CN116106731B - Relay testing device - Google Patents
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- CN116106731B CN116106731B CN202211093890.6A CN202211093890A CN116106731B CN 116106731 B CN116106731 B CN 116106731B CN 202211093890 A CN202211093890 A CN 202211093890A CN 116106731 B CN116106731 B CN 116106731B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
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Abstract
The invention relates to a relay testing device, comprising: a waveform generator for outputting a test signal; the relay coil interface is used for connecting a coil of a relay to be tested; the relay contact interface is used for connecting the contacts of the relay to be tested; one end of the sampling resistor is connected with the relay contact interface, and the other end of the sampling resistor is grounded; one end of the load unit is connected with the relay contact interface, and the other end of the load unit is connected with a test power supply; the subtracting circuit is characterized in that an enabling end is connected with the waveform generator, a first input end is connected with one end of the load unit, which is connected with the relay contact, and a second input end is connected with one end of the sampling resistor, which is connected with the relay contact; the first input end of the comparator is connected with the output end of the subtracting circuit, and the second input end of the comparator is used for inputting a comparison electric signal; and the prompting unit is connected with the output end of the comparator. The invention has comprehensive failure test on the relay, simple structure and low device cost.
Description
Technical Field
The present disclosure relates to relay testing, and more particularly to a relay testing device.
Background
Relays for precision measuring instruments typically use mercury or reed relays, and relay failure is manifested as: 1. the contacts cannot be closed or opened; 2. the time required for switching the contacts from open to closed is too long; 3. the resistance is too great when the contacts are closed. This can introduce measurement errors or mistakes into the precision measuring instrument.
Conventional relay test arrangements often test only for failure condition 1 described above, without consideration of failure condition 2.
Disclosure of Invention
Based on this, it is necessary to provide a relay test device capable of testing against the foregoing failure cases 2 and 3 of the relay to be tested.
A relay testing apparatus comprising: a first waveform generator for outputting a first test signal; the relay coil interface is used for connecting a coil of the relay to be tested so as to open and close contacts of the relay to be tested according to the first test signal; a relay contact interface for connecting the contacts of the relay to be tested; one end of the sampling resistor is connected with the relay contact interface, and the other end of the sampling resistor is grounded; one end of the load unit is connected with the relay contact interface, and the other end of the load unit is connected with a test power supply; when the contact of the relay to be tested is closed, the load unit is conducted with the sampling resistor; when the contact of the relay to be tested is disconnected, the load unit and the sampling resistor are disconnected; the subtracting circuit comprises an enabling end, a first input end, a second input end and an output end, wherein the enabling end is connected with the first waveform generator and is used for enabling operation according to a signal received by the enabling end, the first input end is connected with one end of the load unit, which is connected with the relay contact, the second input end is connected with one end of the sampling resistor, which is connected with the relay contact, and the output end of the subtracting circuit when the enabling end is enabled is the electric signal input by the first input end minus the electric signal input by the second input end; the comparator comprises a first input end, a second input end and an output end, wherein the first input end of the comparator is connected with the output end of the subtracting circuit, the second input end of the comparator is used for inputting a comparison electric signal, and the output end of the comparator is used for outputting a first signal when the electric signal input by the first input end of the comparator is larger than the comparison electric signal; and the prompting unit is connected with the output end of the comparator and is used for prompting when the first signal is received.
According to the relay testing device, when the contacts of the relay to be tested are closed, the voltage between the testing power supply and the ground wire is divided by the load unit, the on-resistance of the contacts of the relay to be tested and the sampling resistor, and the electric signal output by the subtracting circuit is positively correlated with the voltage at two ends of the on-resistance, namely, the electric signal is positively correlated with the on-resistance. Therefore, the comparison electric signal input by the second input end of the comparator is reasonably set, and prompt can be realized through the prompt unit when the on-resistance is overlarge. The relay testing device can test the failure condition 2 and the failure condition 3 of the relay to be tested because the too long time for the contact of the relay to be tested to be transited from opening to closing can be reflected as the too large on resistance. The sampling resistor is arranged to cooperate to test whether the on-resistance is overlarge, so that inaccurate test caused by current fluctuation can be avoided, and the test voltage and the load unit Rl of the test power supply can be conveniently adjusted. The device has simple structure and low cost.
In one embodiment, the relay testing apparatus further includes: the input end of the first amplifying circuit is connected with the output end of the subtracting circuit, and the output end of the first amplifying circuit is connected with the first input end of the comparator; the input end of the second amplifying circuit is connected with one end of the sampling resistor, which is connected with the relay contact interface, and the output end of the second amplifying circuit is connected with the second input end of the comparator; the ratio of the amplification factor of the first amplification circuit to the amplification factor of the second amplification circuit is not larger than the ratio of the resistance value of the sampling resistor to the expected on-resistance value of the contact of the relay to be tested.
In one embodiment, the amplification factor of the first amplifying circuit ranges from 100 to 500, and the amplification factor of the second amplifying circuit ranges from 10 to 50.
In one embodiment, the relay testing device further includes a delay circuit, where the delay circuit is disposed between the first waveform generator and an enable end of the subtracting circuit, and is configured to delay the subtracting circuit from starting operation of the enable signal in the first test signal.
In one embodiment, the relay testing apparatus further includes: the input end of the waveform delay circuit is connected with the first waveform generator; the AND gate comprises a first input end, a second input end and an output end, wherein the first input end of the AND gate is connected with the first waveform generator, the second input end of the AND gate is connected with the output end of the waveform delay circuit, and the output end of the AND gate is connected with the enabling end of the subtracting circuit.
In one embodiment, the relay testing device further includes a driving circuit, and an output end of the driving circuit is connected to the relay coil interface and is used for driving the contacts of the relay to be tested to be opened and closed according to the first test signal.
In one embodiment, the relay testing device further comprises a diode, wherein the anode of the diode is grounded, and the cathode of the diode is connected with the output end of the driving circuit.
In one embodiment, the relay testing device further includes a first counter connected to an output of the comparator, and the first counter is configured to count the number of times the first signal is received.
In one embodiment, the relay testing apparatus further includes: a second waveform generator for outputting a second test signal; a first selection switch connecting the second waveform generator to the relay coil interface in a first state and connecting the first waveform generator to the relay coil interface in a second state; a second selection switch, wherein one end of the load unit connected with the relay contact interface is connected with the first counter without being connected with the first input end of the subtracting circuit in a third state, and one end of the load unit connected with the relay contact interface is connected with the first input end of the subtracting circuit in a fourth state; and the second counter is connected with the second waveform generator and is used for counting the cycle number of the second test signal.
In one embodiment, the relay testing apparatus further includes: a third selection switch connecting the first counter to the second selection switch in a fifth state without connecting the first counter to the output terminal of the comparator, and connecting the first counter to the output terminal of the comparator in a sixth state; a function selecting circuit that causes the first selecting switch to be in a first state, the second selecting switch to be in a third state, and the third selecting switch to be in a fifth state when a first function is selected; the first selection switch is in a second state, the second selection switch is in a fourth state, and the third selection switch is in a sixth state when the second function is selected.
Drawings
In order to more clearly illustrate the technical solutions of embodiments or conventional techniques of the present application, the drawings required for the descriptions of the embodiments or conventional techniques will be briefly described below, and it is apparent that the drawings in the following description are only some embodiments of the present application, and other drawings may be obtained according to these drawings without inventive effort for a person of ordinary skill in the art.
FIG. 1 is a schematic circuit diagram of a relay testing apparatus according to an embodiment of the present disclosure;
FIG. 2 is a schematic circuit diagram of a relay testing apparatus according to another embodiment of the present application;
fig. 3 is a schematic circuit diagram of a relay testing device connected to a relay under test in an embodiment of the present application.
Detailed Description
In order to facilitate an understanding of the present application, a more complete description of the present application will now be provided with reference to the relevant figures. Examples of the present application are given in the accompanying drawings. This application may, however, be embodied in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein in the description of the application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.
It will be understood that when an element or layer is referred to as being "on," "adjacent," "connected to," or "coupled to" another element or layer, it can be directly on, adjacent, connected, or coupled to the other element or layer, or intervening elements or layers may be present. In contrast, when an element is referred to as being "directly on," "directly adjacent to," "directly connected to," or "directly coupled to" another element or layer, there are no intervening elements or layers present. It will be understood that, although the terms first, second, third, etc. may be used to describe various elements, components, regions, layers, doping types and/or sections, these elements, components, regions, layers, doping types and/or sections should not be limited by these terms. These terms are only used to distinguish one element, component, region, layer, doping type or section from another element, component, region, layer, doping type or section. Thus, a first element, component, region, layer, doping type or section discussed below could be termed a second element, component, region, layer or section without departing from the teachings of the present invention; for example, the first doping type may be made the second doping type, and similarly, the second doping type may be made the first doping type; the first doping type and the second doping type are different doping types, for example, the first doping type may be P-type and the second doping type may be N-type, or the first doping type may be N-type and the second doping type may be P-type.
Spatially relative terms, such as "under", "below", "beneath", "under", "above", "over" and the like, may be used herein to describe one element or feature's relationship to another element or feature as illustrated in the figures. It will be understood that the spatially relative terms are intended to encompass different orientations of the device in use and operation in addition to the orientation depicted in the figures. For example, if the device in the figures is turned over, elements or features described as "under" or "beneath" other elements would then be oriented "on" the other elements or features. Thus, the exemplary terms "below" and "under" may include both an upper and a lower orientation. Furthermore, the device may also include an additional orientation (e.g., rotated 90 degrees or other orientations) and the spatial descriptors used herein interpreted accordingly.
As used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms "comprises" and/or "comprising," and/or the like, specify the presence of stated features, integers, steps, operations, elements, components, or groups thereof, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, or groups thereof. Also, in this specification, the term "and/or" includes any and all combinations of the associated listed items.
Fig. 1 is a schematic circuit diagram of a relay testing device according to an embodiment of the present application. The relay testing apparatus includes a first waveform generator 110, a subtracting circuit 120, a comparator 130, a prompting unit 140, a relay coil interface a, a relay contact interface B, a sampling resistor Rs, and a load unit Rl. The dashed box position in fig. 1 is used for accessing the relay under test. The first waveform generator 110 is used for outputting a first test signal. The relay coil interface A is used for connecting a coil of the relay to be tested so as to enable contacts of the relay to be tested to be opened/closed according to the first test signal. The relay contact interface B is used for connecting contacts of the relay to be tested. One end of the sampling resistor Rs is connected with the relay contact interface B, and the other end is grounded. One end of the load unit Rl is connected with the relay contact interface B, and the other end of the load unit Rl is connected with a test power supply. The test power supply is used for providing test voltage, and when the relay to be tested is connected to the relay test device, if the contact of the relay to be tested is closed, the load unit Rl and the sampling resistor Rs are conducted; if the contacts of the relay to be tested are opened, the circuit is broken between the load unit Rl and the sampling resistor Rs.
The subtracting circuit 120 has an enable terminal connected to the first waveform generator 110, a first input terminal connected to one end of the load unit Rl connected to the relay contact B, and a second input terminal connected to one end of the sampling resistor Rs connected to the relay contact B. The subtracting circuit 120 operates according to the first test signal enable, and when the enable terminal is enabled, the output of the output terminal is the electric signal input by the first input terminal minus the electric signal input by the second input terminal.
A first input of the comparator 130 is connected to an output of the subtracting block 120. A second input of the comparator 130 is for inputting a comparison electrical signal. The output terminal of the comparator 130 is configured to output a first signal when the electrical signal input at the first input terminal of the comparator 130 is greater than the comparison electrical signal. The prompting unit 140 is connected to an output terminal of the comparator 130, and is configured to prompt when the first signal is received.
In one embodiment of the present application, the voltage signals are input to two input terminals of the subtracting circuit 120, and the output terminal of the subtracting circuit 120 outputs the corresponding electric signals obtained by subtracting the two voltages.
In the relay testing device, when the contacts of the relay to be tested are closed, the voltage between the test power supply and the ground line is divided by the load unit Rl, the on-resistance Ron of the contacts of the relay to be tested, and the sampling resistor Rs, the electric signal output by the subtracting circuit 120 is positively correlated with the voltage across the on-resistance Ron, and when the test voltage output by the test power supply, the load unit Rl, and the sampling resistor Rs are unchanged, the electric signal output by the subtracting circuit 120 is positively correlated with the on-resistance Ron (the larger the on-resistance Ron is, the larger the electric signal output by the subtracting circuit 120 is). Therefore, by reasonably setting the comparison electric signal input by the second input terminal of the comparator 130, the alarm prompt by the prompt unit 140 can be realized when the on-resistance Ron is too large. The time for the contact of the relay to be tested to be transited from opening to closing is too long and can be also reflected in that the on-resistance Ron is too large, so that the relay testing device can test the failure condition 2 and the failure condition 3 of the relay to be tested. The sampling resistor Rs is arranged to cooperate with the test of whether the on-resistance Ron is overlarge, so that inaccurate test caused by current fluctuation can be avoided, and the voltage of a test power supply and the load unit Rl can be conveniently adjusted.
In one embodiment of the present application, the relay testing apparatus further includes:
the input end of the first amplifying circuit is connected with the output end of the subtracting circuit 120, and the output end of the first amplifying circuit is connected with the first input end of the comparator 130;
and the input end of the second amplifying circuit is connected with one end of the sampling resistor Rs, which is connected with the relay contact interface B, and the output end of the second amplifying circuit is connected with the second input end of the comparator 130.
In this embodiment, the electric signal output by the subtracting circuit 120 is amplified by the first amplifying circuit and then input to the first input terminal of the comparator 130, and the voltage of the sampling resistor Rs is amplified by the second amplifying circuit and then input to the second input terminal of the comparator 130. The ratio of the amplification factor X of the first amplifying circuit to the amplification factor Y of the second amplifying circuit is not greater than the ratio of the resistance value R1 of the sampling resistor Rs to the expected on-resistance value R2 of the contact of the relay to be tested, that is, the selection of the amplification factor of the amplifying circuit is related to the ratio of R1 and R2. Assuming R2 is 100 milliohms and sampling resistor Rs selects 1 ohm, then X/Y is no greater than 10, e.g., x=100, y=10. R2 can be the nominal value of the on-resistance provided by the manufacturer of the relay to be tested, and can also be the on-resistance test value obtained through the test. In one embodiment of the present application, the value of X ranges from 100 to 500 and the value of y ranges from 10 to 50. In order to avoid that the error between the resistance value and the nominal value of the sampling resistor Rs causes the prompt unit 140 to report by mistake, the sampling resistor Rs may be selected as a precision sampling resistor.
By arranging an amplifying circuit, the voltage is amplified proportionally and then compared, and the dependence on the precision of the sampling resistor Rs can be reduced.
In one embodiment of the present application, the relay testing apparatus further comprises a delay circuit. The delay circuit is disposed between the first waveform generator 110 and the enable terminal of the subtracting circuit 120. The delay circuit is provided to enable the subtracting circuit 120 to slightly delay the enabling signal in the first test signal (for example, the high level in the first test signal) to restart operation, so that the relay to be tested can be fully turned on. It will be appreciated that even with a normally-present high precision relay, a certain response time (e.g., 1 millisecond or more) is required from the receipt of the contact closure signal to the normal closure of the contacts. Even for a normally-in-state high-precision relay, the presentation unit 140 may be misreported if no delay is performed. Therefore, the delay circuit is provided, so that the subtracting circuit 120 can start to work again after the relay to be tested in a normal state is fully conducted, and correspondingly, the comparator 130 also can conduct voltage comparison after the contact of the relay to be tested is fully conducted, so as to judge whether the on resistance of the contact of the relay to be tested is too high.
In one embodiment of the present application, the delay circuit is specifically implemented by a waveform delay circuit and an and gate. The input of the waveform delay circuit is connected to the first waveform generator 110. The first input end of the and gate is connected to the first waveform generator 110, the second input end of the and gate is connected to the output end of the waveform delay circuit, and the output end of the and gate is connected to the enable end of the subtracting circuit 120. In this way, the subtracting circuit 120 delays the start of the operation of the enable signal in the first test signal output by the first waveform generator 110, but ends the operation in synchronization with the disable signal (e.g., low level) in the first test signal. In one embodiment of the present application, the waveform delay circuit delays for a period of 1 to 2 milliseconds.
In one embodiment of the present application, the relay testing apparatus further comprises a driving circuit. The output end of the driving circuit is connected with the relay coil interface A, and the input end of the driving circuit can be connected with the first waveform generator 110 for driving the contact of the relay to be tested to be opened/closed according to the first test signal output by the first waveform generator 110.
In one embodiment of the present application, the relay test apparatus further comprises a protection diode. The anode of the protection diode is grounded, and the cathode of the protection diode is connected with the output end of the driving circuit 170.
In one embodiment of the present application, the relay test apparatus further includes a first counter connected to the output of the comparator 130. The first counter is used for counting the times of receiving the first signal.
Fig. 2 is a schematic circuit diagram of a relay testing apparatus according to another embodiment of the present application. In this embodiment, the relay testing apparatus includes a first waveform generator 110, a subtracting circuit 120, a comparator 130, a prompt unit 140, a waveform delay circuit 152, an and gate 154, a first amplifying circuit 162, a second amplifying circuit 164, a driving circuit 170, a first counter 182, a relay coil interface a, a relay contact interface B, a sampling resistor Rs, a load unit Rl, and a protection diode D1.
The first waveform generator 110 is used for outputting a first test signal. The relay coil interface A is used for connecting a coil of a relay to be tested. An output end of the driving circuit 170 is connected with the relay coil interface A, an input end of the driving circuit 170 is connected with the first waveform generator 110, and the driving circuit is used for driving contacts of the relay to be tested to be opened/closed according to a first test signal output by the first waveform generator 110. The relay contact interface B is used for connecting contacts of the relay to be tested. One end of the sampling resistor Rs is connected with the relay contact interface B, and the other end is grounded. One end of the load unit Rl is connected with the relay contact interface B, and the other end of the load unit Rl is connected with a test power supply. The test power supply is used for providing test voltage, and when the relay to be tested is connected to the relay test device, if the contact of the relay to be tested is closed, the load unit Rl and the sampling resistor Rs are conducted; if the contacts of the relay to be tested are opened, the circuit is broken between the load unit Rl and the sampling resistor Rs. The positive electrode of the protection diode D1 is grounded, and the negative electrode is connected with the output end of the driving circuit 170.
The input of the waveform delay circuit 152 is connected to the first waveform generator 110. A first input terminal of the and gate 154 is connected to the first waveform generator 110, a second input terminal of the and gate 154 is connected to an output terminal of the waveform delay circuit 152, and an output terminal of the and gate 154 is connected to an enable terminal of the subtracting circuit 120. The subtracting circuit 120 has a first input connected to one end of the load unit Rl connected to the relay contact B and a second input connected to one end of the sampling resistor Rs connected to the relay contact B. The subtracting circuit 120 is enabled according to the electric signal output from the and gate 154, and when the enable terminal is enabled, the output of the output terminal of the subtracting circuit 120 is the electric signal input from the first input terminal minus the electric signal input from the second input terminal.
An input terminal of the first amplifying circuit 162 is connected to an output terminal of the subtracting circuit 120, and an output terminal of the first amplifying circuit 162 is connected to a first input terminal of the comparator 130. An input terminal of the second amplifying circuit 164 is connected to one terminal of the sampling resistor Rs connected to the relay contact interface B, and an output terminal of the second amplifying circuit 164 is connected to a second input terminal of the comparator 130. The output terminal of the comparator 130 is configured to output a first signal when the electrical signal input by the first input terminal of the comparator 130 is greater than the electrical signal input by the second input terminal. The prompting unit 140 is connected to an output terminal of the comparator 130, and is configured to prompt when the first signal is received. The first counter 182 is connected to the output of the comparator 130, and is configured to count the number of times the first signal is received.
When the relay testing device tests the relay to be tested, the driving circuit 170 receives the first test signal output by the first waveform generator 110, and drives the relay to be tested to be conducted according to the first test signal. In one embodiment of the present application, the period of the first test signal is in the range of 4 ms to 10 ms, and the specific value may be determined according to the characteristics of the relay to be tested. Waveform delay circuit 152 delays to enable subtracting block 120. The electric signal output by the subtracting circuit 120 is equivalent to the voltage across the on-resistance Ron of the contact of the relay to be measured, which is amplified by the first amplifying circuit 162 and compared with the sampling voltage of the sampling resistor Rs amplified by the second amplifying circuit 164 by the comparator 130, and if it is greater than the sampling voltage signal, it is indicated that the on-resistance Ron is abnormal (excessive), which is alerted by the presenting unit 140 and counted by the first counter 182.
The principle of determining abnormality in on-resistance Ron is illustrated: assume that the expected on-resistance value R2 of the contacts of the relay under test is 100 milliohms. In one embodiment of the present application, the sampling resistor Rs is a precision sampling resistor of 1 ohm, the amplification factor of the first amplification circuit 162 is 100, and the amplification factor of the second amplification circuit 164 is 10. The inputs to the two inputs of comparator 130 are normally equal and alert unit 140 does not alert when subtracting block 120 is enabled. Only when the on-resistance is too high, or when the contact of the relay to be tested is too long to switch from open to closed, the input of the first input end of the comparator 130 is larger than the input of the second input end, and the prompting unit 140 alarms.
In one embodiment of the present application, the load unit Rl may be a load resistor with a resistance value that is selected according to the load capacity of the relay to be tested. The influence of the existence of the load on the test result of the relay to be tested is larger.
In one embodiment of the present application, a test function for failure condition 1 in the background art may be further added to the relay test device. Accordingly, in one embodiment of the present application, the relay testing apparatus further includes:
a second waveform generator for outputting a second test signal;
a first selector switch for connecting the second waveform generator to the relay coil interface a in the first state and connecting the first waveform generator 110 to the relay coil interface a in the second state;
a second selector switch for connecting one end of the load unit Rl connected to the relay contact interface B to the first counter 182, not to the first input terminal of the subtracting circuit 120, in the third state, and connecting one end of the load unit Rl connected to the relay contact interface B to the first input terminal of the subtracting circuit 120 in the fourth state;
and the second counter is connected with the second waveform generator and is used for counting the cycle number of the second test signal.
When the failure condition 1 is tested, the first selector switch is set to the first state and the second selector switch is set to the third state. At this time, the second counter records the number of waveforms (cycles) of the second test signal, the first counter 182 records the number of conduction times of the contacts of the relay to be tested, if the count of the first counter 182 is the same as the count of the second counter, the test is passed, otherwise, the relay to be tested is failed.
In one embodiment of the present application, the second test signal is a square wave signal, and the period of the square wave signal ranges from 10 milliseconds to 20 milliseconds.
In another embodiment of the present application, the first waveform generator 110 may also be multiplexed, for example, by changing a connection relationship of a first selection switch, where the first selection switch connects the first waveform generator 110 to the waveform delay circuit 152 and the and gate 154 in the second state, disconnects the first waveform generator 110 from the waveform delay circuit 152 and the and gate 154 in the first state, and sets a second counter for counting the number of periods of the first test signal of the first waveform generator 110. So that the test signal can be provided by the first waveform generator 110 under both test functions.
In one embodiment of the present application, the relay test arrangement may further comprise a function selection circuit for switching between two test functions (testing failure condition 1 or testing failure conditions 2 and 3). The function selection circuit enables the first selection switch to be in a first state and the second selection switch to be in a third state when a first function is selected; the first selection switch is in a second state and the second selection switch is in a fourth state when the second function is selected.
In one embodiment of the present application, the relay testing apparatus may further include a third selection switch. The third selector switch connects the first counter 182 to the second selector switch and not to the output of the comparator 130 in the fifth state, and connects the first counter 181 to the output of the comparator 130 in the sixth state.
Fig. 3 is a schematic circuit diagram of a relay testing device connected to a relay to be tested according to an embodiment of the present application, where positions indicated by two arrows indicate that two intersecting circuits are not connected to each other. In this embodiment, the relay test apparatus includes a first waveform generator 110, a second waveform generator 112, a subtracting circuit 120, a comparator 130, a prompt unit 140, a waveform delay circuit 152, an and gate 154, a first amplifying circuit 162, a second amplifying circuit 164, a driving circuit 170, a first counter 182, a second counter 184, a function selecting circuit 190, a relay coil interface a, a relay contact interface B, a sampling resistor Rs, a load resistor, and a protection diode. Wherein the function selection circuit 190 is used to select a test function of the relay test device. When selecting test function 1, the relay test device is used for testing the failure condition 1 described in the background art, and three selection switches controlled by the function selection circuit 190 are all switched to 1 st gear in fig. 3; when test function 2 is selected, the relay test device is used to test for failure cases 2 and 3 described in the background art, and three selection switches controlled by function selection circuit 190 are all turned to gear 2 in fig. 3.
When selecting test function 2, the connection of the circuit is similar to the embodiment shown in fig. 2, and the circuit principle at the time of its test will not be described here again. When the test function 1 is selected, the second waveform generator 112 is connected to the driving circuit 170, and the driving circuit 170 controls the on/off of the contacts of the relay under test according to the second test signal output from the second waveform generator 112. The load resistor is grounded through the sampling resistor Rs when the contact of the relay to be tested is closed; and when the contact of the relay to be tested is opened, the test voltage is supplied to the first counter 182 through the load resistor. The second counter 184 connected to the second waveform generator 112 is used for recording the number of waveforms of the second test signal, the first counter 182 records the number of conduction times of the contacts of the relay to be tested, if the count of the first counter 182 is the same as the count of the second counter 184, the test is passed, otherwise, the relay to be tested is failed. In one embodiment of the present application, the test time for one test when selecting test function 1 may be 6-10 minutes, and the test passes if the count of the first counter 182 is the same as the count of the second counter 184. In one embodiment of the present application, multiple test cycles of test function 1 and test function 2 may be performed during testing.
In one embodiment of the present application, the relay testing device may test a relay having more than two relay switches at the same time, and accordingly, a plurality of test branches are to be provided, each test branch includes a subtracting circuit 120, a comparator 130, a prompting unit 140, a waveform delay circuit 152, an and gate 154, a first amplifying circuit 162, a second amplifying circuit 164, and a first counter 182, i.e. the number of these units is the same as the number of relay switches.
In the description of the present specification, reference to the terms "some embodiments," "other embodiments," "desired embodiments," and the like, means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, schematic descriptions of the above terms do not necessarily refer to the same embodiment or example.
The technical features of the above embodiments may be arbitrarily combined, and for brevity, all of the possible combinations of the technical features of the above embodiments are not described, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.
The above examples only represent a few embodiments of the present application, which are described in more detail and are not to be construed as limiting the scope of the claims. It should be noted that it would be apparent to those skilled in the art that various modifications and improvements could be made without departing from the spirit of the present application, which would be within the scope of the present application. Accordingly, the scope of protection of the present application is to be determined by the claims appended hereto.
Claims (7)
1. A relay testing apparatus, comprising:
a first waveform generator for outputting a first test signal;
the relay coil interface is used for connecting a coil of the relay to be tested so as to open and close contacts of the relay to be tested according to the first test signal;
a relay contact interface for connecting the contacts of the relay to be tested;
one end of the sampling resistor is connected with the relay contact interface, and the other end of the sampling resistor is grounded;
one end of the load unit is connected with the relay contact interface, and the other end of the load unit is connected with a test power supply; when the contact of the relay to be tested is closed, the load unit is conducted with the sampling resistor; when the contact of the relay to be tested is disconnected, the load unit and the sampling resistor are disconnected;
the subtracting circuit comprises an enabling end, a first input end, a second input end and an output end, wherein the enabling end is connected with the first waveform generator and is used for enabling operation according to a signal received by the enabling end, the first input end is connected with one end of the load unit, which is connected with the relay contact, the second input end is connected with one end of the sampling resistor, which is connected with the relay contact, and the output end of the subtracting circuit when the enabling end is enabled is the electric signal input by the first input end minus the electric signal input by the second input end;
the comparator comprises a first input end, a second input end and an output end, wherein the first input end of the comparator is connected with the output end of the subtracting circuit, the second input end of the comparator is used for inputting a comparison electric signal, and the output end of the comparator is used for outputting a first signal when the electric signal input by the first input end of the comparator is larger than the comparison electric signal;
the prompting unit is connected with the output end of the comparator and is used for prompting when the first signal is received;
the first counter is connected with the output end of the comparator and is used for counting the times of receiving the first signal;
a second waveform generator for outputting a second test signal;
a first selection switch connecting the second waveform generator to the relay coil interface in a first state and connecting the first waveform generator to the relay coil interface in a second state;
a second selection switch, wherein one end of the load unit connected with the relay contact interface is connected with the first counter without being connected with the first input end of the subtracting circuit in a third state, and one end of the load unit connected with the relay contact interface is connected with the first input end of the subtracting circuit in a fourth state;
the second counter is connected with the second waveform generator and is used for counting the cycle number of the second test signal;
a third selection switch, which connects the first counter to the second selection switch but not to the output terminal of the comparator in a fifth state, and connects the first counter to the output terminal of the comparator in a sixth state;
a function selecting circuit that causes the first selecting switch to be in the first state, the second selecting switch to be in the third state, and the third selecting switch to be in the fifth state when a first function is selected; the first selection switch is in the second state, the second selection switch is in the fourth state, and the third selection switch is in the sixth state when the second function is selected.
2. The relay testing apparatus of claim 1, further comprising:
the input end of the first amplifying circuit is connected with the output end of the subtracting circuit, and the output end of the first amplifying circuit is connected with the first input end of the comparator;
the input end of the second amplifying circuit is connected with one end of the sampling resistor, which is connected with the relay contact interface, and the output end of the second amplifying circuit is connected with the second input end of the comparator;
the ratio of the amplification factor of the first amplification circuit to the amplification factor of the second amplification circuit is not larger than the ratio of the resistance value of the sampling resistor to the expected on-resistance value of the contact of the relay to be tested.
3. The relay test device according to claim 2, wherein the range of amplification of the first amplification circuit is 100 to 500, and the range of amplification of the second amplification circuit is 10 to 50.
4. The relay test device of claim 1, further comprising a delay circuit disposed between the first waveform generator and an enable terminal of the subtracting circuit for delaying the subtracting circuit from an enable signal in the first test signal.
5. The relay testing apparatus of claim 2, further comprising:
the input end of the waveform delay circuit is connected with the first waveform generator;
the AND gate comprises a first input end, a second input end and an output end, wherein the first input end of the AND gate is connected with the first waveform generator, the second input end of the AND gate is connected with the output end of the waveform delay circuit, and the output end of the AND gate is connected with the enabling end of the subtracting circuit.
6. The relay testing apparatus of claim 1, further comprising a driving circuit, wherein an output of the driving circuit is connected to the relay coil interface, for driving the contacts of the relay to be tested to open and close according to the first test signal.
7. The relay testing apparatus of claim 6, further comprising a diode, wherein a positive electrode of the diode is grounded and a negative electrode of the diode is connected to an output terminal of the driving circuit.
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| CN202211093890.6A CN116106731B (en) | 2022-09-08 | 2022-09-08 | Relay testing device |
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| CN202211093890.6A CN116106731B (en) | 2022-09-08 | 2022-09-08 | Relay testing device |
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