CN116165409A - Automatic withstand voltage test machine of nano-capacitor - Google Patents
Automatic withstand voltage test machine of nano-capacitor Download PDFInfo
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- CN116165409A CN116165409A CN202310429261.4A CN202310429261A CN116165409A CN 116165409 A CN116165409 A CN 116165409A CN 202310429261 A CN202310429261 A CN 202310429261A CN 116165409 A CN116165409 A CN 116165409A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
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- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention relates to the technical field of nano capacitors, in particular to an automatic withstand voltage tester for a nano capacitor, which comprises a tester body; the device comprises a tester body, wherein the top end of the tester body is provided with an abutting structure, the abutting structure comprises a base, the top end of the tester body is fixedly connected with the base, two ends of the base are fixedly connected with supporting rods, the top ends of the supporting rods are slidably connected with connecting rods, the side ends of the connecting rods are fixedly connected with fixing seats, two ends of the fixing seats are rotatably connected with two rotating rods, the bottom ends of the rotating rods are slidably connected with clamping rods, the side ends of the clamping rods are rotatably connected with rotating plates, the rotating plates are fixedly locked through bolts, the top ends of the rotating plates are fixedly connected with fixing rings, and the bottom ends of the rotating plates are fixedly connected with abutting rods; the rotating structure is arranged in the abutting structure; through installing the conflict structure on test machine body top, can be convenient for carry out the centre gripping with the positive negative pole of nanometer electric capacity and contradict.
Description
Technical Field
The invention relates to the technical field of nano capacitors, in particular to an automatic withstand voltage tester for a nano capacitor.
Background
The capacitor is one of electronic components widely used in electronic equipment, and is widely applied to the aspects of blocking direct current alternating current, coupling, bypass, filtering, tuning loop, energy conversion, control and the like in a circuit.
However, when the nano capacitor is tested, the clamp of the withstand voltage tester is clamped on the positive electrode port and the negative electrode port of the nano capacitor, and the positive electrode port and the negative electrode port of part of the nano capacitor are too small, so that the clamp of the withstand voltage tester is difficult to clamp and fix, and the clamp of the withstand voltage tester is easy to fall off from the port of the nano capacitor during clamping, so that the accuracy and efficiency of the nano capacitor test can be affected.
Disclosure of Invention
Aiming at the problems in the prior art, the invention provides an automatic withstand voltage tester for a nano capacitor.
The technical scheme adopted for solving the technical problems is as follows: an automatic withstand voltage testing machine for nano-capacitors, comprising:
a tester body;
the device comprises a tester body, wherein the top end of the tester body is provided with an abutting structure, the abutting structure comprises a base, the top end of the tester body is fixedly connected with the base, two ends of the base are fixedly connected with supporting rods, the top ends of the supporting rods are slidably connected with connecting rods, the side ends of the connecting rods are fixedly connected with fixing seats, two ends of the fixing seats are rotatably connected with two rotating rods, the bottom ends of the rotating rods are slidably connected with clamping rods, the side ends of the clamping rods are rotatably connected with rotating plates, the rotating plates are fixedly locked through bolts, the top ends of the rotating plates are fixedly connected with fixing rings, and the bottom ends of the rotating plates are fixedly connected with abutting rods;
and the rotating structure is arranged in the abutting structure.
Specifically, the rotating structure includes the pivot, fixing base swivelling joint has the pivot, pivot and rotary rod fixed connection, pivot side fixedly connected with gear, sliding connection has the rack in the fixing base, gear and rack meshing, fixedly connected with guide arm in the fixing base, guide arm and rack sliding connection.
Specifically, install location structure in the conflict structure, location structure includes the slider, clamping bar side fixedly connected with slider, slider and rotary rod sliding connection, slider side and the equal fixedly connected with roating seat of rotary rod side, two rotate between the roating seat and be connected with the shell fragment, fixedly connected with spacing post in the rotary rod, spacing post and slider sliding connection.
Specifically, the adjusting structure is installed to conflict structure side, adjusting structure includes the screw rod, connecting rod bottom fixedly connected with screw rod, screw rod and bracing piece sliding connection, the bracing piece top rotates and is connected with the screwed ring, screwed ring and screw rod threaded connection.
Specifically, the thread ring bottom fixedly connected with spacing ring, spacing ring and bracing piece rotate to be connected.
Specifically, the clamping structure is installed to conflict structure bottom, the clamping structure includes the slide, base top sliding connection has the slide, the slide internal rotation is connected with the lead screw, threaded connection has splint on the lead screw, splint and slide sliding connection, splint side fixedly connected with rubber piece.
Specifically, lead screw side fixedly connected with first bevel gear, slide internal rotation is connected with bull stick, bull stick side fixedly connected with second bevel gear, first bevel gear and second bevel gear meshing.
Specifically, the sliding structure is installed to conflict structure bottom, sliding structure includes the slide, base top sliding connection has the slide, slide top fixedly connected with fixed axle, the slide is connected with the connecting seat through the fixed axle rotation, connecting seat and slide fixed connection, sliding connection has the card pole in the fixed axle, card pole and connecting seat block, fixedly connected with first spring between card pole and the fixed axle, fixedly connected with reference column in the fixed axle, reference column and card pole sliding connection.
Specifically, conflict structure internally mounted has limit structure, limit structure includes the limiting plate, sliding connection has the limiting plate in the base, limiting plate top fixedly connected with a plurality of inserted bars, be equipped with the slot in the slide, inserted bar and slot are pegged graft, fixedly connected with second spring between limiting plate and the base.
Specifically, slide side fixedly connected with locating lever, locating lever and base sliding connection.
The beneficial effects of the invention are as follows:
(1) According to the automatic withstand voltage testing machine for the nano capacitor, disclosed by the invention, the anode and the cathode of the nano capacitor can be conveniently clamped and abutted through the abutting structure arranged at the top end of the testing machine body, the anode and the cathode of the nano capacitor can be automatically clamped through the rotating structure, meanwhile, the abutting structure and the nano capacitor can be better kept in abutting through the positioning structure, and the abutting structure can be adjusted according to the height of the nano capacitor through the adjusting structure.
(2) According to the automatic withstand voltage testing machine for the nano capacitor, the clamping structure arranged at the bottom end of the abutting structure can clamp the nano capacitor to be tested, and the sliding structure and the limiting structure can facilitate placement of a plurality of nano capacitors when clamping the nano capacitor, so that time is saved, and testing efficiency is improved.
Drawings
The invention will be further described with reference to the drawings and examples.
FIG. 1 is a schematic diagram of an overall structure of a preferred embodiment of an automatic withstand voltage tester for nano-capacitors according to the present invention;
FIG. 2 is an enlarged schematic view of the portion A shown in FIG. 1;
FIG. 3 is an enlarged schematic view of the B-section structure shown in FIG. 1;
FIG. 4 is an enlarged schematic view of the structure of the portion C shown in FIG. 1;
FIG. 5 is an enlarged schematic view of the structure of the portion D shown in FIG. 1;
FIG. 6 is a schematic view of the connection structure of the gear and rack of the present invention;
FIG. 7 is a schematic view of the connection structure of the skateboard and splint of the present invention;
FIG. 8 is a schematic view of the connection structure of the base and the connection base of the present invention;
FIG. 9 is a schematic view of the connection structure of the rotating lever and the clamping lever of the present invention;
fig. 10 is a schematic view of the connection structure of the screw and the threaded ring of the present invention.
In the figure: 1. a tester body; 2. a collision structure; 201. a base; 202. a support rod; 203. a connecting rod; 204. a fixing seat; 205. a rotating rod; 206. a clamping rod; 207. a rotating plate; 208. a fixing ring; 209. a touch-up rod; 3. a rotating structure; 301. a rotating shaft; 302. a gear; 303. a rack; 304. a guide rod; 4. a positioning structure; 401. a slide block; 402. a rotating seat; 403. a spring plate; 404. a limit column; 5. an adjustment structure; 501. a screw; 502. a threaded ring; 503. a limiting ring; 6. a clamping structure; 601. a slide plate; 602. a screw rod; 603. a clamping plate; 604. a rubber block; 605. a first bevel gear; 606. a rotating rod; 607. a second bevel gear; 7. a sliding structure; 701. a slide; 702. a fixed shaft; 703. a connecting seat; 704. a clamping rod; 705. a first spring; 706. positioning columns; 8. a limit structure; 801. a limiting plate; 802. a rod; 803. a slot; 804. a second spring; 805. and a positioning rod.
Detailed Description
The invention is further described in connection with the following detailed description in order to make the technical means, the creation characteristics, the achievement of the purpose and the effect of the invention easy to understand.
As shown in fig. 1-10, the automatic withstand voltage testing machine for nano-capacitors of the invention comprises a testing machine body 1, wherein an abutting structure 2 is arranged at the top end of the testing machine body 1, a rotating structure 3 is arranged in the abutting structure 2, a positioning structure 4 is arranged in the abutting structure 2, an adjusting structure 5 is arranged at the side end of the abutting structure 2, a clamping structure 6 is arranged at the bottom end of the abutting structure 2, a sliding structure 7 is arranged at the bottom end of the abutting structure 2, and a limiting structure 8 is arranged in the abutting structure 2;
the interference structure 2 comprises a base 201, the top end of the testing machine body 1 is fixedly connected with the base 201, the two ends of the base 201 are fixedly connected with a supporting rod 202, the top end of the supporting rod 202 is slidably connected with a connecting rod 203, the side end of the connecting rod 203 is fixedly connected with a fixing seat 204, the two ends of the fixing seat 204 are rotatably connected with two rotating rods 205, the bottom end of the rotating rod 205 is slidably connected with a clamping rod 206, the side end of the clamping rod 206 is rotatably connected with a rotating plate 207, the rotating plate 207 is fixedly locked through bolts, the top end of the rotating plate 207 is fixedly connected with a fixing ring 208, the bottom end of the rotating plate 207 is fixedly connected with an interference rod 209, the rotating structure 3 comprises a rotating shaft 301, the fixing seat 204 is rotatably connected with a rotating shaft 301, the rotating shaft 301 is fixedly connected with the rotating rod 205, the side end of the rotating shaft 301 is fixedly connected with a gear 302, the fixing seat 204 is slidably connected with a rack 303, the gear 302 is meshed with the rack 303, a guide rod 304 is fixedly connected in the fixing seat 204, the guide rod 304 is slidably connected with the rack 303, when the nano capacitor is required to be tested, an electric telescopic rod arranged at the top end of the fixing seat 204 is started, as the output end of the electric telescopic rod is fixedly connected with the rack 303, the rack 303 can be driven to slide up and down when the electric telescopic rod is started, the gear 302 fixed on the rotating shaft 301 can be driven to rotate when the rack 303 slides down, the rotating rod 205 fixed on the rotating shaft 301 can be driven to be unfolded, the rotating rod 205 can be driven to rotate in opposite directions when the rack 303 is driven to slide up, as the clamping rod 206 is slidably connected at the bottom end of the rotating rod 205, and the rotating plate 207 is rotatably connected on the clamping rod 206, therefore, the angle of the rotating plate 207 can be adjusted according to the size of the positive and negative electrode ports of the nano capacitor, and the rotor plate 207 is fixed through bolt and clamping rod 206 locking, then fix the positive and negative pole of test machine body 1 respectively on both ends solid fixed ring 208, and gu fixed ring 208 and the conflict pole 209 electric connection of fixing in rotor plate 207 bottom, conflict pole 209 is electrically conductive material, consequently can carry out the centre gripping to the positive and negative pole of nanometer electric capacity voluntarily to be convenient for test.
Specifically, location structure 4 includes slider 401, clamp lever 206 side fixedly connected with slider 401, slider 401 and rotary rod 205 sliding connection, slider 401 side and rotary rod 205 side all fixedly connected with roating seat 402, two rotate between roating seat 402 and be connected with shell fragment 403, rotary rod 205 internal fixation has spacing post 404, spacing post 404 and slider 401 sliding connection, adjust structure 5 includes screw rod 501, connecting rod 203 bottom fixedly connected with screw rod 501, screw rod 501 and bracing piece 202 sliding connection, bracing piece 202 top rotation is connected with screwed ring 502, screwed ring 502 and screw rod 501 screwed connection, screwed ring 502 bottom fixedly connected with spacing ring 503, spacing ring 503 and bracing piece 202 rotation are connected, because install shell fragment 403 between slider 401 and rotary rod 205, can drive clamp lever 206 slip and the port conflict of nanometer electric capacity through the spacing post 404 and slider 401 sliding connection of fixing in 205 at any time, can carry out direction spacing ring 202 to slider 401, because screwed ring 502 rotates and is connected with screwed ring 502 at any time, can carry out the screw thread to the height through the screwed ring 502, thus can be adjusted the height through screwed ring 502, and the fixed connection of the height of the top of the connecting rod 502.
Specifically, the clamping structure 6 includes a sliding plate 601, sliding plate 601 is slidingly connected to the top end of base 201, sliding plate 601 is rotationally connected to a screw rod 602, clamping plate 603 is connected to screw rod 602, clamping plate 603 is slidingly connected to sliding plate 601, rubber block 604 is fixedly connected to the side end of clamping plate 603, first bevel gear 605 is fixedly connected to the side end of screw rod 602, rotating rod 606 is rotationally connected to rotating plate 601, second bevel gear 607 is fixedly connected to the side end of rotating rod 606, first bevel gear 605 is meshed with second bevel gear 607, when nano capacitor is required to be tested, sliding plate 601 is slidingly connected to the top end of base 201, rotating rod 606 rotating in sliding plate 601 can drive screw rod 602 to rotationally connect to sliding plate 601 through first bevel gear 605 and second bevel gear 607, nano capacitor can be clamped through opposite sliding of clamping plates 603 and screw rod 602 sliding in sliding plate 601, nano capacitor can be fixed, and damage to nano capacitor can be prevented by fixing rubber block 604 at the side end of clamping plate 603.
Specifically, the sliding structure 7 includes a sliding seat 701, the top end of the base 201 is slidably connected with the sliding seat 701, the top end of the sliding seat 701 is fixedly connected with a fixed shaft 702, the sliding seat 701 is rotatably connected with a connecting seat 703 through the fixed shaft 702, the connecting seat 703 is fixedly connected with a sliding plate 601, a clamping rod 704 is slidably connected with the fixed shaft 702, the clamping rod 704 is clamped with the connecting seat 703, a first spring 705 is fixedly connected between the clamping rod 704 and the fixed shaft 702, a positioning column 706 is fixedly connected in the fixed shaft 702, the positioning column 706 is slidably connected with the clamping rod 704, after the nano capacitor on the sliding plate 601 at one end of the sliding seat 701 is tested, the sliding seat 701 is then slid to the outermost end of the base 201, then the clamping rod 704 is pressed downwards, after the clamping rod 704 is separated from the sliding seat 701, the sliding plate 601 at two ends can be rotated, therefore, the nano capacitor clamped on the sliding plate 601 at the other end can be tested, then the tested nano capacitor is taken down, and the tested nano capacitor is placed and clamped again, so that the testing efficiency of the nano capacitor can be improved.
Specifically, limit structure 8 includes limiting plate 801, sliding connection has limiting plate 801 in base 201, limiting plate 801 top fixedly connected with a plurality of inserted bars 802, be equipped with slot 803 in the slide 701, inserted bar 802 and slot 803 peg graft, fixedly connected with second spring 804 between limiting plate 801 and the base 201, slide 701 side fixedly connected with locating lever 805, locating lever 805 and base 201 sliding connection, because slide 701 that slides on base 201 is connected with connecting seat 703 through fixed axle 702 rotation, and connecting seat 703 and slide 601 fixed connection, consequently push down limiting plate 801, can drive the inserted bar 802 of fixing on limiting plate 801 and slide 803 and slide downwards, after inserted bar 802 and slot 803 are separated, can adjust the position of slide 701 to can adjust the position of slide 601, thereby can test different nano-capacitance on slide 601, can drive inserted bar 802 and slot through the elasticity of fixing the second spring 804 between limiting plate 801 and base 201, can drive slide 802 and slide 803 again through fixing and peg graft the side end 805 and can slide 201 sliding connection.
When the invention is used, when the nano capacitor is required to be tested, the electric telescopic rod arranged at the top end of the fixed seat 204 is started, because the output end of the electric telescopic rod is fixedly connected with the rack 303, the rack 303 can be driven to slide up and down when the electric telescopic rod is started, the gear 302 fixed on the rotating shaft 301 can be driven to rotate when the rack 303 slides down, the rotating rod 205 fixed on the rotating shaft 301 can be driven to be unfolded, when the rack 303 is driven to slide upwards, the rotating rod 205 can be driven to rotate in opposite directions, as the clamping rod 206 is connected at the bottom end of the rotating rod 205 in a sliding way, and the rotating plate 207 is connected on the clamping rod 206 in a rotating way, the angle of the rotating plate 207 can be adjusted according to the size of the positive and negative electrode ports of the nano capacitor, the rotating plate 207 is locked and fixed through the bolt and the clamping rod 206, then the positive electrode and the negative electrode of the tester body 1 are respectively fixed on the two end fixing rings 208, the fixed ring 208 is electrically connected with the abutting rod 209 fixed at the bottom end of the rotating plate 207, the abutting rod 209 is made of conductive materials, so that the anode and the cathode of the nano capacitor can be automatically clamped, the test is convenient, as the elastic sheet 403 is arranged between the sliding block 401 and the rotating rod 205, the clamping rod 206 can be driven to slide to keep abutting with the port of the nano capacitor at any time through the elastic force of the elastic sheet 403, the sliding block 401 can be guided and limited through the limiting column 404 fixed in the rotating rod 205 and the sliding block 401, the supporting rod 202 is rotationally connected with the threaded ring 502 through the limiting ring 503, and the screw rod 501 fixed at the bottom end of the connecting rod 203 is in threaded connection with the threaded ring 502 through the rotating threaded ring 502, the height of the fixed seat 204 can be adjusted, so that the nano capacitors with different heights can be clamped and tested, when the nano-capacitor needs to be tested, as the sliding plate 601 is slidingly connected to the top end of the base 201, the rotating rod 606 rotating in the sliding plate 601 can rotate to drive the screw rod 602 to rotationally connect in the sliding plate 601 through the first bevel gear 605 and the second bevel gear 607, as the clamping plate 603 sliding in the sliding plate 601 is in threaded connection with the screw rod 602, the nano-capacitor can be clamped by the opposite sliding of the clamping plates 603 at two ends so as to be convenient for clamping and fixing the nano-capacitor, the rubber block 604 fixed at the side end of the clamping plate 603 can prevent the nano-capacitor from being clamped and damaging the nano-capacitor, as the sliding seat 701 sliding on the base 201 is rotationally connected with the connecting seat 703 through the fixing shaft 702, and the connecting seat 703 is fixedly connected with the sliding plate 601, the limiting plate 801 is pressed downwards, the inserting rod 802 fixed on the limiting plate 801 can be driven to slide downwards, after the inserting rod 802 and the inserting groove 803 are separated, the position of the sliding seat 701 can be adjusted, so that the position of the sliding plate 601 can be adjusted, different nano-capacitors on the sliding plate 601 can be tested, the inserting rod 802 can be driven to reset and the inserting groove 803 can be inserted again through the elastic force of the second spring 804 fixed between the limiting plate 801 and the base 201, the sliding seat 701 can be limited through the sliding connection of the positioning rod 805 fixed at the side end of the sliding seat 701 and the base 201, after the nano-capacitor test on the sliding plate 601 at one end of the sliding seat 701 is completed, the sliding seat 701 is then slid to the outermost end of the base 201, then the clamping rod 704 is pressed downwards, after the clamping rod 704 is separated from the sliding seat 701, the sliding seat 701 can be rotated to adjust the sliding plates 601 at two ends, so that the nano-capacitors clamped on the sliding plate 601 at the other end can be tested, then the nano-capacitors after the test is completed are taken down, placing and clamping are carried out again, so that the test efficiency of the nano capacitor can be improved.
It will be evident to those skilled in the art that the invention is not limited to the details of the foregoing illustrative embodiments, and that the present invention may be embodied in other specific forms without departing from the spirit or essential characteristics thereof. The present embodiments are, therefore, to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.
Furthermore, it should be understood that although the present disclosure describes embodiments, not every embodiment is provided with a separate embodiment, and that this description is provided for clarity only, and that the disclosure is not limited to the embodiments described in detail below, and that the embodiments described in the examples may be combined as appropriate to form other embodiments that will be apparent to those skilled in the art.
Claims (10)
1. An automatic withstand voltage test machine for nano-capacitors, which is characterized by comprising:
a tester body (1);
the anti-collision structure (2), anti-collision structure (2) is installed on the top of testing machine body (1), anti-collision structure (2) includes base (201), testing machine body (1) top fixedly connected with base (201), base (201) both ends fixedly connected with bracing piece (202), bracing piece (202) top sliding connection has connecting rod (203), connecting rod (203) side fixedly connected with fixing base (204), fixing base (204) both ends all rotate and are connected with two rotary rods (205), rotary rod (205) bottom sliding connection has clamp rod (206), clamp rod (206) side rotation is connected with rotor plate (207), rotor plate (207) are fixed through the bolt locking, rotor plate (207) top fixedly connected with solid fixed ring (208), rotor plate (207) bottom fixedly connected with anti-collision rod (209).
And the rotating structure (3) is arranged in the abutting structure (2).
2. The automatic withstand voltage testing machine for nano-capacitors according to claim 1, wherein: the rotating structure (3) comprises a rotating shaft (301), the rotating shaft (301) is rotationally connected with the fixing seat (204), the rotating shaft (301) is fixedly connected with the rotating rod (205), a gear (302) is fixedly connected with the side end of the rotating shaft (301), a rack (303) is slidably connected with the fixing seat (204), the gear (302) is meshed with the rack (303), a guide rod (304) is fixedly connected with the fixing seat (204), and the guide rod (304) is slidably connected with the rack (303).
3. The automatic withstand voltage testing machine for nano-capacitors according to claim 1, wherein: install location structure (4) in contradicting structure (2), location structure (4) include slider (401), clamping bar (206) side fixedly connected with slider (401), slider (401) and rotary rod (205) sliding connection, slider (401) side and rotary rod (205) side all fixedly connected with roating seat (402), two rotate between roating seat (402) and be connected with shell fragment (403), fixedly connected with spacing post (404) in rotary rod (205), spacing post (404) and slider (401) sliding connection.
4. The automatic withstand voltage testing machine for nano-capacitors according to claim 1, wherein: the adjusting structure is characterized in that the adjusting structure (5) is arranged at the side end of the abutting structure (2), the adjusting structure (5) comprises a screw rod (501), the screw rod (501) is fixedly connected to the bottom end of the connecting rod (203), the screw rod (501) is slidably connected with the supporting rod (202), a threaded ring (502) is rotatably connected to the top end of the supporting rod (202), and the threaded ring (502) is in threaded connection with the screw rod (501).
5. The automatic withstand voltage testing machine for nano-capacitors according to claim 4, wherein: the bottom end of the threaded ring (502) is fixedly connected with a limiting ring (503), and the limiting ring (503) is rotationally connected with the supporting rod (202).
6. The automatic withstand voltage testing machine for nano-capacitors according to claim 1, wherein: the utility model discloses a clamp structure, including base (201), conflict structure (2), clamp structure (6) are installed to conflict structure (2) bottom, clamp structure (6) include slide (601), base (201) top sliding connection has slide (601), slide (601) internal rotation is connected with lead screw (602), threaded connection has splint (603) on lead screw (602), splint (603) and slide (601) sliding connection, splint (603) side fixedly connected with rubber piece (604).
7. The automatic withstand voltage testing machine for nano-capacitors according to claim 6, wherein: the screw rod (602) side fixedly connected with first bevel gear (605), slide (601) internal rotation is connected with bull stick (606), bull stick (606) side fixedly connected with second bevel gear (607), first bevel gear (605) and second bevel gear (607) meshing.
8. The automatic withstand voltage testing machine for nano-capacitors according to claim 6, wherein: the utility model discloses a sliding structure, including base (201), slide (701) are fixed on base (201), slide (701) are fixed on base (702), slide (701) are connected with connecting seat (703) through fixed axle (702) rotation, connecting seat (703) and slide (601) fixed connection, sliding connection has clamping bar (704) in fixed axle (702), clamping bar (704) and connecting seat (703) block, fixedly connected with first spring (705) between clamping bar (704) and fixed axle (702), fixedly connected with reference column (706) in fixed axle (702), reference column (706) and clamping bar (704) sliding connection.
9. The automatic withstand voltage tester for nano-capacitor according to claim 8, wherein: the utility model discloses a sliding seat structure, including base (201), conflict structure (2) internally mounted has limit structure (8), limit structure (8) include limiting plate (801), sliding connection has limiting plate (801) in base (201), limiting plate (801) top fixedly connected with a plurality of inserted bars (802), be equipped with slot (803) in slide (701), inserted bar (802) and slot (803) peg graft, fixedly connected with second spring (804) between limiting plate (801) and base (201).
10. The automatic withstand voltage tester for nano-capacitor according to claim 8, wherein: the side end of the sliding seat (701) is fixedly connected with a positioning rod (805), and the positioning rod (805) is in sliding connection with the base (201).
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310429261.4A CN116165409B (en) | 2023-04-21 | 2023-04-21 | Automatic withstand voltage test machine of nano-capacitor |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202310429261.4A CN116165409B (en) | 2023-04-21 | 2023-04-21 | Automatic withstand voltage test machine of nano-capacitor |
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| CN116165409B CN116165409B (en) | 2023-06-30 |
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