CN115839957B - Method, device, equipment and storage medium for detecting interlayer defects of display module - Google Patents
Method, device, equipment and storage medium for detecting interlayer defects of display module Download PDFInfo
- Publication number
- CN115839957B CN115839957B CN202310135320.7A CN202310135320A CN115839957B CN 115839957 B CN115839957 B CN 115839957B CN 202310135320 A CN202310135320 A CN 202310135320A CN 115839957 B CN115839957 B CN 115839957B
- Authority
- CN
- China
- Prior art keywords
- defect
- detected
- display module
- camera device
- image
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Landscapes
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Abstract
The invention discloses a method, a device, equipment and a medium for detecting interlayer defects of a display module, wherein the method comprises the following steps: acquiring at least 2 images to be detected of the display module to be detected through at least 2 camera devices, wherein the at least 2 camera devices are arranged on the same horizontal line relative to the display module to be detected; performing defect detection on at least 2 images to be detected, and obtaining defect positions in the at least 2 images to be detected; and determining the position of the detected defect in the display module according to the defect positions of the detected defect in at least 2 images to be detected, wherein the position of the defect in the display module comprises a surface layer, an interlayer and/or a cg layer. By adopting the invention, the accuracy of detecting the interlayer defects of the display module can be improved.
Description
Technical Field
The present invention relates to the field of industrial machine vision, and in particular, to a method and apparatus for detecting interlayer defects of a display module, a computer device, and a computer readable storage medium.
Background
The display panel is assembled by a plurality of layers of materials in the manufacturing process, and the display panel comprises the following components in sequence from outside to inside: cover glass, touch functional layer, display layer and backlight plate. The assembly links of each layer inevitably introduce some dust or foreign matters. Once dust or foreign matter occurs in a certain layer of the display panel, the display panel is treated as a defective product.
In the related technical schemes, in order to detect whether defects such as dust or foreign matters exist in each layer of the display panel, the current production line is mostly detected by using a manual sampling inspection mode by a microscope or by adopting an automatic detection method such as spectral confocal detection, confocal laser scanning, multi-field imaging defect feature classification and the like. The detection methods have the advantages of no higher requirements on detection conditions, no slower detection speed or poor detection effect, and are easy to be interfered by surface dust, so that interlayer defects are not easy to be distinguished.
That is, the scheme of detecting interlayer defects such as ash layers and foreign matters existing in the interlayer of the display panel has a problem of insufficient accuracy.
Disclosure of Invention
Based on this, it is necessary to provide a method, a device, a computer device and a computer readable storage medium for detecting interlayer defects of a display module.
In a first aspect of the present invention, a method for detecting a defect in an interlayer of a display module is provided, the method comprising:
acquiring at least 2 images to be detected of a display module to be detected through at least 2 camera devices, wherein the at least 2 camera devices are arranged on the same horizontal line relative to the display module to be detected;
performing defect detection on the at least 2 images to be detected, and obtaining defect positions in the at least 2 images to be detected;
and determining the position of the detected defect in the display module according to the defect positions of the detected defect in the at least 2 images to be detected, wherein the position of the defect in the display module comprises a surface layer, an interlayer and/or a cg layer.
Optionally, the at least 2 image capturing devices include a first image capturing device and a second image capturing device;
the step of acquiring defect positions in the at least 2 images to be detected further includes: acquiring a first defect position in a first image to be detected acquired by a first camera device, and acquiring a second defect position in a second image to be detected acquired by a second camera device, wherein the first defect position and the second defect position are coordinate positions under the same coordinate system;
the step of determining the position of the detected defect in the display module according to the defect positions of the detected defect in the at least 2 images to be detected further comprises: determining whether defect deviation exists according to the first defect position and the second defect position, if yes, determining the deviation amount according to the first defect position and the second defect position; and determining the position of the defect in the display module according to the offset.
Optionally, the 2 camera devices and the same horizontal line of the display module to be detected form an included angle in the horizontal direction, and the included angle is 10-160 degrees; the 2 camera devices focus on the same point on the display module to be detected.
Optionally, after the step of determining whether the defect offset exists according to the first defect position and the second defect position, the method further includes: if the defect deviation does not exist, determining that the defect is on the surface layer of the display module;
the step of determining the position of the defect in the display module according to the offset further comprises: if the offset meets a first offset range, determining that the defect is in an interlayer of the display module; if the offset meets a second offset range, determining that the defect is on the cg layer of the display module; the first offset range and the second offset range are determined according to the thickness of the display module to be detected and the angle of the included angle between the first camera device and the second camera device, and the first offset range is smaller than the second offset range.
Optionally, the first light source and the first camera device are correspondingly arranged and form transmission field imaging at the opposite side of the display module to be detected, and the second light source and the second camera device are correspondingly arranged and form transmission field imaging at the opposite side of the display module to be detected;
the step of obtaining at least 2 images to be detected of the display module to be detected through at least 2 camera devices further comprises the following steps: the first light source and the second light source flash alternately, the first image to be detected is acquired through the first camera device when the first light source flashes, and the second image to be detected is acquired through the second camera device when the second light source flashes.
Optionally, the method further comprises: calibrating cameras of the first camera device and the second camera device, and respectively acquiring calibration conversion matrixes corresponding to the first camera device and the second camera device;
the step of acquiring a first defect position in a first image to be detected acquired by a first camera device, and acquiring a second defect position in a second image to be detected acquired by a second camera device, wherein the first defect position and the second defect position are coordinate positions under the same coordinate system, and the step of further comprises: performing defect identification on a first image to be detected, and performing coordinate position conversion on the identified defect based on a calibration conversion matrix corresponding to the first camera device to obtain a first defect position; and carrying out defect identification on the second image to be detected, and carrying out coordinate position conversion on the identified defect based on a calibration conversion matrix corresponding to the second image pickup device to obtain a second defect position.
In a second aspect of the present invention, there is provided a device for detecting defects in an interlayer of a display module, the device comprising:
the image acquisition module is used for acquiring at least 2 images to be detected of the display module to be detected through at least 2 camera devices, and the at least 2 camera devices are arranged on the same horizontal line relative to the display module to be detected;
the defect identification module is used for carrying out defect detection on the at least 2 images to be detected and obtaining defect positions in the at least 2 images to be detected;
and the defect interlayer position confirming module is used for determining the position of the detected defect in the display module according to the defect positions of the detected defect in the at least 2 images to be detected, wherein the position of the defect in the display module comprises a surface layer, an interlayer and/or a cg layer.
Optionally, the at least 2 image capturing devices include a first image capturing device and a second image capturing device;
the defect identification module is further used for acquiring a first defect position in a first image to be detected acquired by the first camera device and acquiring a second defect position in a second image to be detected acquired by the second camera device, wherein the first defect position and the second defect position are coordinate positions under the same coordinate system;
the defect interlayer position confirming module is also used for determining whether defect deviation exists according to the first defect position and the second defect position, and if yes, determining the deviation amount according to the first defect position and the second defect position; and determining the position of the defect in the display module according to the offset.
In a third aspect of the present invention, there is provided a computer device comprising a memory and a processor, the memory having executable code which when run on the processor implements a method of detecting a display module interlayer defect as described above.
In a fourth aspect of the present invention, there is provided a computer readable storage medium for storing a computer program for executing the method for detecting a display module interlayer defect as described above.
The embodiment of the invention has the following beneficial effects:
after the method, the device, the computer equipment and the computer readable storage medium for detecting the interlayer defects of the display module are adopted, when the interlayer defects of the display module are detected, the images to be detected of the display module to be detected are obtained through at least 2 camera devices arranged on the same horizontal line relative to the display module to be detected, and then the defect positions in the at least 2 images to be detected are obtained through defect detection of the at least 2 images to be detected; and determining that the positions of the detected defects in the display module are surface layers, interlayers and/or cg layers according to the fact that the positions of the detected defects in the at least 2 images to be detected are consistent or have offset. That is, because the display module has a certain thickness, the positions of defects at different positions in images acquired by different camera devices are different, so that the positions of interlayer defects can be determined according to the positions of the defects in different images to be detected, thereby improving the accuracy of interlayer defect detection.
Drawings
In order to more clearly illustrate the embodiments of the invention or the technical solutions in the prior art, the drawings that are required in the embodiments or the description of the prior art will be briefly described, it being obvious that the drawings in the following description are only some embodiments of the invention, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
Wherein:
FIG. 1 is a flow chart of a method for detecting defects of a display module interlayer according to an embodiment;
FIG. 2 is a schematic diagram of a detection system for detecting defects in an interlayer of a display module according to an embodiment;
FIG. 3 is a schematic diagram showing the relationship between the offset and the thickness of the display module and the angle of the camera device according to one embodiment;
FIG. 4 is a schematic diagram showing the relationship between the offset and the thickness of the display module and the angle of the camera device according to one embodiment;
FIG. 5 is a schematic diagram of a device for detecting interlayer defects of a display module according to an embodiment;
fig. 6 is a schematic structural diagram of a computer device running the method for detecting defects of the display module interlayer according to an embodiment.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
In this embodiment, in order to detect an interlayer defect in a display template such as a display panel, a method for detecting an interlayer defect of a display module is provided, which can detect and locate an interlayer defect of the display module, and improve accuracy of detecting an interlayer defect of the display module. Specifically, the method for detecting the interlayer defects of the display module can be applied to an application scene of detecting whether the produced display module has interlayer defects in scenes such as industrial production, and the like, and can be part of defect detection, independent interlayer defect detection and part of production of the display module.
Specifically, referring to fig. 1, fig. 1 shows a flow chart of implementation of a method for detecting defects of a display module interlayer. The method for detecting the interlayer defect of the display module comprises the following steps S101-S103 shown in FIG. 1:
step S101: at least 2 images to be detected of the display module to be detected are obtained through at least 2 camera devices, and the at least 2 camera devices are arranged on the same horizontal line relative to the display module to be detected.
And when the display module to be detected runs to the detection position on the production line or the product detection platform, acquiring an image to be detected of the display module to be detected through the camera device so as to detect defects in the display module to be detected, particularly interlayer defects. The display module to be detected can be a display module such as a liquid crystal display panel and a display screen, and the display module comprises a plurality of layers, wherein the layers may have defects in the production process or foreign matters or defects among the layers, and interlayer defects of the display module can be detected in the production process or after the production is completed.
Specifically, at least 2 image capturing devices are disposed above the moving platform of the display module to be detected, for example, at different positions above the detection position on the moving platform, and focus on the detection position and focus on the same point on the detection position. The first image pickup device and the second image pickup device can cover the display module to be detected, and the vision fields of the first image pickup device and the second image pickup device are at least partially/completely overlapped.
In a specific embodiment, the at least 2 image capturing devices include a first image capturing device and a second image capturing device, which respectively form a certain angle with the horizontal direction (the horizontal line where the moving platform is located, the moving direction) of the same horizontal line of the display module to be detected, and an included angle is formed between the 2 image capturing devices, and the included angle ranges from 10 degrees to 160 degrees. Preferably, the angle of the included angle is not too small or too large for achieving a good defect detection effect. In the application scenario shown in fig. 2, the angle between the imaging device 1 and the imaging device 2 and the horizontal line (movement direction) is 45 degrees.
Further, in this embodiment, in order to cooperate with at least 2 image capturing devices to capture images, a light source corresponding to each image capturing device is also used. Specifically, the first light source and the first camera device are correspondingly arranged, and form transmission field imaging on the opposite side of the display module to be detected, and the second light source and the second camera device are correspondingly arranged, and form transmission field imaging on the opposite side of the display module to be detected. For example, in the scene shown in fig. 2, the light source 1 corresponds to the image pickup device 1, and the light source 2 corresponds to the image pickup device 2. When the images of the display module to be detected are collected, the first light source and the second light source flash alternately, the first image to be detected is collected through the first camera device when the first light source flashes, and the second image to be detected is collected through the second camera device when the second light source flashes. That is, when the display module to be detected passes through the detection position, the light source 1 and the light source 2 flash alternately, and simultaneously the image pickup device 1 and the image pickup device 2 cooperate with the light source to scan the images sequentially line by line, and the image pickup device 1 and the image pickup device 2 collect the images to be detected simultaneously.
In another embodiment, the light source and the image pickup device do not need to form transmission field imaging on different sides, and the light source can also be used for polishing imaging from the front, or a plurality of light sources are used for polishing detection on the display module, so that different defect types can be detected, and the adaptation range of interlayer defect detection is improved.
Step S102: and performing defect detection on the at least 2 images to be detected, and obtaining defect positions in the at least 2 images to be detected.
After the image to be detected is obtained, further defect detection can be performed on the image to be detected, and if the defect is detected, the defect and the corresponding coordinate position (defect position) of the defect in the image to be detected are further obtained.
Specifically, a first defect position in a first image to be detected acquired by a first camera device is acquired, and a second defect position in a second image to be detected acquired by a second camera device is acquired. In this case, since it is difficult to maintain the positions of the image pickup devices in agreement during the mounting process, the image pickup devices 1 and 2 need to be subjected to position calibration before defect detection. And establishing a connection by calibrating the positions of the two camera devices. In the calibration process, the camera device 1 and the camera device 2 shoot the same piece of high-precision calibration plate, characteristic points of a plurality of areas are selected on the calibration plate, and the two camera devices perform calibration conversion of the position relationship through the characteristic points. That is, the positional relationship between the two image capturing devices needs to be calibrated to the same coordinate system, and the positional deviation value of the same defect in the two image capturing devices can be calculated on the basis of the calibration. That is, the first defect position and the second defect position are coordinate positions in the same coordinate system; specifically, calibrating cameras of a first camera device and a second camera device, and respectively acquiring calibration conversion matrixes corresponding to the first camera device and the second camera device; the step of acquiring a first defect position in a first image to be detected acquired by a first camera device, and acquiring a second defect position in a second image to be detected acquired by a second camera device, wherein the first defect position and the second defect position are coordinate positions under the same coordinate system, and the step of further comprises: performing defect identification on a first image to be detected, and performing coordinate position conversion on the identified defect based on a calibration conversion matrix corresponding to the first camera device to obtain a first defect position; and carrying out defect identification on the second image to be detected, and carrying out coordinate position conversion on the identified defect based on a calibration conversion matrix corresponding to the second image pickup device to obtain a second defect position.
Step S103: and determining the position of the detected defect in the display module according to the defect positions of the detected defect in the at least 2 images to be detected, wherein the position of the defect in the display module comprises a surface layer, an interlayer and/or a cg layer.
After the defect is acquired in each image to be detected, the position of the defect in the image to be detected acquired in different cameras may be different because the defect may be in different layers of the display module to be detected because of the angle existing between the cameras and the display module to be detected. For example, if the defect is in the case of the surface layer of the display module, the positions of the defects in the images to be detected corresponding to the different image capturing devices are the same, whereas if the defect is in the case of the interlayer of the display module, the positions of the defects in the images to be detected corresponding to the different image capturing devices may be shifted. Therefore, the position of the defect in different images to be detected can be used for judging which layer of the display module is defective.
Specifically, determining the position of the detected defect in the display module according to the defect positions of the detected defect in the at least 2 images to be detected, that is, determining whether defect offset exists according to the first defect position and the second defect position, and if yes, determining the offset according to the first defect position and the second defect position; and then determining the position of the defect in the display module according to the offset. The position of the defect comprises a surface layer, an interlayer and a cg layer of the display module. And wherein the interlayer further comprises a specific one of the interlayers.
Specifically, referring to fig. 2, if the defect is on the upper surface layer of the display module, i.e. on the sensor layer, the coordinate positions of the defect in the image capturing device 1 and the image capturing device 2 are the same, i.e. there is an offset between the first defect position and the second defect position, because of the different-side lighting manner. If the defect is in the interlayer of the display module, the coordinate positions of the defect in the images acquired by the image capturing device 1 and the image capturing device 2 may deviate along the moving direction due to the angle of the image capturing device, that is, the first defect position and the second defect position corresponding to the defect may deviate. If the defect is on the cg layer of the display module, the coordinate positions of the defect in the images acquired by the image capturing device 1 and the image capturing device 2 will deviate along the moving direction, and the deviation amount will be the largest. Therefore, in this embodiment, in the case where there is an offset, it may be determined which layer of the display module is defective according to the magnitude of the offset. Therefore, whether the defects are on the upper surface layer or the lower surface layer of the display module or in the interlayer of the display module can be determined, interference of the defects on the upper surface layer and the lower surface layer on interlayer defect detection can be well filtered in the interlayer defect detection process, and the accuracy of interlayer defect detection is improved.
Specifically, determining whether a defect offset exists according to the first defect position and the second defect position, if so, determining an offset according to the first defect position and the second defect position; determining the position of the defect in the display module according to the offset; if not, determining that the defect is on the surface layer of the display module.
Further, in the case of defect deviation, the deviation amount can be determined according to the difference between the first defect position and the second defect position, and then the position of the defect in the display module is determined according to the deviation amount. Specifically, if the offset meets a first offset range, determining that the defect is in an interlayer of the display module; if the offset meets a second offset range, determining that the defect is on the cg layer of the display module; the first offset range and the second offset range are determined according to the thickness of the display module to be detected and the angle of the included angle between the first camera device and the second camera device, and the first offset range is smaller than the second offset range.
In a specific embodiment, as shown in fig. 3-4, a schematic diagram of the relationship between the offset and the thickness of the display module and the addition of the camera device is provided. Assuming that the thickness of the display module to be detected is a, the difference of refractive indexes among different media is not considered in an ideal state, and under the example that the included angle between the image pickup device and the display module to be detected is 45 degrees, when the same object is at the bottommost layer, the deviation is the largest in the images shot by the two image pickup devices, and the distance is 2a. When the included angle between the camera device and the display module to be detected is 30 degrees, the deviation is the largest in the pictures shot by the two camera devices when the same object is at the bottommost layer, and the distance is 1.154a. The deviation between the imaging device 30 degrees and the imaging device 45 degrees is 0.85a. The product thickness was 0.72mm and the pixel accuracy was 0.014mm/pixel. The imaging device is offset by 102 pixels at 45 degrees. The image pickup device is offset by 59 pixels at 30 degrees. That is, the larger the angle between the image pickup devices, the larger the deviation value of the defect in the two image pickup devices. The larger the thickness of the display module is, the larger the deviation value of different layer defects in the two camera devices is. The greater the pixel accuracy of the image capture device, the greater the deviation value of the defect in the image. The accuracy of interlayer defect detection can be improved by increasing the angle of the imaging device and the accuracy of the imaging device.
Further, as shown in fig. 5, this embodiment further provides a device for detecting a defect of an interlayer of a display module, where the device includes:
an image acquisition module 101, configured to acquire at least 2 images to be detected of a display module to be detected through at least 2 image capturing devices, where the at least 2 image capturing devices are disposed on a same horizontal line relative to the display module to be detected;
the defect identification module 102 is configured to perform defect detection on the at least 2 images to be detected, and obtain defect positions in the at least 2 images to be detected;
and the defect interlayer position confirming module 103 is used for determining the position of the detected defect in the display module according to the defect positions of the detected defect in the at least 2 images to be detected, wherein the position of the defect in the display module comprises a surface layer, an interlayer and/or a cg layer.
Optionally, in one embodiment, the at least 2 image capturing devices include a first image capturing device and a second image capturing device; the defect identification module 102 is further configured to obtain a first defect position in a first image to be detected, which is acquired by the first camera, and obtain a second defect position in a second image to be detected, which is acquired by the second camera, where the first defect position and the second defect position are coordinate positions in the same coordinate system; the defect interlayer position confirmation module 103 is further configured to determine whether a defect offset exists according to the first defect position and the second defect position, and if yes, determine an offset according to the first defect position and the second defect position; and determining the position of the defect in the display module according to the offset.
Optionally, in an embodiment, the 2 image capturing devices and the display module to be detected form an included angle in a horizontal direction of a same horizontal line, and the included angle ranges from 10 degrees to 160 degrees; the 2 camera devices focus on the same point on the display module to be detected.
Optionally, in an embodiment, the defect interlayer location confirmation module 103 is further configured to determine that the defect is on the surface layer of the display module in the case that there is no defect offset.
Optionally, in an embodiment, the defect interlayer location confirmation module 103 is further configured to determine that the defect is in an interlayer of the display module if the offset meets a first offset range; under the condition that the offset meets a second offset range, determining that the defect is on the cg layer of the display module; the first offset range and the second offset range are determined according to the thickness of the display module to be detected and the angle of the included angle between the first camera device and the second camera device, and the first offset range is smaller than the second offset range.
Optionally, in an embodiment, the first light source is disposed corresponding to the first camera device and forms a transmission field image on the opposite side of the display module to be detected, and the second light source is disposed corresponding to the second camera device and forms a transmission field image on the opposite side of the display module to be detected; the image acquisition module 101 is further configured to alternately flash the first light source and the second light source, collect a first image to be detected through the first image capturing device when the first light source flashes, and collect a second image to be detected through the second image capturing device when the second light source flashes.
Optionally, in an embodiment, as shown in fig. 5, the apparatus further includes a camera calibration module 104, configured to perform camera calibration on the first image capturing device and the second image capturing device, and obtain calibration conversion matrices corresponding to the first image capturing device and the second image capturing device respectively;
optionally, in an embodiment, the defect identifying module 102 is further configured to identify a defect of the first image to be detected, and perform coordinate position conversion on the identified defect based on a calibration conversion matrix corresponding to the first image capturing device, so as to obtain a first defect position; and carrying out defect identification on the second image to be detected, and carrying out coordinate position conversion on the identified defect based on a calibration conversion matrix corresponding to the second image pickup device to obtain a second defect position.
Fig. 6 is a diagram showing an internal structure of a computer device for implementing the method for detecting interlayer defects of a display module according to an embodiment. The computer device may specifically be a terminal or a server. As shown in fig. 6, the computer device includes a processor, a memory, and a network interface connected by a system bus. The memory includes a nonvolatile storage medium and an internal memory. The non-volatile storage medium of the computer device stores an operating system, and may also store a computer program which, when executed by a processor, causes the processor to implement the method described above. The internal memory may also have stored therein a computer program which, when executed by a processor, causes the processor to perform the method described above. It will be appreciated by those skilled in the art that the structure shown in fig. 6 is merely a block diagram of some of the structures associated with the present application and is not limiting of the computer device to which the present application may be applied, and that a particular computer device may include more or fewer components than shown, or may combine certain components, or have a different arrangement of components.
After the method, the device, the computer equipment and the computer readable storage medium for detecting the interlayer defects of the display module are adopted, when the interlayer defects of the display module are detected, the images to be detected of the display module to be detected are obtained through at least 2 camera devices arranged on the same horizontal line relative to the display module to be detected, and then the defect positions in the at least 2 images to be detected are obtained through defect detection of the at least 2 images to be detected; and determining that the positions of the detected defects in the display module are surface layers, interlayers and/or cg layers according to the fact that the positions of the detected defects in the at least 2 images to be detected are consistent or have offset. That is, because the display module has a certain thickness, the positions of defects at different positions in images acquired by different camera devices are different, so that the positions of interlayer defects can be determined according to the positions of the defects in different images to be detected, thereby improving the accuracy of interlayer defect detection.
Those skilled in the art will appreciate that all or part of the processes in the methods of the above embodiments may be implemented by a computer program for instructing relevant hardware, where the program may be stored in a non-volatile computer readable storage medium, and where the program, when executed, may include processes in the embodiments of the methods described above. Any reference to memory, storage, database, or other medium used in the various embodiments provided herein may include non-volatile and/or volatile memory. The nonvolatile memory can include Read Only Memory (ROM), programmable ROM (PROM), electrically Programmable ROM (EPROM), electrically Erasable Programmable ROM (EEPROM), or flash memory. Volatile memory can include Random Access Memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in a variety of forms such as Static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double Data Rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous Link DRAM (SLDRAM), memory bus direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM), among others.
The technical features of the above embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.
The above examples only represent a few embodiments of the present application, which are described in more detail and are not to be construed as limiting the scope of the present application. It should be noted that it would be apparent to those skilled in the art that various modifications and improvements could be made without departing from the spirit of the present application, which would be within the scope of the present application. Accordingly, the scope of protection of the present application is to be determined by the claims appended hereto.
Claims (4)
1. The method for detecting the interlayer defect of the display module is characterized by comprising the following steps:
the method comprises the steps that a first image to be detected and a second image to be detected of a display module to be detected are obtained through a first image pickup device and a second image pickup device, the first image pickup device and the second image pickup device are arranged on the same horizontal line relative to the display module to be detected and form an included angle, the angle range of the included angle is 10-160 degrees, and the first image pickup device and the second image pickup device focus on the same point on the display module to be detected; the first camera device is correspondingly provided with a first light source, the second camera device is correspondingly provided with a second light source, the first light source and the first camera device form transmission field imaging on the opposite side of the display module to be detected, and the second light source and the second camera device form transmission field imaging on the opposite side of the display module to be detected; the step of obtaining the first to-be-detected image and the second to-be-detected image of the to-be-detected display module through the first camera device and the second camera device further comprises the following steps: the first light source and the second light source flash alternately, a first image to be detected is acquired through the first camera device when the first light source flashes, and a second image to be detected is acquired through the second camera device when the second light source flashes;
performing defect detection on the first to-be-detected image and the second to-be-detected image, and acquiring a first defect position and a second defect position in the first to-be-detected image and the second to-be-detected image, wherein the first defect position and the second defect position are coordinate positions under the same coordinate system;
the step of acquiring a first defect position in a first image to be detected acquired by a first camera device, and acquiring a second defect position in a second image to be detected acquired by a second camera device, wherein the first defect position and the second defect position are coordinate positions under the same coordinate system, and the step of further comprises:
performing defect identification on a first image to be detected, and performing coordinate position conversion on the identified defect based on a calibration conversion matrix corresponding to the first camera device to obtain a first defect position; the calibration conversion matrix corresponding to the first camera device is obtained by calibrating a camera of the first camera device;
performing defect identification on a second image to be detected, and performing coordinate position conversion on the identified defect based on a calibration conversion matrix corresponding to the second camera device to obtain a second defect position; the calibration conversion matrix corresponding to the second camera device is obtained by calibrating the second camera device;
determining whether a defect offset exists according to the first defect position and the second defect position, if yes, determining an offset according to the first defect position and the second defect position, determining the position of the defect in the display module according to the offset, wherein the position of the defect in the display module comprises a surface layer, an interlayer and/or a cg layer, and if not, determining the surface layer of the defect in the display module;
wherein, the step of determining the position of the defect in the display module according to the offset further comprises: determining the position of the defect in the display module according to the offset, the thickness of the display module and the included angle between the first camera device and the second camera device;
if the offset meets a first offset range, determining that the defect is in an interlayer of the display module;
if the offset meets a second offset range, determining that the defect is on the cg layer of the display module; the first offset range and the second offset range are determined according to the thickness of the display module to be detected and the angle of the included angle between the first camera device and the second camera device, and the first offset range is smaller than the second offset range;
if the defect is on the upper surface layer of the display module, the coordinate positions of the defect in the first camera device and the second camera device are the same, and no offset exists between the first defect position and the second defect position; if the defect is in the interlayer of the display module, the angle of the camera device can cause the coordinate position of the defect in the images acquired by the first camera device and the second camera device to deviate along the horizontal line direction, and the first defect position and the second defect position deviate; if the defect is on the cg layer of the display module, the coordinate positions of the defect in the images acquired by the first image capturing device and the second image capturing device are offset along the horizontal line direction, and the offset is larger than the offset of the defect in the case of an interlayer.
2. A device for detecting defects of an interlayer of a display module, the device comprising:
the image acquisition module is used for acquiring a first image to be detected and a second image to be detected of the display module to be detected through the first image pickup device and the second image pickup device, the first image pickup device and the second image pickup device are arranged on the same horizontal line relative to the display module to be detected and form an included angle, the range of the included angle is 10-160 degrees, and the first image pickup device and the second image pickup device focus on the same point on the display module to be detected; the first camera device is correspondingly provided with a first light source, the second camera device is correspondingly provided with a second light source, the first light source and the first camera device form transmission field imaging on the opposite side of the display module to be detected, and the second light source and the second camera device form transmission field imaging on the opposite side of the display module to be detected; the image acquisition module is also used for controlling the first light source and the second light source to alternately flash, acquiring a first image to be detected through the first camera device when the first light source flashes, and acquiring a second image to be detected through the second camera device when the second light source flashes;
the defect identification module is used for carrying out defect detection on the first to-be-detected image and the second to-be-detected image, and obtaining a first defect position and a second defect position in the first to-be-detected image and the second to-be-detected image, wherein the first defect position and the second defect position are coordinate positions under the same coordinate system; performing defect identification on a first image to be detected, and performing coordinate position conversion on the identified defect based on a calibration conversion matrix corresponding to a first camera device to obtain a first defect position; the calibration conversion matrix corresponding to the first camera device is obtained by calibrating a camera of the first camera device; performing defect identification on a second image to be detected, and performing coordinate position conversion on the identified defect based on a calibration conversion matrix corresponding to the second camera device to obtain a second defect position; the calibration conversion matrix corresponding to the second camera device is obtained by calibrating the second camera device;
the defect interlayer position confirming module is used for determining whether defect deviation exists according to the first defect position and the second defect position, if yes, determining the offset according to the first defect position and the second defect position, and determining the position of the defect in the display module according to the offset, wherein the position of the defect in the display module comprises a surface layer, an interlayer and/or a cg layer, and if not, determining that the defect is on the surface layer of the display module; determining the position of the defect in the display module according to the offset, the thickness of the display module and the included angle between the first camera device and the second camera device; if the offset meets a first offset range, determining that the defect is in an interlayer of the display module; if the offset meets a second offset range, determining that the defect is on the cg layer of the display module; the first offset range and the second offset range are determined according to the thickness of the display module to be detected and the angle of the included angle between the first camera device and the second camera device, and the first offset range is smaller than the second offset range;
if the defect is on the upper surface layer of the display module, the coordinate positions of the defect in the first camera device and the second camera device are the same, and no offset exists between the first defect position and the second defect position; if the defect is in the interlayer of the display module, the angle of the camera device can cause the coordinate position of the defect in the images acquired by the first camera device and the second camera device to deviate along the horizontal line direction, and the first defect position and the second defect position deviate; if the defect is on the cg layer of the display module, the coordinate positions of the defect in the images acquired by the first image capturing device and the second image capturing device are offset along the horizontal line direction, and the offset is larger than the offset of the defect in the case of an interlayer.
3. A computer-readable storage medium storing a computer program for executing the method of detecting a interlayer defect of a display module set according to claim 1.
4. A computer device comprising a memory and a processor, the memory having executable code that when run on the processor implements the method of detecting a display module interlayer defect of claim 1.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310135320.7A CN115839957B (en) | 2023-02-20 | 2023-02-20 | Method, device, equipment and storage medium for detecting interlayer defects of display module |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310135320.7A CN115839957B (en) | 2023-02-20 | 2023-02-20 | Method, device, equipment and storage medium for detecting interlayer defects of display module |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN115839957A CN115839957A (en) | 2023-03-24 |
| CN115839957B true CN115839957B (en) | 2023-06-16 |
Family
ID=85579933
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202310135320.7A Active CN115839957B (en) | 2023-02-20 | 2023-02-20 | Method, device, equipment and storage medium for detecting interlayer defects of display module |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN115839957B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116380918A (en) * | 2023-05-18 | 2023-07-04 | 赣州市秋田微电子有限公司 | Defect detection method, device and equipment |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002243583A (en) * | 2001-02-19 | 2002-08-28 | Toshiba Corp | Inspection method for image quality of flat display panel and inspection device for image quality of flat display panel |
| CN112200760A (en) * | 2019-06-20 | 2021-01-08 | 惠州旭鑫智能技术有限公司 | Device and method for measuring and layering depth of defect of liquid crystal module |
| CN110618141B (en) * | 2019-09-17 | 2022-08-05 | 深圳新视智科技术有限公司 | Method, system and device for detecting glass defects |
| CN112051038B (en) * | 2020-09-10 | 2021-08-06 | 高视科技(苏州)有限公司 | Defect detection method and system for detecting display screen of wearable device |
| CN114648480A (en) * | 2020-12-17 | 2022-06-21 | 杭州海康威视数字技术股份有限公司 | Surface defect detection method, device and system |
| CN113538420A (en) * | 2021-09-07 | 2021-10-22 | 深圳新视智科技术有限公司 | Defect detection method and system based on double cameras and multiple light sources |
-
2023
- 2023-02-20 CN CN202310135320.7A patent/CN115839957B/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| CN115839957A (en) | 2023-03-24 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Abdelhamed et al. | A high-quality denoising dataset for smartphone cameras | |
| KR100841497B1 (en) | Method for inspecting unevenness, manufacturing method for display panel and apparatus for inspecting unevenness | |
| JP5489897B2 (en) | Stereo distance measuring device and stereo distance measuring method | |
| JP3983573B2 (en) | Stereo image characteristic inspection system | |
| KR100744212B1 (en) | Method and system for detecting defects on a printed circuit board | |
| KR100805486B1 (en) | A system and a method of measuring a display at multi-angles | |
| CN115839957B (en) | Method, device, equipment and storage medium for detecting interlayer defects of display module | |
| JP6209833B2 (en) | Inspection tool, inspection method, stereo camera production method and system | |
| CN113269762B (en) | Screen defect detection method, system and computer storage medium | |
| CN103858001A (en) | Method for inspecting flat panel | |
| JP2008098968A (en) | Defect inspection device | |
| KR101036066B1 (en) | Wafer containing cassette inspection device and method | |
| CN109932369B (en) | Method and device for detecting special-shaped display panel | |
| CN112033965A (en) | 3D arc surface defect detection method based on differential image analysis | |
| CN109916914B (en) | Product defect detection method and device | |
| JP5207057B2 (en) | Dirt detection device and method for detecting contamination of an imaging device | |
| CN110596139A (en) | Screen defect detection method and system | |
| JP2009229197A (en) | Linear defect detecting method and device | |
| CN112348775A (en) | Vehicle-mounted all-round-looking-based pavement pool detection system and method | |
| KR20230096057A (en) | Defect Layering Detection Method and System Based on Light Field Camera and Detection Production Line | |
| CN114529500A (en) | Defect inspection method for display substrate | |
| JP2005345290A (en) | Streak-like flaw detecting method and streak-like flaw detector | |
| JP2012247743A (en) | Chart for checking resolution and method for checking resolution | |
| JP2009281759A (en) | Color filter defect inspection method, inspection apparatus, and color filter manufacturing method using it | |
| CN115222728A (en) | Screen detection method and device based on visual technology and computer equipment |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |