CN116182930B

CN116182930B - Testing device, control method thereof and batch thermosensitive device testing method

Info

Publication number: CN116182930B
Application number: CN202310447338.0A
Authority: CN
Inventors: 王琪; 张宙; 叶频
Original assignee: Suzhou Yingrui Sensor Technology Co ltd
Current assignee: Suzhou Yingrui Sensor Technology Co ltd
Priority date: 2023-04-24
Filing date: 2023-04-24
Publication date: 2023-07-18
Anticipated expiration: 2043-04-24
Also published as: CN116182930A

Abstract

The invention discloses a testing device, a control method thereof and a batch thermosensitive device testing method.A driving assembly, a heating assembly, a sampling piece and a sampling piece fixing and placing plate are arranged on the testing device; the fixed board of placing of sampling piece is used for placing N piece that awaits measuring, N is greater than or equal to 1, includes following step: and S100, when the testing device acquires a first instruction, controlling the driving assembly to start working, so that the driving assembly drives the sampling piece fixing and placing plate to move to a first position, and the sampling pieces and the sampling interface protruding parts of N pieces to be tested on the sampling piece fixing and placing plate are in a preset contact state. S200, controlling the heating assembly to work so as to radiate heat energy to a plurality of pieces to be measured on the sampling piece fixing and placing plate; s300, acquiring at least one detection parameter output by the convex parts of sampling interfaces of N pieces to be detected through the sampling pieces; s400, according to at least one detection parameter, the working performance of N pieces to be detected is determined and prompted. The invention improves the testing efficiency of batch pieces to be tested.

Description

Testing device, control method thereof and batch thermosensitive device testing method

Technical Field

The invention relates to the technical field of test equipment, in particular to a test device, a control method thereof and a batch thermosensitive device test method.

Background

In the process of mass production of thermosensitive devices in factories, the phenomena of low induction sensitivity and poor performance of some thermosensitive devices are unavoidable, so that before the thermosensitive devices leave the factory, the quality detection of each thermosensitive device is required. The existing thermosensitive device is gradually transformed from an analog thermosensitive device to a digital thermosensitive device, the volatility of the digital thermosensitive device is different from that of the analog thermosensitive device, and a worker needs to correspondingly develop a batch test device for the digital thermosensitive device so as to detect the quality of the thermosensitive device. However, most digital probe testing devices on the market can only test the internal thermosensitive module of a single thermosensitive device at a time, and cannot test a large number of thermosensitive devices at the same time, so that the testing efficiency of the large number of thermosensitive devices is reduced.

Disclosure of Invention

The invention mainly aims to provide a testing device, a control method thereof and a batch thermosensitive device testing method, and aims to improve the testing efficiency of batch thermosensitive devices.

Therefore, the invention provides a control method of a testing device, wherein the testing device is provided with a driving component, a heating component, a sampling piece and a sampling piece fixing and placing plate; the fixed board of placing of sampling piece is used for placing N piece that awaits measuring, N is greater than or equal to 1, includes following step:

Step S100, when a testing device acquires a first instruction, controlling the driving assembly to start working, so that the driving assembly drives the sampling piece fixing and placing plate to move to a first position, and the sampling pieces and sampling interface protruding parts of N pieces to be tested on the sampling piece fixing and placing plate are in a preset contact state;

step 200, controlling the heating assembly to work so as to radiate heat energy to N pieces to be measured on the sampling piece fixing and placing plate;

step S300, obtaining at least one detection parameter output by the convex parts of sampling interfaces of N pieces to be detected through the sampling pieces;

and step 400, determining the working performance of N pieces to be tested according to at least one detection parameter and prompting.

Optionally, the step of making the sampling piece and the sampling interface protruding portions of the N pieces to be tested on the sampling piece fixing and placing plate in a preset contact state specifically includes:

step S110, controlling the driving assembly to drive the sampling piece to move so that the sampling piece and the sampling interface protruding portions of N pieces to be detected on the sampling piece fixing and placing plate are in a preset contact state.

Optionally, the step S100 further includes:

And step 120, controlling the driving assembly to drive the heating assembly to move so that the heating assembly and the thermosensitive modules of N pieces to be detected on the sampling piece fixing and placing plate are in a preset contact state.

Optionally, between the step S200 and the step S300, the test device control method further includes:

step S500, when the sampling piece obtains the responses output by the sampling interface protruding parts of the N pieces to be tested in a preset time, confirming that the heating assembly and the internal thermosensitive modules of the N pieces to be tested are in a preset contact state and the sampling piece and the sampling interface protruding parts of the N pieces to be tested are in a preset contact state;

and step 600, when the sampling piece cannot acquire the responses output by the sampling interface protruding portions of the N pieces to be tested within a preset time, confirming that the heating assembly and the internal thermosensitive modules of the N pieces to be tested are in a non-preset contact state and/or that the sampling piece and the sampling interface protruding portions of the N pieces to be tested are in a non-preset contact state, and controlling the driving assembly to drive the sampling piece fixing and placing plate to move from the first position to the second position.

Optionally, the testing device further includes a shielding component, the shielding component is disposed between the heating component and the sampling piece fixing and placing plate, and the step of controlling the heating component to work so as to radiate heat energy to a plurality of pieces to be tested on the sampling piece fixing and placing plate specifically includes:

step S210, controlling the heating assembly to work;

and S220, controlling the shielding component to act so that the heating component radiates heat energy to the position, which is not shielded by the shielding component, on the sampling piece fixing and placing plate.

Optionally, the shielding assembly comprises a first shielding piece and a second shielding piece, the first shielding piece and the second shielding piece are correspondingly arranged up and down along the height direction, and the step of controlling the action of the shielding assembly comprises the following steps:

controlling the first shielding element to alternately switch between a first action state and a second action state at a first preset frequency, and controlling the second shielding element to be in the first action state; the first action state is full open, and the second action state is full shielding;

the step S300 specifically includes:

step S310, when the first shielding member is in the first action state or the second action state, acquiring detection parameters output by the sampling interface protruding portions of the N pieces to be detected through the sampling member to determine parameters of heating uniformity of the N pieces to be detected.

controlling the first shutter to alternately switch between a first action state and a second action state at a first preset frequency, and controlling the second shutter to be in a third action state; the first action state is fully opened, the second action state is fully shielded, and the third action state is semi-shielded;

the step S300 specifically includes:

step S320, when the first shielding member is in the first action state or the second action state, acquiring detection parameters output by the sampling interface protruding portions of the N pieces to be detected through the sampling member to determine the thermal response intensity parameters of the N pieces to be detected.

controlling the first shutter to be in a second action state and controlling the second shutter to be in the first action state; the first action state is full open, and the second action state is full shielding;

The step S300 specifically includes:

and step S330, when the first shielding piece is in the second action state, acquiring detection parameters output by the sampling interface convex parts of the N pieces to be detected through the sampling piece to determine the thermal stability degree parameters of the N pieces to be detected.

Optionally, the test device control method as described above, before the step S200, the test device control method further includes:

and controlling the driving assembly to drive the heating assembly to move so that the heating assembly is tightly attached to the thermosensitive modules of the N pieces to be detected on the sampling piece fixing and placing plate.

Optionally, as a test device control method described above, before step S400, the test device control method further includes:

step S100, when the testing device acquires a second instruction, controlling the driving assembly to work so that the driving assembly drives the sampling piece fixing and placing plate to move from the first position to the second position;

when the sampling piece fixing and placing plate is located at the second position, sampling interface protrusions of N pieces to be tested on the sampling piece fixing and placing plate are located in a second contact state with the sampling pieces.

Optionally, the test device control method as described above, further comprising:

and step S700, controlling the driving assembly to work so that the driving assembly drives the heating assembly and the sampling piece to move until the heating assembly and the internal thermosensitive modules of the N pieces to be tested are in a second contact state.

The invention also proposes a testing device comprising:

the testing device comprises a testing device main body, wherein a sampling piece fixing and placing plate for placing N pieces to be tested is arranged on the testing device main body;

the heating component is arranged in the testing device;

the driving assembly is arranged in the testing device;

the sampling piece is arranged in the testing device;

the driving assembly is used for driving the sampling piece fixing and placing plate to move to a first position;

when the electronic control assembly acquires a first instruction, the driving assembly is controlled to start working, so that the driving assembly drives the sampling piece fixing and placing plate to move to a first position, and the sampling pieces and the sampling interface protruding parts of N pieces to be detected on the sampling piece fixing and placing plate are in a preset contact state; controlling the heating assembly to work so as to radiate heat energy to a plurality of pieces to be measured on the sampling piece fixing and placing plate; acquiring at least one detection parameter output by the convex parts of sampling interfaces of N pieces to be detected through the sampling pieces; when the electric control assembly acquires a second instruction, the driving assembly is controlled to drive the sampling piece fixing and placing plate to move from the first position to the second position, so that the sampling piece and the sampling interface protruding parts of N pieces to be detected on the sampling piece fixing and placing plate are in a second contact state; according to at least one detection parameter, determining the working performance of N pieces to be detected and prompting; and controlling the driving assembly to work so that the driving assembly drives the heating assembly and the sampling piece to move until the heating assembly and the internal thermosensitive modules of the N pieces to be detected are in a second contact state.

Optionally, the heating assembly comprises a heating rod and a temperature control assembly; the heating rod is electrically connected with the temperature control component;

the temperature control sensor is used for controlling the heating rod to generate heat energy.

Optionally, the testing device further comprises an insulation assembly;

the heating component is arranged in the heat insulation component;

the heat insulation assembly is used for wrapping the heating assembly.

Optionally, the test device further comprises:

the heat conduction component is arranged between the heating component and the sampling piece fixing and placing plate;

the heat conduction assembly is used for conducting heat energy of the heating assembly to the sampling piece fixing and placing plate.

Optionally, the testing device further comprises a shielding assembly;

the shielding assembly comprises a first shielding piece and a second shielding piece, and the first shielding piece and the second shielding piece are correspondingly arranged up and down along the height direction;

the first shielding piece is used for generating carrier waves and carrying out alternating switching work between a first action state and a second action state at a first preset frequency;

the second shielding piece is used for performing alternating switching operation between the first action state and the third action state.

Optionally, the number of the driving components is three, namely a first driving component, a second driving component and a third driving component;

the first driving assembly is provided with the sampling piece fixing and placing plate, the second driving assembly is provided with the heating assembly, and the third driving assembly is provided with the sampling piece;

the first driving assembly is used for driving the sampling piece fixing and placing plate to move from a first position to a second position or from the second position to the first position;

the second driving assembly is used for driving the heating assembly to move along the height direction so as to enable the heating assembly and the internal thermosensitive modules of N pieces to be detected on the sampling piece fixing and placing plate to be in a preset contact state or a second contact state;

the third driving assembly is used for driving the sampling piece to move along the height direction, so that sampling interface protrusions of N pieces to be tested on the sampling piece fixing and placing plate are in a preset contact state or a second contact state with the sampling piece.

Optionally, the first driving assembly includes:

a first driving motor;

the first moving slide block is in driving connection with the first driving motor and is connected with the sampling piece fixing and placing plate;

The first driving motor is used for driving the first moving sliding block to drive the sampling piece fixing and placing plate to move from a first position to a second position or from the second position to the first position.

Optionally, the second driving assembly includes:

a second driving motor;

the second moving slide block is in driving connection with the second driving motor and is connected with the heating assembly;

the second driving motor is used for driving the second moving sliding block to drive the heating assembly to move along the height direction, so that the heating assembly and the internal thermosensitive modules of the N pieces to be detected are in a preset contact state or a second contact state.

Optionally, the third driving assembly includes:

a third driving motor;

the third moving slide block is in driving connection with the third driving motor and is connected with the sampling piece;

the third driving motor is used for driving the third moving sliding block to drive the sampling piece to move along the height direction, and the sampling interface convex parts of the N pieces to be tested on the sampling piece fixing and placing plate are in a preset contact state or a second contact state with the sampling piece.

Optionally, the testing device further comprises a trigger component, and the trigger component is arranged on the side surface of the testing device main body.

Optionally, the testing device further comprises a display component, and the display component is electrically connected with the testing device.

The invention also provides a batch thermosensitive device testing method, which is based on the testing device and comprises the following steps:

step S1000, preparing the testing device and powering up the testing device;

step S2000, triggering the triggering component to enable the testing device to acquire a second instruction and control the driving component to work, so that the driving component drives the sampling piece fixing and placing plate to move from a first position to a second position;

step S3000, placing N thermosensitive devices on the sampling piece fixing and placing plate so that the sampling interface protruding parts of the N thermosensitive devices are downwards placed;

step S4000, triggering the triggering assembly to enable the testing device to acquire a first instruction and control the driving assembly to start working, so that the driving assembly drives the sampling piece fixing and placing plate to move from a second position to a first position, and the sampling piece and the sampling interface protruding parts of N thermosensitive devices on the sampling piece fixing and placing plate are in a preset contact state; controlling the heating assembly to work so as to radiate heat energy to a plurality of thermosensitive devices on the sampling piece fixing and placing plate; acquiring at least one detection parameter output by the convex parts of the sampling interfaces of the N thermosensitive devices through the sampling piece;

Step S5000, triggering the triggering assembly to enable the testing device to acquire a second instruction and control the driving assembly to work, so that the driving assembly drives the sampling piece fixing and placing plate to move from a first position to a second position, and the sampling interface protrusions of N thermosensitive devices on the sampling piece fixing and placing plate are in a second contact state with the sampling piece; and determining the working performance of the N thermosensitive devices according to at least one detection parameter and prompting.

The invention discloses a control method of a testing device, wherein a driving assembly, a heating assembly, a sampling piece and a sampling piece fixing and placing plate are arranged on the testing device; the fixed board of placing of sampling piece is used for placing N piece that awaits measuring, N is greater than or equal to 1, includes following step: and step S100, when the testing device acquires a first instruction, controlling the driving assembly to start working, so that the driving assembly drives the sampling piece fixing and placing plate to move to a first position, and the sampling pieces and the sampling interface protruding parts of N pieces to be tested on the sampling piece fixing and placing plate are in a preset contact state. Step 200, controlling the heating assembly to work so as to radiate heat energy to a plurality of pieces to be measured on the sampling piece fixing and placing plate; step S300, obtaining at least one detection parameter output by the convex parts of sampling interfaces of N pieces to be detected through the sampling pieces; and step 400, determining the working performance of N pieces to be tested according to at least one detection parameter and prompting. The invention improves the testing efficiency of batch pieces to be tested.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings that are required in the embodiments or the description of the prior art will be briefly described, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and other drawings may be obtained according to the structures shown in these drawings without inventive effort for a person skilled in the art.

FIG. 1 is a schematic flow chart of a testing device, a control method thereof and a batch thermosensitive device testing method according to the present invention;

FIG. 2 is a schematic flow chart of another embodiment of the testing apparatus, the control method thereof and the batch thermosensitive device testing method according to the present invention;

FIG. 3 is a schematic diagram of a refinement flow of S200 and S300 in FIG. 1;

FIG. 4 is a schematic flow chart of another embodiment of the testing apparatus, the control method thereof and the batch thermosensitive device testing method according to the present invention;

FIG. 5 is a schematic diagram of the structure of the testing device, the control method thereof and the batch thermosensitive device testing method according to the present invention.

Reference numerals illustrate:

10. the sampling piece is fixedly provided with a plate; 20. a heating assembly; 30. a sampling member; 40. an electrical control assembly; 50. a thermal insulation assembly; 61. a first shutter; 62. a second shutter; 70. a heat conducting component; 81. a first drive assembly; 82. a second drive assembly; 83. and a third drive assembly.

The achievement of the objects, functional features and advantages of the present invention will be further described with reference to the accompanying drawings, in conjunction with the embodiments.

Detailed Description

The following description of the embodiments of the present invention will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are only some, but not all embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.

It should be noted that all directional indicators (such as up, down, left, right, front, and rear … …) in the embodiments of the present invention are merely used to explain the relative positional relationship, movement, etc. between the components in a particular posture (as shown in the drawings), and if the particular posture is changed, the directional indicator is changed accordingly.

In the present invention, unless specifically stated and limited otherwise, the terms "connected," "affixed," and the like are to be construed broadly, and for example, "affixed" may be a fixed connection, a removable connection, or an integral body; can be mechanically or electrically connected; either directly or indirectly, through intermediaries, or both, may be in communication with each other or in interaction with each other, unless expressly defined otherwise. The specific meaning of the above terms in the present invention can be understood by those of ordinary skill in the art according to the specific circumstances.

Furthermore, descriptions such as those referred to as "first," "second," and the like, are provided for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implying an order of magnitude of the indicated technical features in the present disclosure. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. In addition, the technical solutions of the embodiments may be combined with each other, but it is necessary to base that the technical solutions can be realized by those skilled in the art, and when the technical solutions are contradictory or cannot be realized, the combination of the technical solutions should be considered to be absent and not within the scope of protection claimed in the present invention.

It should be understood that in the process of mass production of thermosensitive devices in factories, there are some phenomena of low sensing sensitivity and poor performance of thermosensitive devices, so that it is necessary to perform quality detection on each thermosensitive device before the thermosensitive device leaves the factory. The existing thermosensitive device is gradually transformed from an analog thermosensitive device to a digital thermosensitive device, the volatility of the digital thermosensitive device is different from that of the analog thermosensitive device, and a worker needs to correspondingly develop a batch test device for the digital thermosensitive device so as to detect the quality of the thermosensitive device. However, most digital probe testing devices on the market can only test the internal thermosensitive module of a single thermosensitive device at a time, and cannot test a large number of thermosensitive devices at the same time, so that the testing efficiency of the large number of thermosensitive devices is reduced.

Therefore, the invention provides a control method of a testing device, wherein a driving assembly, a heating assembly 20, a sampling piece 30 and a fixed placing plate 10 of the sampling piece 30 are arranged on the testing device; the fixed board 10 that places of sampling piece 30 is used for placing N piece that awaits measuring, and N is greater than or equal to 1, includes following step:

step 100, when the testing device obtains a first instruction, controlling the driving assembly to start working, so that the driving assembly drives the sampling piece 30 to fixedly place the plate 10 to move to a first position, and the sampling piece 30 and the sampling interface protruding portions of the N pieces to be tested on the sampling piece 30 fixedly place the plate 10 are in a preset contact state;

step 200, controlling the heating assembly 20 to work so as to radiate heat energy to the N pieces to be measured on the fixed placement board 10 of the sampling piece 30;

step S300, obtaining at least one detection parameter output by the convex parts of sampling interfaces of N pieces to be detected through the sampling piece 30;

In this embodiment, a heat sensitive device is taken as an example of the device under test.

Specifically, in practical application, when the user triggers to start the testing device, the testing device will correspondingly obtain the first instruction, and meanwhile, the testing device controls the driving assembly to start working, so that the driving assembly drives the sampling piece 30 to fixedly place the plate 10, the sampling piece 30 to fixedly place the plate 10 to move to the internal position of the testing device, so that the sampling piece 30 and the sampling interface protruding portions of the N thermal devices on the sampling piece 30 to fixedly place the plate 10 are in a preset contact state, and the heating assembly 20 and the thermal modules of the N thermal devices on the sampling piece 30 to fixedly place the plate 10 are in a preset contact state. It should be understood that the first position mentioned in this embodiment refers to the inner position of the testing device and the second position refers to the outer position of the testing device.

Further, when the sampling member 30 acquires the responses outputted from the sampling interface protrusions of the N thermosensitive devices within 3 seconds, it can be confirmed that the current heating assembly 20 is in a preset contact state with the internal thermosensitive modules of the N thermosensitive devices and that the sampling member 30 is in a preset contact state with the sampling interface protrusions of the N thermosensitive devices. Further, the testing apparatus controls the operation of the heating assembly 20 to radiate heat energy to the N thermosensitive devices on the stationary placement plate 10 of the sampling member 30. At least one detection parameter output from the sampling interface projections of the N thermosensitive devices is acquired via the sampling member 30. And the testing device determines the working performance of the N thermosensitive devices according to at least one detection parameter and prompts the working performance. Further, the user can judge the quality of each thermosensitive device according to the prompt so as to screen out defective products from the thermosensitive devices.

In addition, when the response output from the sampling interface protruding portions of the N thermosensitive devices cannot be obtained within 303 seconds, it is confirmed that the heating assembly 20 is in a non-preset contact state with the internal thermosensitive modules of the N thermosensitive devices and/or that the sampling member 30 is in a non-preset contact state with the sampling interface protruding portions of the N thermosensitive devices. Further, the testing device controls the driving assembly to reset so as to drive the sampling member 30 to fixedly place the plate 10 to move from the internal position of the testing device to the external position of the testing device, so that a user can conveniently readjust the placing positions of the N thermosensitive devices on the sampling member 30 fixedly place the plate 10. After the placement positions of the N thermosensitive devices are adjusted, the user triggers and starts the testing device again, the testing device correspondingly receives the first instruction, and meanwhile, the testing device controls the driving assembly to drive the sampling piece 30 to fixedly place the plate 10 to move to the internal position of the testing device again until the sampling piece 30 and the sampling interface protruding portions of the N thermosensitive devices on the sampling piece 30 fixedly place the plate 10 are in a preset contact state, and the heating assembly 20 and the thermosensitive modules of the N thermosensitive devices on the sampling piece 30 fixedly place the plate 10 are in a preset contact state.

It should be understood that, in this embodiment, the fact that the sampling member 30 is in a preset contact state with the sampling interface protruding portions of the N thermal devices on the sampling member 30 fixing and placing plate 10 means that the sampling member 30 is in close contact with the sampling interface protruding portions of the N thermal devices on the sampling member 30 fixing and placing plate 10; the fact that the heating assembly 20 and the sampling member 30 fixedly place the thermal modules of the N thermal devices on the board 10 in a preset contact state means that the heating assembly 20 is tightly attached to the thermal modules of the N thermal devices on the board 10 fixedly placed by the sampling member 30. To ensure that the heat energy generated by the heating assembly 20 can be conducted to the internal thermosensitive modules of the N thermosensitive devices, and the sampling member 30 can accurately obtain the detection parameters of the protruding portion of the sampling interface of each thermosensitive device; before the testing device controls the heating assembly 20 to radiate heat energy to N thermosensitive devices on the sampling piece 30 fixing and placing plate 10, the lower position of the heating assembly 20 is clung to the internal thermosensitive modules of the N thermosensitive devices, so that the internal thermosensitive modules of the thermosensitive devices can quickly sense heat energy when the heating assembly 20 works; in addition, the sampling piece 30 is tightly attached to the sampling interface protruding portions of the N thermosensitive devices, so that the sampling piece 30 can accurately obtain the detection parameters of the sampling interface protruding portions output by each thermosensitive device.

The invention discloses a control method of a testing device, wherein a driving assembly, a heating assembly 20, a sampling piece 30 and a fixed placing plate 10 of the sampling piece 30 are arranged on the testing device; the fixed board 10 that places of sampling piece 30 is used for placing N piece that awaits measuring, N is greater than or equal to 1, its characterized in that includes the following step: step 100, when the testing device obtains the first instruction, the driving assembly is controlled to start working, so that the driving assembly drives the sampling piece 30 to fixedly place the board 10 to move to the first position, and the sampling piece 30 and the sampling interface protruding portions of the N pieces to be tested on the sampling piece 30 fixedly place the board 10 are in a preset contact state. Step 200, controlling the heating assembly 20 to work so as to radiate heat energy to the sampling member 30 and the plurality of pieces to be measured on the placing plate 10; step S300, obtaining at least one detection parameter output by the convex parts of sampling interfaces of N pieces to be detected through the sampling piece 30; and step 400, determining the working performance of N pieces to be tested according to at least one detection parameter and prompting. The invention realizes that N pieces to be tested can be tested simultaneously so as to improve the testing efficiency of batch pieces to be tested.

Referring to fig. 2, the steps for making the sampling member 30 and the sampling interface protruding portions of the N pieces to be tested on the sampling member 30 fixing and placing plate 10 in a preset contact state specifically include:

Step S110, controlling the driving assembly to drive the sampling member 30 to move, so that the sampling member 30 and the sampling interface protruding portions of the N to-be-tested members on the fixed placement plate 10 of the sampling member 30 are in a preset contact state.

In the first embodiment, when the testing device obtains the first instruction, the driving assembly is controlled to start working, so that the driving assembly drives the sampling piece 30 and the sampling piece 30 fixing and placing plate 10 to move simultaneously until the sampling piece 30 and the sampling interface protruding portions of the N pieces to be tested on the sampling piece 30 fixing and placing plate 10 are in a close contact state. In the first embodiment, the testing device controls the driving assembly to drive the sampling member 30 and the fixed placement plate 10 of the sampling member 30 to move at the same time, so as to accelerate the testing speed of the N pieces to be tested on the fixed placement plate 10 of the sampling member 30.

In the second embodiment, when the testing device obtains the first instruction, the driving assembly is controlled to start working, so that the driving assembly drives the sampling member 30 to move the fixed placement plate 10, and the fixed placement plate 10 of the sampling member 30 drives the N pieces to be tested to move to the internal position of the testing device. After confirming that the sample piece 30 is fixedly placed on the board 10 at the internal position of the testing device, the testing device controls the driving assembly to drive the sample piece 30 to move until the sample piece 30 is in a close contact state with the sampling interface protruding portions of the N pieces to be tested on the sample piece 30 fixedly placed on the board 10, in the second embodiment, the testing device controls the driving assembly to stagger time to control the sample piece 30 to fixedly placed on the board 10 and the sample piece 30 to move, so that the situation that the sample piece 30 is clamped by the sample piece 30 fixedly placed on the board 10 is prevented when the testing device is used for too long, and the action of the sample piece 30 is slowed down and the sample piece 30 reaches the preset position is prevented.

Further, referring to fig. 2, the step S100 further includes:

step S120, controlling the driving assembly to drive the heating assembly 20 to move, so that the heating assembly 20 and the sampling elements 30 fixedly place the thermal modules of the N pieces to be measured on the board 10 in a preset contact state.

In the first embodiment, when the testing device obtains the first instruction, the driving assembly is controlled to start working, so that the driving assembly drives the sampling piece 30, the sampling piece 30 fixing and placing plate 10 and the heating assembly 20 to move simultaneously until the heating assembly 20 is in a close contact state with the thermosensitive modules of the N pieces to be tested on the sampling piece 30 fixing and placing plate 10 and the sampling piece 30 is in a close contact state with the sampling interface protruding parts of the N pieces to be tested on the sampling piece 30 fixing and placing plate 10, thereby accelerating the testing speed of the N pieces to be tested on the sampling piece 30 fixing and placing plate 10. In the first embodiment, the testing device controls the driving assembly to drive the sampling member 30, the fixed placement plate 10 of the sampling member 30 and the heating assembly 20 to move at the same time, so as to accelerate the testing speed of the N pieces to be tested on the fixed placement plate 10 of the sampling member 30.

In the second embodiment, when the testing device obtains the first instruction, the driving assembly is controlled to start working, so that the driving assembly drives the sampling member 30 to move the fixed placement plate 10, and the fixed placement plate 10 of the sampling member 30 drives the N pieces to be tested to move to the internal position of the testing device. After confirming that the sampling member 30 is fixedly placed on the inner position of the testing device, the testing device controls the driving assembly to drive the sampling member 30 and the heating assembly 20 to move simultaneously until the heating assembly 20 is in a close contact state with the thermal modules of the N pieces to be tested on the sampling member 30 fixedly placed on the board 10 and the sampling interface protruding portions of the sampling member 30 and the N pieces to be tested on the sampling member 30 fixedly placed on the board 10 are in a close contact state. In the second embodiment, the testing device controls the driving assembly to drive the fixed placement plate 10 of the sampling piece 30 to move, and controls the driving assembly to drive the sampling piece 30 and the heating assembly 20 to move simultaneously after determining that the fixed placement plate 10 of the sampling piece 30 reaches the preset position, so that the testing speed of N pieces to be tested on the fixed placement plate 10 of the sampling piece 30 is increased, and the phenomenon that the fixed placement plate 10 of the sampling piece 30 is clamped with the sampling piece 30 or the heating assembly 20 during moving can be avoided.

In the third embodiment, when the testing device obtains the first instruction, the driving assembly is controlled to start working, so that the driving assembly drives the sampling piece 30 to move the fixed placing plate 10, and the fixed placing plate 10 of the sampling piece 30 drives the N pieces to be tested to move to the internal position of the testing device. After confirming that the sampling piece 30 is fixedly placed on the board 10 at the internal position of the testing device, the testing device controls the driving assembly to drive the sampling piece 30 to move until the sampling piece 30 is in a closely contacted state with the sampling interface protruding portions of the N pieces to be tested on the board 10 fixedly placed on the sampling piece 30. When the sampling piece 30 and the sampling interface protruding parts of the N pieces to be tested on the sampling piece 30 fixing and placing plate 10 are in a clung contact state, the testing device controls the driving assembly to drive the heating assembly 20 to move until the heating assembly 20 and the sampling piece 30 are in a clung contact state, and the temperature sensing modules of the N pieces to be tested on the sampling piece 30 fixing and placing plate 10 are in a clung contact state. In the third embodiment, the test device controls the driving assembly to stagger and control the movement time of the three assemblies of the sampling member 30, the sampling member 30 and the heating assembly 20, so as to prevent the situation that the movement of the sampling member 30 is slowed down and the sampling member 30 or the heating assembly 20 reaches the preset position to cause the clamping of the sampling member 30 and the fixing plate 10 when the test device is used for too long.

In this embodiment, referring to fig. 2, between the step S200 and the step S300, the test device control method further includes:

step 500, when the sampling piece 30 obtains the responses output by the sampling interface protruding portions of the N pieces to be tested within a preset time, it is confirmed that the heating assembly 20 and the internal thermal modules of the N pieces to be tested are in a preset contact state and the sampling piece 30 and the sampling interface protruding portions of the N pieces to be tested are in a preset contact state;

in step S600, when the sampling member 30 cannot obtain the responses output by the sampling interface protruding portions of the N to-be-measured members within the preset time, it is determined that the heating assembly 20 and the internal thermal modules of the N to-be-measured members are in a non-preset contact state and/or the sampling member 30 and the sampling interface protruding portions of the N to-be-measured members are in a non-preset contact state, and the driving assembly is controlled to drive the sampling member 30 to fixedly move the placement plate 10 from the first position to the second position.

It will be appreciated that when the sampling member 30 obtains the responses output by the sampling interface protruding portions of the N pieces under test within 3 seconds, it can be confirmed that the current thermal assembly is in a close contact state with the internal thermal modules of the N pieces under test and that the sampling member 30 is in a close contact state with the sampling interface protruding portions of the N pieces under test. Further, the testing device controls the heating assembly 20 to operate so as to radiate heat energy to the N pieces to be tested on the sampling member 30 fixing placement plate 10. At least one detection parameter output by the sampling interface projecting portions of the N pieces to be measured is acquired via the sampling piece 30. The testing device determines the working performance of N pieces to be tested according to at least one detection parameter and prompts the N pieces to be tested. Further, the user can judge the quality of each piece to be tested according to the prompt so as to screen out defective products from the pieces to be tested.

On the contrary, when the response output by the sampling interface protruding portions of the N pieces to be measured cannot be obtained within 303 seconds, it is confirmed that the heating assembly 20 is in a non-closely contact state with the internal thermosensitive modules of the N pieces to be measured and/or the sampling piece 30 is in a non-closely contact state with the sampling interface protruding portions of the N pieces to be measured. At this time, the testing device further controls the driving assembly to reset, so as to drive the sampling member 30 to fixedly place the board 10 to move from the internal position of the testing device to the external position of the testing device, so that the user can readjust the placing positions of the N pieces to be tested on the sampling member 30 fixedly place the board 10. After the placement positions of the N pieces to be tested are adjusted, the user triggers and starts the testing device again, the testing device correspondingly receives the first instruction, and meanwhile, the testing device controls the driving assembly to drive the sampling piece 30 to fixedly place the plate 10 to move to the internal position of the testing device again until the sampling piece 30 is in a clung contact state with the sampling interface protruding portions of the N pieces to be tested on the sampling piece 30 fixedly placed plate 10, and the heating assembly 20 is in a clung contact state with the heat-sensitive modules of the N pieces to be tested on the sampling piece 30 fixedly placed plate 10.

In this embodiment, referring to fig. 3, the testing apparatus further includes a shielding assembly, the shielding assembly is disposed between the heating assembly 20 and the fixed placement plate 10 of the sampling element 30, and the step of controlling the heating assembly 20 to work so as to radiate heat energy to the plurality of to-be-tested elements on the fixed placement plate 10 of the sampling element 30 is specifically:

step S210, controlling the heating assembly 20 to work;

step S220, controlling the shielding component to act, so that the heating component 20 radiates heat energy to the position on the sampling piece 30 fixed placement plate 10, which is not shielded by the shielding component.

Specifically, in practical application, when the user triggers to start the testing device, the testing device will correspondingly receive the first instruction, and meanwhile, the testing device controls the driving assembly to start working, so that the driving assembly drives the sampling piece 30 to fixedly place the plate 10, the sampling piece 30 to fixedly place the plate 10 to move to the internal position of the testing device, so that the sampling piece 30 and the sampling interface protruding portions of the N thermal devices on the sampling piece 30 to fixedly place the plate 10 are in a preset contact state, and the heating assembly 20 and the thermal modules of the N thermal devices on the sampling piece 30 to fixedly place the plate 10 are in a preset contact state. When it is confirmed that the sampling member 30 is in a preset contact state with the sampling interface protruding portions of the N thermosensitive devices on the sampling member 30 fixing plate 10 and the heating assembly 20 is in a preset contact state with the thermosensitive modules of the N thermosensitive devices on the sampling member 30 fixing plate 10, the testing device controls the heating assembly 20 to start working, and meanwhile, the testing device controls the shielding assembly to start different shielding actions, so that the heating assembly 20 radiates heat energy to the position, which is not shielded by the shielding assembly, on the sampling member 30 fixing plate 10. The N thermosensitive devices on the fixed placement plate 10 of the sampling member 30 receive different heat energy due to different shielding actions of the shielding assembly, so that the sampling member 30 can further obtain different parameters output by the projecting portions of the sampling interface of the thermosensitive devices.

In a first embodiment, referring to fig. 3, the shielding assembly includes a first shielding member 61 and a second shielding member 62, where the first shielding member 61 and the second shielding member 62 are disposed vertically correspondingly, and the step of controlling the action of the shielding assembly specifically includes:

controlling the first shutter 61 to alternately switch between a first operating state and a second operating state at a first preset frequency, and controlling the second shutter 62 to be in the first operating state; the first action state is full open, and the second action state is full shielding;

the step S300 specifically includes:

step S310, when the first shielding member 61 is in the first action state or the second action state, acquiring the detection parameters output by the sampling interface protruding portions of the N pieces to be tested through the sampling member 30 to determine the parameters of the heated uniformity of the N pieces to be tested.

Specifically, in the first embodiment, upon confirming that the sampling interface projecting portions of the N thermosensitive devices on the sampling member 30 and sampling member 30 fixed placement plate 10 are in the preset contact state and that the heating assembly 20 and the thermosensitive modules of the N thermosensitive devices on the sampling member 30 fixed placement plate 10 are in the preset contact state, the test device controls the heating assembly 20 to start operating while the test device controls the first shutter 61 to alternately switch between the fully open state and the fully closed state at the first preset frequency and controls the second shutter to be in the fully open state.

Further, when the first shielding member 61 is alternately switched between the fully opened state and the fully shielded state at the first preset frequency and the second shielding member is in the fully opened state, the heating assembly 20 fixedly places the heat energy radiated by the N thermosensitive devices on the plate 10 on the sampling member 30, and at this time, the detection parameters outputted by the projecting portions of the sampling interfaces of the N thermosensitive devices can be obtained through the sampling member 30, so as to determine the parameters of the heated uniformity of the N thermosensitive devices.

It should be understood that the first preset frequency may be 1HZ, which is not limited herein.

In the second embodiment, referring to fig. 3, the shielding assembly includes a first shielding member 61 and a second shielding member 62, where the first shielding member 61 and the second shielding member 62 are disposed vertically correspondingly along the height direction, and the step of controlling the action of the shielding assembly specifically includes:

controlling the first shutter 61 to alternately switch between a first operating state and a second operating state at a first preset frequency, and controlling the second shutter 62 to be in a third operating state; the first action state is fully opened, the second action state is fully shielded, and the third action state is semi-shielded;

The step S300 specifically includes:

step S320, when the first shielding member 61 is in the first action state or the second action state, acquiring the detection parameters output by the sampling interface protruding portions of the N pieces to be tested through the sampling member 30 to determine the thermal response intensity parameters of the N pieces to be tested.

Specifically, in the second embodiment, when it is confirmed that the sampling interface projecting portions of the N thermosensitive devices on the sampling member 30 and the sampling member 30 fixed placement plate 10 are in the preset contact state and the heating assembly 20 and the thermosensitive modules of the N thermosensitive devices on the sampling member 30 fixed placement plate 10 are in the preset contact state, the test device controls the heating assembly 20 to start to operate while the test device controls the first shutter 61 to alternately switch between the fully open state and the fully shutter state at the first preset frequency and controls the second shutter assembly to be in the half shutter state.

Further, when the first shielding member 61 is alternately switched between the fully opened state and the fully shielded state at the first preset frequency and the second shielding member is in the semi-shielded state, the heating assembly 20 fixedly places the heat energy radiated by the N thermosensitive devices on the plate 10 on the sampling member 30, and at this time, the detection parameters outputted by the projecting portions of the sampling interfaces of the N thermosensitive devices can be obtained through the sampling member 30, so as to determine the thermal response intensity parameters of the N thermosensitive devices.

In the third embodiment, referring to fig. 3, the shielding assembly includes a first shielding member 61 and a second shielding member 62, where the first shielding member 61 and the second shielding member 62 are disposed vertically correspondingly, and the step of controlling the action of the shielding assembly specifically includes:

controlling the first shutter 61 to be in a second active state and controlling the second shutter 62 to be in the first active state; the first action state is full open, and the second action state is full shielding;

the step S300 specifically includes:

step S330, when the first shielding member 61 is in the second motion state, acquiring the detection parameters output by the sampling interface protruding portions of the N pieces to be tested via the sampling member 30 to determine the thermal stability degree parameters of the N pieces to be tested.

Specifically, in the third embodiment, when it is confirmed that the sampling interface projecting portions of the N thermosensitive devices on the sampling member 30 and the sampling member 30 fixed placement plate 10 are in the preset contact state and the heating assembly 20 and the thermosensitive modules of the N thermosensitive devices on the sampling member 30 fixed placement plate 10 are in the preset contact state, the testing device controls the heating assembly 20 to start to operate, while the testing device controls the first shutter 61 to be in the full-shutter state and controls the second shutter assembly to be in the full-open state.

Further, when the first shielding member 61 is in the fully shielding state and the second shielding member is in the fully opened state, the heating assembly 20 fixes the heat energy radiated from the N thermosensitive devices on the placement plate 10 to the sampling member 30, and the heat energy generated by the heating assembly 20 is completely shielded by the first shielding member 61, so that the detection parameters output by the projecting portions of the sampling interfaces of the N thermosensitive devices can be obtained through the sampling member 30, and the thermal stability degree parameters of the N thermosensitive devices can be determined.

In this embodiment, referring to fig. 4, before the step S200, the test device control method further includes:

the driving assembly is controlled to drive the heating assembly 20 to move, so that the heating assembly 20 is tightly attached to the thermosensitive modules of the N pieces to be measured on the sampling piece 30 fixing and placing plate 10.

It can be understood that when the testing device obtains the first instruction, the driving assembly is controlled to start working so as to drive the heating assembly 20 to move until the heating assembly 20 and the sampling member 30 are in a close contact state with the heat-sensitive modules of the N pieces to be tested on the board 10, so as to ensure that the heat energy generated by the heating assembly 20 can be radiated to the internal heat-sensitive modules of the N heat-sensitive devices, and further, the N heat-sensitive devices output corresponding detection parameters through the protruding parts of the sampling interface when receiving the heat energy of the heating assembly 20.

In this embodiment, referring to fig. 4, before step S400, the test device control method further includes:

step 100, when the testing device obtains a second instruction, controlling the driving assembly to work, so that the driving assembly drives the sampling piece 30 to fixedly move the placing plate 10 from the first position to the second position;

when the fixed placement plate 10 of the sampling piece 30 is at the second position, the sampling interface protrusions of the N pieces to be tested on the fixed placement plate 10 of the sampling piece 30 are in the second contact state with the sampling piece 30.

Further, the test device control method further includes:

and step S700, controlling the driving assembly to work, so that the driving assembly drives the heating assembly 20 and the sampling member 30 to move until the heating assembly 20 and the internal thermosensitive modules of the N pieces to be tested are in a second contact state.

It should be understood that, when the sampling member 30 cannot obtain the responses output by the sampling interface protruding portions of the N thermal devices within the preset time, the user may confirm that the internal thermal modules of the N thermal devices are currently in the non-preset contact state and/or that the sampling member 30 and the sampling interface protruding portions of the N thermal devices are in the non-preset contact state. At this time, the user can fix the placement positions of the N thermosensitive devices on the placement plate 10 by readjusting the sampling member 30 to ensure that the heating assembly 20 and the internal thermosensitive modules of the N thermosensitive devices are in a preset contact state and the sampling interface protrusions of the sampling member 30 and the N thermosensitive devices are in a preset contact state.

In the first embodiment, the user triggers the testing device again, and the testing device correspondingly acquires the second instruction to control the driving assembly to simultaneously drive the sampling member 30, the heating assembly 20 and the sampling member 30 to move, so that the sampling interface protruding portions of the N thermosensitive devices on the sampling member 30 and the sampling interface protruding portions of the N thermosensitive devices on the sampling member 30 and the sampling member 30 are in a non-contact state, the heating assembly 20 and the heating module of the N thermosensitive devices on the sampling member 30 and the sampling member 10 are in an external position of the testing device. When the sample 30 is fixedly placed on the plate 10 at the external position of the testing device, the user readjusts the placement positions of the N thermosensitive devices on the sample 30 fixedly placed on the plate 10. In the first embodiment, the testing device controls the driving assembly to drive the sampling member 30, the fixed placement plate 10 of the sampling member 30 and the heating assembly 20 to move at the same time, so as to accelerate the testing speed of the N thermosensitive devices on the fixed placement plate 10 of the sampling member 30.

In the second embodiment, the user triggers the testing device again, and the testing device correspondingly acquires the second instruction to control the driving assembly to simultaneously drive the sampling member 30 and the heating assembly 20 to move, so that the sampling member 30 and the sampling interface protruding portions of the N thermal devices on the sampling member 30 fixing and placing plate 10 are in a non-contact state, and the heating assembly 20 and the thermal modules of the N thermal devices on the sampling member 30 fixing and placing plate 10 are in a non-contact state. When it is confirmed that the sampling member 30 is in a non-contact state with the sampling interface protruding portions of the N thermosensitive devices on the sampling member 30 fixed placement plate 10 and the heating assembly 20 is in a non-contact state with the thermosensitive modules of the N thermosensitive devices on the sampling member 30 fixed placement plate 10, the testing device controls the driving assembly to further drive the driving assembly to drive the sampling member 30 fixed placement plate 10 to move from the internal position of the testing device to the external position of the testing device, so that a user can conveniently readjust the placement positions of the N thermosensitive devices on the sampling member 30 fixed placement plate 10. In the second embodiment, the testing device controls the driving assembly to drive the sampling member 30 and the heating assembly 20 to move, and further controls the driving assembly to drive the sampling member 30 to move the fixed placement plate 10 when confirming that the sampling member 30 and the heating assembly 20 are in a non-contact state with the N thermosensitive devices respectively, so that the testing speed of the N thermosensitive devices on the fixed placement plate 10 of the sampling member 30 is not affected, and the phenomenon that the fixed placement plate 10 of the sampling member 30 is clamped with the sampling member 30 or the heating assembly 20 during movement can be avoided.

In the third embodiment, the user triggers and starts the testing device again, and the testing device will correspondingly acquire the second instruction to control the driving assembly to drive the sampling member 30 to move first until the sampling member 30 and the sampling interface protruding portions of the N thermosensitive devices on the sampling member 30 fixing and placing plate 10 are in a non-contact state. When it is confirmed that the sampling member 30 and the sampling interface projecting portions of the N thermosensitive devices on the sampling member 30 fixed placement plate 10 are in a non-contact state, the testing device controls the driving assembly to further drive the heating assembly 20 to move until the heating assembly 20 and the sampling member 30 are in a non-contact state. Upon confirming that the heating assembly 20 is in a non-contact state with the thermosensitive modules of the N thermosensitive devices on the sampling member 30 stationary placement plate 10, the testing device controls the driving assembly to further drive the sampling member 30 stationary placement plate 10 to move so that the sampling member 30 stationary placement plate 10 moves from an inner position of the testing device to an outer position of the testing device. In the third embodiment, the testing device sequentially controls the movement of the sampling member 30, the heating assembly 20 and the fixed placement plate 10 of the sampling member 30, so as to avoid the phenomenon that the fixed placement plate 10 of the sampling member 30 is slow to cause clamping.

The first position in this embodiment refers to an internal position of the testing device, the second position refers to an external position of the testing device, and the second contact state refers to a non-contact state.

The invention also proposes a testing device, with reference to fig. 5, comprising:

a testing device main body, on which a sampling piece 30 for placing N pieces to be tested is arranged to fix a placing plate 10;

a heating assembly 20, the heating assembly 20 being disposed within the testing device;

the driving assembly is arranged in the testing device;

a sampling member 30, wherein the sampling member 30 is arranged in the testing device;

the driving assembly is used for driving the sampling piece 30 to fixedly move the placing plate 10 to a first position;

the electronic control assembly 40 controls the driving assembly to start working when the electronic control assembly 40 acquires a first instruction, so that the driving assembly drives the sampling piece 30 to fixedly place the plate 10 to move to a first position, and the sampling piece 30 and the sampling interface protruding portions of the N pieces to be tested on the sampling piece 30 fixedly place the plate 10 are in a preset contact state; controlling the heating assembly 20 to work so as to radiate heat energy to the plurality of pieces to be measured on the sampling member 30 fixing and placing plate 10; acquiring at least one detection parameter output by the sampling interface convex parts of N pieces to be detected through the sampling piece 30; when the electronic control assembly 40 obtains a second instruction, the driving assembly is controlled to drive the sampling piece 30 to fixedly place the plate 10 from the first position to the second position, so that the sampling piece 30 and the sampling interface protruding portions of the N pieces to be tested on the sampling piece 30 fixedly place the plate 10 are in a second contact state; according to at least one detection parameter, determining the working performance of N pieces to be detected and prompting; the driving assembly is controlled to work, so that the driving assembly drives the heating assembly 20 and the sampling piece 30 to move until the heating assembly 20 and the internal thermosensitive modules of the N pieces to be tested are in a second contact state.

Specifically, when the user triggers the start-up test device, the electronic control assembly 40 correspondingly obtains a first instruction to control the driving assembly to start working, so that the driving assembly drives the sampling member 30 to fixedly place the plate 10, the heating assembly 20 and the sampling member 30 to move until the sampling member 30 fixedly places the plate 10 to move to the internal position of the test device, the sampling member 30 is in a contact state of close contact with the sampling interface protruding portions of the N thermosensitive devices on the sampling member 30 fixedly places the plate 10, and the heating assembly 20 is in a contact state of close contact with the thermosensitive modules of the N thermosensitive devices on the sampling member 30 fixedly places the plate 10. Further, when it is confirmed that the current heating assembly 20 is in a closely contact state with the internal thermal modules of the N thermal devices and the sampling member 30 is in a closely contact state with the sampling interface protruding portions of the N thermal devices, the electronic control assembly 40 controls the heating assembly 20 to operate so as to radiate heat energy to the N thermal devices on the sampling member 30 fixing placement plate 10. At least one detection parameter output from the sampling interface projections of the N thermosensitive devices is acquired via the sampling member 30. The electronic control assembly 40 determines the working performance of the N thermosensitive devices according to at least one detection parameter and prompts the same. Further, the user triggers the testing device again, the electronic control assembly 40 will correspondingly acquire the second instruction to control the driving assembly to start working, and meanwhile, the electronic control assembly 40 controls the driving assembly to start working, so that the driving assembly drives the sampling member 30 to fixedly place the plate 10, the heating assembly 20 and the sampling member 30 to move until the sampling member 30 fixedly places the plate 10 to move from the internal position to the external position of the testing device, the sampling member 30 and the sampling interface protruding portions of the N thermosensitive devices on the sampling member 30 fixedly place the plate 10 are in a non-contact state, and the heating assembly 20 and the thermosensitive modules of the N thermosensitive devices on the sampling member 30 fixedly place the plate 10 are in a non-contact state. Further, the user can judge the quality of each thermosensitive device according to the prompt so as to screen out defective products from the N thermosensitive devices.

In this embodiment, referring to fig. 5, the heating assembly 20 includes a heat generating rod and a temperature control assembly; the heating rod is electrically connected with the temperature control component;

It will be appreciated that when the heating assembly 20 is in operation, its internal temperature control sensor is activated and controls the heater rod in a PID temperature control manner to generate constant thermal energy. Meanwhile, the heating rod transmits the generated heat energy to the sampling member 30 fixing and placing plate 10 so as to radiate the heat energy to N pieces to be measured on the sampling member 30 fixing and placing plate 10. Because the internal thermosensitive modules of the N pieces to be tested are in a contact state of being clung to the heating assembly 20, when the heating rod radiates heat energy to the N pieces to be tested, the internal thermosensitive modules of the N pieces to be tested can be received in time, and meanwhile, the convex parts of the sampling interfaces of the N pieces to be tested correspondingly output detection parameters. The sampling piece 30 is in a close contact state with the sampling interface protruding portions of the N pieces to be tested, and the sampling piece 30 acquires at least one detection parameter output by the sampling interface protruding portions of the N pieces to be tested. Further, the electronic control assembly 40 can determine and prompt the working performance of the N pieces to be tested according to at least one detection parameter collected by the sampling piece 30. The user can judge the good and bad conditions of each piece to be tested according to the prompt so as to screen out defective products from a plurality of pieces to be tested.

Further, referring to fig. 5, the testing device further includes an insulation assembly 50;

the heating assembly 20 is disposed inside the heat insulation assembly 50;

the heat insulation assembly 50 is used for wrapping the heating assembly 20.

It can be understood that, in the process that the temperature control sensor controls the heating rod to generate heat energy in the PID temperature control manner, so that the heating rod radiates heat energy to the N pieces to be measured on the fixed placement board 10 of the sampling piece 30, the heat energy can be emitted into the air, so that the heat energy received by the pieces to be measured is insufficient, and further, the response output by the protruding portion of the sampling interface of the pieces to be measured is inaccurate.

Therefore, in this embodiment, the heat insulation assembly 50 is further provided, and the heat insulation assembly 50 is implemented using asbestos, it should be understood that asbestos has high fire resistance, electrical insulation and heat insulation properties, and is an important fire-proof, insulating and heat-preserving material. Specifically, when the electric control assembly 40 controls the temperature control sensor to start to work so that the heating rod generates heat and generates heat energy, asbestos is used for wrapping the heating assembly 20, namely, wrapping the heating rod and the temperature control sensor, so that the heating rod is isolated from the external environment, and the heat energy generated by the temperature control sensor for controlling the heating rod can be maintained at a constant value as much as possible. The heat insulation assembly 50 in this embodiment can avoid the phenomenon that the heat energy generated by the heating rod is emitted into the air, so that the heat energy received by the N pieces to be tested is insufficient.

Further, referring to fig. 5, the test apparatus further includes:

a heat conduction assembly 70, wherein the heat conduction assembly 70 is arranged between the heating assembly 20 and the sampling member 30 fixing and placing plate 10;

the heat conducting component 70 is configured to conduct heat energy of the heating component 20 to the sampling member 30 to fix the placement plate 10.

It can be understood that, in the process that the temperature control sensor controls the heating rod to generate heat energy in the PID temperature control manner, so that the heating rod radiates heat energy to the N pieces to be measured on the fixed placement board 10 of the sampling piece 30, the heat energy generated by the heating rod needs to be radiated to the N pieces to be measured on the fixed placement board 10 of the sampling piece 30. Therefore, in this embodiment, a heat conduction assembly 70 is further provided for conducting the heat energy generated by the heating rod to the fixed placement plate 10 of the sampling member 30. In this embodiment, the heat conduction assembly 70 is implemented by a graphite heat conductor, and in addition, the graphite heat conductor is further provided with a plurality of through holes for conducting heat energy.

It should be appreciated that the heating element 20 is disposed inside the heat insulation element 50, and the heat insulation element 50 is used to wrap the heating element 20, so as to prevent heat energy of the heating element 20 from being emitted into the air. In contrast, the heat conducting component 70 is not provided with the heat insulating component 50 for wrapping, and in this embodiment, the heat conducting component 70 is not provided with the heat insulating component 50 for wrapping, so as to avoid the phenomenon that when the heating component 20 generates too high heat energy, the heat energy conducted by the heat conducting component 70 is difficult to be emitted to the air, and the N pieces to be measured on the fixed placement plate 10 of the sampling piece 30 receive the too high heat energy. It should be understood that the accuracy of the output detection parameters is affected by the fact that the part to be measured receives too high heat energy. Therefore, the heat conducting component 70 in the present embodiment does not need to be wrapped by the heat insulating component 50, which is beneficial to the dissipation of heat energy.

In this embodiment, referring to FIG. 5, the test device further comprises a shielding assembly;

the shielding assembly comprises a first shielding piece 61 and a second shielding piece 62, wherein the first shielding piece 61 and the second shielding piece 62 are arranged vertically correspondingly along the height direction;

the first shielding member 61 is used for generating carrier waves and performing alternating switching operation between a first action state and a second action state at a first preset frequency;

the second shutter 62 is configured to perform an alternate switching operation between the first operation state and the third operation state.

It will be appreciated that the first shutter 61 is implemented using a motor to generate a carrier frequency to effect the alternating switching between the first and second operating states. The first preset frequency may be a 1HZ frequency, which is not limited herein. In this embodiment, the first operation state refers to a fully open state, the second operation state refers to a fully blocked state, and the third operation state refers to a half blocked state.

In the first embodiment, when it is confirmed that the sampling interface protruding portions of the N thermosensitive devices on the sampling member 30 and the sampling member 30 fixed placement plate 10 are in the preset contact state and the heating assembly 20 and the thermosensitive modules of the N thermosensitive devices on the sampling member 30 fixed placement plate 10 are in the preset contact state, the electric control assembly 40 controls the heating assembly 20 to start to operate, and at the same time, the electric control assembly 40 controls the first shielding member 61 to alternately switch between the full open state and the full shielding state at the first preset frequency and controls the second shielding member to be in the full open state. Further, the heating assembly 20 fixes the heat energy radiated by the N thermosensitive devices on the placement board 10 to the sampling member 30, and at this time, the detection parameters output by the projecting portions of the sampling interfaces of the N thermosensitive devices may be obtained through the sampling member 30, so as to determine the parameters of the uniformity of heating of the N thermosensitive devices.

In the second embodiment, when it is confirmed that the sampling interface protruding portions of the N thermosensitive devices on the sampling member 30 and the sampling member 30 fixed placement plate 10 are in the preset contact state and the heating assembly 20 and the thermosensitive modules of the N thermosensitive devices on the sampling member 30 fixed placement plate 10 are in the preset contact state, the electric control assembly 40 controls the heating assembly 20 to start working, and at the same time, the electric control assembly 40 controls the first shielding member 61 to alternately switch between the fully opened state and the fully shielded state at the first preset frequency and controls the second shielding member to be in the half shielded state. Further, the heating assembly 20 fixes the heat energy radiated by the N thermosensitive devices on the placement board 10 to the sampling member 30, and at this time, the detection parameters output by the projecting portions of the sampling interfaces of the N thermosensitive devices can be obtained through the sampling member 30, so as to determine the thermal response intensity parameters of the N thermosensitive devices.

In the third embodiment, when it is confirmed that the sampling interface protruding portions of the N thermosensitive devices on the fixed placement plate 10 of the sampling member 30 and the sampling member 30 are in the preset contact state and the heating assembly 20 and the thermosensitive modules of the N thermosensitive devices on the fixed placement plate 10 of the sampling member 30 are in the preset contact state, the electric control assembly 40 controls the heating assembly 20 to start working, and at the same time, the electric control assembly 40 controls the first shielding member 61 to be in the full shielding state and controls the second shielding member to be in the full opening state. Further, the heating assembly 20 fixes the heat energy radiated by the N thermosensitive devices on the placement board 10 to the sampling member 30, and at this time, the detection parameters output by the projecting portions of the sampling interfaces of the N thermosensitive devices may be obtained through the sampling member 30, so as to determine the thermal stability degree parameters of the N thermosensitive devices.

Further, referring to fig. 5, the number of the driving assemblies is three, namely a first driving assembly 81, a second driving assembly 82 and a third driving assembly 83;

the first driving assembly 81 is provided with the sampling member 30 fixing and placing plate 10, the second driving assembly 82 is provided with the heating assembly 20, and the third driving assembly 83 is provided with the sampling member 30;

the first driving component 81 is used for driving the sampling piece 30 to fix the placement plate 10 to move from the first position to the second position or from the second position to the first position;

the second driving assembly 82 is configured to drive the heating assembly 20 to move along the height direction, so that the heating assembly 20 and the sampling member 30 fixedly place the internal thermosensitive modules of the N to-be-measured members on the board 10 in a preset contact state or a second contact state;

the third driving assembly 83 is configured to drive the sampling member 30 to move along the height direction, so that the sampling interface protrusions of the N pieces to be tested on the placement board 10 are in a preset contact state or a second contact state with the sampling member 30.

It will be appreciated that in this embodiment the first position refers to the inner position of the testing device and the second position refers to the outer position of the testing device; the preset contact state refers to a close contact state, and the second contact state refers to a non-contact state.

Specifically, when the first driving assembly 81 starts to operate, the sampling member 30 is driven to move from the internal position of the testing device to the external position of the testing device or from the external position of the testing device to the internal position of the testing device. When the second driving assembly 82 starts to work, the heating assembly 20 is driven to move upwards or downwards in parallel, so that the heating assembly 20 and the sampling member 30 fixedly place the internal thermosensitive modules of the N members to be tested on the plate 10 in a close contact state or a non-contact state. When the third driving assembly 83 starts to work, the sampling member 30 is driven to move up or down in parallel, so that the sampling interfaces of the N pieces to be tested on the placement board 10 are in a contact state or a non-contact state of the sampling member 30.

Further, referring to fig. 5, the first driving assembly 81 includes:

a first driving motor;

the first moving slide block is in driving connection with the first driving motor, and is connected with the fixed placement plate 10 of the sampling piece 30;

the first driving motor is configured to drive the first moving slider to drive the sampling member 30 to move the placement plate 10 from the first position to the second position or from the second position to the first position.

It can be understood that when the electronic control assembly 40 receives the first instruction, the first driving motor is controlled to start working, so that the first driving motor drives the first moving slide block to drive the sample piece 30 to fixedly place the board 10 to move to the internal position of the testing device; when the electronic control assembly 40 receives the second instruction, the first driving motor is controlled to start working, so that the first driving motor drives the first moving slide block to drive the sampling piece 30 to fixedly place the plate 10 to move to the external position of the testing device, and when the sampling piece 30 is fixedly placed on the plate 10 to be tested, a user can place N pieces to be tested on the sampling piece 30 to fixedly place the plate 10 to prepare for triggering the testing device again.

Further, referring to fig. 5, the second driving assembly 82 includes:

a second driving motor;

a second moving slide block, the second moving slide block is in driving connection with the second driving motor, and the second moving slide block is connected with the heating component 20;

the second driving motor is configured to drive the second moving slider to drive the heating assembly 20 to move along the height direction, so that the heating assembly 20 and the internal thermosensitive modules of the N pieces to be tested are in a preset contact state or a second contact state.

It can be understood that when the electronic control assembly 40 receives the first instruction, the second driving motor is controlled to start working, so that the second driving motor drives the second moving slide block to drive the heating assembly 20 to translate downwards until the heating assembly 20 is in a close contact state with the internal thermal modules of the N pieces to be tested; when the electric control assembly 40 receives the second instruction, the second driving motor is controlled to drive the second moving slide block to drive the heating assembly 20 to translate upwards until the heating assembly 20 and the internal thermosensitive modules of the N pieces to be detected are in a non-contact state.

It should be understood that in this embodiment, the second moving slide is further connected to the heat conducting component 70, and because the surface of the heating component 20 is wrapped by the heat insulating component 50, and the heat conducting component 70 is disposed at the lower position of the heat insulating component 50, when the second driving motor drives the second moving slide to drive the heating component 20 to move downward, the second moving slide drives the heat conducting component 70 and the heating component 20 wrapped by the heat insulating component 50 to move downward synchronously, until the heat conducting component 70 and the internal heat sensitive modules of the N pieces to be tested are in a close contact state, the electronic control component 40 further controls the heating component 20 to start working.

Further, referring to fig. 5, the third driving assembly 83 includes:

a third driving motor;

a third moving slide block, which is in driving connection with the third driving motor, and is connected with the sampling piece 30;

the third driving motor is configured to drive the third moving slider to drive the sampling piece 30 to move along the height direction, where the sampling interface protrusions of the N pieces to be tested on the sampling piece 30 fixing and placing board 10 are in a preset contact state or a second contact state with the sampling piece 30.

It can be understood that when the electronic control assembly 40 receives the first instruction, the third driving motor is controlled to start working, so that the third driving motor drives the third moving slide block to drive the sampling piece 30 to translate upwards until the protruding portions of the sampling interfaces of the sampling piece 30 and the N pieces to be tested on the disk are in a tightly-attached contact state; when the electronic control assembly 40 receives the second instruction, the third driving motor is controlled to drive the third moving sliding block to drive the sampling piece 30 to translate downwards until the sampling piece 30 and the sampling interface convex parts of the N pieces to be tested on the disk are in a non-contact state.

In this embodiment, referring to fig. 5, the testing device further includes a trigger assembly, where the trigger assembly is disposed on a side surface of the testing device body.

Alternatively, the trigger assembly may be implemented using a trigger button and a touch screen.

In this embodiment, the trigger component is implemented by using a trigger button, and is used to trigger the test device to start and start working. Specifically, in practical application, a user places a plurality of heat-sensitive devices on the fixed placement plate 10 of the sampling member 30, and simultaneously presses a trigger button for a short time, the electronic control assembly 40 in the testing device correspondingly receives a first instruction, the electronic control assembly 40 controls the first driving assembly 81 to drive the first moving slide block to drive the fixed placement plate 10 of the sampling member 30 to move to the internal position of the testing device, and simultaneously, the electronic control assembly 40 also controls the second driving assembly 82 and the third driving assembly 83 to work, so that the second driving assembly 82 drives the second moving slide block to drive the heating assembly 20 to translate downwards until the heating assembly 20 and the internal heat-sensitive modules of the N pieces to be tested are in a close contact state, and the third driving assembly 83 drives the third moving slide block to drive the sampling member 30 to translate upwards until the sampling member 30 and the sampling interface protruding portions of the N pieces to be tested on the fixed placement plate 10 of the sampling member 30 are in a close contact state. Further, N test pieces on the sampling member 30 fixed-placement board 10 are tested.

It should be understood that when the sampling element 30 cannot obtain the responses output by the projecting portions of the sampling interfaces of the N to-be-tested elements within the preset time, when the testing device is in the working state, the user can press the trigger button for a long time, the electronic control assembly 40 in the testing device correspondingly obtains the second instruction, the electronic control assembly 40 controls the first driving assembly 81 to drive the first moving slide block to drive the sampling element 30 to fixedly place the plate 10 to move to the external position of the testing device, meanwhile, the electronic control assembly 40 also controls the second driving assembly 82 and the third driving assembly 83 to work, so that the second driving assembly 82 drives the second moving slide block to drive the heating assembly 20 to translate upwards until the heating assembly 20 and the internal thermosensitive modules of the N to-be-tested elements are in a non-contact state, and the third driving assembly 83 drives the third moving slide block to drive the sampling element 30 to translate downwards until the sampling element 30 and the projecting portions of the sampling interfaces of the N to-be-tested elements on the disk are in a non-contact state. At this time, the user can adjust the placement positions of the N pieces to be measured on the placement plate 10 by readjusting the sampling piece 30 to ensure that the heating assembly 20 and the internal thermosensitive modules of the N pieces to be measured are in a preset contact state and the sampling interface protruding portions of the sampling piece 30 and the N pieces to be measured are in a preset contact state.

In this embodiment, referring to fig. 5, the testing device further includes a display assembly electrically connected to the testing device.

Alternatively, the display assembly may be implemented using an LED display screen and a liquid crystal display screen.

In this embodiment, the display assembly is implemented using an LED display screen. Specifically, in practical application, the electronic control assembly 40 determines the working performance of the N pieces to be tested according to at least one detection parameter obtained by the sampling piece 30, and at the same time, the electronic control assembly 40 controls the LED display screen to display the working performance of each piece to be tested, for example, the image of the uniformity degree of heating of the piece to be tested, the image of the intensity of the thermal response of the piece to be tested, the image of the degree of thermal stability of the piece to be tested, and so on. And a user can comprehensively judge the quality of each piece to be tested according to the images displayed by the LED display screen.

step S1000, preparing the testing device and powering up the testing device;

step S2000, triggering the triggering component to enable the testing device to acquire a second instruction and control the driving component to work, so that the driving component drives the sampling piece 30 to fixedly move the placing plate 10 from the first position to the second position;

Step S3000, placing N thermosensitive devices on the sampling piece 30 fixing and placing plate 10 so that the sampling interface convex parts of the N thermosensitive devices are placed downwards;

step S4000, triggering the triggering assembly, so that the testing device obtains a first instruction and controls the driving assembly to start working, so that the driving assembly drives the sampling piece 30 to move the fixed placement plate 10 from the second position to the first position, and the sampling piece 30 and the sampling interface protruding portions of the N thermosensitive devices on the fixed placement plate 10 are in a preset contact state; controlling the heating assembly 20 to operate so as to radiate heat energy to the plurality of thermosensitive devices on the stationary placement plate 10 of the sampling member 30; acquiring at least one detection parameter output by the sampling interface convex parts of the N thermosensitive devices through the sampling piece 30;

step S5000, triggering the triggering component to enable the testing device to acquire a second instruction and control the driving component to work, so that the driving component drives the sampling piece 30 to fixedly place the plate 10 to move from a first position to a second position, and the sampling interface protrusions of N thermosensitive devices on the sampling piece 30 fixedly place the plate 10 and the sampling piece 30 are in a second contact state; and determining the working performance of the N thermosensitive devices according to at least one detection parameter and prompting.

In practical application, before triggering and starting the testing device, the user connects the testing device to the power supply, and presses the trigger button for a long time to trigger the electronic control assembly 40 in the testing device to receive the second instruction. After receiving the second instruction, the electronic control assembly 40 controls the first driving assembly 81 to drive the first moving sliding block to drive the sampling piece 30 to fixedly place the plate 10 to move to the external position of the testing device, meanwhile, the electronic control assembly 40 also controls the second driving assembly 82 and the third driving assembly 83 to work, so that the second driving assembly 82 drives the second moving sliding block to drive the heating assembly 20 to translate upwards until the heating assembly 20 and the internal thermosensitive modules of the N thermosensitive devices are in a non-contact state, and the third driving assembly 83 drives the third moving sliding block to drive the sampling piece 30 to translate downwards until the sampling piece 30 and the sampling interface convex parts of the N thermosensitive devices on the disk are in a non-contact state.

Further, when the sampling member 30 fixing placement plate 10 is at an external position of the test device, the user places N thermosensitive devices on the sampling member 30 fixing placement plate 10 so that sampling interface protrusions of the N thermosensitive devices are placed downward; such that the inner ones of the N thermosensitive devices are placed upwardly and the sampling interface projections of the N thermosensitive devices are placed downwardly, to provide for enabling the downward movement of the heating assembly 20 to contact the inner ones of the N thermosensitive devices and for enabling the upward movement of the sampling member 30 to contact the sampling interface projections of the N thermosensitive devices.

Further, after the N thermosensitive devices are placed, the user presses the trigger button for a short time to trigger the electronic control assembly 40 in the testing device to receive the first instruction. After receiving the first instruction, the electronic control assembly 40 controls the first driving assembly 81 to drive the first moving sliding block to drive the sampling piece 30 to fixedly place the plate 10 to move to the internal position of the testing device, meanwhile, the electronic control assembly 40 also controls the second driving assembly 82 and the third driving assembly 83 to work, so that the second driving assembly 82 drives the second moving sliding block to drive the heating assembly 20 to translate downwards until the heating assembly 20 is in a closely contacted state with the internal heat-sensitive modules of the N heat-sensitive devices, and the third driving assembly 83 drives the third moving sliding block to drive the sampling piece 30 to translate upwards until the sampling piece 30 is in a closely contacted state with the sampling interface convex parts of the N heat-sensitive devices on the sampling piece 30 fixedly place the plate 10, thereby further testing the N heat-sensitive devices on the sampling piece 30 fixedly place the plate 10. At least one detection parameter output by the convex parts of the sampling interfaces of the N thermosensitive devices is obtained through the sampling piece 30, and the electric control assembly 40 determines the working performance of the N thermosensitive devices according to the at least one detection parameter and controls the display assembly to display corresponding images so as to prompt a user.

Further, after the electronic control assembly 40 determines the working performance of the N thermosensitive devices and prompts the working performance through the display assembly, the electronic control assembly 40 controls the second driving assembly 82 and the third driving assembly 83 to work, so that the second driving assembly 82 drives the second moving slide block to drive the heating assembly 20 to translate upwards until the heating assembly 20 is in a non-contact state with the internal thermosensitive modules of the N thermosensitive devices, and the third driving assembly 83 drives the third moving slide block to drive the sampling member 30 to translate downwards until the sampling member 30 is in a non-contact state with the sampling interface convex portions of the N thermosensitive devices on the disk. Meanwhile, the electric control assembly 40 controls the first driving assembly 81 to work so as to drive the sampling member 30 to fixedly place the plate 10 to move to the external position of the testing device, and the user judges the quality condition of each thermosensitive device according to the prompt of the testing device, and screens out defective products on the sampling member 30 fixedly place the plate 10.

The foregoing description of the preferred embodiments of the present invention should not be construed as limiting the scope of the invention, but rather should be understood to cover all modifications, equivalents, and alternatives falling within the spirit and scope of the invention as defined by the following description and drawings or any application directly or indirectly to other relevant art(s).

Claims

1. A control method of a testing device is provided, wherein a first shielding piece, a second shielding piece, a driving component, a heating component, a sampling piece and a sampling piece fixing and placing plate are arranged on the testing device; the first shielding piece and the second shielding piece are arranged between the heating assembly and the sampling piece fixing and placing plate, and the first shielding piece and the second shielding piece are correspondingly arranged up and down along the height direction; the fixed board of placing of sampling piece is used for placing N piece that awaits measuring, N is greater than or equal to 1, its characterized in that includes following step:

step 200, controlling the heating assembly to work, controlling the first shielding piece to alternately switch between a first action state and a second action state at a first preset frequency, and controlling the second shielding piece to be in the first action state; the first action state is full open, and the second action state is full shielding, so that the heating component radiates heat energy to the position, which is not shielded by the first shielding piece and the second shielding piece, on the sampling piece fixing and placing plate;

Controlling the heating assembly to work, controlling the first shielding piece to alternately switch between a first action state and a second action state at a first preset frequency, and controlling the second shielding piece to be in a third action state; the first action state is fully opened, the second action state is fully shielded, and the third action state is semi-shielded, so that the heating assembly radiates heat energy to the position, which is not shielded by the first shielding piece and the second shielding piece, on the sampling piece fixing and placing plate;

controlling the heating assembly to work, controlling the first shielding piece to be in a second action state and controlling the second shielding piece to be in a first action state; the first action state is full open, and the second action state is full shielding, so that the heating component radiates heat energy to the position, which is not shielded by the first shielding piece and the second shielding piece, on the sampling piece fixing and placing plate;

step S300, detecting parameters output by the sampling interface convex parts of the N pieces to be detected are obtained through the sampling pieces to determine heating uniformity degree parameters, heating response intensity parameters and heating stability degree parameters of the N pieces to be detected;

2. The method for controlling a test device according to claim 1, wherein the step of bringing the sampling member into a predetermined contact state with the sampling interface protrusions of the N pieces under test on the sampling member fixing and placing plate is specifically:

3. The test device control method according to claim 2, wherein the step S100 further comprises:

4. The test device control method of claim 3, wherein between said step S200 and said step S300, said test device control method further comprises:

5. The test device control method according to any one of claims 1 to 4, characterized in that the test device control method further comprises, prior to the step S200:

6. The test device control method of any one of claims 1-4, wherein prior to step S400, the test device control method further comprises:

7. The test device control method of any one of claims 1-4, further comprising:

8. A test device, the test device comprising:

the heating component is arranged in the testing device;

the driving assembly is arranged in the testing device;

the sampling piece is arranged in the testing device;

9. The test device of claim 8, wherein the heating assembly comprises a heat bar and a temperature control assembly; the heating rod is electrically connected with the temperature control component;

the temperature control component is used for controlling the heating rod to generate heat energy.

10. The test device of claim 8, wherein the test device further comprises an insulation assembly;

the heating component is arranged in the heat insulation component;

the heat insulation assembly is used for wrapping the heating assembly.

11. The test apparatus of claim 8, wherein the test apparatus further comprises:

12. The test device of claim 8, further comprising a shield assembly;

13. The test device of claim 8, wherein the number of drive assemblies is three, a first drive assembly, a second drive assembly, and a third drive assembly, respectively;

14. The test apparatus of claim 13, wherein the first drive assembly comprises:

a first driving motor;

15. The test apparatus of claim 13, wherein the second drive assembly comprises:

a second driving motor;

16. The test apparatus of claim 13, wherein the third drive assembly comprises:

a third driving motor;

17. The test device of claim 8, further comprising a trigger assembly disposed on a side of the test device body.

18. The test device of claim 8, further comprising a display assembly electrically connected to the test device.

19. A method of testing a batch of thermosensitive devices based on a testing apparatus according to any one of claims 8-18, comprising the steps of:

step S1000, preparing the testing device and powering up the testing device;