TWI406515B - Apparatus and method for wireless testing of a plurality of transmit paths and a plurality of receive paths of an electronic device - Google Patents

Abstract

An apparatus for wireless testing, the apparatus comprising: a test interface, a test generator, a test module, and an analysis module. The test interface is coupled to an electronic device and is configured to transmit data to the electronic device and to receive data from the electronic device. The test generator drives the electronic device through the test interface to vary the beam direction. The test module determines a plurality of transmit values of a transmit parameter based on the test signal wirelessly received from the electronic device using at least one static antenna for receiving the test signal. Each transmit value of the transmit parameter is associated with a different beam direction. The analysis module provides an assessment of the plurality of transmit paths of the electronic device based on the plurality of transmit values.

Description

Apparatus and method for wirelessly testing multiple transmission paths and multiple reception paths of an electronic device Field of invention

The present invention relates to an apparatus and method for wirelessly testing a plurality of transmission paths and a plurality of reception paths of an electronic device.

Background of the invention

An embodiment of the present invention relates to a test system for an electronic device, and more particularly to a device and a method for wirelessly testing a plurality of transmission paths of an electronic device, for using a plurality of electronic devices A device and a method for receiving a path for wireless testing, and a device for wirelessly testing a plurality of transmission paths and a plurality of reception paths of the electronic device.

A current trend in new wireless integrated circuits utilizes millimeter wave radios where the wavelength is short enough to allow the antenna to be integrated on the die or package. The connection of the antenna and the antenna to these electronic devices becomes more important due to the nature of the radiation. Some integrated circuits in these integrated circuits use several antennas for beam steering (eg, 16, 36, ...) and/or for multiple input multiple output MIMO (eg, 4+4, ...) communication. . These applications add to the need for test systems capable of testing wireless die or packaged wafers.

It is known that the system performs a conduction test on the die or package. Each RF (Radio Frequency) is connected to a test port of the test system. This test method has several drawbacks. The probe must be done at millimeter wave frequency and the antenna turns (16-36) for beam steering and multiple input multiple output (MIMO) devices (4+4, ...) must be connected during the test. In addition, for devices with beam steering capability, the circuit responsible for beam steering must be tested (eg, phase shifter on the transmit (TX)/receive (RX) side, to the power amplifier (PA) / from the low noise amplifier (LNA) Uniform gain or path). As a result, testing time and effort in testing the test resources of such electronic devices is high, which also results in huge test expenditures.

Summary of invention

It is an object of the present invention to provide an improved concept for testing multiple transmit paths and multiple receive paths for an electronic device, which allows for reduced test time, test effort, and/or test expenditure.

This object is solved by the apparatus as described in claim 1, 9, or 17, and the method as described in claim 23 or 24.

An embodiment of the invention provides an apparatus for wirelessly testing a plurality of transmission paths of the electronic device capable of changing a preferred direction of a beam of a test signal of an electronic device. The device includes a test interface for connecting to the electronic device, a test generator, a test module, and an analysis module. The test interface group is configured to send data to and receive data from the electronic device. The test generator assembly is configured to drive the electronic device through the test interface to change the preferred direction of the beam. In addition, the test module wirelessly determines a plurality of transmission values of a transmission parameter based on a test signal received from the electronic device by using at least one static antenna of the test module for receiving the test signal. Each transmitted value of the transmit parameter is associated with a different preferred direction of the beam. The analysis module group is configured to provide an evaluation of a plurality of transmission paths of the electronic device based on the plurality of transmission values.

A further embodiment provides an apparatus for wirelessly testing a plurality of receive paths of an electronic device capable of changing a preferred receive direction of an electronic device. The device includes a test interface for connecting to the electronic device, a test generator, a test module, and an analysis module. The test interface group is configured to send data to and receive data from the electronic device. The test generator assembly is configured to drive the electronic device through the test interface to change the preferred receiving direction. The test module is further configured to transmit a test signal to the electronic device through at least one antenna of the test module. Each transmitted value of the transmit parameter is associated with a different preferred direction of the beam. The analysis module set is configured to provide an evaluation of the plurality of receive paths based on the plurality of received values received from the electronic device through the test interface. The plurality of received values belong to a plurality of receiving parameters of the plurality of receiving paths, wherein the plurality of received values are determined by the electronic device. At least two received values are determined for each of the received parameters, wherein each received value of one of the received parameters is associated with a different preferred receive direction.

Embodiments in accordance with the present invention are based on the central idea of wirelessly testing the transmission and/or reception paths of electronic devices using the beam steering capabilities of one of the electronic devices to be tested. In this way, testing efforts in terms of test resources can be reduced because the RF ports do not have to be electrically connected via probe cards or probes. Thus, the reliability of the test can also be increased because the stability of the connection of the probe to the RF pad of the electronic device is no longer affected. In addition, a static test can reduce the test time by using a static antenna of the test module compared to a dynamic test, because the beam steering of the electronic device can be changed faster than the electronic device can be moved to different tests during a dynamic test. position. In addition, several transmit and/or receive paths can be tested simultaneously or quickly, which can be the second reason for reduced test time.

Some embodiments in accordance with the present invention are directed to a test system for wirelessly testing a plurality of transmit and receive paths of an electronic device. A common test interface, test generator, test module, and analysis module can be used to test multiple transmit paths and multiple receive paths.

Simple illustration

Embodiments in accordance with the present invention will be described later with reference to the accompanying drawings, wherein: FIG. 1 is a block diagram of an apparatus for wirelessly testing a plurality of transmission paths of an electronic device; FIG. 2 is for A block diagram of a device for wirelessly testing a plurality of receiving paths of an electronic device; and FIG. 3 is a block diagram of a device for wirelessly testing a plurality of transmitting paths and a plurality of receiving paths of an electronic device; 4 is a schematic illustration of a test module and an electronic device; FIG. 5 is a schematic illustration of an electronic device and a test interface combined with a test module including a reference device; A flow chart of a method for wirelessly testing a plurality of transmission paths of an electronic device; and FIG. 7 is a flow chart of a method for wirelessly testing a plurality of receiving paths of an electronic device.

Detailed description of the preferred embodiment

The same reference numerals are used in part for objects and functional units having the same or similar functional properties, and the description thereof with respect to one figure is equally applicable to other figures in order to reduce redundancy in the description of the embodiments.

1 is a block diagram of a device 100 for wirelessly testing a plurality of transmission paths of an electronic device 102. The electronic device 102 can change a beam of a test signal according to an embodiment of the present invention. direction. The device 100 includes a test interface 110 for connecting to the electronic device 102, a test generator, a test module 130, and an analysis module 140. The test generator 120 is connected to the test interface 110 and the test module 130 is connected to the analysis module. The test interface 110 is capable of transmitting data to and receiving data from the electronic device 102. The test generator 120 drives the electronic device 102 through the test interface 110 to change the preferred direction of the beam. In addition, the test module 130 wirelessly determines a plurality of transmit values 132 of a transmit parameter based on the test signal 104 received from the electronic device 102 using at least one static antenna of the test module 130 for receiving the test signal 104. Each transmit value 132 of the transmit parameter is associated with a different preferred direction of the beam. The analysis module 140 provides an evaluation of the plurality of transmission paths of the electronic device 102 based on the plurality of transmission values 132.

Multiple transmit paths can be tested wirelessly by utilizing the ability to change the direction of the beam of the electronic device 102 (also known as beam steering capability). Therefore, the RF埠 of the transmission path of the electronic device 102 must not be electrically connected for testing. In this way, testing efforts in testing resources can be significantly reduced. In addition, several transmission paths can be tested simultaneously. In other words, all transmission paths for adjusting the current direction of the beam can be tested simultaneously, which also reduces test time. In addition, stability problems due to unstable electrical connections to the RF埠 can be avoided, making it possible to increase test reliability. In addition, a static test can reduce the test time by using a static antenna of the test module compared to a dynamic test, because during a dynamic test, the beam steering of the electronic device can be changed faster than the electronic device can be moved to different Test location.

Furthermore, by simultaneously testing several transmission paths, the specification of each single transmission path can be relaxed, since the beam direction is a combined effect, and slight variations in the specification of a single transmission path can compensate each other. Thus, the yield of the error-free test device can be increased.

The direction of the beam of test signal 104 determines the direction in which the test signal is transmitted at the highest power. As mentioned, each transmission value of the transmission parameter is associated with a different preferred direction of the beam. In other words, if the direction of the beam is changed, the transmission parameter changes its value. Thus, analyzing the transmitted values 132 for different preferred directions of the beam can give an indication of the correct function of the beam steering capabilities of the electronic device 102. In this manner, the analysis module 140 can provide an evaluation 142 of multiple transmission paths.

The transmit parameters may be, for example, related to power, amplitude, energy, or another amount related to the power, amplitude, or energy of the test signal 104 received by the at least one static antenna of the module test 130. This power or energy of the test signal 104 is dependent on the direction of the beam and is increased or decreased by changing the preferred direction of the beam. Based on this increase or decrease in power or energy of test signal 104, analysis module 140 may determine an evaluation 142 of the transmission path. It is also possible to determine more than one transmission parameter for each transmission path.

The test generator drives the electronic device 102 through the test interface 110. The drive electronics 102 means, for example, that at least a start test signal is sent to the electronic device 102 to force the electronic device 102 to begin a test sequence. After receiving the start test signal, the electronic device 102 can begin to change the preferred direction of the beam and transmit the test signal 104. Alternatively, test generator 120 may also send a clock signal to electronic device 102 to synchronize test system 100 with electronic device 102. For this purpose, the test generator 120 can also be connected to the analysis module 140 and/or the test module 130 to provide the clock signal and the start test signal to the analysis module 140 and/or the test module 130, so that the test system and the electronic Device 102 is synchronized. In another example, test generator 120 transmits a relative or absolute angle of the beam direction to electronic device 102. For example, test generator 120 drives electronic device 102 to change the preferred direction of the beam by 1°, 10°, 30°, 60°, 90° or another angle between 0° and 180° for each time interval. Optionally, the test generator instructs the electronic device to set the direction of the beam to a particular absolute angle for each time interval.

Alternatively, test generator 122 transmits the entire test pattern from the plurality of test vectors to electronic device 102 to drive electronic device 102 into a desired test mode and/or control electronic device 102 during testing.

As a premise, the test signal 104 is received by a static antenna of the test module 130. This means, for example, that a plurality of transmission paths can be evaluated with a static antenna by using the above concept, compared to a known method of measuring a beam shape by changing the position of one of the antennas of a test system. In other words, the relative position between the static antenna of test system 100 and electronic device 102 can remain constant during the test.

Moreover, the test generator can drive the electronic device 102 such that only a predetermined number of selected transmission paths of the plurality of transmission paths are enabled at a test interval such that the preferred direction of the beam during the test interval depends only on the selected transmission path. In other words, during the test interval, the direction and shape of the beam may depend only on the selected transmission path. Other of the plurality of transmission paths may not be enabled for this test interval. For example, the send paths can be tested in pairs. In this way, a possible failure of one of the plurality of transmission paths is easier to find than testing all of the plurality of transmission paths simultaneously. Thus, analysis module 140 can evaluate the selected transmission path during this test interval. Next, for example, the selected transmit path is changed at the next test interval to select each of the plurality of transmit paths during at least one test interval. The analysis module 140 is thereby able to evaluate each transmission path.

The analysis module 140 can determine a gain parameter and/or a phase parameter of each transmission path according to the plurality of transmission values. These gain parameters and/or phase parameters can be compared to at least one reference gain parameter and/or phase parameter to evaluate the transmit path.

The determined gain parameter may, for example, be an absolute gain factor of the corresponding transmit path or a relative gain factor between different transmit paths. For example, different gain factors of the transmit path affect the preferred direction of the beam and, as such, affect the determined plurality of transmit values. Therefore, the analysis module 140 can draw conclusions from multiple transmissions. This pair of phase parameters can also be effective.

For example, the gain parameter of a transmit path depends on a gain of one of the power amplifiers included in a transmit path. Thus, the analysis module 140 can evaluate the gain of the power amplifier and, as such, evaluate the correct function of the power amplifier based on the gain parameters. Alternatively, the evaluation of the power amplifier can be directly determined by the transmission parameters.

In another example, the value of the corresponding phase parameter of a transmit path depends on the phase shift of one of the phase shifters included in a transmit path. Thus, the analysis module 140 can be able to evaluate the phase shift of the phase shifter and evaluate its correct function based on the phase parameters. Alternatively, the evaluation of the phase shifter can be directly determined by the transmission parameters.

A transmission path of the electronic device may include a power amplifier, a phase shifter, and an antenna. A signal transmitted by the electronic device can be amplified by the power amplifier, phase shifted by the phase shifter, and transmitted by the antenna. Since the electronic device has a beamforming capability, the electronic device includes a plurality of such transmission paths.

The test interface 110, the test generator 120, the test module 130, and the analysis module 140 can be a single hardware unit or a test board, a test system, a microcontroller, a computer, or an automated test device (ATE). )a part of.

2 is a block diagram of a device 200 for wirelessly testing a plurality of receiving paths of an electronic device 202. The electronic device 202 can change a preferred receiving direction of the electronic device 102 according to an embodiment of the present invention. . The device 200 includes a test interface 210 for connecting to the electronic device 202, a test generator 220, a test module 230, and an analysis module 240. The test generator 220 is connected to the test interface 210 and the test interface is connected to the analysis module 240. The test interface 210 is capable of transmitting data to and receiving data from the electronic device 202. The test generator 220 drives the electronic device through the test interface to change the preferred receiving direction. In addition, the test module 230 transmits a test signal 204 to the electronic device 102 through at least one static antenna of the test module 230. The analysis module 240 provides an evaluation 242 of the plurality of receive paths based on the plurality of received values 212 received from the electronic device 202 through the test interface 210. The plurality of received values 212 belong to a plurality of receive parameters of the plurality of receive paths, wherein the plurality of received values 212 are determined by the electronic device 202. For each received parameter, at least two received values are determined, wherein each received value 212 of a received parameter is associated with a different preferred receive direction.

In other words, at least one receive parameter is associated with each receive path, and electronic device 202 determines a value for each receive parameter for a different receive direction.

The advantages of device 200 are similar to those mentioned with respect to the device shown in Figure 1. Instead, the test module determines the transmit value, and the electronic device 202 determines the received value and provides the received value 212 to the analysis module 240 via the test interface 210. The received value 212 may again be, for example, a power, amplitude or energy value or other amount related to the power, amplitude or energy of the received test signal 204, which increases or decreases if the direction of reception changes.

For a device description for wirelessly testing a plurality of transmission paths, there are a gain parameter, a phase parameter, a selection of only a predetermined number of transmission paths, and/or a power amplifier and/or a phase shift included in a transmission path. The detailed embodiment of the evaluation of the apparatus can be readily adapted to a device 200 for wireless testing of multiple receive paths. In most cases, the term "send path" must be replaced only with "receive path".

A receiving path of the electronic device may include an antenna, a phase shifter, and a low noise amplifier. A signal received by the antenna can be phase shifted by the phase shifter and amplified by a low noise amplifier. Since the electronic device has a beamforming capability, the electronic device includes a plurality of such receiving paths.

FIG. 3 is a block diagram of a test system 300 for wirelessly testing a plurality of transmission paths and a plurality of reception paths of an electronic device 302. The electronic device 302 can change a test signal according to an embodiment of the present invention. The preferred direction of the beam and the preferred direction of reception of the electronic device 302. The test system 300 includes a test interface 310 for connecting to the electronic device 302, a test generator 320, a test module 330, and an analysis module 340. The test interface 310 is capable of transmitting data to and receiving data from the electronic device 302. The test generator 320 drives the electronic device 302 through the test interface 310 to change the preferred direction of the beam and/or the preferred direction of reception. In addition, the test module 330 transmits a test signal 304 to the electronic device 302 through at least one antenna of the test module 330 and/or from at least one static antenna through the test module 330 for receiving the test signal 304. The test signal 304 received by the electronic device 302 wirelessly determines a plurality of transmit values 332 for a transmit parameter. Each transmit value 332 of the transmit parameter is associated with a different preferred direction of the beam. The analysis module 340 provides an evaluation 342 of the plurality of transmission paths of the electronic device 302 according to the plurality of transmission values 332, and provides a plurality of reception paths according to the plurality of received values 312 received from the electronic device 302 through the test interface 310. An assessment of 342. The plurality of received values belong to a plurality of receive parameters of the plurality of receive paths, wherein the plurality of received values 312 are determined by the electronic device 302. For each received parameter, at least two received values are determined, wherein each received value 312 of a received parameter is associated with a different preferred receive direction.

The test system 300 will be used to wirelessly test a plurality of transmission paths (for example, as shown in FIG. 1) and one of the devices for wirelessly testing a plurality of reception paths (for example, as shown in FIG. 2). Combine. Thus, all of the examples and embodiments described above are also applicable to test system 300.

FIG. 4 illustrates a schematic diagram of a test module 330 and the electronic device 302 to be tested. In this example, the electronic device 302 is a package DUT (device to be tested) that receives a reference clock signal 422 (ref clk) and a baseband signal 414 (BB) from the test generator through the test interface and a fundamental frequency. Signal 414 is sent to the test interface. In addition, a schematic shape 406 of the beam is illustrated and the different directions of the beam are indicated by dashed lines.

The test module includes an oscillator 450 having a frequency of, for example, 60 GHz (or another frequency in a frequency or millimeter wavelength region between 100 MHz and 1000 GHz) coupled to a mix of one of the test paths 330 of the transmit path 422 The 458 is coupled to a mixer 454 of one of the test modules 330 receiving path 432. The transmit path mixer 458 downmixes the test signal received by the electronic device 302 to the carrier frequency (eg, 60 GHz) provided by the test signal upmixer 450, and the receive path 432 of the test module 330. A baseband. In addition, the transmit path 454 and the receive path 432 of the test module 432 include a power amplifier 456, 452 to amplify the test signal sent to the electronic device 302 or amplify the test signal received from the electronic device 302.

The test signal sent to the electronic device 302 can be, for example, a constant signal, a pulse signal, or a signal containing baseband data.

The transmission parameters determined by the test module 330 based on the test signals received from the electronic device 302 may be, for example, power, amplitude or energy parameters, or available baseband data.

Additionally, the test system can include an electromagnetic shield 460 to protect the DUT 302 from the test module 330 from external interference.

In other words, the idea is, for example, to use beam steering for spatial and temporal power adjustment. For example, during a transmit (TX) test, the desired power at each transmit (TX) antenna A (at least one antenna of test module 330) can verify the power amplifier (PA) and the antenna in DUT 302. In addition, the desired power change of antenna A of test module 330 can verify transmit (TX) phase control while manipulating the transmit (TX) beam. For DUT 302 receive (RX) testing, the low power amplifier (LNA) and antenna can be verified at the desired power of each receive (RX) antenna (at each receive path). Furthermore, changing the receive (RX) power verifiable receive (RX) phase control while manipulating the receive (RX) beam.

This enables, for example, a radiation package test or a radiation die or wafer test.

In some embodiments in accordance with the invention, test module 330 includes a reference device equivalent to the electronic device to be tested. The reference device can determine a plurality of transmitted values for each transmitted parameter or send a test signal. With this arrangement, for example, it is possible to change a preferred direction of the beam of the reference device during transmission of the test signal to the electronic device. In this way, the power of the test signal at the electronic device is changed. Therefore, the sensitivity of the electronic device or the sensitivity of the multiple receiving paths of the electronic device can be tested.

Suitably, FIG. 5 illustrates a schematic illustration 500 of an electronic device 302 and a DUT board. The DUT board includes a test interface 310 and a test module 330. The example shown in FIG. 5 is similar to the example shown in FIG. 4, but the test module 330 includes a reference device that can also change the direction or direction of the beam. A shape 534 of the beam of the reference device 330 is additionally shown.

Reference device 530 can be driven by test generator 320, for example, a reference clock signal 422 and at least one baseband signal 522. In the same manner, reference device 530 provides a baseband signal 522 to the analysis module and/or test generator.

In this way, it may be possible to perform a radiation package test, a die test or a wafer test, for example, a 60 GHz device.

A DUT Receive (RX) sensitivity test can be enabled using a test module 330 with beam steering capability. Beam steering of test module 330 can be used to control the power of the DUT. The beam steering capability of test module 330 can be accomplished, for example, by using reference device 530 as shown in FIG. 5, or by directly implementing beam steering capabilities on test module 330.

A full task mode test can also be enabled. This includes, for example, finding a beam, modulating, and/or negotiating a modulation mode.

In some embodiments according to the present invention, the test module can change a power of the test signal of the electronic device, and the analysis module can determine a critical power according to the power variation of the test signal. The analysis module can then evaluate a receive path based on the critical power. In other words, the power of the test signal can be increased until the electronic device can correctly receive the test signal, which is also referred to as "critical power." A low critical power can indicate a good receive path.

In some embodiments, the electronic device is a die, a single die, or a packaged wafer on a wafer, wherein each transmission path and each receiving path of the electronic device are connected to the die, or are located in the package. One of the antennas within the package of the wafer.

Some embodiments in accordance with the present invention relate to a radiation RF test based on beam steering. For example, a radiation test involving one of the wireless dies or packaged wafers of beam steering is performed, where the beam steering capabilities of the DUT are utilized and/or the test system performs beam steering.

Some of the advantages of the above concepts are adjustment of very high carrier frequencies, adjustment of antenna count, cost effective testing of beam steering capabilities in the DUT, and/or cost effective testing of a MIMO function.

Some further embodiments in accordance with the present invention relate to a radiation test involving one of a beam manipulation (eg, a DUT and/or a test system) or a packaged wafer (eg, a non-systematic). One level of this concept is to test the grain beam steering DUT for example. Another level is the use of test systems with beam steering capabilities. For example, beam steering in the DUT is used to test the phase shifter, and the uniformity of the power amplifier (PA) / low noise amplifier (LNA) / antenna path. Another example is to use the beam steering of the test system to vary the transmit power and measure the uniformity of the power amplifier/low noise amplifier path.

Some embodiments in accordance with the present invention relate to an automated test equipment (ATE) including one device for wirelessly testing a plurality of transmission paths of an electronic device for wirelessly receiving a plurality of receiving paths of an electronic device Testing one of the devices or one of the devices for wirelessly testing a plurality of transmission paths and a plurality of reception paths of an electronic device.

FIG. 6 is a flow chart showing a method 600 for wirelessly testing a plurality of transmission paths of an electronic device. The electronic device can change a comparison of the beam of the test signal of one of the electronic devices according to an embodiment of the present invention. Good direction. The method 600 includes driving the 610 electronic device to change the preferred direction of the beam through the test interface, receiving 620 a test signal, determining 630 multiple transmit values, and providing an evaluation of the plurality of transmit paths of the electronic device. A plurality of transmission values of a transmission parameter are determined wirelessly based on a test signal received by using at least one static antenna for receiving a test module of one of the test signals. Each transmitted value of the transmit parameter is associated with a different preferred direction of the beam. Providing 640 an evaluation of multiple transmission paths of the electronic device based on the plurality of transmission values

FIG. 7 is a flow chart showing a method 700 for wirelessly testing a plurality of receiving paths of an electronic device, the electronic device being capable of changing a preferred receiving direction thereof according to an embodiment of the present invention. The method 700 includes driving 710 an electronic device to change a preferred direction of the beam, transmitting 720 a test signal through at least one antenna of a test module, receiving 730 multiple received values from the electronic device through the test interface, and providing 740 pairs of receiving paths. An assessment. The plurality of received values belong to a plurality of receiving parameters of the plurality of receiving paths, wherein the plurality of received values are determined by the electronic device. At least two received values are determined for each of the received parameters, wherein each received value of one of the received parameters is associated with a different preferred receive direction. The evaluation of the plurality of receive paths is provided 740 based on the plurality of received values.

Although some aspects are described in the context of a device, it is clear that these layers also represent a description of the corresponding method, where a block or device corresponds to a feature of a method step or a method step. Similarly, the levels described in the context of a method step also represent a description of the features of a corresponding block or item or a corresponding device.

The inventive encoded audio signal may be stored on a digital storage medium or may be transmitted on a transmission medium such as a wireless transmission medium or a wired transmission medium such as the Internet.

Embodiments of the invention may be implemented in hardware or software, depending on certain implementation requirements. The implementation can be performed using a digital storage medium storing electronically readable control signals, for example, floppy disk, DVD, Blu-ray, CD, ROM, PROM, EPROM or FLASH memory, electronically readable control signals and a programmable The computer systems collaborate (or can collaborate) so that the respective methods are executed. Therefore, the digital storage medium can be computer readable.

Some embodiments in accordance with the present invention comprise a data carrier having electronically readable control signals that are capable of cooperating with a programmable computer system such that one of the methods described herein is performed.

In general, embodiments of the present invention can be implemented as a computer program product having a code that is operable to perform a method in a method when the computer program product runs on a computer. The code can be stored, for example, on a machine readable carrier.

Other embodiments comprise a computer program stored on a machine readable carrier for performing one of the methods described herein.

In other words, an embodiment of the inventive method is thus a computer program having a program code for performing one of the methods described herein when it is run on a computer.

A further embodiment of the inventive method is thus a data carrier (or a digital storage medium, or a computer readable medium) comprising a computer program recorded thereon for performing one of the methods described herein.

A further embodiment of the inventive method is thus a data stream or a sequence of signals representing a computer program for performing one of the methods described herein. The data stream or signal sequence can be configured, for example, to be delivered via a data communication connection (e.g., via the Internet).

A further embodiment comprises means for processing or adapted to perform one of the methods described herein, for example, a computer, or a programmable logic device.

A further embodiment comprises a computer having a computer program for performing one of the methods described herein.

In some embodiments, a programmable logic device (for example, a field programmable gate array) can be used to perform some or all of the functions of the methods described herein. In some embodiments, a field programmable gate array can cooperate with a microprocessor to perform one of the methods described herein. Generally, the method is preferably performed by any hardware device.

The above embodiments are merely illustrative of the principles of the invention. It will be understood that modifications and variations of the arrangements and details described herein will be apparent to those skilled in the art. Accordingly, the intention is to be limited only by the scope of the appended claims.

100, 200‧‧‧ equipment

102, 202, 302‧‧‧ electronic devices

104, 204, 304‧‧‧ test signals

110, 210, 310‧‧‧ test interface

120, 220, 320‧‧‧ test generator

130, 230, 330‧‧‧ test modules

132, 332‧‧‧ Send value

140, 240, 340‧‧‧ Analysis Module

142, 242, 342‧‧‧ assessment

212, 312‧‧‧ Received values

300‧‧‧Test system

400, 500‧‧‧ Schematic description

406‧‧‧Symbolic shape

414‧‧‧ fundamental frequency signal

422‧‧‧Reference clock signal

432‧‧‧ Receiving path

452, 456‧‧‧ power amplifier

454, 458‧‧‧ Mixer

460‧‧‧Shield

522‧‧‧ fundamental frequency signal

530‧‧‧ reference device

534‧‧‧ shape

600, 700‧‧‧ method

610~640, 710~740‧‧‧ steps

1 is a block diagram of an apparatus for wirelessly testing a plurality of transmission paths of an electronic device;

2 is a block diagram of an apparatus for wirelessly testing a plurality of receiving paths of an electronic device;

Figure 3 is a block diagram of a device for wirelessly testing a plurality of transmission paths and a plurality of reception paths of an electronic device;

Figure 4 is a schematic illustration of a test module and an electronic device;

Figure 5 is a schematic illustration of an electronic device and a test interface in combination with a test module including a reference device;

Figure 6 is a flow chart of a method for wirelessly testing a plurality of transmission paths of an electronic device; and

Figure 7 is a flow diagram of one method for wirelessly testing multiple receive paths of an electronic device.

100. . . device

102. . . Electronic device

104. . . Test signal

110. . . Test interface

120. . . Test generator

130. . . Test module

132. . . Send value

140. . . Analysis module

142. . . Evaluation

Claims (25)

An apparatus for wirelessly testing a plurality of transmission paths of the electronic device capable of changing a preferred direction of a beam of a test signal of an electronic device, comprising: a test interface coupled to the electronic device and grouped Configuring to send data to and receive data from the electronic device; a test generator configured to drive the electronic device to change the preferred direction of the beam through the test interface; a test module, the combination thereof Wirelessly determining a plurality of transmission values of a transmission parameter based on the test signal received from the electronic device by using at least one static antenna of the test module for receiving the test signal, wherein each transmission parameter is sent The value is associated with a different preferred direction of the beam; and an analysis module configured to provide an evaluation of the plurality of transmission paths of the electronic device based on the plurality of transmitted values. The device of claim 1, wherein the analysis module is configured to determine a gain parameter or a phase parameter of each transmission path according to the plurality of transmission values, and to be configured according to the corresponding gain parameter. Or the corresponding phase parameter evaluates a transmission path. The device of claim 2, wherein the analysis module is configured to compare the gain parameter of each transmission path with at least one reference gain parameter or according to the phase parameter of each transmission path. The evaluation is provided by a comparison of at least one reference phase parameter. The device of claim 2, wherein the gain parameter is An absolute gain factor of a transmit path or a relative gain factor between different transmit paths. The device of claim 2, wherein the value of the corresponding gain parameter of a transmission path depends on a gain of a power amplifier included in the transmission path, wherein the analysis module is configured according to the The gain parameter evaluates the gain of the power amplifier. The device of claim 2, wherein a value of the corresponding phase parameter of a transmission path depends on a phase shift of a phase shifter included in the transmission path, wherein the analysis module is configured The phase shift of the phase shifter is evaluated based on the phase parameter. The device of claim 1, wherein the test generator set is configured to drive the electronic device such that only a predefined number of the selected ones of the plurality of transmit paths are enabled during a test interval, such that the beam The preferred direction of the test interval depends only on the selected transmit paths during the test interval, wherein the analysis module is configured to evaluate the selected transmit paths during the test interval. The device of claim 7, wherein the selected transmission paths are varied at different test intervals such that each of the plurality of transmission paths is selected during at least one test interval. An apparatus for wirelessly testing a plurality of receiving paths of an electronic device capable of changing a preferred receiving direction of an electronic device, comprising: a test interface coupled to the electronic device and configured to transmit data Receiving data from and receiving data from the electronic device; a test generator configured to drive the electricity through the test interface The sub-device changes the preferred receiving direction; a test module is configured to transmit a test signal to the electronic device through at least one static antenna of the test module; and an analysis module is configured to The test interface provides a plurality of received values from the electronic device to provide an evaluation of the plurality of receive paths, wherein the plurality of received values belong to a plurality of receive parameters of the plurality of receive paths, wherein the plurality of received values Determining by the electronic device, wherein at least two received values are determined for each of the received parameters, wherein each received value of a received parameter is associated with a different preferred receive direction. The device of claim 9, wherein the analysis module is configured to determine a gain parameter or a phase parameter of each receiving path according to the plurality of received values, and to form a corresponding gain parameter according to the corresponding Or the corresponding phase parameter evaluates a receive path. The device of claim 10, wherein the analysis module is configured to compare the gain parameter according to each receiving path with at least one reference gain parameter or according to the phase parameter of each receiving path. The evaluation is provided in comparison to at least one reference phase parameter. The device of claim 10, wherein the gain parameter is an absolute gain factor of a receive path or a relative gain factor between different receive paths. The device of claim 10, wherein a value of the corresponding gain parameter of a receiving path depends on a gain of a power amplifier included in the receiving path, wherein the analyzing module is configured according to the The gain parameter evaluates the gain of the power amplifier. The device of claim 10, wherein the value of the corresponding phase parameter of a receiving path depends on a phase shift of a phase shifter included in the receiving path, wherein the analyzing module is configured The phase shift of the phase shifter is evaluated based on the phase parameter. The apparatus of claim 9, wherein the test generator set is configured to drive the electronic device such that only a predefined number of the selected ones of the plurality of receive paths are enabled during a test interval such that the The preferred receive direction depends only on the selected receive paths during the test interval, wherein the analysis module is configured to evaluate the selected receive paths during the test interval. The device of claim 15 wherein the selected receive paths are varied at different test intervals such that each of the plurality of transmit paths is selected during at least one test interval. A device for wirelessly testing a plurality of transmission paths and a plurality of receiving paths of a preferred direction of a beam capable of changing a test signal or a preferred receiving direction of an electronic device, comprising: a test interface connected to the electronic device and configured to transmit data to and receive data from the electronic device; a test generator configured to drive the electronic device to change the comparison of the beam through the test interface And a preferred receiving direction; a test module configured to transmit a test signal to the electronic device through at least one static antenna of the test module, and configured to receive the test according to transmission At least one of the test modules of the signal Statically determining the plurality of transmission values of a transmission parameter by the test signal received by the electronic device, wherein each transmission value of the transmission parameter is associated with a different preferred direction of the beam; and an analysis module, The grouping is configured to provide an evaluation of the plurality of transmission paths of the electronic device according to the plurality of transmission values, and to provide the plurality of received values received from the electronic device through the test interface to provide the plurality of An evaluation of the receiving path, wherein the plurality of received values belong to a plurality of receiving parameters of the plurality of receiving paths, wherein the plurality of received values are determined by the electronic device, wherein at least two received values are determined for each receiving parameter, wherein one Each received value of the received parameter is associated with a different preferred receive direction. The device of claim 1, wherein the test module comprises a reference device equivalent to the electronic device to be tested, wherein the reference device is configured to determine the plurality of transmission values for each transmission parameter Or grouped to send the test signal. The device of claim 18, wherein a preferred direction of the beam of the reference device changes during transmission of the test signal to change a power, an amplitude, or an energy of the test signal at the electronic device. The device of claim 1, wherein the test module is configured to change a power of the test signal in the electronic device, wherein the analysis module is configured to determine the power change according to the test signal. A critical power and a receive path is evaluated based on the critical power. The device of claim 1, wherein the electronic device is a die, a single die or a package wafer on a wafer, wherein Each of the transmission paths of the electronic device and each of the receiving paths are connected to one of the antennas located on the die or in the package of the packaged wafer. An automated test apparatus comprising the apparatus of claim 1 of the patent application. A method for wirelessly testing a plurality of transmission paths of the electronic device capable of changing a preferred direction of a beam of a test signal of an electronic device, comprising the steps of: driving the electronic device to change the beam. Directionally receiving a test signal from the electronic device by using at least one static antenna of a test module; wirelessly determining a plurality of transmission values of a transmission parameter according to the test signal received from the electronic device, wherein the transmission parameter is Each transmit value is associated with a different preferred direction of the beam; and an estimate of the plurality of transmit paths for the electronic device is provided based on the plurality of transmit values. A method for wirelessly testing a plurality of receiving paths of an electronic device capable of changing a preferred receiving direction of an electronic device, comprising the steps of: driving the electronic device to change the preferred receiving direction; and transmitting a test mode At least one antenna of the group sends a test signal to the electronic device; receiving, by the test interface, a plurality of received values from the electronic device, wherein the plurality of received values belong to a plurality of receiving parameters of the plurality of receiving paths, wherein the A plurality of received values are determined by the electronic device, wherein each pair A receive parameter determines at least two received values, wherein each received value of a received parameter is associated with a different preferred receive direction; and an estimate of the plurality of receive paths for the electronic device is provided based on the plurality of received values. A computer program having a program for performing the method of any one of claims 23 or 24 when it is run on a computer or a microcontroller.