CN116165208A - Film defect detection system, detection method, detection device and storage medium - Google Patents

Abstract

The application discloses a defect detection system, a detection method, a detection device and a storage medium for a film material, and belongs to the technical field of film material defect detection. The defect detection system of the film material comprises: the light source is used for facing the film material to be detected and comprises a plurality of light source modules distributed along the width direction of the film material; the photographing equipment and the light source are arranged on the same side of the film material and are used for collecting reflected light; the controller is electrically connected with the light sources and the photographing equipment, and is used for synchronously controlling the states of the light source modules and photographing the photographing equipment, and processing the received image group to obtain a defect detection result. Through the setting of above-mentioned light source, equipment of shooing and controller, when detecting the surface defect of membrane material self, can also detect the subtle fish tail of membrane material along the direction of motion in the transportation, and the quantity requirement and the precision requirement to the camera are lower to detection cost has been practiced thrift by a wide margin.

Description

Film defect detection system, detection method, detection device and storage medium

Technical Field

The application belongs to the technical field of film defect detection, and particularly relates to a film defect detection system, a detection method, a detection device and a storage medium.

Background

Some of the defect detection works on the film material can adopt manual visual inspection to detect whether the film material has defects or not, and record the defect areas. However, the above-described manner of detection by the human eye has the following problems: firstly, fatigue or misjudgment is easily generated by eyes under long-time observation, the defect discrimination rate of the film material starts to be reduced, and the defect judgment standard of a single product is inconsistent; secondly, the speed of the film material on the conveyor belt cannot be too high; third, when the defect is small, the human eye cannot recognize.

In the related art, an automatic optical defect detection device is used for detecting defects of a film material, and the traditional film material detection mode is a reflection detection station and a backlight detection station. The camera generally adopts a black-and-white line scanning camera, the light source generally adopts a strip light source or a line light source, the reflection station is used for detecting surface defects, namely defects such as concave-convex points, impurities, scratches, leakage coating of passivation solution, scratches and the like, and the transmission station is used for detecting defects such as pinholes, damages and the like.

However, the inventor researches that in the film production process, if a hard tiny object is arranged on a conveying roller of the equipment, a tiny scratch is formed on the surface of the film along the moving direction, the width is about 15um-30um, the reflection station of the existing automatic optical detection equipment only forms a slight image on the resolution of 0.015mm/pixel for the tiny scratch along the moving direction, and 8 black-white line cameras are required for the width of 1000mm, so that the cost of the detection equipment is too high.

Disclosure of Invention

The present application aims to solve at least one of the technical problems existing in the prior art. Therefore, the application provides a defect detection system, a detection method, a detection device and a storage medium for a film material, which can detect fine scratches along the moving direction, and has lower requirements on the number of cameras and the accuracy, thereby greatly saving the detection cost.

In a first aspect, the present application provides a defect detection system for a film, the system comprising:

the light source is used for facing the film material to be detected and comprises a plurality of light source modules distributed along the width direction of the film material;

the photographing device and the light source are arranged on the same side of the film material and used for collecting reflected light;

and the controller is electrically connected with the light sources and the photographing equipment, and is used for synchronously controlling the states of the light source modules and photographing the photographing equipment, and processing the received image group to obtain a defect detection result.

According to the defect detection system of the film material, through the arrangement of the light source, the photographing equipment and the controller, the surface defect of the film material can be detected, meanwhile, the film material can be detected to be finely scratched along the moving direction in the transportation process, and the requirement on the quantity of cameras and the requirement on the precision are low, so that the detection cost is greatly saved.

According to one embodiment of the present application, the controller includes:

an encoder;

the image acquisition card is electrically connected with the encoder, the light source and the photographing equipment, and is used for synchronously controlling the light source to adjust the states of the light source modules and controlling the photographing equipment to photograph according to control signals output by the encoder, and the image acquisition card is also used for receiving an image group output by the photographing equipment;

and the image processor is electrically connected with the image acquisition card and is used for processing the image group to obtain a defect detection result.

According to one embodiment of the present application, the system further comprises:

and the encoder is arranged on the film conveying mechanism and is used for outputting pulse signals based on the motion state of the film conveying mechanism.

According to one embodiment of the present application, the system further comprises:

the alarm module is electrically connected with the controller and is used for outputting alarm information when receiving an alarm signal;

and the storage module is electrically connected with the controller and used for storing the detection log.

In a second aspect, the present application provides a method for detecting a defect of a film, including:

outputting a first control signal to a light source to control states of a plurality of light source modules of the light source;

outputting a second control signal synchronous with the first control signal to the photographing equipment so as to control the photographing equipment to photograph the film material image;

receiving image groups output by the photographing equipment, wherein a plurality of images in each image group correspond to a plurality of states of the light source one by one;

and performing defect detection based on the image group to obtain a defect detection result.

According to the defect detection method for the film material, through the arrangement of the steps, the defect detection system of the film material is matched, a plurality of images are shot at the same position of the film material in the advancing process of the film material, and the detection capability of fine scratches along the moving direction is improved by combining the information of the size, the shape, the gray scale and the like of the defect under the full brightness of the plurality of light source modules and the partial brightness of the plurality of light source modules, so that the quality control of the film material with high precision is realized.

According to an embodiment of the present application, the performing defect detection based on the image set to obtain a defect detection result includes:

Splicing the images corresponding to the same state of the light source in the plurality of image groups to obtain a plurality of images to be identified, wherein the images correspond to the plurality of states of the light source one by one;

and carrying out defect identification on the image to be identified to obtain a defect detection result.

According to one embodiment of the application, the image to be identified corresponding to the full brightness of the plurality of light source modules is used for identifying concave-convex point defects, impurity defects, scratch defects and passivation solution coating defects on the surface of the film material;

the images to be identified, which are partially bright and correspond to the light source modules, are used for identifying scratch defects of the surface of the film along the moving direction.

According to one embodiment of the present application, the states of the plurality of light source modules of the light source include:

the plurality of light source modules are all bright;

the light source modules are alternately lighted.

In a third aspect, the present application provides a defect detection device for a film material, the device including:

the first sending module is used for outputting a first control signal to the light source so as to control the states of a plurality of light source modules of the light source;

the second sending module is used for outputting a second control signal synchronous with the first control signal to the photographing equipment so as to control the photographing equipment to photograph the film material image;

The first receiving module is used for receiving image groups output by the photographing equipment, and a plurality of images in each image group correspond to a plurality of states of the light source one by one;

and the first processing module is used for carrying out defect detection based on the image group to obtain a defect detection result.

According to the defect detection device for the film material, through the arrangement of the first sending module, the second sending module, the first receiving module and the first processing module, the defect detection system for the film material and the defect detection method for the film material are matched, a plurality of images are shot at the same position of the film material in the advancing process of the film material, and the size, the shape, the gray scale and other information of defects in the state that a plurality of light source modules are fully bright and a plurality of light source modules are partially bright are combined, so that the detection capability of fine scratches along the moving direction is improved, and the quality control of the film material with high precision is realized.

According to an embodiment of the present application, the first processing module may be configured to stitch the images corresponding to the same state of the light source in the plurality of image groups to obtain a plurality of images to be identified corresponding to the plurality of states of the light source one to one; and carrying out defect identification on the image to be identified to obtain a defect detection result.

According to one embodiment of the application, the image to be identified corresponding to the full brightness of the plurality of light source modules is used for identifying concave-convex point defects, impurity defects, scratch defects and passivation solution coating defects on the surface of the film material;

the images to be identified, which are partially bright and correspond to the light source modules, are used for identifying scratch defects of the surface of the film along the moving direction.

According to one embodiment of the present application, the states of the plurality of light source modules of the light source include:

the plurality of light source modules are all bright;

the light source modules are alternately lighted.

In a fourth aspect, the present application provides an electronic device, including a memory, a processor, and a computer program stored in the memory and capable of running on the processor, where the processor implements the method for detecting a defect of a film material according to the first aspect when executing the computer program.

In a fifth aspect, the present application provides a non-transitory computer readable storage medium having stored thereon a computer program which, when executed by a processor, implements a method for defect detection of a film material according to the first aspect described above.

In a sixth aspect, the present application provides a chip, where the chip includes a processor and a communication interface, where the communication interface is coupled to the processor, and the processor is configured to execute a program or instructions to implement the method for detecting a defect of a film material according to the first aspect.

In a seventh aspect, the present application provides a computer program product comprising a computer program which, when executed by a processor, implements a method for defect detection of a film material according to the first aspect.

Additional aspects and advantages of the application will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the application.

Drawings

The foregoing and/or additional aspects and advantages of the present application will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings, wherein:

FIG. 1 is a schematic diagram of a defect detection system for a film according to an embodiment of the present disclosure;

FIG. 2 is a schematic diagram of a defect detection system for a film according to an embodiment of the present disclosure;

FIG. 3 is a second schematic diagram of a defect detection system for a film according to an embodiment of the present disclosure;

FIG. 4 is a schematic image of a full brightness light source of a defect detection system for a film according to an embodiment of the present disclosure;

FIG. 5 is one of the imaging diagrams of the brightness of a portion of the light source module of the defect detection system for a film material according to the embodiment of the present application;

FIG. 6 is a second image of a portion of the light source module of the defect detection system for a film according to the embodiment of the present disclosure;

FIG. 7 is a schematic view of a light source of a defect detection system for a film according to an embodiment of the present disclosure;

FIG. 8 is a film image obtained when the light source module is fully on in the film defect detection system provided in the embodiment of the present application;

FIG. 9 is a film image obtained when the light source modules are alternately on in the film defect detection system provided in the embodiment of the present application;

FIG. 10 is a schematic flow chart of a method for detecting defects of a film according to an embodiment of the present disclosure;

FIG. 11 is a schematic structural diagram of a defect detecting device for a film material according to an embodiment of the present disclosure;

fig. 12 is a hardware schematic of an electronic device according to an embodiment of the present application.

Reference numerals:

the defect detection system 100, the light source 110, the light source module one 111, the light source module two 112, the light source module three 113, the light source module four 114, the photographing equipment 120, the controller 130, the encoder 131, the image acquisition card 132, the image processor 133, the alarm module 140 and the storage module 160 of the film material;

and a membrane 400.

Detailed Description

Technical solutions in the embodiments of the present application will be clearly described below with reference to the drawings in the embodiments of the present application, and it is apparent that the described embodiments are some embodiments of the present application, but not all embodiments. All other embodiments obtained by a person of ordinary skill in the art based on the embodiments in the present application are within the scope of the protection of the present application.

The terms first, second and the like in the description and in the claims, are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used may be interchanged, as appropriate, such that embodiments of the present application may be implemented in sequences other than those illustrated or described herein, and that the objects identified by "first," "second," etc. are generally of a type and not limited to the number of objects, e.g., the first object may be one or more. Furthermore, in the description and claims, "and/or" means at least one of the connected objects, and the character "/", generally means that the associated object is an "or" relationship.

The application discloses a defect detection system 100 for a film material.

A defect detection system 100 for a film material according to an embodiment of the present application is described below with reference to fig. 1-9.

In some embodiments, as shown in fig. 1, a defect detection system 100 for a film includes: a light source 110, a photographing apparatus 120, and a controller 130.

The light source 110 is configured to face the film 400 to be detected, and the light source 110 includes a plurality of light source modules distributed along a width direction of the film 400.

The light source 110 may be used to illuminate the film 400 to be detected, the light source 110 may be a strip light source 110, or the light source 110 may be a line light source, such as, in some embodiments, the light source 110 employs a strip light source, and the type of light source 110 may include, but is not limited to, a strobe light source, a cross-line light source, or other light source, or the like, such as, in some embodiments, the type of light source 110 is a strobe light source.

One light source 110 may include a plurality of light source modules, where a plurality represents 2 or more, such as, in some embodiments, as shown in fig. 7, one light source 110 includes 4 light source modules.

As shown in fig. 7, the 4 light source modules may be a first light source module 111, a second light source module 112, a third light source module 113 and a fourth light source module 114, and the first light source module 111, the second light source module 112, the third light source module 113 and the fourth light source module 114 are sequentially connected to form a complete light source 110.

One light source module may include a plurality of light beads, where a plurality represents 2 or more, such as, in some embodiments, one light source module includes 12 LED light beads, as shown in fig. 7.

In practical implementation, the film 400 is wound around a guide roller, the light source 110 may be disposed on one side of the film 400, the first light source module 111, the second light source module 112, the third light source module 113 and the fourth light source module 114 are disposed along the width direction of the film 400, and the guide roller slowly unwinds, so that the first light source module 111, the second light source module 112, the third light source module 113 and the fourth light source module 114 may illuminate the unwound film 400.

Through the arrangement of the light source 110, firstly, the target film 400 is illuminated, the brightness is improved, the imaging effect beneficial to image processing is formed, and the complexity of the film defect detection system 100 and the difficulty of an image processing algorithm are reduced; and secondly, the interference of ambient light is overcome, and the stability of the image is ensured.

The photographing device 120 and the light source 110 are installed on the same side of the film 400, and the photographing device 120 is used for collecting reflected light.

The photographing device 120 may be used to image the surface of the film 400, the film 400 may include an aluminum plastic film, a copper foil, an aluminum foil, or the like, the photographing device 120 may be a black-and-white 8K line camera, and the photographing device 120 may be disposed in a plurality, where the plurality represents 2 or more than 2, for example, in some embodiments, the photographing device 120 is disposed with 2.

As shown in fig. 3, the photographing apparatus 120 and the light source 110 may be disposed on the same side of the film 400, and the lens of the photographing apparatus 120 may face the surface of the film 400 to be detected.

In practical implementation, the positions of the photographing device 120 and the light source 110 are fixed in advance, the light source 110 emits a plurality of light rays to irradiate the film 400 to be detected, the light rays reflect on the surface of the film 400, the photographing device 120 is located on the reflection paths of the light rays, the reflected light rays are collected by the lens of the photographing device 120, and finally, an image of a part of the film 400 is formed.

By the arrangement of the photographing equipment 120, reflection imaging of the film 400 to be detected is realized, and the development degree of the defects of the film 400 to be detected is ensured, so that the identification rate of the defects of the film 400 is improved.

The controller 130 is electrically connected to the light source 110 and the photographing device 120, and is configured to synchronously control states of the light source modules and photographing of the photographing device 120, and the controller 130 is configured to process the received image set to obtain a defect detection result.

The controller 130 may be configured to regulate the start and stop of the photographing apparatus 120 and the state transition of the light source 110, where the light source 110 may have multiple states, and the multiple states may be implemented by the on-off states of the multiple light source modules.

The state of the light source 110 may include that the plurality of light source modules are fully lit and the plurality of light source modules are partially lit.

In an actual implementation, after receiving an external trigger signal, the controller 130 gives a plurality of photographing commands to the photographing device 120 and gives a plurality of status commands to the light source 110, the light source 110 completes the conversion of a plurality of statuses through stroboscopic effect, and at the same time, the photographing device 120 obtains a plurality of groups of images with all light source modules and part light source modules, and software in the controller 130 splices the plurality of groups of images.

In the related art, an automatic optical defect detection device is used for detecting defects of a film material, and the traditional film material detection mode is a reflection detection station and a backlight detection station. The camera adopts a black-and-white line scanning camera, the light source adopts a strip light source or a line light source, the reflection station is used for detecting surface defects, namely defects such as concave-convex points, impurities, scratches, leakage coating of passivation solution, scratches and the like, and the transmission station is used for detecting defects such as pinholes, breakage and the like.

However, the inventors have found that the reflection station of the existing automatic optical detection device only forms a slight image at a resolution of 0.015mm/pixel for a slight scratch in the moving direction, and for a width of 1000mm, 8 black-and-white line cameras are required, resulting in an excessively high cost of the detection device.

The defect detection system 100 of the film material can detect fine scratches along the moving direction by using only 2 black-and-white 8K line cameras under the resolution of 0.065mm/pixel, and saves about 6 8K black-and-white cameras.

According to the defect detection system 100 for the film material, provided by the embodiment of the application, through the arrangement of the light source 110, the photographing device 120 and the controller 130, when the surface defect of the film material 400 is detected, the film material 400 can be detected to be finely scratched along the moving direction in the transportation process, and the requirement on the quantity and the precision of cameras is low, so that the detection cost is greatly saved.

In some embodiments, as shown in fig. 2-3, the controller 130 may include: an encoder 131, an image capture card 132, and an image processor 133.

The encoder 131 may be used for measuring the displacement of the film 400, and the encoder 131 may be electrically connected with the image acquisition card 132.

In actual implementation, as shown in fig. 2, after the film 400 moves to a pre-designed displacement value, the encoder 131 converts the mechanical geometric displacement into a pulse signal, and then the encoder 131 outputs the pulse signal to the image acquisition card 132.

The image acquisition card 132 may be electrically connected to the encoder 131, the light source 110 and the photographing device 120, the image acquisition card 132 may be used for synchronously controlling the light source 110 to adjust the states of the light source modules and controlling the photographing device 120 to photograph according to the control signal output by the encoder 131, and the image acquisition card 132 may also be used for receiving the image set output by the photographing device 120.

In actual implementation, as shown in fig. 2, after receiving a control signal from the encoder 131, the image capturing card 132 controls the on/off states of a plurality of light source modules of the light source 110, so that the light source 110 completes rapid conversion of a plurality of states in a short time in a strobe form, and simultaneously, sends a plurality of photographing instructions to the photographing device 120, so as to complete image capturing of a line of film 400, and the photographing device 120 outputs the obtained image group to the image capturing card 132.

The image processor 133 may be electrically connected to the image acquisition card 132, and the image processor 133 may be configured to process the image group to obtain a defect detection result.

In actual implementation, as shown in fig. 2, after receiving an image group from the photographing device 120, the image acquisition card 132 transmits the image group to the image processor 133, the image processor 133 splices the image group to obtain a plurality of images of a line of film 400 in a state that the plurality of light source 110 modules are fully bright and the plurality of light source modules are partially bright, and processes the plurality of spliced images to obtain a defect detection result.

According to the defect detection system 100 for the film material, through the arrangement of the encoder 131, the image acquisition card 132 and the image processor 133, the controller 130 is used for controlling the light source 110 and the photographing equipment 120, meanwhile, the splicing and defect detection of the image group are realized, on one hand, one controller 130 is used for controlling a plurality of components, the light weight of the defect detection system 100 for the film material is realized, and unnecessary space waste is reduced; on the other hand, one controller 130 controls the transition of the states of the light source 110, which reduces the complexity of the detection system and improves the detection efficiency of the film 400.

In some embodiments, the defect detection system 100 of the film material may further include: film conveying mechanism.

The encoder 131 is mounted on the film material conveying mechanism, and the encoder 131 can be used for outputting a pulse signal based on the motion state of the film material conveying mechanism.

The film material conveying mechanism can be used for conveying the film material 400 towards a specific direction, the film material conveying mechanism can be a transmission shaft, the film material 400 can be wound on a guide roller, and the film material conveying mechanism can convey the film material 400 after unwinding.

In actual implementation, the film 400 is unwound, the unwound film 400 may move toward a specific direction through the film conveying mechanism, at this time, the encoder 131 may be coupled to a spindle of the film conveying mechanism, after the film conveying mechanism conveys the film 400 for a predetermined length of linear displacement, the encoder 131 converts the linear displacement into a pulse signal, and the encoder 131 measures the linear displacement of the film 400 by outputting the number of pulses, and then the encoder 131 transmits the pulse signal to the image capture card 132.

Through the arrangement of the film conveying mechanism, the linear displacement of the film 400 is metered by the encoder 131, the linear displacement is converted into a pulse signal which can be used for transmission and storage by matching with the function of the encoder 131 while the linear motion of the film 400 is assisted, and therefore the detection precision of the film 400 is improved.

In some embodiments, as shown in fig. 2, the defect detection system 100 for a film material may further include: an alarm module 140 and a storage module 160.

The alarm module 140 may be electrically connected to the controller 130, and the alarm module 140 may be used to output alarm information when an alarm signal is received.

In actual implementation, the image processor 133 in the controller 130 processes the image group of the film 400 to obtain a detection result of the section of the film 400, when the section of the film 400 has an oversized defect, the image processor 133 may generate an alarm signal corresponding to a seriously damaged state of the film 400, the image processor 133 may transmit the alarm signal to the alarm module 140, and the alarm module 140 may then output the alarm signal to other components, so that the section of the film 400 having the oversized defect is eliminated.

Through the arrangement of the alarm module 140, the alarm processing of the film 400 with oversized defects is realized, and the yield of the produced film 400 is ensured.

The memory module 160 may be electrically connected to the controller 130, and the memory module 160 may be used to store a detection log.

In actual implementation, the image processor 133 in the controller 130 processes the image group of the film 400 to obtain a detection result of the section of the film 400, the image processor 133 may convert the detection result into a signal form that can be used for storage, and the image processor 133 transmits the signal to the storage module 160, and after the storage module 160 receives the signal, the storage module performs a storage operation on the signal.

Through the arrangement of the storage module 160, the detection log of the membrane material 400 is stored, so that the detection process of the membrane material 400 of the related batch can be conveniently consulted immediately after the detection log is stored.

The method for detecting a defect of a film material, the device 300 for detecting a defect of a film material, the electronic device and the readable storage medium provided in the embodiments of the present application are described in detail below with reference to the accompanying drawings.

The defect detection method of the film material can be applied to a terminal, and can be specifically executed by hardware or software in the terminal.

The implementation main body of the method for detecting the defects of the film material may be an electronic device or a functional module or a functional entity capable of implementing the method for detecting the defects of the film material in the electronic device, where the electronic device includes, but is not limited to, a mobile phone, a tablet computer, a camera, a wearable device, and the like.

As shown in fig. 10, the defect detection method of the film material includes: step 210, step 220, step 230 and step 240.

Step 210, outputting a first control signal to the light source 110 to control states of a plurality of light source modules of the light source 110.

The first control signal is used for indicating states of the plurality of light source modules of the light source 110, the states of the plurality of light source modules of the light source 110 can include full lighting of the plurality of light source modules and partial lighting of the plurality of light source modules, and the state conversion of the plurality of light source modules can be realized by lighting of the plurality of light source modules or not.

In practical implementation, the image capture card 132 may output the first control signal to the light source 110, after the light source 110 receives the first control signal, the states of the plurality of light source modules of the light source 110 may be controlled in a short time, and the light source 110 may complete the rapid conversion of the states of the plurality of light source modules of the light source 110 in a short time in a strobe form.

Step 220, outputting a second control signal synchronized with the first control signal to the photographing apparatus 120 to control the photographing apparatus 120 to photograph the film 400.

The second control signal may be used to send a plurality of photographing instructions to the photographing device 120, where the second control signal is sent at the same time as the first control signal, and the number of photographing instructions sent to the photographing device 120 is equal to the number of states of the plurality of light source modules of the light source 110.

In an actual implementation, the image capturing card 132 may output a second control signal to the photographing device 120, after the photographing device 120 receives the second control signal, may capture multiple images at the same position of the film 400 to be detected, where when the photographing device 120 captures a first image of the film 400, the first image corresponds to a first state of the light source 110, and when the photographing device 120 captures a second image of the film 400, the second image corresponds to a second state of the light source 110, and so on.

Step 230, receiving image groups output by the photographing apparatus 120, where a plurality of images in each image group corresponds to a plurality of states of the light source 110 one by one.

The image group may be a set of a plurality of images captured at the same position of the film 400 to be detected.

In practical implementations, the image processor 133 may receive image sets from the image capturing card 132, where each image in the image sets corresponds to a different state of the plurality of light source modules of the light source 110.

And 240, performing defect detection based on the image group to obtain a defect detection result.

In an actual implementation, after the image processor 133 receives the image group sent from the image acquisition card 132, a plurality of images in the image group can be subjected to related processing operation, and the image processor 133 can compare and analyze the processed plurality of images to finally obtain a defect detection result of the section of film 400.

According to the method for detecting defects of a film material provided by the embodiment of the application, through the arrangement of the steps 210, 220, 230 and 240, in cooperation with the use of the defect detection system 100 of the film material, a plurality of images are shot at the same position of the film material 400 in the advancing process of the film material 400, and the detection capability of fine scratches along the moving direction is improved by combining the information of the size, the shape, the gray level and the like of the defects in the state that the light source modules are fully-bright and the light source modules are partially-bright, so that the quality control of the film material 400 with high precision is realized.

In some embodiments, as shown in fig. 2-3, step 240, performing defect detection based on the image group to obtain a defect detection result includes:

splicing the images corresponding to the same state of the light source 110 in the plurality of image groups to obtain a plurality of images to be identified corresponding to the plurality of states of the light source 110 one by one; and carrying out defect identification on the image to be identified to obtain a defect detection result.

In actual execution, the image processor 133 splices a plurality of images corresponding to the full brightness of the plurality of light source modules to obtain an image of the section of film 400 in the state of full brightness of the plurality of light source modules; the image processor 133 splices the plurality of images corresponding to the light source module part brightness to obtain an image of the section of film 400 in the state that the light source module part brightness, and then the image processor 133 performs defect identification and analysis on the image of the film 400 in the state that the light source modules are fully brightness and the light source module part brightness to finally obtain a defect detection result of the section of film 400.

According to the defect detection method for the film material, due to the design of the image splicing mode, the splicing and the combination of a plurality of images of the film material 400 in the states that a plurality of light source modules are fully bright and a plurality of light source modules are partially bright are realized, on one hand, defects of the film material 400 are detected from a plurality of different light states, and the defect detection capability of the film material 400 is improved; on the other hand, repeated identification and analysis of a plurality of images in the same state are reduced, and defect detection efficiency is improved.

In some embodiments, step 210, the status of the plurality of light source modules of the light source 110 includes: the light source modules are all lighted and the light source modules are alternately lighted.

The following describes the implementation manner of full lighting of the light source modules and alternate lighting of the light source modules.

First, the light source 110 is in a state that the plurality of light source modules are all on.

In this embodiment, as shown in fig. 4, a white square represents a light source module in a lighting state, and all the squares are white to represent all the light source modules in the light source 110 in the lighting state.

Second, the light source 110 is in a state that a plurality of light source modules are alternately lighted.

In this embodiment, as shown in fig. 5-6, a white square represents a light source module in a light-up state, a gray square represents a light source module in a non-light-up state, and the plurality of light source modules alternately light up may include a plurality of modes, for example, mode one: the first light source module is in a lighting state, the second light source module is in a non-lighting state, and the light source modules repeat the sequence; mode two: the first light source module is in a non-lighting state, the second light source module is in a lighting state, and the light source modules after the first light source module repeat the sequence; mode three: the first light source module and the second light source module are in a non-lighting state, the third light source module is in a lighting state, and the light source modules after the third light source module repeat the sequence; mode four: the first light source module and the second light source module are in a lighting state, the third light source module is in a non-lighting state, and the light source modules after that repeat the above sequence.

The plurality of light source modules alternately illuminate more than the modes one, two, three and four listed above, and the plurality of light source modules alternately illuminate more modes, which are not described herein.

It should be noted that, the number of light source modules included in the light source 110 may be determined according to the width of the film 400, and the number of modes in which the plurality of light source modules are alternately lighted may be changed along with the change of the number of light source modules.

According to the defect detection method for the film material, provided by the embodiment of the application, through the mode arrangement that the light source modules are fully lighted and the light source modules are alternately lighted, the defect detection of the film material 400 in various different light states is realized, the development degree of various different micro defects under a camera lens is ensured, and the defect detection accuracy is improved.

In some embodiments, as shown in fig. 8 to fig. 9, the image to be identified corresponding to the full brightness of the plurality of light source modules is used to identify the concave-convex point defect, the impurity defect, the scratch defect and the passivation solution coating defect on the surface of the film 400; the image to be identified, which corresponds to the partial brightness of the plurality of light source modules, is used for identifying the scratch defect of the surface of the film 400 along the movement direction.

As shown in fig. 4 and 8, the image of the film 400 in the state that the plurality of light source modules are fully illuminated can be used to detect defects such as concave-convex points, magazines, scratches, and leakage of passivation solution on the surface of the film 400.

As shown in fig. 5 to 6 and 9, the image of the film 400 in the state that the plurality of light source modules are alternately illuminated may be used to detect fine scratches along the moving direction.

It will be appreciated that, during the production of the film 400, if there are hard micro objects on the conveying roller of the apparatus, the surface of the film 400 may form a fine scratch with a width of about 15um to 30um along the moving direction, for example, in some embodiments, the surface of the film 400 may have a scratch with a width of 25 um.

According to the defect detection method for the film material, through the design of combining imaging under the state that the light source modules are fully bright and imaging under the state that the light source modules are alternately bright, the complete imaging of different defects under the two states is realized, the effect of defect imaging is optimized, the detection omission phenomenon caused by unobvious imaging of the fine scratch of the film material 400 along the moving direction is avoided, and strict quality control of the film material 400 is ensured.

In the method for detecting a defect of a film material provided in the embodiment of the present application, the execution body may be the device 300 for detecting a defect of a film material. In this embodiment, taking the defect detection method of the film performed by the defect detection device 300 for a film as an example, the defect detection device 300 for a film provided in this embodiment of the present application is described.

The embodiment of the application also provides a defect detection device 300 for the film material.

As shown in fig. 11, the defect detecting device 300 for a film material includes: a first transmitting module 310, a second transmitting module 320, a first receiving module 330 and a first processing module 340.

A first transmitting module 310, configured to output a first control signal to the light source 110 to control states of a plurality of light source modules of the light source 110;

A second sending module 320, configured to output a second control signal synchronized with the first control signal to the photographing apparatus 120, so as to control the photographing apparatus 120 to photograph an image of the film 400;

a first receiving module 330, configured to receive image groups output by the photographing apparatus 120, where a plurality of images in each image group corresponds to a plurality of states of the light source 110 one by one;

the first processing module 340 is configured to perform defect detection based on the image set, and obtain a defect detection result.

According to the film defect detection device 300 provided in the embodiment of the present application, through the arrangement of the first sending module 310, the second sending module 320, the first receiving module 330 and the first processing module 340, in cooperation with the use of the film defect detection system 100 and the film defect detection method, multiple images are shot at the same position of the film 400 in the advancing process of the film 400, and the size, the shape, the gray level and other information of defects in the state of combining the full brightness of the multiple light source modules and the partial brightness of the multiple light source modules are improved, so that the detection capability of fine scratches along the moving direction is improved, thereby realizing the quality control of the film 400 with high precision.

In some embodiments, the first processing module 340 is further configured to splice images corresponding to the same state of the light source 110 in the plurality of image groups, so as to obtain a plurality of images to be identified corresponding to the plurality of states of the light source 110 one to one; and carrying out defect identification on the image to be identified to obtain a defect detection result.

According to the defect detection device 300 for the film material provided by the embodiment of the application, through the design of the image stitching mode, the stitching and the combination of a plurality of images of the film material 400 in the states that a plurality of light source modules are fully bright and a plurality of light source modules are partially bright are realized, on one hand, the defect of the film material 400 is detected from a plurality of different light states, and the defect detection capability of the film material 400 is improved; on the other hand, repeated identification and analysis of a plurality of images in the same state are reduced, and defect detection efficiency is improved.

In some embodiments, the states of the plurality of light source modules of the light source 110 include:

the plurality of light source modules are all bright;

the light source modules are alternately lighted.

According to the defect detection device 300 for the film material, provided by the embodiment of the application, through the arrangement of the mode that the light source modules are fully lighted and the light source modules are alternately lighted, the defect detection of the film material 400 in various different light states is realized, the development degree of various different micro defects under a camera lens is ensured, and the accuracy of defect detection is improved.

In some embodiments, the image to be identified corresponding to the full brightness of the plurality of light source modules is used to identify the concave-convex point defect, the impurity defect, the scratch defect and the passivation solution coating defect on the surface of the film 400;

The image to be identified, which corresponds to the partial brightness of the plurality of light source modules, is used for identifying the scratch defect of the surface of the film 400 along the movement direction.

According to the defect detection device 300 for the film material, provided by the embodiment of the application, through the design of combining imaging under the state that the plurality of light source modules are fully bright and imaging under the state that the plurality of light source modules are alternately bright, the complete imaging of different defects under the two states is realized, the effect of defect imaging is optimized, the omission phenomenon caused by unobvious imaging of the film material 400 along the fine scratch of the moving direction is avoided, and the strict quality control of the film material 400 is ensured.

The defect detection device 300 for a film material in the embodiment of the present application may be an electronic device, or may be a component in an electronic device, such as an integrated circuit or a chip. The electronic device may be a terminal, or may be other devices than a terminal. By way of example, the electronic device may be a mobile phone, tablet computer, notebook computer, palm computer, vehicle-mounted electronic device, mobile internet appliance (Mobile Internet Device, MID), augmented reality (augmented reality, AR)/Virtual Reality (VR) device, robot, wearable device, ultra-mobile personal computer, UMPC, netbook or personal digital assistant (personal digital assistant, PDA), etc., but may also be a server, network attached storage (Network Attached Storage, NAS), personal computer (personal computer, PC), television (TV), teller machine or self-service machine, etc., and the embodiments of the present application are not limited in particular.

The defect detection device 300 for a film material in the embodiment of the present application may be a device with an operating system. The operating system may be a microsoft (Windows) operating system, an Android operating system, an IOS operating system, or other possible operating systems, which are not specifically limited in the embodiments of the present application.

The defect detection device 300 for a film material provided in this embodiment of the present application can implement each process implemented by the method embodiment of fig. 10, and in order to avoid repetition, a description is omitted here.

In some embodiments, as shown in fig. 12, the embodiment of the present application further provides an electronic device 500, including a processor 501, a memory 502, and a computer program stored in the memory 502 and capable of running on the processor 501, where the program, when executed by the processor 501, implements the processes of the foregoing film defect detection method embodiment, and the same technical effects can be achieved, and for avoiding repetition, a detailed description is omitted herein.

The electronic device in the embodiment of the application includes the mobile electronic device and the non-mobile electronic device described above.

The embodiment of the present application further provides a non-transitory computer readable storage medium, on which a computer program is stored, where the computer program when executed by a processor implements each process of the foregoing film defect detection method embodiment, and the same technical effects can be achieved, so that repetition is avoided, and details are not repeated here.

Wherein the processor is a processor in the electronic device described in the above embodiment. The readable storage medium includes computer readable storage medium such as computer readable memory ROM, random access memory RAM, magnetic or optical disk, etc.

The embodiment of the application also provides a computer program product, which comprises a computer program, and the computer program realizes the defect detection method of the film material when being executed by a processor.

Wherein the processor is a processor in the electronic device described in the above embodiment. The readable storage medium includes computer readable storage medium such as computer readable memory ROM, random access memory RAM, magnetic or optical disk, etc.

The embodiment of the application further provides a chip, the chip includes a processor and a communication interface, the communication interface is coupled with the processor, the processor is used for running a program or an instruction, implementing each process of the defect detection method embodiment of the film material, and achieving the same technical effect, so as to avoid repetition, and no further description is provided here.

It should be understood that the chips referred to in the embodiments of the present application may also be referred to as system-on-chip chips, chip systems, or system-on-chip chips, etc.

It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element. Furthermore, it should be noted that the scope of the methods and apparatus in the embodiments of the present application is not limited to performing the functions in the order shown or discussed, but may also include performing the functions in a substantially simultaneous manner or in an opposite order depending on the functions involved, e.g., the described methods may be performed in an order different from that described, and various steps may also be added, omitted, or combined. Additionally, features described with reference to certain examples may be combined in other examples.

From the above description of the embodiments, it will be clear to those skilled in the art that the above-described embodiment method may be implemented by means of software plus a necessary general hardware platform, but of course may also be implemented by means of hardware, but in many cases the former is a preferred embodiment. Based on such understanding, the technical solutions of the present application may be embodied essentially or in a part contributing to the prior art in the form of a computer software product stored in a storage medium (such as ROM/RAM, magnetic disk, optical disk), comprising several instructions for causing a terminal (which may be a mobile phone, a computer, a server, or a network device, etc.) to perform the methods described in the embodiments of the present application.

The embodiments of the present application have been described above with reference to the accompanying drawings, but the present application is not limited to the above-described embodiments, which are merely illustrative and not restrictive, and many forms may be made by those of ordinary skill in the art without departing from the spirit of the present application and the scope of the claims, which are also within the protection of the present application.

In the description of the present specification, reference to the terms "one embodiment," "some embodiments," "illustrative embodiments," "examples," "specific examples," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present application. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiments or examples. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.

While embodiments of the present application have been shown and described, it will be understood by those of ordinary skill in the art that: many changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the application, the scope of which is defined by the claims and their equivalents.

Claims (10)

1. A defect detection system for a film, comprising:

the light source is used for facing the film material to be detected and comprises a plurality of light source modules distributed along the width direction of the film material;

the photographing device and the light source are arranged on the same side of the film material and used for collecting reflected light;

and the controller is electrically connected with the light sources and the photographing equipment, and is used for synchronously controlling the states of the light source modules and photographing the photographing equipment, and processing the received image group to obtain a defect detection result.

2. The defect detection system of film material of claim 1, wherein the controller comprises:

an encoder;

the image acquisition card is electrically connected with the encoder, the light source and the photographing equipment, and is used for synchronously controlling the light source to adjust the states of the light source modules and controlling the photographing equipment to photograph according to control signals output by the encoder, and the image acquisition card is also used for receiving an image group output by the photographing equipment;

and the image processor is electrically connected with the image acquisition card and is used for processing the image group to obtain a defect detection result.

3. The defect detection system of film material of claim 2, further comprising:

and the encoder is arranged on the film conveying mechanism and is used for outputting pulse signals based on the motion state of the film conveying mechanism.

4. A defect detection system for films according to any of claims 1-3, further comprising:

the alarm module is electrically connected with the controller and is used for outputting alarm information when receiving an alarm signal;

and the storage module is electrically connected with the controller and used for storing the detection log.

5. The defect detection method of the film material is characterized by comprising the following steps of:

outputting a first control signal to a light source to control states of a plurality of light source modules of the light source;

outputting a second control signal synchronous with the first control signal to the photographing equipment so as to control the photographing equipment to photograph the film material image;

receiving image groups output by the photographing equipment, wherein a plurality of images in each image group correspond to a plurality of states of the light source one by one;

and performing defect detection based on the image group to obtain a defect detection result.

6. The method for detecting a defect of a film according to claim 5, wherein the performing defect detection based on the image group to obtain a defect detection result comprises:

splicing the images corresponding to the same state of the light source in the plurality of image groups to obtain a plurality of images to be identified, wherein the images correspond to the plurality of states of the light source one by one;

and carrying out defect identification on the image to be identified to obtain a defect detection result.

7. The method for detecting defects of a film material according to claim 6, wherein the image to be identified corresponding to the full brightness of the plurality of light source modules is used for identifying the defects of the concave-convex points, the defects of impurities, the defects of scratches and the defects of the leakage coating of the passivation solution on the surface of the film material;

the images to be identified, which are partially bright and correspond to the light source modules, are used for identifying scratch defects of the surface of the film along the moving direction.

8. The method for detecting defects of a film according to any one of claims 5 to 7, wherein the states of the plurality of light source modules of the light source include:

the plurality of light source modules are all bright;

the light source modules are alternately lighted.

9. A defect detection device for a film material, comprising:

the first sending module is used for outputting a first control signal to the light source so as to control the states of a plurality of light source modules of the light source;

The second sending module is used for outputting a second control signal synchronous with the first control signal to the photographing equipment so as to control the photographing equipment to photograph the film material image;

the first receiving module is used for receiving image groups output by the photographing equipment, and a plurality of images in each image group correspond to a plurality of states of the light source one by one;

and the first processing module is used for carrying out defect detection based on the image group to obtain a defect detection result.

10. A non-transitory computer readable storage medium having stored thereon a computer program, which when executed by a processor, implements a method of defect detection of a film material according to any of claims 5-8.

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