CN115987287B - Parameter calibration method and device based on analog-to-digital converter - Google Patents
Parameter calibration method and device based on analog-to-digital converter Download PDFInfo
- Publication number
- CN115987287B CN115987287B CN202310264886.XA CN202310264886A CN115987287B CN 115987287 B CN115987287 B CN 115987287B CN 202310264886 A CN202310264886 A CN 202310264886A CN 115987287 B CN115987287 B CN 115987287B
- Authority
- CN
- China
- Prior art keywords
- analog
- digital converter
- digital
- digital code
- temperature
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02D10/00—Energy efficient computing, e.g. low power processors, power management or thermal management
Landscapes
- Analogue/Digital Conversion (AREA)
Abstract
The invention provides a parameter calibration method and a device based on an analog-to-digital converter, wherein the parameter calibration method based on the analog-to-digital converter comprises the following steps: acquiring a first digital code and a second digital code at normal temperature; converting the first analog signal into a third digital code and converting the second analog signal into a fourth digital code according to the first conversion coefficient; obtaining a first slope by calculating the ratio of the first difference to the second difference; obtaining a first constant by calculating a first product and calculating a difference between the first digital code and the first product; and adjusting parameters of digital codes generated according to the analog signals in the analog-to-digital converter by taking the first slope and the first constant as references to finish parameter calibration. The invention improves the conversion precision of devices taking the analog-to-digital converter as a key structure by correcting the linear relation between the input and the output of the analog-to-digital converter.
Description
Technical Field
The present invention relates to the field of integrated circuits, and in particular, to a parameter calibration method and apparatus based on an analog-to-digital converter.
Background
The analog-to-digital converter is a necessary structure of a chip common device, is widely applied to communication, image acquisition, instruments and meters and various military equipment, and is a key structure in most devices, and is used for converting analog signals into digital codes with high fidelity for analysis and calculation by a digital processor.
With the progress of the process, the analog-to-digital converter can achieve a higher conversion speed, but is limited by the process, the resolution of the high-speed analog-to-digital converter is lower, so that the accuracy of signal processing is reduced, and therefore, increasing the accuracy of the analog-to-digital converter becomes a great technical hotspot. Specifically, the analog-to-digital converter generates larger linear gain error and nonlinear distortion at a fast operating speed, and the error and distortion change along with temperature and supply voltage, thereby limiting the conversion accuracy of the analog-to-digital converter.
Therefore, the invention provides a parameter calibration method and device based on an analog-to-digital converter so as to improve the conversion precision of the analog-to-digital converter.
Disclosure of Invention
The invention provides a parameter calibration method and device based on an analog-to-digital converter, which are used for solving the technical problem that in the prior art, the conversion accuracy of the analog-to-digital converter is limited due to the influence of temperature and power supply voltage.
In a first aspect, the present invention provides a parameter calibration method based on an analog-to-digital converter, including: s1, under the condition that the working temperature is normal temperature, acquiring a first digital code generated by an analog-to-digital converter according to a first analog signal and a second digital code generated by the analog-to-digital converter according to a second analog signal; s2, converting the first analog signal into a third digital code and converting the second analog signal into a fourth digital code according to a first conversion coefficient; s3, obtaining a first slope by calculating the ratio of a first difference value to a second difference value, wherein the first difference value is the difference value between the first digital code and the second digital code, and the second difference value is the difference value between the third digital code and the fourth digital code; s4, obtaining a first constant by calculating a first product and calculating a difference value between the first digital code and the first product, wherein the first product is the product of the second digital code and the first slope; s5, adjusting parameters of digital codes generated according to analog signals in the analog-to-digital converter by taking the first slope and the first constant as references to finish parameter calibration. The beneficial effects are that: the invention improves the conversion accuracy of the analog-to-digital converter by correcting the linear relation between the input and the output of the analog-to-digital converter.
Optionally, the first conversion coefficient is a second product and
the second product is the product of the reference voltage of the device formed by the analog-to-digital converter and the first coefficient T1, the first coefficient T1 is obtained according to the working temperature of the analog-to-digital converter, and N is the number of counting digits of the analog-to-digital converter. The beneficial effects are that: to obtain the first conversion factor.
Alternatively, by formula
The first coefficient T1 is obtained, ts is the actual working temperature of the analog-to-digital converter, tc is the normal temperature, and the value of i is-1.
Optionally, in the step S2, converting the first analog signal into a third digital code and converting the second analog signal into a fourth digital code according to a first conversion coefficient includes: obtaining the third digital code by calculating a quotient of the first analog signal and the first conversion coefficient; and obtaining the fourth digital code by calculating the quotient of the second analog signal and the first conversion coefficient. The beneficial effects are that: and converting the first analog signal and the second analog signal into data of the same type as the output result of the analog-to-digital converter through the first conversion coefficient, so that comparison and analysis are facilitated.
Optionally, after the step S5 is completed, the method further includes: acquiring a first working temperature, wherein the first working temperature is the actual working temperature of the analog-to-digital converter after parameter calibration is completed; judging whether the first working temperature is normal temperature, if so, converting the analog signal into digital codes by the analog-to-digital converter according to the first slope, the first constant and the first conversion coefficient, otherwise, acquiring the first coefficient T1; obtaining a second slope by calculating the product of the first slope and the first coefficient T1; and adjusting the parameters of the digital codes generated by the analog-to-digital converter according to the analog signals again by taking the second slope and the first constant as references so as to finish parameter calibration. The beneficial effects are that: by calculating the product of the first slope and the first temperature coefficient to obtain the second slope, the conversion accuracy of the analog-to-digital converter can be ensured to be consistent at different temperatures.
Optionally, before the first operating temperature is obtained, the method further comprises: the analog-to-digital converter converts a third analog signal into a fifth digital code under a first temperature signal, wherein the working temperature of the first temperature signal corresponding to the analog-to-digital converter is normal temperature; the analog-to-digital converter converts a fourth analog signal into a sixth digital code under a second temperature signal, wherein the working temperature corresponding to the second temperature signal is the first working temperature; converting a first temperature signal of the analog-to-digital converter when generating the fifth digital code into a seventh digital code and converting a second temperature signal of the analog-to-digital converter when generating the sixth digital code into an eighth digital code according to a second conversion coefficient; and calculating the sum of a third product and the normal temperature to calibrate the second temperature signal, wherein the third product is the product of a third difference value and a second temperature coefficient, and the third difference value is the difference value between the second temperature signal and the first temperature signal. The beneficial effects are that: by the above operation, the temperature signal received by the analog-to-digital converter is calibrated, because the temperature signal that can be acquired by the analog-to-digital converter does not necessarily coincide with the actual temperature.
Optionally, the value range of the second temperature coefficient is-1. The beneficial effects are that: the resulting operating temperature in this range is more realistic.
Optionally, the second conversion coefficient is a fourth product and
the fourth product is the product of the reference voltage of the device formed by the analog-to-digital converter and the second coefficient T2, and N is the number of counting bits of the analog-to-digital converter. The beneficial effects are that: to obtain a second conversion factor.
Alternatively, according to the pass formula
And acquiring the second coefficient T2, wherein Ts is the actual working temperature of the analog-to-digital converter, tc is the normal temperature, and j is-1.
Optionally, converting the first temperature signal of the analog-to-digital converter when generating the fifth digital code into a seventh digital code and converting the second temperature signal of the analog-to-digital converter when generating the sixth digital code into an eighth digital code according to a second conversion coefficient includes: obtaining the seventh digital code by calculating the quotient of the first temperature signal and the second coefficient T2; the eighth digital code is obtained by calculating the quotient of the second temperature signal and the second coefficient T2.
In a second aspect, the present invention provides an analog-to-digital converter based parameter calibration apparatus for performing the analog-to-digital converter based parameter calibration method according to any one of the first aspects, comprising: the device comprises an acquisition unit, a conversion unit, a first parameter acquisition unit, a second parameter acquisition unit and a parameter calibration unit; the acquisition unit is used for acquiring a first digital code generated by the analog-to-digital converter according to a first analog signal and a second digital code generated by the analog-to-digital converter according to a second analog signal at normal temperature; the conversion unit is used for converting the first analog signal into a third digital code and converting the second analog signal into a fourth digital code according to a first conversion coefficient; the first parameter obtaining unit is configured to obtain a first slope by calculating a ratio of a first difference value to a second difference value, where the first difference value is a difference value between the first digital code and the second digital code, and the second difference value is a difference value between the third digital code and the fourth digital code; the second parameter obtaining unit is configured to obtain a first constant by calculating a first product, which is a product of the second digital code and the first slope, and calculating a difference value between the first digital code and the first product; the parameter calibration unit is used for adjusting parameters of digital codes generated according to analog signals in the analog-to-digital converter by taking the first slope and the first constant as references so as to complete parameter calibration. The beneficial effects are that: the invention improves the conversion accuracy of the analog-to-digital converter by correcting the linear relation between the input and the output of the analog-to-digital converter.
Drawings
FIG. 1 is a flowchart of an embodiment of a parameter calibration method based on an analog-to-digital converter according to the present invention;
fig. 2 is a schematic structural diagram of an embodiment of a parameter calibration device based on an analog-to-digital converter according to the present invention.
Detailed Description
The technical solutions in the embodiments of the present application are described below with reference to the drawings in the embodiments of the present application. In the description of the embodiments of the present application, the terminology used in the embodiments below is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. As used in the specification of this application and the appended claims, the singular forms "a," "an," "the," and "the" are intended to include, for example, "one or more" such forms of expression, unless the context clearly indicates to the contrary. It should also be understood that in the various embodiments herein below, "at least one", "one or more" means one or more than two (including two). The term "and/or" is used to describe an association relationship of associated objects, meaning that there may be three relationships; for example, a and/or B may represent: a alone, a and B together, and B alone, wherein A, B may be singular or plural. The character "/" generally indicates that the context-dependent object is an "or" relationship.
Reference in the specification to "one embodiment" or "some embodiments" or the like means that a particular feature, structure, or characteristic described in connection with the embodiment is included in one or more embodiments of the application. Thus, appearances of the phrases "in one embodiment," "in some embodiments," "in other embodiments," and the like in the specification are not necessarily all referring to the same embodiment, but mean "one or more but not all embodiments" unless expressly specified otherwise. The terms "comprising," "including," "having," and variations thereof mean "including but not limited to," unless expressly specified otherwise. The term "coupled" includes both direct and indirect connections, unless stated otherwise. The terms "first," "second," and the like are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated.
In the embodiments of the present application, words such as "exemplary" or "such as" are used to mean serving as examples, illustrations, or descriptions. Any embodiment or design described herein as "exemplary" or "for example" should not be construed as preferred or advantageous over other embodiments or designs. Rather, the use of words such as "exemplary" or "such as" is intended to present related concepts in a concrete fashion.
The invention provides a parameter calibration method based on an analog-to-digital converter, which has a flow shown in figure 1 and comprises the following steps:
s1, under the condition that the working temperature is normal temperature, acquiring a first digital code generated by an analog-to-digital converter according to a first analog signal and a second digital code generated by the analog-to-digital converter according to a second analog signal;
s2, converting the first analog signal into a third digital code and converting the second analog signal into a fourth digital code according to a first conversion coefficient;
s3, obtaining a first slope by calculating the ratio of a first difference value to a second difference value, wherein the first difference value is the difference value between the first digital code and the second digital code, and the second difference value is the difference value between the third digital code and the fourth digital code;
s4, obtaining a first constant by calculating a first product and calculating a difference value between the first digital code and the first product, wherein the first product is the product of the second digital code and the first slope;
s5, adjusting parameters of digital codes generated according to analog signals in the analog-to-digital converter by taking the first slope and the first constant as references to finish parameter calibration.
In some preferred embodiments, the first analog signal and the second analog signal correspond to one-fourth and three-fourths of a reference voltage of a device or the analog-to-digital converter in which the analog-to-digital converter is a critical structure, respectively, to obtain a reasonable linear relationship. The devices formed by the analog-to-digital converter can be considered as devices with the analog-to-digital converter as a key structure. The invention improves the conversion precision of the analog-to-digital converter or a device taking the analog-to-digital converter as a key structure by correcting the linear relation between the input and the output of the analog-to-digital converter. The normal temperature is 23-27 ℃. Optionally, the normal temperature is 23, 25 or 27 ℃.
In some embodiments, the first conversion factor is a second product and
the second product is the product of the reference voltage of the device formed by the analog-to-digital converter and the first coefficient T1, the first coefficient T1 is obtained according to the working temperature of the analog-to-digital converter, and N is the number of counting digits of the analog-to-digital converter.
In some embodiments, the formula is passed through
The first coefficient T1 is obtained, ts is the actual working temperature of the analog-to-digital converter, tc is the normal temperature, and the value of i is-1. The value of i is specifically set between-1 and 1 according to practical situations, and is not limited herein.
In some embodiments, in the S2, converting the first analog signal into a third digital code and converting the second analog signal into a fourth digital code according to a first scaling factor includes: obtaining the third digital code by calculating a quotient of the first analog signal and the first conversion coefficient; and obtaining the fourth digital code by calculating the quotient of the second analog signal and the first conversion coefficient. The beneficial effects are that: and converting the first analog signal and the second analog signal into data of the same type as the output result of the analog-to-digital converter through the first conversion coefficient, so that comparison and analysis are facilitated.
In some embodiments, after completing S5, further comprising: acquiring a first working temperature, wherein the first working temperature is the actual working temperature of the analog-to-digital converter after parameter calibration is completed; judging whether the first working temperature is normal temperature, if so, converting the analog signal into digital codes by the analog-to-digital converter according to the first slope, the first constant and the first conversion coefficient, otherwise, acquiring the first coefficient T1; obtaining a second slope by calculating the product of the first slope and the first coefficient T1; and adjusting the parameters of the digital codes generated by the analog-to-digital converter according to the analog signals again by taking the second slope and the first constant as references so as to finish parameter calibration. The beneficial effects are that: by calculating the product of the first slope and the first temperature coefficient to obtain the second slope, the conversion accuracy of the analog-to-digital converter can be ensured to be consistent at different temperatures.
In some embodiments, prior to obtaining the first operating temperature, further comprising: the analog-to-digital converter converts a third analog signal into a fifth digital code under a first temperature signal, wherein the working temperature of the first temperature signal corresponding to the analog-to-digital converter is normal temperature; the analog-to-digital converter converts a fourth analog signal into a sixth digital code under a second temperature signal, wherein the working temperature corresponding to the second temperature signal is the first working temperature; converting a first temperature signal of the analog-to-digital converter when generating the fifth digital code into a seventh digital code and converting a second temperature signal of the analog-to-digital converter when generating the sixth digital code into an eighth digital code according to a second conversion coefficient; and calculating the sum of a third product and the normal temperature to calibrate the second temperature signal, wherein the third product is the product of a third difference value and a second temperature coefficient, and the third difference value is the difference value between the second temperature signal and the first temperature signal. The beneficial effects are that: by the above operation, the temperature signal received by the analog-to-digital converter is calibrated, because the temperature signal that can be acquired by the analog-to-digital converter does not necessarily coincide with the actual temperature.
In some embodiments, the value range of the second temperature coefficient is-1 to 1. The beneficial effects are that: the resulting operating temperature in this range is more realistic. Optionally, the second temperature coefficient is-1, -0.5, -0.3, -0.1, 0.12, 0.15, 0.18, 0.2, 0.5, 0.7, or 1.
In some embodiments, the second conversion factor is a fourth product and
the fourth product is the product of the reference voltage of the device formed by the analog-to-digital converter and the second coefficient T2, and N is the number of counting bits of the analog-to-digital converter. The beneficial effects are that: to obtain a second conversion factor. Alternatively, according to the pass formula
And acquiring the second coefficient T2, wherein Ts is the actual working temperature of the analog-to-digital converter, tc is the normal temperature, and j is-1. The value of j is specifically set between-1 and 1 according to practical situations, and is not limited herein.
In some embodiments, converting the first temperature signal of the analog-to-digital converter when generating the fifth digital code to a seventh digital code and converting the second temperature signal of the analog-to-digital converter when generating the sixth digital code to an eighth digital code according to a second conversion coefficient comprises: obtaining the seventh digital code by calculating the quotient of the first temperature signal and the second coefficient T2; the eighth digital code is obtained by calculating the quotient of the second temperature signal and the second coefficient T2.
For a more detailed description of embodiments of the present application, examples are illustrated herein:
example one:
at normal temperature, the calibration of the analog-digital converter is performed by the method, taking the reference voltage vref of the analog-digital converter as 1.5V as an example, a mathematical relationship of code=vi/m and m=1.5v Tc/4096 exists between the input signal Vi of the analog-digital converter and the count result code of the analog-digital converter, and Tc is a coefficient related to temperature. The input signals Vi1 and Vi2 are selected to be 0.375V and 1.125V respectively, the analog-to-digital converter is respectively Co1 and Co2 according to the counting results of the Vi1 and Vi2, and the input signals Vi1 and Vi2 are respectively corresponding to Co3 and Co4 according to the input signals and the mathematical relation. The first slope K is obtained according to the formula k= (Co 1-Co 2)/(Co 3-Co 4), and the first constant B is obtained according to the formula b=co1-k×co2. And adjusting parameters used for generating digital codes for analog signals in the analog-to-digital converter according to the first slope K and the first constant B.
When the analog-to-digital converter is not operating at normal temperature, k=ak, where k is the actual operating temperature, and a is the first coefficient T1. By k=k/a,
A first slope at the corresponding temperature is obtained.
Example two:
the temperature sensor is calibrated (Tsensor calibration) from the result of the analog-to-digital converter calibration. The second temperature signal Ti2 is obtained by the formula ti2= (co2_cali-co1_cali) ×0.16+ti1, co2_cali is a digital code corresponding to the second temperature signal, co1_cali is a first temperature signal, i.e. normal temperature, and 0.16 is a second temperature coefficient. The method is suitable for any temperature in the working temperature range of-40 ℃ to 125 ℃, and Ti1 can be 25 ℃.
Example three:
calibration of the voltage sensor is as in the example:
at normal temperature, assuming that the range of the power supply voltage of the voltage sensor is 2.2-5.5V, two input signals Vi 1=3.025V, vi 2= 4.675V of the analog-to-digital converter in the voltage sensor are acquired, and a mathematical relationship of code=vi/m and m=1.5v×tc/4096 exists between the input signals Vi of the analog-to-digital converter in the voltage sensor and the count result code of the analog-to-digital converter, wherein Tc is a coefficient related to temperature. The analog-digital converter obtains input signals Vi1 and Vi2 corresponding to Co3 and Co4 respectively according to the input signals and the mathematical relationship according to the counting results of Vi1 and Vi2 respectively as Co1 and Co 2. The first slope K is obtained according to the formula k= (Co 1-Co 2)/(Co 3-Co 4), and the first constant B is obtained according to the formula b=co1-k×co2. And adjusting parameters used for generating digital codes for analog signals in the analog-to-digital converter according to the first slope K and the first constant B.
When the analog-to-digital converter is not operating at normal temperature, k=ak, where k is the actual operating temperature, and a is the firstA coefficient T1. By k=k/a,
A first slope at the corresponding temperature is obtained.
The voltage sensor in this example may be a supply voltage sensor.
Example five:
the calibration of the operational amplifier is the same as the calibration methods of the first and third examples, and will not be described again.
Based on the parameter calibration method based on the analog-to-digital converter according to any one of the embodiments, the present invention provides a parameter calibration device based on an analog-to-digital converter, which is configured to execute the parameter calibration method based on the analog-to-digital converter according to any one of the embodiments. As shown in fig. 2, the parameter calibration device based on the analog-to-digital converter includes: an acquisition unit 201, a conversion unit 202, a first parameter acquisition unit 203, a second parameter acquisition unit 204, and a parameter calibration unit 205; the obtaining unit 201 is configured to obtain, at a normal temperature, a first digital code generated by the analog-to-digital converter according to a first analog signal and a second digital code generated by the analog-to-digital converter according to a second analog signal; the conversion unit 202 is configured to convert the first analog signal into a third digital code and convert the second analog signal into a fourth digital code according to a first conversion coefficient; the first parameter obtaining unit 203 is configured to obtain a first slope by calculating a ratio of a first difference value to a second difference value, where the first difference value is a difference value between the first digital code and the second digital code, and the second difference value is a difference value between the third digital code and the fourth digital code; the second parameter obtaining unit 204 is configured to obtain a first constant by calculating a first product, which is a product of the second digital code and the first slope, and calculating a difference value between the first digital code and the first product; the parameter calibration unit 205 is configured to adjust parameters of the analog-to-digital converter for digital encoding generated according to an analog signal, with the first slope and the first constant as references, so as to complete parameter calibration.
Alternatively, the order of acquisition of the parameters in the first parameter acquisition unit and the second parameter acquisition unit is not necessarily limited, and may be in a parallel relationship.
The beneficial effects are that: according to the invention, the linear relation between two digital signals output by the analog-to-digital converter is corrected, so that the conversion precision of the analog-to-digital converter on unused analog signals is consistent, and the influence of temperature on the conversion precision of the analog-to-digital converter is reduced.
All relevant contents of each step related to the above method embodiment may be cited to the functional description of the corresponding unit module, which is not described herein.
The foregoing is merely a specific implementation of the embodiments of the present application, but the protection scope of the embodiments of the present application is not limited thereto, and any changes or substitutions within the technical scope disclosed in the embodiments of the present application should be covered by the protection scope of the embodiments of the present application. Therefore, the protection scope of the embodiments of the present application shall be subject to the protection scope of the claims.
Claims (10)
1. A method for calibrating parameters based on an analog-to-digital converter, comprising:
s1, under the condition that the working temperature is normal temperature, acquiring a first digital code generated by an analog-to-digital converter according to a first analog signal and a second digital code generated by the analog-to-digital converter according to a second analog signal;
s2, converting the first analog signal into a third digital code and converting the second analog signal into a fourth digital code according to a first conversion coefficient;
s3, obtaining a first slope by calculating the ratio of a first difference value to a second difference value, wherein the first difference value is the difference value between the first digital code and the second digital code, and the second difference value is the difference value between the third digital code and the fourth digital code;
s4, obtaining a first constant by calculating a first product and calculating a difference value between the first digital code and the first product, wherein the first product is the product of the second digital code and the first slope;
s5, adjusting parameters of digital codes generated according to analog signals in the analog-to-digital converter by taking the first slope and the first constant as references to finish parameter calibration;
wherein the first conversion coefficient is the second product and
the second product is the product of the reference voltage of the device formed by the analog-to-digital converter and the first coefficient T1, the first coefficient T1 is obtained according to the working temperature of the analog-to-digital converter, and N is the number of counting digits of the analog-to-digital converter.
2. The analog-to-digital converter based parameter calibration method of claim 1, wherein the parameter calibration method is performed by the formula
The first coefficient T1 is obtained, ts is the actual working temperature of the analog-to-digital converter, tc is the normal temperature, and the value of i is-1.
3. The analog-to-digital converter based parameter calibration method of claim 1, wherein in said S2 converting said first analog signal into a third digital code and said second analog signal into a fourth digital code according to a first conversion coefficient comprises:
obtaining the third digital code by calculating a quotient of the first analog signal and the first conversion coefficient;
and obtaining the fourth digital code by calculating the quotient of the second analog signal and the first conversion coefficient.
4. The analog-to-digital converter based parameter calibration method according to claim 2, further comprising, after completing S5:
acquiring a first working temperature, wherein the first working temperature is the actual working temperature of the analog-to-digital converter after parameter calibration is completed;
judging whether the first working temperature is normal temperature, if so, converting the analog signal into digital codes by the analog-to-digital converter according to the first slope, the first constant and the first conversion coefficient, otherwise, acquiring the first coefficient T1;
obtaining a second slope by calculating the product of the first slope and the first coefficient T1;
and adjusting the parameters of the digital codes generated by the analog-to-digital converter according to the analog signals again by taking the second slope and the first constant as references so as to finish parameter calibration.
5. The analog-to-digital converter based parameter calibration method of claim 4, further comprising, prior to acquiring the first operating temperature:
the analog-to-digital converter converts a third analog signal into a fifth digital code under a first temperature signal, wherein the working temperature of the first temperature signal corresponding to the analog-to-digital converter is normal temperature;
the analog-to-digital converter converts a fourth analog signal into a sixth digital code under a second temperature signal, wherein the working temperature corresponding to the second temperature signal is the first working temperature;
converting a first temperature signal of the analog-to-digital converter when generating the fifth digital code into a seventh digital code and converting a second temperature signal of the analog-to-digital converter when generating the sixth digital code into an eighth digital code according to a second conversion coefficient;
and calculating the sum of a third product and the normal temperature to calibrate the second temperature signal, wherein the third product is the product of a third difference value and a second temperature coefficient, and the third difference value is the difference value between the second temperature signal and the first temperature signal.
6. The method for calibrating parameters based on an analog-to-digital converter as claimed in claim 5, wherein the range of values of the second temperature coefficient is-1 to 1.
7. The method of calibrating an analog-to-digital converter based parameter of claim 5, wherein said second scaling factor is a fourth product and
the fourth product is the product of the reference voltage of the device formed by the analog-to-digital converter and the second coefficient T2, and N is the number of counting bits of the analog-to-digital converter.
8. The method of calibrating an analog-to-digital converter based parameter according to claim 7, wherein the parameter is calibrated according to a pass equation
And acquiring the second coefficient T2, wherein Ts is the actual working temperature of the analog-to-digital converter, tc is the normal temperature, and j is-1.
9. The analog-to-digital converter based parameter calibration method of claim 8, wherein converting a first temperature signal of the analog-to-digital converter when generating the fifth digital code to a seventh digital code and converting a second temperature signal of the analog-to-digital converter when generating the sixth digital code to an eighth digital code according to a second conversion coefficient comprises:
obtaining the seventh digital code by calculating the quotient of the first temperature signal and the second coefficient T2;
the eighth digital code is obtained by calculating the quotient of the second temperature signal and the second coefficient T2.
10. An analog-to-digital converter based parameter calibration apparatus for performing the analog-to-digital converter based parameter calibration method of any of claims 1-9, comprising: the device comprises an acquisition unit, a conversion unit, a first parameter acquisition unit, a second parameter acquisition unit and a parameter calibration unit;
the acquisition unit is used for acquiring a first digital code generated by the analog-to-digital converter according to a first analog signal and a second digital code generated by the analog-to-digital converter according to a second analog signal at normal temperature;
the conversion unit is used for converting the first analog signal into a third digital code and converting the second analog signal into a fourth digital code according to a first conversion coefficient;
the first parameter obtaining unit is configured to obtain a first slope by calculating a ratio of a first difference value to a second difference value, where the first difference value is a difference value between the first digital code and the second digital code, and the second difference value is a difference value between the third digital code and the fourth digital code;
the second parameter obtaining unit is configured to obtain a first constant by calculating a first product, which is a product of the second digital code and the first slope, and calculating a difference value between the first digital code and the first product;
the parameter calibration unit is used for adjusting parameters of digital codes generated according to analog signals in the analog-to-digital converter by taking the first slope and the first constant as references so as to complete parameter calibration.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310264886.XA CN115987287B (en) | 2023-03-20 | 2023-03-20 | Parameter calibration method and device based on analog-to-digital converter |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310264886.XA CN115987287B (en) | 2023-03-20 | 2023-03-20 | Parameter calibration method and device based on analog-to-digital converter |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN115987287A CN115987287A (en) | 2023-04-18 |
| CN115987287B true CN115987287B (en) | 2023-06-30 |
Family
ID=85963485
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202310264886.XA Active CN115987287B (en) | 2023-03-20 | 2023-03-20 | Parameter calibration method and device based on analog-to-digital converter |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN115987287B (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113037283A (en) * | 2019-12-09 | 2021-06-25 | 中兴通讯股份有限公司 | Time-interleaved successive approximation type analog-to-digital converter and calibration method thereof |
| CN115425974A (en) * | 2022-09-01 | 2022-12-02 | 重庆邮电大学 | Digital calibration system and method for time deviation of time-domain interleaved analog-to-digital converter |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4592796B2 (en) * | 2008-12-15 | 2010-12-08 | 三菱電機株式会社 | Electronic control unit with analog input signal |
| US10382048B2 (en) * | 2015-05-28 | 2019-08-13 | Analog Devices, Inc. | Calibration of analog-to-digital converter devices |
| CN109660255B (en) * | 2018-12-14 | 2023-05-16 | 江苏芯云电子科技有限公司 | Nonlinear calibration method of analog-to-digital converter |
| CN114142862B (en) * | 2021-02-04 | 2022-11-18 | 上海辰竹仪表有限公司 | High-precision digital-to-analog conversion device and method |
| CN115063943B (en) * | 2022-08-15 | 2022-11-15 | 芯翼信息科技(上海)有限公司 | Smoke sensor and smoke detection equipment based on low-power-consumption analog-to-digital converter |
| CN115642913A (en) * | 2022-10-13 | 2023-01-24 | 北京奕斯伟计算技术股份有限公司 | Analog-to-digital converter ADC calibration method, device, equipment and storage medium |
-
2023
- 2023-03-20 CN CN202310264886.XA patent/CN115987287B/en active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113037283A (en) * | 2019-12-09 | 2021-06-25 | 中兴通讯股份有限公司 | Time-interleaved successive approximation type analog-to-digital converter and calibration method thereof |
| CN115425974A (en) * | 2022-09-01 | 2022-12-02 | 重庆邮电大学 | Digital calibration system and method for time deviation of time-domain interleaved analog-to-digital converter |
Also Published As
| Publication number | Publication date |
|---|---|
| CN115987287A (en) | 2023-04-18 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US8593314B2 (en) | A/D conversion circuit, integrated circuit device, electronic apparatus | |
| CN111837087A (en) | Temperature sensor, electronic device, and temperature detection system | |
| US20090212860A1 (en) | Integrated circuit device and electronic instrument | |
| CN112688687B (en) | Method and device for acquiring physical information to be tested, computer equipment and storage medium | |
| US6891486B1 (en) | Calibrating capacitor mismatch in a pipeline ADC | |
| CN102723951B (en) | Pipelined ADC (Analog-to-Digital Converter) digital background correcting circuit with translation technology | |
| CN115987287B (en) | Parameter calibration method and device based on analog-to-digital converter | |
| US6664911B2 (en) | Differential input A/D converter | |
| CN103529379A (en) | Selection method used for low-resolution signal source in high-precision ADC test | |
| CN103715984A (en) | Received signal strength indicator temperature compensation method and device | |
| US6456211B2 (en) | Method and system for calibrating a data converter | |
| EP3627708B1 (en) | Device for absolute voltage measurement | |
| CN104718703A (en) | Correction device and correction method for light reception power monitor | |
| CN102594276B (en) | Gain calibration system for instrument amplifier and gain calibration method | |
| KR20090085283A (en) | Apparatus and method of compensating the error of analog to digital converter | |
| Lukić et al. | A compact and cost-effective linearization circuit used for angular position sensors | |
| CN108387834B (en) | Wide area ADC error correction test method and device | |
| CN116032282A (en) | Comparator in successive approximation analog-to-digital converter and offset calibration method | |
| Jovanović et al. | NTC thermistor nonlinearity compensation using Wheatstone bridge and novel dual-stage single-flash piecewise-linear ADC | |
| CN115642913A (en) | Analog-to-digital converter ADC calibration method, device, equipment and storage medium | |
| CN114279566B (en) | Method, device and system for correcting non-linearity of spectrometer radiance response | |
| CN206670832U (en) | A kind of device for lifting temperature survey precision | |
| US20190128746A1 (en) | Temperature measurement apparatus | |
| CN115018812B (en) | Material type determining method, device, equipment and readable storage medium | |
| CN210427666U (en) | Current detection circuit |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |