CN115792344A - Multi-path micro-current testing system and multi-path micro-current testing method - Google Patents

Multi-path micro-current testing system and multi-path micro-current testing method Download PDF

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Publication number
CN115792344A
CN115792344A CN202310070381.XA CN202310070381A CN115792344A CN 115792344 A CN115792344 A CN 115792344A CN 202310070381 A CN202310070381 A CN 202310070381A CN 115792344 A CN115792344 A CN 115792344A
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China
Prior art keywords
test
module
upper computer
micro
channel
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CN202310070381.XA
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Chinese (zh)
Inventor
陆去疾
孙伯乐
高志齐
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Changzhou Tonghui Electronics Co ltd
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Changzhou Tonghui Electronics Co ltd
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Priority to CN202310070381.XA priority Critical patent/CN115792344A/en
Publication of CN115792344A publication Critical patent/CN115792344A/en
Pending legal-status Critical Current

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Abstract

The invention relates to a multi-path micro-current testing system and a multi-path micro-current testing method for sensor testing. The invention combines the mode of computer upper computer software, single-circuit test module and communication control module to form a multi-circuit micro-current test system, compared with the original scheme of independent test of a plurality of micro-current testers, firstly, the system can simultaneously test dozens of tested pieces with the same model, thereby greatly shortening the test time; moreover, because the upper computer software is used for replacing instrument operation, the operation is more convenient, and because the test parameters are set at the same time, the test environment can be kept consistent; in addition, compared with a single tester, the single-path test module is lower in price, and only one operator needs to operate, so that the instrument cost and the labor cost are greatly reduced.

Description

Multi-path micro-current testing system and multi-path micro-current testing method
Technical Field
The invention relates to the technical field of sensor testing, in particular to a multi-path micro-current testing system and a multi-path micro-current testing method for sensor testing based on the multi-path micro-current testing system.
Background
In the existing sensors, different microcurrents are generated by products due to different concentrations of a special gas in the air. Therefore, in the finished product inspection process, the finished product needs to be placed in a closed space, special gas with specified concentration is added, micro-current generated by the current sensor is detected, and the current is used as a parameter index to sort the finished product into a good product and a defective product.
The original inspection process is to use a single-machine micro-current tester to independently inspect a single finished product, the time is long, the steps are complicated and repeated, if batch finished products are to be detected, a plurality of micro-current testers are needed, manual operation is carried out by a plurality of persons, and the cost is high.
Disclosure of Invention
The multi-path micro-current testing system and the multi-path micro-current testing method for the sensor testing can simultaneously test a plurality of finished products, meanwhile, the manual operation of an instrument is not needed, the upper computer software is operated on a computer to test easily, all testing results are displayed on the liquid crystal display clearly, the quality inspection efficiency is improved, and the labor cost is saved.
The invention uses the upper computer software to control a plurality of single-circuit (micro-current) test modules simultaneously, so the communication mode of the upper computer software and the single-circuit test modules becomes the key. When the number of the test modules is less than 5, the test modules can be directly connected with the computer by using the serial port, but when the number of the modules reaches dozens or hundreds, the computer cannot be provided with so many hardware ports, so that the communication control module is used for realizing the function of communicating the multi-channel test modules with the computer.
After the invention is used and the upper computer software is operated, the computer sends a setting or query instruction, the communication control module can simultaneously control a plurality of single-channel test modules, and after the test of each single-channel test module is finished, the communication control module uploads the test data to the upper computer software of the computer and displays the test result on the upper computer software completely.
The invention provides a multi-path micro-current testing system, which comprises computer upper computer software, a communication control module and a single-path testing module;
the computer upper computer software is used for sending a setting or query instruction;
the communication control modules are respectively connected with the computer upper computer software and the single-channel test module and used for controlling the single-channel test module and uploading test data to the computer upper computer software;
the single-circuit test module is provided with a plurality of groups, and each group of single-circuit test modules is connected with one communication control module and used for carrying out micro-current test on the tested piece.
The communication control module comprises a chip, a crystal oscillator connected with the chip, a plurality of sockets, a plurality of power input external capacitors, a plurality of power output external capacitors and a power input capacitor; the single-path test module is provided with an input end, a ground end, a protection end and an output end.
The invention also provides a multi-path micro-current testing method for testing the sensor, and the multi-path micro-current testing system comprises the following steps:
(1) Connecting each tested piece to the input end of the single-path test module;
(2) Setting test parameters on computer upper computer software;
(3) The communication control module transmits the parameters measured by the single-channel test module back to computer upper computer software, and the parameters are compared and analyzed to display the test result.
The invention has the beneficial effects that: the invention combines the computer, the upper computer software, the single-circuit testing module(s) and the communication control module(s) to form a multi-path micro-current testing system, and compared with the original scheme of independent testing of a plurality of micro-current testers, firstly, the system can simultaneously test dozens of tested pieces with the same model, thereby greatly shortening the testing time; moreover, because the upper computer software is used for replacing instrument operation, the operation is more convenient, and because the test parameters are set simultaneously, the test environment can be kept consistent; in addition, compared with a single tester, the single-path test module is lower in price, and only one operator needs to operate, so that the instrument and labor cost is greatly reduced.
Drawings
FIG. 1 is a system block diagram of a multi-channel microcurrent test system of the present invention;
FIG. 2 is a schematic circuit diagram of a communication control module according to the present invention;
FIG. 3 is a circuit schematic of the one-way test module of the present invention.
Detailed Description
The following detailed description of the preferred embodiments of the present invention, taken in conjunction with the accompanying drawings, will make the advantages and features of the present invention more comprehensible and clear for those skilled in the art, and thus define the scope of the present invention more clearly.
The multi-channel micro-current testing system shown in fig. 1 comprises computer upper computer software, communication control module(s) and single-channel testing module (multiple groups, multiple in each group).
Computer upper computer software: the computer is provided with upper computer software, the upper computer software can be provided with test parameters of the single-channel test module, the test process can be controlled, and the test result can be read back. When some parameters are set, such as test time, an instruction MEAS is sent: 1PLC, MEAS:10PLC and MEAS. Other parameters such as a grounding mode, a filtering mode and the like can be transmitted and realized by the upper computer software. After the test is finished, the single-path test module can return the test result to the upper computer by a scientific counting method, the MEAS: RESUIT 3.25e-9, namely, the test result is 3.25nA. The test procedure can be controlled and the test results read back.
The communication control module: the module comprises sockets JA100, JA101, JA102, JA103 and JA104, capacitors CA123, CA122, CA131, CA132, CA134, CA133, CA119, CA118, CA117, CA121, CA120 and CA116, a chip UA104, a crystal oscillator YA101 and a resistor RA 102. The module is used for upgrading four paths of serial port signals into one path of USB bus.
Specifically, as shown in fig. 2, the module may upgrade four serial signals to 1 USB bus. (this application uses the chip to upgrade USB of the same way for four ways serial ports, and eight serial ports upgrade USB model of the same way in addition for more demands use).
Sockets JA100, JA101, JA102, and JA103 are used to access the four-path serial signal to chip UA104, and socket JA104 is used to output a USB signal obtained by upgrading the four-path serial signal.
The capacitors CA131, CA117, CA118, CA119, CA122 and CA123 are external 0.1uF capacitors with 3.3V input power.
The capacitors CA132 and CA134 are output by the kernel power supply of 1.2V and are externally connected with 3.2uF capacitors.
The capacitor CA133 is an input terminal of the I/O port power supply and needs to be externally connected with a decoupling capacitor.
The peripheral circuits of the crystal oscillator YA101, the capacitors CA120 and CA121 need to be connected with a 30MHz crystal between an X1 pin and an XO pin, and the XI pin and the XO pin are connected with an oscillation capacitor of 20pF to the ground.
Resistor RA102 and capacitor CA116 provide a 12K Ω resistance to ground while shunting a 20pF capacitor.
Single-path test module: referring to fig. 3, the module Is a module with input and output, the input end has three signals of Is, G, com, which are the input end Is of the tested current, the earth end G, the protection end Com, and the user connects the tested piece to the input end of the single-channel test module as required. The output end is provided with two signals, namely Uart + and Uart-which are two read-write signal lines of the serial port and are used for outputting the test result of the single-channel test module to the outside.
During testing, after the system is successfully built and connected, a plurality of USB interfaces can be formed at a computer hardware port by a HUB, each USB can map 4 serial ports in upper computer software, and at the moment, the upper computer can map 4 serial ports which are the number of the USB;
then the input end of each single-channel test module is connected with a tested piece, the output end (two serial port wires Uart +, uart-) is connected with a communication control module, and the whole system is successfully built;
when the test device is used, 1 to n serial port numbers can be presented on the upper computer software, corresponding to each single-path test module, after the upper computer selects n single-path test modules, all the single-path test modules are simultaneously controlled, and if the test time is to be controlled, an instruction MEAS is sent: the 10PLC controls the testing speed of all the testing modules to be medium speed at the same time, and the testing conditions for testing each path of testing modules are the same; after a test is finished, each path of test module uploads the test result by a scientific and technical method, and the nth serial port of the upper computer receives an instruction MEAS: RESUIT 3.25e-9, namely the test result of the nth test module is 3.25nA, when the selected serial port receives the test data of the test module, the upper computer can display the multi-channel test result, and can also display the multi-channel test result in a curve graph or histogram mode according to the requirement;
at the moment, each single-path test module and the communication loop are equivalent to a single small system and are in a parallel state, so that no influence is caused; when a setting or query instruction is sent on the upper computer software, the control of one-path test and the control of multi-path test are basically the same.
After the application is used, one computer can be matched with upper computer software, multi-path micro-current testing is carried out simultaneously, and each single module is unrelated and does not interfere.
Compared with the traditional multi-instrument test, the test efficiency is improved, and the instrument and labor cost is reduced.
Finally, it should be noted that: although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art will understand that: any person skilled in the art can modify or easily conceive the technical solutions described in the foregoing embodiments or equivalent substitutes for some technical features within the technical scope of the present disclosure; such modifications, changes or substitutions do not depart from the spirit and scope of the embodiments of the present invention, and they should be construed as being included therein. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.

Claims (4)

1. A multichannel microcurrent test system is characterized in that: the device comprises computer upper computer software, a communication control module and a single-channel test module;
the computer upper computer software is used for sending a setting or query instruction;
the communication control modules are respectively connected with the computer upper computer software and the single-channel test module and used for controlling the single-channel test module and uploading test data to the computer upper computer software;
the single-circuit testing module is provided with a plurality of groups, each group of single-circuit testing modules is connected with one communication control module, and each single-circuit testing module is connected with one tested piece and used for carrying out micro-current testing on the tested piece.
2. The multi-channel microcurrent test system of claim 1, wherein: the communication control module comprises a chip, a crystal oscillator connected with the chip, a plurality of sockets, a plurality of power input external capacitors, a plurality of power output external capacitors and a power input capacitor.
3. The multi-channel microcurrent test system of claim 2, wherein: the single-path test module is provided with an input end, a ground end, a protection end and an output end.
4. A multi-channel micro-current testing method for sensor testing, using the multi-channel micro-current testing system according to any one of claims 1 to 3, comprising the steps of:
(1) Connecting each tested piece to the input end of the single-channel test module;
(2) Setting test parameters on computer upper computer software;
(3) And the communication control module transmits the parameters measured by the single-channel test module back to computer upper computer software, and the parameters are compared and analyzed to display a test result.
CN202310070381.XA 2023-02-07 2023-02-07 Multi-path micro-current testing system and multi-path micro-current testing method Pending CN115792344A (en)

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CN202310070381.XA CN115792344A (en) 2023-02-07 2023-02-07 Multi-path micro-current testing system and multi-path micro-current testing method

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CN202310070381.XA CN115792344A (en) 2023-02-07 2023-02-07 Multi-path micro-current testing system and multi-path micro-current testing method

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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102445485A (en) * 2011-09-26 2012-05-09 华瑞科学仪器(上海)有限公司 Detection method and equipment of gas sensor
CN106053551A (en) * 2016-07-31 2016-10-26 河北工业大学 Multi-channel multi-type sensor capability test system
CN209911327U (en) * 2019-03-31 2020-01-07 李辉 Gas sensor testing device
CN111896586A (en) * 2020-08-12 2020-11-06 湖州美奇医疗器械有限公司 Blood glucose monitoring sensor testing method and testing device
CN218180801U (en) * 2022-09-21 2022-12-30 山西腾星传感技术有限公司 Portable gas sensor tester

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102445485A (en) * 2011-09-26 2012-05-09 华瑞科学仪器(上海)有限公司 Detection method and equipment of gas sensor
CN106053551A (en) * 2016-07-31 2016-10-26 河北工业大学 Multi-channel multi-type sensor capability test system
CN209911327U (en) * 2019-03-31 2020-01-07 李辉 Gas sensor testing device
CN111896586A (en) * 2020-08-12 2020-11-06 湖州美奇医疗器械有限公司 Blood glucose monitoring sensor testing method and testing device
CN218180801U (en) * 2022-09-21 2022-12-30 山西腾星传感技术有限公司 Portable gas sensor tester

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
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董文庚等: ""化工安全工程"" *

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Application publication date: 20230314