CN116054869B - Integrated signal combiner - Google Patents
Integrated signal combiner Download PDFInfo
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- CN116054869B CN116054869B CN202310331831.6A CN202310331831A CN116054869B CN 116054869 B CN116054869 B CN 116054869B CN 202310331831 A CN202310331831 A CN 202310331831A CN 116054869 B CN116054869 B CN 116054869B
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B1/00—Details of transmission systems, not covered by a single one of groups H04B3/00 - H04B13/00; Details of transmission systems not characterised by the medium used for transmission
- H04B1/38—Transceivers, i.e. devices in which transmitter and receiver form a structural unit and in which at least one part is used for functions of transmitting and receiving
- H04B1/40—Circuits
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B1/00—Details of transmission systems, not covered by a single one of groups H04B3/00 - H04B13/00; Details of transmission systems not characterised by the medium used for transmission
- H04B1/02—Transmitters
- H04B1/04—Circuits
- H04B1/0458—Arrangements for matching and coupling between power amplifier and antenna or between amplifying stages
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B1/00—Details of transmission systems, not covered by a single one of groups H04B3/00 - H04B13/00; Details of transmission systems not characterised by the medium used for transmission
- H04B1/06—Receivers
- H04B1/16—Circuits
- H04B1/18—Input circuits, e.g. for coupling to an antenna or a transmission line
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/0082—Monitoring; Testing using service channels; using auxiliary channels
- H04B17/0085—Monitoring; Testing using service channels; using auxiliary channels using test signal generators
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02D30/00—Reducing energy consumption in communication networks
- Y02D30/70—Reducing energy consumption in communication networks in wireless communication networks
Abstract
The application relates to the technical field of wireless communication, in particular to an integrated signal combiner which comprises a duplexer, an electric bridge, a main-stage amplifier, a grading amplifier, a first output amplifier, a second output amplifier, a test signal transmitter, a time sequence controller, a test signal receiver, a test signal analysis circuit and an intermediate frequency board. The application can accurately determine the damage condition of the amplifying circuit. In a specific test, the application can detect whether the test signal is abnormal or not by selecting two test time points t1 and t2, so that whether the corresponding amplifier is abnormal or not can be judged, and whether the signal between the test time points t1 and t2 is abnormal or not can be also judged.
Description
Technical Field
The application relates to the technical field of wireless communication, in particular to an integrated signal combiner.
Background
In the prior art, a power amplifier is usually disposed between a combiner and an antenna, where the power amplifier is used for amplifying uplink and downlink signals of radio frequencies, for example, a related art representative of this type of technology is disclosed in patent document CN105530039B, which discloses a combiner device, in which, in order to ensure stability of signals, and in order to implement functions of a diplexer, two of the diplexers have a corresponding amplifying circuit, that is, two radio frequency input amplifying circuits are disposed, and in order to ensure that output of a bridge can reach power before reaching the antenna, two radio frequency output amplifying circuits are preferably disposed, but in practical applications, only one of the two radio frequency input amplifying circuits and the two radio frequency output amplifying circuits can stably operate, which results in that the whole combiner device will normally operate even if one radio frequency input amplifying circuit or radio frequency output amplifying circuit is damaged. In this case, the stability of the entire combining device becomes weak, however, since the entire combining device is also operating normally, it is generally difficult to find the damage of one of the rf input amplifying circuit or the rf output amplifying circuit.
Disclosure of Invention
The present application is directed to an integrated signal combiner for solving the above-mentioned problems.
In order to solve the technical problems, the application provides the following technical scheme:
the integrated signal combiner comprises a duplexer, an electric bridge, a main-stage amplifier, a grading amplifier, a first output amplifier, a second output amplifier, a test signal transmitter, a time sequence controller, a test signal receiver, a test signal analysis circuit and an intermediate frequency board, wherein the time sequence controller is used for controlling the test signal transmitter to generate regular test signals in a time-sharing mode, the test signal transmitter is used for generating the regular test signals in the time-sharing mode and transmitting the regular test signals to the main-stage amplifier, the grading amplifier, the first output amplifier and the second output amplifier in the time-sharing mode, the test signal receiver is used for receiving uplink signals corresponding to the test signals from the intermediate frequency board, the test signal receiver is further used for receiving downlink signals corresponding to the test signals from an antenna, the test signal analysis circuit is used for judging whether the main-stage amplifier and the grading amplifier are abnormal or not according to the uplink signals corresponding to the test signals, and the test signal analysis circuit is further used for judging whether the first output amplifier and the second output amplifier are abnormal or not.
Optionally, the test signal includes an uplink signal loaded on the main stage amplifier and the stage amplifier, and further includes a downlink signal loaded on the first output amplifier and the second output amplifier.
Optionally, the regular test signal includes a test signal configured according to a fixed time domain variation, and the analysis information carried by the test signal has a fixed regular value f, f=t 2 arccos (t/a), where t is the generation time point of the test signal and a is a fixed coefficient; test signal analysis circuit optionally two test time points t after obtaining the test signal 1 、t 2 By calculating two test time points t 1 、t 2 The corresponding test parameters determine whether the test signal is abnormal.
Alternatively, two test time points t are calculated 1 、t 2 Corresponding test parameters determine whether the test signal is abnormal, including calculating the test time point t 1 Carried by test signalsResolving whether the information value is equal to f 1 =t 1 2 arccos(t 1 A) comprising calculating a test time point t 2 When the analysis information value carried by the test signal is equal to f 2 =t 2 2 arccos(t 2 A) comprising calculating a test time t 1 、t 2 Whether the integral quantity of the continuous function formed by all the analytic information values is equal to the discrimination parameter p or not, and the value of the discrimination parameter p is: p=t 1 3 arccos(t 1 /a)-（1/9）*（t 1 2 + 2a 2 ）*(a 2 -t 1 2 ) 1/2 -t 2 3 arccos(t 2 /a)+（1/9）*（t 2 2 + 2a 2 ）*(a 2 -t 2 2 ) 1/2 ；
Wherein a is a fixed coefficient, t 1 、t 2 For two selected points in time.
Optionally, the calculating test time point t 1 When the analysis information value carried by the test signal is equal to f 1 =t 1 2 arccos(t 1 A), in particular if the test time point t 1 When the value of the analysis information carried by the test signal is equal to f 1 =t 1 2 arccos(t 1 Judging the test time point t 1 When the test signal is normal, otherwise, judging the test time point t 1 The analysis information value carried by the test signal and f 1 Whether the difference in (2) exceeds a threshold, e.g. test time point t 1 The analysis information value carried by the test signal and f 1 Judging the test time point t if the difference value of the two signals does not exceed the threshold value 1 When the test signal is normal, otherwise, judging the test time point t 1 The test signal is abnormal.
Optionally, the calculating test time point t 2 When the analysis information value carried by the test signal is equal to f 2 =t 2 2 arccos(t 2 A), in particular if the test time point t 2 When the value of the analysis information carried by the test signal is equal to f 2 =t 2 2 arccos(t 2 Judging according to a) ofTime t of breaking test 2 When the test signal is normal, otherwise, judging the test time point t 2 The analysis information value carried by the test signal and f 2 Whether the difference in (2) exceeds a threshold, e.g. test time point t 2 The analysis information value carried by the test signal and f 2 Judging the test time point t if the difference value of the two signals does not exceed the threshold value 2 When the test signal is normal, otherwise, judging the test time point t 2 The test signal is abnormal.
Optionally, the calculating test time t 1 、t 2 Whether the integral of the continuous function formed by all the analysis information values is equal to the discrimination parameter p or not, specifically means that if the test time t 1 、t 2 If the integral quantity of continuous function formed by all the analysis information values is equal to the discrimination parameter p, the test time t is determined 1 、t 2 If all test signals between the test signals are normal, otherwise, judging the test time t 1 、t 2 Judging whether the difference value between the integral quantity and p of the continuous function formed by all the analytic information values exceeds a threshold value or not, if not, judging the test time t 1 、t 2 All test signals between are normal, otherwise test time t 1 、t 2 There is an anomaly in the test signal between them.
In another aspect, a signal testing method for an integrated signal combiner includes the steps of:
the time sequence controller controls the test signal transmitter to generate regular test signals in a time-sharing mode, and the test signals are transmitted to the main-stage amplifier, the grading amplifier, the first output amplifier and the second output amplifier in a time-sharing mode; the test signal comprises an uplink signal loaded on the main stage amplifier and the grading amplifier, and further comprises a downlink signal loaded on the first output amplifier and the second output amplifier; and then, the test signal receiver receives an uplink signal corresponding to the test signal from the intermediate frequency board, the test signal receiver also receives a downlink signal corresponding to the test signal from the antenna, the uplink signal corresponding to the test signal is used for judging whether the main amplifier and the hierarchical amplifier are abnormal, and the downlink signal corresponding to the test signal is used for judging whether the first output amplifier and the second output amplifier are abnormal.
Optionally, the test signal is transmitted to the main stage amplifier, the classifying amplifier, the first output amplifier and the second output amplifier in a time sharing manner, specifically, the timing controller controls the main stage amplifier, the classifying amplifier, the first output amplifier and the second output amplifier to obtain the test signal at different time points of a period respectively.
Compared with the prior art, the application has the beneficial effects that:
the time sequence controller controls the test signal transmitter to generate regular test signals in a time-sharing way, and the test signals are transmitted to the main-stage amplifier, the grading amplifier, the first output amplifier and the second output amplifier in a time-sharing way; the test signal receiver also receives a downlink signal corresponding to the test signal from the antenna, judges whether the main amplifier and the grading amplifier are abnormal according to the uplink signal corresponding to the test signal, and judges whether the first output amplifier and the second output amplifier are abnormal according to the downlink signal corresponding to the test signal; thus, the damage condition of the amplifying circuit can be accurately determined. In a specific test, the application can detect whether the test signal is abnormal or not by selecting two test time points t1 and t2, so that whether the corresponding amplifier is abnormal or not can be judged, and whether the signal between the test time points t1 and t2 is abnormal or not can be also judged.
Drawings
Fig. 1 is a circuit diagram of an integrated signal combiner according to the present application.
Detailed Description
The following description of the embodiments of the present application will be made clearly and completely with reference to the embodiments of the present application and the accompanying drawings, and it is apparent that the described embodiments are only some embodiments of the present application, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the application without making any inventive effort, are intended to be within the scope of the application.
The application discloses an integrated signal combiner, as shown in fig. 1, which comprises a duplexer, a bridge, a main-stage amplifier, a grading amplifier, a first output amplifier, a second output amplifier, a test signal transmitter, a time sequence controller, a test signal receiver, a test signal analysis circuit and an intermediate frequency board, wherein the time sequence controller is used for controlling the test signal transmitter to generate regular test signals in a time-sharing manner, the test signal transmitter is used for generating regular test signals in the time-sharing manner and transmitting the regular test signals to the main-stage amplifier, the grading amplifier, the first output amplifier and the second output amplifier in the time-sharing manner, the test signal receiver is used for receiving uplink signals corresponding to the test signals from the intermediate frequency board, the test signal receiver is also used for receiving downlink signals corresponding to the test signals from an antenna, the test signal analysis circuit is used for judging whether the main-stage amplifier and the grading amplifier are abnormal or not according to the downlink signals corresponding to the test signals, and the test signal analysis circuit is also used for judging whether the first output amplifier and the second output amplifier are abnormal or not. In the implementation, the time sequence controller controls the test signal transmitter to generate regular test signals in a time-sharing manner, and the test signals are transmitted to the main-stage amplifier, the grading amplifier, the first output amplifier and the second output amplifier in a time-sharing manner; the test signal comprises an uplink signal loaded on the main stage amplifier and the grading amplifier, and further comprises a downlink signal loaded on the first output amplifier and the second output amplifier; then, the test signal receiver receives the uplink signal corresponding to the test signal from the intermediate frequency board, the test signal receiver also receives the downlink signal corresponding to the test signal from the antenna, the uplink signal corresponding to the test signal judges whether the main amplifier and the grading amplifier are abnormal, and the downlink signal corresponding to the test signal judges whether the first output amplifier and the second output amplifier are abnormal, so that the damage condition of the amplifying circuit can be accurately determined.
Optionally, the application discloses an integrated signal combiner, as shown in fig. 1, which comprises a duplexer, a bridge, a main stage amplifier, a first output amplifier, a second output amplifier, a test signal transmitter, a time sequence controller, a test signal receiver, a test signal analysis circuit and an intermediate frequency board, wherein the time sequence controller is used for controlling the test signal transmitter to generate regular test signals in a time-sharing manner, the test signal transmitter is used for generating the regular test signals in the time-sharing manner and transmitting the regular test signals to the main stage amplifier, the first output amplifier and the second output amplifier in the time-sharing manner, and the test signals comprise uplink signals loaded on the main stage amplifier and the stage amplifier and downlink signals loaded on the first output amplifier and the second output amplifier. The test signal receiver is used for receiving an uplink signal corresponding to the test signal from the intermediate frequency board, the test signal receiver is also used for receiving a downlink signal corresponding to the test signal from the antenna, the test signal analysis circuit is used for judging whether the main amplifier and the grading amplifier are abnormal or not according to the uplink signal corresponding to the test signal, and the test signal analysis circuit is also used for judging whether the first output amplifier and the second output amplifier are abnormal or not according to the downlink signal corresponding to the test signal. In the implementation, the time sequence controller controls the test signal transmitter to generate regular test signals in a time-sharing manner, and the test signals are transmitted to the main-stage amplifier, the grading amplifier, the first output amplifier and the second output amplifier in a time-sharing manner; the test signal comprises an uplink signal loaded on the main stage amplifier and the grading amplifier, and further comprises a downlink signal loaded on the first output amplifier and the second output amplifier; and then, the test signal receiver receives an uplink signal corresponding to the test signal from the intermediate frequency board, the test signal receiver also receives a downlink signal corresponding to the test signal from the antenna, the uplink signal corresponding to the test signal is used for judging whether the main amplifier and the hierarchical amplifier are abnormal, and the downlink signal corresponding to the test signal is used for judging whether the first output amplifier and the second output amplifier are abnormal.
Optionally, the present application discloses an integrated signal combiner, as shown in fig. 1, which comprises a duplexer, a bridge, a main stage amplifier, a first output amplifier, a second output amplifier, a test signal transmitter, a timing controller, a test signal receiver, a test signal analysis circuit, and an intermediate frequency board, wherein the timing controller is used for controlling the test signal transmitter to generate regular test signals in a time sharing manner, and the test signal transmitter is used for generating regular test signals in a time sharing manner and transmitting the regular test signals to the main stage amplifier in a time sharing mannerThe test signal comprises an uplink signal loaded on the main stage amplifier and the grading amplifier, and further comprises a downlink signal loaded on the first output amplifier and the second output amplifier. The test signal receiver is used for receiving an uplink signal corresponding to the test signal from the intermediate frequency board, the test signal receiver is also used for receiving a downlink signal corresponding to the test signal from the antenna, the test signal analysis circuit is used for judging whether the main amplifier and the grading amplifier are abnormal or not according to the uplink signal corresponding to the test signal, and the test signal analysis circuit is also used for judging whether the first output amplifier and the second output amplifier are abnormal or not according to the downlink signal corresponding to the test signal. The regular test signal comprises a test signal configured according to fixed time domain variation, and the analysis information carried by the test signal has a fixed regular value f, f=t 2 arccos (t/a), where t is the generation time point of the test signal and a is a fixed coefficient; test signal analysis circuit optionally two test time points t after obtaining the test signal 1 、t 2 By calculating two test time points t 1 、t 2 The corresponding test parameters determine whether the test signal is abnormal.
Optionally, the application discloses an integrated signal combiner, as shown in fig. 1, which comprises a duplexer, a bridge, a main stage amplifier, a first output amplifier, a second output amplifier, a test signal transmitter, a time sequence controller, a test signal receiver, a test signal analysis circuit and an intermediate frequency board, wherein the time sequence controller is used for controlling the test signal transmitter to generate regular test signals in a time-sharing manner, the test signal transmitter is used for generating the regular test signals in the time-sharing manner and transmitting the regular test signals to the main stage amplifier, the first output amplifier and the second output amplifier in the time-sharing manner, and the test signals comprise uplink signals loaded on the main stage amplifier and the stage amplifier and downlink signals loaded on the first output amplifier and the second output amplifier. The test signal receiver is used for receiving an uplink signal corresponding to the test signal from the intermediate frequency board, and the test signal receiver is also used for receiving an uplink signal corresponding to the test signal from the intermediate frequency boardThe test signal analysis circuit is used for judging whether the main amplifier and the grading amplifier are abnormal or not according to the uplink signals corresponding to the test signals, and the test signal analysis circuit is also used for judging whether the first output amplifier and the second output amplifier are abnormal or not according to the downlink signals corresponding to the test signals. The regular test signal comprises a test signal configured according to fixed time domain variation, and the analysis information carried by the test signal has a fixed regular value f, f=t 2 arccos (t/a), where t is the generation time point of the test signal and a is a fixed coefficient; test signal analysis circuit optionally two test time points t after obtaining the test signal 1 、t 2 By calculating two test time points t 1 、t 2 The corresponding test parameters determine whether the test signal is abnormal. Calculate two test time points t 1 、t 2 Corresponding test parameters determine whether the test signal is abnormal, including calculating the test time point t 1 When the analysis information value carried by the test signal is equal to f 1 =t 1 2 arccos(t 1 A) comprising calculating a test time point t 2 When the analysis information value carried by the test signal is equal to f 2 =t 2 2 arccos(t 2 A) comprising calculating a test time t 1 、t 2 Whether the integral quantity of the continuous function formed by all the analytic information values is equal to the discrimination parameter p or not, and the value of the discrimination parameter p is: p=t 1 3 arccos(t 1 /a)-（1/9）*（t 1 2 + 2a 2 ）*(a 2 -t 1 2 ) 1/2 -t 2 3 arccos(t 2 /a)+（1/9）*（t 2 2 + 2a 2 ）*(a 2 -t 2 2 ) 1/2 ；
Wherein a is a fixed coefficient, t 1 、t 2 For two selected points in time.
Preferably said calculation of the test time point t 1 When the analysis information value carried by the test signal is equal to f 1 =t 1 2 arccos(t 1 A), in particular if the test time point t 1 When the value of the analysis information carried by the test signal is equal to f 1 =t 1 2 arccos(t 1 Judging the test time point t 1 When the test signal is normal, otherwise, judging the test time point t 1 The analysis information value carried by the test signal and f 1 Whether the difference in (2) exceeds a threshold, e.g. test time point t 1 The analysis information value carried by the test signal and f 1 Judging the test time point t if the difference value of the two signals does not exceed the threshold value 1 When the test signal is normal, otherwise, judging the test time point t 1 The test signal is abnormal.
Preferably said calculation of the test time point t 2 When the analysis information value carried by the test signal is equal to f 2 =t 2 2 arccos(t 2 A), in particular if the test time point t 2 When the value of the analysis information carried by the test signal is equal to f 2 =t 2 2 arccos(t 2 Judging the test time point t 2 When the test signal is normal, otherwise, judging the test time point t 2 The analysis information value carried by the test signal and f 2 Whether the difference in (2) exceeds a threshold, e.g. test time point t 2 The analysis information value carried by the test signal and f 2 Judging the test time point t if the difference value of the two signals does not exceed the threshold value 2 When the test signal is normal, otherwise, judging the test time point t 2 The test signal is abnormal.
Preferably said calculation of the test time t 1 、t 2 Whether the integral of the continuous function formed by all the analysis information values is equal to the discrimination parameter p or not, specifically means that if the test time t 1 、t 2 If the integral quantity of continuous function formed by all the analysis information values is equal to the discrimination parameter p, the test time t is determined 1 、t 2 If all test signals between the test signals are normal, otherwise, judging the test time t 1 、t 2 Judging whether the difference value between the integral quantity and p of the continuous function formed by all the analytic information values exceeds a threshold value or not, if not, judging the test time t 1 、t 2 All test signals between are normal, otherwise test time t 1 、t 2 And the test signal is abnormal.
In a specific implementation, the integrated signal combiner includes a duplexer, a bridge, a main stage amplifier, a first output amplifier, a second output amplifier, a test signal transmitter, a timing controller, a test signal receiver, a test signal analysis circuit, and an intermediate frequency board, where, as shown in fig. 1, the duplexer is electrically connected with the main stage amplifier and the stage amplifier, the bridge is electrically connected with the first output amplifier and the second output amplifier, the duplexer is electrically connected with the antenna through the main stage amplifier and the stage amplifier and is used for processing an uplink signal, the bridge is electrically connected with the antenna through the first output amplifier and the second output amplifier and is used for processing a downlink signal, the duplexer and the bridge are all electrically connected with the intermediate frequency board, the main stage amplifier, the first output amplifier, and the second output amplifier are all electrically connected with the test signal transmitter, the test signal transmitter is electrically connected with the timing controller, the test signal receiver is electrically connected with the intermediate frequency board and the antenna, and the test signal receiver is electrically connected with the test signal analysis circuit; the time sequence controller is used for controlling the test signal transmitter to generate regular test signals in a time-sharing mode, the test signal transmitter is used for generating regular test signals in a time-sharing mode and transmitting the regular test signals to the main amplifier, the grading amplifier, the first output amplifier and the second output amplifier in a time-sharing mode, the test signals comprise uplink signals loaded on the main amplifier and the grading amplifier, the test signal transmitter also comprises downlink signals loaded on the first output amplifier and the second output amplifier, the test signal receiver is used for receiving the uplink signals corresponding to the test signals from the intermediate frequency board, the test signal receiver is also used for receiving the downlink signals corresponding to the test signals from the antenna, the test signal analysis circuit is used for judging whether the main amplifier and the grading amplifier are abnormal or not according to the uplink signals corresponding to the test signals, the test signal analysis circuit is also used for judging whether the first output amplifier and the second output amplifier are abnormal or not according to the downlink signals corresponding to the test signals, and the test signal analysis circuit is also used for judging whether the first output amplifier and the second output amplifier are abnormal or notThe regular test signal comprises a test signal configured according to a fixed time domain variation, and the analytic information carried by the test signal has a fixed regular value f, f=t 2 arccos (t/a), where t is the generation time point of the test signal and a is a fixed coefficient; test signal analysis circuit optionally two test time points t after obtaining the test signal 1 、t 2 By calculating two test time points t 1 、t 2 Determining whether the test signal is abnormal or not according to the corresponding test parameters; calculate two test time points t 1 、t 2 Corresponding test parameters determine whether the test signal is abnormal, including calculating the test time point t 1 When the analysis information value carried by the test signal is equal to f 1 =t 1 2 arccos(t 1 A) comprising calculating a test time point t 2 When the analysis information value carried by the test signal is equal to f 2 =t 2 2 arccos(t 2 A) comprising calculating a test time t 1 、t 2 Whether the integral quantity of the continuous function formed by all the analytic information values is equal to the discrimination parameter p or not, and the value of the discrimination parameter p is: p=t 1 3 arccos(t 1 /a)-（1/9）*（t 1 2 + 2a 2 ）*(a 2 -t 1 2 ) 1/2 -t 2 3 arccos(t 2 /a)+（1/9）*（t 2 2 + 2a 2 ）*(a 2 -t 2 2 ) 1/2 The method comprises the steps of carrying out a first treatment on the surface of the Wherein a is a fixed coefficient, t 1 、t 2 For two selected points in time.
By such optional two test time points t1, t2, it is possible to detect whether or not the test signal is abnormal, so that it is possible to determine whether or not the corresponding amplifier is abnormal, and it is also possible to determine whether or not the signal between the test time points t1, t2 is abnormal.
The calculation of the test time point t 1 When the analysis information value carried by the test signal is equal to f 1 =t 1 2 arccos(t 1 A), in particular if the test time point t 1 When the value of the analysis information carried by the test signal is equal to f 1 =t 1 2 arccos(t 1 Judging the test time point t 1 When the test signal is normal, otherwise, judging the test time point t 1 The analysis information value carried by the test signal and f 1 Whether the difference in (2) exceeds a threshold, e.g. test time point t 1 The analysis information value carried by the test signal and f 1 Judging the test time point t if the difference value of the two signals does not exceed the threshold value 1 When the test signal is normal, otherwise, judging the test time point t 1 The test signal is abnormal. The calculation of the test time point t 2 When the analysis information value carried by the test signal is equal to f 2 =t 2 2 arccos(t 2 A), in particular if the test time point t 2 When the value of the analysis information carried by the test signal is equal to f 2 =t 2 2 arccos(t 2 Judging the test time point t 2 When the test signal is normal, otherwise, judging the test time point t 2 The analysis information value carried by the test signal and f 2 Whether the difference in (2) exceeds a threshold, e.g. test time point t 2 The analysis information value carried by the test signal and f 2 Judging the test time point t if the difference value of the two signals does not exceed the threshold value 2 When the test signal is normal, otherwise, judging the test time point t 2 The test signal is abnormal. The test time t is calculated 1 、t 2 Whether the integral of the continuous function formed by all the analysis information values is equal to the discrimination parameter p or not, specifically means that if the test time t 1 、t 2 If the integral quantity of continuous function formed by all the analysis information values is equal to the discrimination parameter p, the test time t is determined 1 、t 2 If all test signals between the test signals are normal, otherwise, judging the test time t 1 、t 2 Judging whether the difference value between the integral quantity and p of the continuous function formed by all the analytic information values exceeds a threshold value or not, if not, judging the test time t 1 、t 2 All test signals between are normal, otherwise test time t 1 、t 2 There is an anomaly in the test signal between them.
The application also discloses a signal testing method of the integrated signal combiner, which comprises the following steps: the time sequence controller controls the test signal transmitter to generate regular test signals in a time-sharing mode, and the test signals are transmitted to the main-stage amplifier, the grading amplifier, the first output amplifier and the second output amplifier in a time-sharing mode; the test signal comprises an uplink signal loaded on the main stage amplifier and the grading amplifier, and further comprises a downlink signal loaded on the first output amplifier and the second output amplifier; the uplink signals loaded on the main-stage amplifier and the grading amplifier are transmitted to the intermediate frequency board after passing through the amplifier and the duplexer, in the implementation, if any one of the main-stage amplifier and the grading amplifier is abnormal, the uplink signal corresponding to the test signal is abnormal, and the uplink signal can be detected at the intermediate frequency board; similarly, the downlink signals loaded on the first output amplifier and the second output amplifier are transmitted to the antenna after passing through the amplifiers, and in the implementation, if any one of the first output amplifier and the second output amplifier is abnormal, the downlink signal corresponding to the test signal is abnormal and can be detected at the antenna; and then, the test signal receiver receives an uplink signal corresponding to the test signal from the intermediate frequency board, the test signal receiver also receives a downlink signal corresponding to the test signal from the antenna, the uplink signal corresponding to the test signal is used for judging whether the main amplifier and the hierarchical amplifier are abnormal, and the downlink signal corresponding to the test signal is used for judging whether the first output amplifier and the second output amplifier are abnormal.
In the implementation, test signals are transmitted to the main stage amplifier, the classifying amplifier, the first output amplifier and the second output amplifier in a time sharing way, specifically, the time sequence controller controls the lower main stage amplifier, the classifying amplifier, the first output amplifier and the second output amplifier to obtain the test signals at different time points of one period respectively, so that the subsequent test signal receiver and the test signal analysis circuit can determine which corresponding signal is the signal of the corresponding test amplifier through the time stamp.
The regular test signal comprises a test signal configured according to fixed time domain variation, and the analysis information carried by the test signal has a fixed regular value f, f=t 2 arccos (t/a), where t is the generation time point of the test signal and a is a fixed coefficientThe method comprises the steps of carrying out a first treatment on the surface of the Test signal analysis circuit optionally two test time points t after obtaining the test signal 1 、t 2 By calculating two test time points t 1 、t 2 Determining whether the test signal is abnormal or not according to the corresponding test parameters; calculate two test time points t 1 、t 2 Corresponding test parameters determine whether the test signal is abnormal, including calculating the test time point t 1 When the analysis information value carried by the test signal is equal to f 1 =t 1 2 arccos(t 1 A) comprising calculating a test time point t 2 When the analysis information value carried by the test signal is equal to f 2 =t 2 2 arccos(t 2 A) comprising calculating a test time t 1 、t 2 Whether the integral quantity of the continuous function formed by all the analytic information values is equal to the discrimination parameter p or not, and the value of the discrimination parameter p is: p=t 1 3 arccos(t 1 /a)-（1/9）*（t 1 2 + 2a 2 ）*(a 2 -t 1 2 ) 1/2 -t 2 3 arccos(t 2 /a)+（1/9）*（t 2 2 + 2a 2 ）*(a 2 -t 2 2 ) 1/2 The method comprises the steps of carrying out a first treatment on the surface of the Wherein a is a fixed coefficient, t 1 、t 2 For two selected points in time.
By such optional two test time points t1, t2, it is possible to detect whether or not the test signal is abnormal, so that it is possible to determine whether or not the corresponding amplifier is abnormal, and it is also possible to determine whether or not the signal between the test time points t1, t2 is abnormal.
The calculation of the test time point t 1 When the analysis information value carried by the test signal is equal to f 1 =t 1 2 arccos(t 1 A), in particular if the test time point t 1 When the value of the analysis information carried by the test signal is equal to f 1 =t 1 2 arccos(t 1 Judging the test time point t 1 When the test signal is normal, otherwise, judging the test time point t 1 The analysis information value carried by the test signal and f 1 Whether or not the difference of (2) exceeds a thresholdValues, e.g. test time point t 1 The analysis information value carried by the test signal and f 1 Judging the test time point t if the difference value of the two signals does not exceed the threshold value 1 When the test signal is normal, otherwise, judging the test time point t 1 The test signal is abnormal. The calculation of the test time point t 2 When the analysis information value carried by the test signal is equal to f 2 =t 2 2 arccos(t 2 A), in particular if the test time point t 2 When the value of the analysis information carried by the test signal is equal to f 2 =t 2 2 arccos(t 2 Judging the test time point t 2 When the test signal is normal, otherwise, judging the test time point t 2 The analysis information value carried by the test signal and f 2 Whether the difference in (2) exceeds a threshold, e.g. test time point t 2 The analysis information value carried by the test signal and f 2 Judging the test time point t if the difference value of the two signals does not exceed the threshold value 2 When the test signal is normal, otherwise, judging the test time point t 2 The test signal is abnormal. The test time t is calculated 1 、t 2 Whether the integral of the continuous function formed by all the analysis information values is equal to the discrimination parameter p or not, specifically means that if the test time t 1 、t 2 If the integral quantity of continuous function formed by all the analysis information values is equal to the discrimination parameter p, the test time t is determined 1 、t 2 If all test signals between the test signals are normal, otherwise, judging the test time t 1 、t 2 Judging whether the difference value between the integral quantity and p of the continuous function formed by all the analytic information values exceeds a threshold value or not, if not, judging the test time t 1 、t 2 All test signals between are normal, otherwise test time t 1 、t 2 There is an anomaly in the test signal between them.
Claims (9)
1. The integrated signal combiner comprises a duplexer, an electric bridge, a main-stage amplifier, a grading amplifier, a first output amplifier and a second output amplifier, and is characterized by further comprising a test signal transmitter, a time sequence controller, a test signal receiver, a test signal analysis circuit and an intermediate frequency board, wherein the time sequence controller is used for controlling the test signal transmitter to generate regular test signals in a time-sharing mode, the test signal transmitter is used for generating regular test signals in a time-sharing mode and transmitting the regular test signals to the main-stage amplifier, the grading amplifier, the first output amplifier and the second output amplifier in a time-sharing mode, the test signal receiver is used for receiving uplink signals corresponding to the test signals from the intermediate frequency board, the test signal receiver is also used for receiving downlink signals corresponding to the test signals from an antenna, the test signal analysis circuit is used for judging whether the main-stage amplifier and the grading amplifier are abnormal or not according to the uplink signals corresponding to the test signals, and the test signal analysis circuit is also used for judging whether the first output amplifier and the second output amplifier are abnormal or not.
2. The integrated signal combiner of claim 1, wherein the test signal comprises an upstream signal applied to the main stage amplifier and the stage amplifier, and further comprising a downstream signal applied to the first output amplifier and the second output amplifier.
3. The integrated signal combiner of claim 1 wherein the regular test signals comprise test signals configured according to a fixed time domain variation, the analytical information carried by the test signals having a fixed regular value f, f = t 2 arccos (t/a), where t is the generation time point of the test signal and a is a fixed coefficient; test signal analysis circuit optionally two test time points t after obtaining the test signal 1 、t 2 By calculating two test time points t 1 、t 2 The corresponding test parameters determine whether the test signal is abnormal.
4. The integrated signal combiner of claim 3, wherein two test time points t are calculated 1 、t 2 Corresponding test parameters determine whether the test signal is abnormal, including calculating the test time point t 1 Number of analysis information carried by time test signalWhether or not the value is equal to f 1 =t 1 2 arccos(t 1 A) comprising calculating a test time point t 2 When the analysis information value carried by the test signal is equal to f 2 =t 2 2 arccos(t 2 A) comprising calculating a test time t 1 、t 2 Whether the integral quantity of the continuous function formed by all the analytic information values is equal to the discrimination parameter p or not, and the value of the discrimination parameter p is: p=t 1 3 arccos(t 1 /a)-（1/9）*（t 1 2 + 2a 2 ）*(a 2 -t 1 2 ) 1/2 -t 2 3 arccos(t 2 /a)+（1/9）*（t 2 2 + 2a 2 ）*(a 2 -t 2 2 ) 1/2 ；
Wherein a is a fixed coefficient, t 1 、t 2 For two selected points in time.
5. The integrated signal combiner of claim 4, wherein the calculated test time point t 1 When the analysis information value carried by the test signal is equal to f 1 =t 1 2 arccos(t 1 A), in particular if the test time point t 1 When the value of the analysis information carried by the test signal is equal to f 1 =t 1 2 arccos(t 1 Judging the test time point t 1 When the test signal is normal, otherwise, judging the test time point t 1 The analysis information value carried by the test signal and f 1 Whether the difference of (2) exceeds a threshold value, if the test time point t 1 The analysis information value carried by the test signal and f 1 Judging the test time point t if the difference value of the two signals does not exceed the threshold value 1 When the test signal is normal, otherwise, judging the test time point t 1 The test signal is abnormal.
6. The integrated signal combiner of claim 4, wherein the calculated test time point t 2 When the analysis information value carried by the test signal is equal to f 2 =t 2 2 arccos(t 2 A), in particular if the test time point t 2 When the value of the analysis information carried by the test signal is equal to f 2 =t 2 2 arccos(t 2 Judging the test time point t 2 When the test signal is normal, otherwise, judging the test time point t 2 The analysis information value carried by the test signal and f 2 Whether the difference of (2) exceeds a threshold value, if the test time point t 2 The analysis information value carried by the test signal and f 2 Judging the test time point t if the difference value of the two signals does not exceed the threshold value 2 When the test signal is normal, otherwise, judging the test time point t 2 The test signal is abnormal.
7. The integrated signal combiner of claim 4, wherein the calculated test time t 1 、t 2 Whether the integral of the continuous function formed by all the analysis information values is equal to the discrimination parameter p or not, specifically means that if the test time t 1 、t 2 If the integral quantity of continuous function formed by all the analysis information values is equal to the discrimination parameter p, the test time t is determined 1 、t 2 If all test signals between the test signals are normal, otherwise, judging the test time t 1 、t 2 Whether the difference value between the integral quantity and p of the continuous function formed by all the analytic information values exceeds a threshold value or not, if not, judging the test time t 1 、t 2 All test signals between are normal, otherwise test time t 1 、t 2 There is an anomaly in the test signal between them.
8. The signal testing method of the integrated signal combiner comprises the following steps:
the time sequence controller controls the test signal transmitter to generate regular test signals in a time-sharing mode, and the test signals are transmitted to the main-stage amplifier, the grading amplifier, the first output amplifier and the second output amplifier in a time-sharing mode; the test signal comprises an uplink signal loaded on the main stage amplifier and the grading amplifier, and further comprises a downlink signal loaded on the first output amplifier and the second output amplifier;
and then, the test signal receiver receives an uplink signal corresponding to the test signal from the intermediate frequency board, the test signal receiver also receives a downlink signal corresponding to the test signal from the antenna, the uplink signal corresponding to the test signal is used for judging whether the main amplifier and the hierarchical amplifier are abnormal, and the downlink signal corresponding to the test signal is used for judging whether the first output amplifier and the second output amplifier are abnormal.
9. The signal testing method of the integrated signal combiner of claim 8, wherein: the test signals are transmitted to the main stage amplifier, the classifying amplifier, the first output amplifier and the second output amplifier in a time sharing way, and specifically, the time sequence controller controls the lower main stage amplifier, the classifying amplifier, the first output amplifier and the second output amplifier to obtain the test signals at different time points of a period respectively.
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| JPH04139925A (en) * | 1990-09-30 | 1992-05-13 | Toshiba Lighting & Technol Corp | Voice device |
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| CN109861766A (en) * | 2019-03-26 | 2019-06-07 | 重庆长安汽车股份有限公司 | A kind of function test system being related to radiofrequency signal and method |
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Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04139925A (en) * | 1990-09-30 | 1992-05-13 | Toshiba Lighting & Technol Corp | Voice device |
| CN105577294A (en) * | 2014-10-13 | 2016-05-11 | 罗森伯格技术（昆山）有限公司 | Multifunctional handheld passive intermodulation analyzer |
| CN105530039A (en) * | 2015-12-23 | 2016-04-27 | 通号通信信息集团上海有限公司 | Combiner, combing device and signal combing system |
| CN205681429U (en) * | 2016-06-12 | 2016-11-09 | 广州杰赛科技股份有限公司 | A kind of test device of repeater downgoing reflection inter-modulated signal |
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