CN116093734A - Laser chip aging monitoring device based on double MPDs (MPDs) monitoring - Google Patents

Laser chip aging monitoring device based on double MPDs (MPDs) monitoring Download PDF

Info

Publication number
CN116093734A
CN116093734A CN202211730471.9A CN202211730471A CN116093734A CN 116093734 A CN116093734 A CN 116093734A CN 202211730471 A CN202211730471 A CN 202211730471A CN 116093734 A CN116093734 A CN 116093734A
Authority
CN
China
Prior art keywords
gold
laser chip
mpd
chip
plated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202211730471.9A
Other languages
Chinese (zh)
Inventor
刘强
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
O Net Technologies Shenzhen Group Co Ltd
Original Assignee
O Net Technologies Shenzhen Group Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by O Net Technologies Shenzhen Group Co Ltd filed Critical O Net Technologies Shenzhen Group Co Ltd
Priority to CN202211730471.9A priority Critical patent/CN116093734A/en
Publication of CN116093734A publication Critical patent/CN116093734A/en
Pending legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/0014Measuring characteristics or properties thereof
    • H01S5/0021Degradation or life time measurements

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Semiconductor Lasers (AREA)

Abstract

本发明涉及激光器芯片检测领域,具体涉及一种基于双MPD监控的激光器芯片老化监控装置。所述激光器芯片老化监控装置包括激光芯片载体、MPD芯片载体、耦合透镜支架和基座;其中,所述激光芯片载体和两MPD芯片载体分别并列设置在基座上;所述耦合透镜支架包括两个支脚;所述MPD芯片载体上装载有MPD芯片,所述激光芯片载体上装载有待监控的激光器芯片。本发明的有益效果在于,与现有技术相比,本发明提供一种激光器芯片老化监控装置,快速、便捷、准确实现激光器芯片的老化监控,为选型待测激光器芯片提供了老化功能和测试功能。

Figure 202211730471

The invention relates to the field of laser chip detection, in particular to a laser chip aging monitoring device based on dual MPD monitoring. The laser chip aging monitoring device includes a laser chip carrier, an MPD chip carrier, a coupling lens holder and a base; wherein, the laser chip carrier and two MPD chip carriers are respectively arranged side by side on the base; the coupling lens holder includes two The MPD chip carrier is loaded with an MPD chip, and the laser chip carrier is loaded with a laser chip to be monitored. The beneficial effect of the present invention is that, compared with the prior art, the present invention provides a laser chip aging monitoring device, which can quickly, conveniently and accurately realize the aging monitoring of the laser chip, and provide aging function and testing for the type selection of the laser chip to be tested. Function.

Figure 202211730471

Description

一种基于双MPD监控的激光器芯片老化监控装置A laser chip aging monitoring device based on dual MPD monitoring

技术领域technical field

本发明涉及激光器芯片检测领域,具体涉及一种基于双MPD监控的激光器芯片老化监控装置。The invention relates to the field of laser chip detection, in particular to a laser chip aging monitoring device based on dual MPD monitoring.

背景技术Background technique

在光通信产品开发中,经常要对激光器芯片进行选型,需要验证不同厂商的激光器芯片,或者同一厂商的不同款式的激光器芯片。In the development of optical communication products, it is often necessary to select laser chips, and it is necessary to verify laser chips from different manufacturers, or different styles of laser chips from the same manufacturer.

现在的检测装置,一方面难以兼顾老化和监控功能,另一方面激光器芯片的拆装也非常麻烦,不利于推广。The current detection device, on the one hand, is difficult to take into account the aging and monitoring functions, and on the other hand, the disassembly and assembly of the laser chip is also very troublesome, which is not conducive to popularization.

发明内容Contents of the invention

本发明要解决的技术问题在于,针对现有技术的上述缺陷,提供一种基于双MPD监控的激光器芯片老化监控装置,解决一方面难以兼顾老化和监控功能,另一方面激光器芯片的拆装也非常麻烦,不利于推广的问题。The technical problem to be solved by the present invention is to provide a laser chip aging monitoring device based on dual MPD monitoring in view of the above-mentioned defects of the prior art, which solves the problem that it is difficult to take care of aging and monitoring functions on the one hand, and that the disassembly and assembly of the laser chip is difficult on the other hand. Very troublesome, not conducive to the problem of promotion.

本发明解决其技术问题所采用的技术方案是:提供一种基于双MPD监控的激光器芯片老化监控装置,激光器芯片老化监控装置包括激光芯片载体、MPD芯片载体、耦合透镜支架和基座;其中,The technical solution adopted by the present invention to solve the technical problem is: provide a laser chip aging monitoring device based on dual MPD monitoring, the laser chip aging monitoring device includes a laser chip carrier, an MPD chip carrier, a coupling lens bracket and a base; wherein,

激光芯片载体和两MPD芯片载体分别并列设置在基座上,且激光芯片载体设置在两MPD芯片载体之间;The laser chip carrier and the two MPD chip carriers are respectively arranged side by side on the base, and the laser chip carrier is arranged between the two MPD chip carriers;

耦合透镜支架包括两个支脚,两支脚上均设置有耦合透镜,并固设在基座上且分别设置在激光芯片载体和一MPD芯片载体之间;The coupling lens bracket includes two legs, and the coupling lenses are arranged on the two legs, and are fixed on the base and respectively arranged between the laser chip carrier and an MPD chip carrier;

MPD芯片载体上装载有MPD芯片,激光芯片载体上装载有待监控的激光器芯片,激光器芯片在通电后产生激光光束并分别向前后两个方向发射,一光束经过一耦合透镜耦合至一MPD芯片上,且另一光束经过另一耦合透镜耦合至另一MPD芯片上。The MPD chip carrier is loaded with an MPD chip, and the laser chip carrier is loaded with a laser chip to be monitored. After the laser chip is powered on, it generates a laser beam and emits it in two directions, forward and backward. One beam is coupled to an MPD chip through a coupling lens. And another light beam is coupled to another MPD chip through another coupling lens.

其中,较佳方案是:基座上设置有作为激光器芯片电信号线路的第一镀金走线和第二镀金走线,激光器芯片的两焊盘通过金丝绑定至第一镀金走线和第二镀金走线上;或者,激光芯片载体设置有第一导电层,激光器芯片的一焊盘与第一导电层连接,且通过金丝绑定至第一镀金走线,激光器芯片的另一焊盘通过金丝绑定至第二镀金走线上。Among them, the preferred solution is: the base is provided with the first gold-plated wiring and the second gold-plated wiring as the electrical signal line of the laser chip, and the two pads of the laser chip are bound to the first gold-plated wiring and the second gold-plated wiring through gold wires. On the second gold-plated wiring; or, the laser chip carrier is provided with a first conductive layer, a pad of the laser chip is connected to the first conductive layer, and is bound to the first gold-plated wiring by a gold wire, and the other welding pad of the laser chip is connected to the first conductive layer. The pad is bonded to a second gold-plated trace with gold wire.

其中,较佳方案是:基座上设置有作为MPD芯片采集线路的第三镀金走线和第四镀金走线,MPD芯片载体布设有第五镀金走线和第六镀金走线,MPD芯片的两个焊盘通过金丝绑定至第五镀金走线和第六镀金走线上,MPD芯片载体固设至基座时将第五镀金走线与第三镀金走线连接,且将第六镀金走线与第四镀金走线连接。Wherein, the preferred scheme is: the base is provided with the third gold-plated wiring and the fourth gold-plated wiring as the MPD chip acquisition circuit, the MPD chip carrier is provided with the fifth gold-plated wiring and the sixth gold-plated wiring, the MPD chip The two pads are bound to the fifth gold-plated trace and the sixth gold-plated trace through gold wires. When the MPD chip carrier is fixed to the base, the fifth gold-plated trace is connected to the third gold-plated trace, and the sixth The gold-plated trace is connected to the fourth gold-plated trace.

其中,较佳方案是:MPD芯片载体固设至基座时将第五镀金走线与第三镀金走线通过导电胶水连接,且将第六镀金走线与第四镀金走线通过导电胶水连接。Among them, the preferred solution is: when the MPD chip carrier is fixed to the base, the fifth gold-plated wiring is connected to the third gold-plated wiring through conductive glue, and the sixth gold-plated wiring is connected to the fourth gold-plated wiring through conductive glue. .

其中,较佳方案是:MPD芯片载体包括与基座固设的第一端面和安装MPD芯片的第二端面,第一端面和第二端面为垂直的两个端面,第五镀金走线和第六镀金走线均沿着第一端面和第二端面布设。Among them, the preferred solution is: the MPD chip carrier includes a first end face fixed with the base and a second end face for installing the MPD chip, the first end face and the second end face are two vertical end faces, the fifth gold-plated wiring and the second end face The six gold-plated traces are all routed along the first end surface and the second end surface.

其中,较佳方案是:耦合透镜支架为U型结构,支脚为U型结构的两侧边,支脚上设置有安装孔位,耦合透镜安装至安装孔位内或孔口处;其中,MPD芯片的接收端面、耦合透镜和激光器芯片的射出端口处于同一直线上。Among them, the preferred solution is: the coupling lens bracket is a U-shaped structure, the legs are the two sides of the U-shaped structure, mounting holes are provided on the legs, and the coupling lens is installed in the mounting hole or at the hole; wherein, the MPD chip The receiving end face, the coupling lens and the emitting port of the laser chip are on the same straight line.

其中,较佳方案是:支脚朝向激光芯片载体的方向设置有准直透镜,耦合透镜设置在支脚朝向MPD芯片载体的方向上。Among them, a preferred solution is: a collimating lens is arranged in the direction of the support feet facing the laser chip carrier, and a coupling lens is arranged in the direction of the support feet facing the MPD chip carrier.

其中,较佳方案是:激光器芯片的正向出光和背向出光的出光比例为X:Y;其中,X/Y大于1。Among them, the preferred solution is: the ratio of the forward light emission and the back light emission of the laser chip is X:Y; wherein, X/Y is greater than 1.

本发明的有益效果在于,与现有技术相比,本发明提供一种激光器芯片老化监控装置,快速、便捷、准确实现激光器芯片的老化监控,为选型待测激光器芯片提供了老化功能和测试功能。The beneficial effect of the present invention is that, compared with the prior art, the present invention provides a laser chip aging monitoring device, which can quickly, conveniently and accurately realize the aging monitoring of the laser chip, and provide aging function and testing for the type selection of the laser chip to be tested. Function.

附图说明Description of drawings

下面将结合附图及实施例对本发明作进一步说明,附图中:The present invention will be further described below in conjunction with accompanying drawing and embodiment, in the accompanying drawing:

图1是本发明激光器芯片老化监控装置的结构示意图;Fig. 1 is a schematic structural view of a laser chip aging monitoring device of the present invention;

图2是本发明激光器芯片老化监控装置的侧面结构示意图;Fig. 2 is a side structural schematic diagram of a laser chip aging monitoring device of the present invention;

图3是本发明激光芯片载体和激光器芯片的结构示意图;Fig. 3 is the structural representation of laser chip carrier and laser chip of the present invention;

图4是本发明MPD芯片载体和MPD芯片的结构示意图;Fig. 4 is the structural representation of MPD chip carrier and MPD chip of the present invention;

图5是本发明耦合透镜支架的结构示意图;Fig. 5 is a structural schematic diagram of the coupling lens holder of the present invention;

图6是本发明基座的结构示意图。Fig. 6 is a schematic structural view of the base of the present invention.

具体实施方式Detailed ways

现结合附图,对本发明的较佳实施例作详细说明。Now in conjunction with the accompanying drawings, the preferred embodiments of the present invention will be described in detail.

如图1和图2所示,本发明提供一种激光器芯片120老化监控装置的优选方案。As shown in FIG. 1 and FIG. 2 , the present invention provides a preferred solution of an aging monitoring device for a laser chip 120 .

一种基于双MPD监控的激光器芯片120老化监控装置,激光器芯片120老化监控装置包括激光芯片载体110、MPD芯片载体210、耦合透镜支架300和基座400;其中,激光芯片载体110和两MPD芯片载体210分别并列设置在基座400上,且激光芯片载体110设置在两MPD芯片载体210之间;耦合透镜支架300包括两个支脚310,两支脚310上均设置有耦合透镜311,并固设在基座400上且分别设置在激光芯片载体110和一MPD芯片载体210之间;MPD芯片载体210上装载有MPD芯片220,激光芯片载体110上装载有待监控的激光器芯片120,激光器芯片120在通电后产生激光光束并分别向前后两个方向发射,一光束经过一耦合透镜311耦合至一MPD芯片220上,且另一光束经过另一耦合透镜311耦合至另一MPD芯片220上。A laser chip 120 aging monitoring device based on dual MPD monitoring, the laser chip 120 aging monitoring device includes a laser chip carrier 110, an MPD chip carrier 210, a coupling lens holder 300 and a base 400; wherein, the laser chip carrier 110 and two MPD chips The carriers 210 are arranged side by side on the base 400 respectively, and the laser chip carrier 110 is arranged between the two MPD chip carriers 210; the coupling lens holder 300 includes two legs 310, and the coupling lens 311 is arranged on the two legs 310, and fixed On the base 400 and respectively arranged between the laser chip carrier 110 and an MPD chip carrier 210; the MPD chip carrier 210 is loaded with the MPD chip 220, the laser chip carrier 110 is loaded with the laser chip 120 to be monitored, and the laser chip 120 is placed on After electrification, laser beams are generated and emitted in forward and backward directions respectively. One beam is coupled to an MPD chip 220 through a coupling lens 311 , and the other beam is coupled to another MPD chip 220 through another coupling lens 311 .

具体地,先将待监控的激光器芯片120安装至激光芯片载体110上,作为激光器芯片120老化监控装置的老化监控对象,实现老化功能和测试功能,具体可以是对激光器芯片120进行加电老化,同时,对激光器芯片120进行各项所需参数的测试,通过MPD芯片220获取发出激光的参数,获取性能参数变化情况,例如,给激光器芯片120持续加电,在特定的电流下连续工作特定的时间,有的要求在特定温度下进行,这个过程称为激光器芯片120的老化,通过老化,激光器芯片120的性能(比如发光功率,阈值电流等等参数)都会发生变化,或者裂化。当然,老化测试属于常规测试方案,本发明的主要改进点在于提供一种激光器芯片120老化监控装置,快速、便捷、准确实现激光器芯片120的老化监控,为选型待测激光器芯片120提供了老化功能和测试功能。Specifically, the laser chip 120 to be monitored is installed on the laser chip carrier 110 first, as the aging monitoring object of the laser chip 120 aging monitoring device, to realize the aging function and testing function, specifically, the laser chip 120 can be energized and aged, At the same time, the laser chip 120 is tested for various required parameters, the parameters of the laser are obtained through the MPD chip 220, and the changes in performance parameters are obtained. Time, some require to be carried out at a specific temperature, this process is called the aging of the laser chip 120, through aging, the performance of the laser chip 120 (such as luminous power, threshold current and other parameters) will change or crack. Of course, the aging test belongs to the conventional testing scheme, and the main improvement of the present invention is to provide a laser chip 120 aging monitoring device, which can quickly, conveniently and accurately realize the aging monitoring of the laser chip 120, and provide aging control for the type selection of the laser chip 120 to be tested. function and test function.

利用基座400作为各功能部件的固定和电连接,激光芯片载体110和两MPD芯片载体210分别并列设置在基座400上,且激光芯片载体110设置在两MPD芯片载体210之间,基座400上设置有各种走线结构,分别与激光芯片载体110上的激光器芯片120进行电连接,为激光器芯片120持续加电,从而实现激光器芯片120通电后产生激光;另一方面,不断获取MPD芯片220的采集信号,MPD芯片220获取激光器芯片120发出的激光光束,从而判断激光器芯片120的参数变化。其中,MPD即为监视器光电二极管,激光器芯片120的激光光束入射至MPD的光接收端面221后,获取激光内部的参数,如光功率。Using the base 400 as the fixing and electrical connection of each functional component, the laser chip carrier 110 and the two MPD chip carriers 210 are arranged side by side on the base 400 respectively, and the laser chip carrier 110 is arranged between the two MPD chip carriers 210, and the base 400 is provided with various routing structures, which are respectively electrically connected to the laser chip 120 on the laser chip carrier 110, and continuously powers up the laser chip 120, so that the laser chip 120 can generate laser light after power-on; on the other hand, the MPD is continuously obtained The signal collected by the chip 220 , the MPD chip 220 obtains the laser beam emitted by the laser chip 120 , so as to judge the parameter change of the laser chip 120 . Wherein, the MPD is a monitor photodiode. After the laser beam of the laser chip 120 is incident on the light-receiving end surface 221 of the MPD, internal parameters of the laser, such as optical power, are obtained.

以及,为了便于光路设置和光汇聚,即激光器芯片120的激光光束汇聚至MPD芯片220上,通过耦合透镜支架300建立激光器芯片120和MPD芯片220之间的光路路径。根据两个MPD芯片220和激光器芯片120的相对位置距离,构建耦合透镜支架300的两个支脚310的位置,从而通过耦合透镜支架300直接设置两个光学路径,即将耦合透镜支架300的两个支脚310分别插入激光器芯片120和任一一个MPD芯片220之间,使激光器芯片120、支脚310和MPD芯片220处于一直线上,优选地,两个MPD芯片220、两个支脚310和激光器芯片120均设置在一直线上。And, in order to facilitate optical path setting and light convergence, that is, the laser beam of the laser chip 120 is converged onto the MPD chip 220 , the optical path between the laser chip 120 and the MPD chip 220 is established through the coupling lens holder 300 . According to the relative position distance of the two MPD chips 220 and the laser chip 120, the positions of the two feet 310 of the coupling lens holder 300 are constructed, so that two optical paths are directly set through the coupling lens holder 300, that is, the two feet of the coupling lens holder 300 310 are respectively inserted between the laser chip 120 and any one MPD chip 220, so that the laser chip 120, the legs 310 and the MPD chip 220 are in a straight line, preferably, two MPD chips 220, two legs 310 and the laser chip 120 are set on a straight line.

具体工作方式如下:激光器芯片120安装至激光芯片载体110上后,其他功能模块也安装完成,即激光芯片载体110、MPD芯片载体210、耦合透镜支架300均设置在基座400上且电路连接也设置完成,基座400与外部的相关检测器件和电源连接,为激光器芯片120持续加电和检测MPD芯片220所采集的参数数据;以及,激光器芯片120通电后产生两束激光光束,分别从激光器芯片120的前后两个激光发射端口向外发射,一光束经过一耦合透镜311耦合至一MPD芯片220上,且另一光束经过另一耦合透镜311耦合至另一MPD芯片220上,通过获取两个MPD芯片220的参数信息,从而获取两束激光的参数变化情况。The specific working method is as follows: after the laser chip 120 is installed on the laser chip carrier 110, other functional modules are also installed, that is, the laser chip carrier 110, the MPD chip carrier 210, and the coupling lens holder 300 are all arranged on the base 400 and the circuit connections are also completed. After the setting is completed, the base 400 is connected to the relevant external detection devices and power supply, continuously powers up the laser chip 120 and detects the parameter data collected by the MPD chip 220; The front and rear two laser emission ports of the chip 120 emit outwards, one light beam is coupled to an MPD chip 220 through a coupling lens 311, and the other light beam is coupled to another MPD chip 220 through another coupling lens 311, by obtaining two parameter information of each MPD chip 220, so as to obtain the parameter changes of the two laser beams.

在一个实施例中,激光器芯片120的正向出光和背向出光的出光比例为X:Y;其中,X/Y大于1。优选地,激光器芯片120的正向出光和背向出光的出光比例为7:3,出光功率较大的就是正向出光。这是激光器芯片120特性导致的,同时由于激光器芯片120的特性采用本申请的双MPD芯片220设置,实现双激光光束同时监控。进一步的,可根据出光比例适当调整两个MPD芯片220的光敏感性,提高检测精度。In one embodiment, the light emitting ratio of the laser chip 120 from the forward direction to the rear direction is X:Y; wherein, X/Y is greater than 1. Preferably, the light output ratio of the laser chip 120 is 7:3, and the output power of the laser chip 120 is the forward output light. This is caused by the characteristics of the laser chip 120, and because of the characteristics of the laser chip 120, the double MPD chip 220 of the present application is used to monitor the dual laser beams simultaneously. Further, the photosensitivity of the two MPD chips 220 can be properly adjusted according to the ratio of light emitted to improve detection accuracy.

如图3和图6所示,本发明提供基座400上设置第一镀金走线410和第二镀金走线420的较佳实施例。As shown in FIG. 3 and FIG. 6 , the present invention provides a preferred embodiment in which a first gold-plated trace 410 and a second gold-plated trace 420 are disposed on the base 400 .

基座400上设置有作为激光器芯片120电信号线路的第一镀金走线410和第二镀金走线420,通过第一镀金走线410和第二镀金走线420实现外部控制电路与激光器芯片120之间的电连接,具体提供两套连接方案。The base 400 is provided with a first gold-plated wiring 410 and a second gold-plated wiring 420 as the electrical signal lines of the laser chip 120, and the external control circuit and the laser chip 120 are realized through the first gold-plated wiring 410 and the second gold-plated wiring 420. Specifically provide two sets of connection schemes for the electrical connection between them.

方案一,激光器芯片120的两焊盘通过金丝绑定至第一镀金走线410和第二镀金走线420上,金丝绑定表示通过黄金支撑的线丝实现两个导电体之间的连接,通过金丝实现激光器芯片120的两焊盘分别与对应的第一镀金走线410和第二镀金走线420连接,通过金丝绑定提高导电效率,也便于连接操作。Option 1, the two pads of the laser chip 120 are bound to the first gold-plated wiring 410 and the second gold-plated wiring 420 through gold wires. For connection, the two pads of the laser chip 120 are respectively connected to the corresponding first gold-plated wiring 410 and the second gold-plated wiring 420 through gold wires, and the conductive efficiency is improved through gold wire binding, which is also convenient for connection operations.

方案二,激光芯片载体110设置有第一导电层,激光器芯片120的一焊盘与第一导电层连接,且通过金丝绑定至第一镀金走线410,激光器芯片120的另一焊盘通过金丝绑定至第二镀金走线420上。相对于方案一,方案二是将激光芯片载体110作为一个导体,通过设置第一导电层先与激光器芯片120的一个焊盘121连接,在实际连接过程中,提高两个金丝绑定的距离,便于金丝的绑定和放置两个金丝之间产生干扰。Solution 2, the laser chip carrier 110 is provided with a first conductive layer, a pad of the laser chip 120 is connected to the first conductive layer, and is bound to the first gold-plated wiring 410 through a gold wire, and the other pad of the laser chip 120 is It is bound to the second gold-plated trace 420 through a gold wire. Compared with the first solution, the second solution is to use the laser chip carrier 110 as a conductor, and connect the first conductive layer to a pad 121 of the laser chip 120 by setting the first conductive layer, and increase the distance between the two gold wires during the actual connection process. , to facilitate the binding of gold wires and place interference between two gold wires.

如图4和图6所示,本发明提供基座400上设置第三镀金走线430和第四镀金走线440的较佳实施例。As shown in FIG. 4 and FIG. 6 , the present invention provides a preferred embodiment in which a third gold-plated trace 430 and a fourth gold-plated trace 440 are disposed on the base 400 .

基座400上设置有作为MPD芯片220采集线路的第三镀金走线430和第四镀金走线440,MPD芯片载体210布设有第五镀金走线231和第六镀金走线232,MPD芯片220的两个焊盘通过金丝10绑定至第五镀金走线231和第六镀金走线232上,MPD芯片载体210固设至基座400时将第五镀金走线231与第三镀金走线430连接,且将第六镀金走线232与第四镀金走线440连接。The base 400 is provided with the third gold-plated wiring 430 and the fourth gold-plated wiring 440 as the acquisition circuit of the MPD chip 220, the MPD chip carrier 210 is provided with the fifth gold-plated wiring 231 and the sixth gold-plated wiring 232, and the MPD chip 220 The two pads are bound to the fifth gold-plated wire 231 and the sixth gold-plated wire 232 through the gold wire 10, and when the MPD chip carrier 210 is fixed to the base 400, the fifth gold-plated wire 231 and the third gold-plated wire The wire 430 is connected, and connects the sixth gold-plated wire 232 with the fourth gold-plated wire 440 .

由于激光器芯片120是不断更换的,以测试不同的激光器芯片120,故激光器芯片120更换后还需要金丝绑定比较合适,而MPD芯片载体210和MPD芯片220是测试过程所必须的结构,故并非必要拆装结构,因此在实际使用过程中,MPD芯片载体210可直接设置第五镀金走线231和第六镀金走线232,MPD芯片220的两个焊盘通过金丝10绑定至第五镀金走线231和第六镀金走线232上,MPD芯片载体210通过第五镀金走线231直接与第三镀金走线430连接,且通过第六镀金走线232与第四镀金走线440连接,实现MPD芯片220与第三镀金走线430和第四镀金走线440进行连接,实现数据的采集。Since the laser chip 120 is constantly replaced to test different laser chips 120, it is more appropriate to need gold wire bonding after the laser chip 120 is replaced, and the MPD chip carrier 210 and the MPD chip 220 are necessary structures for the testing process, so It is not necessary to disassemble the structure, so in actual use, the MPD chip carrier 210 can be directly provided with the fifth gold-plated wiring 231 and the sixth gold-plated wiring 232, and the two pads of the MPD chip 220 are bound to the sixth gold-plated wiring through the gold wire 10. On the fifth gold-plated wire 231 and the sixth gold-plated wire 232, the MPD chip carrier 210 is directly connected to the third gold-plated wire 430 through the fifth gold-plated wire 231, and is connected to the fourth gold-plated wire 440 through the sixth gold-plated wire 232. The connection is to realize the connection between the MPD chip 220 and the third gold-plated wire 430 and the fourth gold-plated wire 440 to realize data collection.

在一个实施例中,MPD芯片载体210固设至基座400时将第五镀金走线231与第三镀金走线430通过导电胶水连接,且将第六镀金走线232与第四镀金走线440通过导电胶水连接,导电胶水优选为银胶,采用贴片方式贴合,提高两者的电连接性能,采用此方式,只要将MPD芯片载体210和MPD芯片220两者连接固定好,后续只要着重要装MPD芯片载体210即可,整体安装方式较为简单、快捷和方便。In one embodiment, when the MPD chip carrier 210 is fixed to the base 400, the fifth gold-plated wire 231 and the third gold-plated wire 430 are connected by conductive glue, and the sixth gold-plated wire 232 is connected to the fourth gold-plated wire. 440 is connected by conductive glue, the conductive glue is preferably silver glue, and it is pasted by a patch method to improve the electrical connection performance of the two. In this way, as long as the MPD chip carrier 210 and the MPD chip 220 are connected and fixed, the follow-up only needs to It only needs to install the MPD chip carrier 210, and the overall installation method is relatively simple, fast and convenient.

在一个实施例中,MPD芯片载体210包括与基座400固设的第一端面和安装MPD芯片220的第二端面,第一端面和第二端面为垂直的两个端面,第五镀金走线231和第六镀金走线232均沿着第一端面和第二端面布设。通过使第五镀金走线231和第六镀金走线232均沿着两个垂直的端面布设,在MPD芯片载体210固定时就可以直接实现贴片安装,同时,MPD芯片220也可以竖立放置,使激光器芯片120的激光光束准确无误入射至MPD芯片220的光接收端面221上。In one embodiment, the MPD chip carrier 210 includes a first end surface fixed to the base 400 and a second end surface on which the MPD chip 220 is mounted, the first end surface and the second end surface are two vertical end surfaces, and the fifth gold-plated wiring 231 and the sixth gold-plated wiring 232 are both laid along the first end surface and the second end surface. By making the fifth gold-plated wires 231 and the sixth gold-plated wires 232 be arranged along two vertical end faces, patch mounting can be directly realized when the MPD chip carrier 210 is fixed, and at the same time, the MPD chip 220 can also be placed upright. The laser beam of the laser chip 120 is accurately incident on the light-receiving end surface 221 of the MPD chip 220 .

如图5所示,本发明提供耦合透镜支架300为U型结构的较佳实施例。As shown in FIG. 5 , the present invention provides a preferred embodiment in which the coupling lens holder 300 is a U-shaped structure.

耦合透镜支架300为U型结构,支脚310为U型结构的两侧边,支脚310上设置有安装孔位,耦合透镜311安装至安装孔位内或孔口处;其中,MPD芯片220的光接收端面221、耦合透镜311和激光器芯片120的射出端口处于同一直线上。耦合透镜支架300的设置,便于整体光路的直接建立,特别是在更换激光器芯片120时,便于拆装。The coupling lens holder 300 is a U-shaped structure, and the legs 310 are the two sides of the U-shaped structure. Mounting holes are provided on the legs 310, and the coupling lens 311 is installed in the mounting holes or at the opening; wherein, the light of the MPD chip 220 The receiving end face 221 , the coupling lens 311 and the output port of the laser chip 120 are on the same straight line. The arrangement of the coupling lens holder 300 facilitates the direct establishment of the overall optical path, especially when replacing the laser chip 120 , it is convenient for disassembly and assembly.

支脚310朝向激光芯片载体110的方向设置有准直透镜312,耦合透镜311设置在支脚310朝向MPD芯片载体210的方向上。具体地,激光器芯片120发送的激光光束,依次经过准直透镜312准直后,在经过耦合透镜311耦合,并入射至MPD芯片载体210的MPD芯片220上。A collimating lens 312 is disposed on the supporting leg 310 toward the laser chip carrier 110 , and a coupling lens 311 is disposed on the direction toward the MPD chip carrier 210 of the supporting leg 310 . Specifically, the laser beam sent by the laser chip 120 is sequentially collimated by the collimator lens 312 , coupled by the coupling lens 311 , and incident on the MPD chip 220 of the MPD chip carrier 210 .

以上所述者,仅为本发明最佳实施例而已,并非用于限制本发明的范围,凡依本发明申请专利范围所作的等效变化或修饰,皆为本发明所涵盖。The above are only the best embodiments of the present invention, and are not used to limit the scope of the present invention. All equivalent changes or modifications made according to the patent scope of the present invention are covered by the present invention.

Claims (8)

1.一种基于双MPD监控的激光器芯片老化监控装置,其特征在于,所述激光器芯片老化监控装置包括激光芯片载体、MPD芯片载体、耦合透镜支架和基座;其中,1. A laser chip aging monitoring device based on dual MPD monitoring, characterized in that, the laser chip aging monitoring device comprises a laser chip carrier, an MPD chip carrier, a coupling lens support and a base; wherein, 所述激光芯片载体和两MPD芯片载体分别并列设置在基座上,且所述激光芯片载体设置在两MPD芯片载体之间;The laser chip carrier and the two MPD chip carriers are respectively arranged side by side on the base, and the laser chip carrier is arranged between the two MPD chip carriers; 所述耦合透镜支架包括两个支脚,两所述支脚上均设置有耦合透镜,并固设在基座上且分别设置在激光芯片载体和一MPD芯片载体之间;The coupling lens bracket includes two legs, and the coupling lenses are arranged on the two legs, and are fixed on the base and respectively arranged between the laser chip carrier and an MPD chip carrier; 所述MPD芯片载体上装载有MPD芯片,所述激光芯片载体上装载有待监控的激光器芯片,所述激光器芯片在通电后产生激光光束并分别向前后两个方向发射,一所述光束经过一耦合透镜耦合至一MPD芯片上,且另一所述光束经过另一耦合透镜耦合至另一MPD芯片上。The MPD chip carrier is loaded with an MPD chip, and the laser chip carrier is loaded with a laser chip to be monitored. After the laser chip is powered on, the laser beam is generated and emitted in two directions forward and backward respectively. The lens is coupled to one MPD chip, and another said light beam is coupled to another MPD chip through another coupling lens. 2.根据权利要求1所述的激光器芯片老化监控装置,其特征在于:所述基座上设置有作为激光器芯片电信号线路的第一镀金走线和第二镀金走线,所述激光器芯片的两焊盘通过金丝绑定至第一镀金走线和第二镀金走线上;或者,所述激光芯片载体设置有第一导电层,所述激光器芯片的一焊盘与第一导电层连接,且通过金丝绑定至第一镀金走线,所述激光器芯片的另一焊盘通过金丝绑定至第二镀金走线上。2. The laser chip aging monitoring device according to claim 1, characterized in that: the base is provided with a first gold-plated wire and a second gold-plated wire as the electrical signal line of the laser chip, and the laser chip's The two pads are bound to the first gold-plated wiring and the second gold-plated wiring through gold wires; or, the laser chip carrier is provided with a first conductive layer, and a pad of the laser chip is connected to the first conductive layer , and is bound to the first gold-plated wiring through a gold wire, and the other pad of the laser chip is bound to the second gold-plated wiring through a gold wire. 3.根据权利要求1所述的激光器芯片老化监控装置,其特征在于:所述基座上设置有作为MPD芯片采集线路的第三镀金走线和第四镀金走线,所述MPD芯片载体布设有第五镀金走线和第六镀金走线,所述MPD芯片的两个焊盘通过金丝绑定至第五镀金走线和第六镀金走线上,所述MPD芯片载体固设至基座时将第五镀金走线与第三镀金走线连接,且将第六镀金走线与第四镀金走线连接。3. The laser chip aging monitoring device according to claim 1, characterized in that: the base is provided with the third gold-plated wiring and the fourth gold-plated wiring as the MPD chip acquisition circuit, and the MPD chip carrier is laid There are the fifth gold-plated wiring and the sixth gold-plated wiring, the two pads of the MPD chip are bound to the fifth gold-plated wiring and the sixth gold-plated wiring through gold wires, and the MPD chip carrier is fixed to the base When connecting the fifth gold-plated wire to the third gold-plated wire, and connect the sixth gold-plated wire to the fourth gold-plated wire. 4.根据权利要求3所述的激光器芯片老化监控装置,其特征在于:所述MPD芯片载体固设至基座时将第五镀金走线与第三镀金走线通过导电胶水连接,且将第六镀金走线与第四镀金走线通过导电胶水连接。4. The laser chip aging monitoring device according to claim 3, characterized in that: when the MPD chip carrier is fixed to the base, the fifth gold-plated wiring and the third gold-plated wiring are connected by conductive glue, and the second The sixth gold-plated wire is connected to the fourth gold-plated wire through conductive glue. 5.根据权利要求3或4所述的激光器芯片老化监控装置,其特征在于:所述MPD芯片载体包括与基座固设的第一端面和安装MPD芯片的第二端面,所述第一端面和第二端面为垂直的两个端面,所述第五镀金走线和第六镀金走线均沿着第一端面和第二端面布设。5. The laser chip aging monitoring device according to claim 3 or 4, characterized in that: the MPD chip carrier includes a first end face fixed to the base and a second end face for installing the MPD chip, the first end face Two end faces perpendicular to the second end face, the fifth gold-plated trace and the sixth gold-plated trace are laid along the first end face and the second end face. 6.根据权利要求1所述的激光器芯片老化监控装置,其特征在于:所述耦合透镜支架为U型结构,所述支脚为U型结构的两侧边,所述支脚上设置有安装孔位,所述耦合透镜安装至安装孔位内或孔口处;其中,所述MPD芯片的接收端面、耦合透镜和激光器芯片的射出端口处于同一直线上。6. The laser chip aging monitoring device according to claim 1, characterized in that: the coupling lens bracket is a U-shaped structure, the legs are the two sides of the U-shaped structure, and mounting holes are provided on the legs , the coupling lens is installed in the installation hole or at the hole; wherein, the receiving end surface of the MPD chip, the coupling lens and the output port of the laser chip are on the same straight line. 7.根据权利要求1或6所述的激光器芯片老化监控装置,其特征在于:所述支脚朝向激光芯片载体的方向设置有准直透镜,所述耦合透镜设置在支脚朝向MPD芯片载体的方向上。7. The laser chip aging monitoring device according to claim 1 or 6, wherein a collimating lens is arranged in the direction of the legs toward the laser chip carrier, and the coupling lens is arranged in the direction of the legs toward the MPD chip carrier . 8.根据权利要求1所述的激光器芯片老化监控装置,其特征在于:所述激光器芯片的正向出光和背向出光的出光比例为X:Y;其中,X/Y大于1。8 . The laser chip aging monitoring device according to claim 1 , characterized in that: the ratio of forward light emission and back light emission of the laser chip is X:Y; wherein X/Y is greater than 1. 9 .
CN202211730471.9A 2022-12-30 2022-12-30 Laser chip aging monitoring device based on double MPDs (MPDs) monitoring Pending CN116093734A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202211730471.9A CN116093734A (en) 2022-12-30 2022-12-30 Laser chip aging monitoring device based on double MPDs (MPDs) monitoring

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202211730471.9A CN116093734A (en) 2022-12-30 2022-12-30 Laser chip aging monitoring device based on double MPDs (MPDs) monitoring

Publications (1)

Publication Number Publication Date
CN116093734A true CN116093734A (en) 2023-05-09

Family

ID=86205772

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202211730471.9A Pending CN116093734A (en) 2022-12-30 2022-12-30 Laser chip aging monitoring device based on double MPDs (MPDs) monitoring

Country Status (1)

Country Link
CN (1) CN116093734A (en)

Similar Documents

Publication Publication Date Title
US20050214957A1 (en) Method for manufacturing a transmitting optical sub-assembly with a thermo-electric cooler therein
CN111293582A (en) an optical signal transmitter
WO2009107671A1 (en) Photoelectric conversion device
JP2010016012A (en) Photoelectric conversion device, photoelectric conversion module, and method of manufacturing photoelectric conversion device
JP2007335651A (en) Apparatus and tool for measuring optical device
JPH11103120A (en) Semiconductor laser device
CN116093734A (en) Laser chip aging monitoring device based on double MPDs (MPDs) monitoring
CN113703104B (en) Butterfly SOA device and production coupling method
CN211012847U (en) Multi-channel spectrum confocal measuring system
CN213959319U (en) Multichannel DFB laser and laser radar
CN113839301A (en) Shell assembly of high-speed optical signal emitting device and high-speed optical signal emitting device
CN103180939A (en) Photonics module and method of manufacturing
CN209860911U (en) Emitted light power monitoring device of light emitting device
CN112526681A (en) Optical transmitting and receiving integrated device based on TO encapsulation
TWI334498B (en) Integrated optical detector in semiconductor reflector
CN113824496B (en) Test method and test device for Combo optical device
CN111121633A (en) Multichannel spectral confocal measurement system and measurement method thereof
CN203204200U (en) Optical device
CN209675674U (en) A kind of 100G vertical cavity surface emitting laser light engine
CN111679179A (en) Semi-packaged detector chip testing device and method of use
US20050201668A1 (en) Method of connecting an optical element at a slope
CN115241733B (en) Heat sink structure and method for testing laser chip
JP2006310333A (en) Apparatus and method of measuring light-receiving device
CN112415676A (en) Single-mode parallel multi-channel optical engine design method
CN222167172U (en) Test device

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination