CN116026855A - Sample analysis system for solid particle inspection based on visual analysis - Google Patents

Sample analysis system for solid particle inspection based on visual analysis Download PDF

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CN116026855A
CN116026855A CN202310165100.9A CN202310165100A CN116026855A CN 116026855 A CN116026855 A CN 116026855A CN 202310165100 A CN202310165100 A CN 202310165100A CN 116026855 A CN116026855 A CN 116026855A
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sample
particles
volume
analysis
information
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罗陨飞
姜英
周璐
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Yingfei Zhixin Beijing Technology Co ltd
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Yingfei Zhixin Beijing Technology Co ltd
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Abstract

The invention discloses a sample analysis system for solid particle inspection based on visual analysis, which belongs to the field of solid particle analysis and is used for solving the problems of inaccurate solid particle analysis and influence on judgment effect, and specifically comprises the following steps: sample information during analysis of solid particles is obtained; the acquired sample information is transmitted to a sample analysis module to analyze the received sample information, and sample data is acquired; the sample data are transmitted to a data calculation module, and the data calculation module acquires qualified reference data of the sample based on the sample data; the sample analysis module sets a sample quality reference interval based on sample qualification reference data, and the invention obtains and analyzes sample information generated during visual analysis of solid particle samples, judges whether the samples are qualified or not according to data parameters obtained through analysis, and obtains the qualification rate of the samples, so that the solid particles are accurately analyzed during analysis, and the solid particle judgment accuracy is improved.

Description

Sample analysis system for solid particle inspection based on visual analysis
Technical Field
The invention belongs to the field of visual analysis, relates to a solid particle inspection analysis technology, and in particular relates to a sample analysis system for solid particle inspection based on visual analysis.
Background
Solid particles, including seeds and the like, need to be inspected, and in the inspection process, a sample of the solid particles needs to be analyzed, and currently, machine vision is mostly adopted to detect the solid particles.
In the prior art, when the visual analysis is performed on the solid particles, the judgment is usually performed according to the surface condition of the solid particles, but the judgment is inaccurate, the effective analysis and judgment can not be performed according to the sample information on the surface of the solid particles, and the accuracy of the solid particle analysis is affected.
Disclosure of Invention
In view of the shortcomings of the prior art, the invention aims to provide a sample analysis system for solid particle inspection based on visual analysis.
The technical problems to be solved by the invention are as follows:
based on the solid particles, in the visual analysis process, the known data of the solid particles cannot be acquired and judged according to the sample information of the solid particles, so that the analysis is inaccurate when the solid particles are analyzed, and the judging effect of the solid particles is affected.
The aim of the invention can be achieved by the following technical scheme: the sample analysis system for solid particle inspection based on visual analysis comprises a sample information acquisition module, a sample analysis module, a sample judgment module, a data calculation module, a sample recording module and a server; the sample information acquisition module, the sample analysis module, the sample judgment module, the data calculation module and the sample recording module are respectively connected with the server;
the server controls the sample information acquisition module to acquire sample information during analysis of the solid particles; the method comprises the steps that acquired sample information is conveyed to a sample analysis module, and the sample analysis module analyzes the received sample information to acquire sample data; the sample data are transmitted to a data calculation module, and the data calculation module acquires qualified reference data of the sample based on the sample data;
the obtained sample qualified reference data is transmitted to a sample analysis module, and the sample analysis module sets a sample quality reference interval based on the sample qualified reference data; the sample judging module judges whether the sample is qualified or not based on the sample quality reference interval to obtain a judging result; the sample recording module receives the judging result to record, the data calculating module calculates the qualification rate of the sample based on the recorded data, and the calculated result is transmitted to the sample recording module to record.
Further, the sample information includes sample shape information, sample weight information, sample picture information, and sample picture proportion information;
and conveying the sample shape information, the sample weight information, the sample picture information and the sample picture proportion information to a sample analysis module.
Further, the sample analysis module receives sample shape information, sample weight information, sample picture information and sample picture proportion information for analysis, and the specific analysis is as follows:
acquiring a sample shape according to the sample shape information, and selecting a proper volume calculation formula according to the sample shape;
measuring the distance of the sample particles according to a volume calculation formula, acquiring the volume of the sample particles, and recording the acquired volume as Vk;
observing the surface of a sample according to sample picture information, observing whether the sample particles in the picture information have defects, if the sample particles have no defects, not processing the sample particles, if the sample particles have the defects, observing the ratio of the distance of the defects to the distance of the pictures, acquiring the ratio of the sample pictures to the sample particles through sample picture proportion information, acquiring the actual distance of the defects, calculating the surface area of the defects according to the actual distance of the defects, estimating the volume of the defects according to the actual distance by observing the internal shape of the defects and the internal shape of the defects of the internal combined pictures, and recording the acquired volume of the defects as Vq;
acquiring an actual volume according to the acquired volumes Vk and Vq, and setting the actual volume as Vs, wherein vs=vk-Vq;
measuring the weight of each sample particle by the sample weight information, and recording the weight of the sample particle as my;
the volume, defect volume, actual volume and sample particle weight obtained by analysis are defined as sample data, and the sample data are transmitted to a data calculation module.
Further, when the volume calculation formula is selected, the following is specific:
if the shape of the sample is a sphere, the shape and the volume of the sample are obtained through the formula V= (4/3) pi r 3;
if the sample is rectangular, performing volume calculation by the formula v=abc, wherein a is the length of the rectangular, b is the width of the rectangular, and c is the height of the rectangular;
if the sample shape is square, passing through formula v=a3, where a is the side length of the square;
if the shape of the sample is irregular, the water absorption and the sinking and floating performance of the sample are judged based on the characteristics of the sample particles, if the sample particles do not absorb water and can generate sinking phenomenon in water, a measuring cup filled with a certain amount of aqueous solution is selected, the sample particles are placed in the measuring cup, the volume change of the aqueous solution in the measuring cup is observed to be the volume of the sample particles, if the sample particles do not absorb water and can generate floating phenomenon in water, the sample particles are fixed through the measuring cup with a fixing frame, a certain volume of aqueous solution is added in the measuring cup, the volume of the observation solution is v1, the sample particles are taken out, the volume of the observation solution is v2, the volume of the sample particles is v1-v2, if the sample particles absorb water and can generate sinking phenomenon in water, a waterproof film attached to the sample particles is adhered to the surface of the sample particles, the measuring cup is selected, the sample particles are placed in the measuring cup, the volume change of the aqueous solution in the measuring cup is the volume of the sample particles, if the sample particles absorb water and can generate floating phenomenon in water, the sample particles are adhered to the surface of the sample particles, the sample particles is fixed through the fixing frame, the volume of the sample particles is v3, and the volume of the sample particles is observed, and v4 is obtained by fixing frame, and the volume is obtained by fixing frame, and v is obtained by the volume 3.
Further, the data calculation module receives the actual volume and the weight of the sample particles to acquire a sample particle reference density value, and a plurality of sample particle reference density values are acquired according to a plurality of sample particles;
the data calculation module receives the acquired volume and acquires the ratio of the defect volume to the defect volume; obtaining a plurality of defect volume ratios based on the plurality of sample particles;
and defining the obtained defect volume ratio and the sample particle reference density value as sample qualified reference data, and conveying the sample qualified reference data to a sample analysis module.
Further, the sample analysis module receives the defect volume ratio, sets a first duty ratio interval, a second duty ratio interval and a third duty ratio interval, defines the defect volume ratio in the third duty ratio interval as an unqualified volume ratio, acquires corresponding sample particles according to the defect volume ratio, and defines the sample particles as unqualified samples;
obtaining a standard density value through a server, obtaining a quality judgment value, obtaining a plurality of quality judgment values, and setting a first quality threshold value, a second quality threshold value and a third quality threshold value based on the plurality of quality judgment values; the value in the first good and bad threshold is smaller than the value in the second good and bad threshold, and the value in the second good and bad threshold is smaller than the value in the third good and bad threshold;
and recording the number of the sample particles in the third duty ratio interval and the third good and bad threshold value through a sample recording module, and conveying the first good and bad threshold value, the second good and bad threshold value and the third good and bad threshold value to a sample judging module.
Further, the sample judgment module receives a first good and bad threshold, a second good and bad threshold and a third good and bad threshold, and defines sample particles corresponding to good and bad judgment values in the first good and bad threshold as excellent sample particles, and defines sample particles corresponding to good and bad judgment values in the second good and bad threshold as qualified sample particles; and defining the sample particles corresponding to the quality judgment value in the third quality threshold as unqualified sample particles.
Further, the sample recording module counts the number of the sample particles in the third duty ratio interval and the third quality threshold, the total number of the sample particles is obtained through the server, the data calculation module receives the number of the sample particles in the recorded data and the total number of the sample particles to obtain the reject ratio, the sample percent of pass is obtained according to the reject ratio, and the sample percent of pass is recorded through the sample recording module.
Compared with the prior art, the invention has the beneficial effects that:
according to the invention, based on sample information generated during visual analysis of the solid particle sample, analysis is performed according to the sample information, the sample qualified reference data is acquired through data parameters obtained through analysis, the sample quality reference interval is set based on the sample qualified reference data, and whether the sample is qualified or not is judged based on the sample quality reference interval, so that the qualification rate of the sample is obtained, the analysis is accurate during the analysis of the solid particles, and the solid particle judgment accuracy is improved.
According to the invention, the shape information of the sample is locally acquired, a corresponding volume calculation formula is selected, the surface defects of the sample particles are acquired according to the picture information of the sample, the surface defect volume of the sample particles is estimated, the density information of the sample particles is acquired, the defect occupation ratio is acquired according to the defect volume and the sample volume, the difference between the sample and the standard density value is acquired according to the density information of the sample, and the quality of the sample particles is comprehensively judged.
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The present invention is further described below with reference to the accompanying drawings for the convenience of understanding by those skilled in the art.
FIG. 1 is an overall system block diagram of a sample analysis system for solid particle testing based on visual analysis of the present invention;
FIG. 2 is a diagram of the method steps of the sample analysis system for solid particle testing based on visual analysis of the present invention.
Detailed Description
The technical solutions of the present invention will be clearly and completely described in connection with the embodiments, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Referring to fig. 1 and 2, a sample analysis system for inspecting solid particles based on visual analysis includes a sample information acquisition module, a sample analysis module, a sample judgment module, a data calculation module, a sample recording module and a server; the sample information acquisition module, the sample analysis module, the sample judgment module, the data calculation module and the sample recording module are respectively connected with the server;
in this embodiment, when analyzing the solid particles, the server controls the sample information acquisition module to acquire sample information when analyzing the solid particles;
the sample information comprises sample shape information, sample weight information, sample picture information and sample picture proportion information;
sample shape information, sample weight information, sample picture information and sample picture proportion information; delivering to a sample analysis module;
the acquired sample information is transmitted to a sample analysis module, and the sample analysis module analyzes the received sample information to acquire sample data;
the sample analysis module receives the sample shape information, the sample weight information, the sample picture information and the sample picture proportion information for analysis, and the specific analysis is as follows:
acquiring a sample shape according to the sample shape information, and selecting a proper volume calculation formula according to the sample shape;
when the volume calculation formula is selected, the following is specific:
if the shape of the sample is a sphere, the shape and the volume of the sample are obtained through the formula V= (4/3) pi r 3;
if the sample is rectangular, performing volume calculation by the formula v=abc, wherein a is the length of the rectangular, b is the width of the rectangular, and c is the height of the rectangular;
if the sample shape is square, passing through formula v=a3, where a is the side length of the square;
if the shape of the sample is irregular, judging the water absorption and the sinking and floating performance of the sample based on the characteristics of the sample particles, if the sample particles do not absorb water and can generate sinking phenomenon in water, selecting a measuring cup filled with a certain amount of aqueous solution, placing the sample particles into the measuring cup, observing the volume change of the aqueous solution in the measuring cup to be the volume of the sample particles, if the sample particles do not absorb water and can generate floating phenomenon in water, fixing the sample particles through the measuring cup with a fixing frame, adding a certain volume of aqueous solution into the measuring cup, observing the volume of the solution to be v1, taking out the sample particles, observing the volume of the solution to be v2, if the sample particles absorb water and can generate sinking phenomenon in water, adhering a waterproof film attached to the sample particles on the surface of the sample particles, selecting a measuring cup filled with a certain amount of aqueous solution, placing the sample particles into the measuring cup, observing the volume change of the aqueous solution in the measuring cup to be the volume of the sample particles, and if the sample particles absorb water and can generate floating phenomenon in water, fixing the sample particles through the measuring cup, and the volume of the sample particles is v3, and the sample particles are observed to be v4, and the volume is fixed through the fixing frame, and v is the volume of the sample particles is observed by the volume 3;
measuring the distance of the sample particles according to a volume calculation formula, acquiring the volume of the sample particles, and recording the acquired volume as Vk;
observing the surface of a sample according to sample picture information, observing whether the sample particles in the picture information have defects, if the sample particles have no defects, not processing the sample particles, if the sample particles have the defects, observing the ratio of the distance of the defects to the distance of the pictures, acquiring the ratio of the sample pictures to the sample particles through sample picture proportion information, acquiring the actual distance of the defects, calculating the surface area of the defects according to the actual distance of the defects, estimating the volume of the defects according to the actual distance by observing the internal shape of the defects and the internal shape of the defects of the internal combined pictures, and recording the acquired volume of the defects as Vq;
acquiring an actual volume according to the acquired volumes Vk and Vq, and setting the actual volume as Vs, wherein vs=vk-Vq;
measuring the weight of each sample particle by the sample weight information, and recording the weight of the sample particle as my;
defining the volume, the defect volume, the actual volume and the weight of the sample particles obtained by analysis as sample data, and transmitting the sample data to a data calculation module;
the sample data are transmitted to a data calculation module, and the data calculation module acquires qualified reference data of the sample based on the sample data;
the data calculation module receives the actual volume and the weight of the sample particles to acquire a sample particle reference density value, and sets the sample particle reference density value as follows: YPCKMDz;
YPCKMDz = my/Vs;
obtaining a plurality of sample particle reference density values from a plurality of sample particles;
the data calculation module receives the acquired volume and acquires the ratio of the defect volume to the defect volume;
the defect volume ratio is set as follows: QXTBz; qxtbz=vq/Vk;
obtaining a plurality of defect volume ratios based on the plurality of sample particles;
defining the obtained defect volume ratio and the sample particle reference density value as sample qualified reference data, and conveying the sample qualified reference data to a sample analysis module;
the acquired sample qualified reference data is transmitted to a sample analysis module, and the sample analysis module sets a sample quality reference interval based on the sample qualified reference data;
the sample analysis module receives the defect volume ratio, sets a first duty ratio interval, a second duty ratio interval and a third duty ratio interval, defines the defect volume ratio in the third duty ratio interval as an unqualified volume ratio, acquires corresponding sample particles according to the defect volume ratio, and defines the sample particles as unqualified samples;
the method comprises the steps that a standard density value is obtained through a server, the volume ratio of each defect in a first duty ratio interval and a second duty ratio interval and a corresponding sample particle reference density value are obtained, a good and bad judgment value is obtained, and the good and bad judgment value is set as follows: yl pdz; the standard density values are: BZMDz; the specific calculation formula is as follows:
YLPDz=QXTBz×|YPCKMDz-BZMDz|;
acquiring a plurality of good and bad judgment values, and setting a first good and bad threshold value, a second good and bad threshold value and a third good and bad threshold value based on the good and bad judgment values;
the value in the first good and bad threshold is smaller than the value in the second good and bad threshold, and the value in the second good and bad threshold is smaller than the value in the third good and bad threshold;
the sample judging module judges whether the sample is qualified or not based on the sample quality reference interval to obtain a judging result;
the sample judgment module receives the first good and bad threshold, the second good and bad threshold and the third good and bad threshold, and defines sample particles corresponding to the good and bad judgment values in the first good and bad threshold as excellent sample particles, and defines sample particles corresponding to the good and bad judgment values in the second good and bad threshold as qualified sample particles; and defining the sample particles corresponding to the quality judgment value in the third quality threshold as unqualified sample particles.
The sample recording module receives the judging result to record, the data calculating module calculates the qualification rate of the sample based on the recorded data, and the calculated result is transmitted to the sample recording module to record.
The sample recording module counts the number of the sample particles in the third duty ratio interval and the third quality threshold, the total number of the sample particles is obtained through the server, the data calculation module receives the number of the sample particles in the recorded data and the total number of the sample particles to obtain the disqualified rate, the qualified rate of the sample is obtained according to the disqualified rate, and the qualified rate of the sample is recorded through the sample recording module.
Examples: a sample analysis system for solid particle testing based on visual analysis, comprising the steps of:
step S1: acquiring sample information during analysis of solid particles, conveying the acquired sample information to a sample analysis module, and analyzing the received sample information by the sample analysis module to acquire sample data;
the sample information comprises sample shape information, sample weight information, sample picture information and sample picture proportion information;
the sample analysis module receives the sample shape information, the sample weight information, the sample picture information and the sample picture proportion information in the sample information for analysis, and the specific analysis steps are as follows:
step S11: acquiring a sample shape according to the sample shape information, and selecting a proper volume calculation formula according to the sample shape;
step S12: measuring the distance of the sample particles according to a volume calculation formula, acquiring the volume of the sample particles, and recording the acquired volume as Vk;
step S13: observing the surface of a sample according to sample picture information, observing whether the sample particles in the picture information have defects, if the sample particles have no defects, not processing the sample particles, if the sample particles have the defects, observing the ratio of the distance of the defects to the distance of the pictures, acquiring the ratio of the sample pictures to the sample particles through sample picture proportion information, acquiring the actual distance of the defects, calculating the surface area of the defects according to the actual distance of the defects, estimating the volume of the defects according to the actual distance by observing the internal shape of the defects and the internal shape of the defects of the internal combined pictures, and recording the acquired volume of the defects as Vq;
step S14: acquiring an actual volume according to the acquired volumes Vk and Vq, and setting the actual volume as Vs, wherein vs=vk-Vq; measuring the weight of each sample particle by the sample weight information, and recording the weight of the sample particle as my;
step S15: defining the volume, the defect volume, the actual volume and the weight of the sample particles obtained by analysis as sample data, and transmitting the sample data to a data calculation module;
in step S11, when the volume calculation formula is selected, the specific steps are as follows:
step S111: if the shape of the sample is a sphere, the shape and the volume of the sample are obtained through the formula V= (4/3) pi r 3;
step S112: if the sample is rectangular, performing volume calculation by the formula v=abc, wherein a is the length of the rectangular, b is the width of the rectangular, and c is the height of the rectangular;
step S113: if the sample shape is square, passing through formula v=a3, where a is the side length of the square;
step S114: if the shape of the sample is irregular, judging the water absorbability and the sinking and floating property of the sample based on the characteristics of the sample particles, if the sample particles do not absorb water and can sink in water, selecting a measuring cup containing a certain amount of aqueous solution, placing the sample particles into the measuring cup, observing the volume change of the aqueous solution in the measuring cup to obtain the volume of the sample particles,
step S115: if the sample particles do not absorb water and float up in water, the sample particles are fixed by a measuring cup with a fixing frame, a certain volume of aqueous solution is added into the measuring cup, the volume of the observation solution is v1, the sample particles are taken out, the volume of the observation solution is v2, the volume of the sample particles is v1-v2,
step S116: if the sample particles absorb water and simultaneously sink in water, a waterproof film attached to the sample particles is adhered to the surfaces of the sample particles, a measuring cup filled with a certain amount of aqueous solution is selected, the sample particles are placed into the measuring cup, the volume change of the aqueous solution in the measuring cup is observed to be the volume of the sample particles,
step S117: if the sample particles absorb water and float in water, a waterproof film attached to the sample particles is adhered to the surfaces of the sample particles, the sample particles are fixed through a measuring cup with a fixing frame, a certain volume of aqueous solution is added into the measuring cup, the volume of the observed solution is v3, the sample particles are taken out, the volume of the observed solution is v4, and the volume of the sample particles is v3-v4.
Step S2: the sample data are transmitted to a data calculation module, and the data calculation module acquires qualified reference data of the sample based on the sample data;
the data calculation module receives the actual volume and the weight of the sample particles to acquire a sample particle reference density value, and a plurality of sample particle reference density values are acquired according to a plurality of sample particles;
the data calculation module receives the acquired volumes and the defect volumes to acquire the defect volume ratio, and acquires a plurality of defect volume ratios based on a plurality of sample particles;
defining the obtained defect volume ratio and the sample particle reference density value as sample qualified reference data, and conveying the sample qualified reference data to a sample analysis module;
step S3: the acquired sample qualified reference data is transmitted to a sample analysis module, and the sample analysis module sets a sample quality reference interval based on the sample qualified reference data;
when the sample analysis module analyzes the good and bad intervals, the specific steps are as follows:
step S31: the sample analysis module receives the defect volume ratio, sets a first duty ratio interval, a second duty ratio interval and a third duty ratio interval, defines the defect volume ratio in the third duty ratio interval as an unqualified volume ratio, acquires corresponding sample particles according to the defect volume ratio, and defines the sample particles as unqualified samples;
step S32: obtaining a standard density value through a server, and obtaining each defect volume ratio of a first duty ratio interval and a second duty ratio interval and a corresponding sample particle reference density value to obtain a quality judgment value;
step S33: a plurality of good and bad judgment values are obtained, and a first good and bad threshold value, a second good and bad threshold value and a third good and bad threshold value are set based on the good and bad judgment values.
Step S4: the sample judging module judges whether the sample is qualified or not based on the sample quality reference section to obtain a judging result, the sample recording module receives the judging result to record, the data calculating module calculates the sample qualification rate based on the recorded data, and the calculating result is transmitted to the sample recording module to record.
The sample judgment module receives the first good and bad threshold, the second good and bad threshold and the third good and bad threshold, and defines sample particles corresponding to the good and bad judgment values in the first good and bad threshold as excellent sample particles;
defining sample particles corresponding to the quality judgment value in the second quality threshold as qualified sample particles;
and defining the sample particles corresponding to the quality judgment value in the third quality threshold as unqualified sample particles.
The sample recording module counts the number of the sample particles in the third duty ratio interval and the third quality threshold;
the method comprises the steps that the total number of sample particles is obtained through a server, the number of the sample particles in recorded data is received by a data calculation module, and the total number of the sample particles is obtained through the ratio of disqualification occupation;
and obtaining the qualification rate of the sample according to the disqualification rate, and recording the qualification rate of the sample by a sample recording module.
The preferred embodiments of the invention disclosed above are intended only to assist in the explanation of the invention. The preferred embodiments are not intended to be exhaustive or to limit the invention to the precise form disclosed. Obviously, many modifications and variations are possible in light of the above teaching. The embodiments were chosen and described in order to best explain the principles of the invention and the practical application, to thereby enable others skilled in the art to best understand and utilize the invention. The invention is limited only by the claims and the full scope and equivalents thereof.

Claims (8)

1. The sample analysis system for solid particle inspection based on visual analysis is characterized by comprising a sample information acquisition module, a sample analysis module, a sample judgment module, a data calculation module, a sample recording module and a server;
the server controls the sample information acquisition module to acquire sample information during analysis of the solid particles; the method comprises the steps that acquired sample information is conveyed to a sample analysis module, and the sample analysis module analyzes the received sample information to acquire sample data;
the sample data are transmitted to a data calculation module, and the data calculation module acquires qualified reference data of the sample based on the sample data; the obtained sample qualified reference data is transmitted to a sample analysis module, and the sample analysis module sets a sample quality reference interval based on the sample qualified reference data; the sample judging module judges whether the sample is qualified or not based on the sample quality reference interval to obtain a judging result;
the sample recording module receives the judging result to record, the data calculating module calculates the qualification rate of the sample based on the recorded data, and the calculated result is transmitted to the sample recording module to record.
2. The sample analysis system for solid particle testing based on visual analysis according to claim 1, wherein the sample information comprises sample shape information, sample weight information, sample picture information, and sample picture proportion information;
and conveying the sample shape information, the sample weight information, the sample picture information and the sample picture proportion information to a sample analysis module.
3. The sample analysis system for solid particle testing based on visual analysis according to claim 2, wherein the sample analysis module receives sample shape information, sample weight information, sample picture information, and sample picture proportion information for analysis, and the specific analysis is as follows:
acquiring a sample shape according to the sample shape information, and selecting a proper volume calculation formula according to the sample shape;
measuring the distance of the sample particles according to a volume calculation formula, acquiring the volume of the sample particles, and recording the acquired volume as Vk;
observing the surface of a sample according to sample picture information, observing whether the sample particles in the picture information have defects, if the sample particles have no defects, not processing the sample particles, if the sample particles have the defects, observing the ratio of the distance of the defects to the distance of the pictures, acquiring the ratio of the sample pictures to the sample particles through sample picture proportion information, acquiring the actual distance of the defects, calculating the surface area of the defects according to the actual distance of the defects, estimating the volume of the defects according to the actual distance by observing the internal shape of the defects and the internal shape of the defects of the internal combined pictures, and recording the acquired volume of the defects as Vq;
acquiring an actual volume according to the acquired volumes Vk and Vq, and setting the actual volume as Vs, wherein vs=vk-Vq;
measuring the weight of each sample particle by the sample weight information, and recording the weight of the sample particle as my;
the volume, defect volume, actual volume and sample particle weight obtained by analysis are defined as sample data, and the sample data are transmitted to a data calculation module.
4. A sample analysis system for solid particle testing based on visual analysis according to claim 3, wherein when selecting the volumetric calculation formula, the following is specified:
if the shape of the sample is a sphere, the shape and the volume of the sample are obtained through the formula V= (4/3) pi r 3;
if the sample is rectangular, performing volume calculation by the formula v=abc, wherein a is the length of the rectangular, b is the width of the rectangular, and c is the height of the rectangular;
if the sample shape is square, passing through formula v=a3, where a is the side length of the square;
if the shape of the sample is irregular, the water absorption and the sinking and floating performance of the sample are judged based on the characteristics of the sample particles, if the sample particles do not absorb water and can generate sinking phenomenon in water, a measuring cup filled with a certain amount of aqueous solution is selected, the sample particles are placed in the measuring cup, the volume change of the aqueous solution in the measuring cup is observed to be the volume of the sample particles, if the sample particles do not absorb water and can generate floating phenomenon in water, the sample particles are fixed through the measuring cup with a fixing frame, a certain volume of aqueous solution is added in the measuring cup, the volume of the observation solution is v1, the sample particles are taken out, the volume of the observation solution is v2, the volume of the sample particles is v1-v2, if the sample particles absorb water and can generate sinking phenomenon in water, a waterproof film attached to the sample particles is adhered to the surface of the sample particles, the measuring cup is selected, the sample particles are placed in the measuring cup, the volume change of the aqueous solution in the measuring cup is the volume of the sample particles, if the sample particles absorb water and can generate floating phenomenon in water, the sample particles are adhered to the surface of the sample particles, the sample particles is fixed through the fixing frame, the volume of the sample particles is v3, and the volume of the sample particles is observed, and v4 is obtained by fixing frame, and the volume is obtained by fixing frame, and v is obtained by the volume 3.
5. The sample analysis system for solid particle testing based on visual analysis of claim 3, wherein the data calculation module receives the actual volume and the sample particle weight to obtain a sample particle reference density value, and obtains a plurality of sample particle reference density values from a plurality of sample particles;
the data calculation module receives the acquired volume and acquires the ratio of the defect volume to the defect volume; obtaining a plurality of defect volume ratios based on the plurality of sample particles;
and defining the obtained defect volume ratio and the sample particle reference density value as sample qualified reference data, and conveying the sample qualified reference data to a sample analysis module.
6. The sample analysis system for inspecting solid particles based on visual analysis according to claim 5, wherein the sample analysis module receives the defective volume ratio to set a first duty cycle interval, a second duty cycle interval, and a third duty cycle interval, defines the defective volume ratio in the third duty cycle interval as a defective volume ratio, obtains corresponding sample particles according to the defective volume ratio, and defines the sample particles as a defective sample;
obtaining a standard density value through a server, obtaining a quality judgment value, obtaining a plurality of quality judgment values, and setting a first quality threshold value, a second quality threshold value and a third quality threshold value based on the plurality of quality judgment values; the value in the first good and bad threshold is smaller than the value in the second good and bad threshold, and the value in the second good and bad threshold is smaller than the value in the third good and bad threshold;
and recording the number of the sample particles in the third duty ratio interval and the third good and bad threshold value through a sample recording module, and conveying the first good and bad threshold value, the second good and bad threshold value and the third good and bad threshold value to a sample judging module.
7. The sample analysis system for inspecting solid particles based on visual analysis according to claim 6, wherein the sample judgment module receives a first quality threshold, a second quality threshold, and a third quality threshold, wherein the sample particles corresponding to the quality judgment value in the first quality threshold are defined as excellent sample particles, and the sample particles corresponding to the quality judgment value in the second quality threshold are defined as qualified sample particles; and defining the sample particles corresponding to the quality judgment value in the third quality threshold as unqualified sample particles.
8. The sample analysis system for solid particle inspection based on visual analysis according to claim 6, wherein the sample recording module counts the number of sample particles in a third duty cycle interval and a third quality threshold, the total number of sample particles is obtained through a server, the total number of sample particles in the recorded data and the ratio of the total number of sample particles to the fraction of disqualified are received by the data calculation module, the sample qualification rate is obtained according to the ratio of the fraction of disqualified, and the sample qualification rate is recorded by the sample recording module.
CN202310165100.9A 2023-02-27 2023-02-27 Sample analysis system for solid particle inspection based on visual analysis Pending CN116026855A (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117606384A (en) * 2023-11-20 2024-02-27 浙江数瞳智能科技有限公司 MEMS micro-mirror piezoelectric crystal finished product detection system based on data analysis
CN117907533A (en) * 2023-12-22 2024-04-19 山东山田新材科研有限公司 Fine particle silica flour activity measurement system

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6438261B1 (en) * 1998-09-03 2002-08-20 Green Vision Systems Ltd. Method of in-situ focus-fusion multi-layer spectral imaging and analysis of particulate samples
CN109598715A (en) * 2018-12-05 2019-04-09 山西镭谱光电科技有限公司 Material size online test method based on machine vision
CN110907317A (en) * 2018-09-14 2020-03-24 中石化石油工程技术服务有限公司 Rock particle analysis method, device, equipment and computer readable storage equipment
CN111398294A (en) * 2020-04-16 2020-07-10 沈阳农业大学 Straw particle defect detection system and detection method based on machine vision

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6438261B1 (en) * 1998-09-03 2002-08-20 Green Vision Systems Ltd. Method of in-situ focus-fusion multi-layer spectral imaging and analysis of particulate samples
CN110907317A (en) * 2018-09-14 2020-03-24 中石化石油工程技术服务有限公司 Rock particle analysis method, device, equipment and computer readable storage equipment
CN109598715A (en) * 2018-12-05 2019-04-09 山西镭谱光电科技有限公司 Material size online test method based on machine vision
CN111398294A (en) * 2020-04-16 2020-07-10 沈阳农业大学 Straw particle defect detection system and detection method based on machine vision

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117606384A (en) * 2023-11-20 2024-02-27 浙江数瞳智能科技有限公司 MEMS micro-mirror piezoelectric crystal finished product detection system based on data analysis
CN117606384B (en) * 2023-11-20 2024-05-03 浙江数瞳智能科技有限公司 MEMS micro-mirror piezoelectric crystal finished product detection system based on data analysis
CN117907533A (en) * 2023-12-22 2024-04-19 山东山田新材科研有限公司 Fine particle silica flour activity measurement system

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