CN116008692A - Microwave electric field measurement probe device and use method - Google Patents
Microwave electric field measurement probe device and use method Download PDFInfo
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- CN116008692A CN116008692A CN202211608675.5A CN202211608675A CN116008692A CN 116008692 A CN116008692 A CN 116008692A CN 202211608675 A CN202211608675 A CN 202211608675A CN 116008692 A CN116008692 A CN 116008692A
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Abstract
The application discloses a microwave electric field measurement probe device and a using method thereof, wherein the device comprises: an atomic vapor chamber; the end part of the atomic vapor chamber is connected with a dual-wavelength beam-splitting prism, and one end of the dual-wavelength beam-splitting prism, which is far away from the atomic vapor chamber, is connected with an input coupling optical fiber collimation assembly and an output signal optical fiber collimation assembly; an input detection light optical fiber component is connected to the atomic vapor chamber; the input detection light optical fiber component is connected to one end of the atomic vapor chamber, which is far away from the dual-wavelength beam splitter prism, and the input detection light optical fiber component, the output signal light optical fiber collimation component and the atomic vapor chamber are positioned on the same axis; the detection light can pass through the dual-wavelength beam splitting prism to enter the output signal light optical fiber collimation assembly; the coupled light into the atomic vapor chamber can coincide with the probe light within the atomic vapor chamber that can pass through the dual wavelength dichroic prism. The purpose of improving the light collection efficiency and the use flexibility is achieved.
Description
Technical Field
The application relates to the technical field of microwave electric field measurement, in particular to a microwave electric field measurement probe device based on an optical fiber coupling atomic vapor chamber structure and a use method thereof.
Background
The traditional quantum electric field probe has low integration level, is unstable, is not easy to move, and is difficult to realize microwave electric field test in a narrow space. And the light path formed by placing the optical lenses based on free space is easy to be subjected to vibration transmission of the optical element mounting frame, so that the superposition degree of the double light beams is influenced, the superposition degree of the light beams of 509nm and 852nm can be influenced by the direction change, and as only atoms in the superposition area of the light beams can induce a microwave electric field, the volume reduction of the superposition area can cause the change of the number of sensing units (Redburg atoms) for receiving the electric field, the electric field measurement signal is reduced, and further, the spectrum splitting signal induced by the electric field intensity is influenced. Although there are samples with optical fibers connected into the atomic gas chamber, the collection efficiency of the detection signal light is low, and the measurable minimum field intensity and the signal-to-noise ratio are limited. Also, in the direction away from the microwave field source inside the gas cell, the field strength does not decrease with increasing distance, but there are multiple maxima and minima, and the higher the frequency, the greater the difference in the electric field strength at locations on different optical paths, so that a change in the beam pointing path will result in a change in the measured field strength.
The original straight-through atomic electric field probe scheme is shown in the following figure 1, because the input collimation part of 509nm and the output coupling part of 852nm are both through the collimation lens part A2, the dispersion is different when passing through clens collimation or clens coupling because the wavelength values of 509nm and 852nm are different, so that the focusing focal positions are different, in order to enhance the induction microwave electric field signals, when ensuring that 509nm parallel light beams and 852nm are overlapped in a vapor chamber, the output efficiency of 852nm from an A2 port is reduced to 50%, and the WDM of an additional optical fiber is used for separating 509nm laser and 852nm laser, the loss of the device is about 40-50%, namely the maximum efficiency of WDM is 60%. In practice, the through-flow scheme can be only 30% at maximum. The connection loss between the probe and the optical fiber WDM is not considered at this time. The original optical fibers at the left and right sides of the straight-through connection point are used for ensuring that 852nm and 509nm are used simultaneously, PM630 optical fibers are used, the transmittance at 852nm is 80%, and the transmittance at 509nm is 70%.
Disclosure of Invention
The embodiment of the specification provides a microwave electric field measurement probe device and a use method thereof, which solve the problems of low optical signal collection efficiency and inflexible use of a single structure in the prior art.
For this purpose, the embodiment of the present specification provides the following scheme:
in one aspect, an embodiment of the present application provides a microwave electric field measurement probe apparatus, including: an atomic vapor chamber. The end part of the atomic vapor chamber is connected with a dual-wavelength beam-splitting prism, and one end of the dual-wavelength beam-splitting prism, which is far away from the atomic vapor chamber, is connected with an input coupling optical fiber collimation assembly and an output signal optical fiber collimation assembly; and the atomic vapor chamber is connected with an input detection light optical fiber assembly.
And the input coupling light fiber collimation component is used for receiving coupling light, and the dual-wavelength beam splitting prism can reflect the coupling light into the atomic vapor chamber. And the output signal light optical fiber collimation assembly is used for outputting detection light. And the input detection light optical fiber component is used for transmitting detection light to the atomic vapor chamber.
The end part of the atomic vapor chamber is connected with a dual-wavelength beam-splitting prism, and one end of the dual-wavelength beam-splitting prism, which is far away from the atomic vapor chamber, is connected with an input coupling optical fiber collimation assembly and an output signal optical fiber collimation assembly; and the atomic vapor chamber is connected with an input detection light optical fiber assembly.
The input detection light optical fiber component is connected to one end of the atomic vapor chamber, which is far away from the dual-wavelength beam splitting prism, and the input detection light optical fiber component, the output signal light optical fiber collimation component and the atomic vapor chamber are positioned on the same axis; or the input detection light fiber component and the dual-wavelength beam splitter prism are connected to the same end of the atomic vapor chamber, and one end of the atomic vapor chamber, which is far away from the dual-wavelength beam splitter prism, is connected with a pyramid reflector.
The detection light can pass through the dual-wavelength beam splitting prism to enter the output signal light optical fiber collimation assembly, and the detection light can pass through the pyramid reflector to enter the atomic vapor chamber.
Further, the atomic vapor chamber is in a cylinder structure, and the end face of the atomic vapor chamber is provided with an optical antireflection film.
Further, the dual-wavelength beam-splitting prism comprises a right-angle triangular prism and an inclined triangular prism, wherein the right-angle triangular prism comprises a right-angle surface and a triangular prism inclined surface, and the inclined triangular prism comprises an incident coupling light narrow surface, an emergent light narrow surface and an inclined triangular prism inclined surface;
the inclined quadrangular prism inclined plane is connected with the right triangular prism inclined plane; the emergent light narrow surface is connected with the atomic vapor chamber; the incident coupling light narrow surface is connected with the input coupling light optical fiber collimation component;
the right angle surface, the incident coupling light narrow surface and the emergent light narrow surface are provided with light antireflection films; the triangular prism inclined plane and the triangular prism inclined plane are provided with a detection light antireflection film and a coupling light high reflection film.
Furthermore, the emergent light narrow surface and the atomic vapor chamber are bonded in a seamless mode through optical cement.
Furthermore, the narrow surface of the incident coupling light and the collimating component of the input coupling light optical fiber are bonded through high-strength ultraviolet glue.
Further, the inclined quadrangular prism inclined plane is bonded with the right triangular prism inclined plane through optical cement.
Further, the output signal light optical fiber collimation assembly comprises a fixed coaxial glass tube, a C-shaped lens and an optical fiber end face, wherein the C-shaped lens and the optical fiber end face are arranged in the fixed coaxial glass tube at intervals, and the angle face of the C-shaped lens is parallel to the angle face of the optical fiber end face.
Further, if the input probe optical fiber assembly and the dual-wavelength beam splitting prism are connected to the same end of the atomic vapor chamber, the pyramid reflector comprises a laser incident surface, a first reflecting inclined surface and a second reflecting inclined surface;
the laser incidence surface is provided with a light antireflection film, the first reflection inclined surface and the second reflection inclined surface are provided with a high reflection film for detecting light and a high transmission film for coupling light and are coated with black paint, and the laser incidence surface is connected with the atomic vapor chamber.
Further, the atomic vapor chamber, the dual-wavelength beam splitting prism, the output signal optical fiber collimation assembly, the input coupling optical fiber collimation assembly and the input detection optical fiber assembly are all made of glass.
In another aspect, an embodiment of the present application provides a method for using a microwave electric field measurement probe apparatus, including the following steps: if the input detection light optical fiber component and the output signal light optical fiber collimation component are positioned at two ends of the atomic vapor chamber, the method comprises the following steps:
the detection light enters the atomic vapor chamber through the input detection light optical fiber collimation component;
after passing through the atomic vapor chamber, the light is transmitted into an output signal light optical fiber collimation assembly through a dual-wavelength beam splitting prism;
the coupling light passes through the input coupling light optical fiber collimation component to realize parallel light beams with large beam diameters, and then is reflected by the dual-wavelength beam splitting prism, enters into the atomic vapor chamber and is overlapped with the detection light to be emitted out of the atomic vapor chamber;
if the input detection optical fiber collimator and the output signal optical fiber collimation component are positioned at the same end of the atomic vapor chamber, the method comprises the following steps:
the detection light enters the atomic vapor chamber through the input detection light optical fiber collimation component;
after passing through the atomic vapor chamber, the detection light is reflected by the pyramid reflector and enters the atomic vapor chamber again;
after passing through the atomic vapor chamber again, the light is transmitted into the output signal light fiber assembly through the dual-wavelength beam splitting prism;
the coupling light passes through the input coupling light optical fiber collimation component to realize the parallel light beam with large beam diameter, and then is reflected by the dual-wavelength beam splitting prism, enters into the atomic vapor chamber and is overlapped with the detection light which is about to be emitted out of the atomic vapor chamber.
The above-mentioned at least one technical scheme that this application embodiment adopted can reach following beneficial effect:
the atomic electric field probe can realize low-loss detection laser transmission coupling, collect the induction intensity of the microwave electric field with high efficiency, obtain a spectrum signal with high signal-to-noise ratio, and improve the measurement sensitivity of the atomic electric field meter.
Compared with an electric field probe with a metal structure, the atomic electric field probe adopting full glass has low dielectric constant, and the interference of the electric field probe on the electric field of the detected microwave is reduced.
The optical fiber coupling type atomic vapor chamber packaged by the optical cement can avoid the poor reproducibility of the electric field amplitude caused by the atomic groups at different positions used for detection in the chamber due to the directional jitter of a free space optical path.
And the structure of all-optical glass optical cement bonding can ensure that the probe has the advantages of high temperature resistance and vibration resistance. The electric field probes with the reflective structures and the straight-through electric field probes can be arranged according to the requirements, so that the wiring paths can be conveniently arranged on site.
The collimating part and the output part are mutually independent, and the focusing parameters of the collimating part and the output part can be respectively adjusted, so that the coincidence of the detection light and the coupling light in the vapor chamber is ensured, and the output coupling efficiency can be improved. The method can realize measurement of field intensity in a narrow space, ensure consistency and stability of double-beam superposition, ensure that the beam path in the air chamber is unchanged when the atomic air chamber is arranged, and ensure consistency of measured electric field intensity. Meanwhile, by utilizing a small-sized dual-wavelength beam splitting prism designed by a pure free space type, the laser beam splitting of high-efficiency detection light and coupling light is realized, and by utilizing inclined plane reflection, the input and output laser beams are in the same axial direction, so that the tail fiber coupling straight-in and straight-out structure is convenient to arrange, excessive bending is avoided, and the use flexibility is improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below. It will be apparent to those of ordinary skill in the art that the drawings in the following description are exemplary only and that other implementations can be obtained from the extensions of the drawings provided without inventive effort.
The structures, proportions, sizes, etc. shown in the present specification are shown only for the purposes of illustration and description, and are not intended to limit the scope of the invention, which is defined by the claims, so that any structural modifications, changes in proportions, or adjustments of sizes, which do not affect the efficacy or the achievement of the present invention, should fall within the ambit of the technical disclosure.
In the drawings:
FIG. 1 is a schematic diagram of a conventional straight-through atomic electric field probe;
FIG. 2 is a schematic diagram of a possible structure of a microwave electric field measurement probe apparatus according to an embodiment of the present disclosure;
FIG. 3 is a schematic structural diagram of an input coupling optical fiber collimation assembly according to an embodiment of the present disclosure;
fig. 4 is a schematic structural diagram of a dual wavelength beam-splitting prism according to an embodiment of the present disclosure;
FIG. 5 is a schematic view of another possible structure of a microwave electric field measurement probe apparatus according to an embodiment of the present disclosure;
fig. 6 is a schematic diagram of a pyramid reflector according to an embodiment of the present disclosure.
Detailed Description
For the purposes, technical solutions and advantages of the present application, the technical solutions of the present application will be clearly and completely described below with reference to specific embodiments of the present application and corresponding drawings. It will be apparent that the described embodiments are only some, but not all, of the embodiments of the present application. All other embodiments, which can be made by one of ordinary skill in the art without undue burden from the present disclosure, are within the scope of the present disclosure.
The following describes in detail the technical solutions provided by the embodiments of the present application with reference to the accompanying drawings.
Example 1
Embodiment 1 of the present disclosure provides a microwave electric field measurement probe apparatus, please refer to fig. 2, including: an atomic vapor chamber 6, including but not limited to a cylindrical structure, provided with an optical antireflection film on the end face; the end part of the atomic vapor chamber is connected with a dual-wavelength beam splitter prism 5, one end of the dual-wavelength beam splitter prism, which is far away from the atomic vapor chamber, is connected with an input coupling optical fiber collimation assembly 4 and an output signal optical fiber collimation assembly 2, when in use, the input coupling optical fiber collimation assembly 4 is connected with the input coupling optical fiber 3, and the output signal optical fiber collimation assembly 2 is connected with the output signal optical fiber 1; an input detection light optical fiber component 7 is connected to the atomic vapor chamber, and when in use, the input detection light optical fiber component 7 is connected with an input detection light optical fiber 8; the input detection light optical fiber component 7 is connected to one end of the atomic vapor chamber 6 far away from the dual-wavelength beam splitting prism 5, and the input detection light optical fiber component, the output signal light optical fiber collimation component and the atomic vapor chamber are positioned on the same axis.
By way of further illustration, the coupling light fiber collimation assembly 4 is configured to receive coupling light and transmit the coupling light to a dual wavelength dichroic prism capable of reflecting the coupling light into an atomic vapor chamber; the output signal light optical fiber collimation assembly is used for outputting detection light; the input detection light optical fiber component is used for transmitting detection light to the atomic vapor chamber; the detection light can pass through the dual-wavelength beam splitting prism and enter the output signal light optical fiber collimation assembly; the coupled light into the atomic vapor chamber can coincide with the probe light within the atomic vapor chamber that can pass through the dual wavelength dichroic prism.
Further, referring to fig. 3, the output signal optical fiber collimating component 2 includes a fixed coaxial glass tube 21, and a C-shaped lens 22 and an optical fiber end surface 23 disposed in the fixed coaxial glass tube 21, wherein the C-shaped lens 22 and the optical fiber end surface 23 are disposed at intervals, and the angle surface of the C-shaped lens is parallel to the angle surface of the optical fiber end surface. (other fiber alignment assemblies are identical to this structure and will not be repeated here)
Further, referring to fig. 4, the dual wavelength beam splitter prism 5 includes a right triangular prism 51 and an oblique triangular prism 52, the right triangular prism includes a right angle surface 511 and a triangular prism inclined surface 512, and the oblique triangular prism 52 includes an incident coupling light narrow surface 521, an emergent light narrow surface 523 and an oblique triangular prism inclined surface 522; the inclined quadrangular prism inclined plane is connected with the right triangular prism inclined plane; the emergent light narrow surface is connected with the atomic vapor chamber; the narrow surface of the incident coupling light is connected with the optical fiber collimation component of the input coupling light; the right angle surface, the incident coupling light narrow surface and the emergent light narrow surface are provided with light antireflection films; the triangular prism inclined plane and the triangular prism inclined plane are provided with a detection light antireflection film and a coupling light high reflection film.
The emergent light narrow surface and the atomic vapor chamber are bonded by the photoresist in a seamless way. The narrow surface of the incident coupling light is bonded with the optical fiber collimation component of the input coupling light through high-strength ultraviolet glue. The inclined quadrangular prism inclined plane is bonded with the right triangular prism inclined plane through optical cement.
In one implementation, the wavelength of the detection light is 852nm, the wavelength of the coupling light is 509nm, the output signal light is 852nm, the input detection light and the input coupling light are used for preparing atoms from a ground state to a Redberg energy level, the laser frequency of the input detection light resonates at the atomic ground state and an intermediate excited state, and the frequency of the input coupling light continuously and periodically scans near the Redberg energy level.
The input detection light sequentially passes through the input detection light optical fiber, the input detection light optical fiber assembly, the atomic vapor chamber, the dual-wavelength beam splitting prism and the output signal light optical fiber collimation assembly and is output through the output signal optical fiber.
The input coupling light sequentially passes through the coupling light optical fiber, the input coupling light optical fiber assembly, the dual-wavelength beam splitting prism and the atomic vapor chamber. The coupling light and the detection light are overlapped in the space of the atomic vapor chamber and are reversely transmitted.
The coupling light and the probe light are overlapped at the right-angle triangular prism inclined surface 512 of the dual-wavelength spectroscopic prism 5, and at this surface, a 509nm high-reflectivity 852nm anti-reflection film is plated so that the coupling light achieves a high reflectivity at this surface, and the probe light achieves a high transmissivity.
The input detection light optical fiber component and the output signal light optical fiber component are collinear, so that high collection efficiency of signal light can be realized.
The coupling light is reflected by the two light-splitting inclined planes of the dual-wavelength light-splitting prism 5 in sequence, and enters the atomic vapor chamber through the emergent light narrow face 523.
The output laser of the optical fiber collimation assembly is a beam with a nearly parallel light spot diameter, and the beam diameter is 1mm.
The laser enters or outputs from the plane zero angle incidence, so that the laser transmission can be ensured not to generate refraction and the direction deviation of the light beam is generated. Even triangular surfaces reflect the laser when the laser passes through the prism, so that astigmatism can be avoided when the laser passes through the prism.
The inclined C-shaped lens with 8 degrees and the optical fiber with 8 degrees with polished end face are adopted to be spaced at a certain distance, and are adhered and fixed in the fixed coaxial glass tube 21, and the glass tube is encapsulated and sealed through the end face of the optical fiber. The two 8-degree angle surfaces are parallel, so that the light spots can be ensured not to deviate axially, and the light spots are transmitted into the atomic vapor chamber in parallel.
The end face of the atomic vapor chamber is plated with an antireflection film of 400-900 nm, so that the utilization rate of detection light is increased, the acquisition efficiency of signal light is improved, and the aim of improving the spectral signal-to-noise ratio of detection electric field information is fulfilled.
The atomic vapor chamber is a cesium atom vapor chamber, the inside of the atomic vapor chamber is a high vacuum environment, and the atoms are in saturated vapor pressure.
Example 2
In embodiment 2 of the present disclosure, a microwave electric field measuring probe device is provided, which is substantially the same as the embodiment, except that, referring to fig. 5, an input probe optical fiber assembly and a dual wavelength beam splitter prism are connected to the same end of an atomic vapor chamber, and a pyramid reflector 9 is connected to one end of the atomic vapor chamber away from the dual wavelength beam splitter prism. Further to the description, referring to fig. 6, the pyramid reflector includes a laser light incident surface 921, a first reflecting inclined surface 922, and a second reflecting inclined surface 923; the laser incidence surface is provided with a light antireflection film, the first reflection inclined surface and the second reflection inclined surface are provided with a high reflection film for detecting light and a high transmission film for coupling light and are coated with black paint, and the laser incidence surface is connected with the atomic vapor chamber. The atomic vapor chamber, the dual-wavelength beam splitting prism, the output signal optical fiber collimation component, the input coupling optical fiber collimation component and the input detection optical fiber component are all made of glass. The input detection light, the input coupling light and the output signal are all on the same side of the vapor chamber, three optical fibers can form a beam, the structure is compact, the carrying and the installation test are convenient, the pyramid reflector is fixed at the other end of the atomic vapor chamber, and the structure is stable and reliable.
In one possible implementation, the laser incidence plane 921 of the pyramid reflector is coated with an antireflection film of 400nm-900nm, the first reflecting inclined plane 922 and the second reflecting inclined plane 923 of the pyramid reflector are coated with a high reflecting film of probe light, a high transmitting film of coupling light, and a black paint.
All the components are of glass structure, have low dielectric constant and small interference to a microwave electric field, and can enhance the accuracy of microwave field intensity test. The input coupling optical fiber and the detection optical fiber adopt single-mode polarization maintaining optical fibers, so that the polarization direction of laser light is ensured. The output signal light optical fiber is a multimode optical fiber with a large fiber core diameter, so that the collection efficiency of the signal light can be increased, the signal to noise ratio of a spectrum signal is improved, and the utilization rate of detection laser is up to 80%.
The rotation angle of the optical fiber collimation component is changed, so that the polarization directions of the detection light and the coupling light are consistent, atoms can be in the same polarization direction, and the polarization high-sensitivity measurement of the microwave electric field is realized.
The collimating part of 509nm and the output part of 852nm are mutually independent, and the focusing parameters of the collimating part and the output part of 852nm can be respectively adjusted, so that the coincidence of light of 509nm and light of 852nm in a vapor chamber is ensured, and the output coupling efficiency of 852nm can be improved. Meanwhile, by utilizing a small-sized dual-wavelength beam splitting prism designed in a pure free space mode, high-efficiency laser beam splitting is realized, and by utilizing inclined plane reflection, input and output laser beams are in the same axial direction, so that the tail fiber coupling straight-in and straight-out structure is convenient to arrange and free from excessive bending. The transmittance is improved.
It should also be noted that the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article or apparatus that comprises the element.
It should be noted that, in the present application, "first" and "second" are used to distinguish a plurality of objects having the same name, and are not used to limit the order or the size. Unless specifically stated otherwise, there are no other special meanings.
The foregoing is merely exemplary of the present application and is not intended to limit the present application. Various modifications and changes may be made to the present application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc. which are within the spirit and principles of the present application are intended to be included within the scope of the claims of the present application.
Claims (10)
1. A microwave electric field measurement probe apparatus, comprising: an atomic vapor chamber;
the end part of the atomic vapor chamber is connected with a dual-wavelength beam-splitting prism, and one end of the dual-wavelength beam-splitting prism, which is far away from the atomic vapor chamber, is connected with an input coupling optical fiber collimation assembly and an output signal optical fiber collimation assembly; the atomic vapor chamber is connected with an input detection light optical fiber assembly;
the input detection light optical fiber component is connected to one end of the atomic vapor chamber, which is far away from the dual-wavelength beam splitting prism, and the input detection light optical fiber component, the output signal light optical fiber collimation component and the atomic vapor chamber are positioned on the same axis;
or the input detection light fiber component and the dual-wavelength beam splitter prism are connected to the same end of the atomic vapor chamber, and one end of the atomic vapor chamber, which is far away from the dual-wavelength beam splitter prism, is connected with a pyramid reflector;
the detection light can pass through the dual-wavelength beam splitting prism to enter the output signal light optical fiber collimation assembly, and the detection light can pass through the pyramid reflector to enter the atomic vapor chamber.
2. The probe device for measuring microwave electric field according to claim 1, wherein the atomic vapor chamber has a cylindrical structure, and the end face is provided with an optical antireflection film.
3. The microwave electric field measurement probe apparatus according to claim 1, wherein the dual wavelength beam splitter prism includes a right triangular prism and an oblique triangular prism, the right triangular prism includes a right angle surface and a triangular prism inclined surface, and the oblique triangular prism includes an incident coupling light narrow surface, an outgoing light narrow surface and an oblique triangular prism inclined surface;
the inclined quadrangular prism inclined plane is connected with the right triangular prism inclined plane; the emergent light narrow surface is connected with the atomic vapor chamber; the incident coupling light narrow surface is connected with the input coupling light optical fiber collimation component;
the right angle surface, the incident coupling light narrow surface and the emergent light narrow surface are provided with light antireflection films; the triangular prism inclined plane and the triangular prism inclined plane are provided with a detection light antireflection film and a coupling light high reflection film.
4. A microwave electric field measuring probe apparatus as defined in claim 3, wherein the narrow surface of the outgoing light is bonded with the atomic vapor chamber by a photo-adhesive.
5. A microwave electric field measurement probe apparatus according to claim 3 wherein the narrow face of the incident coupling light is bonded to the input coupling light fiber optic collimator assembly by high intensity uv glue.
6. A microwave electric field measuring probe apparatus according to claim 3, wherein the inclined quadrangular prism inclined plane and the right triangular prism inclined plane are bonded by optical cement.
7. The microwave electric field measurement probe apparatus according to claim 1, wherein the output signal light fiber collimation assembly comprises a fixed coaxial glass tube, and a C-shaped lens and an optical fiber end face arranged in the fixed coaxial glass tube, the C-shaped lens is arranged at intervals with the optical fiber end face, and an angle face of the C-shaped lens is parallel to an angle face of the optical fiber end face.
8. The microwave electric field measuring probe apparatus according to claim 1, wherein if the input probe optical fiber assembly and the dual wavelength beam splitting prism are connected to the same end of the atomic vapor chamber, the pyramid reflector comprises a laser incident surface, a first reflecting inclined surface and a second reflecting inclined surface;
the laser incidence surface is provided with a light antireflection film, the first reflection inclined surface and the second reflection inclined surface are provided with a high reflection film for detecting light and a high transmission film for coupling light and are coated with black paint, and the laser incidence surface is connected with the atomic vapor chamber.
9. The microwave electric field measurement probe apparatus according to claim 1, wherein the atomic vapor chamber, the dual wavelength beam splitting prism, the output signal optical fiber collimating assembly, the input coupling optical fiber collimating assembly, and the input probe optical fiber assembly are all made of glass.
10. The application method of the microwave electric field measurement probe device is characterized by comprising the following steps of:
if the input detection light optical fiber component and the output signal light optical fiber collimation component are positioned at two ends of the atomic vapor chamber, the method comprises the following steps:
the detection light enters the atomic vapor chamber through the input detection light optical fiber collimation component;
after passing through the atomic vapor chamber, the light is transmitted into an output signal light optical fiber collimation assembly through a dual-wavelength beam splitting prism;
the coupling light passes through the input coupling light optical fiber collimation component to realize parallel light beams with large beam diameters, and then is reflected by the dual-wavelength beam splitting prism, enters into the atomic vapor chamber and is overlapped with the detection light to be emitted out of the atomic vapor chamber;
if the input detection optical fiber collimator and the output signal optical fiber collimation component are positioned at the same end of the atomic vapor chamber, the method comprises the following steps:
the detection light enters the atomic vapor chamber through the input detection light optical fiber collimation component;
after passing through the atomic vapor chamber, the detection light is reflected by the pyramid reflector and enters the atomic vapor chamber again;
after passing through the atomic vapor chamber again, the light is transmitted into the output signal light fiber assembly through the dual-wavelength beam splitting prism;
the coupling light passes through the input coupling light optical fiber collimation component to realize the parallel light beam with large beam diameter, and then is reflected by the dual-wavelength beam splitting prism, enters into the atomic vapor chamber and is overlapped with the detection light which is about to be emitted out of the atomic vapor chamber.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202211608675.5A CN116008692A (en) | 2022-12-14 | 2022-12-14 | Microwave electric field measurement probe device and use method |
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| CN202211608675.5A CN116008692A (en) | 2022-12-14 | 2022-12-14 | Microwave electric field measurement probe device and use method |
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| CN116008692A true CN116008692A (en) | 2023-04-25 |
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| CN202211608675.5A Pending CN116008692A (en) | 2022-12-14 | 2022-12-14 | Microwave electric field measurement probe device and use method |
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