CN116147635A - Processing method applied to multi-contour sensor - Google Patents
Processing method applied to multi-contour sensor Download PDFInfo
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- CN116147635A CN116147635A CN202310404312.8A CN202310404312A CN116147635A CN 116147635 A CN116147635 A CN 116147635A CN 202310404312 A CN202310404312 A CN 202310404312A CN 116147635 A CN116147635 A CN 116147635A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C21/00—Navigation; Navigational instruments not provided for in groups G01C1/00 - G01C19/00
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/042—Calibration or calibration artifacts
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/20—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile
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- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
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Abstract
The invention relates to the technical field of contour measurement, in particular to a processing method applied to a multi-contour sensor. The method comprises the following steps: s100, if the arrangement mode of the plurality of contour sensors with coplanar light planes relative to the target to be acquired is annular arrangement, entering S200; s200, if m=4, acquiring the profile of the parallelogram cylinder in the first pose using the plurality of profile sensors; s300, obtaining theta i The method comprises the steps of carrying out a first treatment on the surface of the S400, acquiring the outline of the parallelogram cylinder in the second pose by using the plurality of outline sensors; s500, obtaining P i Corresponding xz direction offset T when converting to world coordinate system i =(t x,i ,t z,i ) The method comprises the steps of carrying out a first treatment on the surface of the S600, theta is calculated i 、T i Recorded as u i And u j Is used for the relative position parameter of the sensor. The invention can obtain the relative position relation between different contour sensors.
Description
Technical Field
The invention relates to the technical field of contour measurement, in particular to a processing method applied to a multi-contour sensor.
Background
In order to adapt to different measurement application scenes and expand the measurement range, one contour sensor is often required to be used together with other contour sensors, each contour sensor only needs to scan a part of contours of an object to be acquired, and then the whole contour of the object to be acquired is spliced according to the contours scanned by each contour sensor. However, the self coordinate systems corresponding to the different contour sensors are different, and if the complete contour of the object to be acquired is accurately spliced, the relative position relationship between the different contour sensors needs to be acquired. How to obtain the relative position relation between different contour sensors is a technical problem to be solved.
Disclosure of Invention
The invention aims to provide a processing method applied to a multi-contour sensor, which is used for acquiring the relative position relation between different contour sensors.
According to the invention, a processing method applied to a multi-profile sensor comprises the following steps:
s100, acquiring a plurality of contour sensors U= (U) with coplanar light planes 1 ,u 2 ,…,u i ,…,u M ) In contrast to the arrangement mode of the targets to be acquired, if the arrangement mode is annular arrangement, entering S200; u (u) i And for an ith contour sensor in the plurality of contour sensors, the value range of i is 1 to M, M is the number of contour sensors included in the plurality of contour sensors, and the plurality of contour sensors are used for acquiring the contour of the object to be acquired.
S200, if m=4, acquiring the profile of the parallelogram cylinder in the first pose using the plurality of profile sensors; u (u) i For collecting a first parallelogram pl 1 Is the ith vertex S of (1) 1 i And S is 1 i Corresponding first and second sides, S 1 i The intersection point of the corresponding first side and the second side is S 1 i The first parallelogram pl 1 For said in a first positionA parallelogram obtained after the parallelogram cylinder of the plurality of contour sensors is cut by the light planes of the plurality of contour sensors.
S300, u is j Corresponding self coordinate system P j Aligned with the constructed world coordinate system according to
、L M (i,w)=L l (i+1, w) and L M (M,w)=L l (1, w) acquisition of θ i ，θ i Is u i Corresponding self coordinate system P i Corresponding y-axis rotation angles, i.noteq.j, u, when converting to the world coordinate system j A j-th profile sensor of the plurality of profile sensors; l (L) M (i, w) is S in world coordinate system 1 i Vectors of the corresponding second sides, L M (i, o) is P i Lower O 1 i Vector of corresponding second edge, O 1 i The corresponding second edge is formed by u i Acquisition S 1 i The corresponding second side is obtained, O 1 i Is P i Lower S 1 i A corresponding vertex; l (L) l (i+1, w) is S in world coordinate system 1 i+1 Vectors of the corresponding first sides S 1 i+1 Is a first parallelogram pl 1 I+1th vertex of L M (M, w) is S in world coordinate system 1 M Vectors of the corresponding second sides S 1 M For the first parallelogram pl 1 M th vertex of L l (1, w) is S in world coordinate system 1 1 Vectors of the corresponding first sides S 1 1 For the first parallelogram pl 1 Is the 1 st vertex of (2); the y-axis of the world coordinate system is the main axis direction of the parallelogram cylinder in the first pose, and the x-axis of the world coordinate system is pl 1 The z-axis of the world coordinate system is orthogonal to the x-axis and the y-axis of the world coordinate system. />
S400, acquiring the outline of the parallelogram cylinder in the second pose by using the plurality of outline sensors；u i For collecting a second parallelogram pl 2 Is the ith vertex S of (1) 2 i And S is 2 i Corresponding first and second sides, S 2 i The intersection point of the corresponding first side and the second side is S 2 i The second parallelogram pl 2 And the second pose is not equal to the first pose, and is a parallelogram obtained by cutting the parallelogram cylinder in the second pose by the light planes of the plurality of contour sensors.
S500 according to
S600, theta is calculated i 、T i Recorded as u i And u j Is used for the relative position parameter of the sensor.
The invention has at least the following beneficial effects: in view of the fact that a parallelogram is obtained after a parallelogram cylinder is cut by the light planes of 4 contour sensors which are annularly arranged, and the parallelogram has characteristics different from other polygons (namely, the sum of two adjacent inner angles of the parallelogram is 180 degrees, two opposite angles of the parallelogram are equal, and the relation between any two inner angles of the other polygons is uncertain), the invention provides a method for acquiring relative position parameters between different contour sensors in the 4 contour sensors aiming at the combined measurement application scene of the 4 contour sensors which are annularly arranged; the calibration method does not require that the main axis direction of the parallelogram cylinder is strictly consistent with the normal vector of the light plane of the 4-stage profile sensor in the calibration process, so that the process of aligning the main axis direction of the parallelogram cylinder with the normal vector of the light plane of the 4-stage profile sensor in the calibration process can be omitted, and the efficiency of the calibration process is improved. The processing method is suitable for scenes in which the main axis direction of the parallelogram cylinder is strictly consistent and inconsistent with the normal vector of the light plane of the 4-stage profile sensor, and has higher flexibility and wider application range.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for the description of the embodiments will be briefly described below, and it is apparent that the drawings in the following description are only some embodiments of the present invention, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a flowchart of a processing method applied to a multi-profile sensor according to an embodiment of the present invention;
FIG. 2 is a diagram of S in a world coordinate system according to an embodiment of the present invention 1 i Vector diagrams of the corresponding first and second sides;
FIG. 3 shows a P provided by an embodiment of the present invention i Lower O 1 i Vector diagrams of the corresponding first and second sides;
FIG. 4 is a schematic view of a calibration rod according to an embodiment of the present invention;
FIG. 5 is a schematic diagram of an embodiment of the present invention when the light plane does not intersect the groove;
fig. 6 is a schematic diagram of an embodiment of the present invention when a light plane intersects a groove.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to fall within the scope of the invention.
According to the present invention, there is provided a processing method applied to a multi-profile sensor, as shown in fig. 1, including:
s100, acquiring a plurality of contour sensors U= (U) with coplanar light planes 1 ,u 2 ,…,u i ,…,u M ) In contrast to the arrangement mode of the targets to be acquired, if the arrangement mode is annular arrangement, entering S200; u (u) i And for an ith contour sensor in the plurality of contour sensors, the value range of i is 1 to M, M is the number of contour sensors included in the plurality of contour sensors, and the plurality of contour sensors are used for acquiring the contour of the object to be acquired.
It should be noted that, the object to be acquired refers to an object that is jointly acquired by the plurality of contour sensors. As one example, multiple profile sensors are combined to acquire the profile of a carrier device (e.g., conveyor belt, robotic arm, etc.), then the carrier device is the object to be acquired by the multiple profile sensors.
According to the invention, a plurality of contour sensors are combined to collect the target to be collected, each contour sensor acquires a part of the contour of the target to be collected, the contour collected by each contour sensor is processed and then spliced, and then the whole contour of the target to be collected can be obtained; the processing converts the contour under the self coordinate system according to the relative position relation with other contour sensors.
Optionally, if M is greater than or equal to 3 and the target to be acquired is arranged inside a polygon surrounded by the plurality of contour sensors, judging that the arrangement mode is annular arrangement; the polygon surrounded by the plurality of contour sensors is a polygon surrounded by the centroid of each contour sensor in the plurality of contours as a vertex.
S200, if m=4, acquiring the profile of the parallelogram cylinder in the first pose using the plurality of profile sensors; u (u) i For collecting a first parallelogram pl 1 Is the ith vertex S of (1) 1 i And S is 1 i Corresponding first and second sides, S 1 i The intersection point of the corresponding first side and the second side is S 1 i The first parallelogram pl 1 And the parallelogram column body in the first pose is obtained by cutting the light planes of the plurality of contour sensors.
According to the invention, in order to acquire the contour of the object to be acquired, the relative position relation between each contour sensor and other contour sensors in the plurality of contour sensors for acquiring the object to be acquired needs to be known in advance, namely, the relative position parameters between each contour sensor and other contour sensors in the plurality of contour sensors for acquiring the object to be acquired need to be acquired in advance, the relative position parameters can be used for converting the contour acquired by the different contour sensors in the plurality of contour sensors, the converted contour can accurately reflect the original contour of the object to be acquired (it is understood that one horizontal line segment on the object to be acquired is presented as two line segments which are not present between one line segment under the different contour sensor coordinate systems, and in order to acquire the original contour of the object to be acquired, the contour of the different contour sensors need to be converted first and then spliced.
In order to acquire the relative position relation between different contour sensors, the invention sets a calibration process before the target to be acquired is acquired. The invention aims at a scene of carrying out joint measurement by annular arrangement of 4 contour sensors, and in the calibration process, the 4 contour sensors are used for acquiring the contour of a parallelogram cylinder so as to acquire the relative position relationship between different contour sensors in the 4 contour sensors according to the acquisition result of the parallelogram cylinder. Optionally, the parallelogram cylinder is a cuboid.
S300, u is j Corresponding self coordinate system P j Aligned with the constructed world coordinate system according to
、L M (i,w)=L l (i+1, w) and L M (M,w)=L l (1, w) acquisition of θ i ，θ i Is u i Corresponding self coordinate system P i Corresponding y-axis rotation angles, i.noteq.j, u, when converting to the world coordinate system j A j-th profile sensor of the plurality of profile sensors; l (L) M (i, w) is S in world coordinate system 1 i Vectors of the corresponding second sides, L M (i, o) is P i Lower O 1 i Vector of corresponding second edge, O 1 i The corresponding second edge is formed by u i Acquisition S 1 i The corresponding second side is obtained, O 1 i Is P i Lower S 1 i A corresponding vertex; l (L) l (i+1, w) is S in world coordinate system 1 i+1 Vectors of the corresponding first sides S 1 i+1 Is a first parallelogram pl 1 I+1th vertex of L M (M, w) is S in world coordinate system 1 M Vectors of the corresponding second sides S 1 M For the first parallelogram pl 1 M th vertex of L l (1, w) is S in world coordinate system 1 1 Vectors of the corresponding first sides S 1 1 For the first parallelogram pl 1 Is the 1 st vertex of (2); the y-axis of the world coordinate system is a parallelogram in a first poseThe main axis direction of the column body, the x axis of the world coordinate system is pl 1 The z-axis of the world coordinate system is orthogonal to the x-axis and the y-axis of the world coordinate system.
According to the invention, S in the constructed world coordinate system 1 i The vectors of the corresponding first and second sides are known values, at P i Lower O 1 i The vectors of the corresponding first and second sides are also known values, whereby the unknown quantity θ can be obtained according to the above formula i ，θ i Namely P i And converting the world coordinate system to a corresponding y-axis rotation angle. In the present invention, S is in the world coordinate system 1 i Corresponding first edge and P i Lower O 1 i The corresponding first sides have corresponding relation, S under the world coordinate system 1 i Corresponding second side and P i Lower O 1 i The corresponding second sides have a corresponding relationship.
As one embodiment, S in world coordinate System 1 1 The vector of the corresponding first edge is L l (1, w) S in world coordinate System 1 i The vector of the corresponding second side is L M (1, w) as shown in fig. 2. P (P) i Lower O 1 1 The vector of the corresponding first edge is L l (1,o)，P i Lower O 1 1 The vector of the corresponding second side is L M (1, o) as shown in fig. 3.
S400, acquiring the outline of the parallelogram cylinder in the second pose by using the plurality of outline sensors; u (u) i For collecting a second parallelogram pl 2 Is the ith vertex S of (1) 2 i And S is 2 i Corresponding first and second sides, S 2 i The intersection point of the corresponding first side and the second side is S 2 i The second parallelogram pl 2 The parallelogram column body in the second position is obtained by cutting the light planes of the plurality of contour sensors, and the second position is not equal to the first positionPose(s).
According to the invention, the cylindrical surface of the parallelogram is parallel to the opposite surface, the parallelogram cylinder is cut by the light planes of 4 contour sensors which are annularly arranged, and the parallelogram has the characteristic different from other polygons, namely, the sum of two adjacent inner angles of the parallelogram is 180 degrees, and the opposite angles of the parallelogram are equal; the inner angles of any two of the other polygons are relatively independent, and no definite size relation exists; therefore, the constraint on the normal line of the parallelogram obtained after cutting cannot be realized by using the cosine law like other polygons.
To obtain P i Corresponding xz direction offset T when converting to world coordinate system i =(t x,i , t z,i ) The invention obtains the constraint of the parallelogram obtained by cutting the parallelogram cylinder under two postures (namely the first posture and the second posture, and the second posture is not equal to the first posture) by the light planes of the plurality of contour sensors.
S500 according to
According to the invention, t x,i And t z,i As unknown quantity O a x,i 、O a z,i 、k a 1 And k a 2 All are known quantities, constraints corresponding to a=1 and a=2 are respectively constructed, and t can be obtained by jointly solving the constructed constraints x,i And t z,i 。
S600, theta is calculated i 、T i Recorded as u i And u j Is used for the relative position parameter of the sensor.
According to the invention, u j Corresponding self coordinate system P j Having been aligned with the world coordinate system of construction, then P i Corresponding y-axis rotation angle theta when converting to the world coordinate system i Namely P i To P j Corresponding y-axis rotation angle during conversion, P i Offset T in the corresponding xz direction when converting to the world coordinate system i Namely P i To P j Offset T in the corresponding xz direction during conversion i . Based on this, the self coordinate system corresponding to the profile sensor other than the jth profile sensor among the plurality of profile sensors is equal to P j The relative position relation is known, the acquired contour under the self coordinate system is converted based on the corresponding relative position relation in the subsequent application, and then the acquired contour is spliced with the contour converted by other contour sensors, so that the overall contour of the target to be acquired can be obtained.
In view of the fact that a parallelogram is obtained after a parallelogram cylinder is cut by the light planes of 4 contour sensors which are annularly arranged, and the parallelogram has characteristics different from other polygons (namely, the sum of two adjacent inner angles of the parallelogram is 180 degrees, two opposite angles of the parallelogram are equal, and the relation between any two inner angles of other polygons is uncertain), the invention provides a method for acquiring relative position parameters among different contour sensors in the 4 contour sensors aiming at the combined measurement application scene of the 4 contour sensors which are annularly arranged; the calibration method does not require that the main axis direction of the parallelogram cylinder is strictly consistent with the normal vector of the light plane of the 4-stage profile sensor in the calibration process, so that the process of aligning the main axis direction of the parallelogram cylinder with the normal vector of the light plane of the 4-stage profile sensor in the calibration process can be omitted, and the efficiency of the calibration process is improved. The processing method is suitable for scenes in which the main axis direction of the parallelogram cylinder is strictly consistent and inconsistent with the normal vector of the light plane of the 4-stage profile sensor, and has higher flexibility and wider application range.
According to the present invention, S100 further includes: if the arrangement is parallel arrangement, the process proceeds to S201.
According to the invention, if the object to be acquired is arranged on the same side of each contour sensor in the plurality of contour sensors, the arrangement mode is judged to be parallel arrangement.
S201, acquiring the profile of the calibration rod by using the plurality of profile sensors; the calibration rod is provided with a round hole C= (C) 1 ,c 2 ,…,c i ,…,c M )，c i The ith round hole arranged on the calibration rod is equal in radius, u i For collecting c i Is of the profile d c,i =d u,i ，d c,i C is i And c i+1 Distance between d u,i Is u i And u is equal to i+1 Distance between c i+1 For the (i+1) th round hole arranged on the calibration rod, u i+1 Is the (i+1) th contour sensor of the plurality of contour sensors.
According to the invention, when the arrangement mode of the plurality of contour sensors relative to the target to be acquired is parallel arrangement, the calibration object used in the calibration stage is a calibration rod with a specific structure. As an example, the calibration rod 1 is provided with 2 circular holes 2, as shown in fig. 4.
S301, traversing U and obtaining P i Correspondence upon conversion to the constructed second coordinate systemIs a z-axis rotation angle delta of (2) i And P i+1 Corresponding z-axis rotation angle delta when converting to the constructed second coordinate system i+1 ；δ i =w i ，w i To P i In (a)l i Rotated to P i The corresponding rotation angle of the middle x-axis,l i to use u i Acquisition c i C obtained by the profile of (2) i A corresponding chord; delta i+1 =w i+1 ，w i+1 To P i In (a)l i+1 Rotated to P i+1 The corresponding rotation angle of the middle x-axis,l i+1 to use u i+1 Acquisition c i+1 C obtained by the profile of (2) i+1 Corresponding chord, P i+1 Is u i+1 A corresponding self coordinate system; in the constructed second coordinate systeml i Andl i+1 all are line segments on the x-axis.
The invention does not specifically limit the xyz axis of the second coordinate system, as long as the constructed second coordinate system meets the requirement of the second coordinate systeml i Andl i+1 all conditions are the line segments on the x-axis.
S401, traversing U and obtainingl i Center point A of (2) i And (3) withl i+1 Center point A of (2) i+1 Distance D between A,i 。
According to the invention, the calibration rod c i And c i+1 A groove f is also arranged between i When u i And u i+1 And f i When intersecting, D A,i =((DO i ) 2 -((r 2 -(L i /2) 2 ) 1/2 +(r 2 -(L i+1 /2) 2 ) 1/2 ) 2 ) 1/2 The method comprises the steps of carrying out a first treatment on the surface of the When u is i And u i+1 And f i When not intersecting, D A,i =((DO i ) 2 -((r 2 -(L i /2) 2 ) 1/2 -(r 2 -(L i+1 /2) 2 ) 1/2 ) 2 ) 1/2 ；DO i C is i Center of circle of (c) and c i+1 R is the radius of a round hole arranged on the calibration rod,L i is thatl i Length L of (2) i+1 Is thatl i+1 Is a length of (c).
As an example, as shown in fig. 4, the groove 3 is provided between 2 circular holes 2, and the depth of the groove 3 is smaller than the depth of the circular holes 2.
When the light plane 4 does not intersect the groove 3, as shown in fig. 5, D A,1 =((DO 1 ) 2 -((r 2 -(L 1 /2) 2 ) 1/2 -(r 2 -(L 2 /2) 2 ) 1/2 ) 2 ) 1/2 The method comprises the steps of carrying out a first treatment on the surface of the When the light plane 4 intersects the groove 3, D as shown in fig. 6 A,1 =((DO 1 ) 2 -((r 2 -(L 1 /2) 2 ) 1/2 +(r 2 -(L 2 /2) 2 ) 1/2 ) 2 ) 1/2 。
S501, obtaining P i Corresponding xy-direction offset TR when converting to the second coordinate system i =(-D A,i /2,0)-(Ax i ,Ay i ) Acquiring P i+1 Corresponding xy-direction offset TR when converting to the second coordinate system i+1 =(D A,i /2,0)-(Ax i+1 ,Ay i+1 )；Ax i And Ay i Respectively P i In A of i X and y coordinates, ax i+1 ,Ay i+1 Respectively P i+1 In A of i+1 X-coordinate and y-coordinate of (c).
S601, delta i 、TR i 、δ i+1 And TR i+1 Recorded as u i And u i+1 Is used for the relative position parameter of the sensor.
Delta-based according to the invention i And TR i Can realize P i Conversion to a constructed second coordinate system based on delta i+1 And TR i+1 Can realize P i+1 Conversion to a constructed second coordinate system; therefore, during subsequent application, each contour sensor in the plurality of contour sensors converts the contour acquired under the corresponding coordinate system to the second coordinate system, and the converted acquired contour is spliced in the second coordinate system, so that the overall contour of the target to be acquired can be obtained.
The invention provides a method for acquiring relative position parameters among different contour sensors for a combined measurement application scene in which a plurality of contour sensors are arranged in parallel; the calibration method does not require the position of the calibration rod to meet the preset condition (the preset condition is that the light planes of the plurality of contour sensors pass through the connecting line of the circle centers of all round holes on the calibration rod), so that the process of placing the calibration rod according to the position meeting the preset condition in the calibration process can be omitted, and the efficiency of the calibration process can be improved. The calibration method is suitable for a scene that the calibration rod is placed according to the position meeting the preset condition or is not placed according to the position meeting the preset condition, and the application range of the calibration method is wider.
While certain specific embodiments of the invention have been described in detail by way of example, it will be appreciated by those skilled in the art that the above examples are for illustration only and are not intended to limit the scope of the invention. Those skilled in the art will also appreciate that many modifications may be made to the embodiments without departing from the scope and spirit of the invention. The scope of the invention is defined by the appended claims.
Claims (7)
1. A processing method applied to a multi-profile sensor, comprising the steps of:
s100, acquiring a plurality of contour sensors U= (U) with coplanar light planes 1 ,u 2 ,…,u i ,…,u M ) In contrast to the arrangement mode of the targets to be acquired, if the arrangement mode is annular arrangement, entering S200; u (u) i For an ith contour sensor in the plurality of contour sensors, the value range of i is 1 to M, M is the number of contour sensors included in the plurality of contour sensors, and the plurality of contour sensors are used for acquiring the contour of the object to be acquired;
s200, if m=4, acquiring the profile of the parallelogram cylinder in the first pose using the plurality of profile sensors; u (u) i For collecting a first parallelogram pl 1 Is the ith vertex S of (1) 1 i And S is 1 i Corresponding first and second sides, S 1 i The intersection point of the corresponding first side and the second side is S 1 i The first parallelogram pl 1 The parallelogram column body in the first pose is obtained after the parallelogram column body is cut by the light planes of the plurality of contour sensors;
s300, u is j Corresponding self coordinate system P j Aligned with the constructed world coordinate system according to
s400, acquiring the outline of the parallelogram cylinder in the second pose by using the plurality of outline sensors; u (u) i For collecting a second parallelogram pl 2 Is the ith vertex S of (1) 2 i And S is 2 i Corresponding first and second sides, S 2 i The intersection point of the corresponding first side and the second side is S 2 i The second parallelogram pl 2 The parallelogram column body in the second pose is obtained by cutting the light planes of the plurality of contour sensors, and the second pose is not equal to the first pose;
s500 according to
s600, theta is calculated i 、T i Recorded as u i And u j Is used for the relative position parameter of the sensor.
2. The processing method applied to the multi-profile sensor according to claim 1, wherein S100 further comprises: if the arrangement is parallel arrangement, then S201 is entered;
s201, acquiring the profile of the calibration rod by using the plurality of profile sensors; the calibration rod is provided with a round hole C= (C) 1 ,c 2 ,…,c i ,…,c M )，c i The ith round hole arranged on the calibration rod is equal in radius, u i For collecting c i Is of the profile d c,i =d u,i ，d c,i C is i And c i+1 Distance between d u,i Is u i And u is equal to i+1 Distance between c i+1 For the (i+1) th round hole arranged on the calibration rod, u i+1 An i+1th contour sensor of the plurality of contour sensors;
s301, traversing U and obtaining P i Corresponding z-axis rotation angle delta when converting to the constructed second coordinate system i And P i+1 Corresponding z-axis rotation angle delta when converting to the constructed second coordinate system i+1 ；δ i =w i ，w i To P i In (a)l i Rotated to P i The corresponding rotation angle of the middle x-axis,l i to use u i Acquisition c i C obtained by the profile of (2) i A corresponding chord; delta i+1 =w i+1 ，w i+1 To P i In (a)l i+1 Rotated to P i+1 The corresponding rotation angle of the middle x-axis,l i+1 to use u i+1 Acquisition c i+1 C obtained by the profile of (2) i+1 Corresponding chord, P i+1 Is u i+1 A corresponding self coordinate system; the construction is thatIn a second coordinate system of (2)l i Andl i+1 all are line segments on the x axis;
s401, traversing U and obtainingl i Center point A of (2) i And (3) withl i+1 Center point A of (2) i+1 Distance D between A,i ；
S501, obtaining P i Corresponding xy-direction offset TR when converting to the second coordinate system i =(-D A,i /2,0)-(Ax i ,Ay i ) Acquiring P i+1 Corresponding xy-direction offset TR when converting to the second coordinate system i+1 =(D A,i /2,0)-(Ax i+1 ,Ay i+1 )；Ax i And Ay i Respectively P i In A of i X and y coordinates, ax i+1 ,Ay i+1 Respectively P i+1 In A of i+1 X and y coordinates of (c);
s601, delta i 、TR i 、δ i+1 And TR i+1 Recorded as u i And u i+1 Is used for the relative position parameter of the sensor.
3. The method of claim 2, wherein the calibration rod c i And c i+1 A groove f is also arranged between i When u i And u i+1 And f i When intersecting, D A,i =((DO i ) 2 -((r 2 -(L i /2) 2 ) 1/2 +(r 2 -(L i+1 /2) 2 ) 1/2 ) 2 ) 1/2 The method comprises the steps of carrying out a first treatment on the surface of the When u is i And u i+1 And f i When not intersecting, D A,i =((DO i ) 2 -((r 2 -(L i /2) 2 ) 1/2 -(r 2 -(L i+1 /2) 2 ) 1/2 ) 2 ) 1/2 ；DO i C is i Center of circle of (c) and c i+1 R is the radius of a round hole arranged on the calibration rod, L i Is thatl i Length L of (2) i+1 Is thatl i+1 Is a length of (c).
4. The processing method applied to the multi-profile sensor according to claim 2, wherein the judging method of the arrangement mode being parallel arrangement comprises: and if the targets to be acquired are arranged on the same side of each contour sensor in the plurality of contour sensors, judging that the arrangement mode is parallel arrangement.
5. The method for processing a multi-profile sensor according to claim 1, wherein the determining method for determining the arrangement mode as a circular arrangement includes: and if M is more than or equal to 3 and the target to be acquired is arranged in the polygon surrounded by the outline sensors, judging that the arrangement mode is annular arrangement.
6. The processing method applied to a multi-profile sensor according to claim 1, wherein the parallelogram-shaped column is a cuboid.
7. A processing method applied to a multi-profile sensor according to claim 3, characterized in that the groove f i Is less than c i Is a depth of (c).
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