CN115803610A - 图像获取方法及装置、存储介质 - Google Patents

图像获取方法及装置、存储介质 Download PDF

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Publication number
CN115803610A
CN115803610A CN202180001255.8A CN202180001255A CN115803610A CN 115803610 A CN115803610 A CN 115803610A CN 202180001255 A CN202180001255 A CN 202180001255A CN 115803610 A CN115803610 A CN 115803610A
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CN
China
Prior art keywords
defect
defects
display panel
target
image
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Pending
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CN202180001255.8A
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English (en)
Inventor
张国林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BOE Technology Group Co Ltd
Chengdu BOE Optoelectronics Technology Co Ltd
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BOE Technology Group Co Ltd
Chengdu BOE Optoelectronics Technology Co Ltd
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Application filed by BOE Technology Group Co Ltd, Chengdu BOE Optoelectronics Technology Co Ltd filed Critical BOE Technology Group Co Ltd
Publication of CN115803610A publication Critical patent/CN115803610A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G06T7/73—Determining position or orientation of objects or cameras using feature-based methods

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Chemical & Material Sciences (AREA)
  • Quality & Reliability (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Nonlinear Science (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Abstract

一种图像获取方法及装置、存储介质。该方法包括：获取包含显示面板的第一图像；确定第一图像中的显示面板的多个缺陷的维修指示信息，维修指示信息用于反映对缺陷的维修需求的程度；基于多个缺陷的维修指示信息，在多个缺陷中筛选目标缺陷；对显示面板的目标缺陷进行拍摄，以得到包含目标缺陷的维修参考图像。无需获取显示面板全部缺陷的维修参考图像，保证AOI系统对显示面板的检测效率较高。并且，通过维修指示信息筛选出的目标缺陷需要被维修的概率较高，有效地提高了AOI系统获取维修参考图像的准确度，保证显示面板的良品率较高。

Description

PCT国内申请，说明书已公开。

Claims (15)

  1. PCT国内申请，权利要求书已公开。
CN202180001255.8A 2021-05-25 2021-05-25 图像获取方法及装置、存储介质 Pending CN115803610A (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/CN2021/095789 WO2022246643A1 (zh) 2021-05-25 2021-05-25 图像获取方法及装置、存储介质

Publications (1)

Publication Number Publication Date
CN115803610A true CN115803610A (zh) 2023-03-14

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN202180001255.8A Pending CN115803610A (zh) 2021-05-25 2021-05-25 图像获取方法及装置、存储介质

Country Status (3)

Country Link
US (1) US20240169511A1 (zh)
CN (1) CN115803610A (zh)
WO (1) WO2022246643A1 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
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CN117058090A (zh) * 2023-08-11 2023-11-14 曲靖阳光新能源股份有限公司 用于检测单晶硅片缺陷的方法和装置

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JPH09101236A (ja) * 1995-10-04 1997-04-15 Hitachi Ltd 表示欠陥検査装置および表示欠陥検査方法
WO2001022070A1 (en) * 1999-09-20 2001-03-29 Matsushita Electric Industrial Co., Ltd. Method and system of lcd inspection by pattern comparison
US8290239B2 (en) * 2005-10-21 2012-10-16 Orbotech Ltd. Automatic repair of electric circuits
JP2007192983A (ja) * 2006-01-18 2007-08-02 Micronics Japan Co Ltd 表示パネルの欠陥画素のアドレス特定方法、自動画質検査方法およびその装置
JP5217841B2 (ja) * 2008-09-25 2013-06-19 オムロン株式会社 画像処理装置および画像上の欠陥検出に係るパラメータの設定を支援する方法
JP4664417B2 (ja) * 2009-03-26 2011-04-06 シャープ株式会社 表示パネル点灯検査装置、及び表示パネル点灯検査方法。
CN102189331B (zh) * 2010-03-05 2015-09-30 奥林巴斯株式会社 缺陷修正装置以及缺陷跟踪方法
CN105259181A (zh) * 2015-10-26 2016-01-20 华为技术有限公司 显示屏的显示缺陷检测方法、装置及设备
CN107507571B (zh) * 2017-08-28 2019-09-27 哈尔滨工业大学深圳研究生院 一种对amoled进行外部光学补偿的方法及装置
CN108362712B (zh) * 2018-03-14 2022-09-30 京东方科技集团股份有限公司 一种基板母板及其检测方法
CN109001208A (zh) * 2018-05-28 2018-12-14 南京中电熊猫平板显示科技有限公司 一种显示面板的缺陷定位装置及缺陷定位方法
TWI689875B (zh) * 2018-06-29 2020-04-01 由田新技股份有限公司 利用深度學習系統的自動光學檢測分類設備及其訓練設備
CN108663835A (zh) * 2018-07-02 2018-10-16 江阴澄云机械有限公司 一种液晶设备检测方法
CN109118482B (zh) * 2018-08-07 2019-12-31 腾讯科技（深圳）有限公司 一种面板缺陷分析方法、装置及存储介质
KR102692769B1 (ko) * 2018-10-18 2024-08-08 삼성디스플레이 주식회사 표시 패널 검사 시스템, 표시 패널 검사 방법 및 이를 이용한 표시 패널.
TWI707137B (zh) * 2020-01-13 2020-10-11 憶象有限公司 智能產線監測系統及監測方法
CN111563889B (zh) * 2020-05-06 2023-06-27 深圳市斑马视觉科技有限公司 基于计算机视觉的液晶屏幕Mura缺陷检测方法
CN112184667A (zh) * 2020-09-28 2021-01-05 京东方科技集团股份有限公司 缺陷检测、修复方法、装置以及存储介质

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117058090A (zh) * 2023-08-11 2023-11-14 曲靖阳光新能源股份有限公司 用于检测单晶硅片缺陷的方法和装置

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US20240169511A1 (en) 2024-05-23

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