CN115856750B - Quick calibration device and method for SOC test system - Google Patents
Quick calibration device and method for SOC test system Download PDFInfo
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- CN115856750B CN115856750B CN202310152392.2A CN202310152392A CN115856750B CN 115856750 B CN115856750 B CN 115856750B CN 202310152392 A CN202310152392 A CN 202310152392A CN 115856750 B CN115856750 B CN 115856750B
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Abstract
The invention discloses a device and a method for quickly calibrating an SOC test system, which are used for calibrating the SOC test system, and comprise an SOC test system calibration source board and a universal meter, wherein the SOC test system is provided with more than two functional board cards, each functional board card is provided with a Load & Measure module and more than two PMU modules, and all the EXT_F & EXT_S output ports of the modules on each functional board card are connected to a public EXT_F & EXT_S bus; and the SOC test system calibration source board is respectively connected with the public EXT_F & EXT_S bus of each functional board card, the Load & Measure module of each functional board card and the universal meter. The invention can quickly improve the calibration time through the high-speed parallel calibration among the functional boards.
Description
Technical Field
The invention relates to a device and a method for quickly calibrating an SOC test system, belonging to the field of automatic test equipment of integrated circuits.
Background
The calibration scheme of the existing SOC test system is to calibrate each channel in the system one by using an external high-precision universal meter, because the number of channels of the high-density integrated circuit test system is increased in geometric level, and different calibration items are arranged in each channel, each calibration item contains different gears, so that the calibration time of the whole system is multiplied, the time spent in calibration is an important index for measuring the test system, the single-channel calibration time of the existing calibration scheme is 30s, a 512-channel system and a single-board 64-channel system are required to be about 30min, and the time required for overall calibration is about 4.25h.
The traditional solution method is that a calibration test program is optimized, and the test efficiency is improved, but the improvement efficiency of the method is limited, and the time for reading the result of the external multimeter is constant, and the requirement on the test stability is higher.
In the second traditional solution, a calibration source is added to replace an external multimeter, and the calibration time is improved, but the scheme also increases the test time by increasing the number of channels of the test system, so that the test time of the multimeter is only optimized.
The two solutions have problems, namely, the problem that each channel needs to be calibrated through a universal meter by the first traditional testing method and the problem of low testing efficiency. In the second conventional test method, the calibration efficiency is limited by the calibration source. In summary, each conventional test scheme cannot obviously reduce the calibration time in a high-density test system, and the increase of the calibration time is the increase of cost, so that the conventional test system is advanced to low cost and high efficiency.
Disclosure of Invention
The invention aims to: in order to overcome the problem that the test time of the calibration system is not improved substantially by the existing calibration scheme, the invention provides a quick calibration device and a quick calibration method of an SOC test system.
The technical scheme is as follows: in order to achieve the above purpose, the invention adopts the following technical scheme:
the quick calibration device of the SOC test system is used for calibrating the SOC test system and comprises an SOC test system calibration source board and a universal meter, wherein the SOC test system is provided with more than two functional board cards, each functional board card is provided with a Load & Measure module and more than two PMU modules, each PMU module is provided with a module EXT_F & EXT_S output port, and all the module EXT_F & EXT_S output ports on each functional board card are connected to a public EXT_F & EXT_S bus; and the SOC test system calibration source board is respectively connected with the public EXT_F & EXT_S bus of each functional board card, the Load & Measure module of each functional board card and the universal meter.
Preferably: all the module ext_f & ext_s output ports on each functional board are connected to a common ext_f & ext_s bus by relays.
Preferably: the SOC test system is provided with 8 functional boards, and each functional board is provided with 64 PMU modules.
A quick calibration method of an SOC test system adopts the quick calibration device of the SOC test system, and comprises the following steps:
step 1, calibration source calibration: the method for calibrating the SOC test system calibration source board through the multimeter comprises the following steps: the calibration source PMU module of the calibration source board of the SOC test system is driven, the calibration source measurement module of the calibration source board of the SOC test system measures parameters of the calibration source PMU module of the calibration source board of the SOC test system, the parameters are used as a first parameter, the parameters of the calibration source PMU module of the calibration source board of the SOC test system are measured through a universal meter, the first parameter is compared with the second parameter to obtain calibration source calibration parameters, and the calibrated calibration source board of the SOC test system is obtained according to the calibration source calibration parameters;
step 2, load & measure module calibration: the method for calibrating the Load & Measure modules on each functional board card by taking the calibrated SOC test system calibration source board as a reference comprises the steps of: driving any one PMU module on the ith functional board card, and measuring the Load & Measure module on the ith functional board card to the PMU module driven on the ith functional board card to obtain a first parameter; meanwhile, the calibrated SOC test system calibration source board also measures a PMU module driven on the ith functional board card to obtain a second parameter, the first parameter is compared with the second parameter to obtain a Load & Measure module calibration parameter of the ith functional board card, and the calibrated Load & Measure module of the ith functional board card is obtained according to the Load & Measure module calibration parameter of the ith functional board card; load & Measure modules on each functional board card are calibrated in sequence;
step 3, calibrating each channel PMU module: each functional board card is calibrated in sequence to each channel PMU module in the functional board card through a public EXT_F & EXT_S bus by taking the respective calibrated Load & Measure module as a reference; based on the respective calibrated Load & Measure modules, each functional board card sequentially calibrates each channel PMU module in the functional board card through a common EXT_F & EXT_S bus by the method of: and recording a jth PMU module on the ith functional board as an ij PMU module, recording a Load & Measure module on the ith functional board as an ith Load & Measure module, driving the ij PMU module, and measuring the driving ij PMU module by the ith Load & Measure module through a public EXT_F & EXT_S bus to obtain calibration parameters of the ij PMU module, and completing the calibration of the ij PMU module according to the calibration parameters of the ij PMU module.
Preferably: and 3, calibrating different functional boards in the step 3 at the same time.
Preferably: the calibration source calibration parameters in step 1 include load resistance, MI and MV.
Compared with the prior art, the invention has the following beneficial effects:
the invention fully utilizes the calibration source, and introduces load and measurement in each board card, so that the internal channels of each single board can be independently calibrated, the channels of different board cards can be calibrated in parallel, and the calibration time is quickly prolonged.
Drawings
FIG. 1 is a schematic diagram of an SOC test system.
Fig. 2 is a block diagram of the structure of the present invention.
Detailed Description
The present invention is further illustrated in the accompanying drawings and detailed description which are to be understood as being merely illustrative of the invention and not limiting of its scope, and various equivalent modifications to the invention will fall within the scope of the appended claims to the skilled person after reading the invention.
The utility model provides a quick calibrating device of SOC test system, as shown in fig. 1 and 2, is used for the calibration of SOC test system, including SOC test system calibration source board 7 and high accuracy universal meter 6, SOC test system calibration source board 7 mainly used replaces outside high accuracy universal meter, realizes the quick calibration of SOC system, SOC test system 1 installs the function board card more than two, is provided with Load & Measure module 5 and more than two PMU module 2 on each function board card, and each PMU module 2 is provided with module EXT_F & EXT_S output port 4, and all modules EXT_F & EXT_S output port 4 on each function board card are connected to public EXT_F & EXT_S bus 3 through the relay. And the SOC test system calibration source board 7 is respectively connected with the public EXT_F & EXT_S bus 3 of each functional board card, the Load & Measure module 5 of each functional board card and the universal meter 6.
In the embodiment of the invention, 8 functional boards are installed in the SOC test system 1, and 64 PMU modules 2 are disposed on each functional board.
A quick calibration method of an SOC test system adopts the quick calibration device of the SOC test system, and comprises the following steps:
step 1, calibration source calibration: calibrating the SOC test system by the universal meter 6 to calibrate the source board 7, and calibrating various parameters of the source board 7 by the SOC test system, such as: load resistance, MI, MV and the like, a calibration source PMU module and a calibration source measuring module are arranged on a calibration source board 7 of the calibration SOC test system, and the method for calibrating the calibration source board 7 of the SOC test system comprises the following steps: the calibration source PMU module of the SOC test system calibration source board 7 is driven, the calibration source measurement module of the SOC test system calibration source board 7 measures parameters of the calibration source PMU module of the SOC test system calibration source board 7, the parameters are taken as a first parameter, meanwhile, the parameters of the calibration source PMU module of the SOC test system calibration source board 7 are measured through the universal meter 6, the first parameter is taken as a second parameter, the first parameter is compared with the second parameter, a calibration source calibration parameter is obtained, and the calibrated SOC test system calibration source board 7 is obtained according to the calibration source calibration parameter.
Step 2, load & measure module 5 calibration: the Load & Measure modules 5 on each functional board card are calibrated based on the calibrated SOC test system calibration board 7, and it should be noted that the functional boards in the chassis are all calibrated, so as to prepare for subsequent parallel calibration. Method of calibrating Load & Measure modules 5 on each function board: and driving any PMU module 2 on the ith functional board card, and measuring the PMU module 2 driven on the ith functional board card by the Load & Measure module 5 on the ith functional board card to obtain a first parameter. Meanwhile, the calibrated SOC test system calibration source board 7 also measures the PMU module 2 driven on the ith functional board card to obtain a second parameter, the first parameter is compared with the second parameter to obtain the Load & Measure module 5 calibration parameter of the ith functional board card, and the Load & Measure module 5 of the ith functional board card is calibrated according to the Load & Measure module 5 calibration parameter of the ith functional board card. The Load & Measure modules 5 on each function board are calibrated in turn.
Step 3, each channel PMU module 2 calibrates: and each functional board card is used for calibrating each channel PMU module 2 in the functional board card in sequence through the common EXT_F & EXT_S bus 3 by taking the calibrated Load & Measure module 5 as a reference. The method for calibrating the PMU modules 2 of the channels in the functional board card sequentially through the common EXT_F and EXT_S buses 3 by taking the calibrated Load & Measure modules 5 as references of the functional board cards comprises the following steps: and (3) recording a jth PMU module 2 on the ith functional board as an ij PMU module, recording a Load & Measure module 5 on the ith functional board as an ith Load & Measure module, and driving the ij PMU module, wherein the ith Load & Measure module measures the driving ij PMU module through a public EXT_F & EXT_S bus 3 to obtain calibration parameters of the ij PMU module, and calibrating the ij PMU module according to the calibration parameters of the ij PMU module. At this time, different functional boards can be calibrated at the same time.
The invention uses Load & Measure modules on the functional board card, and the parallel calibration of a plurality of functional board cards can quickly improve the calibration efficiency of the whole machine, reduce the calibration time, and the optimization time is very obvious. For example, a 512 channel tester, a single function board 64 channel, requires 8 boards, and the prior art scheme requires 8 times for a single board, while the time required by the present invention is still that required for a single board.
The invention has the advantages that the calibration function is placed in the functional board card, so that the calibration board is separated, the types of hardware board cards are reduced, the cost of the calibration board is saved, and the competitiveness of the equipment cost is improved.
The EXT_F and EXT_S buses are used for outputting, so that the use of an output relay is reduced, the problem caused by the abnormality of the relay is reduced, the equipment is convenient to maintain, and the stability of the performance of the equipment is improved.
The invention uses the Load & Measure modules of the external meter, the calibration source and the function board card for hierarchical calibration. And the output relay is reduced by outputting through EXT_F & EXT_S buses. And calibrating the functional board card through a Load & Measure module of the functional board card. Multiple function cards may be calibrated in parallel. The optimization of the calibration efficiency is very obvious, the whole system can be calibrated only by spending time for calibrating one functional board card, and the calibration scheme of the invention only needs 30 minutes for calibrating the whole system just like the calibration scheme of the prior art, thus the calibration efficiency is greatly optimized and the calibration time is saved.
The invention also saves the hardware cost, in particular to a calibration plate which saves the prior proposal, and hundreds of relays on the calibration plate are all very large cost, but the invention reduces the cost of the whole testing machine and improves the competitiveness of the equipment.
The foregoing is only a preferred embodiment of the invention, it being noted that: it will be apparent to those skilled in the art that various modifications and adaptations can be made without departing from the principles of the present invention, and such modifications and adaptations are intended to be comprehended within the scope of the invention.
Claims (5)
1. A quick calibration method of an SOC test system is used for calibrating the SOC test system and is characterized in that: the quick calibration device of the SOC test system (1) comprises an SOC test system calibration source board (7) and a universal meter (6), wherein the SOC test system (1) is provided with more than two functional board cards, each functional board card is provided with a Load & Measure module (5) and more than two PMU modules (2), the Load & Measure module (5) introduces Load and measurement into each board card, a calibration function is placed inside the functional board card, each PMU module (2) is provided with a module EXT_F & EXT_S output port (4), and all the module EXT_F & EXT_S output ports (4) on each functional board card are connected to a public EXT_F & EXT_S bus (3); the SOC test system calibration source board (7) is respectively connected with the public EXT_F & EXT_S bus (3) of each functional board card, the Load & Measure module (5) of each functional board card and the universal meter (6);
the method comprises the following steps:
step 1, calibration source calibration: calibrating an SOC test system calibration source board (7) through a universal meter (6), and calibrating the SOC test system calibration source board (7) by the method: the calibration source PMU module of the calibration source board (7) of the SOC test system is driven, the calibration source measurement module of the calibration source board (7) of the SOC test system measures parameters of the calibration source PMU module of the calibration source board (7) of the SOC test system, the parameters serve as first parameters, the parameters of the calibration source PMU module of the calibration source board (7) of the SOC test system are measured through the universal meter (6), the first parameters are compared with the second parameters, calibration source calibration parameters are obtained, and the calibrated SOC test system calibration source board (7) is obtained according to the calibration source calibration parameters;
step 2, load & measure module (5) calibration: the method for calibrating the Load & Measure modules (5) on each functional board card by taking the calibrated SOC test system calibration source board (7) as a reference comprises the steps of: driving any one PMU module (2) on the ith functional board card, and measuring the PMU module (2) driven on the ith functional board card by a Load & Measure module (5) on the ith functional board card to obtain a first parameter; meanwhile, the calibrated SOC test system calibration source board (7) also measures a PMU module (2) driven on the ith functional board card to obtain a second parameter, the first parameter is compared with the second parameter to obtain a Load & Measure module (5) calibration parameter of the ith functional board card, and the Load & Measure module (5) of the ith functional board card is calibrated according to the Load & Measure module (5) calibration parameter of the ith functional board card; load & Measure modules (5) on each functional board card are calibrated in sequence;
step 3, calibrating each channel PMU module (2): each functional board card sequentially calibrates each channel PMU module (2) in the functional board card through a public EXT_F & EXT_S bus (3) by taking the calibrated Load & Measure module (5) as a reference; the method for calibrating the PMU modules (2) of all channels in the functional board card sequentially through the common EXT_F & EXT_S bus (3) by taking the calibrated Load & Measure modules (5) as references of the functional board card comprises the following steps: and (3) recording a jth PMU module (2) on the ith functional board as an ij PMU module, recording a Load & Measure module (5) on the ith functional board as an ith Load & Measure module, and driving the ij PMU module, wherein the ith Load & Measure module measures the driven ij PMU module through a public EXT_F & EXT_S bus (3) to obtain calibration parameters of the ij PMU module, and calibrating the ij PMU module according to the calibration parameters of the ij PMU module.
2. The SOC test system rapid calibration method of claim 1, wherein: all the modules EXT_F & EXT_S output ports (4) on each functional board card are connected to a common EXT_F & EXT_S bus (3) through relays.
3. The SOC test system rapid calibration method of claim 2, wherein: 8 functional boards are mounted on the SOC test system (1), and 64 PMU modules (2) are arranged on each functional board.
4. A method for rapid calibration of an SOC test system as claimed in claim 3, wherein: and 3, calibrating different functional boards in the step 3 at the same time.
5. The SOC test system rapid calibration method of claim 4, wherein: the calibration source calibration parameters in step 1 include load resistance, MI and MV.
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