CN116148578A - Probe contact device with carrier plate buffer - Google Patents
Probe contact device with carrier plate buffer Download PDFInfo
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- CN116148578A CN116148578A CN202310171492.XA CN202310171492A CN116148578A CN 116148578 A CN116148578 A CN 116148578A CN 202310171492 A CN202310171492 A CN 202310171492A CN 116148578 A CN116148578 A CN 116148578A
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- fixedly connected
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- bottom plate
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06722—Spring-loaded
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention relates to a probe contact device with a carrier plate for buffering, which comprises an air cylinder, wherein the upper end of the air cylinder is provided with a telescopic rod, the rear side surface of the air cylinder is provided with a slideway, the slideway is connected with a sliding block in a sliding way, the upper end of the sliding block is fixedly connected with an extrusion block, the lower side of the front end of the extrusion block is fixedly connected with an elastic buffer block, the lower end of the elastic buffer block is fixedly connected with a left-right translation structure, the lower end of the left-right translation structure is fixedly connected with a front-back movement structure, the lower end of the front-back movement structure is fixedly connected with a supporting bottom plate, the front end of the supporting bottom plate is provided with a carrier plate device, the carrier plate device is provided with a middle control plate, the upper end of the middle control plate is fixedly connected with the supporting bottom plate, the upper side of the center position of the front end of the middle control plate is provided with a chip plate, the chip plate is provided with a probe contact hole, the whole device has a dustproof effect when not working, and has a buffering effect when working, so that the whole probe detection is more accurate.
Description
Technical Field
The invention relates to the technical field of probe contact testing, in particular to a probe contact device with a carrier plate for buffering.
Background
The probe contact mode is simple and efficient, is a detection means widely applied in the field of electronic components at present, influences the stability, the miniaturization, the accuracy of signal transmission and the like of the probe due to the contact mode of the test probe, is worth more research force investment, the spring probe is adopted in most of the current markets, the probe is easy to generate non-vertical offset force in the contact process, the force can cause the problems of incomplete probe contact, inaccurate test, reduced service life of the probe and the like, and in the process of testing the nitrogen-oxygen sensor probe, the general probe testing device cannot realize integral control due to the fact that the rear end of the probe is provided with a connecting wire.
The authorization bulletin number CN202210090253.7 discloses a rotary probe contact module, through setting up the guiding axle one, be equipped with the push rod on the contact fixing plate, the guiding axle one with push rod sliding fit, the contact fixing plate and the location slider spare sliding connection of this rotary probe contact module, the guiding axle one with sliding fit of guiding hole one and contact fixing plate and location slider spare sliding connection can be adjusted and the probe that is located on the probe board with be located between the contact on the contact fixing plate, improve the grafting accuracy that realizes between probe and the probe contact, avoided simultaneously the probe with product damage phenomenon that insert two appeared by force between the probe contact has, but this invention has following problem: firstly, the process of searching the accurate position of the probe contact at the machine is overlong, the damage of the probe is easy to fall due to the error, the efficiency is low, secondly, the flexibility of the whole device is poor, the device has single function, the problems of dust removal and the like cannot be solved by utilizing the accurate probe contact structure, and the practicability is poor.
Disclosure of Invention
The invention aims at overcoming the defects of the prior art, and the sensor probe is manually inserted into the probe groove by a worker through the buffer plate, so that the aim of testing is fulfilled, and because the telescopic support columns are arranged at the four vertex positions, the probe can be quickly and accurately inserted into the probe groove, and the dustproof function of the whole carrier plate device and the fixing function of a tested product can be realized by a front-back left-right translation structure, so that the technical problem of single function of the device is solved.
In order to achieve the above purpose, the present invention provides the following technical solutions:
the probe contact device with the carrier plate for buffering comprises a cylinder, wherein a telescopic rod is arranged at the upper end of the cylinder, a slide way is arranged on the surface of the rear side of the cylinder, a sliding block is connected onto the slide way in a sliding manner, the upper end of the sliding block is fixedly connected with an extrusion block, and the lower side of the front end of the extrusion block is fixedly connected with an elastic buffer block;
the lower end of the elastic buffer block is fixedly connected with a left translation structure and a right translation structure, the lower end of the left translation structure and the right translation structure is fixedly connected with a front-back movement structure, the lower end of the front-back movement structure is fixedly connected with a support bottom plate, and the front end of the support bottom plate is provided with a carrier plate device;
the support plate device is provided with a central control plate, the upper end of the central control plate is fixedly connected with a supporting bottom plate, the upper side of the central position of the front end of the central control plate is provided with a chip plate, and the chip plate is provided with a probe contact hole.
As one preference, the horizontal moving structure comprises a main sliding support plate, protruding round hole blocks are arranged on the front side and the rear side of the main sliding support plate, the protruding round hole blocks are connected with a sliding rod in a sliding mode, limiting blocks are fixedly connected on the left side and the right side of the sliding rod, the lower ends of the limiting blocks are fixedly connected with a first bottom plate, a pneumatic plate is fixedly connected to the center of the first bottom plate, and the pneumatic plate is connected with the main sliding support plate in a sliding mode.
Preferably, the back-and-forth moving structure comprises a second pneumatic plate, wherein the upper end of the second pneumatic plate is connected with the first bottom plate in a sliding manner, and the lower end of the second pneumatic plate is fixedly connected with the supporting bottom plate.
Preferably, the main sliding support plate comprises a sliding cylinder, the upper end of the sliding cylinder is fixedly connected with the central position of the lower side of the main sliding support plate, the sliding cylinder is of a C-shaped structure, the lower end of the sliding cylinder is in sliding connection with the pneumatic plate, the central position of the lower end of the first bottom plate is provided with a second sliding cylinder, the upper end of the second sliding cylinder is fixedly connected with the first bottom plate, and the lower end of the second sliding cylinder is in sliding connection with the second pneumatic plate.
As one preference, the left side and the right side of the lower end of the first bottom plate are fixedly connected with second protruding round hole blocks, the second protruding round hole blocks are connected with a second sliding rod in a sliding mode, the front end and the rear end of the second sliding rod are fixedly connected with second limiting blocks, and the lower ends of the second limiting blocks are fixedly connected with a supporting bottom plate.
As one preference, the carrier plate device comprises a protection block, a probe groove is formed in the center of the protection block, telescopic support columns are arranged at the four top positions of the lower end of the protection block, the telescopic support columns penetrate through the buffer plate fixedly connected with the lower end of the buffer plate, four round holes are formed in the buffer plate, springs are arranged in the round holes, and the upper ends of the springs are fixedly connected with the buffer plate.
As a preference, the left side and the right side of the lower end of the central control board are fixedly connected with an anti-collision block, and a layer of silica gel layer is laid on the lower side surface of the anti-collision block.
As one preferable mode, the elastic buffer block is formed by splicing two C-shaped rubber blocks into a rectangular structure, the rubber blocks arranged up and down are fixedly connected together, the upper end of the elastic buffer block is fixedly connected with the extrusion block, a fixed hook is arranged at the position, below the front end of the elastic buffer block, and serrated rubber is arranged in the fixed hook.
Preferably, the chip board is connected with a charging module, the charging module is externally connected with a charging wire, the charging wire passes through the extrusion block, a through hole is formed in the position where the charging wire passes through the extrusion block, the diameter of the through hole is larger than that of the charging wire, and the uppermost side of the charging wire is connected with a USB interface.
As still another preferable mode, the protection block upper end is fixedly connected with a C-shaped damage-preventing block, the C-shaped damage-preventing block protrudes from the protection block upper end, the length and the width of the protection block are the same as those of the first bottom plate front end protruding from the second sliding cylinder, and an anti-slip rubber layer is arranged on the lower side of the protruding position.
The invention has the beneficial effects that:
(1) According to the invention, the left-right translation structure and the front-back movement structure are arranged, so that the fixed hook can be driven to adjust the position, and therefore, a test product (a nitrogen-oxygen sensor) inserted in the probe groove cannot fall off due to no manual intervention, and the contact accuracy of the whole probe of the test product and the good fixing effect of the test product are ensured.
(2) According to the invention, the cylinder and the extrusion block are arranged, the extrusion block acts on the elastic buffer block by utilizing the up-down expansion of the telescopic rod, so that the structure at the lower end of the elastic buffer block is pressed down, the front-back left-right translation structure moves to the position of the first bottom plate protruding upwards and downwards corresponding to the anti-collision block in advance, when the device is not used, the contact between the first bottom plate and the anti-collision block is realized by utilizing the cylinder, thereby the dustproof effect is achieved, the self protection effect can be realized in the non-working process, and the service life is prolonged.
(3) According to the invention, the carrier plate device is arranged, the central control plate is arranged in the carrier plate device, the insertion position of a test product is ensured, then the telescopic support column is arranged, the stability of the vertical stable movement of the central control plate is ensured, and the springs are arranged, so that the contact perpendicularity and the probe pressing depth of the probe are ensured, and the poor contact and the service life loss of the probe caused by the non-perpendicularity or excessive pressing direction are reduced.
In conclusion, the device has the advantages of simple principle, good dustproof effect and stable probe insertion, and is particularly suitable for the technical field of probe contact test.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for the description of the embodiments will be briefly described below, it being obvious that the drawings described below are only some embodiments of the present invention, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of the overall structure of the present invention.
FIG. 2 is a schematic view of the position structure of the cylinder and the slideway in the invention.
Fig. 3 is a schematic structural diagram of a horizontal translation structure in the present invention.
Fig. 4 is a schematic structural view of the air plate and the sliding cylinder in the present invention.
Fig. 5 is a schematic structural view of a back and forth moving structure in the present invention.
Fig. 6 is a schematic structural diagram of a carrier device in the present invention.
Fig. 7 is a schematic view of the structure of the telescopic support column and the spring according to the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention are clearly and completely described below with reference to the accompanying drawings.
Example 1
As shown in fig. 1 to 7, the invention provides a probe contact device with carrier plate buffering, which comprises a cylinder 1, wherein a telescopic rod 11 is arranged at the upper end of the cylinder 1, a slide way 12 is arranged on the surface of the rear side of the cylinder 1, a sliding block 13 is connected on the slide way 12 in a sliding manner, the upper end of the sliding block 13 is fixedly connected with a squeezing block 14, and the lower side of the front end of the squeezing block 14 is fixedly connected with an elastic buffer block 2;
the elastic buffer block 2, the lower end of the elastic buffer block 2 is provided with a left-right translation structure 3, the lower end of the left-right translation structure 3 is fixedly connected with a front-back movement structure 4, the lower end of the front-back movement structure 4 is fixedly connected with a support bottom plate 5, and the front end of the support bottom plate 5 is provided with a carrier plate device 6;
the carrier plate device 6, be equipped with well accuse board 61 in the carrier plate device 6, well accuse board 61 upper end fixed connection supporting baseplate 5, and well accuse board 61 front end central point puts the upside and is equipped with chip board 62, be equipped with probe contact hole 63 on the chip board 62.
Further, as shown in fig. 3, the left-right translation structure 3 includes a main sliding support plate 31, protruding round hole blocks 32 are respectively disposed on front and rear sides of the main sliding support plate 31, the protruding round hole blocks 32 are slidably connected with a sliding rod 33, both left and right sides of the sliding rod 33 are fixedly connected with a limiting block 34, a lower end of the limiting block 34 is fixedly connected with a first bottom plate 35, a pneumatic plate 36 is fixedly connected with a center position of the first bottom plate 35, the pneumatic plate 36 is slidably connected with the main sliding support plate 31, the pneumatic plate 36 is matched with a sliding cylinder 311, so that the main sliding support plate 31 can be adjusted in left and right directions, and the position of the elastic buffer block 2 can be adjusted by adjusting the main sliding support plate 31 because the upper end of the main sliding support plate 31 is fixedly connected with an elastic buffer block 2, so that the position of the fixed hook 21 can be adjusted, and the sliding rod 33 disposed at the front and rear ends can be more stable when the main sliding support plate 31 is adjusted in left and right directions.
Further, as shown in fig. 3, the back-and-forth moving structure 4 includes a second air plate 41, the upper end of the second air plate 41 is slidably connected with the first bottom plate 35, and the lower end of the second air plate is fixedly connected with the supporting bottom plate 5, and the back-and-forth moving structure 4 is used for adjusting the position of the first bottom plate 35, so as to cooperate with the carrier plate device 6 to perform dust protection of the central control plate 61 and detection of the press-fit probe.
Further, as shown in fig. 4, the main sliding support plate 31 includes a sliding cylinder 311, the upper end of the sliding cylinder 311 is fixedly connected to the center position of the lower side of the main sliding support plate 31, and the sliding cylinder 311 is in a C-shaped structure, the lower end of the sliding cylinder 311 is slidably connected to the pneumatic plate 36, the center position of the lower end of the first bottom plate 35 is provided with a second sliding cylinder 351, the upper end of the second sliding cylinder 351 is fixedly connected to the first bottom plate 35, the lower end of the second sliding cylinder 351 is slidably connected to the second pneumatic plate 41, the second sliding cylinder 351 is cooperatively moved with the second pneumatic plate 41, the second sliding cylinder 351 provides power to enable the first bottom plate 35 to slide on the upper end of the second pneumatic plate 41, so that the front-back position of the first bottom plate 35 is adjusted, and different working conditions are met, and different functions are achieved.
Further, as shown in fig. 5, the left and right sides of the lower end of the first bottom plate 35 are fixedly connected with the second protruding circular hole block 352, the second protruding circular hole block 352 is slidably connected with the second sliding rod 353, the front end and the rear end of the second sliding rod 353 are fixedly connected with the second limiting block 354, the lower end of the second limiting block 354 is fixedly connected with the supporting bottom plate 5, the second protruding circular hole 352 is more stable in the process of moving the first bottom plate 35 back and forth, the second limiting block 354 has the function of preventing the movement distance from being too large, and after the distance is limited, the safety of the whole device is better, the operation is smoother, the principle is clear, and the practicability is strong.
Further, as shown in fig. 6, the carrier device 6 includes a protection block 611, a probe groove 612 is formed in the central position of the protection block 611, and telescopic support columns 613 are disposed at four vertex positions of the lower end of the protection block 611, the telescopic support columns 613 penetrate through the central control board 61 and are fixedly connected with a buffer board 614 at the lower end thereof, four round holes are drawn out on the buffer board 614, springs 64 are disposed in the round holes, the upper ends of the springs 64 are fixedly connected with the central control board 61, the carrier device 6 is arranged for positioning through the protection block 611, corresponding contact points are contacted through the probe groove 612, the perpendicularity of probe contact and the probe pressing depth can be ensured, poor contact and service life loss of probes due to non-perpendicularity or excessive pressing directions are reduced, the protection block 611 is added at the upper end of the chip board 62, the protection block 611 completely surrounds the product of the detection probes, the height is flush with the probes, the lower ends of the probes are flush with the springs 64 and the telescopic support columns 613, and pressing and rebound in the vertical direction can be realized under the condition of bearing pressure.
Further, as shown in fig. 3, the left and right sides of the lower end of the central control board 61 are fixedly connected with the anti-collision blocks 65, a layer of silica gel layer is laid on the lower side surface of the anti-collision blocks 65, so that the whole structure is pressed down in the process of contacting with the workbench surface, the dangerous situation of structural deformation caused by too fast pressing down is avoided, the anti-collision blocks 65 are arranged on two sides, and the pressing force can be well buffered, so that the device works more stably, and the safety is high.
Further, the elastic buffer block 2 is formed by splicing two C-shaped rubber blocks into a rectangular structure, the rubber blocks arranged up and down of the elastic buffer block 2 are fixedly connected together, the upper end of the elastic buffer block is fixedly connected with the extrusion block 14, the lower position of the front end of the elastic buffer block 2 is provided with the fixed hook 21, the fixed hook 21 is internally provided with saw-tooth rubber, the elastic buffer block 2 is made of rubber, so that deformation in different directions can be recovered, the service life is long, the position of the fixed hook 21 is regulated by utilizing the deformation generated by the elastic buffer block 2, and therefore, a test product with a connecting wire is adapted, a probe of the test product is contacted with the chip board 62 more stably, the saw-tooth rubber is arranged in the fixed hook 21, the friction force can be increased, and the connecting wire of the test product can be clamped into the fixed hook 21 more stably.
Further, as shown in fig. 3, the chip board 62 is connected with a charging module, the charging module is externally connected with a charging wire 621, the charging wire 621 passes through the extrusion block 14, a through hole is formed in the position where the charging wire 621 passes through the extrusion block 14, the diameter of the through hole is larger than that of the charging wire 621, the uppermost side of the charging wire 621 is connected with a USB interface 622, the chip board 62 is externally connected with the charging wire, and then the charging module is arranged, so that the device can be better suitable for probe detection in different places, the chip board 62 is electrified, and then the chip board 62 is externally connected with a computer end to record and compare data time, thereby ensuring the accuracy of probe detection, and the flexibility of the whole device is better.
Still further, as shown in fig. 6, the upper end of the protection block 611 is fixedly connected with a C-shaped damage preventing block 615, the C-shaped damage preventing block 615 protrudes from the upper end of the protection block 611, the length and width of the protection block 611 are the same as those of the front end of the first bottom plate 35 protruding from the second sliding cylinder 351, an anti-slip rubber layer is arranged at the lower side of the protruding position, the C-shaped damage preventing block 615 can prevent the protection block 611 from being damaged and deformed, the whole probe buffering is ensured to be more accurate, the protruding plate of the first bottom plate 35 can just cover the whole protection block 611, thus, when the protection block is not in operation, the position of the first bottom plate 35 and the protection block 611 is adjusted, the dust-proof effect can be achieved, if the protection block 611 can also move to the position contacting the C-shaped damage preventing block 615 when the protection block is in operation, the protection block 611 is pressed down under the condition that the test product is not interfered to contact with the probe groove 612, the test process can be prolonged, the artificial long-time intervention is not needed, the functions are multiple, and the protection block is creative.
The working process comprises the following steps: firstly, when the device is not in a working state, the buffer plate 614 is fixedly connected with a working table, the upper end device of the buffer plate 614 is in a suspended state, so that when the device is not in work, the air cylinder 1 drives the telescopic rod 11 to do telescopic motion, the extrusion block 14 extrudes the elastic buffer block 2, the elastic buffer block 2 is subjected to downward pressure and then drives the front-back horizontal moving structure to move downwards, the front-back moving structure 4 drives the first bottom plate 35 to move right above the central control plate 61 in the carrier plate device 6, the left-right horizontal moving structure 3 is subjected to position adjustment, the first bottom plate 35 can be in contact with the C-shaped anti-damage block 615, the spring 64 is subjected to downward pressure, and the structure on the upper side of the buffer plate 614 is subjected to downward pressure, so that the anti-collision block 65 is in contact with the working table, the device is not in a protection state, the upper end of the probe groove 612 is covered, and a dustproof effect is achieved;
secondly, when the device is in a working state, the air cylinder 1 moves to drive the extrusion block 14 to move upwards, so that the elastic buffer block 2 moves upwards to reset, the extrusion block 14 can also pull the elastic buffer block 2 to reset, then after the upper part is not subjected to downward pressure, the spring 64 at the lower end also resets along with the self elastic force, so that the front-back moving structure 4 and the left-right translation structure 3 reset, then the second sliding air cylinder 351 in the front-back moving structure 4 provides power to change the position of the first bottom plate 35, so that the probe groove 612 is exposed, then a worker inserts a product to be tested into the probe groove 612, one end with a probe is added with a central control plate 61 at the upper end of the probe, the plate completely surrounds the detection probe, the height is flush with the probe, the lower end of the detection probe can realize downward pressing and rebound in the vertical direction under the condition of bearing pressure, the detected object firstly contacts the central control plate 61 through the spring 64, the central control plate 61 is positioned through the central control plate 61, and the corresponding contact point is contacted with the probe groove 612 in the vertical direction, the vertical pressing direction of the probe is not ensured, and the vertical contact loss of the probe is reduced due to the vertical pressing and the vertical contact loss of the probe is not ensured;
secondly, because the rear end of some test products is provided with a connecting wire (such as a nitrogen-oxygen sensor), the placement of the connecting wire is also important, the connecting wire is fixed by utilizing the fixing hooks 21 on the elastic buffer block 2, and the fixing hooks 21 are internally provided with serrated rubber for increasing friction force, so that the fixing of the connecting wire is more stable;
finally, after the worker hands off the test product, the front-back moving structure 4 and the left-right translation structure 3 can adjust the positions, so that the pressed position of the front-back moving structure is positioned at the contact position of the first bottom plate 35 and the C-shaped damage preventing block 615, the contact between the test product and the probe groove 612 is not interfered, and the influence of the resilience force of the spring 64 on the connection between the test product and the probe detection of the chip board 62 is also prevented;
in summary, when the device does not work, the first bottom plate 35 covers the probe groove 612 and the probe contact hole, so that dust cannot fall onto the chip board 62, and a dust-proof effect is achieved, then when the device works, the first bottom plate 35 can be used for fixing the position of the protection block 611 to control the time of probe detection, the fixing hook 21 can also be used for fixing the connecting wire of the test product, and finally the buffer effect of the spring 64 and the control pressing path of the protection block 611 ensure the perpendicularity of probe contact and the pressing depth of the probe, so that poor contact and the service life loss of the probe caused by non-perpendicularity or excessive pressing direction are reduced.
In the description of the present invention, it should be understood that the directions or positional relationships indicated by the terms "front and rear", "left and right", etc. are based on the directions or positional relationships shown in the drawings, are merely for convenience of description and simplification of the description, and do not indicate or imply that the apparatus or component in question must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as limiting the invention.
Of course, in this disclosure, those skilled in the art will understand that the term "a" or "an" is to be interpreted as "at least one" or "one or more," i.e., in one embodiment, the number of elements may be one, and in another embodiment, the number of elements may be multiple, and the term "a" is not to be construed as limiting the number.
The foregoing is merely a preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any changes or substitutions easily conceivable by those skilled in the art under the technical teaching of the present invention should be included in the scope of the present invention. Therefore, the protection scope of the present invention should be subject to the protection scope of the claims.
Claims (10)
1. The utility model provides a take probe contact device of support plate buffering which characterized in that: comprising
The device comprises an air cylinder (1), wherein a telescopic rod (11) is arranged at the upper end of the air cylinder (1), a slide way (12) is arranged on the surface of the rear side of the air cylinder (1), a sliding block (13) is connected onto the slide way (12) in a sliding mode, the upper end of the sliding block (13) is connected with an extrusion block (14), and the lower side of the front end of the extrusion block (14) is fixedly connected with an elastic buffer block (2);
the device comprises an elastic buffer block (2), wherein a left-right translation structure (3) is arranged at the lower end of the elastic buffer block (2), the lower end of the left-right translation structure (3) is fixedly connected with a front-back movement structure (4), the lower end of the front-back movement structure (4) is connected with a supporting bottom plate (5), and a carrier plate device (6) is arranged at the front end of the supporting bottom plate (5);
the support plate device (6), be equipped with well accuse board (61) in the support plate device (6), well accuse board (61) upper end connection back-up table (5), and well accuse board (61) front end central point put upside and be equipped with chip board (62), be equipped with probe contact hole (63) on chip board (62).
2. The probe contact device with carrier plate buffering according to claim 1, wherein the left-right translation structure (3) comprises a main sliding support plate (31), protruding round hole blocks (32) are arranged on the front side and the rear side of the main sliding support plate (31), the protruding round hole blocks (32) are connected with a sliding rod (33) in a sliding mode, limiting blocks (34) are fixedly connected on the left side and the right side of the sliding rod (33), the lower ends of the limiting blocks (34) are fixedly connected with a first bottom plate (35), a pneumatic plate (36) is fixedly connected to the central position of the first bottom plate (35), and the pneumatic plate (36) is connected with the main sliding support plate (31) in a sliding mode.
3. A probe contact device with carrier plate buffer according to claim 1, characterized in that the back and forth moving structure (4) comprises a second pneumatic plate (41), the upper end of the second pneumatic plate (41) is slidingly connected with the first bottom plate (35), and the lower end thereof is fixedly connected with the supporting bottom plate (5).
4. The probe contact device with carrier plate buffering according to claim 2, wherein the main sliding support plate (31) comprises a sliding cylinder (311), the upper end of the sliding cylinder (311) is fixedly connected with the center position of the lower side of the main sliding support plate (31), the sliding cylinder (311) is of a C-shaped structure, the lower end of the sliding cylinder is slidably connected with a pneumatic plate (36), the center position of the lower end of the first bottom plate (35) is provided with a second sliding cylinder (351), the upper end of the second sliding cylinder (351) is fixedly connected with the first bottom plate (35), and the lower end of the second sliding cylinder is slidably connected with the second pneumatic plate (41).
5. The probe contact device with carrier plate buffering according to claim 2, wherein the left side and the right side of the lower end of the first bottom plate (35) are fixedly connected with second protruding round hole blocks (352), the second protruding round hole blocks (352) are slidably connected with second sliding rods (353), the front end and the rear end of each second sliding rod (353) are fixedly connected with second limiting blocks (354), and the lower ends of the second limiting blocks (354) are fixedly connected with a supporting bottom plate (5).
6. The probe contact device with the carrier plate buffer according to claim 1, wherein the carrier plate device (6) comprises a protection block (611), a probe groove (612) is formed in the central position of the protection block (611), telescopic support columns (613) are arranged at four vertex positions of the lower end of the protection block (611), the telescopic support columns (613) penetrate through a central control plate (61) and are fixedly connected with a buffer plate (614) at the lower end of the central control plate, four round holes are formed in the buffer plate (614), springs (64) are arranged in the round holes, and the upper ends of the springs (64) are fixedly connected with the central control plate (61).
7. The probe contact device with the carrier plate buffer according to claim 1, wherein the left side and the right side of the lower end of the central control plate (61) are fixedly connected with an anti-collision block (65), and a layer of silica gel layer is laid on the lower side surface of the anti-collision block (65).
8. The probe contact device with the carrier plate buffer according to claim 1, wherein the elastic buffer block (2) is formed by splicing two C-shaped rubber blocks into a rectangular structure, the rubber blocks arranged up and down of the elastic buffer block (2) are fixedly connected together, the upper end of the elastic buffer block is fixedly connected with the extrusion block (14), a fixed hook (21) is arranged at the lower position of the front end of the elastic buffer block (2), and serrated rubber is arranged in the fixed hook (21).
9. The probe contact device with the carrier plate buffer according to claim 1, wherein a charging module is connected to the chip board (62), the charging module is externally connected with a charging wire (621), the charging wire (621) passes through the extrusion block (14), a through hole is formed in a position where the charging wire (621) passes through the extrusion block (14), the diameter of the through hole is larger than that of the charging wire (621), and a USB interface (622) is connected to the uppermost side of the charging wire (621).
10. The probe contact device with carrier plate buffering according to claim 6, wherein the upper end of the protection block (611) is fixedly connected with a C-shaped damage prevention block (615), the C-shaped damage prevention block (615) protrudes from the upper end of the protection block (611), the length and the width of the protection block (611) are the same as those of the front end of the first bottom plate (35) protruding from the second sliding cylinder (351), and an anti-slip rubber layer is arranged at the lower side of the protruding position.
Priority Applications (1)
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| CN202310171492.XA CN116148578B (en) | 2023-02-28 | 2023-02-28 | Probe contact device with carrier plate buffer |
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