks characterised by path configuration, e.g. LAN [Local Area Networks] or WAN [Wide Area Networks]
- H04L12/40—Bus networks
- H04L2012/40208—Bus networks characterized by the use of a particular bus standard
- H04L2012/40215—Controller Area Network CAN
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Abstract
The application provides a communication interface test circuit relates to the quality detection field. The circuit is used for testing MEC; the circuit is provided with monitoring equipment, an SOC and a transceiver provided with a communication interface; the single transceiver forms a signal channel by self-shorting through a communication interface of the single transceiver; or/and the plurality of transceiver devices are/is connected with each other through communication interfaces of the plurality of transceiver devices in a short circuit manner to form a signal channel; the network communication output end of the SOC is connected to the monitoring equipment through a network port, and the monitoring equipment is configured to display the MEC interface state determined by the MEC according to the signals of the signal channels. In the circuit, the MEC and the monitoring equipment only need to be connected with one network cable, a plurality of test wires and test auxiliary equipment are not required to be arranged according to the communication interface, the number requirements on the test wires and the test auxiliary equipment are reduced, the building difficulty of a test environment is further reduced, and the test efficiency is improved.
Description
Technical Field
The application relates to the field of quality detection, in particular to a communication interface test circuit.
Background
In the vehicle-road cloud integrated system, MEC (Multi-access Edge Computing, chinese name: multiple access edge computing) is an indispensable key part, and can be used for carrying out fusion storage, computation uploading and feedback distribution on data of equipment such as road side cameras, radars, RSUs, traffic lights, temperature and humidity sensors and the like. The data transmission of the MEC and the peripheral devices is generally realized by transmission communication modes such as Ethernet, RS232, RS485, CAN and the like. The test verification of each actual function of the MEC is required before the MEC leaves the factory to ensure the reliability of the MEC leaves the factory. Currently, the common practice for reliability detection of MECs is: and connecting the functional interfaces of each practical application with corresponding peripheral products or monitoring equipment to detect whether the monitoring function of the MEC operates normally. However, the test mode requires a plurality of auxiliary equipment and cables, so that the construction difficulty of the test environment is improved, and the test efficiency is affected.
Disclosure of Invention
Accordingly, an object of the embodiments of the present application is to provide a communication interface testing circuit, which can reduce the requirements for auxiliary equipment and cables, further reduce the difficulty of building a testing environment, and improve the testing efficiency.
In a first aspect, an embodiment of the present application provides a communication interface testing circuit, where the circuit is configured to test an MEC; the circuit is provided with monitoring equipment, an SOC and a transceiver provided with a communication interface; the single transceiver forms a signal channel by self-shorting through a communication interface; or/and a plurality of the receiving and transmitting devices are/is connected with each other through respective communication interfaces in a short circuit manner to form a signal channel; the network communication output end of the SOC is connected to the monitoring equipment through a network port, and the monitoring equipment is configured to display the MEC interface state determined by the MEC according to the signals of the signal channels.
In the implementation process, the communication interfaces of the transceiver are short-circuited in a corresponding short-circuit mode to form a signal channel, and the SOC determines the state of the MEC interface according to the test signals in the signal channel so as to test whether all the communication interfaces of the MEC are abnormal or not and display the abnormal state through the monitoring equipment. In the circuit, the MEC and the monitoring equipment only need to be connected with one network cable, and a plurality of test wires and test auxiliary equipment are not required to be arranged according to the communication interface, so that the number requirements on the test wires and the test auxiliary equipment are reduced. For the test of darkroom MEC, because only a network cable is needed between the MEC and the monitoring equipment, the network cable can isolate interference through an Ethernet optical port optical fiber of a laboratory, so that the monitoring equipment can be placed outside the darkroom for monitoring, and only the MEC and the test line exist in the darkroom, thereby avoiding the introduction of an auxiliary equipment interference test result, the test line cannot influence the length and placement of the auxiliary equipment, reducing the length requirement on the test line while reducing the auxiliary equipment, further reducing the difficulty of building the test environment, and improving the test efficiency. In addition, through testing the MEC interface, the function of the MEC can be tested, and the reliability of the MEC is improved.
In one embodiment, the transceiver is a plurality of transceivers; the plurality of transceiving devices comprise a plurality of types of sub-transceiving devices; communication interfaces of different types of sub-transceivers are interconnected and shorted by a conversion tool.
In the implementation process, for different types of sub-transceiving devices, the signal transmission mode, the transmission efficiency, the transmission distance, the interface type of the communication interface and the like may be different, the test lines connected with the communication interfaces of the different types of sub-transceiving devices cannot be directly shorted, and the test lines under the condition can be interconnected and shorted by setting a conversion tool, so that the rest of sub-transceiving devices can also form a signal channel, a plurality of test lines are not required to be independently arranged for the communication interfaces of the rest of sub-transceiving devices, and the number requirements for the test lines are reduced. In addition, the conversion tool has small volume, small influence on information and low cost, and can reduce the requirement of the circuit on the test environment.
In one embodiment, the transceiver device comprises a half-duplex communication sub-transceiver device and a full-duplex communication sub-transceiver device; the first sub communication interface of the sub transceiver for half duplex communication is in short connection with the first sub communication interface of the sub transceiver for full duplex communication through the conversion tool, and the first sub communication interface of the sub transceiver for half duplex communication and the first sub communication interface of the sub transceiver for full duplex communication are different types of sub communication interfaces; the second sub communication interface of the sub transceiver for half duplex communication is in short connection with the second sub communication interface of the sub transceiver for full duplex communication through the conversion tool, and the second sub communication interface of the sub transceiver for half duplex communication and the second sub communication interface of the sub transceiver for full duplex communication are different types of sub communication interfaces.
In the above implementation process, when the sub transceiver for half duplex communication is connected to the communication interface of the sub transceiver for full duplex communication, because the sub transceiver for half duplex communication and the sub transceiver for full duplex communication belong to two different types of transceivers 210, the communication interface of the sub transceiver for half duplex communication and the communication interface of the sub transceiver for full duplex communication are interconnected and shorted by the conversion tool, so that the sub transceivers incapable of shorting with the sub transceivers of the same type to form a signal channel also form a signal channel, thereby reducing the number requirements on the test line 110.
In one embodiment, wherein the transceiver comprises a CAN transceiver; the number of the CAN transceivers is singular, and the communication interfaces of every two CAN transceivers are short-circuited; the monitoring equipment is connected with the redundant first sub-communication interface of the CAN transceiver and the redundant second sub-communication interface of the CAN transceiver so as to display the redundant communication interface state of the CAN transceiver through the monitoring equipment.
In the implementation process, for the redundant CAN transceiver, the redundant CAN transceiver is directly connected with the monitoring equipment, and compared with a mode of shorting the CAN transceiver and other types of sub-transceiver devices to form a signal channel, the requirement on a conversion tool CAN be reduced, the interference test result of the conversion tool is avoided, the length and the placement of a test wire cannot be influenced by the conversion tool, and the length requirement on the test wire is reduced while the conversion tool is reduced.
In one embodiment, the plurality of said transceiving means comprises a plurality of types of sub-transceiving means; the communication interfaces of the same type of sub-transceivers are directly shorted.
In the implementation process, for the same type of sub-transceiver, because the signal transmission mode, the transmission efficiency, the transmission distance, the interface type of the communication interface and the like are the same, the test line connected with the communication interface of the same type of sub-transceiver can be directly shorted, and the test line is directly shorted, compared with the mode of shorting the test line connected with the communication interface of different types of sub-transceivers, the requirement of the communication interface test circuit on a conversion tool can be reduced, and further the requirement of auxiliary equipment is reduced, so that the influence of the auxiliary equipment on a test result is reduced, and the test accuracy is improved while the cost is reduced.
In one embodiment, the same type of transceiver device includes a plurality of communication interfaces; the plurality of communication interfaces comprise a plurality of types of sub-communication interfaces; if the sub-transceiver is half-duplex communication, the sub-communication interfaces of the same type are directly interconnected and shorted.
In the implementation process, the communication interfaces of the sub-transceiving devices of the same type of half-duplex communication are tested, and when the test line is in short circuit, the sub-communication interfaces of the same type are directly connected in short circuit, so that the actual wiring condition of the MEC and external equipment can be simulated more truly, and the accuracy of the communication interfaces is improved.
In one embodiment, the transceiver device comprises a first sub-transceiver device and a second sub-transceiver device, and the first sub-transceiver device and the second sub-transceiver device are sub-transceiver devices for half duplex communication of the same type; the first sub communication interface of the first sub transceiver and the first sub communication interface of the second sub transceiver are directly interconnected and short-circuited, and the first sub communication interface of the first sub transceiver and the first sub communication interface of the second sub transceiver are the same type of sub communication interface; the second sub communication interface of the first sub transceiver and the second sub communication interface of the second sub transceiver are directly interconnected and short-circuited, and the second sub communication interface of the first sub transceiver and the second sub communication interface of the second sub transceiver are the same type of sub communication interface.
In the implementation process, when the transceiver device comprises a plurality of half-duplex communication sub-transceivers of the same type, two sides of the same type of sub-communication interfaces of each two half-duplex communication sub-transceivers are directly in short circuit through the test line, compared with the mode of short circuit of the test line connected with the communication interfaces of different types of sub-transceivers, the requirement of the communication interface test circuit on a conversion tool can be reduced, and further, the requirement of auxiliary equipment is reduced, so that the influence of the auxiliary equipment on a test result is reduced, and the test accuracy is improved while the cost is reduced.
In one embodiment, the same type of sub-transceiver device includes a plurality of communication interfaces, the plurality of communication interfaces including a plurality of types of sub-communication interfaces; if the sub-transceiver is full duplex communication, the sub-communication interfaces of different types are directly and self-shorted.
In the implementation process, the communication interface test of the sub-transceiver device for full duplex communication is performed, when the sub-transceiver device is in short circuit, the sub-communication interfaces of different types are in self short circuit through the test line, so that the actual wiring condition of the MEC and the external equipment can be simulated more truly, and the accuracy of the communication interface is improved.
In one embodiment, the transceiving means comprises at least one sub-transceiving means for full duplex communication; the first sub communication interface of the full duplex communication sub transceiver and the second sub communication interface of the full duplex communication sub transceiver are directly and self-short-circuited, and the first sub communication interface of the full duplex communication sub transceiver and the second sub communication interface of the full duplex communication sub transceiver are different types of communication interfaces; the third sub communication interface of the full duplex communication sub transceiver and the fourth sub communication interface of the full duplex communication sub transceiver are directly and self-short-circuited, and the third sub communication interface of the full duplex communication sub transceiver and the fourth sub communication interface of the full duplex communication sub transceiver are different types of communication interfaces; the first sub communication interface of the full duplex communication sub transceiver and the third sub communication interface of the full duplex communication sub transceiver are the same type communication interfaces, and the second sub communication interface of the full duplex communication sub transceiver and the fourth sub communication interface of the full duplex communication sub transceiver are the same type communication interfaces.
In the implementation process, when the receiving and transmitting device comprises the full duplex communication sub receiving and transmitting device, two sides of different types of sub communication interfaces of the full duplex communication sub receiving and transmitting device are directly short-circuited through the test line, so that the actual wiring condition of the MEC and the external equipment can be simulated more truly, and the accuracy of the communication interfaces is improved.
In one embodiment, at least every two of the communication interfaces are shorted by a test line.
In the implementation process, the test line is low in price and easy to acquire, and at least every two communication interfaces are short-circuited through the test line, so that the circuit difficulty in short-circuited communication interfaces can be reduced, and meanwhile, the cost of the test circuit is reduced.
In order to make the above objects, features and advantages of the present application more comprehensible, embodiments accompanied with figures are described in detail below.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are needed in the embodiments will be briefly described below, it being understood that the following drawings only illustrate some embodiments of the present application and therefore should not be considered limiting the scope, and that other related drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
Fig. 1 is a schematic diagram of a communication interface test circuit according to an embodiment of the present application;
fig. 2 is a schematic diagram of a communication interface test circuit provided with an RS485 transceiver according to an embodiment of the present application;
fig. 3 is a schematic diagram of a communication interface test circuit of a CAN transceiver according to an embodiment of the present application;
fig. 4 is a schematic diagram of a communication interface test circuit of two RS485 transceivers and two CAN transceivers provided in the embodiment of the present application.
Description of the drawings: 100-communication interface test circuit, 110-test line, 120-monitoring equipment, 200-MEC, 210-transceiver, 220-SOC, 230-network port.
Detailed Description
The technical solutions in the embodiments of the present application will be described below with reference to the drawings in the embodiments of the present application. For example, the flowchart and block diagrams in the figures illustrate the architecture, functionality, and operation of possible implementations of principle structures, systems, methods and computer program products according to various embodiments of the present invention. In this regard, each block in the flowchart or block diagrams may represent a module, a function block, a program segment, or a portion of code, which comprises one or more executable instructions for implementing the specified analog and logic functions. It should also be noted that in some alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved. It will also be noted that each block of the block diagrams and/or flowchart illustration, and combinations of blocks in the block diagrams and/or flowchart illustration, can be implemented by special purpose hardware-based systems which perform the specified functions or acts, or combinations of special purpose hardware and computer instructions. In addition, functional modules in the embodiments of the present invention may be integrated together to form a single part, or each module may exist alone, or two or more modules may be integrated to form a single part.
The inventor of the application finds that the current EMC reliability test has various defects through long-term research. For example, from the EMC reliability certification link, the test environment needs to be set up as close as possible to the actual application scene, the functional interfaces of each application of the road side MEC product need to be corresponding auxiliary devices for communication or monitoring, and the setting up of the test monitoring environment is affected by a plurality of auxiliary devices.
Also for dark room type EMC tests, it is necessary to shield the auxiliary equipment from interference. The general practice is as follows: the auxiliary equipment is placed in a shielding box or led out of a darkroom, each functional interface of the anti-interference darkroom test is connected to the corresponding auxiliary equipment for monitoring through a test wire, for example, the functional interface is connected to an upper computer test computer, the upper computer test computer is connected to a monitoring room outside the darkroom, the interface of the front laboratory, which CAN be led out of the darkroom, is generally only a network interface optical fiber, the CAN optical isolation equipment is only available in an individual laboratory, and for RS232 and RS485, the functional interfaces CAN only be pulled out of the darkroom, so that the cable length is increased, and the test result is affected.
From the aspect of environment reliability authentication, various auxiliary equipment and cables can influence the construction of a test monitoring environment. For example, the temperature cycle test may be performed by simultaneously connecting the lifting devices to be tested in the same test chamber, in which case a certain length of cable is required. If two test boxes are adopted for testing respectively, a plurality of equipment cables cannot be transferred in time, so that the test result is affected.
In view of this, this application provides a communication interface test circuit, through with the test line of being connected with the communication interface in this MEC keep away from this MEC one end short circuit, with the test signal transmission that sends the communication interface to supervisory equipment through the net gape of this MEC, reduced the demand to auxiliary assembly and test line in this MEC test, solved because of auxiliary assembly is numerous, the pencil is complicated, build test environment difficulty and influence the difficult problem of efficiency of software testing in reliability test authentication process to MEC and similar product, simplified shortened the whole process cycle of reliability test, saved project test research and development cost. In addition, through testing the MEC interface, the function of the MEC can be tested, and the reliability of the MEC is improved.
Referring to fig. 1, a schematic diagram of a communication interface testing circuit 100 according to an embodiment of the present application is shown. The circuit is used for testing the MEC 200; the circuit is provided with a monitoring device 120, an SOC220 and a transceiver 210 with a communication interface.
Wherein, the single transceiver 210 forms a signal channel by self-shorting through its communication interface; or/and the plurality of transceiver devices 210 are/is connected with each other through respective communication interfaces in a short circuit manner to form a signal channel; the network communication output end of the SOC (System on Chip, chinese name: system on Chip) 220 is connected to the monitoring device 120 through the network port 230.
The transceiver 210 described above includes one or more transceivers 210. When the number of transceivers 210 is plural, and the transceivers 210 need to form signal paths by shorting, the transceivers 210 may include multiple shorting modes.
In some embodiments, each of the plurality of transceivers 210 may be self-shorting through more than two communication interfaces of the transceiver 210 itself to form a signal path.
In other embodiments, part of the transceiver 210 may be self-shorted to form a signal channel through two or more communication interfaces of the transceiver 210 itself. Another portion of the transceivers 210 may be shorted to form a signal path by the communication interface of the transceiver 210 itself and the communication interfaces of the other transceivers 210.
In other embodiments, all of the plurality of transceivers 210 are shorted to form a signal path through the communication interfaces of the transceivers 210 themselves and the communication interfaces of the other transceivers 210.
The self-shorting is a shorting manner between communication interfaces of the transceiver 210 itself. The interconnection shorting is a shorting manner between the communication interface of the transceiver 210 itself and the communication interfaces of other transceivers 210. The communication interfaces of the single transceiver device are in self-shorting connection, and the communication interfaces of the plurality of transceiver devices are in interconnection shorting connection through the test line.
Wherein, the communication interfaces needing short circuit are all connected with the test line 110; the test line 110 is shorted at an end remote from the communication interface according to the actual wiring rules of the MEC200 to form a signal path.
The monitoring device 120 and the network port 230 may be connected through a network cable, where the monitoring device 120 is configured to obtain a signal of the communication interface state through the network port 230 and display the communication interface state.
Optionally, the monitoring device 120 may display the status of the communication interface by means of text, images, sound, light, etc. The monitoring device 120 may be a host computer, a display, an alarm, a speaker, an indicator light, etc.
In some embodiments, the SOC220 determines the MEC interface status from the signal of the signal path. In some embodiments, when the SOC220 tests the MEC200 with the communication interface test circuit 100, a test signal sent by a communication interface connected to one end of the shorted test line 110 is transmitted to the SOC220 of the MEC200 through a communication interface connected to the other end of the shorted test line 110, the SOC220 determines, according to the test signal, whether a signal channel formed by the MEC200 connected to two ends of the shorted test line 110 and the shorted test line 110 is abnormal, and transmits a test result to the monitoring device 120 through a network of the MEC200, where the monitoring device 120 is configured to feed back the test result. The monitoring device 120 may be implemented by displaying on a display, broadcasting or broadcasting by a speaker through voice, or broadcasting by a warning lamp when feeding back the test result.
The test line 110 may be a plurality of types of communication lines. The test line 110 is different for each type of sub-transceiver device with different communication interfaces. The selection of the test line 110 may be determined according to the communication interface of the sub-transceiver, which is not particularly limited in this application.
It will be appreciated that a plurality of transceivers 210 may be provided in one MEC200, the plurality of transceivers 210 comprising a plurality of types of sub-transceivers. The same type of sub-transceiver device comprises a plurality of communication interfaces, and the plurality of communication interfaces comprise a plurality of types of sub-communication interfaces.
The sub-transceiver means herein may comprise sub-transceiver means for half duplex communication and sub-transceiver means for full duplex communication. The sub-transceiving apparatus of half duplex communication may include: RS485 transceiver, CAN transceiver, etc. The sub-transceiving apparatus of full duplex communication may include: RS232 transceiver, RS422 transceiver, ethernet, etc.
It will be appreciated that the self-shorting and interconnect shorting of the transceiver device 210 in embodiments of the present application may be determined according to the actual wiring rules of the MEC 200. The actual wiring rules of the MEC200 in the embodiments of the present application may be stored in advance in the SOC220 of the CAN. The actual wiring rule of the MEC200 is that the sub-transceivers in the MEC200 can be connected, i.e. the test lines 110 connected by at least two communication interfaces that can be connected need to be shorted according to the actual use of the MEC200, so as to form a complete path.
In the implementation process, the communication interfaces of the transceiver are short-circuited in a corresponding short-circuit manner to form a signal channel, and the SOC220 determines the state of the MEC interface according to the test signal in the signal channel, so as to test whether all the communication interfaces of the MEC are abnormal or not, and display the abnormal communication interfaces through the monitoring device. In the circuit, the MEC and the monitoring equipment only need to be connected with one network cable, and a plurality of test wires and test auxiliary equipment are not required to be arranged according to the communication interface, so that the number requirements on the test wires and the test auxiliary equipment are reduced. For the test of darkroom MEC, because only a network cable is needed between the MEC and the monitoring equipment, the network cable can isolate interference through an Ethernet optical port optical fiber of a laboratory, so that the monitoring equipment can be placed outside the darkroom for monitoring, and only the MEC and the test line exist in the darkroom, thereby avoiding the introduction of an auxiliary equipment interference test result, the test line cannot influence the length and placement of the auxiliary equipment, reducing the length requirement on the test line while reducing the auxiliary equipment, further reducing the difficulty of building the test environment, and improving the test efficiency. In addition, through testing the MEC interface, the function of the MEC can be tested, and the reliability of the MEC is improved.
In one possible implementation, the communication interfaces of the different types of sub-transceivers are shorted by a switching tool interconnect.
It will be appreciated that two sub-transceivers of the same type may be shorted directly to each other via the test line 110 to form a plurality of signal paths. However, when a certain sub-transceiver is singular, more than one sub-transceiver cannot form a signal channel with the same type of sub-transceiver. The redundant sub-transceivers may be shorted to other types of sub-transceivers via the test line 110 to form multiple signal paths. Or the redundant sub-transceiver is directly connected with the monitoring equipment.
Because the signal transmission modes, transmission efficiency, transmission distances and interface types of the communication interfaces of the different types of sub-transceivers may be different, the test lines 110 connected with the communication interfaces of the different types of sub-transceivers cannot be directly shorted when being shorted, and the short circuits need to be interconnected through the switching tool, so that the communication interfaces of the different types of sub-transceivers can form signal channels.
Optionally, the switching tool may be an RS 485-to-RS 232 test tool, an RS 485-to-CAN test tool, an RS 232-to-CAN test tool, an RS 485-to-RS 422 test tool, an RS 422-to-CAN test tool, an RS 422-to-RS 232 test tool, or the like, where the switching tool may be a CAN interface to which the test wires 110 that are shorted as needed are respectively connected, and the selection of the switching tool may be adjusted according to the actual situation, which is not specifically limited in the present application.
It will be appreciated that when shorting the test line 110 connected to the MEC200, for a sub-transceiver for half-duplex communications, a signal path may be formed between two sub-transceivers for half-duplex communications by shorting the test line 110. For full duplex communication sub-transceivers, two different types of communication interfaces of each full duplex communication sub-transceiver are shorted by test line 110 to form a signal path. If the sub-transceiver for half duplex communication is singular, the redundant sub-transceiver for half duplex communication can be connected with the communication interface of the sub-transceiver for full duplex communication by interconnecting and shorting through the switching tool to form a signal channel.
In the implementation process, for different types of sub-transceivers, because the signal transmission mode, the transmission efficiency, the transmission distance, the interface type of the communication interface, and the like may be different, the test lines 110 connected with the communication interfaces of the different types of sub-transceivers cannot be directly shorted, and the test lines 110 under the condition can be interconnected and shorted by setting a conversion tool, so that the redundant sub-transceivers also form a signal channel, and the communication interfaces of the redundant sub-transceivers do not need to be independently provided with a plurality of test lines 110, thereby reducing the number requirements on the test lines 110. In addition, the conversion tool has small volume, small influence on information and low cost, and can reduce the requirement of the circuit on the test environment.
In one possible implementation, the shorted test line 110 is connected across different types of sub-communication interfaces.
In one possible implementation, the first sub-communication interface of the sub-transceiver for half-duplex communication is shorted to the first sub-communication interface of the sub-transceiver for full-duplex communication by a switching tool interconnection; the second sub communication interface of the sub transceiver for half duplex communication is short-circuited with the second sub communication interface of the sub transceiver for full duplex communication through the switching tool interconnection.
The first sub communication interface of the sub transceiver for half duplex communication and the first sub communication interface of the sub transceiver for full duplex communication are different types of sub communication interfaces; the second sub-communication interface of the sub-transceiver for half-duplex communication and the second sub-communication interface of the sub-transceiver for full-duplex communication are different types of sub-communication interfaces.
The sub-transceiver means of the half duplex communication here may be an RS485 transceiver, a CAN transceiver, etc. If the sub-transceiver of the half-duplex communication is an RS485 transceiver, the first sub-communication interface of the sub-transceiver of the half-duplex communication may be an RS485_d+ interface, an RS 485_d-interface, or the like. The second sub communication interface of the sub transceiver for half duplex communication may also be an RS485_d+ interface, an RS 485_d-interface, etc. If the sub-transceiver of the half-duplex communication is a CAN transceiver, the first sub-communication interface of the sub-transceiver of the half-duplex communication may be a can_h interface, a can_l interface, or the like. The second sub communication interface of the sub transceiver for half duplex communication may also be a can_h interface, a can_l interface, or the like.
The above-mentioned sub-transceiver device for full duplex communication may be an RS232 transceiver, an RS422 transceiver, or the like. If the full duplex communication sub-transceiver is an RS232 transceiver, the first sub-communication interface of the full duplex communication sub-transceiver may be a TX1 interface or a TR2 interface, and the second sub-communication interface of the full duplex communication sub-transceiver may be a TX1 interface or a TR2 interface. If the full-duplex communication sub-transceiver is an RS422 transceiver, the first sub-communication interface of the full-duplex communication sub-transceiver may be an r+ interface, an R-interface, a t+ interface, or a T-interface, and the second sub-communication interface of the full-duplex communication sub-transceiver may also be an r+ interface, an R-interface, a t+ interface, or a T-interface.
Illustratively, as shown in fig. 2, the MEC200 includes an RS485 transceiver, an RS232 transceiver, and two CAN transceivers. The communication interface test circuit 100 of the MEC200 may be configured in the following manner: the TX1 interface and the TR1 interface of the RS232 transceiver are self-shorted via the test line 110. The D+ interface of the RS485 transceiver and the TR2 interface of the RS232 transceiver are connected in short circuit through the RS 485-to-RS 232 testing tool and the testing line 110. The D-interface of the RS485 transceiver and the TX2 interface of the RS232 transceiver are also interconnected and shorted through the RS 485-to-RS 232 test tool and the test line 110. The CAN1_h interface of the CAN1 transceiver and the CAN2_h interface of the CAN2 transceiver are shorted directly to each other by the test line 110. The CAN1_l interface of the CAN1 transceiver and the CAN2_l interface of the CAN2 transceiver are shorted directly to each other by the test line 110.
Illustratively, as shown in fig. 3, the MEC200 includes two RS485 transceivers, one RS232 transceiver, and one CAN transceiver. The communication interface test circuit 100 of the MEC200 may be configured in the following manner: the TX1 interface of the RS232 transceiver and the TR1 interface of the RS232 transceiver are shorted to themselves by the test line 110. The CAN_H interface of the CAN transceiver and the TR2 interface of the RS232 transceiver are connected in short circuit through the interconnection of the CAN-to-RS 232 test tool and the test line 110. The CAN_L interface of the CAN transceiver and the TX2 interface of the RS232 transceiver are also interconnected and shorted through the CAN-to-RS 232 test tool and the test line 110. The d1+ interface of the RS4851 transceiver and the d2+ interface of the RS4852 transceiver are shorted directly to each other by the test line 110. The D1-interface of the RS4851 transceiver and the D2-interface of the RS4852 transceiver are shorted directly to each other by the test line 110.
The above-mentioned setting manner of the communication interface test circuit 100 is merely exemplary, and the setting manner of the communication interface test circuit 100 may be adjusted according to practical situations, which is not limited in this application.
In the above implementation process, when the sub transceiver for half duplex communication is connected to the communication interface of the sub transceiver for full duplex communication, because the sub transceiver for half duplex communication and the sub transceiver for full duplex communication belong to two different types of transceivers 210, the communication interface of the sub transceiver for half duplex communication and the communication interface of the sub transceiver for full duplex communication are interconnected and shorted by the conversion tool, so that the sub transceivers incapable of shorting with the sub transceivers of the same type to form a signal channel also form a signal channel, thereby reducing the number requirements on the test line 110.
In one possible implementation, the number of CAN transceivers is singular, and the communication interfaces of every two CAN transceivers are shorted; the monitoring device 120 connects the first sub-communication interface of the redundant CAN transceiver and the second sub-communication interface of the redundant CAN transceiver to display the communication interface status of the redundant CAN transceiver through the monitoring device 120.
The monitoring device 120 and the redundant CAN transceiver may further have a CAN-to-USB testing tool disposed therebetween, and the first sub-communication interface of the redundant CAN transceiver and the second sub-communication interface of the redundant CAN transceiver are connected to the CAN-to-USB testing tool at an end far away from the CAN transceiver, so that signals sent by the sub-communication interface of the CAN transceiver are converted into USB signals by the CAN-to-USB testing tool and transmitted to the monitoring device 120, so as to determine the communication interface state of the displayed CAN transceiver by the monitoring device 120.
In some embodiments, the first sub-communication interface of the redundant CAN transceiver and the second sub-communication interface of the redundant CAN transceiver are connected to the CAN optical isolator at an end remote from the CAN transceiver, and the end of the CAN optical isolator remote from the CAN transceiver is connected to a CAN-to-USB test tool.
It will be appreciated that a signal line is provided between the CAN-to-USB test tool and the monitoring device 120.
The above is merely an example of setting the test line 110 connected to the redundant CAN transceiver when the number of CAN transceivers is singular. It will be appreciated that when the number of RS485 transceivers is singular, the test lines 110 connected to the redundant RS485 transceivers may be arranged in the same manner as the test lines 110 of the redundant CAN transceivers. The arrangement of the test line 110 of the CAN transceiver, the RS485 transceiver and other sub-transceivers CAN be adjusted according to practical situations, and the present application is not limited specifically.
In the implementation process, for the redundant CAN transceiver, the redundant CAN transceiver is directly connected with the monitoring device 120, so that the requirement for a conversion tool CAN be reduced, the test result of introducing the conversion tool to interfere with the test result is avoided, the length and placement of the test wire 110 cannot be influenced by the conversion tool, and the length requirement for the test wire 110 is reduced while the conversion tool is reduced.
In one possible implementation, the communication interfaces of the same type of sub-transceivers are shorted directly.
It can be understood that the signal transmission mode, transmission efficiency, transmission distance and interface type of the communication interface of the same type of the sub-transceiver are the same. Therefore, the communication interfaces of the same type of sub-transceiver can be directly short-circuited when short-circuited is carried out.
In some embodiments, if there are multiple sub-transceivers of the same type in the MEC200, the sub-transceivers of the same type may be combined two by two, and the two sub-transceivers of the same type combined may be shorted directly through the test line 110.
In the implementation process, for the same type of sub-transceiver, because the signal transmission mode, the transmission efficiency, the transmission distance, the interface type of the communication interface and the like are the same, the communication interfaces of the same type of sub-transceiver can be directly shorted, compared with the shorting mode of the communication interfaces of different types of sub-transceivers, the requirement of the communication interface test circuit 100 on a conversion tool can be reduced, and further the requirement of auxiliary equipment is reduced, so that the influence of the auxiliary equipment on a test result is reduced, and the test accuracy is improved while the cost is reduced.
In one possible implementation, if the sub-transceivers are half-duplex communications, the same type of sub-communications interfaces are shorted directly to each other.
The half duplex communication refers to a communication mode in which information can be transmitted from a to B or from B to a at any time in the communication process, but only one direction transmission exists.
It will be appreciated that the same type of sub-communication interface as the same type of sub-transceiver for half-duplex communication will transmit the same signal when the MEC200 is physically wired to an external device. Therefore, when the communication interfaces of the same type of sub-transceivers are tested, the same type of sub-communication interfaces are in short connection with each other, so that the actual wiring between the MEC200 and the external equipment in actual use can be more truly simulated.
In the implementation process, for the communication interface test of the sub-transceiver device of the same type of half-duplex communication, when the test line 110 is shorted, the sub-communication interfaces of the same type are directly interconnected and shorted, so that the actual wiring condition of the MEC200 and the external equipment can be more truly simulated, and the accuracy of the communication interface is further improved.
In one possible implementation, if the transceiver 210 includes a first sub-transceiver and a second sub-transceiver, the first sub-transceiver and the second sub-transceiver are sub-transceivers for half-duplex communications of the same type; the communication interface test circuit 100 may be configured in the following manner:
The first sub communication interface of the first sub transceiver and the first sub communication interface of the second sub transceiver are directly interconnected and short-circuited; the second sub communication interface of the first sub transceiver and the second sub communication interface of the second sub transceiver are directly interconnected and shorted.
The first sub communication interface of the first sub transceiver and the first sub communication interface of the second sub transceiver are the same type of sub communication interface, and the second sub communication interface of the first sub transceiver and the second sub communication interface of the second sub transceiver are the same type of sub communication interface.
The first sub-transceiver and the second sub-transceiver may be RS485 transceivers, CAN transceivers, etc. The transceiver 210 may include a plurality of types of first sub-transceivers and second sub-transceivers. And may further include a plurality of first sub-transceivers and a plurality of second sub-transceivers, where the types and numbers of the first sub-transceivers and the second sub-transceivers in the transceiver 210 may be adjusted according to actual situations, which is not specifically limited in this application.
Illustratively, as shown in fig. 4, two RS485 transceivers and two CAN transceivers are included in the MEC 200. The communication interface test circuit 100 of the MEC200 may be configured in the following manner:
The d1+ interface of the rs485_1 transceiver is directly interconnected with the d2+ interface of the rs485_2 transceiver via the test line 110 for shorting. The D1-interface of the rs485_1 transceiver is shorted directly to the D2-interface of the rs485_2 transceiver by the test line 110. The CAN1_h interface of the CAN1 transceiver and the CAN2_h interface of the CAN2 transceiver are shorted directly to each other by the test line 110. The CAN1_l interface of the CAN1 transceiver and the CAN2_l interface of the CAN2 transceiver are shorted directly to each other by the test line 110.
In the implementation process, when the transceiver 210 includes a plurality of sub transceivers of the same type of half duplex communication, two sides of the same type of sub communication interfaces of each two types of sub transceivers of the same type of half duplex communication are directly shorted by the test line 110, so that the requirement of the communication interface test circuit 100 on a conversion tool can be reduced, and further, the requirement of auxiliary equipment is reduced, so that the influence of the auxiliary equipment on the test result is reduced, the cost is reduced, and the test accuracy is improved.
In one possible implementation, if the sub-transceiver is full duplex communication, the different types of sub-communication interfaces are directly self-shorting.
Wherein the transceiver 210 comprises at least one sub-transceiver for full duplex communication.
Full duplex communication herein refers to the simultaneous (instantaneous) bi-directional transmission of signals (i.e., a to B while B communicates a), which are instantaneously synchronized.
It will be appreciated that since the full duplex communication sub-transceiver uses two cables when external devices are connected, a pair of cables is not used as the half duplex communication sub-transceiver. Therefore, when the communication interface test is performed on the sub transceiver device for full duplex communication, the test lines 110 connected with different types of sub communication interfaces are short-circuited, so that the actual wiring between the MEC200 and the external equipment in actual use can be more truly simulated.
In the implementation process, the communication interface test of the sub-transceiver device for full duplex communication performs self-shorting on different types of sub-communication interfaces through the test line 110, so that the actual wiring condition of the MEC200 and the external device can be simulated more truly, and the accuracy of the communication interface is improved.
In one possible implementation, the first sub-communication interface of the full-duplex communication sub-transceiver and the second sub-communication interface of the full-duplex communication sub-transceiver are directly self-shorted; the third sub communication interface of the full duplex communication sub transceiver and the fourth sub communication interface of the full duplex communication sub transceiver are directly and self-short-circuited.
The first sub communication interface of the full duplex communication sub transceiver and the second sub communication interface of the full duplex communication sub transceiver are different types of communication interfaces, and the third sub communication interface of the full duplex communication sub transceiver and the fourth sub communication interface of the full duplex communication sub transceiver are different types of communication interfaces; the first sub communication interface of the full duplex communication sub transceiver and the third sub communication interface of the full duplex communication sub transceiver are the same type communication interfaces, and the second sub communication interface of the full duplex communication sub transceiver and the fourth sub communication interface of the full duplex communication sub transceiver are the same type communication interfaces.
Illustratively, as shown in fig. 1, an RS232 transceiver is included in the MEC 200. The communication interface test circuit 100 of the MEC200 may be configured in the following manner: the TX1 interface and the TR1 interface of the RS232 transceiver are directly self-shorted via the test line 110. The TX2 interface and the TR2 interface of the RS232 transceiver are directly self-shorted via the test line 110.
In the implementation process, when the transceiver 210 includes the full duplex communication sub-transceiver, two sides of different types of sub-communication interfaces of the full duplex communication sub-transceiver are directly shorted by the test line 110, so that the actual connection situation between the MEC200 and the external device can be simulated more truly, and the accuracy of the communication interfaces is further improved.
In one possible implementation, at least every second communication interface is shorted by test line 110.
Alternatively, when two communication interfaces are shorted, the two communication interfaces may be connected to one test line 110 respectively, and the test lines 110 connected to the two communication interfaces are shorted at an end far from the communication interfaces. When the two communication interfaces are shorted, the two communication interfaces can also be respectively connected with two ends of one test wire 110, so that the two communication interfaces are shorted through the one test wire 110. When the communication interfaces are shorted, the communication interfaces can be respectively connected with one test line 110, and the test lines 110 connected with the communication interfaces are shorted at one end far away from the communication interfaces.
In the implementation process, the test line 110 is low in price and easy to obtain, and at least every two communication interfaces are short-circuited through the test line 110, so that the circuit difficulty in short-circuited communication interfaces can be reduced, and meanwhile, the cost of a test circuit is reduced.
The foregoing is merely a preferred embodiment of the present application and is not intended to limit the present application, and various modifications and variations may be made to the present application by those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principles of the present application should be included in the protection scope of the present application. It should be noted that: like reference numerals and letters denote like items in the following figures, and thus once an item is defined in one figure, no further definition or explanation thereof is necessary in the following figures.
The foregoing is merely a specific embodiment of the present application, but the protection scope of the present application is not limited thereto, and any person skilled in the art can easily think about changes or substitutions within the technical scope of the present application, and the changes or substitutions are covered in the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (9)
1. A communication interface test circuit, wherein the circuit is used for testing MEC; the circuit is provided with monitoring equipment, an SOC and a transceiver provided with a communication interface;
the single transceiver forms a signal channel by self-shorting through a communication interface; or/and a plurality of the receiving and transmitting devices are/is connected with each other through respective communication interfaces in a short circuit manner to form a signal channel;
the network communication output end of the SOC is connected to the monitoring equipment through a network port, and the monitoring equipment is configured to display the MEC interface state determined by the MEC according to the signals of the signal channels;
the receiving and transmitting devices comprise a half-duplex communication sub-receiving and transmitting device and a full-duplex communication sub-receiving and transmitting device, and the plurality of receiving and transmitting devices comprise a plurality of types of sub-receiving and transmitting devices; communication interfaces of different types of sub-transceiving devices are interconnected and short-circuited through a conversion tool;
When the communication interface test circuit tests the MEC, a test signal sent by a communication interface connected with one end of a short-circuited test line is transmitted to the SOC of the MEC through a communication interface connected with the other end of the short-circuited test line; and the SOC determines whether the signal channel is abnormal according to the test signal, and transmits a test result to the monitoring equipment through the network port of the MEC.
2. The circuit of claim 1, wherein the circuit comprises a plurality of capacitors,
the first sub communication interface of the sub transceiver for half duplex communication is in short connection with the first sub communication interface of the sub transceiver for full duplex communication through the conversion tool, and the first sub communication interface of the sub transceiver for half duplex communication and the first sub communication interface of the sub transceiver for full duplex communication are different types of sub communication interfaces;
the second sub communication interface of the sub transceiver for half duplex communication is in short connection with the second sub communication interface of the sub transceiver for full duplex communication through the conversion tool, and the second sub communication interface of the sub transceiver for half duplex communication and the second sub communication interface of the sub transceiver for full duplex communication are different types of sub communication interfaces.
3. The circuit of claim 1, wherein the transceiver means comprises a CAN transceiver; the number of the CAN transceivers is singular, and the communication interfaces of every two CAN transceivers are short-circuited;
the monitoring equipment is connected with the redundant first sub-communication interface of the CAN transceiver and the redundant second sub-communication interface of the CAN transceiver so as to display the redundant communication interface state of the CAN transceiver through the monitoring equipment.
4. The circuit of claim 1, wherein a plurality of said transceiving means comprises a plurality of types of sub-transceiving means;
the communication interfaces of the same type of sub-transceivers are directly shorted.
5. The circuit of claim 4, wherein the same type of transceiver comprises a plurality of communication interfaces; the plurality of communication interfaces comprise a plurality of types of sub-communication interfaces;
if the sub-transceiver is half-duplex communication, the sub-communication interfaces of the same type are directly interconnected and shorted.
6. The circuit of claim 5, wherein the transceiving means comprises a first sub-transceiving means and a second sub-transceiving means, the first sub-transceiving means and the second sub-transceiving means being sub-transceiving means for half duplex communication of the same type;
The first sub communication interface of the first sub transceiver and the first sub communication interface of the second sub transceiver are directly interconnected and short-circuited, and the first sub communication interface of the first sub transceiver and the first sub communication interface of the second sub transceiver are the same type of sub communication interface;
the second sub communication interface of the first sub transceiver and the second sub communication interface of the second sub transceiver are directly interconnected and short-circuited, and the second sub communication interface of the first sub transceiver and the second sub communication interface of the second sub transceiver are the same type of sub communication interface.
7. The circuit of claim 4, wherein the same type of sub-transceiver comprises a plurality of communication interfaces, the plurality of communication interfaces comprising a plurality of types of sub-communication interfaces;
if the sub-transceiver is full duplex communication, the sub-communication interfaces of different types are directly and self-shorted.
8. The circuit of claim 7, wherein said transceiving means comprises at least one sub-transceiving means for full duplex communication;
the first sub communication interface of the full duplex communication sub transceiver and the second sub communication interface of the full duplex communication sub transceiver are directly and self-short-circuited, and the first sub communication interface of the full duplex communication sub transceiver and the second sub communication interface of the full duplex communication sub transceiver are different types of communication interfaces;
The third sub communication interface of the full duplex communication sub transceiver and the fourth sub communication interface of the full duplex communication sub transceiver are directly and self-short-circuited, and the third sub communication interface of the full duplex communication sub transceiver and the fourth sub communication interface of the full duplex communication sub transceiver are different types of communication interfaces;
the first sub communication interface of the full duplex communication sub transceiver and the third sub communication interface of the full duplex communication sub transceiver are the same type communication interfaces, and the second sub communication interface of the full duplex communication sub transceiver and the fourth sub communication interface of the full duplex communication sub transceiver are the same type communication interfaces.
9. The circuit of any of claims 1-8, wherein at least every two of the communication interfaces are shorted by a test line.
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| US8780959B2 (en) * | 2009-01-13 | 2014-07-15 | Intel Mobile Communications GmbH | Integrated transceiver loop back self test by amplitude modulation |
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