CN115790868A - Double-color ultrashort pulse laser time delay measuring method and device - Google Patents
Double-color ultrashort pulse laser time delay measuring method and device Download PDFInfo
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- CN115790868A CN115790868A CN202211585616.0A CN202211585616A CN115790868A CN 115790868 A CN115790868 A CN 115790868A CN 202211585616 A CN202211585616 A CN 202211585616A CN 115790868 A CN115790868 A CN 115790868A
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Abstract
The invention provides a method and a device for measuring time delay of a bicolor ultrashort pulse laser, which are used for solving the technical problem that the measurement, calibration and locking of pulse time delay cannot be accurately realized because the zero time delay position between pulses cannot be obtained by the conventional method for measuring the time delay of the bicolor ultrashort pulse laser. The measuring method comprises the following steps: performing spectrum modulation on the first ultra-short pulse laser and the second ultra-short pulse laser which are incident in parallel; focusing and injecting the first ultra-short pulse laser and the second ultra-short pulse laser after spectral modulation to a nonlinear crystal, and generating a beam of measuring light through the nonlinear crystal; detecting the generated measuring light after the generated measuring light is collimated to obtain the intensity difference of envelopes at two sides of the measuring light spot and a curve graph of the intensity difference of the envelopes at two sides of the measuring light spot along with the change of time delay; and by detecting the intensity difference of the envelopes at two sides of the measuring light spot, the zero delay position and the relative delay information of the first ultrashort pulse laser and the second ultrashort pulse laser are obtained through inversion.
Description
Technical Field
The invention relates to an ultrashort pulse laser, in particular to a method and a device for measuring time delay of a bicolor ultrashort pulse laser.
Background
With the development of ultra-strong and ultra-fast laser technology, a plurality of beams of multi-color ultra-short pulse laser are used for coherently synthesizing the femtosecond pulse laser with the periodic magnitude, so that a brand new technical research means is provided for the subjects of high-field physics, chemistry, information science, biomedicine and the like. In laser coherent synthesis, how to perform delay measurement and calibration on multiple pulses with different spectral components is a very important and challenging research content.
For the time delay measurement of the two-color ultrashort pulse laser, a balanced optical cross correlation (BOC) method is generally used for measurement, and the scheme is well verified internationally. However, when performing coherent laser synthesis, it is necessary to simultaneously measure and lock the carrier-envelope phase (CEP) and the pulse delay of the two-color ultrashort pulse laser, the carrier-envelope phase is measured and locked by using a beat-to-2 f technique, and the pulse delay needs to measure and calibrate the zero-delay position first and then lock one of the delays. The delay measurement scheme is limited by the measurement principle, fixed delay difference exists between the to-be-measured double-color pulses, and zero delay positions between the pulses cannot be obtained, so that measurement, calibration and locking of pulse delay cannot be accurately realized.
Disclosure of Invention
The invention aims to solve the technical problem that the measurement, calibration and locking of pulse delay cannot be accurately realized due to the fact that the existing double-color ultrashort pulse laser delay measurement method cannot obtain a zero delay position between pulses, and provides a double-color ultrashort pulse laser delay measurement method and a device.
In order to achieve the purpose, the technical scheme of the invention is as follows:
a time delay measuring method of bicolor ultrashort pulse laser comprises a first ultrashort pulse laser and a second ultrashort pulse laser which are incident in parallel, and is characterized by comprising the following steps:
1, performing spectrum modulation on the first ultra-short pulse laser and the second ultra-short pulse laser;
focusing and injecting the first ultra-short pulse laser and the second ultra-short pulse laser after spectrum modulation to a nonlinear crystal, and generating a beam of measuring light through the nonlinear crystal;
detecting the generated measuring light after the generated measuring light is collimated to obtain the intensity difference of envelopes at two sides of a measuring light spot;
adjusting delay lines of the first ultrashort pulse laser and the second ultrashort pulse laser, collecting the intensity difference of envelopes at two sides of the detection light spot every 1fs, and obtaining a curve graph of the intensity difference of the envelopes at two sides of the measurement light spot along with the change of delay;
and 5, by detecting the intensity difference of the envelopes at the two sides of the light spot and combining the curve graph of the intensity difference of the envelopes at the two sides of the measuring light spot, which is obtained in the step 4, along with the time delay change, time delay information between the first ultra-short pulse laser and the second ultra-short pulse laser is obtained through inversion, wherein the time delay information comprises a zero time delay position and relative time delay information.
Further, in step 1, the first ultrashort pulse laser and the second ultrashort pulse laser are spectrally modulated by the same spectral modulation slice, so as to avoid introducing measurement errors.
Further, in step 2, the nonlinear crystal is a crystal having both second-order and third-order nonlinearities.
Further, in step 2, generating a beam of measuring light by the nonlinear crystal is specifically:
and adjusting the delay lines of the first ultrashort pulse laser and the second ultrashort pulse laser to enable the delay lines to generate a beam of combined frequency measuring light or a beam of difference frequency measuring light through the nonlinear crystal.
In order to realize the two-color ultrashort pulse laser time delay measuring method, the invention also provides a two-color ultrashort pulse laser time delay measuring device which is characterized by comprising a reflecting mirror, a spectrum adjusting sheet, a first focusing mirror, a nonlinear crystal, a second focusing mirror, a small-hole diaphragm and a detector which are sequentially arranged along the light paths of the first ultrashort pulse laser and the second ultrashort pulse laser which are incident in parallel;
the first ultra-short pulse laser and the second ultra-short pulse laser which are incident in parallel are reflected by a reflector and then are incident to a spectrum modulation sheet, the first ultra-short pulse laser and the second ultra-short pulse laser are incident to a first focusing mirror after being subjected to spectrum modulation and reflection by the spectrum modulation sheet, the first ultra-short pulse laser and the second ultra-short pulse laser are incident to a nonlinear crystal after being focused by the first focusing mirror, the first ultra-short pulse laser and the second ultra-short pulse laser transmit through the nonlinear crystal, and simultaneously a beam of measuring light is generated by the nonlinear crystal; the transmitted first ultrashort pulse laser, the second ultrashort pulse laser and the generated measuring light are incident to a second focusing mirror to be collimated; the collimated first ultrashort pulse laser and the second ultrashort pulse laser are blocked by the small aperture diaphragm, and the collimated measuring light is incident to the detector through the clear aperture of the small aperture diaphragm to be detected, so that the intensity difference of envelopes at two sides of the measuring light spot is obtained.
Further, the spectrum modulation sheet is a reflection type spectrum modulation sheet and is used for avoiding errors caused by the refractive index of the transmission type spectrum modulation sheet.
Further, the nonlinear crystal is located at the focal points of the first focusing mirror and the second focusing mirror and used for improving the measurement accuracy.
Further, the focal length of the first focusing mirror is 100mm;
the focal length of the second focusing lens is 100mm, and the second focusing lens is used for ensuring higher integration performance of the measuring device.
Further, the nonlinear crystal is a crystal having both second-order and third-order nonlinearities;
the thickness of the nonlinear crystal is below 50 μm.
Further, the nonlinear crystal is a barium metaborate crystal with the thickness of 20 μm.
Compared with the prior art, the invention has the beneficial effects that:
1. the invention provides a time delay measuring method of a bicolor ultrashort pulse laser, which focuses and emits a first ultrashort pulse laser and a second ultrashort pulse laser which are subjected to spectrum modulation to a nonlinear crystal to generate a beam of measuring light, detects the measuring light to obtain a curve graph of the variation of the intensity difference of envelopes at two sides of a measuring light spot along with time delay, and realizes the measurement and calibration of a zero time delay position and relative time delay information according to the intensity difference of the envelopes at two sides of the measuring light spot detected in real time, thereby improving the accuracy of the time delay information, laying a foundation for the locking of different time delay positions and making up the defects of the prior art.
2. The time delay measuring method of the bicolor ultrashort pulse laser, provided by the invention, has low operation difficulty and high practicability, and can be effectively applied to time delay measurement of the bicolor ultrashort pulse laser.
3. According to the double-color ultrashort pulse laser time delay measuring device, time delay measurement of double-color ultrashort pulse laser is achieved through the spectrum modulation sheet and the nonlinear crystal, the structure is simple, the integration performance is high, the zero time delay position of the double-color ultrashort pulse laser can be measured and calibrated, different time delay positions can be locked, and accurate time delay information can be obtained.
Drawings
FIG. 1 is a schematic structural diagram of a two-color ultrashort pulse laser delay measuring device according to the present invention;
fig. 2 is a comparison diagram before and after spectral modulation of a two-color ultrashort laser in an embodiment of the present invention, where (a) in fig. 2 is a comparison diagram before and after spectral modulation of a first ultrashort pulse laser having a center wavelength of 1300nm, and (b) in fig. 2 is a comparison diagram before and after spectral modulation of a second ultrashort pulse laser having a center wavelength of 2000nm, where dotted lines are both spectra before modulation, and solid lines are both spectra after modulation.
Fig. 3 is a composite frequency measurement light intensity distribution obtained by the detector when the delay of the first ultrashort pulse laser and the second ultrashort pulse laser is 0 in the embodiment of the present invention, where (a) in fig. 3 is a two-dimensional intensity distribution and (b) in fig. 3 is a one-dimensional intensity distribution;
fig. 4 is an intensity distribution diagram of the frequency-multiplexed measuring light with pulse delay of the first ultrashort pulse laser and the second ultrashort pulse laser in the embodiment of the present invention, where (a) in fig. 4 is a two-dimensional intensity distribution of the frequency-multiplexed measuring light with pulse delay of 5fs, (b) in fig. 4 is a two-dimensional intensity distribution of the frequency-multiplexed measuring light with pulse delay of 10fs, (c) in fig. 4 is a two-dimensional intensity distribution of the frequency-multiplexed measuring light with pulse delay of 15fs, and (d) in fig. 4 is a comparison diagram of one-dimensional intensity distributions of the frequency-multiplexed measuring light with pulse delay of 0, 5fs, 10fs, and 15fs, respectively;
FIG. 5 is a graph showing the variation of the envelope intensity difference between two sides of the measured light spot with time delay according to the embodiment of the present invention.
The specific reference numbers are as follows:
1-a first ultrashort pulse laser; 2-second ultrashort pulse laser, 3-reflector, 4-spectrum modulation sheet, 5-first focusing mirror, 6-nonlinear crystal, 7-second focusing mirror, 8-small aperture diaphragm and 9-detector.
Detailed Description
To further clarify the advantages and features of the present invention, a more particular description of the invention will be rendered by reference to specific embodiments thereof which are illustrated in the appended drawings.
A two-color ultrashort pulse laser time delay measuring method specifically comprises the following steps:
1, bicolor ultrashort pulse laser comprises a first ultrashort pulse laser 1 and a second ultrashort pulse laser 2 which are incident in parallel, and the first ultrashort pulse laser 1 and the second ultrashort pulse laser 2 are subjected to spectrum modulation at first; preferably, in order to reduce the introduction of measurement errors, when performing spectral modulation, the first ultrashort pulse laser 1 and the second ultrashort pulse laser 2 perform spectral modulation by using the same spectral modulation sheet, and the spectral modulation sheet employs a reflective spectral modulation sheet.
Focusing and injecting the first ultrashort pulse laser 1 and the second ultrashort pulse laser 2 after spectrum modulation to a nonlinear crystal 6, and generating a beam of frequency-combining measuring light or difference frequency measuring light through the nonlinear crystal 6; the nonlinear crystal 6 is a crystal having both second-order and third-order nonlinearities.
Detecting the generated measuring light after the generated measuring light is collimated to obtain the intensity difference of envelopes at two sides of a measuring light spot;
adjusting delay lines of the first ultrashort pulse laser 1 and the second ultrashort pulse laser 2, collecting the intensity difference of envelopes at two sides of the measuring light spot every 1fs, and obtaining a curve graph of the intensity difference of the envelopes at two sides of the measuring light spot along with the change of delay;
and 5, by detecting the intensity difference of the envelopes at the two sides of the measuring light spot and combining the curve graph of the intensity difference of the envelopes at the two sides of the measuring light spot, which is obtained in the step 4, along with the change of time delay, the zero time delay position and the relative time delay information between the first ultrashort pulse laser 1 and the second ultrashort pulse laser 2 are obtained through inversion.
Based on the two-color ultrashort pulse laser time delay measuring method, the invention also provides a two-color ultrashort pulse laser time delay measuring device for realizing the method, which comprises a reflecting mirror 3, a spectrum adjusting sheet 4, a first focusing mirror 5, a nonlinear crystal 6, a second focusing mirror 7, a small-hole diaphragm 8 and a detector 9 which are sequentially arranged along the light paths of a first ultrashort pulse laser 1 and a second ultrashort pulse laser 2 which are incident in parallel. In this embodiment, the center wavelength of the first ultrashort pulse laser 1 is 1300nm and the pulse width is 40fs, and the center wavelength of the second ultrashort pulse laser 2 is 2000nm and the pulse width is 40fs. In order to reduce the introduction of measurement errors, the spectrum modulation sheet 4 selects a reflective spectrum modulation sheet, and the spectrum modulation sheet 4 needs to be designed and adjusted for lasers of different spectral components. In this embodiment, the focal lengths of the first focusing lens 5 and the second focusing lens 7 are both 100mm, and the overall integration of the measuring apparatus can be improved on the premise of ensuring the focusing effect. The nonlinear crystal 6 is a crystal having both second-order and third-order nonlinearities, such as a single-crystal barium metaborate crystal or a single-crystal lithium triborate crystal; the thickness of the crystal is closely related to the measurement accuracy, and the measurement accuracy is higher as the thickness of the body is smaller within the allowable range of the production process, and the thickness of the nonlinear crystal 6 in the present invention is usually 50 μm or less. In this embodiment, the nonlinear crystal 6 is a barium metaborate crystal with a thickness of 20 μm, and the nonlinear crystal 6 is located at the focus of the first focusing mirror 5 and the second focusing mirror 7, so as to improve the measurement accuracy of the delay information.
As shown in fig. 1, a first ultrashort pulse laser 1 and a second ultrashort pulse laser 2 which are incident in parallel are incident on a measuring device, are reflected by a reflector 3 and then incident on a spectrum modulation sheet 4, are subjected to spectrum modulation by the spectrum modulation sheet 4 and then reflected and then incident on a first focusing mirror 5, are focused by the first focusing mirror 5 and then incident on a nonlinear crystal 6, and the first ultrashort pulse laser 1 and the second ultrashort pulse laser 2 transmit through the nonlinear crystal 6 and simultaneously generate a beam of measuring light through the nonlinear crystal 6; the transmitted first ultrashort pulse laser 1, the second ultrashort pulse laser 2 and the generated measuring light are incident to a second focusing mirror 7 for collimation; the aperture diaphragm 8 is arranged between the second focusing mirror 7 and the detector 9, the collimated first ultrashort pulse laser 1 and the collimated second ultrashort pulse laser 2 are blocked by the aperture diaphragm 8, and the collimated measuring light is incident to the detector 9 through the clear aperture of the aperture diaphragm 8 for detection.
According to the two-color ultrashort pulse laser time delay measuring device, the specific measuring experiment process is as follows:
a first ultrashort pulse laser 1 with the central wavelength of 1300nm and the pulse width of 40fs and a second ultrashort pulse laser 2 with the central wavelength of 2000nm and the pulse width of 40fs are parallelly incident to a spectrum modulation sheet 4; the reflective spectrum modulation sheet 4 simultaneously performs spectrum modulation on the first ultrashort pulse laser 1 and the second ultrashort pulse laser 2. The modulated two beams of parallel light are focused by a first focusing mirror 5 and enter a nonlinear crystal 6, and at the moment, delay lines of a first ultrashort pulse laser 1 and a second ultrashort pulse laser 2 outside the measuring device are adjusted, so that the nonlinear crystal 6 generates frequency combination measuring light; the first ultrashort pulse laser 1, the second ultrashort pulse laser 2 and the frequency combination measuring light are collimated by the second focusing mirror 7, then the collimated first ultrashort pulse laser 1 and the collimated second ultrashort pulse laser 2 are blocked by the small aperture diaphragm 8, and the collimated frequency combination measuring light is made to be incident to the detector 9 through the clear aperture of the small aperture diaphragm 8 for detection. By detecting the intensity difference of the envelopes at the two sides of the measuring light spot, the time delay information between the first ultrashort pulse laser 1 and the second ultrashort pulse laser 2 is obtained through inversion.
To further demonstrate the feasibility of the present invention, the following is illustrated by specific experimental measurements.
Fig. 2 is a comparison diagram before and after two-color ultrashort laser spectrum modulation, in which (a) in fig. 2 is a comparison diagram before and after spectrum modulation of a first ultrashort pulse laser 1 having a center wavelength of 1300nm, and (b) in fig. 2 is a comparison diagram before and after spectrum modulation of a second ultrashort pulse laser 2 having a center wavelength of 2000nm, where dotted lines are spectra before modulation, and solid lines are spectra after modulation. Fig. 3 is a graph showing the combined-frequency measured light intensity distribution obtained by the detector 9 when the pulse delay of the first ultrashort pulse laser 1 and the second ultrashort pulse laser 2 is 0, where (a) in fig. 3 is a two-dimensional intensity distribution and (b) in fig. 3 is a one-dimensional intensity distribution; as can be seen from fig. 3, there is a distinct modulation envelope on both sides of the composite frequency signal intensity, and the intensity of the envelopes on both sides is the same. Fig. 4 is a graph showing a comparison of the combined-frequency measured light intensity distributions obtained by the detector 9 when the first ultrashort pulse laser 1 and the second ultrashort pulse laser 2 have the pulse delay detector 9, where (a) in fig. 4 is the combined-frequency measured light two-dimensional intensity distribution obtained by the detector 9 when the pulse delay is 5fs, (b) in fig. 4 is the combined-frequency measured light two-dimensional intensity distribution obtained by the detector 9 when the pulse delay is 10fs, and (c) in fig. 4 is the combined-frequency measured light two-dimensional intensity distribution obtained by the detector 9 when the pulse delay is 15fs, and (d) in fig. 4 is the combined-frequency measured light one-dimensional intensity distribution obtained by the detector 9 when the pulse delays are 0, 5fs, 10fs, and 15fs, respectively. Fig. 5 is a graph of the envelope intensity difference between two sides of the measured light spot according to the embodiment as a function of time delay. According to the results obtained from fig. 3 and fig. 4, and by performing inversion with reference to fig. 5, the two-color ultrashort laser pulse delay information can be accurately obtained, including the measurement and calibration of the zero delay position and the locking of different delay positions, which proves the feasibility of the invention.
It should be noted that the above-mentioned embodiments are only intended to illustrate the technical solutions of the present invention, but not to limit the technical solutions, and those skilled in the art can make modifications to the specific technical solutions described in the above-mentioned embodiments, or make equivalent substitutions for some technical features, and these modifications or substitutions do not make the essence of the corresponding technical solutions depart from the scope of the technical solutions protected by the present invention.
Claims (10)
1. A time delay measuring method of bicolor ultrashort pulse laser comprises a first ultrashort pulse laser (1) and a second ultrashort pulse laser (2) which are incident in parallel, and is characterized by comprising the following steps:
1, performing spectrum modulation on a first ultrashort pulse laser (1) and a second ultrashort pulse laser (2);
focusing and irradiating the first ultrashort pulse laser (1) and the second ultrashort pulse laser (2) after spectrum modulation to a nonlinear crystal (6), and generating a beam of measuring light through the nonlinear crystal (6);
detecting the generated measuring light after the generated measuring light is collimated to obtain the intensity difference of envelopes at two sides of a measuring light spot;
adjusting delay lines of the first ultrashort pulse laser (1) and the second ultrashort pulse laser (2), collecting the intensity difference of envelopes at two sides of the detection light spot every 1fs, and obtaining a curve graph of the intensity difference of the envelopes at two sides of the measurement light spot along with the change of delay;
and 5, obtaining the zero delay position and the relative delay information of the first ultrashort pulse laser (1) and the second ultrashort pulse laser (2) through the real-time detected intensity difference of the envelopes at the two sides of the measuring light spot and combining the curve graph of the intensity difference of the envelopes at the two sides of the measuring light spot obtained in the step 4 along with the change of delay.
2. The method for measuring delay of bicolor ultrashort pulse laser according to claim 1, wherein:
in step 1, the first ultrashort pulse laser (1) and the second ultrashort pulse laser (2) are spectrally modulated by the same spectral modulation slice.
3. The method of claim 2, wherein the method comprises the following steps:
in the step 2, the nonlinear crystal (6) is a crystal having both second-order and third-order nonlinearities.
4. The method for measuring delay of bicolor ultrashort pulse laser according to any one of claims 1 to 3, characterized by comprising the following steps:
in the step 2, generating a beam of measuring light through the nonlinear crystal (6) specifically comprises the following steps:
and adjusting delay lines of the first ultrashort pulse laser (1) and the second ultrashort pulse laser (2) to enable the delay lines to generate a beam of combined frequency measuring light or a beam of difference frequency measuring light through the nonlinear crystal (6).
5. A two-color ultrashort pulse laser delay measuring device, which is used for realizing the two-color ultrashort pulse laser delay measuring method of any one of claims 1 to 4, and is characterized in that:
the device comprises a reflecting mirror (3), a spectrum modulation sheet (4), a first focusing mirror (5), a nonlinear crystal (6), a second focusing mirror (7), an aperture diaphragm (8) and a detector (9) which are sequentially arranged along the light paths of a first ultrashort pulse laser (1) and a second ultrashort pulse laser (2) which are incident in parallel;
the method comprises the following steps that a first ultrashort pulse laser (1) and a second ultrashort pulse laser (2) which are incident in parallel are reflected by a reflecting mirror (3) and then are incident to a spectrum modulation sheet (4), are subjected to spectrum modulation by the spectrum modulation sheet (4), are reflected and then are incident to a first focusing mirror (5), are focused by the first focusing mirror (5) and then are incident to a nonlinear crystal (6), and the first ultrashort pulse laser (1) and the second ultrashort pulse laser (2) transmit through the nonlinear crystal (6) and simultaneously generate a beam of measuring light through the nonlinear crystal (6); the transmitted first ultrashort pulse laser (1), the second ultrashort pulse laser (2) and the generated measuring light are incident to a second focusing mirror (7) to be collimated; the collimated first ultrashort pulse laser (1) and the collimated second ultrashort pulse laser (2) are separated and blocked through the small aperture diaphragm (8), and the collimated measuring light enters the detector (9) through the clear aperture of the small aperture diaphragm (8) to be detected, so that the intensity difference of envelopes at two sides of the measuring light spot is obtained.
6. The bicolor ultrashort pulse laser delay measuring device of claim 5, wherein:
the spectrum modulation sheet (4) is a reflection-type spectrum modulation sheet.
7. The bicolor ultrashort pulse laser delay measuring device of claim 6, wherein:
the nonlinear crystal (6) is positioned at the focus of the first focusing mirror (5) and the second focusing mirror (7).
8. The bicolor ultrashort pulse laser delay measuring device of any one of claims 5 to 7, wherein:
the focal length of the first focusing mirror (5) is 100mm;
the focal length of the second focusing mirror (7) is 100mm.
9. The bicolor ultrashort pulse laser delay measuring device of claim 8, wherein:
the nonlinear crystal (6) is a crystal with second-order and third-order nonlinearity simultaneously;
the thickness of the nonlinear crystal (6) is less than 50 μm.
10. The two-color ultrashort pulse laser delay measuring device of claim 9, wherein:
the nonlinear crystal (6) is a barium metaborate crystal with the thickness of 20 mu m.
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