CN115992698A - Method for positioning underground leakage point based on microchip measurement data - Google Patents
Method for positioning underground leakage point based on microchip measurement data Download PDFInfo
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- CN115992698A CN115992698A CN202310125007.5A CN202310125007A CN115992698A CN 115992698 A CN115992698 A CN 115992698A CN 202310125007 A CN202310125007 A CN 202310125007A CN 115992698 A CN115992698 A CN 115992698A
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Abstract
The invention relates to a method for locating an underground leakage point based on microchip measurement data, which comprises the following steps: acquiring original measurement data of the temperature of a whole shaft through microchip field test; converting the original measurement data into data of well depth corresponding to temperature; noise reduction processing is carried out on the data of the temperature corresponding to the well depth to obtain data of the temperature gradient corresponding to the well depth; the noise reduction processing temperature gradient corresponding well depth data is calculated again to obtain temperature gradient change corresponding well depth data and form a temperature gradient change curve; and judging the leakage point according to the temperature gradient change curve. The method uses the microchip with small size, can measure the temperature field of the whole shaft under the condition of not affecting the drilling flow, and can quickly locate the leakage place by recovering and processing the measured data to obtain the data of the temperature gradient change of the whole shaft in the later period and combining with the underground heat conduction model.
Description
Technical Field
The invention belongs to the technical field of drilling, and particularly relates to a method for positioning underground leakage points based on microchip measurement data.
Background
In drilling operations, lost circulation is a relatively serious complex field situation that can result in significant amounts of drilling fluid and field man-hours being wasted, resulting in significant economic losses. Serious lost circulation can cause pressure drop in the well, affect normal drilling, cause instability of the well wall, induce formation fluid to flow into the well bore, and cause serious safety problems such as blowout. Lost circulation is classified into several categories based on the severity of the loss: leakage, partial leakage, and severe leakage. Leakage is the slightest leak, with a leak rate of less than 10 barrels per hour (1.6 square per hour). Typically this loss is due to drilling fluid entering the formation pores rather than the fractures. Leakage is often associated with the loss of mud to the pore network system of the formation before filter cake formation. The leak rate is closely related to the over-balance pressure and the rock permeability.
Partial loss refers to drilling fluid loss rates of 10-100 barrels per hour (1.6-16 square per hour) when the driller needs to take care of drilling or take remedial action.
Severe lost circulation occurs when drilling fluid enters the formation through a fracture, hole or cave at a rate of greater than 16 square/hour. Including the complete loss of drilling fluid, i.e., no drilling fluid is returned to the surface. The consequences of such an event may include well control events and dry drilling events, where dry drilling refers to the continued drilling after the entire loss of drilling fluid, resulting in damage to the drill bit, drill string, or well wall.
Therefore, once the underground leakage is found, the plugging operation needs to be carried out on site as soon as possible, and the influence caused by the leakage is avoided to the greatest extent. For plugging operation, the first step is to solve the problem of locating the lost circulation point.
Disclosure of Invention
Aiming at the problems, the invention aims to provide a method for positioning underground leakage points based on microchip measurement data, which can rapidly and cheaply perform field measurement and calculation and positioning of the leakage points and can be widely applied to well drilling and plugging operations.
In order to achieve the above purpose, the present invention adopts the following technical scheme:
in a first aspect, the present invention provides a method for locating a leak point downhole based on microchip measurement data, comprising the steps of:
acquiring original measurement data of the temperature of a whole shaft through microchip field test;
converting the original measurement data into data of well depth corresponding to temperature;
noise reduction processing is carried out on the data of the temperature corresponding to the well depth to obtain data of the temperature gradient corresponding to the well depth;
the noise reduction processing temperature gradient corresponding well depth data is calculated again to obtain temperature gradient change corresponding well depth data and form a temperature gradient change curve;
and judging the leakage point according to the temperature gradient change curve.
Preferably, the noise reduction processing of the data of the well depth corresponding to the temperature includes smoothing the data of the well depth corresponding to the temperature.
Preferably, the smoothing process includes the steps of:
importing temperature data of the microchip after the deep calibration calculation treatment;
selecting a smoothing method;
selecting the number of time points of the smoothing data;
and starting a smooth data algorithm for the depth calibration data of each microchip, so as to perform noise reduction treatment on the data and obtain the smooth data.
Preferably, the determining the leakage point according to the temperature gradient change curve includes:
when the temperature gradient change is less than zero, the temperature gradually rises when the drilling fluid moves upwards, and the leakage point is judged to occur in the lower section of the annulus;
when the temperature gradient change is greater than zero, the temperature gradually decreases when the drilling fluid moves upwards, and the leakage point is judged to occur at the upper section of the annulus;
when the temperature gradient curve is obviously suddenly changed in the forward direction, the liquid in the annular space is cooled in an accelerating way or heated in a decelerating way, and the leakage point is judged to be positioned in the annular space section.
Preferably, the range of the data variation amplitude of the smoothing treatment is within 0.01 ℃/ft.
In a second aspect, the present invention provides an apparatus for locating a leak point downhole based on microchip measurement data, comprising:
the first processing unit is used for acquiring original measurement data of the temperature of the whole shaft through microchip field test;
the second processing unit is used for converting the original measurement data into data of well depth corresponding to the temperature;
the third processing unit is used for carrying out noise reduction processing on the data of the temperature corresponding to the well depth to obtain data of the temperature gradient corresponding to the well depth;
the fourth processing unit is used for deriving well depth data corresponding to the temperature gradient of the noise reduction processing again to obtain well depth data corresponding to the temperature gradient change and forming a temperature gradient change curve;
and the fifth processing unit is used for judging the leakage point according to the temperature gradient change curve.
In a third aspect, the present invention provides a computer readable storage medium storing computer instructions for implementing the method of locating a leak point downhole based on microchip measurement data when executed by a processor.
In a fourth aspect, the present invention provides a computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor, when executing the computer program, implements the method for locating a leak point downhole based on microchip measurement data.
Due to the adoption of the technical scheme, the invention has the following advantages:
the method for locating the underground leakage point based on microchip measurement data provided by the invention uses the microchip with small size, can carry out full-shaft temperature field measurement under the condition of not affecting the drilling flow, obtains the data of full-shaft temperature gradient change by recycling the measured data in the later period, and can be used for quickly locating the leakage point by combining an underground heat conduction model.
And the drill is not required to be started and started, so that a great amount of time and labor cost are saved.
Drawings
Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The drawings are only for purposes of illustrating the preferred embodiments and are not to be construed as limiting the invention. Like parts are designated with like reference numerals throughout the drawings.
In the drawings:
FIG. 1 is a microchip workflow diagram;
FIG. 2 is a flowchart of a smoothing process;
FIG. 3 is a graph of microchip temperature measurement data after depth calibration calculation;
FIG. 4 is a graph of temperature gradients after smoothing;
FIG. 5 is a graph of temperature gradients after further processing using a simple moving average method;
FIG. 6 is a graph of temperature gradients after further processing using a weighted moving average method;
FIG. 7 is a graph of three sets of microchip temperature gradients calculated using a simple moving average (left) and a weighted moving average (right).
Detailed Description
Exemplary embodiments of the present invention will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the present invention are shown in the drawings, it should be understood that the present invention may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art.
The embodiment of the invention provides a method for positioning a downhole leakage point based on microchip measurement data, which comprises the following steps: acquiring original measurement data of the temperature of a whole shaft through microchip field test; converting the original measurement data into data of well depth corresponding to temperature; noise reduction processing is carried out on the data of the temperature corresponding to the well depth to obtain data of the temperature gradient corresponding to the well depth; the noise reduction processing temperature gradient corresponding well depth data is calculated again to obtain temperature gradient change corresponding well depth data and form a temperature gradient change curve; and judging the leakage point according to the temperature gradient change curve. The method uses the microchip with small size, can measure the temperature field of the whole shaft under the condition of not affecting the drilling flow, and can quickly locate the leakage place by recovering and processing the measured data to obtain the data of the temperature gradient change of the whole shaft in the later period and combining with the underground heat conduction model.
Example 1
The method for positioning the underground leakage point based on microchip measurement data provided by the invention specifically comprises the following steps:
s1, acquiring an original measurement value of the temperature of a whole shaft through microchip field test, as shown in FIG. 1;
the underground measuring microchip (also called as a wandering data collector while drilling) is a micro-sized spherical or capsule-shaped instrument, the inside of the instrument comprises a micro control unit, a memory, a sensor, a data transmission module and a micro rechargeable lithium battery, all circuits and components are wrapped in spherical or capsule-shaped protective materials, and the diameter of the whole system is about 8-12mm. The protective material used by the microchip has extremely high strength and glass transition temperature, and can ensure that the internal circuit and components thereof bear the high-temperature and high-pressure environment in the well, as shown in figure 1.
In actual drilling operation, the underground measurement microchip is put into a drill rod after being activated, the drilling fluid circularly flows to the bottom of the well, is sprayed out from a drill bit water hole, enters an annulus to return to the ground surface, finally reaches a vibrating screen to be recovered, and continuously measures underground important parameters such as temperature, pressure and the like in the whole movement process. The microchip can be recovered and then read by special equipment.
S2, converting the original measurement data into data of well depth corresponding to temperature;
s3, carrying out noise reduction treatment on the data of the well depth corresponding to the temperature to obtain data of the well depth corresponding to the temperature gradient;
s4, deriving well depth data corresponding to the noise reduction processing temperature gradient again to obtain well depth data corresponding to the temperature gradient change and forming a temperature gradient change curve;
s5, judging the leakage point according to the temperature gradient change curve.
The noise reduction processing of the data of the well depth corresponding to the temperature comprises smoothing processing of the data of the well depth corresponding to the temperature.
There are various methods for smoothing the measurement data of the microchip, such as a simple moving average method and a weighted moving average method. In data processing, the length of the number of time periods of moving average (the number of measurement data points is an odd number in actual operation) needs to be set specifically. For example, the data with the period number of 5 is smoothed by a moving average algorithm by 2 data at the front end and 2 data at the back end of the data point to be calculated and 5 data points (2+1+2) of the data point itself, and then the calculated data is substituted for the original data. According to this method, once the temperature-corresponding well depth data of the entire microchip has been smoothed, we can calculate the temperature gradient (dT/dZ) of the actual annulus segment.
In the past data processing, microchip measurement data has never been smoothed, and data noise and fluctuations that have not been smoothed are large, which greatly affects the accuracy of later data analysis and interpretation.
The noise reduction process specifically includes the steps as shown in fig. 2:
s3-1, importing data of the microchip after the depth calibration calculation processing;
s3-2, selecting and formulating relevant settings (such as a data smoothing method and a unit); the unit refers to a unit of input parameter. For example: well depth is measured in metric units meters and in english units feet; the temperature units may be degrees celsius and may be degrees fahrenheit. The units need to be selected well.
S3-3, selecting the number of time points of the smoothing data;
s3-4, starting a smoothing data algorithm on the depth calibration data of each microchip to obtain a measurement value of the temperature corresponding to the well depth after smoothing;
s3-5, after smoothing treatment, selecting data of the well depth corresponding to the temperature in the annular section, and deriving to obtain a temperature gradient dT/dZ;
deriving the temperature gradient again to obtain temperature gradient change;
carrying out smoothing treatment on the temperature gradient change again;
and drawing the result of the smoothed temperature gradient change corresponding to the well depth in the graph.
The negative temperature gradient changes indicate that the drilling fluid is heated up as the annulus rises, which is typically the case in the lower part of the annulus, i.e. near the bottom of the well. Conversely, a positive temperature gradient change indicates that the drilling fluid is being cooled as the annulus rises, which is typically the upper part of the annulus, i.e., the part near the surface, where the annulus refers to the annular space in the wellbore, specifically the annular space outside the drill pipe and inside the borehole wall. The magnitude of the change in the temperature gradient of the annulus segment after data processing can be used to diagnose and locate abnormal points of temperature change downhole. According to theory, a significant temperature gradient change at a location may indicate that there may be an abnormal situation downhole at the location, such as: lithology or geothermal gradient changes, wellbore irregularities or leaks occur. The possibility of lithology or geothermal gradient change, irregular well hole and the like can be eliminated by analyzing the data of the practical case, so that the underground leakage problem can be determined and the leakage place can be positioned.
Example 1
Taking test well 1 as an example, it is specifically proposed herein that a slight or partial loss of this well be found to occur. Thus, tests are performed in situ using the microchip in an attempt to locate the actual leak by analysis of the microchip measurement data.
The microchip temperature measurement data after the depth calibration calculation is shown in fig. 3. As can be seen from the graph, the difference between the different microchip measurements is within 2 ℃.
When the microchip measurement data is smoothed by using different time period number points (such as 5,11,15, 21) of moving average, the noise of the processed data is larger when the time period number is smaller; conversely, if the number of epochs used is greater, the smoother the processed data. Therefore, in the actual smoothing processing, a total of 21 time periods are actually used, and the data is calculated according to the sampling frequency of the microchip being 2 seconds, which corresponds to the average calculation of 20 seconds of data before and after one data point, and the calculated data result is shown in fig. 4.
The average calculated temperature gradient curve shows that the curve noise is still relatively large at certain positions. Therefore, the temperature measurement data is further processed, i.e., the temperature gradient is calculated according to the number of 21 periods by using both the simple moving average method and the weighted moving average method, and the results are shown in fig. 5 and 6. Wherein fig. 5 is a temperature gradient curve after processing by a simple moving average method, and fig. 6 is a temperature gradient curve after processing by a weighted moving average method.
The noise of the temperature gradient calculation data can be well removed by using a simple moving average method. The mean fluctuation amplitude of dT/dZ in the data is 0.005C/foot, so any point of data change that is significantly larger than the amplitude of change should be carefully studied to determine if it is a downhole leak or other anomaly. By definition, a negative temperature gradient change represents a heating up of the drilling fluid as it rises in the annulus, and according to fig. 7, the temperature of the drilling fluid is highest when the abscissa dT/dz=0, i.e. at a well depth of about 6100-6200 feet. The three groups of microchip measured temperature gradient change values after treatment all have great change at the position of 8000 feet of well depth, which shows that abnormal conditions are very likely to occur, and after other borehole irregularities and drilling tool abnormality problems are eliminated, on-site personnel can determine the position of leakage occurring near the position of 8000 feet of well depth.
Finally, it should be noted that: the above embodiments are only for illustrating the technical solution of the present invention, and are not limiting; although the invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present invention.
Claims (8)
1. A method for locating a leak point downhole based on microchip measurement data, comprising the steps of:
acquiring original measurement data of the temperature of a whole shaft through microchip field test;
converting the original measurement data into data of well depth corresponding to temperature;
noise reduction processing is carried out on the data of the temperature corresponding to the well depth to obtain data of the temperature gradient corresponding to the well depth;
the noise reduction processing temperature gradient corresponding well depth data is calculated again to obtain temperature gradient change corresponding well depth data and form a temperature gradient change curve;
and judging the leakage point according to the temperature gradient change curve.
2. The method of locating a leak point downhole based on microchip measurement data as defined by claim 1, wherein the denoising the temperature-corresponding well depth data comprises smoothing the temperature-corresponding well depth data.
3. The method of locating a leak down hole based on microchip measurement data as defined by claim 2, wherein the smoothing process comprises the steps of:
importing temperature data of the microchip after the deep calibration calculation treatment;
selecting a smoothing method;
selecting the number of time points of the smoothing data;
and starting a smooth data algorithm for the depth calibration data of each microchip, so as to perform noise reduction treatment on the data and obtain the smooth data.
4. The method for locating a leak in a well based on microchip measurement data as defined by claim 3, wherein determining the leak from the temperature gradient profile comprises:
when the temperature gradient change is less than zero, the temperature gradually rises when the drilling fluid moves upwards, and the leakage point is judged to occur in the lower section of the annulus;
when the temperature gradient change is greater than zero, the temperature gradually decreases when the drilling fluid moves upwards, and the leakage point is judged to occur at the upper section of the annulus;
when the temperature gradient curve is obviously suddenly changed in the forward direction, the liquid in the annular space is cooled in an accelerating way or heated in a decelerating way, and the leakage point is judged to be positioned in the annular space section.
5. The method for locating a leak down hole based on microchip measurement data as defined in claim 3, wherein the range of variation of the data, which is typically smoothed, is within 0.01 ℃/ft.
6. A device for locating a leak point downhole based on microchip measurement data, comprising:
the first processing unit is used for acquiring original measurement data of the temperature of the whole shaft through microchip field test;
the second processing unit is used for converting the original measurement data into data of well depth corresponding to the temperature;
the third processing unit is used for carrying out noise reduction processing on the data of the temperature corresponding to the well depth to obtain data of the temperature gradient corresponding to the well depth;
the fourth processing unit is used for deriving well depth data corresponding to the temperature gradient of the noise reduction processing again to obtain well depth data corresponding to the temperature gradient change and forming a temperature gradient change curve;
and the fifth processing unit is used for judging the leakage point according to the temperature gradient change curve.
7. A computer readable storage medium storing computer instructions for implementing the method of locating a leak point downhole based on microchip measurement data according to any one of claims 1 to 5 when executed by a processor.
8. A computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor, when executing the computer program, implements the method of locating a leak point downhole based on microchip measurement data as claimed in any one of claims 1 to 5.
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