CN115792552A - Thyristor detection device and method - Google Patents
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Abstract
The application relates to a thyristor detection device and a thyristor detection method. The method comprises the following steps: the thyristor interface module is respectively connected with the signal generation module and the measurement module, and the processor is respectively connected with the signal generation module, the measurement module and the thyristor interface module; the thyristor interface module is respectively connected with two ends of the thyristors to be tested and is used for communicating the target thyristor to be tested with the signal generation module and the measurement module. The signal generation module is used for outputting a test signal to the target thyristor to be tested; the measuring module is used for measuring a feedback signal output by the target thyristor to be tested after receiving the test signal; the processor is used for determining the parameters of the target thyristor to be tested according to the feedback signal and controlling the thyristor interface module to switch the thyristor to be tested communicated with the signal generation module and the measurement module. The thyristor that the scheme of this application can convenient and fast switch awaits measuring improves the efficiency that the thyristor detected.
Description
Technical Field
The application relates to the technical field of direct current transmission, in particular to a thyristor detection device and a thyristor detection method.
Background
With the development of direct current transmission technology, the application of the converter valve is more and more extensive. The converter valve is a core device for voltage rectification and inversion, and the basic structure of the converter valve is the series connection of multi-stage thyristors. In order to ensure the stability and safety of the power transmission system, each thyristor needs to be detected.
In the conventional technology, testing instruments such as a universal meter and a capacitance bridge are adopted to measure the voltage value and the current value of two ends of each thyristor one by one, and then the thyristors are detected based on the measured voltage value and current value.
However, the detection efficiency of the conventional method is low due to the huge number of thyristors in the power transmission system.
Disclosure of Invention
In view of the above, it is necessary to provide a thyristor inspection apparatus and method capable of improving the inspection efficiency of the thyristor.
A thyristor detection apparatus comprising: the thyristor interface module is respectively connected with the signal generating module and the measuring module, and the processor is respectively connected with the signal generating module, the measuring module and the thyristor interface module; the thyristor interface module is respectively connected with two ends of a plurality of thyristors to be tested and is used for communicating a target thyristor to be tested with the signal generation module and the measurement module, wherein the target thyristor to be tested is at least one of the plurality of thyristors to be tested; the signal generation module is used for outputting a test signal to the target thyristor to be tested; the measuring module is used for measuring a feedback signal output by the target thyristor to be tested after receiving the test signal; the processor is used for controlling the signal generation module to output a test signal, determining the parameter of the target thyristor to be tested according to the feedback signal, and controlling the thyristor interface module to switch the thyristor to be tested communicated with the signal generation module and the measurement module.
In one embodiment, the signal generating module comprises: the direct current generation unit is connected with the target thyristor to be tested through the thyristor interface module and is used for outputting a direct current signal to the target thyristor to be tested; the measurement module includes: the first measurement unit is connected with the target thyristor to be measured through the thyristor interface module and is used for measuring a first current output by the target thyristor to be measured after receiving the direct-current signal and a first voltage at two ends of the target thyristor to be measured; the processor is connected with the first measuring unit and used for determining the voltage-sharing resistance of the target thyristor to be tested according to the first current and the first voltage.
In one embodiment, the signal generating module comprises: the alternating current generating unit is used for outputting an alternating current signal; the input end of the amplifying unit is connected with the alternating current generating unit, and the output end of the amplifying unit is connected with the target thyristor to be tested through the thyristor interface module and is used for amplifying the alternating current signal and outputting the amplified alternating current signal to the target thyristor to be tested; the measurement module includes: the second measurement unit is connected with the target thyristor to be tested through the thyristor interface module and is used for measuring a second current output by the target thyristor to be tested after receiving the alternating-current signal, a second voltage at two ends of the target thyristor to be tested and a power parameter of the target thyristor; the processor is connected with the second measuring unit and used for determining the damping resistance and the damping capacitance of the target thyristor to be tested according to the second current, the second voltage and the power parameter.
In one embodiment, the processor is configured to control the thyristor interface module to communicate the next target thyristor to be tested with the signal generation module and the measurement module after the feedback signal corresponding to the last target thyristor to be tested is obtained, until the feedback signal corresponding to each thyristor to be tested connected to the thyristor interface module is obtained.
In one embodiment, the processor is further configured to obtain a compensation value, and adjust a parameter of the target thyristor to be tested according to the compensation value.
In one embodiment, the processor is further configured to determine whether a parameter of the target thyristor to be tested is within a preset range, and if the parameter of the target thyristor to be tested is outside the preset range, send a prompt signal; the device further comprises: and the alarm module is connected with the processor and used for giving an alarm when receiving the prompt signal.
In one embodiment, the apparatus further comprises: and the touch screen is connected with the processor and used for displaying the parameters of the target thyristor to be tested and controlling the thyristor interface module and the signal generation module through the processor according to a user instruction.
A thyristor detection method is applied to the thyristor detection device, and the method comprises the following steps: outputting a test signal to a target thyristor to be tested; acquiring a feedback signal output by the target thyristor to be tested after receiving the test signal; determining parameters of the target thyristor to be tested according to the feedback signal output by the target thyristor to be tested; and taking at least one thyristor with undetermined parameters in the plurality of thyristors to be tested as the next target thyristor to be tested, and then returning to the step of outputting the test signal to the target thyristor to be tested until the parameters of each thyristor to be tested are determined.
In one embodiment, the outputting the test signal to the target thyristor under test includes: outputting a direct current signal to the target thyristor to be tested; the obtaining of the feedback signal output by the target thyristor to be tested after receiving the test signal includes: and acquiring a first current output by the target thyristor to be tested after receiving the direct-current signal and a first voltage at two ends of the target thyristor to be tested.
In one embodiment, the outputting the test signal to the target thyristor under test includes: outputting an alternating current signal to the target thyristor to be tested; the obtaining of the feedback signal output by the target thyristor to be tested after receiving the test signal includes: and acquiring a second current output by the target thyristor to be tested after receiving the alternating current signal, a second voltage at two ends of the target thyristor to be tested and power parameters of the target thyristor.
According to the thyristor detection device and the method, the thyristor interface module is arranged and is respectively connected with the two ends of the thyristors to be detected, so that the thyristors to be detected can be simultaneously accessed, at least one of the thyristors can be selected as a target thyristor to be detected to be communicated with the signal generation module and the measurement module for detection, the thyristors to be detected are accessed at one time, and the target thyristor to be detected is selected through the thyristor interface module, so that when the detected thyristor is switched, rewiring is not needed, only the thyristor is switched through the thyristor interface module, and the detection efficiency is improved. By arranging the signal generation module and the measurement module, a detection loop is formed by the signal generation module and the target thyristor to be tested, and a test signal can be sent to the target thyristor to be tested and a feedback signal sent by the target thyristor to be tested can be measured. Through setting up the treater, can control signal generation module output test signal and adjust the parameter of the test signal of signal generation module output etc, can also calculate the parameter of target thyristor that awaits measuring according to feedback signal, realized the detection to target thyristor that awaits measuring, and can also control the thyristor interface module and switch the thyristor that awaits measuring with signal generation module and measuring module intercommunication, realized the switching to the thyristor that awaits measuring, only need control thyristor interface module can realize the switching of thyristor, need not rewiring, it is more convenient and efficient. In conclusion, the thyristor to be detected can be conveniently and quickly switched by the scheme, and the efficiency of thyristor detection is improved.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments or the conventional technologies of the present application, the drawings used in the descriptions of the embodiments or the conventional technologies will be briefly introduced below, it is obvious that the drawings in the following descriptions are only some embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a schematic structural diagram of a thyristor detection device in one embodiment;
FIG. 2 is a schematic structural diagram of a thyristor detection device in another embodiment;
FIG. 3 is a schematic structural diagram of a thyristor detection device in yet another embodiment;
FIG. 4 is a schematic structural diagram of a thyristor detection device in yet another embodiment;
FIG. 5 is a schematic structural diagram of a thyristor detection device in yet another embodiment;
FIG. 6 is an equivalent circuit diagram of the thyristor detection device in one embodiment;
FIG. 7 is a schematic structural diagram of a thyristor detection device in yet another embodiment;
FIG. 8 is a flow diagram of a thyristor detection method in one embodiment;
FIG. 9 is a flow chart of a thyristor detection method in another embodiment;
FIG. 10 is a flow chart of a thyristor detection method in yet another embodiment;
fig. 11 is a flow chart of a thyristor detection method in yet another embodiment.
Description of the reference numerals: the device comprises a 10-thyristor interface module, a 20-to-be-tested thyristor, a 30-signal generation module, a 40-measurement module, a 50-processor, a 31-direct current generation unit, a 41-first measurement unit, a 32-alternating current generation unit, a 33-amplification unit, a 42-second measurement unit, a 60-alarm module and a 70-touch screen.
Detailed Description
To facilitate an understanding of the present application, the present application will now be described more fully with reference to the accompanying drawings. Embodiments of the present application are set forth in the accompanying drawings. This application may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein in the description of the present application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.
It will be understood that, as used herein, the terms "first," "second," and the like may be used herein to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish one element from another.
It will be understood that when an element is referred to as being "connected" to another element, it can be directly connected to the other element or be connected to the other element through intervening elements. Further, "connection" in the following embodiments is understood to mean "electrical connection", "communication connection", or the like, if there is a transfer of electrical signals or data between the connected objects.
As used herein, the singular forms "a", "an" and "the" may include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms "comprises/comprising," "includes" or "including," or "having," and the like, specify the presence of stated features, integers, steps, operations, components, parts, or combinations thereof, but do not preclude the presence or addition of one or more other features, integers, steps, operations, components, parts, or combinations thereof.
In one embodiment, as shown in fig. 1, there is provided a thyristor detection device comprising: the thyristor interface module 10 is respectively connected with the signal generating module 30 and the measuring module 40, and the processor 50 is respectively connected with the signal generating module 30, the measuring module 40 and the thyristor interface module 10. Wherein:
the thyristor interface module 10 is respectively connected to two ends of the plurality of thyristors to be tested 20, and is configured to communicate the target thyristor to be tested 20 with the signal generation module 30 and the measurement module 40, where the target thyristor to be tested 20 is at least one of the plurality of thyristors to be tested 20.
Illustratively, the thyristor interface module 10 may include a multi-way selection switch, and the on/off condition of the switch of each way can be adjusted under the control of the processor 50 to select at least one of the thyristors 20 under test as the target thyristor 20 to be connected to the signal generating module 30 and the measuring module 40.
Illustratively, the thyristor interface module 10 may include a plurality of detection clips, configured to clip two ends of the plurality of thyristors 20 to be tested, so as to connect the plurality of thyristors 20 to be tested, where the number of the detection clips is one more than the number of the plurality of thyristors 20 to be tested, so as to clip two ends of each thyristor 20 to be tested, and the size of the detection clips corresponds to the size of the thyristors, and a distance between two adjacent detection clips is equal to a distance between rear end surfaces of two adjacent thyristors connected in series, so that only one detection clip can be connected between two adjacent thyristors connected in series during wiring, thereby avoiding a wiring error.
The signal generating module 30 is configured to output a test signal to the target thyristor under test 20.
For example, the signal generating module 30 can send a test signal for testing the parameter to be tested of the target thyristor 20, where the test signal corresponds to the parameter to be tested of the target thyristor 20, for example, send a direct current signal to detect the voltage-sharing impedance of the target thyristor 20, or send an alternating current signal to detect the damping capacitance and the damping resistance of the target thyristor 20.
The measurement module 40 is configured to measure a feedback signal output by the target thyristor under test 20 after receiving the test signal.
For example, the measurement module 40 may include an ammeter, a voltmeter, a power meter, etc., and is capable of measuring the voltage, current, and power of the target thyristor under test 20 after receiving the test signal.
The processor 50 is configured to control the signal generation module 30 to output a test signal, determine a parameter of the target thyristor 20 to be tested according to the feedback signal, and control the thyristor interface module 10 to switch the thyristor 20 to be tested, which is communicated with the signal generation module 30 and the measurement module 40.
Specifically, the processor 50 is connected to the signal generating module 30, and can control whether the signal generating module 30 transmits the test signal, and can adjust parameters of the test signal transmitted by the signal generating module 30. The processor 50 can also calculate the parameters of the target thyristor 20 to be tested by substituting the feedback signal into a preset formula. The processor 50 can also control the thyristor interface module 10 to switch the thyristor 20 to be tested, which is communicated with the signal generation module 30 and the measurement module 40, so as to realize the switching of the target thyristor 20 to be tested.
In this embodiment, by setting the thyristor interface module 10 and connecting the thyristor interface module 10 to two ends of the thyristors 20 to be tested respectively, the thyristors 20 to be tested can be simultaneously accessed, and at least one of the thyristors can be selected as the target thyristor 20 to be tested to be communicated with the signal generating module 30 and the measuring module 40 for detection, so that the thyristors 20 to be tested are accessed at one time, and the target thyristor 20 to be tested is selected by the thyristor interface module 10, so that when the tested thyristor is switched, no rewiring is needed, only the thyristor interface module 10 needs to be switched, and the detection efficiency is improved. By arranging the signal generating module 30 and the measuring module 40, a detection loop is formed with the target thyristor to be tested 20, and the signal generating module and the measuring module can send a test signal to the target thyristor to be tested 20 and measure a feedback signal sent by the target thyristor to be tested 20. Through setting up treater 50, can control signal generation module 30 output test signal and adjust the parameter of the test signal of signal generation module 30 output etc, can also calculate the parameter of target thyristor 20 that awaits measuring according to feedback signal, realized the detection to target thyristor 20 that awaits measuring, and can also control thyristor interface module 10 and switch the thyristor 20 that awaits measuring that communicates with signal generation module 30 and measurement module 40, realized the switching to thyristor 20 that awaits measuring, only need control thyristor interface module 10 can realize the switching of thyristor, need not to rewire, it is more convenient and efficient. In conclusion, the thyristor to be tested can be switched conveniently and rapidly by the scheme, and the efficiency of thyristor detection is improved.
Illustratively, as shown in fig. 2, the thyristor interface module 10 may include a multiplexer switch, including a multiplexer relay switch. Each relay switch has a common terminal C, a normally open contact NO and a normally closed contact NC. When the thyristor corresponding to the relay switch KA1 is selected as the target thyristor 20 to be tested, the normally open contact NO of the relay switch KA1 is closed with the common end C, the normally closed NC contact is disconnected with the common end C, the normally open contacts NO of the relay switches KA2 to KA14 are disconnected with the common end C, the normally closed NC contact is closed with the common end C, and the thyristor corresponding to the electrical appliance switch KA1 is communicated with the signal generation module 30 and the measurement module 40 at the moment. When the thyristor corresponding to relay switch KA2 is selected as target thyristor 20 to be tested, normally open contact NO of relay switches KA1 and KA2 is closed with common terminal C, normally closed NC contact is disconnected with common terminal C, normally open contact NO of relay switches KA3 to KA14 is disconnected with common terminal C, normally closed NC contact is closed with common terminal C, the thyristor corresponding to relay switch KA2 is communicated with signal generation module 30 and measurement module 40 at the moment, so on, thyristor 20 to be tested communicated with signal generation module 30 and measurement module 40 can be selected by switching each relay switch.
In one embodiment, as shown in fig. 3, the signal generation module 30 includes: the direct current generating unit 31, the direct current generating unit 31 is connected to the target thyristor 20 to be tested through the thyristor interface module 10, and is configured to output a direct current signal to the target thyristor 20 to be tested.
The dc generating unit 31 is illustratively a dc power supply and is capable of outputting a dc signal.
The measurement module 40 includes: the first measuring unit 41 is connected to the target thyristor 20 to be measured through the thyristor interface module 10, and is configured to measure a first current output by the target thyristor 20 to be measured after receiving the dc signal and a first voltage across the target thyristor 20 to be measured.
Illustratively, the measurement module 40 includes an ammeter connected in series with the target thyristor under test 20 and a voltmeter connected in parallel with the target thyristor under test 20, and is capable of measuring the current output by the target thyristor under test 20 and the voltage across the target thyristor under test 20.
The processor 50 is connected to the first measurement unit 41, and is configured to determine the voltage-sharing resistance of the target thyristor 20 to be tested according to the first current and the first voltage.
Illustratively, the processor 50 calculates the voltage-sharing resistance of the target thyristor 20 to be tested according to ohm's law, that is, according to the first current and the first voltage.
In this embodiment, the voltage-sharing resistor of the target thyristor 20 to be tested can be obtained by applying a dc signal to the target thyristor 20 to be tested and measuring the current and voltage of the target thyristor 20 to be tested, thereby implementing the detection of the target thyristor 20 to be tested.
In one embodiment, as shown in fig. 4, the signal generation module 30 includes: an alternating current generating unit 32 and an amplifying unit 33. Wherein:
and an alternating current generating unit 32 for outputting an alternating current signal.
Illustratively, the ac generating unit 32 may be an ac power source capable of outputting a sine wave ac signal.
The input end of the amplifying unit 33 is connected with the alternating current generating unit 32, and the output end of the amplifying unit 33 is connected with the target thyristor to be tested 20 through the thyristor interface module 10, and is used for amplifying the alternating current signal and outputting the amplified alternating current signal to the target thyristor to be tested 20.
For example, the amplifying unit 33 may be a power amplifier, and may amplify the ac signal and output the amplified ac signal.
The measurement module 40 includes: a second measurement unit 42. The second measurement unit 42 is connected to the target thyristor 20 to be measured through the thyristor interface module 10, and is configured to measure a second current output by the target thyristor 20 to be measured after receiving the ac signal, a second voltage across the target thyristor 20 to be measured, and a power parameter of the target thyristor.
Illustratively, the measurement module 40 includes an ammeter connected in series with the target thyristor under test 20, a voltmeter connected in parallel with the target thyristor under test 20, and a power meter connected in series and parallel with the target thyristor under test 20, and is capable of measuring the current output by the target thyristor under test 20, the voltage across the target thyristor under test 20, the power and the power factor of the target thyristor under test 20.
The processor 50 is connected to the second measurement unit 42, and is configured to determine a damping resistance and a damping capacitance of the target thyristor 20 to be tested according to the second current, the second voltage, and the power parameter.
For example, the processor 50 may calculate the damping capacitance and the damping resistance of the target thyristor 20 to be tested according to the current output by the target thyristor 20 to be tested, the voltage across the target thyristor 20 to be tested, the power and the power factor of the target thyristor 20 to be tested.
The damping resistance of the target thyristor 20 to be tested is calculated by the following formula:
R 1 ＝λU 1 /I 1
wherein R is 1 Is the damping resistance of the target thyristor 20 to be tested, λ is the power factor, U, of the target thyristor 20 to be tested 1 The voltage across the target thyristor 20 to be tested, I 1 Is the current of the target thyristor 20 to be tested.
The damping capacitance of the target thyristor 20 to be tested is calculated by the following formula:
wherein, C 1 Damping capacitance of the target thyristor 20 to be tested, pi is a circumferential ratio, f is a frequency of the alternating signal, U 1 The voltage across the target thyristor 20 to be tested, I 1 Current, R, of the thyristor 20 to be tested 1 Is the damping resistance of the target thyristor 20 to be tested.
In this embodiment, the damping resistance and the damping capacitance of the target thyristor 20 to be tested can be obtained by applying an ac signal to the target thyristor 20 to be tested and measuring the current output by the target thyristor 20 to be tested, the voltage across the target thyristor 20 to be tested, and the power factor of the target thyristor 20 to be tested, thereby realizing the detection of the target thyristor 20 to be tested.
Illustratively, as shown in fig. 5, the direct current generation unit 31, the first measurement unit 41, the alternating current generation unit 32, the amplification unit 33, and the second measurement unit 42 may exist at the same time, but the direct current generation unit 31 and the alternating current generation unit 32 do not operate at the same time, but the direct current generation unit 31 and the alternating current generation unit 32 operate sequentially, and when the direct current generation unit 31 operates, the first measurement unit 41 collects a feedback signal, and when the alternating current generation unit 32 operates, the second measurement unit 42 collects a feedback signal.
Illustratively, fig. 6 shows an equivalent circuit diagram of the thyristor detection device. The measuring module 40 includes an ammeter A1, an ammeter A2, a power meter W, and a voltmeter V. The signal generating module 30 includes a DC power supply DC and an AC power supply AC, R2 represents a voltage-sharing resistor of the target thyristor 20 to be tested, R1 represents a damping resistor of the target thyristor 20 to be tested, and C1 represents a damping capacitor of the target thyristor 20 to be tested. When the relay switch KA is in contact with the contact 1, a direct current signal can be applied to the target thyristor to be tested 20, so that the voltage-sharing resistor R2 is determined through the readings of the ammeter A1 and the voltmeter V. When the relay switch KA is in contact with the contact 2, an alternating-current signal can be applied to the target thyristor to be tested 20, so that the damping resistor R1 and the damping capacitor C1 are determined through the readings of the ammeter A2, the power meter W and the voltmeter V.
In one embodiment, the processor 50 is configured to, after obtaining the feedback signal corresponding to the previous target thyristor 20 to be tested, control the thyristor interface module 10 to communicate the next target thyristor 20 to be tested with the signal generation module 30 and the measurement module 40 until obtaining the feedback signal corresponding to each thyristor 20 to be tested connected to the thyristor interface module 10.
In this embodiment, the processor 50 can obtain the feedback signal corresponding to the previous target thyristor 20 to be tested, that is, obtain the measurement parameter of the previous target thyristor 20 to be tested, and can detect the previous target thyristor 20 to be tested. Then, the thyristor interface module 10 is controlled to use at least one thyristor, which has not been measured yet, of the plurality of thyristors 20 to be measured as the next target thyristor 20 to be measured, so that the target thyristor 20 to be measured can be switched by controlling the thyristor interface module 10, and the detection of each thyristor 20 to be measured is realized.
In one embodiment, the processor 50 is further configured to obtain a compensation value, and adjust the parameter of the target thyristor 20 to be tested according to the compensation value.
Specifically, the thyristors in the power transmission system are removed from the power transmission system for detection, and the obtained detection result is the most accurate, but the thyristors are frequently removed for detection due to the fact that the number of the thyristors in the power transmission system is too large, so that the workload is huge, and the devices are easily damaged. Therefore, the detection method is not adopted, but the detection method can obtain an accurate detection result, so that one thyristor can be dismounted to measure the parameters of the thyristor, then the thyristor before being dismounted is measured by adopting the scheme of the application, the obtained measurement results are compared, and the difference value of the measurement results is used as a compensation value, so that when other thyristors are measured by adopting the scheme of the application in the subsequent process, the obtained results can be adjusted by adopting the compensation value.
In this embodiment, an error value measured by the scheme of the present application is obtained through a calibration operation in advance, so as to obtain a compensation value, and the compensation value is used to adjust the parameter of the target thyristor 20 to be tested obtained by the scheme of the present application, so as to improve the accuracy of the detection.
In one embodiment, the processor 50 is further configured to determine whether the parameter of the target thyristor 20 to be tested is within a preset range, and send a prompt signal if the parameter of the target thyristor 20 to be tested is outside the preset range.
Specifically, a preset range corresponding to each parameter of the thyristor 20 to be tested is preset in the processor 50, after the parameter of each thyristor 20 to be tested is determined, the processor 50 compares the parameter with the corresponding preset range, and if the parameter of the thyristor 20 to be tested is outside the preset range, a prompt signal is sent out to indicate that the thyristor is abnormal.
As shown in fig. 7, the thyristor detection apparatus further includes: an alarm module 60. The alarm module 60 is connected to the processor 50 for generating an alarm when the prompt signal is received.
Illustratively, the alarm module 60 may be an audible and visual alarm, including an indicator light and a horn.
In this embodiment, whether the thyristor 20 to be tested is abnormal is determined by the processor 50, and if the thyristor 20 to be tested is abnormal, the alarm module 60 is controlled to alarm to prompt a worker to process the thyristor. Therefore, the detection of the thyristor is realized.
In one embodiment, continuing to fig. 7, the thyristor detection apparatus further comprises: a touch screen 70. The touch screen 70 is connected to the processor 50, and is configured to display parameters of the target thyristor 20 to be tested, and control the thyristor interface module 10 and the signal generating module 30 through the processor 50 according to a user instruction.
Specifically, the touch screen 70 may display measurement data and parameters corresponding to each thyristor, and may also display an alarm signal. The user can also adjust the settings of the modules in the thyristor detection apparatus through the touch screen 70, and operate the thyristor interface module 10 to switch the target thyristor 20 to be tested, and the like.
In this embodiment, by setting the touch screen, a user can visually check parameters of each thyristor to be tested, and the user can output a user instruction to control each module in the thyristor detection device.
In one embodiment, as shown in fig. 8, there is provided a thyristor testing method applied to the thyristor testing apparatus, the method including:
step S800, outputting a test signal to the target thyristor to be tested.
The target thyristor to be tested is at least one of the thyristors to be tested.
Illustratively, a test signal for testing the parameter to be tested of the target thyristor to be tested is sent, and the test signal corresponds to the parameter to be tested of the target thyristor to be tested, for example, a direct current signal is sent to detect the voltage-sharing impedance of the target thyristor to be tested, or an alternating current signal is sent to detect the damping capacitance and the damping resistance of the target thyristor to be tested.
Step S810, obtaining a feedback signal output by the target thyristor to be tested after receiving the test signal.
Illustratively, the voltage, the current and the power of the target thyristor to be tested after receiving the test signal are measured.
And step S820, determining parameters of the target thyristor to be tested according to the feedback signal output by the target thyristor to be tested.
Specifically, the measured feedback signal is substituted into a preset formula to calculate the parameter of the target thyristor to be measured. For example, the parameters of the target thyristor under test may include voltage-sharing impedance, damping capacitance, damping resistance, and the like.
Step S830, determine whether the parameters of each thyristor to be tested have been determined. And if the parameters of each thyristor to be tested are determined, ending the test. If the parameters of each thyristor to be tested are not determined, step S840 is performed.
Specifically, whether the thyristors to be tested have been measured and the parameters thereof have been determined is judged, if the thyristors which have not been measured still exist in the plurality of thyristors to be tested, the execution is continued, and if all the thyristors to be tested have the parameters determined, the process is ended.
And step 840, taking at least one thyristor with undetermined parameters in the plurality of thyristors to be tested as the next target thyristor to be tested. After the step S840 is executed, the process returns to the step S800, and a test signal is output to the target thyristor to be tested.
Specifically, taking the thyristor which is not measured as the next target thyristor to be measured, and repeating the above steps to measure.
In this embodiment, the parameters of the target thyristor to be tested are calculated by outputting the test signal according to the feedback signal, so that the target thyristor to be tested is detected, and then whether all the thyristors to be tested have been detected is determined, and if not, the thyristors to be tested are switched until all the thyristors to be tested have been detected. Therefore, the thyristor to be detected can be conveniently and quickly switched by the scheme, and the efficiency of thyristor detection is improved.
In one embodiment, as shown in fig. 9, step S800 of outputting a test signal to a target thyristor under test includes:
and step S8001, outputting a direct current signal to the target thyristor to be tested.
Step S810, obtaining a feedback signal output by the target thyristor to be tested after receiving the test signal, including:
step S8101, a first current output by the target thyristor to be tested after receiving the direct current signal and first voltages at two ends of the target thyristor to be tested are obtained.
And step S820, determining parameters of the target thyristor to be tested according to the feedback signal output by the target thyristor to be tested. The method comprises the following steps:
and S8201, determining the voltage-sharing resistance of the target thyristor to be tested according to the first current and the first voltage.
The voltage-sharing resistance of the target thyristor to be tested is one of the parameters of the thyristor to be tested.
In this embodiment, the voltage-sharing resistor of the target thyristor to be tested can be obtained by applying a direct-current signal to the target thyristor to be tested and measuring the current and voltage of the target thyristor to be tested, thereby realizing the detection of the target thyristor to be tested.
In one embodiment, as shown in fig. 10, step S800 of outputting a test signal to a target thyristor under test includes:
and step S8002, outputting an alternating current signal to the target thyristor to be tested.
Step S810, obtaining a feedback signal output by the target thyristor to be tested after receiving the test signal, including:
and S8102, acquiring a second current output by the target thyristor to be tested after receiving the alternating current signal, a second voltage at two ends of the target thyristor to be tested and power parameters of the target thyristor.
And step S820, determining parameters of the target thyristor to be tested according to the feedback signal output by the target thyristor to be tested. The method comprises the following steps:
and S8202, determining a damping resistor and a damping capacitor of the target thyristor to be tested according to the second current, the second voltage at the two ends of the target thyristor to be tested and the power parameter of the target thyristor.
The damping resistance and the damping capacitance of the target thyristor to be tested are two of the parameters of the thyristor to be tested.
In this embodiment, the damping resistor and the damping capacitor of the target thyristor to be detected can be obtained by applying an alternating current signal to the target thyristor to be detected and measuring the current output by the target thyristor to be detected, the voltage at two ends of the target thyristor to be detected and the power factor of the target thyristor to be detected, thereby realizing the detection of the target thyristor to be detected.
For example, as shown in fig. 11, step S8001, step S8002, step S8101, step S8102, step S8201, and step S8202 may be performed in combination, and step S8001 and step S8101 may be performed first, and then step S8002 and step S8102 may be performed. Then, step S8201 and step S8202 are performed simultaneously.
In one embodiment, with continued reference to fig. 11, after step S8202, the thyristor detection method further includes: and step S850, adding corresponding compensation values to the voltage-sharing resistor, the damping resistor and the damping capacitor of the target thyristor to be tested respectively.
Specifically, the thyristors in the power transmission system are removed from the power transmission system for detection, and the obtained detection result is the most accurate, but the thyristors are frequently removed for detection due to the fact that the number of the thyristors in the power transmission system is too large, so that the workload is huge, and the devices are easily damaged. Therefore, the detection method is not adopted, but the detection method can obtain an accurate detection result, so that one thyristor can be dismounted to measure the parameters of the thyristor, then the thyristor before being dismounted is measured by adopting the scheme of the application, the obtained measurement results are compared, and the difference value of the measurement results is used as a compensation value, so that when other thyristors are measured by adopting the scheme of the application in the subsequent process, the obtained results can be adjusted by adopting the compensation value.
In this embodiment, an error value measured by the scheme of the present application is obtained through a calibration operation in advance, so as to obtain a compensation value, and the compensation value is used to adjust the parameter of the target thyristor to be tested obtained by the scheme of the present application, so that the accuracy of detection can be improved.
It should be understood that although the various steps in the flowcharts of fig. 8-11 are shown in order as indicated by the arrows, the steps are not necessarily performed in order as indicated by the arrows. The steps are not performed in the exact order shown and described, and may be performed in other orders, unless explicitly stated otherwise. Moreover, at least some of the steps in fig. 8-11 may include multiple steps or multiple stages, which are not necessarily performed at the same time, but may be performed at different times, which are not necessarily performed in sequence, but may be performed in turn or alternately with other steps or at least some of the other steps.
It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by hardware instructions of a computer program, which can be stored in a non-volatile computer-readable storage medium, and when executed, can include the processes of the embodiments of the methods described above. Any reference to memory, storage, database or other medium used in the embodiments provided herein can include at least one of non-volatile and volatile memory. Non-volatile Memory may include Read-Only Memory (ROM), magnetic tape, floppy disk, flash Memory, optical storage, or the like. Volatile Memory can include Random Access Memory (RAM) or external cache Memory. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM), among others.
In the description herein, references to the description of "some embodiments," "other embodiments," "desired embodiments," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, a schematic description of the above terminology may not necessarily refer to the same embodiment or example.
The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. A thyristor detection device, comprising: the thyristor interface module is respectively connected with the signal generation module and the measurement module, and the processor is respectively connected with the signal generation module, the measurement module and the thyristor interface module;
the thyristor interface module is respectively connected with two ends of a plurality of thyristors to be tested and is used for communicating a target thyristor to be tested with the signal generation module and the measurement module, wherein the target thyristor to be tested is at least one of the plurality of thyristors to be tested;
the signal generation module is used for outputting a test signal to the target thyristor to be tested;
the measuring module is used for measuring a feedback signal output by the target thyristor to be tested after receiving the test signal;
the processor is used for controlling the signal generation module to output a test signal, determining the parameter of the target thyristor to be tested according to the feedback signal, and controlling the thyristor interface module to switch the thyristor to be tested communicated with the signal generation module and the measurement module.
2. The apparatus of claim 1, wherein the signal generation module comprises: the direct current generation unit is connected with the target thyristor to be tested through the thyristor interface module and is used for outputting a direct current signal to the target thyristor to be tested;
the measurement module includes: the first measuring unit is connected with the target thyristor to be measured through the thyristor interface module and is used for measuring a first current output by the target thyristor to be measured after receiving the direct-current signal and a first voltage at two ends of the target thyristor to be measured;
the processor is connected with the first measuring unit and used for determining the voltage-sharing resistance of the target thyristor to be tested according to the first current and the first voltage.
3. The apparatus of claim 1, wherein the signal generation module comprises:
the alternating current generating unit is used for outputting an alternating current signal;
the input end of the amplifying unit is connected with the alternating current generating unit, and the output end of the amplifying unit is connected with the target thyristor to be tested through the thyristor interface module and is used for amplifying the alternating current signal and outputting the amplified alternating current signal to the target thyristor to be tested;
the measurement module includes: the second measurement unit is connected with the target thyristor to be tested through the thyristor interface module and is used for measuring a second current output by the target thyristor to be tested after receiving the alternating-current signal, a second voltage at two ends of the target thyristor to be tested and a power parameter of the target thyristor;
the processor is connected with the second measuring unit and used for determining the damping resistance and the damping capacitance of the target thyristor to be tested according to the second current, the second voltage and the power parameter.
4. The device according to claim 1, wherein the processor is configured to control the thyristor interface module to communicate a next target thyristor to be tested with the signal generation module and the measurement module after acquiring the feedback signal corresponding to the last target thyristor to be tested until acquiring the feedback signal corresponding to each thyristor to be tested connected to the thyristor interface module.
5. The apparatus of claim 1, wherein the processor is further configured to obtain a compensation value, and adjust a parameter of the target thyristor under test according to the compensation value.
6. The device of claim 1, wherein the processor is further configured to determine whether the parameter of the target thyristor to be tested is within a preset range, and if the parameter of the target thyristor to be tested is outside the preset range, send a prompt signal;
the device further comprises: and the alarm module is connected with the processor and used for giving an alarm when receiving the prompt signal.
7. The apparatus of claim 1, further comprising: and the touch screen is connected with the processor and used for displaying the parameters of the target thyristor to be tested and controlling the thyristor interface module and the signal generation module through the processor according to a user instruction.
8. A method for detecting a thyristor, the method being applied to the apparatus of any one of claims 1 to 7, the method comprising:
outputting a test signal to a target thyristor to be tested;
acquiring a feedback signal output by the target thyristor to be tested after receiving the test signal;
determining parameters of the target thyristor to be tested according to the feedback signal output by the target thyristor to be tested;
and taking at least one thyristor with undetermined parameters in the plurality of thyristors to be tested as the next target thyristor to be tested, and then returning to execute the step of outputting test signals to the target thyristor to be tested until the parameters of each thyristor to be tested are determined.
9. The method of claim 8, wherein outputting the test signal to the target thyristor under test comprises:
outputting a direct current signal to the target thyristor to be tested;
the obtaining of the feedback signal output by the target thyristor to be tested after receiving the test signal includes:
and acquiring a first current output by the target thyristor to be tested after receiving the direct current signal and a first voltage at two ends of the target thyristor to be tested.
10. The method of claim 8, wherein outputting the test signal to the target thyristor under test comprises:
outputting an alternating current signal to the target thyristor to be tested;
the obtaining of the feedback signal output by the target thyristor to be tested after receiving the test signal includes:
and acquiring a second current output by the target thyristor to be tested after receiving the alternating current signal, a second voltage at two ends of the target thyristor to be tested and power parameters of the target thyristor.
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