CN116093734A - Laser chip aging monitoring device based on double MPDs (MPDs) monitoring - Google Patents
Laser chip aging monitoring device based on double MPDs (MPDs) monitoring Download PDFInfo
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Abstract
本发明涉及激光器芯片检测领域,具体涉及一种基于双MPD监控的激光器芯片老化监控装置。所述激光器芯片老化监控装置包括激光芯片载体、MPD芯片载体、耦合透镜支架和基座;其中,所述激光芯片载体和两MPD芯片载体分别并列设置在基座上;所述耦合透镜支架包括两个支脚;所述MPD芯片载体上装载有MPD芯片,所述激光芯片载体上装载有待监控的激光器芯片。本发明的有益效果在于,与现有技术相比,本发明提供一种激光器芯片老化监控装置,快速、便捷、准确实现激光器芯片的老化监控,为选型待测激光器芯片提供了老化功能和测试功能。
The invention relates to the field of laser chip detection, in particular to a laser chip aging monitoring device based on dual MPD monitoring. The laser chip aging monitoring device includes a laser chip carrier, an MPD chip carrier, a coupling lens holder and a base; wherein, the laser chip carrier and two MPD chip carriers are respectively arranged side by side on the base; the coupling lens holder includes two The MPD chip carrier is loaded with an MPD chip, and the laser chip carrier is loaded with a laser chip to be monitored. The beneficial effect of the present invention is that, compared with the prior art, the present invention provides a laser chip aging monitoring device, which can quickly, conveniently and accurately realize the aging monitoring of the laser chip, and provide aging function and testing for the type selection of the laser chip to be tested. Function.
Description
技术领域technical field
本发明涉及激光器芯片检测领域,具体涉及一种基于双MPD监控的激光器芯片老化监控装置。The invention relates to the field of laser chip detection, in particular to a laser chip aging monitoring device based on dual MPD monitoring.
背景技术Background technique
在光通信产品开发中,经常要对激光器芯片进行选型,需要验证不同厂商的激光器芯片,或者同一厂商的不同款式的激光器芯片。In the development of optical communication products, it is often necessary to select laser chips, and it is necessary to verify laser chips from different manufacturers, or different styles of laser chips from the same manufacturer.
现在的检测装置,一方面难以兼顾老化和监控功能,另一方面激光器芯片的拆装也非常麻烦,不利于推广。The current detection device, on the one hand, is difficult to take into account the aging and monitoring functions, and on the other hand, the disassembly and assembly of the laser chip is also very troublesome, which is not conducive to popularization.
发明内容Contents of the invention
本发明要解决的技术问题在于,针对现有技术的上述缺陷,提供一种基于双MPD监控的激光器芯片老化监控装置,解决一方面难以兼顾老化和监控功能,另一方面激光器芯片的拆装也非常麻烦,不利于推广的问题。The technical problem to be solved by the present invention is to provide a laser chip aging monitoring device based on dual MPD monitoring in view of the above-mentioned defects of the prior art, which solves the problem that it is difficult to take care of aging and monitoring functions on the one hand, and that the disassembly and assembly of the laser chip is difficult on the other hand. Very troublesome, not conducive to the problem of promotion.
本发明解决其技术问题所采用的技术方案是:提供一种基于双MPD监控的激光器芯片老化监控装置,激光器芯片老化监控装置包括激光芯片载体、MPD芯片载体、耦合透镜支架和基座;其中,The technical solution adopted by the present invention to solve the technical problem is: provide a laser chip aging monitoring device based on dual MPD monitoring, the laser chip aging monitoring device includes a laser chip carrier, an MPD chip carrier, a coupling lens bracket and a base; wherein,
激光芯片载体和两MPD芯片载体分别并列设置在基座上,且激光芯片载体设置在两MPD芯片载体之间;The laser chip carrier and the two MPD chip carriers are respectively arranged side by side on the base, and the laser chip carrier is arranged between the two MPD chip carriers;
耦合透镜支架包括两个支脚,两支脚上均设置有耦合透镜,并固设在基座上且分别设置在激光芯片载体和一MPD芯片载体之间;The coupling lens bracket includes two legs, and the coupling lenses are arranged on the two legs, and are fixed on the base and respectively arranged between the laser chip carrier and an MPD chip carrier;
MPD芯片载体上装载有MPD芯片,激光芯片载体上装载有待监控的激光器芯片,激光器芯片在通电后产生激光光束并分别向前后两个方向发射,一光束经过一耦合透镜耦合至一MPD芯片上,且另一光束经过另一耦合透镜耦合至另一MPD芯片上。The MPD chip carrier is loaded with an MPD chip, and the laser chip carrier is loaded with a laser chip to be monitored. After the laser chip is powered on, it generates a laser beam and emits it in two directions, forward and backward. One beam is coupled to an MPD chip through a coupling lens. And another light beam is coupled to another MPD chip through another coupling lens.
其中,较佳方案是:基座上设置有作为激光器芯片电信号线路的第一镀金走线和第二镀金走线,激光器芯片的两焊盘通过金丝绑定至第一镀金走线和第二镀金走线上;或者,激光芯片载体设置有第一导电层,激光器芯片的一焊盘与第一导电层连接,且通过金丝绑定至第一镀金走线,激光器芯片的另一焊盘通过金丝绑定至第二镀金走线上。Among them, the preferred solution is: the base is provided with the first gold-plated wiring and the second gold-plated wiring as the electrical signal line of the laser chip, and the two pads of the laser chip are bound to the first gold-plated wiring and the second gold-plated wiring through gold wires. On the second gold-plated wiring; or, the laser chip carrier is provided with a first conductive layer, a pad of the laser chip is connected to the first conductive layer, and is bound to the first gold-plated wiring by a gold wire, and the other welding pad of the laser chip is connected to the first conductive layer. The pad is bonded to a second gold-plated trace with gold wire.
其中,较佳方案是:基座上设置有作为MPD芯片采集线路的第三镀金走线和第四镀金走线,MPD芯片载体布设有第五镀金走线和第六镀金走线,MPD芯片的两个焊盘通过金丝绑定至第五镀金走线和第六镀金走线上,MPD芯片载体固设至基座时将第五镀金走线与第三镀金走线连接,且将第六镀金走线与第四镀金走线连接。Wherein, the preferred scheme is: the base is provided with the third gold-plated wiring and the fourth gold-plated wiring as the MPD chip acquisition circuit, the MPD chip carrier is provided with the fifth gold-plated wiring and the sixth gold-plated wiring, the MPD chip The two pads are bound to the fifth gold-plated trace and the sixth gold-plated trace through gold wires. When the MPD chip carrier is fixed to the base, the fifth gold-plated trace is connected to the third gold-plated trace, and the sixth The gold-plated trace is connected to the fourth gold-plated trace.
其中,较佳方案是:MPD芯片载体固设至基座时将第五镀金走线与第三镀金走线通过导电胶水连接,且将第六镀金走线与第四镀金走线通过导电胶水连接。Among them, the preferred solution is: when the MPD chip carrier is fixed to the base, the fifth gold-plated wiring is connected to the third gold-plated wiring through conductive glue, and the sixth gold-plated wiring is connected to the fourth gold-plated wiring through conductive glue. .
其中,较佳方案是:MPD芯片载体包括与基座固设的第一端面和安装MPD芯片的第二端面,第一端面和第二端面为垂直的两个端面,第五镀金走线和第六镀金走线均沿着第一端面和第二端面布设。Among them, the preferred solution is: the MPD chip carrier includes a first end face fixed with the base and a second end face for installing the MPD chip, the first end face and the second end face are two vertical end faces, the fifth gold-plated wiring and the second end face The six gold-plated traces are all routed along the first end surface and the second end surface.
其中,较佳方案是:耦合透镜支架为U型结构,支脚为U型结构的两侧边,支脚上设置有安装孔位,耦合透镜安装至安装孔位内或孔口处;其中,MPD芯片的接收端面、耦合透镜和激光器芯片的射出端口处于同一直线上。Among them, the preferred solution is: the coupling lens bracket is a U-shaped structure, the legs are the two sides of the U-shaped structure, mounting holes are provided on the legs, and the coupling lens is installed in the mounting hole or at the hole; wherein, the MPD chip The receiving end face, the coupling lens and the emitting port of the laser chip are on the same straight line.
其中,较佳方案是:支脚朝向激光芯片载体的方向设置有准直透镜,耦合透镜设置在支脚朝向MPD芯片载体的方向上。Among them, a preferred solution is: a collimating lens is arranged in the direction of the support feet facing the laser chip carrier, and a coupling lens is arranged in the direction of the support feet facing the MPD chip carrier.
其中,较佳方案是:激光器芯片的正向出光和背向出光的出光比例为X:Y;其中,X/Y大于1。Among them, the preferred solution is: the ratio of the forward light emission and the back light emission of the laser chip is X:Y; wherein, X/Y is greater than 1.
本发明的有益效果在于,与现有技术相比,本发明提供一种激光器芯片老化监控装置,快速、便捷、准确实现激光器芯片的老化监控,为选型待测激光器芯片提供了老化功能和测试功能。The beneficial effect of the present invention is that, compared with the prior art, the present invention provides a laser chip aging monitoring device, which can quickly, conveniently and accurately realize the aging monitoring of the laser chip, and provide aging function and testing for the type selection of the laser chip to be tested. Function.
附图说明Description of drawings
下面将结合附图及实施例对本发明作进一步说明,附图中:The present invention will be further described below in conjunction with accompanying drawing and embodiment, in the accompanying drawing:
图1是本发明激光器芯片老化监控装置的结构示意图;Fig. 1 is a schematic structural view of a laser chip aging monitoring device of the present invention;
图2是本发明激光器芯片老化监控装置的侧面结构示意图;Fig. 2 is a side structural schematic diagram of a laser chip aging monitoring device of the present invention;
图3是本发明激光芯片载体和激光器芯片的结构示意图;Fig. 3 is the structural representation of laser chip carrier and laser chip of the present invention;
图4是本发明MPD芯片载体和MPD芯片的结构示意图;Fig. 4 is the structural representation of MPD chip carrier and MPD chip of the present invention;
图5是本发明耦合透镜支架的结构示意图;Fig. 5 is a structural schematic diagram of the coupling lens holder of the present invention;
图6是本发明基座的结构示意图。Fig. 6 is a schematic structural view of the base of the present invention.
具体实施方式Detailed ways
现结合附图,对本发明的较佳实施例作详细说明。Now in conjunction with the accompanying drawings, the preferred embodiments of the present invention will be described in detail.
如图1和图2所示,本发明提供一种激光器芯片120老化监控装置的优选方案。As shown in FIG. 1 and FIG. 2 , the present invention provides a preferred solution of an aging monitoring device for a
一种基于双MPD监控的激光器芯片120老化监控装置,激光器芯片120老化监控装置包括激光芯片载体110、MPD芯片载体210、耦合透镜支架300和基座400;其中,激光芯片载体110和两MPD芯片载体210分别并列设置在基座400上,且激光芯片载体110设置在两MPD芯片载体210之间;耦合透镜支架300包括两个支脚310,两支脚310上均设置有耦合透镜311,并固设在基座400上且分别设置在激光芯片载体110和一MPD芯片载体210之间;MPD芯片载体210上装载有MPD芯片220,激光芯片载体110上装载有待监控的激光器芯片120,激光器芯片120在通电后产生激光光束并分别向前后两个方向发射,一光束经过一耦合透镜311耦合至一MPD芯片220上,且另一光束经过另一耦合透镜311耦合至另一MPD芯片220上。A
具体地,先将待监控的激光器芯片120安装至激光芯片载体110上,作为激光器芯片120老化监控装置的老化监控对象,实现老化功能和测试功能,具体可以是对激光器芯片120进行加电老化,同时,对激光器芯片120进行各项所需参数的测试,通过MPD芯片220获取发出激光的参数,获取性能参数变化情况,例如,给激光器芯片120持续加电,在特定的电流下连续工作特定的时间,有的要求在特定温度下进行,这个过程称为激光器芯片120的老化,通过老化,激光器芯片120的性能(比如发光功率,阈值电流等等参数)都会发生变化,或者裂化。当然,老化测试属于常规测试方案,本发明的主要改进点在于提供一种激光器芯片120老化监控装置,快速、便捷、准确实现激光器芯片120的老化监控,为选型待测激光器芯片120提供了老化功能和测试功能。Specifically, the
利用基座400作为各功能部件的固定和电连接,激光芯片载体110和两MPD芯片载体210分别并列设置在基座400上,且激光芯片载体110设置在两MPD芯片载体210之间,基座400上设置有各种走线结构,分别与激光芯片载体110上的激光器芯片120进行电连接,为激光器芯片120持续加电,从而实现激光器芯片120通电后产生激光;另一方面,不断获取MPD芯片220的采集信号,MPD芯片220获取激光器芯片120发出的激光光束,从而判断激光器芯片120的参数变化。其中,MPD即为监视器光电二极管,激光器芯片120的激光光束入射至MPD的光接收端面221后,获取激光内部的参数,如光功率。Using the
以及,为了便于光路设置和光汇聚,即激光器芯片120的激光光束汇聚至MPD芯片220上,通过耦合透镜支架300建立激光器芯片120和MPD芯片220之间的光路路径。根据两个MPD芯片220和激光器芯片120的相对位置距离,构建耦合透镜支架300的两个支脚310的位置,从而通过耦合透镜支架300直接设置两个光学路径,即将耦合透镜支架300的两个支脚310分别插入激光器芯片120和任一一个MPD芯片220之间,使激光器芯片120、支脚310和MPD芯片220处于一直线上,优选地,两个MPD芯片220、两个支脚310和激光器芯片120均设置在一直线上。And, in order to facilitate optical path setting and light convergence, that is, the laser beam of the
具体工作方式如下:激光器芯片120安装至激光芯片载体110上后,其他功能模块也安装完成,即激光芯片载体110、MPD芯片载体210、耦合透镜支架300均设置在基座400上且电路连接也设置完成,基座400与外部的相关检测器件和电源连接,为激光器芯片120持续加电和检测MPD芯片220所采集的参数数据;以及,激光器芯片120通电后产生两束激光光束,分别从激光器芯片120的前后两个激光发射端口向外发射,一光束经过一耦合透镜311耦合至一MPD芯片220上,且另一光束经过另一耦合透镜311耦合至另一MPD芯片220上,通过获取两个MPD芯片220的参数信息,从而获取两束激光的参数变化情况。The specific working method is as follows: after the
在一个实施例中,激光器芯片120的正向出光和背向出光的出光比例为X:Y;其中,X/Y大于1。优选地,激光器芯片120的正向出光和背向出光的出光比例为7:3,出光功率较大的就是正向出光。这是激光器芯片120特性导致的,同时由于激光器芯片120的特性采用本申请的双MPD芯片220设置,实现双激光光束同时监控。进一步的,可根据出光比例适当调整两个MPD芯片220的光敏感性,提高检测精度。In one embodiment, the light emitting ratio of the
如图3和图6所示,本发明提供基座400上设置第一镀金走线410和第二镀金走线420的较佳实施例。As shown in FIG. 3 and FIG. 6 , the present invention provides a preferred embodiment in which a first gold-plated
基座400上设置有作为激光器芯片120电信号线路的第一镀金走线410和第二镀金走线420,通过第一镀金走线410和第二镀金走线420实现外部控制电路与激光器芯片120之间的电连接,具体提供两套连接方案。The
方案一,激光器芯片120的两焊盘通过金丝绑定至第一镀金走线410和第二镀金走线420上,金丝绑定表示通过黄金支撑的线丝实现两个导电体之间的连接,通过金丝实现激光器芯片120的两焊盘分别与对应的第一镀金走线410和第二镀金走线420连接,通过金丝绑定提高导电效率,也便于连接操作。Option 1, the two pads of the
方案二,激光芯片载体110设置有第一导电层,激光器芯片120的一焊盘与第一导电层连接,且通过金丝绑定至第一镀金走线410,激光器芯片120的另一焊盘通过金丝绑定至第二镀金走线420上。相对于方案一,方案二是将激光芯片载体110作为一个导体,通过设置第一导电层先与激光器芯片120的一个焊盘121连接,在实际连接过程中,提高两个金丝绑定的距离,便于金丝的绑定和放置两个金丝之间产生干扰。Solution 2, the
如图4和图6所示,本发明提供基座400上设置第三镀金走线430和第四镀金走线440的较佳实施例。As shown in FIG. 4 and FIG. 6 , the present invention provides a preferred embodiment in which a third gold-plated
基座400上设置有作为MPD芯片220采集线路的第三镀金走线430和第四镀金走线440,MPD芯片载体210布设有第五镀金走线231和第六镀金走线232,MPD芯片220的两个焊盘通过金丝10绑定至第五镀金走线231和第六镀金走线232上,MPD芯片载体210固设至基座400时将第五镀金走线231与第三镀金走线430连接,且将第六镀金走线232与第四镀金走线440连接。The
由于激光器芯片120是不断更换的,以测试不同的激光器芯片120,故激光器芯片120更换后还需要金丝绑定比较合适,而MPD芯片载体210和MPD芯片220是测试过程所必须的结构,故并非必要拆装结构,因此在实际使用过程中,MPD芯片载体210可直接设置第五镀金走线231和第六镀金走线232,MPD芯片220的两个焊盘通过金丝10绑定至第五镀金走线231和第六镀金走线232上,MPD芯片载体210通过第五镀金走线231直接与第三镀金走线430连接,且通过第六镀金走线232与第四镀金走线440连接,实现MPD芯片220与第三镀金走线430和第四镀金走线440进行连接,实现数据的采集。Since the
在一个实施例中,MPD芯片载体210固设至基座400时将第五镀金走线231与第三镀金走线430通过导电胶水连接,且将第六镀金走线232与第四镀金走线440通过导电胶水连接,导电胶水优选为银胶,采用贴片方式贴合,提高两者的电连接性能,采用此方式,只要将MPD芯片载体210和MPD芯片220两者连接固定好,后续只要着重要装MPD芯片载体210即可,整体安装方式较为简单、快捷和方便。In one embodiment, when the
在一个实施例中,MPD芯片载体210包括与基座400固设的第一端面和安装MPD芯片220的第二端面,第一端面和第二端面为垂直的两个端面,第五镀金走线231和第六镀金走线232均沿着第一端面和第二端面布设。通过使第五镀金走线231和第六镀金走线232均沿着两个垂直的端面布设,在MPD芯片载体210固定时就可以直接实现贴片安装,同时,MPD芯片220也可以竖立放置,使激光器芯片120的激光光束准确无误入射至MPD芯片220的光接收端面221上。In one embodiment, the
如图5所示,本发明提供耦合透镜支架300为U型结构的较佳实施例。As shown in FIG. 5 , the present invention provides a preferred embodiment in which the
耦合透镜支架300为U型结构,支脚310为U型结构的两侧边,支脚310上设置有安装孔位,耦合透镜311安装至安装孔位内或孔口处;其中,MPD芯片220的光接收端面221、耦合透镜311和激光器芯片120的射出端口处于同一直线上。耦合透镜支架300的设置,便于整体光路的直接建立,特别是在更换激光器芯片120时,便于拆装。The
支脚310朝向激光芯片载体110的方向设置有准直透镜312,耦合透镜311设置在支脚310朝向MPD芯片载体210的方向上。具体地,激光器芯片120发送的激光光束,依次经过准直透镜312准直后,在经过耦合透镜311耦合,并入射至MPD芯片载体210的MPD芯片220上。A
以上所述者,仅为本发明最佳实施例而已,并非用于限制本发明的范围,凡依本发明申请专利范围所作的等效变化或修饰,皆为本发明所涵盖。The above are only the best embodiments of the present invention, and are not used to limit the scope of the present invention. All equivalent changes or modifications made according to the patent scope of the present invention are covered by the present invention.
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