CN116042331B - Application of cleaning liquid - Google Patents
Application of cleaning liquid Download PDFInfo
- Publication number
- CN116042331B CN116042331B CN202211414101.4A CN202211414101A CN116042331B CN 116042331 B CN116042331 B CN 116042331B CN 202211414101 A CN202211414101 A CN 202211414101A CN 116042331 B CN116042331 B CN 116042331B
- Authority
- CN
- China
- Prior art keywords
- water
- soluble polymer
- mass fraction
- deionized water
- diaminomaleonitrile
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000004140 cleaning Methods 0.000 title claims abstract description 98
- 239000007788 liquid Substances 0.000 title claims abstract description 27
- 229920003169 water-soluble polymer Polymers 0.000 claims abstract description 128
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 98
- 229920000642 polymer Polymers 0.000 claims abstract description 56
- -1 alcohol amine Chemical class 0.000 claims abstract description 51
- LDZYRENCLPUXAX-UHFFFAOYSA-N 2-methyl-1h-benzimidazole Chemical compound C1=CC=C2NC(C)=NC2=C1 LDZYRENCLPUXAX-UHFFFAOYSA-N 0.000 claims abstract description 49
- AVXURJPOCDRRFD-UHFFFAOYSA-N Hydroxylamine Chemical compound ON AVXURJPOCDRRFD-UHFFFAOYSA-N 0.000 claims abstract description 47
- XUJNEKJLAYXESH-UHFFFAOYSA-N cysteine Natural products SCC(N)C(O)=O XUJNEKJLAYXESH-UHFFFAOYSA-N 0.000 claims abstract description 45
- 235000018417 cysteine Nutrition 0.000 claims abstract description 45
- 230000007797 corrosion Effects 0.000 claims abstract description 25
- 238000005260 corrosion Methods 0.000 claims abstract description 25
- 238000000034 method Methods 0.000 claims abstract description 24
- 239000002738 chelating agent Substances 0.000 claims abstract description 21
- 239000003112 inhibitor Substances 0.000 claims abstract description 21
- 239000002994 raw material Substances 0.000 claims abstract description 17
- 150000007530 organic bases Chemical class 0.000 claims abstract description 15
- 238000005530 etching Methods 0.000 claims abstract description 9
- 238000004380 ashing Methods 0.000 claims abstract description 4
- 239000008367 deionised water Substances 0.000 claims description 79
- 229910021641 deionized water Inorganic materials 0.000 claims description 79
- WGTYBPLFGIVFAS-UHFFFAOYSA-M tetramethylammonium hydroxide Chemical group [OH-].C[N+](C)(C)C WGTYBPLFGIVFAS-UHFFFAOYSA-M 0.000 claims description 76
- DPZSNGJNFHWQDC-ARJAWSKDSA-N (z)-2,3-diaminobut-2-enedinitrile Chemical compound N#CC(/N)=C(/N)C#N DPZSNGJNFHWQDC-ARJAWSKDSA-N 0.000 claims description 61
- 239000000178 monomer Substances 0.000 claims description 48
- KCXVZYZYPLLWCC-UHFFFAOYSA-N EDTA Chemical group OC(=O)CN(CC(O)=O)CCN(CC(O)=O)CC(O)=O KCXVZYZYPLLWCC-UHFFFAOYSA-N 0.000 claims description 38
- VBIXEXWLHSRNKB-UHFFFAOYSA-N ammonium oxalate Chemical group [NH4+].[NH4+].[O-]C(=O)C([O-])=O VBIXEXWLHSRNKB-UHFFFAOYSA-N 0.000 claims description 38
- GIAFURWZWWWBQT-UHFFFAOYSA-N 2-(2-aminoethoxy)ethanol Chemical compound NCCOCCO GIAFURWZWWWBQT-UHFFFAOYSA-N 0.000 claims description 36
- 238000006243 chemical reaction Methods 0.000 claims description 26
- 239000000203 mixture Substances 0.000 claims description 23
- 238000002360 preparation method Methods 0.000 claims description 23
- USHAGKDGDHPEEY-UHFFFAOYSA-L potassium persulfate Chemical compound [K+].[K+].[O-]S(=O)(=O)OOS([O-])(=O)=O USHAGKDGDHPEEY-UHFFFAOYSA-L 0.000 claims description 20
- HRPVXLWXLXDGHG-UHFFFAOYSA-N Acrylamide Chemical compound NC(=O)C=C HRPVXLWXLXDGHG-UHFFFAOYSA-N 0.000 claims description 17
- 230000002209 hydrophobic effect Effects 0.000 claims description 17
- 238000006116 polymerization reaction Methods 0.000 claims description 15
- 229910052757 nitrogen Inorganic materials 0.000 claims description 12
- CMGDVUCDZOBDNL-UHFFFAOYSA-N 4-methyl-2h-benzotriazole Chemical compound CC1=CC=CC2=NNN=C12 CMGDVUCDZOBDNL-UHFFFAOYSA-N 0.000 claims description 9
- HZAXFHJVJLSVMW-UHFFFAOYSA-N 2-Aminoethan-1-ol Chemical compound NCCO HZAXFHJVJLSVMW-UHFFFAOYSA-N 0.000 claims description 8
- GSEJCLTVZPLZKY-UHFFFAOYSA-N Triethanolamine Chemical compound OCCN(CCO)CCO GSEJCLTVZPLZKY-UHFFFAOYSA-N 0.000 claims description 8
- OEYIOHPDSNJKLS-UHFFFAOYSA-N choline Chemical compound C[N+](C)(C)CCO OEYIOHPDSNJKLS-UHFFFAOYSA-N 0.000 claims description 8
- 229960001231 choline Drugs 0.000 claims description 8
- YWYZEGXAUVWDED-UHFFFAOYSA-N triammonium citrate Chemical compound [NH4+].[NH4+].[NH4+].[O-]C(=O)CC(O)(CC([O-])=O)C([O-])=O YWYZEGXAUVWDED-UHFFFAOYSA-N 0.000 claims description 8
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 6
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 claims description 6
- 239000003513 alkali Substances 0.000 claims description 6
- FCKYPQBAHLOOJQ-UHFFFAOYSA-N Cyclohexane-1,2-diaminetetraacetic acid Chemical compound OC(=O)CN(CC(O)=O)C1CCCCC1N(CC(O)=O)CC(O)=O FCKYPQBAHLOOJQ-UHFFFAOYSA-N 0.000 claims description 5
- 239000012530 fluid Substances 0.000 claims description 5
- 238000004519 manufacturing process Methods 0.000 claims description 5
- 230000001502 supplementing effect Effects 0.000 claims description 5
- 238000005406 washing Methods 0.000 claims description 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical group [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 4
- DWAQJAXMDSEUJJ-UHFFFAOYSA-M Sodium bisulfite Chemical compound [Na+].OS([O-])=O DWAQJAXMDSEUJJ-UHFFFAOYSA-M 0.000 claims description 4
- HOWGUJZVBDQJKV-UHFFFAOYSA-N docosane Chemical compound CCCCCCCCCCCCCCCCCCCCCC HOWGUJZVBDQJKV-UHFFFAOYSA-N 0.000 claims description 4
- 238000005470 impregnation Methods 0.000 claims description 4
- 239000003999 initiator Substances 0.000 claims description 4
- 229910052710 silicon Inorganic materials 0.000 claims description 4
- 239000010703 silicon Substances 0.000 claims description 4
- 235000010267 sodium hydrogen sulphite Nutrition 0.000 claims description 4
- 239000004289 sodium hydrogen sulphite Substances 0.000 claims description 4
- CERQOIWHTDAKMF-UHFFFAOYSA-M Methacrylate Chemical compound CC(=C)C([O-])=O CERQOIWHTDAKMF-UHFFFAOYSA-M 0.000 claims description 3
- 238000002791 soaking Methods 0.000 claims description 3
- LRUDIIUSNGCQKF-UHFFFAOYSA-N 5-methyl-1H-benzotriazole Chemical compound C1=C(C)C=CC2=NNN=C21 LRUDIIUSNGCQKF-UHFFFAOYSA-N 0.000 claims description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 2
- 239000003054 catalyst Substances 0.000 claims description 2
- SFZULDYEOVSIKM-UHFFFAOYSA-N chembl321317 Chemical compound C1=CC(C(=N)NO)=CC=C1C1=CC=C(C=2C=CC(=CC=2)C(=N)NO)O1 SFZULDYEOVSIKM-UHFFFAOYSA-N 0.000 claims description 2
- 239000001301 oxygen Substances 0.000 claims description 2
- 229910052760 oxygen Inorganic materials 0.000 claims description 2
- 229940051841 polyoxyethylene ether Drugs 0.000 claims description 2
- 229920000056 polyoxyethylene ether Polymers 0.000 claims description 2
- 239000001393 triammonium citrate Substances 0.000 claims description 2
- 235000011046 triammonium citrate Nutrition 0.000 claims description 2
- 239000000463 material Substances 0.000 abstract description 12
- 229910052751 metal Inorganic materials 0.000 abstract description 10
- 239000002184 metal Substances 0.000 abstract description 9
- 239000003989 dielectric material Substances 0.000 abstract description 6
- 239000000758 substrate Substances 0.000 abstract description 4
- 229910045601 alloy Inorganic materials 0.000 abstract description 3
- 239000000956 alloy Substances 0.000 abstract description 3
- 229910044991 metal oxide Inorganic materials 0.000 abstract description 3
- 150000004706 metal oxides Chemical class 0.000 abstract description 3
- 150000002739 metals Chemical class 0.000 abstract description 3
- 150000004767 nitrides Chemical class 0.000 abstract description 3
- XUJNEKJLAYXESH-REOHCLBHSA-N L-Cysteine Chemical compound SC[C@H](N)C(O)=O XUJNEKJLAYXESH-REOHCLBHSA-N 0.000 abstract description 2
- 230000009972 noncorrosive effect Effects 0.000 abstract description 2
- 239000000243 solution Substances 0.000 description 41
- 230000000052 comparative effect Effects 0.000 description 33
- 230000000694 effects Effects 0.000 description 10
- 235000012431 wafers Nutrition 0.000 description 7
- 239000010949 copper Substances 0.000 description 6
- 229910052721 tungsten Inorganic materials 0.000 description 6
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 5
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 5
- 229910052802 copper Inorganic materials 0.000 description 5
- 239000000523 sample Substances 0.000 description 5
- 239000010937 tungsten Substances 0.000 description 5
- 229910000838 Al alloy Inorganic materials 0.000 description 4
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 4
- NRTOMJZYCJJWKI-UHFFFAOYSA-N Titanium nitride Chemical compound [Ti]#N NRTOMJZYCJJWKI-UHFFFAOYSA-N 0.000 description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 4
- 229910017052 cobalt Inorganic materials 0.000 description 4
- 239000010941 cobalt Substances 0.000 description 4
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 4
- 238000005240 physical vapour deposition Methods 0.000 description 4
- 239000010936 titanium Substances 0.000 description 4
- 229910052719 titanium Inorganic materials 0.000 description 4
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 238000002474 experimental method Methods 0.000 description 3
- 238000002156 mixing Methods 0.000 description 3
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 3
- URDCARMUOSMFFI-UHFFFAOYSA-N 2-[2-[bis(carboxymethyl)amino]ethyl-(2-hydroxyethyl)amino]acetic acid Chemical compound OCCN(CC(O)=O)CCN(CC(O)=O)CC(O)=O URDCARMUOSMFFI-UHFFFAOYSA-N 0.000 description 2
- 229910017107 AlOx Inorganic materials 0.000 description 2
- 229910000881 Cu alloy Inorganic materials 0.000 description 2
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 2
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 2
- OPKOKAMJFNKNAS-UHFFFAOYSA-N N-methylethanolamine Chemical compound CNCCO OPKOKAMJFNKNAS-UHFFFAOYSA-N 0.000 description 2
- NDKBVBUGCNGSJJ-UHFFFAOYSA-M benzyltrimethylammonium hydroxide Chemical compound [OH-].C[N+](C)(C)CC1=CC=CC=C1 NDKBVBUGCNGSJJ-UHFFFAOYSA-M 0.000 description 2
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 2
- PZZHMLOHNYWKIK-UHFFFAOYSA-N eddha Chemical compound C=1C=CC=C(O)C=1C(C(=O)O)NCCNC(C(O)=O)C1=CC=CC=C1O PZZHMLOHNYWKIK-UHFFFAOYSA-N 0.000 description 2
- DEFVIWRASFVYLL-UHFFFAOYSA-N ethylene glycol bis(2-aminoethyl)tetraacetic acid Chemical compound OC(=O)CN(CC(O)=O)CCOCCOCCN(CC(O)=O)CC(O)=O DEFVIWRASFVYLL-UHFFFAOYSA-N 0.000 description 2
- 229910052731 fluorine Inorganic materials 0.000 description 2
- 239000011737 fluorine Substances 0.000 description 2
- 239000007769 metal material Substances 0.000 description 2
- 239000011259 mixed solution Substances 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 238000003756 stirring Methods 0.000 description 2
- 229910052715 tantalum Inorganic materials 0.000 description 2
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 2
- MZLGASXMSKOWSE-UHFFFAOYSA-N tantalum nitride Chemical compound [Ta]#N MZLGASXMSKOWSE-UHFFFAOYSA-N 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- VDZOOKBUILJEDG-UHFFFAOYSA-M tetrabutylammonium hydroxide Chemical compound [OH-].CCCC[N+](CCCC)(CCCC)CCCC VDZOOKBUILJEDG-UHFFFAOYSA-M 0.000 description 2
- DFQPZDGUFQJANM-UHFFFAOYSA-M tetrabutylphosphanium;hydroxide Chemical compound [OH-].CCCC[P+](CCCC)(CCCC)CCCC DFQPZDGUFQJANM-UHFFFAOYSA-M 0.000 description 2
- 229940073455 tetraethylammonium hydroxide Drugs 0.000 description 2
- LRGJRHZIDJQFCL-UHFFFAOYSA-M tetraethylazanium;hydroxide Chemical compound [OH-].CC[N+](CC)(CC)CC LRGJRHZIDJQFCL-UHFFFAOYSA-M 0.000 description 2
- KYVBNYUBXIEUFW-UHFFFAOYSA-N 1,1,3,3-tetramethylguanidine Chemical compound CN(C)C(=N)N(C)C KYVBNYUBXIEUFW-UHFFFAOYSA-N 0.000 description 1
- HXKKHQJGJAFBHI-UHFFFAOYSA-N 1-aminopropan-2-ol Chemical compound CC(O)CN HXKKHQJGJAFBHI-UHFFFAOYSA-N 0.000 description 1
- FYIHPNCKLYPALH-UHFFFAOYSA-N 2-[2-(2-aminophenoxy)ethenoxy]aniline Chemical compound NC1=CC=CC=C1OC=COC1=CC=CC=C1N FYIHPNCKLYPALH-UHFFFAOYSA-N 0.000 description 1
- RAEOEMDZDMCHJA-UHFFFAOYSA-N 2-[2-[bis(carboxymethyl)amino]ethyl-[2-[2-[bis(carboxymethyl)amino]ethyl-(carboxymethyl)amino]ethyl]amino]acetic acid Chemical compound OC(=O)CN(CC(O)=O)CCN(CC(=O)O)CCN(CCN(CC(O)=O)CC(O)=O)CC(O)=O RAEOEMDZDMCHJA-UHFFFAOYSA-N 0.000 description 1
- KWIPUXXIFQQMKN-UHFFFAOYSA-N 2-azaniumyl-3-(4-cyanophenyl)propanoate Chemical compound OC(=O)C(N)CC1=CC=C(C#N)C=C1 KWIPUXXIFQQMKN-UHFFFAOYSA-N 0.000 description 1
- KIZQNNOULOCVDM-UHFFFAOYSA-M 2-hydroxyethyl(trimethyl)azanium;hydroxide Chemical compound [OH-].C[N+](C)(C)CCO KIZQNNOULOCVDM-UHFFFAOYSA-M 0.000 description 1
- QGZKDVFQNNGYKY-UHFFFAOYSA-O Ammonium Chemical compound [NH4+] QGZKDVFQNNGYKY-UHFFFAOYSA-O 0.000 description 1
- USFZMSVCRYTOJT-UHFFFAOYSA-N Ammonium acetate Chemical compound N.CC(O)=O USFZMSVCRYTOJT-UHFFFAOYSA-N 0.000 description 1
- 239000005695 Ammonium acetate Substances 0.000 description 1
- ATRRKUHOCOJYRX-UHFFFAOYSA-N Ammonium bicarbonate Chemical compound [NH4+].OC([O-])=O ATRRKUHOCOJYRX-UHFFFAOYSA-N 0.000 description 1
- 239000004251 Ammonium lactate Substances 0.000 description 1
- 108010053070 Glutathione Disulfide Proteins 0.000 description 1
- QPCDCPDFJACHGM-UHFFFAOYSA-N N,N-bis{2-[bis(carboxymethyl)amino]ethyl}glycine Chemical compound OC(=O)CN(CC(O)=O)CCN(CC(=O)O)CCN(CC(O)=O)CC(O)=O QPCDCPDFJACHGM-UHFFFAOYSA-N 0.000 description 1
- UEEJHVSXFDXPFK-UHFFFAOYSA-O N-dimethylethanolamine Chemical compound C[NH+](C)CCO UEEJHVSXFDXPFK-UHFFFAOYSA-O 0.000 description 1
- WDLRUFUQRNWCPK-UHFFFAOYSA-N Tetraxetan Chemical compound OC(=O)CN1CCN(CC(O)=O)CCN(CC(O)=O)CCN(CC(O)=O)CC1 WDLRUFUQRNWCPK-UHFFFAOYSA-N 0.000 description 1
- RUSUZAGBORAKPY-UHFFFAOYSA-N acetic acid;n'-[2-(2-aminoethylamino)ethyl]ethane-1,2-diamine Chemical compound CC(O)=O.CC(O)=O.CC(O)=O.CC(O)=O.CC(O)=O.CC(O)=O.NCCNCCNCCN RUSUZAGBORAKPY-UHFFFAOYSA-N 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- LHIJANUOQQMGNT-UHFFFAOYSA-N aminoethylethanolamine Chemical compound NCCNCCO LHIJANUOQQMGNT-UHFFFAOYSA-N 0.000 description 1
- 229940043376 ammonium acetate Drugs 0.000 description 1
- 235000019257 ammonium acetate Nutrition 0.000 description 1
- 229940090948 ammonium benzoate Drugs 0.000 description 1
- BVCZEBOGSOYJJT-UHFFFAOYSA-N ammonium carbamate Chemical compound [NH4+].NC([O-])=O BVCZEBOGSOYJJT-UHFFFAOYSA-N 0.000 description 1
- 239000001099 ammonium carbonate Substances 0.000 description 1
- 235000012501 ammonium carbonate Nutrition 0.000 description 1
- VZTDIZULWFCMLS-UHFFFAOYSA-N ammonium formate Chemical compound [NH4+].[O-]C=O VZTDIZULWFCMLS-UHFFFAOYSA-N 0.000 description 1
- 229940059265 ammonium lactate Drugs 0.000 description 1
- 235000019286 ammonium lactate Nutrition 0.000 description 1
- NHJPVZLSLOHJDM-UHFFFAOYSA-N azane;butanedioic acid Chemical compound [NH4+].[NH4+].[O-]C(=O)CCC([O-])=O NHJPVZLSLOHJDM-UHFFFAOYSA-N 0.000 description 1
- RZOBLYBZQXQGFY-HSHFZTNMSA-N azanium;(2r)-2-hydroxypropanoate Chemical compound [NH4+].C[C@@H](O)C([O-])=O RZOBLYBZQXQGFY-HSHFZTNMSA-N 0.000 description 1
- NGPGDYLVALNKEG-UHFFFAOYSA-N azanium;azane;2,3,4-trihydroxy-4-oxobutanoate Chemical compound [NH4+].[NH4+].[O-]C(=O)C(O)C(O)C([O-])=O NGPGDYLVALNKEG-UHFFFAOYSA-N 0.000 description 1
- QRUDEWIWKLJBPS-UHFFFAOYSA-N benzotriazole Chemical compound C1=CC=C2N[N][N]C2=C1 QRUDEWIWKLJBPS-UHFFFAOYSA-N 0.000 description 1
- 239000012964 benzotriazole Substances 0.000 description 1
- KXDHJXZQYSOELW-UHFFFAOYSA-N carbonic acid monoamide Natural products NC(O)=O KXDHJXZQYSOELW-UHFFFAOYSA-N 0.000 description 1
- 239000003153 chemical reaction reagent Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- ZBCBWPMODOFKDW-UHFFFAOYSA-N diethanolamine Chemical compound OCCNCCO ZBCBWPMODOFKDW-UHFFFAOYSA-N 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 238000001312 dry etching Methods 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- IDGUHHHQCWSQLU-UHFFFAOYSA-N ethanol;hydrate Chemical compound O.CCO IDGUHHHQCWSQLU-UHFFFAOYSA-N 0.000 description 1
- 238000004108 freeze drying Methods 0.000 description 1
- YPZRWBKMTBYPTK-BJDJZHNGSA-N glutathione disulfide Chemical group OC(=O)[C@@H](N)CCC(=O)N[C@H](C(=O)NCC(O)=O)CSSC[C@@H](C(=O)NCC(O)=O)NC(=O)CC[C@H](N)C(O)=O YPZRWBKMTBYPTK-BJDJZHNGSA-N 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 229940102253 isopropanolamine Drugs 0.000 description 1
- XMYQHJDBLRZMLW-UHFFFAOYSA-N methanolamine Chemical compound NCO XMYQHJDBLRZMLW-UHFFFAOYSA-N 0.000 description 1
- 229940087646 methanolamine Drugs 0.000 description 1
- CRVGTESFCCXCTH-UHFFFAOYSA-N methyl diethanolamine Chemical compound OCCN(C)CCO CRVGTESFCCXCTH-UHFFFAOYSA-N 0.000 description 1
- MGFYIUFZLHCRTH-UHFFFAOYSA-N nitrilotriacetic acid Chemical compound OC(=O)CN(CC(O)=O)CC(O)=O MGFYIUFZLHCRTH-UHFFFAOYSA-N 0.000 description 1
- 229910052755 nonmetal Inorganic materials 0.000 description 1
- 239000012788 optical film Substances 0.000 description 1
- YPZRWBKMTBYPTK-UHFFFAOYSA-N oxidized gamma-L-glutamyl-L-cysteinylglycine Natural products OC(=O)C(N)CCC(=O)NC(C(=O)NCC(O)=O)CSSCC(C(=O)NCC(O)=O)NC(=O)CCC(N)C(O)=O YPZRWBKMTBYPTK-UHFFFAOYSA-N 0.000 description 1
- 229960003330 pentetic acid Drugs 0.000 description 1
- 238000001020 plasma etching Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- LESFYQKBUCDEQP-UHFFFAOYSA-N tetraazanium;2-[2-[bis(carboxylatomethyl)amino]ethyl-(carboxylatomethyl)amino]acetate Chemical compound N.N.N.N.OC(=O)CN(CC(O)=O)CCN(CC(O)=O)CC(O)=O LESFYQKBUCDEQP-UHFFFAOYSA-N 0.000 description 1
- LPSKDVINWQNWFE-UHFFFAOYSA-M tetrapropylazanium;hydroxide Chemical compound [OH-].CCC[N+](CCC)(CCC)CCC LPSKDVINWQNWFE-UHFFFAOYSA-M 0.000 description 1
- IJGSGCGKAAXRSC-UHFFFAOYSA-M tris(2-hydroxyethyl)-methylazanium;hydroxide Chemical compound [OH-].OCC[N+](C)(CCO)CCO IJGSGCGKAAXRSC-UHFFFAOYSA-M 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/32—Organic compounds containing nitrogen
- C11D7/3218—Alkanolamines or alkanolimines
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/26—Organic compounds containing oxygen
- C11D7/265—Carboxylic acids or salts thereof
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/32—Organic compounds containing nitrogen
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/32—Organic compounds containing nitrogen
- C11D7/3209—Amines or imines with one to four nitrogen atoms; Quaternized amines
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/32—Organic compounds containing nitrogen
- C11D7/3245—Aminoacids
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/32—Organic compounds containing nitrogen
- C11D7/3281—Heterocyclic compounds
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/34—Organic compounds containing sulfur
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02057—Cleaning during device manufacture
- H01L21/02068—Cleaning during device manufacture during, before or after processing of conductive layers, e.g. polysilicon or amorphous silicon layers
- H01L21/02071—Cleaning during device manufacture during, before or after processing of conductive layers, e.g. polysilicon or amorphous silicon layers the processing being a delineation, e.g. RIE, of conductive layers
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D2111/00—Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
- C11D2111/10—Objects to be cleaned
- C11D2111/14—Hard surfaces
- C11D2111/22—Electronic devices, e.g. PCBs or semiconductors
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- Wood Science & Technology (AREA)
- Organic Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Emergency Medicine (AREA)
- Health & Medical Sciences (AREA)
- Detergent Compositions (AREA)
Abstract
The invention discloses application of a cleaning solution. The cleaning liquid can be used for removing residues after etching or ashing in the cleaning process of the integrated circuit wet process; the cleaning solution is prepared from the following raw materials in percentage by mass: alcohol amine, 5-20% hydroxylamine, cysteine, 0.01-0.05% water-soluble polymer, organic base, chelating agent, corrosion inhibitor, ammonium carboxylate, 0.01-1% EO-PO polymer L81, 0.01-2%1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) and water, wherein the balance is water. The cleaning liquid disclosed by the invention has a wide range of residues which can be cleaned, is generally non-corrosive to exposed substrate materials (such as exposed low-k dielectric materials, metal oxides, metals, metal nitrides and alloys thereof), and has a good application prospect.
Description
Technical Field
The invention relates to application of a cleaning solution.
Background
In the chip manufacturing technology, the residual cleaning liquid after the plasma etching of the copper interconnection is mainly fluorine-containing cleaning liquid. With the continuous advancement of technology nodes, more and more materials are introduced, such as cobalt, titanium, tungsten, titanium nitride and other metal materials, low-k dielectric materials and the like, so that the compatibility of the traditional fluorine-containing cleaning solution with various materials is challenging.
Plasma dry etching is commonly used to fabricate vertical sidewall trenches and anisotropic interconnect vias in copper (Cu)/low dielectric constant dual damascene manufacturing processes. As technology nodes evolve to 45nm and smaller (e.g., 7 nm), the shrinking dimensions of semiconductor devices makes achieving precise profile control of vias and trenches more challenging. Integrated circuit manufacturers are researching the use of various hard masks to improve etch selectivity to low dielectric constant materials for better profile control. In post-etch residue cleaning processes, more and more types of metal and dielectric materials are protected, and thus compatibility of conventional cleaning fluids with a variety of materials is challenging.
Development of a cleaning solution with high compatibility is a problem to be solved in the art.
Disclosure of Invention
The invention aims to solve the technical problem of poor compatibility in the traditional cleaning solution, and provides application of the cleaning solution. The cleaning solution of the present invention has at least one or more of the following advantages: the range of the cleanable residues is wide; generally, the method has good application prospect without corrosiveness to exposed substrate materials (such as exposed low-k dielectric materials, metal oxides (such as AlOx)), metals (such as aluminum, aluminum/copper alloys, copper, titanium, tantalum, tungsten and cobalt), metal nitrides (such as aluminum nitride, aluminum oxide nitride, titanium nitride, tantalum nitride and tungsten nitride), and alloys thereof.
The invention solves the technical problems through the following technical proposal.
The invention provides application of a cleaning solution, which can be used for removing residues after etching or ashing in a cleaning process of a wet manufacturing process of an integrated circuit, wherein the cleaning solution is prepared from the following raw materials in percentage by mass: alcohol amine, 5-20% of hydroxylamine, cysteine, 0.01-0.05% of water-soluble polymer, organic base, chelating agent, corrosion inhibitor, ammonium carboxylate, 0.01-1% of EO-PO polymer L81, 0.01-2%1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) and water, wherein the balance is water, and the sum of the mass fractions of the components is 100%;
the corrosion inhibitor is amidoximated diaminomaleonitrile or a mixture of tolutriazole and amidoximated diaminomaleonitrile;
the water-soluble polymer is prepared by a preparation method which comprises the following steps:
step (1): dissolving acrylamide, amphoteric monomer methacryloyloxyethyl-N, N-dimethyl propane sulfonate and hydrophobic monomer docosane polyoxyethylene ether methacrylate in water to obtain a mixture I;
the molar ratio of the acrylamide to the amphoteric monomer is (18-19): 1; the molar ratio of the hydrophobic monomer to the amphoteric monomer is (20-200): 1;
Step (2): adding an initiator into the mixture I obtained in the step (1) to remove oxygen to obtain a mixture II;
the initiator is a mixture of potassium persulfate, sodium bisulphite and azodiisobutylamidine hydrochloride, and the molar ratio of the sodium bisulphite to the potassium persulfate is 2:1; the molar ratio of the azo diisobutylamidine hydrochloride to the potassium persulfate is 6:1; the addition amount of potassium persulfate is 0.11 to 0.3mol.L relative to the volume of the polymerization system -1 ;
Step (3): and (3) reacting the mixture II obtained in the step (2) at 70-85 ℃ to obtain the water-soluble polymer.
The mass fraction of each component is the mass percentage of the mass of each component in the total mass of all components in the cleaning liquid.
In the application of the cleaning solution, the wafer used for manufacturing the integrated circuit is a silicon wafer.
In the application of the cleaning solution, the integrated circuit is preferably immersed in the cleaning solution. The time of the impregnation may be 5 to 30 minutes, preferably 20 minutes. The temperature of the impregnation may be 45-60 ℃, preferably 50 ℃.
The mass fraction of the alcohol amine in the cleaning solution may be in the range of from 5 to 20%, preferably 5%,10% or 20% of the mass fraction conventional in cleaning solutions in the art.
Among the cleaning solutions, the alcohol amine can be alcohol amine conventional in the cleaning solutions in the field, preferably one or more of methanol amine, monoethanolamine, diethanolamine, triethanolamine, N-methylethanolamine, N-dimethylethanolamine, diglycolamine, methyldiethanolamine, aminoethylethanolamine, N-methylaminoethanol, isopropanolamine and isobutolamine; more preferably one or more of diglycolamine, monoethanolamine and triethanolamine.
In the cleaning solution, the mass fraction of the hydroxylamine may be 5%,10% or 20%.
In the washing liquid, the mass fraction of the cysteine may be a mass fraction conventional in washing liquids in the art, preferably 0.001 to 0.25%, more preferably 0.15 to 0.25%, for example 0.15% or 0.25%.
In the cleaning solution, the mass fraction of the water-soluble polymer can be 0.025%,0.01% or 0.05%.
In the cleaning solution, the water-soluble polymer can be one or more of a water-soluble polymer A1, a water-soluble polymer A2, a water-soluble polymer A3, a water-soluble polymer A4, a water-soluble polymer A5 and a water-soluble polymer A6;
wherein the water-soluble polymer A1 is prepared by the preparation method; in step (1), the molar ratio of the acrylamide to the amphoteric monomer is 18.98:1; the molar ratio of the hydrophobic monomer to the amphoteric monomer is 20:1; in the step (2), the potassium persulfate was added in an amount of 0.11mol.L based on the volume of the polymerization system -1 The method comprises the steps of carrying out a first treatment on the surface of the In the step (3), the temperature of the reaction is 70 ℃; preferably, the reaction temperature is replaced by 70 ℃ with reference to the preparation method in the example 1 of the patent CN104140507A, and other conditions and operations are the same as in the example 1 of the CN 104140507A;
the water-soluble polymer A2 is prepared by the preparation method; in step (1), the molar ratio of the acrylamide to the amphoteric monomer is 18.9:1; the molar ratio of the hydrophobic monomer to the amphoteric monomer is 100:1; in the step (2), the potassium persulfate was added in an amount of 0.3mol.L based on the volume of the polymerization system -1 The method comprises the steps of carrying out a first treatment on the surface of the In the step (3), the temperature of the reaction is 80 ℃; preferably, the reaction temperature is changed from 50 ℃ to 80 ℃ by referring to the preparation method in the example 3 of the patent CN104140507A, and other conditions and operations are the same as in the example 3 of the CN 104140507A;
the water-soluble polymer A3 is prepared by the preparation method; in step (1), the molar ratio of the acrylamide to the amphoteric monomer is 18.94:1; the molar ratio of the hydrophobic monomer to the amphoteric monomer is 60:1; in the step (2)The amount of potassium persulfate added was 0.11mol.L relative to the volume of the polymerization system -1 The method comprises the steps of carrying out a first treatment on the surface of the In the step (3), the temperature of the reaction is 70 ℃; preferably, the reaction temperature is changed from 45 ℃ to 70 ℃ by referring to the preparation method in the example 2 of the patent CN104140507A, and other conditions and operations are the same as in the example 2 of the CN 104140507A;
The water-soluble polymer A4 is prepared by the preparation method; in step (1), the molar ratio of the acrylamide to the amphoteric monomer is 18.76:1; the molar ratio of the hydrophobic monomer to the amphoteric monomer is 200:1; in the step (2), the potassium persulfate was added in an amount of 0.11mol.L based on the volume of the polymerization system -1 The method comprises the steps of carrying out a first treatment on the surface of the In the step (3), the temperature of the reaction is 70 ℃; preferably, the reaction temperature is replaced by 70 ℃ with reference to the preparation method in the example 5 of the patent CN104140507A, and other conditions and operations are the same as in the example 5 of the CN 104140507A;
the water-soluble polymer A5 is prepared by the preparation method; in step (1), the molar ratio of the acrylamide to the amphoteric monomer is 18.98:1; the molar ratio of the hydrophobic monomer to the amphoteric monomer is 20:1; in the step (2), the potassium persulfate was added in an amount of 0.11mol.L based on the volume of the polymerization system -1 The method comprises the steps of carrying out a first treatment on the surface of the In the step (3), the temperature of the reaction is 75 ℃; preferably, the reaction temperature is changed from 45 ℃ to 75 ℃ by referring to the preparation method in the example 1 of the patent CN104140507A, and other conditions and operations are the same as in the example 1 of the CN 104140507A;
the water-soluble polymer A6 is prepared by the preparation method; in step (1), the molar ratio of the acrylamide to the amphoteric monomer is 18.9:1; the molar ratio of the hydrophobic monomer to the amphoteric monomer is 100:1; in the step (2), the potassium persulfate was added in an amount of 0.3mol.L based on the volume of the polymerization system -1 The method comprises the steps of carrying out a first treatment on the surface of the In the step (3), the temperature of the reaction is 85 ℃; preferably, the reaction temperature was changed from 50℃to 85℃by the preparation method described in example 3 of the patent CN104140507A, and the other conditions and operations were the same as in example 3 of the patent CN 104140507A.
In the cleaning solution, the mass fraction of the organic base may be a mass fraction conventional in cleaning solutions in the art, preferably 1-5%, such as 1%,2.5% or 5%.
In the cleaning solution, the organic base may be an organic base conventional in the art, preferably one or more of tetramethylammonium hydroxide, tetrapropylammonium hydroxide, tetrabutylammonium hydroxide, tetraethylammonium hydroxide (TEAH), benzyltrimethylammonium hydroxide (BTAH), choline, (2-hydroxyethyl) trimethylammonium hydroxide, tris (2-hydroxyethyl) methylammonium hydroxide, tetrabutylphosphonium hydroxide (TBPH) and tetramethylguanidine; more preferably tetramethylammonium hydroxide and/or choline.
The chelating agent may be present in the cleaning solution in an amount conventional in the art, preferably in an amount of 0.01 to 2.0%, for example 0.01%, 1.0% or 2.0%.
In the cleaning solution, the chelating agent may be a chelating agent conventional in the art, preferably one or more of 1, 2-cyclohexanediamine-N, N ' -tetraacetic acid (CDTA), ethylenediamine tetraacetic acid, nitrilotriacetic acid, diethylenetriamine pentaacetic acid, 1,4,7, 10-tetraazacyclododecane-1, 4,7, 10-tetraacetic acid, ethylene Glycol Tetraacetic Acid (EGTA), 1, 2-bis (o-aminophenoxy) ethane-N, N ' -tetraacetic acid, N- {2- [ bis (carboxymethyl) amino ] ethyl } -N- (2-hydroxyethyl) glycine (HEDTA), ethylenediamine-N, N ' -bis (2-hydroxyphenylacetic acid) (EDDHA), dioxaoctamethylenediazatetraacetic acid (dotta), and triethylenetetramine hexaacetic acid (TTHA); more preferably ethylenediamine tetraacetic acid and/or 1, 2-cyclohexanediamine-N, N' -tetraacetic acid (CDTA).
The mass fraction of the corrosion inhibitor in the cleaning solution may be in an amount conventional in the art, preferably 0.01-2.0%, for example 0.01%, 0.5% or 2.0%.
The amidoximated diamino Ma Laijing of the amidoximated diamino maleonitrile and the tolyltriazole-amidoximated diamino maleonitrile is preferably prepared by a process comprising the steps of:
at K 2 CO 3 NH is added in the presence of a catalyst at a temperature of 75-95 DEG C 2 OH-HCl and diaminomaleonitrile react in aqueous ethanol to give amidoximated diaminomaleonitrile.
In the mixture of tolyltriazole and amidoximated diaminomaleonitrile, the mass ratio of the amidoximated diaminomaleonitrile to the tolyltriazole is preferably 1:1.
The mass fraction of the ammonium carboxylate in the cleaning solution may be in an amount conventional in the art, and may be 0.5-3%, for example 0.5%, 1.0% or 3.0%.
In the cleaning solution, the ammonium carboxylate may be one or more of ammonium oxalate, ammonium lactate, ammonium tartrate, ammonium citrate, ammonium acetate, ammonium carbamate, ammonium carbonate, ammonium benzoate, ammonium ethylenediamine tetraacetate, ammonium succinate, ammonium formate and ammonium 1-H-pyrazole-3-carboxylate, more preferably ammonium oxalate and/or ammonium citrate, which are conventional in the art.
In the cleaning solution, the mass fraction of the EO-PO polymer L81 may be 0.05%, 0.01% or 1.0%.
In the cleaning solution, the mass fraction of the 1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) can be 0.01%, 0.7% or 2.0%.
In the cleaning solution, the water is preferably deionized water.
In one embodiment, the cleaning solution is prepared from the following raw materials in parts by mass:
the alcohol amine is one or more of diglycolamine, monoethanolamine and triethanolamine;
the mass fraction of the alcohol amine is 5-20%;
the mass fraction of the hydroxylamine is 5-20%;
the mass fraction of the cysteine is 0.15-0.25%;
the water-soluble polymer is one or more of the water-soluble polymer A1, the water-soluble polymer A2, the water-soluble polymer A3, the water-soluble polymer A4, the water-soluble polymer A5 and the water-soluble polymer A6;
the mass fraction of the water-soluble polymer is 0.01-0.05%;
the organic base is tetramethyl ammonium hydroxide and/or choline;
the mass fraction of the organic alkali is 1-5%;
The chelating agent is ethylenediamine tetraacetic acid and/or 1, 2-cyclohexanediamine-N, N, N ', N' -tetraacetic acid (CDTA);
the mass fraction of the chelating agent is 0.01-2%;
the corrosion inhibitor is the amidoximated diaminomaleonitrile or the amidoximated diaminomaleonitrile-tolyltriazole mixture; the mass ratio of the amidoximated diaminomaleonitrile to the tolyltriazole in the amidoximated diaminomaleonitrile-tolyltriazole mixture is preferably 1:1;
the mass fraction of the corrosion inhibitor is 0.01-2%;
the ammonium carboxylate is ammonium oxalate and/or ammonium citrate;
the mass fraction of the ammonium carboxylate is 0.5-3%;
the mass fraction of the EO-PO polymer L81 is 0.01-1%;
the mass fraction of the 1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) is 0.01-2%;
the water is deionized water; the deionized water is used for supplementing the balance.
In one embodiment, the cleaning solution is prepared from the following raw materials in parts by mass:
the alcohol amine is diglycolamine;
the mass fraction of the alcohol amine is 5-20%;
the mass fraction of the hydroxylamine is 5-20%;
The mass fraction of the cysteine is 0.15-0.25%;
the water-soluble polymer is the water-soluble polymer A1;
the mass fraction of the water-soluble polymer is 0.01-0.05%;
the organic base is tetramethyl ammonium hydroxide;
the mass fraction of the organic alkali is 1-5%;
the chelating agent is ethylenediamine tetraacetic acid;
the mass fraction of the chelating agent is 0.01-2%;
the corrosion inhibitor is diamino Ma Laijing of the amidoxime;
the mass fraction of the corrosion inhibitor is 0.01-2%;
the ammonium carboxylate is ammonium oxalate;
the mass fraction of the ammonium carboxylate is 0.01-1%;
the mass fraction of the EO-PO polymer L81 is 0.01-1%;
the mass fraction of the 1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) is 0.01-2%;
the water is deionized water; the deionized water is used for supplementing the balance.
In one embodiment, the cleaning solution is prepared from the following raw materials in parts by mass:
the alcohol amine is one or more of diglycolamine, monoethanolamine and triethanolamine;
the mass fraction of the alcohol amine is 5%;
The mass fraction of the hydroxylamine is 5%;
the mass fraction of the cysteine is 0.25%;
the water-soluble polymer is one or more of the water-soluble polymer A1, the water-soluble polymer A2, the water-soluble polymer A3, the water-soluble polymer A4, the water-soluble polymer A5 and the water-soluble polymer A6;
the mass fraction of the water-soluble polymer is 0.025%;
the organic base is tetramethyl ammonium hydroxide and/or choline;
the mass fraction of the organic alkali is 2.5%;
the chelating agent is ethylenediamine tetraacetic acid and/or 1, 2-cyclohexanediamine-N, N, N ', N' -tetraacetic acid (CDTA);
the mass fraction of the chelating agent is 1%;
the corrosion inhibitor is the amidoximated diaminomaleonitrile or the amidoximated diaminomaleonitrile-tolyltriazole mixture; the mass ratio of the amidoximated diaminomaleonitrile to the tolyltriazole in the amidoximated diaminomaleonitrile-tolyltriazole mixture is preferably 1:1;
the mass fraction of the corrosion inhibitor is 0.5%;
the ammonium carboxylate is ammonium oxalate and/or ammonium citrate;
the mass fraction of the ammonium carboxylate is 1%;
The mass fraction of the EO-PO polymer L81 is 0.05%;
the mass fraction of the 1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) is 0.7%;
the water is deionized water; the deionized water is used for supplementing the balance.
In a certain preferred technical scheme, in the cleaning solution, the raw materials are any combination of the following components in percentage by mass:
combination 1:5.0% diglycolamine, 5.000% hydroxylamine, 0.25% cysteine, 0.025% water-soluble polymer A1, 2.50% tetramethylammonium hydroxide, 1.00% ethylenediamine tetraacetic acid, 0.50% amidoximated diaminomaleonitrile, 1.00% ammonium oxalate, 0.05% EO-PO polymer L81, 0.70%1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) and deionized water, the balance being deionized water;
combination 2:10.0% diglycolamine, 10.000% hydroxylamine, 0.15% cysteine, 0.010% water-soluble polymer A1, 1.00% tetramethylammonium hydroxide, 0.01% ethylenediamine tetraacetic acid, 0.01% amidoximated diaminomaleonitrile, 0.50% ammonium oxalate, 0.01% EO-PO polymer L81, 0.01%1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) and deionized water, the balance being deionized water;
Combination 3:20.0% diglycolamine, 10.000% hydroxylamine, 0.25% cysteine, 0.050% water-soluble polymer A1, 5.0% tetramethylammonium hydroxide, 2.0% ethylenediamine tetraacetic acid, 2.0% amidoximated diaminomaleonitrile, 3.0% ammonium oxalate, 1.0% EO-PO polymer L81, 2.0%1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) and deionized water, the balance being deionized water;
combination 4:10.0% diglycolamine, 5.000% hydroxylamine, 0.25% cysteine, 0.025% water-soluble polymer A1, 2.50% tetramethylammonium hydroxide, 1.00% ethylenediamine tetraacetic acid, 0.50% amidoximated diaminomaleonitrile, 1.00% ammonium oxalate, 0.05% eo-PO polymer L81, 0.70%1- (benzotriazol-1-methyl) -1- (2-methylbenzimidazole) and deionized water, the balance being deionized water;
combination 5:20.0% diglycolamine, 20.000% hydroxylamine, 0.15% cysteine, 0.025% water-soluble polymer A1, 5.0% tetramethylammonium hydroxide, 2.0% ethylenediamine tetraacetic acid, 2.0% amidoximated diaminomaleonitrile, 3.0% ammonium oxalate, 1.0% EO-PO polymer L81, 2.0%1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) and deionized water, the balance being deionized water;
Combination 6:5.0% monoethanolamine, 5.000% hydroxylamine, 0.25% cysteine, 0.025% water-soluble polymer A1, 2.50% tetramethylammonium hydroxide, 1.00% ethylenediamine tetraacetic acid, 0.50% amidoximated diaminomaleonitrile, 1.00% ammonium oxalate, 0.05% eo-PO polymer L81, 0.70%1- (benzotriazol-1-methyl) -1- (2-methylbenzimidazole) and deionized water, the balance being deionized water;
combination 7:5.0% triethanolamine, 5.000% hydroxylamine, 0.25% cysteine, 0.025% water-soluble polymer A1, 2.50% tetramethylammonium hydroxide, 1.00% ethylenediamine tetraacetic acid, 0.50% amidoximated diaminomaleonitrile, 1.00% ammonium oxalate, 0.05% EO-PO polymer L81, 0.70%1- (benzotriazol-1-methyl) -1- (2-methylbenzimidazole) and deionized water, the balance being deionized water;
combination 8:5.0% diglycolamine, 5.000% hydroxylamine, 0.25% cysteine, 0.025% water-soluble polymer A1, 2.50% choline, 1.00% ethylenediamine tetraacetic acid, 0.50% amidoximated diaminomaleonitrile, 1.00% ammonium oxalate, 0.05% EO-PO polymer L81, 0.70%1- (benzotriazol-1-methyl) -1- (2-methylbenzimidazole) and deionized water, the balance being deionized water;
Combination 9:5.0% diglycolamine, 5.000% hydroxylamine, 0.25% cysteine, 0.025% water-soluble polymer A1, 2.50% tetramethylammonium hydroxide, 1.00%1, 2-cyclohexanediamine-N, N, N ', N' -tetraacetic acid, 0.50% amidoximated diaminomaleonitrile, 1.00% ammonium oxalate, 0.05% EO-PO polymer L81, 0.70%1- (benzotriazol-1-methyl) -1- (2-methylbenzimidazole) and deionized water, the balance being deionized water;
combination 10:5.0% diglycolamine, 5.000% hydroxylamine, 0.25% cysteine, 0.025% water-soluble polymer A1, 2.50% tetramethylammonium hydroxide, 1.00% ethylenediamine tetraacetic acid, 0.50% 50% tolyltriazole+50% amidoximated diaminomaleonitrile, 1.00% ammonium oxalate, 0.05% EO-PO polymer L81, 0.70%1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) and deionized water, the balance being deionized water;
combination 11:5.0% diglycolamine, 5.000% hydroxylamine, 0.25% cysteine, 0.025% water-soluble polymer A1, 2.50% tetramethylammonium hydroxide, 1.00% ethylenediamine tetraacetic acid, 0.50% amidoximated diaminomaleonitrile, 1.00% tri-ammonium citrate, 0.05% EO-PO polymer L81, 0.70%1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) and deionized water, the balance being deionized water;
Combination 12:5.0% diglycolamine, 5.000% hydroxylamine, 0.25% cysteine, 0.025% water-soluble polymer A2, 2.50% tetramethylammonium hydroxide, 1.00% ethylenediamine tetraacetic acid, 0.50% amidoximated diaminomaleonitrile, 1.00% ammonium oxalate, 0.05% EO-PO polymer L81, 0.70%1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) and deionized water, the balance being deionized water;
combination 13:5.0% diglycolamine, 5.000% hydroxylamine, 0.25% cysteine, 0.025% water-soluble polymer A3, 2.50% tetramethylammonium hydroxide, 1.00% ethylenediamine tetraacetic acid, 0.50% amidoximated diaminomaleonitrile, 1.00% ammonium oxalate, 0.05% EO-PO polymer L81, 0.70%1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) and deionized water, the balance being deionized water;
combination 14:5.0% diglycolamine, 5.000% hydroxylamine, 0.25% cysteine, 0.025% water-soluble polymer A4, 2.50% tetramethylammonium hydroxide, 1.00% ethylenediamine tetraacetic acid, 0.50% amidoximated diaminomaleonitrile, 1.00% ammonium oxalate, 0.05% EO-PO polymer L81, 0.70%1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) and deionized water, the balance being deionized water;
Combination 15:5.0% diglycolamine, 5.000% hydroxylamine, 0.25% cysteine, 0.025% water-soluble polymer A5, 2.50% tetramethylammonium hydroxide, 1.00% ethylenediamine tetraacetic acid, 0.50% amidoximated diaminomaleonitrile, 1.00% ammonium oxalate, 0.05% EO-PO polymer L81, 0.70%1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) and deionized water, the balance being deionized water;
combination 16:5.0% diglycolamine, 5.000% hydroxylamine, 0.25% cysteine, 0.025% water-soluble polymer A6, 2.50% tetramethylammonium hydroxide, 1.00% ethylenediamine tetraacetic acid, 0.50% amidoximated diaminomaleonitrile, 1.00% ammonium oxalate, 0.05% EO-PO polymer L81, 0.70%1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) and deionized water, the balance being deionized water;
the water-soluble polymers A1-A6 are the same as the above;
the amidoximated diaminomaleonitrile is as described above.
In one embodiment, the cleaning solution comprises the following raw materials in percentage by mass: the balance of the alcohol amine, the hydroxylamine, the cysteine, the water-soluble polymer, the organic base, the chelating agent, the corrosion inhibitor, the ammonium carboxylate, the polymer L81, the 1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) and the water;
Wherein the mass fraction of each component is as described above;
the alcohol amine, the water-soluble polymer, the organic base, the chelating agent, the corrosion inhibitor and the ammonium carboxylate are as described above.
The invention also provides the cleaning liquid.
The components of the cleaning liquid can be packaged and temporarily mixed when in use.
The invention also provides a kit comprising in one or more containers, said alcohol amine, said hydroxylamine, said cysteine, said water-soluble polymer, said organic base, said chelating agent, said corrosion inhibitor, said ammonium carboxylate, said EO-PO polymer L81, said 1- (benzotriazol-1-methyl) -1- (2-methylbenzimidazole) and said water, in one or more containers.
The invention also provides a preparation method of the cleaning liquid, which comprises the following steps: and mixing the components to obtain the cleaning liquid.
Wherein, the mixing is preferably to add the solid component in the components into the liquid component and stir the mixture uniformly.
Wherein the temperature of the mixing may be room temperature.
As used herein, "room temperature" refers to 10-30deg.C.
The "volume of the polymerization system" in the present invention refers to the volume of acrylamide, the amphoteric monomer methacryloyloxyethyl-N, N-dimethylpropanesulfonate and the hydrophobic monomer docosapolyoxyethylene ether methacrylate when dissolved in water.
The above preferred conditions can be arbitrarily combined on the basis of not deviating from the common knowledge in the art, and thus, each preferred embodiment of the present invention can be obtained.
Other reagents and starting materials for the present invention, except 1- (benzotriazol-1-methyl) -1- (2-methylbenzimidazole) and amidoximated diaminomaleonitrile, are commercially available, wherein EO-PO polymer L81, EO-PO polymer L42, EO-PO polymer L62 and EO-PO polymer L31 are all available from Nantong brocade chemical Co.
The invention has the positive progress effects that: the cleaning solution of the present invention can clean a wide range of residues, is generally non-corrosive to exposed substrate materials (e.g., exposed low-k dielectric materials, metal oxides (such as AlOx), metals (such as aluminum, aluminum/copper alloys, copper, titanium, tantalum, tungsten, and cobalt), metal nitrides (such as aluminum nitride, aluminum oxide nitride, titanium nitride, tantalum nitride, and tungsten nitride), and alloys thereof), and has good application prospects.
Detailed Description
The invention is further illustrated by means of the following examples, which are not intended to limit the scope of the invention. The experimental methods, in which specific conditions are not noted in the following examples, were selected according to conventional methods and conditions, or according to the commercial specifications.
1- (benzotriazol-1-methyl) -1- (2-methylbenzimidazole)
In the present invention 1- (benzotriazol-1-methyl) -1- (2-methylbenzimidazole) was self-made, which was prepared according to example 2 in patent CN 106188103B.
Amidoximated diamino Ma Laijing
Preparation of amidoximated diaminomaleonitrile: NH is added to 2 OH HCl and K 2 CO 3 Dissolving in ethanol water solution to obtain mixed solution, adding diaminomaleonitrile into the mixed solution, heating to 75-95 ℃ under the protection of nitrogen gas for reaction for 4-8h, centrifuging after the reaction, collecting samples, washing with ethanol and water respectively, and freeze-drying to obtain amidoximated diaminomaleonitrile.
Water-soluble polymers A1 to A6
The water-soluble polymer A1 in the embodiment of the invention is self-made and is prepared by referring to the conditions and the operation in the embodiment 1 in the patent CN104140507A, wherein the reaction temperature is replaced by 70 ℃ from 45 ℃, and other conditions and the operation are the same as those in the embodiment 1 in the CN 104140507A;
The water-soluble polymer A2 in the embodiment of the invention is self-made and is prepared by referring to the conditions and the operation in the embodiment 3 in the patent CN104140507A, wherein the reaction temperature is replaced by 80 ℃ from 50 ℃, and other conditions and the operation are the same as those in the embodiment 3 in the CN 104140507A;
the water-soluble polymer A3 in the embodiment of the invention is self-made and is prepared by referring to the conditions and the operation in the embodiment 2 in the patent CN104140507A, wherein the reaction temperature is changed from 45 ℃ to 70 ℃, and other conditions and the operation are the same as those in the embodiment 2 in the CN 104140507A;
the water-soluble polymer A4 in the embodiment of the invention is self-made and is prepared by referring to the conditions and the operation in the embodiment 5 of the patent CN104140507A, wherein the reaction temperature is changed from 45 ℃ to 70 ℃, and other conditions and the operation are the same as those in the embodiment 5 of the CN 104140507A;
the water-soluble polymer A5 in the embodiment of the invention is self-made and is prepared by referring to the conditions and the operation in the embodiment 1 in the patent CN104140507A, wherein the reaction temperature is replaced by 75 ℃ from 45 ℃, and other conditions and the operation are the same as those in the embodiment 1 in the CN 104140507A;
the water-soluble polymer A6 in the embodiment of the invention is self-made and is prepared by referring to the conditions and the operation in the embodiment 3 in the patent CN104140507A, wherein the reaction temperature is replaced by 85 ℃ from 50 ℃, and other conditions and the operation are the same as those in the embodiment 3 in the CN 104140507A.
Comparative example Water-soluble Polymer
The comparative example water-soluble polymer 1 of the present invention was self-made, which was prepared according to example 1 of CN104140507 a;
the comparative example of the water-soluble polymer 2 of the present invention was self-made and was prepared according to example 2 of CN104140507 a;
the comparative example water-soluble polymer 3 of the present invention was self-made, which was prepared according to example 3 of CN104140507 a;
the comparative example 4 of the present invention was self-made and was prepared according to example 4 of CN104140507 a;
comparative example Water-soluble Polymer 5 in the present invention was self-made, which was prepared according to example 5 of patent CN 104140507A.
In the following examples and comparative examples, the preparation method of the cleaning liquid includes the following steps: adding the solid component into the liquid component, and stirring uniformly.
In the following examples, the specific operating temperatures are not limited, and all refer to being conducted under room temperature conditions.
The types of raw material components in the cleaning liquid of each example are the raw material components and deionized water as shown in table 1.
Table 1: examples kinds of raw material components in cleaning liquid
/>
The contents of the raw material components in the cleaning liquid of each example are shown in Table 2.
Table 2: example content of each raw material component in the cleaning liquid
/>
Comparative examples 1 to 19 below are screens based on the kinds or contents of components performed in example 1.
Comparative example 1
The hydroxylamine component of example 1 was removed, the others being unchanged.
Comparative example 2
The component hydroxylamine of example 1 was replaced with oxidized glutathione and the cysteine was removed, the others being unchanged.
Comparative example 3
The component water-soluble polymer A1 in example 1 was replaced with the comparative water-soluble polymer 1, the others being unchanged.
Comparative example 4
The component water-soluble polymer A1 in example 1 was replaced with the comparative water-soluble polymer 2, the others being unchanged.
Comparative example 5
The component water-soluble polymer A1 in example 1 was replaced with the comparative water-soluble polymer 3, the others being unchanged.
Comparative example 6
The component water-soluble polymer A1 in example 1 was replaced with the comparative water-soluble polymer 4, the others being unchanged.
Comparative example 7
The component water-soluble polymer A1 in example 1 was replaced with the comparative water-soluble polymer 5, the others being unchanged.
Comparative example 8
The component EO-PO polymer L81 in example 1 was replaced with EO-PO polymer L42, the others being unchanged.
Comparative example 9
The component EO-PO polymer L81 in example 1 was replaced with EO-PO polymer L62, the others being unchanged.
Comparative example 10
The component EO-PO polymer L81 in example 1 was replaced with EO-PO polymer L31, the others being unchanged.
Comparative example 11
The water-soluble polymer was removed from the composition of example 1, and the other was unchanged.
Comparative example 12
The content of the water-soluble polymer in example 1 was replaced with 0.005%, and the other was unchanged.
Comparative example 13
The hydroxylamine content in example 1 was replaced with 4.5% and the others were unchanged.
Comparative example 14
The content of the water-soluble polymer in example 1 was replaced with 0.06%, and the other was unchanged.
Comparative example 15
The EO-PO polymer L81 content of example 1 was replaced with 0.0005% and the others were unchanged.
Comparative example 16
The content of 1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) in example 1 was replaced with 0.0005%, and the others were unchanged.
Comparative example 17
The EO-PO polymer L81 content of example 1 was replaced with 1.1% and the others were unchanged.
Comparative example 18
The content of 1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) in example 1 was replaced with 2.1% with the other ones unchanged.
Comparative example 19
The component corrosion inhibitors of example 1 were replaced by a mixture of 50% benzotriazole and 50% amidoximated diaminomaleonitrile, the others being unchanged.
Effect examples
ER (Corrosion Rate) detection
Etching rate sample to be detected: a dummy wafer (dummy wafer) of a single material such as copper, cobalt, titanium nitride, titanium, dielectric material (low-k or high-k), etc. is deposited on the silicon wafer.
Etching experiment: and (3) statically soaking the sample to be detected in a cleaning solution for 30min at 50 ℃, and then cleaning with deionized water and drying with nitrogen.
Method of measuring etch rate (a/min): the thickness of the samples before and after etching was measured, respectively, wherein the metal samples were tested for thickness using a four-point probe instrument (CRESTEST-e of Napson, japan), and the non-metal samples were tested for thickness using an optical film thickness measuring instrument (Filmetrics F20, USA), and the test results are shown in Table 3.
TABLE 3 Table 3
/>
The TiN is PVD TiN. Wherein PVD refers to (Physical Vapor Deposition) physical vapor deposition.
In the table, the cleaning solution of the present invention is used for cleaning the substrate material exposed on the silicon wafer, such as AlNxOy, alN,The etching rates of W, cu, LP-TEOS, BD2, siCN, co, ti, tiN, taN and TiNxOy are extremely low and are all smaller thanHardly corroding the interconnection material on the device; the etching rate of the comparative cleaning solution on the above materials is slightly higher and can reach 192.84 +.>It is possible to etch the interconnect material on the device.
2. Cleaning effect and corrosion effect
Cleaning effect sample to be detected: patterned wafers with post plasma etch residues and post ash residues with patterned features (metal lines, holes via, metal pad or trench, etc.).
The cleaning effect experimental method comprises the following steps: the sample is statically immersed in a cleaning solution for 20min at 50 ℃, and then is cleaned by deionized water and then dried by nitrogen. The cleaning and corrosion effects were observed by electron microscope SEM and the test results are shown in table 4.
The cleaning effect is classified into four grades: a-no residue was observed; b-very little residue was observed; c-small residues were observed; d-significantly more residue was observed.
The corrosion effects are rated in four classes: a-compatibility is good, and undercut is avoided; b-very slight undercut; c-having a small undercut; d-undercut is more pronounced and severe.
TABLE 4 Table 4
Therefore, the cleaning solution has good cleaning effect on residues after etching or ashing in the cleaning process of the Integrated Circuit (IC) wet process.
Claims (20)
1. The application of the cleaning liquid is characterized in that the cleaning liquid can be used for removing residues after etching or ashing in the cleaning process of the wet manufacturing process of the integrated circuit, and the cleaning liquid is prepared from the following raw materials in percentage by mass: 5-20% of alcohol amine, 5-20% of hydroxylamine, 0.15-0.25% of cysteine, 0.01-0.05% of water-soluble polymer, 1-5% of organic base, 0.01-2% of chelating agent, 0.01-2% of corrosion inhibitor, 0.5-3% of ammonium carboxylate, 0.01-1% of EO-PO polymer L81, 0.01-2% of 1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) and water, wherein the balance is water, and the sum of the mass fractions of the components is 100%;
The alcohol amine is one or more of diglycolamine, monoethanolamine and triethanolamine;
the organic base is tetramethyl ammonium hydroxide and/or choline;
the chelating agent is ethylenediamine tetraacetic acid and/or 1, 2-cyclohexanediamine-N, N, N ', N' -tetraacetic acid;
the ammonium carboxylate is ammonium oxalate and/or ammonium citrate;
the corrosion inhibitor is amidoximated diaminomaleonitrile or a mixture of tolutriazole and amidoximated diaminomaleonitrile;
the water-soluble polymer is prepared by a preparation method which comprises the following steps:
step (1): dissolving acrylamide, amphoteric monomer methacryloyloxyethyl-N, N-dimethyl propane sulfonate and hydrophobic monomer docosane polyoxyethylene ether methacrylate in water to obtain a mixture I;
the molar ratio of the acrylamide to the amphoteric monomer is (18-19): 1; the molar ratio of the hydrophobic monomer to the amphoteric monomer is (20-200): 1;
step (2): adding an initiator into the mixture I obtained in the step (1) to remove oxygen to obtain a mixture II;
the initiator is a mixture of potassium persulfate, sodium bisulphite and azodiisobutylamidine hydrochloride, and the molar ratio of the sodium bisulphite to the potassium persulfate is 2:1; the mole of the azo diisobutylamidine hydrochloride and the mole of the potassium persulfate The ratio is 6:1; the addition amount of potassium persulfate is 0.11 to 0.3mol.L relative to the volume of the polymerization system -1 ;
Step (3): reacting the mixture II obtained in the step (2) at 70-85 ℃ to obtain the water-soluble polymer;
the mass fraction of each component is the mass percentage of the mass of each component in the total mass of all components in the cleaning liquid.
2. The use of the cleaning solution of claim 1, wherein the wafer used to fabricate the integrated circuit is a silicon wafer; the application adopts a mode of immersing the integrated circuit in the cleaning liquid; the soaking time is 5-30min; the temperature of the impregnation is 45-60 ℃.
3. The use of a cleaning solution as claimed in claim 2,
the soaking time is 20min;
and/or, the temperature of the impregnation is 50 ℃.
4. The use of a cleaning solution according to claim 1,
the mass fraction of the hydroxylamine is 5%,10% or 20%.
5. The use of a cleaning solution according to claim 1,
the mass fraction of the water-soluble polymer is 0.025%,0.01% or 0.05%.
6. The use of a cleaning solution according to claim 1,
The water-soluble polymer is one or more of a water-soluble polymer A1, a water-soluble polymer A2, a water-soluble polymer A3, a water-soluble polymer A4, a water-soluble polymer A5 and a water-soluble polymer A6;
wherein the water-soluble polymer A1 is prepared by the preparation method of claim 1; in step (1), theThe molar ratio of the acrylamide to the amphoteric monomer is 18.98:1; the molar ratio of the hydrophobic monomer to the amphoteric monomer is 20:1; in the step (2), the potassium persulfate was added in an amount of 0.11mol.L based on the volume of the polymerization system -1 The method comprises the steps of carrying out a first treatment on the surface of the In the step (3), the temperature of the reaction is 70 ℃;
the water-soluble polymer A2 is prepared by the preparation method of claim 1; in step (1), the molar ratio of the acrylamide to the amphoteric monomer is 18.9:1; the molar ratio of the hydrophobic monomer to the amphoteric monomer is 100:1; in the step (2), the potassium persulfate was added in an amount of 0.3mol.L based on the volume of the polymerization system -1 The method comprises the steps of carrying out a first treatment on the surface of the In the step (3), the temperature of the reaction is 80 ℃;
the water-soluble polymer A3 is prepared by the preparation method of claim 1; in step (1), the molar ratio of the acrylamide to the amphoteric monomer is 18.94:1; the molar ratio of the hydrophobic monomer to the amphoteric monomer is 60:1; in the step (2), the potassium persulfate was added in an amount of 0.11mol.L based on the volume of the polymerization system -1 The method comprises the steps of carrying out a first treatment on the surface of the In the step (3), the temperature of the reaction is 70 ℃;
the water-soluble polymer A4 is prepared by the preparation method of claim 1; in step (1), the molar ratio of the acrylamide to the amphoteric monomer is 18.76:1; the molar ratio of the hydrophobic monomer to the amphoteric monomer is 200:1; in the step (2), the potassium persulfate was added in an amount of 0.11mol.L based on the volume of the polymerization system -1 The method comprises the steps of carrying out a first treatment on the surface of the In the step (3), the temperature of the reaction is 70 ℃;
the water-soluble polymer A5 is prepared by the preparation method of claim 1; in step (1), the molar ratio of the acrylamide to the amphoteric monomer is 18.98:1; the molar ratio of the hydrophobic monomer to the amphoteric monomer is 20:1; in the step (2), the potassium persulfate was added in an amount of 0.11mol.L based on the volume of the polymerization system -1 The method comprises the steps of carrying out a first treatment on the surface of the In the step (3), the temperature of the reaction is 75 ℃;
the water-soluble polymer A6 is prepared by the preparation method of claim 1; in step (1), the molar ratio of the acrylamide to the amphoteric monomer is 189:1; the molar ratio of the hydrophobic monomer to the amphoteric monomer is 100:1; in the step (2), the potassium persulfate was added in an amount of 0.3mol.L based on the volume of the polymerization system -1 The method comprises the steps of carrying out a first treatment on the surface of the In step (3), the temperature of the reaction was 85 ℃.
7. The use of a cleaning solution according to claim 1,
the amidoximated diaminomaleonitrile and the amidoximated diaminomaleonitrile of the tolyltriazole-amidoximated diaminomaleonitrile are prepared by a method comprising the steps of:
at K 2 CO 3 NH is added in the presence of a catalyst at a temperature of 75-95 DEG C 2 OH ∙ HCl and diaminomaleonitrile are reacted in aqueous ethanol to give amidoximated diaminomaleonitrile.
8. The use of a cleaning solution according to claim 1,
in the mixture of the tolyltriazole and the amidoximation diaminomaleonitrile, the mass ratio of the amidoximation diaminomaleonitrile to the tolyltriazole is 1:1.
9. The use of a cleaning solution according to claim 1,
the mass fraction of the EO-PO polymer L81 is 0.05%, 0.01% or 1.0%.
10. The use of a cleaning solution according to claim 1,
the mass fraction of the 1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) is 0.01%, 0.7% or 2.0%.
11. The use of a cleaning solution according to claim 1,
The water is deionized water.
12. The use of a cleaning solution according to claim 1,
the mass fraction of the alcohol amine is 5%,10% or 20%.
13. The use of a cleaning solution according to claim 1,
the mass fraction of the organic alkali is 1%,2.5% or 5%.
14. The use of a cleaning solution according to claim 1,
the mass fraction of the chelating agent is 0.01%, 1.0% or 2.0%.
15. The use of a cleaning solution according to claim 1,
the mass fraction of the corrosion inhibitor is 0.01%, 0.5% or 2.0%.
16. The use of a cleaning solution according to claim 1,
the mass fraction of the ammonium carboxylate is 0.5%, 1.0% or 3.0%.
17. The use of the washing liquid according to claim 1, wherein the mass fraction of the cysteine in the washing liquid is 0.15% or 0.25%.
18. The use of a cleaning solution according to claim 1, characterized in that the cleaning solution is prepared from the following raw materials, which consist of the following components in mass fraction:
the alcohol amine is diglycolamine;
the mass fraction of the alcohol amine is 5-20%;
The mass fraction of the hydroxylamine is 5-20%;
the mass fraction of the cysteine is 0.15-0.25%;
the water-soluble polymer is the water-soluble polymer A1 as defined in claim 6;
the mass fraction of the water-soluble polymer is 0.01-0.05%;
the organic base is tetramethyl ammonium hydroxide;
the mass fraction of the organic alkali is 1-5%;
the chelating agent is ethylenediamine tetraacetic acid;
the mass fraction of the chelating agent is 0.01-2%;
the corrosion inhibitor is diamino Ma Laijing of the amidoxime;
the mass fraction of the corrosion inhibitor is 0.01-2%;
the ammonium carboxylate is ammonium oxalate;
the mass fraction of the ammonium carboxylate is 0.01-1%;
the mass fraction of the EO-PO polymer L81 is 0.01-1%;
the mass fraction of the 1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) is 0.01-2%;
the water is deionized water; the deionized water is used for supplementing the balance.
19. The method for preparing the cleaning fluid according to claim 1, wherein the cleaning fluid is prepared from the following raw materials in parts by mass:
the alcohol amine is one or more of diglycolamine, monoethanolamine and triethanolamine;
The mass fraction of the alcohol amine is 5%;
the mass fraction of the hydroxylamine is 5%;
the mass fraction of the cysteine is 0.25%;
the water-soluble polymer is one or more of a water-soluble polymer A1, a water-soluble polymer A2, a water-soluble polymer A3, a water-soluble polymer A4, a water-soluble polymer A5 and a water-soluble polymer A6; the water-soluble polymer A1-A6 is as defined in claim 6;
the mass fraction of the water-soluble polymer is 0.025%;
the organic base is tetramethyl ammonium hydroxide and/or choline;
the mass fraction of the organic alkali is 2.5%;
the chelating agent is ethylenediamine tetraacetic acid and/or 1, 2-cyclohexanediamine-N, N, N ', N' -tetraacetic acid;
the mass fraction of the chelating agent is 1%;
the corrosion inhibitor is the amidoximated diaminomaleonitrile or the amidoximated diaminomaleonitrile-tolyltriazole mixture; the mass ratio of the amidoximated diaminomaleonitrile to the tolyltriazole in the amidoximated diaminomaleonitrile-tolyltriazole mixture is 1:1;
the mass fraction of the corrosion inhibitor is 0.5%;
the ammonium carboxylate is ammonium oxalate and/or ammonium citrate;
The mass fraction of the ammonium carboxylate is 1%;
the mass fraction of the EO-PO polymer L81 is 0.05%;
the mass fraction of the 1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) is 0.7%;
the water is deionized water; the deionized water is used for supplementing the balance.
20. The use of a cleaning fluid according to claim 1, wherein the cleaning fluid is prepared from the following raw materials, the raw materials comprising any combination of the following components in mass fraction:
combination 1:5.0% diglycolamine, 5.000% hydroxylamine, 0.25% cysteine, 0.025% water-soluble polymer A1, 2.50% tetramethylammonium hydroxide, 1.00% ethylenediamine tetraacetic acid, 0.50% of the amidoximated diaminomaleonitrile, 1.00% ammonium oxalate, 0.05% EO-PO polymer L81, 0.70% 1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) and deionized water, the balance being deionized water;
combination 2:10.0% diglycolamine, 10.000% hydroxylamine, 0.15% cysteine, 0.010% water-soluble polymer A1, 1.00% tetramethylammonium hydroxide, 0.01% ethylenediamine tetraacetic acid, 0.01% of the amidoximated diaminomaleonitrile, 0.50% ammonium oxalate, 0.01% EO-PO polymer L81, 0.01% 1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) and deionized water, the balance being deionized water;
Combination 3:20.0% diglycolamine, 10.000% hydroxylamine, 0.25% cysteine, 0.050% water-soluble polymer A1, 5.0% tetramethylammonium hydroxide, 2.0% ethylenediamine tetraacetic acid, 2.0% of the amidoximated diaminomaleonitrile, 3.0% ammonium oxalate, 1.0% EO-PO polymer L81, 2.0% 1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) and deionized water, the balance being deionized water;
combination 4:10.0% diglycolamine, 5.000% hydroxylamine, 0.25% cysteine, 0.025% water-soluble polymer A1, 2.50% tetramethylammonium hydroxide, 1.00% ethylenediamine tetraacetic acid, 0.50% of the amidoximated diaminomaleonitrile, 1.00% ammonium oxalate, 0.05% EO-PO polymer L81, 0.70% 1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) and deionized water, the balance being deionized water;
combination 5:20.0% diglycolamine, 20.000% hydroxylamine, 0.15% cysteine, 0.025% water-soluble polymer A1, 5.0% tetramethylammonium hydroxide, 2.0% ethylenediamine tetraacetic acid, 2.0% of the amidoximated diaminomaleonitrile, 3.0% ammonium oxalate, 1.0% EO-PO polymer L81, 2.0% 1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) and deionized water, the balance being deionized water;
combination 6:5.0% monoethanolamine, 5.000% hydroxylamine, 0.25% cysteine, 0.025% water-soluble polymer A1, 2.50% tetramethylammonium hydroxide, 1.00% ethylenediamine tetraacetic acid, 0.50% of the amidoximated diaminomaleonitrile, 1.00% ammonium oxalate, 0.05% EO-PO polymer L81, 0.70% 1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) and deionized water, the balance being deionized water;
Combination 7:5.0% triethanolamine, 5.000% hydroxylamine, 0.25% cysteine, 0.025% water-soluble polymer A1, 2.50% tetramethylammonium hydroxide, 1.00% ethylenediamine tetraacetic acid, 0.50% of said amidoximated diaminomaleonitrile, 1.00% ammonium oxalate, 0.05% EO-PO polymer L81, 0.70% 1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) and deionized water, the balance being deionized water;
combination 8:5.0% diglycolamine, 5.000% hydroxylamine, 0.25% cysteine, 0.025% water-soluble polymer A1, 2.50% choline, 1.00% ethylenediamine tetraacetic acid, 0.50% of the amidoximated diaminomaleonitrile, 1.00% ammonium oxalate, 0.05% EO-PO polymer L81, 0.70% 1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) and deionized water, the balance being deionized water;
combination 9:5.0% diglycolamine, 5.000% hydroxylamine, 0.25% cysteine, 0.025% water-soluble polymer A1, 2.50% tetramethylammonium hydroxide, 1.00% 1, 2-cyclohexanediamine-N, N' -tetraacetic acid, 0.50% of said amidoximated diaminomaleonitrile, 1.00% ammonium oxalate, 0.05% EO-PO polymer L81, 0.70% 1- (benzotriazol-1-methyl) -1- (2-methylbenzimidazole) and deionized water, the balance being deionized water;
Combination 10:5.0% diglycolamine, 5.000% hydroxylamine, 0.25% cysteine, 0.025% water-soluble polymer A1, 2.50% tetramethylammonium hydroxide, 1.00% ethylenediamine tetraacetic acid, 0.50% 50% tolyltriazole+50% of the amidoximated diaminomaleonitrile, 1.00% ammonium oxalate, 0.05% EO-PO polymer L81, 0.70% 1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) and deionized water, the balance being deionized water;
combination 11:5.0% diglycolamine, 5.000% hydroxylamine, 0.25% cysteine, 0.025% water-soluble polymer A1, 2.50% tetramethylammonium hydroxide, 1.00% ethylenediamine tetraacetic acid, 0.50% of the amidoximated diaminomaleonitrile, 1.00% triammonium citrate, 0.05% EO-PO polymer L81, 0.70% 1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) and deionized water, the balance being deionized water;
combination 12:5.0% diglycolamine, 5.000% hydroxylamine, 0.25% cysteine, 0.025% water-soluble polymer A2, 2.50% tetramethylammonium hydroxide, 1.00% ethylenediamine tetraacetic acid, 0.50% of the amidoximated diaminomaleonitrile, 1.00% ammonium oxalate, 0.05% EO-PO polymer L81, 0.70% 1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) and deionized water, the balance being deionized water;
Combination 13:5.0% diglycolamine, 5.000% hydroxylamine, 0.25% cysteine, 0.025% water-soluble polymer A3, 2.50% tetramethylammonium hydroxide, 1.00% ethylenediamine tetraacetic acid, 0.50% of the amidoximated diaminomaleonitrile, 1.00% ammonium oxalate, 0.05% EO-PO polymer L81, 0.70% 1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) and deionized water, the balance being deionized water;
combination 14:5.0% diglycolamine, 5.000% hydroxylamine, 0.25% cysteine, 0.025% water-soluble polymer A4, 2.50% tetramethylammonium hydroxide, 1.00% ethylenediamine tetraacetic acid, 0.50% of the amidoximated diaminomaleonitrile, 1.00% ammonium oxalate, 0.05% EO-PO polymer L81, 0.70% 1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) and deionized water, the balance being deionized water;
combination 15:5.0% diglycolamine, 5.000% hydroxylamine, 0.25% cysteine, 0.025% water-soluble polymer A5, 2.50% tetramethylammonium hydroxide, 1.00% ethylenediamine tetraacetic acid, 0.50% of the amidoximated diaminomaleonitrile, 1.00% ammonium oxalate, 0.05% EO-PO polymer L81, 0.70% 1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) and deionized water, the balance being deionized water;
Combination 16:5.0% diglycolamine, 5.000% hydroxylamine, 0.25% cysteine, 0.025% water-soluble polymer A6, 2.50% tetramethylammonium hydroxide, 1.00% ethylenediamine tetraacetic acid, 0.50% of the amidoximated diaminomaleonitrile, 1.00% ammonium oxalate, 0.05% EO-PO polymer L81, 0.70% 1- (benzotriazole-1-methyl) -1- (2-methylbenzimidazole) and deionized water, the balance being deionized water;
the water-soluble polymer A1-A6 is as defined in claim 6.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202211414101.4A CN116042331B (en) | 2022-11-11 | 2022-11-11 | Application of cleaning liquid |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202211414101.4A CN116042331B (en) | 2022-11-11 | 2022-11-11 | Application of cleaning liquid |
Publications (2)
Publication Number | Publication Date |
---|---|
CN116042331A CN116042331A (en) | 2023-05-02 |
CN116042331B true CN116042331B (en) | 2024-03-08 |
Family
ID=86112234
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202211414101.4A Active CN116042331B (en) | 2022-11-11 | 2022-11-11 | Application of cleaning liquid |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN116042331B (en) |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104140507A (en) * | 2014-07-24 | 2014-11-12 | 山东大学 | Modified acrylamide water-soluble polymer containing super-long hydrophobic long chain and preparation method of modified acrylamide water-soluble polymer |
WO2015054464A1 (en) * | 2013-10-11 | 2015-04-16 | E. I. Du Pont De Nemours And Company | Removal composition for selectively removing hard mask and methods thereof |
WO2019019533A1 (en) * | 2017-07-25 | 2019-01-31 | 上海新阳半导体材料股份有限公司 | Cleaning agent and preparation method and use thereof |
CN112007618A (en) * | 2020-08-21 | 2020-12-01 | 山东大学 | Amidoxime group-containing three-dimensional cyclodextrin/graphene aerogel composite adsorption material and preparation method and application thereof |
WO2021135804A1 (en) * | 2019-12-31 | 2021-07-08 | 安集微电子科技(上海)股份有限公司 | Cleaning solution for plasma etching residue |
CN113186043A (en) * | 2021-04-27 | 2021-07-30 | 上海新阳半导体材料股份有限公司 | Fluorine-containing cleaning liquid composition and application thereof |
CN113430069A (en) * | 2020-03-23 | 2021-09-24 | 上海新阳半导体材料股份有限公司 | Low-hydroxylamine water-based cleaning solution, and preparation method and application thereof |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7144848B2 (en) * | 1992-07-09 | 2006-12-05 | Ekc Technology, Inc. | Cleaning compositions containing hydroxylamine derivatives and processes using same for residue removal |
-
2022
- 2022-11-11 CN CN202211414101.4A patent/CN116042331B/en active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2015054464A1 (en) * | 2013-10-11 | 2015-04-16 | E. I. Du Pont De Nemours And Company | Removal composition for selectively removing hard mask and methods thereof |
CN104140507A (en) * | 2014-07-24 | 2014-11-12 | 山东大学 | Modified acrylamide water-soluble polymer containing super-long hydrophobic long chain and preparation method of modified acrylamide water-soluble polymer |
WO2019019533A1 (en) * | 2017-07-25 | 2019-01-31 | 上海新阳半导体材料股份有限公司 | Cleaning agent and preparation method and use thereof |
WO2021135804A1 (en) * | 2019-12-31 | 2021-07-08 | 安集微电子科技(上海)股份有限公司 | Cleaning solution for plasma etching residue |
CN113430069A (en) * | 2020-03-23 | 2021-09-24 | 上海新阳半导体材料股份有限公司 | Low-hydroxylamine water-based cleaning solution, and preparation method and application thereof |
CN112007618A (en) * | 2020-08-21 | 2020-12-01 | 山东大学 | Amidoxime group-containing three-dimensional cyclodextrin/graphene aerogel composite adsorption material and preparation method and application thereof |
CN113186043A (en) * | 2021-04-27 | 2021-07-30 | 上海新阳半导体材料股份有限公司 | Fluorine-containing cleaning liquid composition and application thereof |
Also Published As
Publication number | Publication date |
---|---|
CN116042331A (en) | 2023-05-02 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN108485840B (en) | Cleaning formulation for removing residues on surfaces | |
TWI659088B (en) | Etching composition | |
CN1205655C (en) | Post chemical-mechanical planarization (CMP) cleaning composition | |
TWI710629B (en) | Compositions and methods for removing ceria particles from a surface | |
JP6707451B2 (en) | Cleaning formulation for removing surface residues | |
KR20080025697A (en) | Copper passivating post-chemical mechanical polishing cleaning composition and method of use | |
WO2002094462A1 (en) | Method for cleaning surface of substrate | |
CN107850859A (en) | For removing the stripping composition of photoresist on semiconductor substrate | |
CN112424327A (en) | Cleaning compositions containing corrosion inhibitors | |
CN113430072B (en) | Cobalt-compatible semi-aqueous cleaning solution for removing hard mask, preparation method and application thereof | |
CN113667552A (en) | Cleaning solution for copper damascene process | |
CN116042331B (en) | Application of cleaning liquid | |
CN115710536B (en) | Preparation method of cleaning liquid | |
CN115895792B (en) | Cleaning solution and kit | |
CN113430063B (en) | Cleaning solution for selectively removing hard mask, preparation method and application thereof | |
TW201835322A (en) | A cleaning solution comprising fluorine | |
CN113430066B (en) | Cleaning composition for selectively removing hard mask, preparation method and application thereof | |
CN113430069A (en) | Low-hydroxylamine water-based cleaning solution, and preparation method and application thereof | |
CN116218611B (en) | Polyimide cleaning fluid | |
CN116218612B (en) | Application of polyimide cleaning solution in cleaning semiconductor device | |
CN113430060B (en) | Tungsten compatible cleaning solution for removing hard mask, preparation method and application thereof | |
CN116218610B (en) | Preparation method of polyimide cleaning liquid | |
CN115725369B (en) | Application of cleaning fluid composition | |
CN115678693B (en) | Cleaning fluid composition and kit | |
CN113433807B (en) | Ion implantation photoresist cleaning solution, preparation method and application thereof |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant |