CN115763215A - Thermal surface ionization mass spectrum structure - Google Patents
Thermal surface ionization mass spectrum structure Download PDFInfo
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- CN115763215A CN115763215A CN202211183248.7A CN202211183248A CN115763215A CN 115763215 A CN115763215 A CN 115763215A CN 202211183248 A CN202211183248 A CN 202211183248A CN 115763215 A CN115763215 A CN 115763215A
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Abstract
The invention discloses a thermal surface ionization mass spectrum structure. The structure comprises a thermal surface ionization ion source, an ion transmission lens, an electrostatic analyzer, a deflection magnet, a multipole lens, a detection system and the like. Generating thermions by a thermal surface ionization ion source; the acceleration, the focusing and the transmission of the ion beam are realized through the ion transmission lens; the imaging quality of the ion beam is improved through the multipole lens, and the resolution of the instrument is improved; the influence of accelerated high-voltage noise and drift is overcome through matching of the electrostatic analyzer and the deflection magnet, and the excellent peak form coefficient and the long-term stability of the peak center are achieved.
Description
Technical Field
The invention belongs to the technical field of mass spectrometry instruments, and particularly relates to a thermal surface ionization mass spectrometry structure.
Background
Mass spectrometers have been an important tool in the research of challenging scientific problems in the fields of nuclear science, geology, and the like since the advent. Through the development of the last century, the application field of mass spectrometers has been further expanded to various fields such as inorganic chemistry, material science, environmental science and life science. Mass spectrometers have now developed into an affordable, routine analytical tool for many laboratories. The thermal surface ionization mass spectrum is internationally recognized as the 'gold standard' for isotope ratio measurement due to the advantages of less background interference, lower mass fractionation effect, higher measurement precision and accuracy and the like.
Conventional thermal surface ionization mass spectrometers all use a single magnet structure as the mass analyzer. Due to the fact that noise and drift exist in high voltage of a high-voltage power supply and the focusing capacity of a single magnet is limited, the conditions of poor peak shape coefficient and peak center drift generally exist in a single-magnet thermal surface ionization mass spectrometer, and the isotope ratio testing precision is influenced. To overcome this problem, conventional thermal surface ionization mass spectrometers usually require multiple peak center calibrations during the measurement process, thereby increasing sample consumption and reducing instrument analysis efficiency.
Disclosure of Invention
The invention aims to provide a thermal surface ionization mass spectrum structure, which improves the imaging quality of an ion beam through a multipole lens and improves the resolution of an instrument; the influence of accelerated high-voltage noise and drift is overcome by matching the electrostatic analyzer with the deflection magnet, and the excellent peak shape coefficient and long-term stability of the peak center are realized, so that the peak center calibration times in the test process are reduced, the sample consumption is reduced, and the analysis efficiency of an instrument is improved.
The technical scheme of the invention is as follows:
a thermal surface ionization mass spectrum structure comprises a thermal surface ionization ion source, an ion transmission lens, an electrostatic analyzer, a deflection magnet, a detection system and the like.
In the thermal surface ionization mass spectrometry structure, the electrostatic analyzer can be arranged in front of the deflection magnet or behind the deflection magnet. When the electrostatic analyzer is placed in front of the deflection magnet, the detection system adopts a multi-receiving detection system; when the electrostatic analyzer is placed behind the deflection magnet, the detection system employs a receive-only detection system. The multi-receive detection system consists of a multi-channel faraday cup and an electron multiplier, and can simultaneously measure multiple beams of ions of different mass numbers. The single-receiving detection system only receives a single ion beam and consists of a single Faraday cup and a single electron multiplier, and the single Faraday cup and the single electron multiplier can be freely switched.
In order to further improve the imaging quality of the ion beam and improve the resolution of the instrument, multipole lenses are arranged in front of and behind the electrostatic analyzer, and can be hexapole lenses or octopole lenses, depending on the final structural parameters of the instrument.
The multi-receiving detection system consists of a multi-channel Faraday cup and an electron multiplier, wherein the Faraday cups are sequentially arranged on a detection plane, and the electron multiplier is positioned at the rear end of the Faraday cup.
The Faraday cup consists of a single Faraday cup and a single electron multiplier, and the Faraday cup and the single electron multiplier can be freely switched.
The first multipole lens is arranged in front of the electrostatic analyzer, and the second multipole lens is arranged behind the electrostatic analyzer.
The first multipole lens is provided with a deflection lens and an ion beam front detection slit in front.
An ion beam rear detection slit is arranged behind the second multi-polar lens.
The upper pole shoe and the lower pole shoe of the deflection magnet are respectively arranged on the upper side and the lower side of the yoke iron, the upper excitation coil and the lower excitation coil respectively surround the upper pole shoe and the lower pole shoe and are arranged on the yoke iron, and the front magnetic shielding body and the rear magnetic shielding body are respectively arranged in front of and behind the pole shoes.
The invention has the advantages that the influence of accelerated high-voltage noise and drift can be overcome and the stability of the peak center is improved by matching the electrostatic analyzer with the magnet. The peak center calibration times can be reduced in the analysis and test process, so that the sample utilization rate is improved, and the analysis efficiency of an instrument is improved.
Drawings
FIG. 1 is a schematic diagram of a thermal surface ionization mass spectrometer with an electrostatic analyzer in front and a deflecting magnet in back according to an embodiment of the present invention;
FIG. 2 is a block diagram of a thermal surface ionization mass spectrometer with an electrostatic analyzer at the back and a deflecting magnet at the front in accordance with an embodiment of the present invention;
FIG. 3 is a structural view of an electrostatic analyzer equipped with an octupole bar, a deflection lens, an ion detecting slit;
FIG. 4 is a view of a deflection magnet in an embodiment;
FIG. 5 is a graph of the peak profile of the mass spectrum generated by the example;
FIG. 6 is a graph of simultaneous peak nesting for multiple mass numbers achieved by the example;
Detailed Description
The invention is further illustrated by the accompanying drawings and the detailed description. It should be noted that the embodiments described herein are intended to assist the reader in understanding the principles of the invention, and it is to be understood that the scope of the invention is not limited to such specific statements and embodiments.
As shown in fig. 1, a thermal surface ionization mass spectrometry configuration is shown with an electrostatic analyzer 3 in front and a deflecting magnet 4 in back. In addition to the mass analyser, the mass spectrometry configuration comprises a thermal surface ionization ion source 1, an ion transport lens 2, a multiple reception detection system 5, etc.
The structure has the greatest characteristics that the influence of accelerated high-voltage noise and drift is overcome by matching the electrostatic analyzer 3 with the deflection magnet 4, the excellent peak shape coefficient and the long-term stability of the peak center are realized, and the frequent calibration of the peak center in the measuring process of the instrument is avoided, so that the analysis efficiency of the instrument is improved.
As shown in fig. 2, a thermal surface ionization mass spectrometry configuration is shown with the electrostatic analyzer 3 at the back and the deflecting magnet 4 at the front. In addition to the mass analyser, the mass spectrometry configuration comprises a thermal surface ionization ion source 1, an ion transport lens 2, and a single-receiver detection system 5, among others.
The structure is characterized in that signals of ions with different mass quantities are measured at different time periods through magnetic field scanning, so that the analysis of sample components is realized.
As shown in fig. 3, the electrostatic analyzer 3 is composed of an inner electrode 9 and an outer electrode 10, both of which are columnar electrodes. The first multipole lens 6 and the second multipole lens 7 installed in front of and behind the electrostatic analyzer 3 are octopole lenses, the deflection lens 10 and the ion beam front detection slit 11 are installed in front of the first multipole lens 6, and the ion beam rear detection slit 12 is installed in rear of the second multipole lens 7.
The octupole lens is used to improve the imaging quality of the ion beam, the deflection lens 10 is used to correct the direction of the ion beam incident on the electrostatic analyzer 3, and the front detection slit 11 and the rear detection slit 12 of the ion beam are provided for the purpose of detecting and diagnosing the intermediate state of the ion beam.
As shown in fig. 4, the deflection magnet 4 is composed of an upper excitation coil 13, a lower excitation coil 14, a yoke 15, an upper pole piece 16, a lower pole piece 17, a front magnetic shield 18, a rear magnetic shield 19, and the like.
The deflection and separation of ion beams of different mass amounts are realized by applying a stable excitation current to the upper excitation coil 13 and the lower excitation coil 14, thereby generating a stable magnetic field between the pole gaps of the upper pole piece 16 and the lower pole piece 17. The front magnetic shield 18 and the rear magnetic shield 19 function to weaken the fringe field distribution of the magnets, thereby improving the ion beam imaging quality.
As shown in FIG. 5, the peak profile of the mass spectrum generated for this example is relatively broad with a broad flat top and excellent peak profile factor. The steep rising edge and the wide flat top of the trapezoidal peak reflect the excellent ion beam imaging quality of the ion beam realized by the embodiment.
As shown in fig. 6, the multiple mass number simultaneous peak case achieved for this embodiment. The figure reflects that different detection channels detect two different mass numbers of the ion beam simultaneously.
The thermal surface ionization ion source generates ions, the ions are accelerated and focused through the ion transmission lens, the ions are focused and imaged on a detection plane sequentially through the electrostatic analyzer and the magnet or sequentially through the magnet and the electrostatic analyzer, and finally the ions are received by the Faraday cup or the electron multiplier to realize signal output. According to the intensity of the collected signals, the composition and the content of the components of the sample can be analyzed.
To further evaluate the peak center stability achieved by the examples, the index was tested as shown in table 1. The peak center stability of this example, is less than 10ppm.
TABLE 1 example Peak center stability
Claims (10)
1. The utility model provides a hot surface ionization mass spectrum structure, characterized in that, including hot surface ionization ion source (1), ion transmission lens (2), electrostatic analyzer (3), deflection magnet (4), detecting system (5), the ion that hot surface ionization ion source (1) produced realizes accelerating and focusing through ion transmission lens (2), later pass through electrostatic analyzer (3) earlier, later pass through deflection magnet (4), or pass through deflection magnet (4) earlier, later pass through electrostatic analyzer (3), realize different mass number ion separation and formation of image, finally received by detecting system (5) and realize signal output.
2. A thermal surface ionization mass spectrometry structure according to claim 1, characterized in that the detection system (5) is a multiple-receiver detection system when the electrostatic analyzer (3) is placed in front of the deflection magnet (4).
3. A thermal surface ionization mass spectrometry structure according to claim 1, characterized in that the detection system (5) is a single-receiving detection system when the electrostatic analyzer (3) is placed after the deflection magnet (4).
4. The structure according to claim 1, characterized in that the multiple reception detection system consists of a multi-channel faraday cup (5.1) arranged in sequence in the detection plane and an electron multiplier (5.2) located at the rear end of the faraday cup.
5. A thermal surface ionization mass spectrometry structure according to claim 3, characterized by a single reception detection system consisting of a single faraday cup (5.3) and a single electron multiplier (5.4), both of which can be freely switched.
6. A thermal surface ionization mass spectrometry structure according to claim 1, characterized in that a first multipole lens (6) is mounted in front of the electrostatic analyser (3) and a second multipole lens (7) is mounted behind the electrostatic analyser (3).
7. The thermal surface ionization mass spectrometry structure of claim 6, wherein the first multipole lens (7) and the second multipole lens (6) are hexapole lenses or octopole lenses.
8. The structure according to claim 6 or 7, characterized in that the first multipole lens is preceded by a deflection lens (10) and a pre-ion beam detection slit (11).
9. The thermal surface ionization mass spectrometry structure of claim 8, wherein the second multipole lens is followed by an ion beam rear detection slit (12).
10. The structure of the thermal surface ionization mass spectrometry according to claim 1, wherein the deflection magnet (4) comprises an excitation upper coil (13), an excitation lower coil (14), a yoke (15), an upper pole shoe (16), a lower pole shoe (17), a front magnetic shielding body (18) and a rear magnetic shielding body (19), the upper pole shoe (16) and the lower pole shoe (17) are respectively installed on the upper side and the lower side of the yoke (15), the excitation upper coil (13) and the excitation lower coil (14) respectively surround the upper pole shoe (16) and the lower pole shoe (17) and are installed on the yoke (15), and the front magnetic shielding body (18) and the rear magnetic shielding body (19) are respectively installed on the front side and the rear side of the pole shoes.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202211183248.7A CN115763215A (en) | 2022-09-27 | 2022-09-27 | Thermal surface ionization mass spectrum structure |
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| CN202211183248.7A CN115763215A (en) | 2022-09-27 | 2022-09-27 | Thermal surface ionization mass spectrum structure |
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