CN115980502B - Optocoupler driving capability test method and system - Google Patents
Optocoupler driving capability test method and system Download PDFInfo
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- CN115980502B CN115980502B CN202310267834.8A CN202310267834A CN115980502B CN 115980502 B CN115980502 B CN 115980502B CN 202310267834 A CN202310267834 A CN 202310267834A CN 115980502 B CN115980502 B CN 115980502B
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Abstract
The invention relates to a method and a system for testing the driving capability of an optocoupler, wherein a test position of a test system is placed on an optocoupler U2 to be tested, an optocoupler standard component U1 is selected and placed on a standard reference position; applying a test voltage Vin to the input sides of the optocoupler U2 to be tested and the optocoupler standard unit U1; applying an output side voltage Vdd to the collectors of the output sides of the optocoupler standard unit U1 and the optocoupler to be tested U2; converting the current Ic1 and the current Ic2 of the emitters at the output sides of the optocoupler standard unit U1 and the optocoupler to be tested U2 into voltage Vc1 and voltage Vc2; the converted voltage Vc1 and the converted voltage Vc2 are transmitted to a logic processing module for combination, and the logic processing module outputs voltage Vout; the voltage Vout and the voltage Vc1 are transmitted to the waveform analysis unit, and the duty ratio Dout of the voltage Vout and the duty ratio Dc1 of the voltage Vc1 are compared and analyzed. The accuracy of the test optocoupler in the efficiency of processing the digital signals is improved, and the test optocoupler has the characteristics of being strong in stability, visual in result and strong in adjustability.
Description
Technical Field
The invention relates to the technical field of optocoupler testing, in particular to an optocoupler driving capability testing method and system.
Background
The optocoupler is an optocoupler, the working principle of the optocoupler is that an electric signal is input to an input side and is converted into an optical signal through a light emitting diode, and an optical effect tube at an output side converts the optical signal into the electric signal, so that the effect of front-and-back stage isolation of a circuit system can be realized, the optocoupler is commonly used for isolation and current amplification, and the optocoupler is widely applied to analog electricity and digital electricity.
In the prior art, the detection of the optocoupler is more than the detection of CTR (current transmission ratio), and CTR is an important basis as a basic index of the electrical characteristics of the optocoupler, but is more applied to the field of analog electricity and the basis of analog signals. In the field of digital circuits, an optocoupler can well transmit digital signals, and CTR is used for reflecting the on-off speed of the optocoupler, so that the problems of complex calculation process, non-visual result output and poor reliability exist.
Disclosure of Invention
The invention provides an optocoupler driving capability test method and system, and the scheme of the application is applied to solve the problems of complex calculation process, complex test flow, low accuracy and low efficiency of the test optocoupler, and has the characteristics of strong stability, visual result and strong adjustability.
The technical scheme of the invention is as follows:
an optocoupler driving capability test method comprises the steps of selecting an optocoupler U2 to be tested to be placed at a test position of a test system, selecting an optocoupler standard component U1 and placing the standard component U1 at a standard reference position;
applying the same test voltage Vin to the input sides of the optocoupler U2 to be tested and the optocoupler standard component U1, wherein the test voltage Vin is a PWM square wave signal;
applying the same output side voltage Vdd to the collectors of the output sides of the optocoupler standard unit U1 and the optocoupler to be tested U2;
converting the current Ic1 and the current Ic2 output by the emitters at the output side of the optocoupler standard unit U1 and the optocoupler to be tested U2 into voltage Vc1 and voltage Vc2;
the converted voltage Vc1 and the converted voltage Vc2 are transmitted to a logic processing module, the voltage Vc1 and the voltage Vc2 are combined through OR logic operation in the logic processing module, and the logic processing module outputs voltage Vout;
transmitting the voltage Vout and the voltage Vc1 to a waveform analysis unit, and performing comparison analysis on the duty ratio Dout of the voltage Vout and the duty ratio Dc1 of the voltage Vc 1;
and obtaining k1=Dc1/Dout, wherein k1 epsilon (0, 1), and reflecting the driving efficiency of the optocoupler U2 to be tested through the k1 value.
A testing method for driving capability of optocoupler selects the optocoupler U2 to be tested to be placed at the testing position of the testing system,
an optical coupling standard component U1 is selected and placed at a standard reference position;
applying the same test voltage Vin to the input sides of the optocoupler U2 to be tested and the optocoupler standard component U1, wherein the test voltage Vin is a PWM square wave signal;
applying the same output side voltage Vdd to the collectors of the output sides of the optocoupler standard unit U1 and the optocoupler to be tested U2;
converting the current Ic1 and the current Ic2 output by the emitters at the output side of the optocoupler standard unit U1 and the optocoupler to be tested U2 into voltage Vc1 and voltage Vc2;
the converted voltage Vc1 and the converted voltage Vc2 are transmitted to a logic processing module, the logic processing module combines the voltage Vc1 and the voltage Vc2 through OR logic operation, the logic processing module outputs a voltage Vout, meanwhile, the voltage Vc1 is transmitted to a comparison processing module, the voltage Vc1 is divided into two paths and enters the comparison processing module, the comparison processing module processes signals which are connected in parallel in two paths of the voltage Vc1 and carries out OR logic operation, the operation method of the comparison processing module is the same as that of the logic processing module, and the standard voltage Vst is output;
transmitting the voltage Vout and the standard voltage Vst to a waveform analysis unit, and comparing and analyzing the duty ratio Dout of the voltage Vout and the duty ratio Dst of the standard voltage Vst;
and obtaining k2=dst/Dout, wherein k2 epsilon (0, 1), and the driving efficiency of the optocoupler U2 to be tested is reflected through the k2 value.
An optocoupler driving capability test system comprises a test bit, a standard reference bit and a control module, wherein the test bit is used for placing an optocoupler U2 to be tested, the standard reference bit is used for placing an optocoupler standard component U1, the control module comprises a test voltage generating unit and a waveform analysis unit,
the test voltage generating unit is used for generating test voltage Vin and output side voltage Vdd, the input sides of the optocoupler U2 to be tested and the optocoupler standard unit U1 are connected in parallel to form a P1 port and a P2 port, the P1 port and the P2 port are connected with a test voltage generating interface of the test voltage generating unit, the P1 port and the P2 port are used for receiving the test voltage Vin,
the optical coupler standard unit U1 and the collector of the optical coupler U2 to be tested are connected in parallel and then electrically connected with an interface P3, the interface P3 is connected with the output side voltage Vdd, the emitters of the optical coupler standard unit U1 and the optical coupler U2 to be tested are respectively connected with the input end of a logic processing module after passing through a divider resistor R4 and a divider resistor R2, the output end of the logic processing module is connected with the first input end of the waveform analysis unit, the emitter of the optical coupler standard unit U1 is also connected with the second input end of the waveform analysis unit, the logic processing module is used for merging waveforms of output voltages of the optical coupler standard unit U1 and the optical coupler U2 to be tested, the optical coupler standard unit U1 further comprises a comparison processing module, the emitter of the optical coupler standard unit U1 is connected with the waveform analysis unit through the comparison processing module,
the logic processing module comprises a mos transistor Q1-Q6, wherein the mos transistor Q3, the mos transistor Q4 and the mos transistor Q5 are Pmos transistors, the mos transistor Q1, the mos transistor Q2 and the mos transistor Q6 are Nmos transistors, the emitter of the optocoupler standard U1 is connected in parallel with the gates of the mos transistor Q3 and the mos transistor Q1, the emitter of the optocoupler U2 to be tested is connected with the gates of the mos transistor Q4 and the mos transistor Q2, the drain of the mos transistor Q3 is connected with a voltage source VCC1, the source of the mos transistor Q3 is connected with the drain of the mos transistor Q4, the sources of the mos transistors Q1 and Q2 are connected in parallel, the drains of the mos transistors Q1 and Q2 are connected in parallel with each other, the drains of the mos transistors Q5 and Q6 are connected in parallel with each other, the drain of the mos transistor Q5 is connected with the drain of the voltage source VCC1, and the drain of the mos transistor Q6 are connected with the drain of the mos transistor Q5 as a series connection point of the drain of the mos transistor Q6.
The working principle and the beneficial effects of the invention are as follows:
the optocoupler standard component U1 is a standard product with relatively ideal CTR value, and is placed in a humidity range (20% -50%) of standard atmospheric pressure, normal temperature and relative dryness, and the electrical indexes of the optocoupler U2 to be tested and the optocoupler standard component U1 are compared, so that the control variable can be effectively realized. The input sides of the optocoupler standard component U1 and the optocoupler U2 to be tested are connected in parallel with the test voltage Vin, so that the fact that the input of the optocoupler standard component U1 and the input of the optocoupler U2 to be tested are identical is guaranteed, the controllability of input variables is achieved, the optocoupler U2 to be tested and the output side of the optocoupler standard component U1 are connected in parallel with the voltage Vdd of the same output side, at the moment, different environmental changes such as humidity and temperature can be applied to the optocoupler U2 to be tested, CTR value and on-off speed of the optocoupler U2 to be tested can be changed, the emitters of the optocoupler standard component U1 and the optocoupler U2 to be tested convert current values into voltage values Vc1 and Vc2 after resistor voltage division, the voltage Vc1 and the voltage Vc2 are square wave voltage signals, the square wave voltage signals are transmitted to the logic processing module, and the logic processing module carries out OR logic operation on the voltage Vc1 and the voltage Vc2, and the square wave voltage Vout after processing is obtained. Since the voltage Vc1 is the emitter voltage at the output side of the optocoupler standard unit U1, the duty ratio thereof may be used as a standard duty ratio, the voltage Vc1 and the voltage Vout are respectively input to the first input terminal and the second input terminal of the waveform analysis unit, the duty ratios of the two input voltages are compared, and k1 reflects the driving efficiency of the optocoupler U2 to be tested on the PWM signal, that is, the degree of response to the PWM wave, or a representation of the switching speed, k1 e (0, 1) according to the value k1 (i.e., dc 1/Dout) of the duty ratio Dc1 of the voltage Vc1 divided by the duty ratio Dout of the voltage Vout. Similarly, for the second method, k2 can be used for representing the driving efficiency of the optocoupler U2 to be tested, so that the accuracy of the efficiency of the testing optocoupler in processing digital signals is improved.
The scheme is applied to detection of the driving efficiency of the optocouplers, and a general application scene can be to analyze defective optocouplers and select qualified products; after the production line is upgraded or changed, the driving efficiency of the produced optical coupler product is tested; the change of the driving efficiency caused by the stress change of the optocoupler under different environments can be tested.
The method uses the idea of difference to directly compare the optocoupler to be tested with the standard optocoupler, so that the control of external variables is guaranteed to the greatest extent, and as the processing speed of the digital signals is far higher than that of the analog signals, the operation speed can be improved and the algorithm is simplified through the scheme, only the duty ratios of the two PWM signals are required to be compared, and the driving capability of the optocoupler to be tested to the PWM signals can be intuitively judged according to the ratio, and the driving efficiency is also improved. By applying the method, the complexity of the dependent test system is greatly simplified, the output speed of the result is improved, an intermediate step is omitted, the driving efficiency can be directly reflected, and the working efficiency of batch detection in production application is improved.
Drawings
The invention will be described in further detail with reference to the drawings and the detailed description.
FIG. 1 is a schematic block diagram of an embodiment 1 of an optocoupler driving capability test system according to the present application;
FIG. 2 is a schematic block diagram of an embodiment 2 of an optocoupler driving capability test system according to the present application;
FIG. 3 is a schematic block diagram of an embodiment 3 of an optocoupler driving capability test system according to the present application;
FIG. 4 is a schematic circuit diagram of the standard reference bit, test bit and logic processing module of the present application;
FIG. 5 is a schematic circuit diagram of a control processing module of the present application;
FIG. 6 is a schematic circuit diagram of embodiment 2 of the current feedback module of the present application;
FIG. 7 is a schematic circuit diagram of the current feedback module in embodiment 3 of the present application;
fig. 8 is a schematic circuit diagram of the D/a conversion module in embodiment 3 of the present application.
Detailed Description
The technical solutions of the embodiments of the present invention will be clearly and completely described below in conjunction with the embodiments of the present invention, and it is apparent that the described embodiments are only some embodiments of the present invention, not all embodiments. All other embodiments, which can be made by one of ordinary skill in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
In embodiment 1, as shown in fig. 1 of the specification, an optocoupler driving capability test method is provided, an optocoupler U2 to be tested is selected and placed at a test site of a test system,
an optical coupling standard component U1 is selected and placed at a standard reference position;
applying the same test voltage Vin to the input sides of the optocoupler U2 to be tested and the optocoupler standard component U1, wherein the test voltage Vin is a PWM square wave signal;
applying the same output side voltage Vdd to the collectors of the output sides of the optocoupler standard unit U1 and the optocoupler to be tested U2;
converting the current Ic1 and the current Ic2 output by the emitters at the output side of the optocoupler standard unit U1 and the optocoupler to be tested U2 into voltage Vc1 and voltage Vc2;
the converted voltage Vc1 and the converted voltage Vc2 are transmitted to a logic processing module, the voltage Vc1 and the voltage Vc2 are combined through OR logic operation in the logic processing module, and the logic processing module outputs voltage Vout;
transmitting the voltage Vout and the voltage Vc1 to a waveform analysis unit, and performing comparison analysis on the duty ratio Dout of the voltage Vout and the duty ratio Dc1 of the voltage Vc 1;
and obtaining k1=Dc1/Dout, wherein k1 epsilon (0, 1), and reflecting the driving efficiency of the optocoupler U2 to be tested through the k1 value.
In the scheme, the optocoupler standard component U1 is adopted to reflect the electrical index of the optocoupler U2 to be tested, the optocoupler standard component U1 and the optocoupler U2 to be tested are used for processing the same PWM signal together, the analysis result is compared to judge the reliability and the driving efficiency of the optocoupler U2 to be tested, after logic processing, the result is directly reflected by a division type, the operation steps are greatly simplified, the hardware pressure of a control module is reduced, and meanwhile, the idea of a control variable is adopted, so that the driving efficiency of the optocoupler is used as a unique variable, the error can be effectively reduced, and the accuracy of the result is greatly improved. The test voltage generating unit and the waveform analysis unit belong to the control module, and belong to different functional units of the control module, wherein the control module can be a singlechip, a computer and the like, and the waveform analysis unit can also be an oscilloscope and the like.
In embodiment 2, as shown in fig. 2 of the specification, an optocoupler driving capability test method is selected, an optocoupler U2 to be tested is placed at a test site of a test system,
an optical coupling standard component U1 is selected and placed at a standard reference position;
applying the same test voltage Vin to the input sides of the optocoupler U2 to be tested and the optocoupler standard component U1, wherein the test voltage Vin is a PWM square wave signal;
applying the same output side voltage Vdd to the collectors of the output sides of the optocoupler standard unit U1 and the optocoupler to be tested U2;
converting the current Ic1 and the current Ic2 output by the emitters at the output side of the optocoupler standard unit U1 and the optocoupler to be tested U2 into voltage Vc1 and voltage Vc2;
the converted voltage Vc1 and the converted voltage Vc2 are transmitted to a logic processing module, the logic processing module combines the voltage Vc1 and the voltage Vc2 through OR logic operation, the logic processing module outputs a voltage Vout, meanwhile, the voltage Vc1 is transmitted to a comparison processing module, the voltage Vc1 is divided into two paths and enters the comparison processing module, the comparison processing module processes signals which are connected in parallel in two paths of the voltage Vc1 and carries out OR logic operation, the operation method of the comparison processing module is the same as that of the logic processing module, and the standard voltage Vst is output; transmitting the voltage Vout and the standard voltage Vst to a waveform analysis unit, and comparing and analyzing the duty ratio Dout of the voltage Vout and the duty ratio Dst of the standard voltage Vst;
and obtaining k2=dst/Dout, wherein k2 epsilon (0, 1), and the driving efficiency of the optocoupler U2 to be tested is reflected through the k2 value.
In this method, the variable control is further performed on the method of embodiment 1, in embodiment 1, the waveform analysis unit directly analyzes the voltage Vc1, and the voltage Vout is processed by the logic processing module and then is transferred to the waveform analysis unit, so that Vout is compared with Vc1 by one more processing procedure, and the difference is caused to a certain extent in this procedure (although the logic processing module applies mos devices, the switching speed is far greater than that of the optocouplers, the influence on the duty ratio is not great, but there is an error value), so in this embodiment, the voltage Vc1 is processed by the comparison processing module, and the electrical structures of the comparison processing module and the logic processing module are completely the same, and therefore, the waveform error between the output standard voltage Vst waveform and the voltage Vout is smaller, and the k2 value can better reflect the driving efficiency of the optocouplers U2 to be tested.
As shown in fig. 2 and 6 of the specification, the method further includes collecting the current Ic2, transmitting the collected current value to a CTR analysis unit, and calculating the CTR value of the optocoupler U2 to be tested.
The CTR analysis unit is also a functional unit included in the control module, and the part calculates the CTR value of the optocoupler to be tested through the electric quantity values of the port P1 and the port P2 in fig. 3 and the electric quantity values of the port P4 and the port P5 in fig. 6, wherein in the calculation formula ctr=ion/If of the CTR, the port P1 and the port P2 react with the If value, and the port P4 and the port P5 react with the Ion value.
And according to the analysis result of the CTR analysis unit, performing voltage compensation on the collector electrode of the optocoupler U2 to be tested, and applying a compensation voltage Vref.
Because the performance of the optocoupler U2 to be tested is unstable, the problem that the resistance value of the output side is increased and the CTR value is reduced generally exists. If it is desired to ensure that the output-side current value is stable or belongs to an ideal value, the voltage required for the emitter on the output side is high. Therefore, the compensation voltage Vref (shown in fig. 4) can increase the voltage drop at the output side of the optocoupler U2 to be tested to ensure the intensity and stability of the output current, so that the logic processing module can be stably started.
As shown in fig. 2 of the specification, the compensation voltage Vref is applied to the voltage Vc2 by a D/a conversion module.
Under the condition of applying the D/A conversion module, the control module (test voltage generation unit) directly outputs 0 and 1 digital signals to the D/A conversion module, and the D/A conversion module can convert the received digital value into reasonable analog voltage quantity to be used as compensation film Vref, so that the calculation load of the control module can be reduced, and the operation efficiency is increased.
The test position is hermetically placed in an environment variable control system, and the environment variable control system is used for adjusting the test environment of the optocoupler U2 to be tested.
When the stress changes caused by different environments are carried out on the optocoupler U2 to be tested, and the electrical characteristics are changed, the environment information of the environment variable control system can be regulated and controlled, the environment variable control system is a closed space, a plurality of sensors such as a temperature sensor, a humidity sensor, an air pressure sensor, an inclination sensor and the like are placed in the environment variable control system, the environment variable control system further comprises a humidifier, a heating part and the like, and the change of the internal environment can be controlled according to test requirements, so that various environment supports are provided for the optocoupler U2 to be tested, and the driving efficiency of the optocoupler U2 to be tested under different environments can be tested by combining the method.
the test voltage generating unit is used for generating test voltage Vin and output side voltage Vdd, the input sides of the optocoupler U2 to be tested and the optocoupler standard unit U1 are connected in parallel to form a P1 port and a P2 port, the P1 port and the P2 port are connected with a test voltage generating interface of the test voltage generating unit, the P1 port and the P2 port are used for receiving the test voltage Vin,
the optical coupler standard U1 and the collector of the optical coupler U2 to be tested are connected in parallel and then electrically connected with an interface P3, the interface P3 is connected with the output side voltage Vdd, the emitters of the optical coupler standard U1 and the optical coupler U2 to be tested are respectively connected with the input end of a logic processing module after passing through a voltage dividing resistor R4 and a voltage dividing resistor R2, the output end of the logic processing module is connected with the first input end of the waveform analysis unit, the emitter of the optical coupler standard U1 is also connected with the second input end of the waveform analysis unit, the logic processing module is used for merging waveforms of output voltages of the optical coupler standard U1 and the optical coupler U2 to be tested, the optical coupler standard U1 further comprises a comparison processing module, the comparison processing module is identical with the logic processing module, the emitter of the optical coupler standard U1 is connected with the waveform analysis unit through the comparison processing module,
the logic processing module comprises a mos transistor Q1-Q6, wherein the mos transistor Q3, the mos transistor Q4 and the mos transistor Q5 are Pmos transistors, the mos transistor Q1, the mos transistor Q2 and the mos transistor Q6 are Nmos transistors, the emitter of the optocoupler standard U1 is connected in parallel with the gates of the mos transistor Q3 and the mos transistor Q1, the emitter of the optocoupler U2 to be tested is connected with the gates of the mos transistor Q4 and the mos transistor Q2, the drain of the mos transistor Q3 is connected with a voltage source VCC1, the source of the mos transistor Q3 is connected with the drain of the mos transistor Q4, the sources of the mos transistors Q1 and Q2 are connected in parallel, the drains of the mos transistors Q1 and Q2 are connected in parallel with each other, the drains of the mos transistors Q5 and Q6 are connected in parallel with each other, the drain of the mos transistor Q5 is connected with the drain of the voltage source VCC1, and the drain of the mos transistor Q6 are connected with the drain of the mos transistor Q5 as a series connection point of the drain of the mos transistor Q6.
As shown in fig. 5 of the specification, the control processing module includes mos transistors Q12-Q17, where the mos transistor Q16, the mos transistor Q17, and the mos transistor Q13 are Pmos transistors, the mos transistor Q15, the mos transistor Q14, and the mos transistor Q12 are Nmos transistors, the emitter of the optocoupler standard U1 is connected in parallel to the gates of the mos transistor Q16 and the mos transistor Q15 and the gates of the mos transistor Q17 and the mos transistor Q14, the drain of the mos transistor Q16 is connected to the voltage source VCC1, the source of the mos transistor Q16 is connected to the drain of the mos transistor Q17, the sources of the mos transistor Q17 are connected in parallel to the drains of the mos transistors Q15 and Q14, the drains of the mos transistors Q15 and Q14 are connected in parallel to the gates of the mos transistor Q13 and Q12, the drain of the mos transistor Q13 is connected to the drain of the mos transistor Q13, and the drain of the mos transistor Q13 is connected to the drain of the mos transistor Q12, and the drain of the mos transistor Q13 is connected to the drain of the logic transistor Q12.
The optocoupler standard component U1 is connected in parallel with the input side of the optocoupler U2 to be tested, the fact that PWM signals input by the two optocouplers are identical is guaranteed, the test voltage generating module is connected with the P1 port and the P2 port, a stable voltage value can be provided for the two optocouplers, the resistor R5 is connected between the input sides of the two optocouplers, the control module can calculate current passing through the optocoupler U2 according to the resistance of the resistor R5, the resistance of the potentiometer RP1, the voltage drop of the input side of the optocoupler U1 and the voltage drop of the diode D1, and the control module also provides output side voltage Vdd through the P3 interface.
As shown in figure 4 of the specification, Q3, Q4 and Q5 are PMOS, Q1, Q2 and Q6 are NMOS, when Vc1 and Vc2 have low potential, only one of Q3 and Q4 is cut off, at least one of Q1 and Q2 is conducted, the sources of Q5 and Q6 are pulled to low potential, Q5 is conducted, and Q6 is cut off, and then high potential is output. On the contrary, when Vc1 and Vc2 are both in high potential, Q3 and Q4 are switched on, Q1 and Q2 are switched off, the sources of Q5 and Q6 are pulled to high potential, Q5 is switched off, and Q6 is switched on, and low potential is output.
As shown in fig. 5 of the specification, the device further comprises a comparison processing module, wherein the emitter of the optical coupling standard unit U1 is connected with the waveform analysis unit through the comparison processing module, and the comparison processing module is identical to the logic processing module.
The structure and principle of the comparison processing module are the same as those of the logic processing module, and the description of the principle of the logic processing module is referred.
As shown in fig. 4 of the specification, a potentiometer RP2 connected in parallel with the voltage dividing resistor R2 is disposed at the emitter of the optocoupler U2 to be tested, the connection point of the voltage dividing resistor R2 and the logic processing module is connected to the compensation voltage interface of the test voltage generating unit, and the connection point of the voltage dividing resistor R2 and the logic processing module receives the compensation voltage Vref.
In the figure, for simplicity, the inserted compensation voltage Vref is represented by a curve, and the compensation voltage is used as a compensation voltage source to be connected in series with the emitter of the optocoupler U2 to be tested, wherein the positive electrode of the compensation voltage source is connected with the emitter of the optocoupler U2 to be tested.
As shown in fig. 2 or 8 of the specification, a D/a conversion module is disposed between the compensation voltage interface of the test voltage generating unit and the collector of the optocoupler U2 to be tested, and the test voltage generating unit controls the D/a conversion module to provide the compensation voltage Vref.
The output end of the summing amplifier U5 is the positive electrode, namely the compensation voltage Vref, GND2 is the negative electrode, and the negative electrode is connected with the emitter of the optocoupler standard component U1, wherein VA, VEE and VCC2 are provided by a control module, the values of the VA, VEE and VCC2 are selected according to the optocouplers of different types, the input value of the analog switch is a binary digital signal, and the bit setting of the analog switch can be adjusted according to the conditions of specific test optocouplers.
The control module further comprises a CTR analysis unit, and the emitter of the optical coupler U2 to be tested is connected with the CTR analysis unit through the current feedback module.
As shown in fig. 2 or 7 of the specification, the current feedback module converts the current Ic2 into a voltage value which can be processed by the amplifier U6 through the voltage dividing resistor R11, and sends the voltage value to the CTR analysis unit for CTR calculation after the processing of the amplifier U6, so that the magnitude of the compensation voltage Vref can be adjusted according to the calculation result, and when Ic2 is equal to the normal condition, the value of the compensation voltage Vref is reasonable.
When the method provided by the method is applied, a reasonable threshold value of k can be set in the control module, and the larger the k value is, the closer Dout is to Dst or Dc1, the stronger the driving efficiency of the optocoupler to be tested is; conversely, the smaller k indicates that Vout is severely deformed, that is, vc2 is severely deformed, and is not suitable for transmitting PWM signals.
The switching speed of the optocoupler in the defective optocoupler or the disqualified environment is inevitably reduced, so that the waveform duty ratio of Vc1 and Vc2 overlapped is necessarily larger than Dst or Dc1 under the normal condition, and therefore, the driving efficiency index of the optocoupler to be tested can be simply and efficiently expressed by the method.
The foregoing description of the preferred embodiments of the invention is not intended to be limiting, but rather is intended to cover all modifications, equivalents, alternatives, and improvements that fall within the spirit and scope of the invention.
Claims (10)
1. An optocoupler driving capability test method selects an optocoupler U2 to be tested to be placed at a test position of a test system, and is characterized in that:
an optical coupling standard component U1 is selected and placed at a standard reference position;
applying the same test voltage Vin to the input sides of the optocoupler U2 to be tested and the optocoupler standard component U1, wherein the test voltage Vin is a PWM square wave signal;
applying the same output side voltage Vdd to the collectors of the output sides of the optocoupler standard unit U1 and the optocoupler to be tested U2;
converting the current Ic1 and the current Ic2 output by the emitters at the output side of the optocoupler standard unit U1 and the optocoupler to be tested U2 into voltage Vc1 and voltage Vc2;
the converted voltage Vc1 and the converted voltage Vc2 are transmitted to a logic processing module, the voltage Vc1 and the voltage Vc2 are combined through OR logic operation in the logic processing module, and the logic processing module outputs voltage Vout;
transmitting the voltage Vout and the voltage Vc1 to a waveform analysis unit, and performing comparison analysis on the duty ratio Dout of the voltage Vout and the duty ratio Dc1 of the voltage Vc 1;
and obtaining k1=Dc1/Dout, wherein k1 epsilon (0, 1), and reflecting the driving efficiency of the optocoupler U2 to be tested through the k1 value.
2. An optocoupler driving capability test method selects an optocoupler U2 to be tested to be placed at a test position of a test system, and is characterized in that:
an optical coupling standard component U1 is selected and placed at a standard reference position;
applying the same test voltage Vin to the input sides of the optocoupler U2 to be tested and the optocoupler standard component U1, wherein the test voltage Vin is a PWM square wave signal;
applying the same output side voltage Vdd to the collectors of the output sides of the optocoupler standard unit U1 and the optocoupler to be tested U2;
converting the current Ic1 and the current Ic2 output by the emitters at the output side of the optocoupler standard unit U1 and the optocoupler to be tested U2 into voltage Vc1 and voltage Vc2;
the converted voltage Vc1 and the converted voltage Vc2 are transmitted to a logic processing module, the logic processing module combines the voltage Vc1 and the voltage Vc2 through OR logic operation, the logic processing module outputs a voltage Vout, meanwhile, the voltage Vc1 is transmitted to a comparison processing module, the voltage Vc1 is divided into two paths and enters the comparison processing module, the comparison processing module processes signals which are connected in parallel in two paths of the voltage Vc1 and carries out OR logic operation, the operation method of the comparison processing module is the same as that of the logic processing module, and the standard voltage Vst is output;
transmitting the voltage Vout and the standard voltage Vst to a waveform analysis unit, and comparing and analyzing the duty ratio Dout of the voltage Vout and the duty ratio Dst of the standard voltage Vst;
and obtaining k2=dst/Dout, wherein k2 epsilon (0, 1), and the driving efficiency of the optocoupler U2 to be tested is reflected through the k2 value.
3. The method for testing the driving capability of an optocoupler according to claim 2, wherein: the method further comprises the steps of collecting the current Ic2, transmitting the collected current value to a CTR analysis unit, and calculating the CTR value of the optocoupler U2 to be tested.
4. The method for testing the driving capability of an optocoupler according to claim 3, wherein: and according to the analysis result of the CTR analysis unit, performing voltage compensation on the collector electrode of the optocoupler U2 to be tested, and applying a compensation voltage Vref.
5. The method for testing the driving capability of an optocoupler according to claim 4, wherein: and applying the compensation voltage Vref to the collector electrode of the optocoupler U2 to be tested through a D/A conversion module.
6. The utility model provides an opto-coupler driving capability test system, includes the test bit, the test bit is used for placing the opto-coupler U2 that awaits measuring, its characterized in that: the device also comprises a standard reference bit which is used for placing an optocoupler standard component U1, and a control module which comprises a test voltage generating unit and a waveform analyzing unit,
the test voltage generating unit is used for generating test voltage Vin and output side voltage Vdd, the input sides of the optocoupler U2 to be tested and the optocoupler standard unit U1 are connected in parallel to form a P1 port and a P2 port, the P1 port and the P2 port are connected with a test voltage generating interface of the test voltage generating unit, the P1 port and the P2 port are used for receiving the test voltage Vin,
the optical coupler standard U1 and the collector of the optical coupler U2 to be tested are connected in parallel and then electrically connected with an interface P3, the interface P3 is connected with the output side voltage Vdd, the emitters of the optical coupler standard U1 and the optical coupler U2 to be tested are respectively connected with the input end of a logic processing module after passing through a voltage dividing resistor R4 and a voltage dividing resistor R2, the output end of the logic processing module is connected with the first input end of the waveform analysis unit, the emitter of the optical coupler standard U1 is also connected with the second input end of the waveform analysis unit, the logic processing module is used for merging waveforms of output voltages of the optical coupler standard U1 and the optical coupler U2 to be tested, the optical coupler standard U1 is also provided with a comparison processing module, the comparison processing module and the logic processing module are the same, the emitter of the optical coupler standard U1 is connected with the waveform analysis unit through the comparison processing module,
the logic processing module comprises a mos transistor Q1-Q6, wherein the mos transistor Q3, the mos transistor Q4 and the mos transistor Q5 are Pmos transistors, the mos transistor Q1, the mos transistor Q2 and the mos transistor Q6 are Nmos transistors, the emitter of the optocoupler standard U1 is connected in parallel with the gates of the mos transistor Q3 and the mos transistor Q1, the emitter of the optocoupler U2 to be tested is connected with the gates of the mos transistor Q4 and the mos transistor Q2, the drain of the mos transistor Q3 is connected with a voltage source VCC1, the source of the mos transistor Q3 is connected with the drain of the mos transistor Q4, the sources of the mos transistors Q1 and Q2 are connected in parallel, the drains of the mos transistors Q1 and Q2 are connected in parallel with each other, the drains of the mos transistors Q5 and Q6 are connected in parallel with each other, the drain of the mos transistor Q5 is connected with the drain of the voltage source VCC1, and the drain of the mos transistor Q6 are connected with the drain of the mos transistor Q5 as a series connection point of the drain of the mos transistor Q6.
7. The optocoupler driving capability test system of claim 6, wherein: the comparison processing module comprises a mos transistor Q12-Q17, wherein the mos transistor Q16, the mos transistor Q17 and the mos transistor Q13 are Pmos transistors, the mos transistor Q15, the mos transistor Q14 and the mos transistor Q12 are Nmos transistors, the emitters of the optocoupler standard U1 are connected in parallel with the gates of the mos transistor Q16 and the mos transistor Q15 and the gates of the mos transistor Q17 and the mos transistor Q14, the drain of the mos transistor Q16 is connected with a voltage source VCC1, the source of the mos transistor Q16 is connected with the drain of the mos transistor Q17, the sources of the mos transistor Q17 are connected with the drains of the mos transistors Q15 and Q14 in parallel, the sources of the mos transistors Q15 and Q14 are connected in parallel, the drains of the mos transistors Q13 and Q12 are connected in parallel, the drain of the mos transistor Q13 is connected with the voltage source VCC1, the source of the mos transistor Q13 is connected with the drain of the mos transistor Q12, and the drain of the mos transistor Q13 is connected with the drain of the logic transistor Q12 as a source of the drain of the MOS transistor Q12.
8. The optocoupler driving capability test system of claim 6, wherein: the emitter of the optocoupler to be tested U2 is provided with a potentiometer RP2 connected in parallel with the divider resistor R2, and the collector of the optocoupler to be tested U2 is also connected in series with a compensation voltage interface of the test voltage generating unit, wherein the compensation voltage interface is used for providing compensation voltage Vref.
9. The optocoupler driving capability test system of claim 6, wherein: the control module further comprises a CTR analysis unit, and the collector of the optocoupler U2 to be tested is connected with the CTR analysis unit through the current feedback module.
10. The optocoupler driving capability test system of claim 8, wherein: a D/a conversion module is arranged between the compensation voltage interface of the test voltage generation unit and the collector of the optocoupler to be tested U2, and the test voltage generation unit controls the D/a conversion module to provide the compensation voltage Vref.
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