CN115754366A - Through type binding post test element and through type binding post quick testing arrangement - Google Patents
Through type binding post test element and through type binding post quick testing arrangement Download PDFInfo
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- CN115754366A CN115754366A CN202211366687.1A CN202211366687A CN115754366A CN 115754366 A CN115754366 A CN 115754366A CN 202211366687 A CN202211366687 A CN 202211366687A CN 115754366 A CN115754366 A CN 115754366A
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- type wiring
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- wiring terminal
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Abstract
The invention discloses a through type wiring terminal testing unit and a through type wiring terminal rapid testing device, and belongs to the technical field of testing devices. The main body of the through type wiring terminal testing unit is an adjusting lamination, a pair of insulating sleeves is embedded and connected in the adjusting lamination, a banana female head is connected in the insulating sleeves, and a conductive probe is connected in the banana female head; the front part and the rear part of the adjusting lamination are provided with through wire through holes, and the banana female head is connected with a test cable at the rear part of the adjusting lamination through the wire through holes; and the left side and the right side of the adjusting lamination are respectively provided with a clamp mounting part for mounting an external clamp, and the clamp fixes the through type wiring terminal testing unit on the through type wiring terminal to be tested. The invention can quickly and conveniently realize the mounting and dismounting between the testing device and the straight-through type wiring terminal to be tested according to the type and the number of the wiring terminals to be tested, quickly derive all terminal signals and improve the testing efficiency and the testing quality.
Description
Technical Field
The invention belongs to the technical field of testing devices, and particularly relates to a through type wiring terminal testing unit and a through type wiring terminal rapid testing device.
Background
A large number of through type wiring terminals are used as external wiring ports in the industries of electronic equipment such as cabinets, distribution boxes and the like, at present, the on-off test of the through type wiring terminals does not have a matched test tool, when the function is checked, the on-off test between the through type wiring terminals can only be manually carried out one by using a universal meter, the universal meter pen cannot be firmly matched with the through type wiring terminals to be tested, the contact failure rate is high, if all signals of the through type wiring terminals to be tested are led out, the on-off traversal between the through type wiring terminals to be tested is realized, a large amount of test time needs to be consumed, and the test efficiency and the test quality of the test method are low.
Based on the above discussion, it is desirable to provide a fast testing apparatus for a through type connection terminal, which can solve the above problems.
Disclosure of Invention
The invention aims to provide a through type wiring terminal rapid testing device which can rapidly and conveniently realize the mounting and dismounting between the testing device and a through type wiring terminal to be tested according to the model and the number of the wiring terminals to be tested, rapidly derive all terminal signals and improve the testing efficiency and the testing quality.
Specifically, on one hand, the invention provides a through type wiring terminal testing unit which is used for performing on-off detection when the through type wiring terminal is in contact with a to-be-tested through type wiring terminal, wherein a main body is an adjusting lamination, a pair of insulating sleeves are embedded and connected in the adjusting lamination, a banana female head is connected in the insulating sleeves, and a conductive probe is connected in the banana female head;
the front part and the rear part of the adjusting lamination are provided with through wire through holes, and the banana female head is connected with a test cable at the rear part of the adjusting lamination through the wire through holes;
and the left side and the right side of the adjusting lamination are respectively provided with a clamp mounting part for mounting an external clamp, and the clamp fixes the through type wiring terminal testing unit on the through type wiring terminal to be tested.
Further, the conductive probe is a spring probe.
Furthermore, the plurality of adjusting laminations are connected together through a connecting piece after being stacked.
Furthermore, the top and the bottom of the adjusting lamination are respectively provided with a convex particle and a groove which are in interference fit, so that the adjusting laminations are pressed together.
Furthermore, the outer side of the insulating sleeve is provided with an insulating sleeve limiting part, so that the conductive probe is guaranteed to be fully constrained relative to the adjusting lamination.
Furthermore, the insulation sleeve limiting part is a limiting convex strip arranged along the axial direction of the insulation sleeve.
Furthermore, a wire hole limiting part matched with the insulating sleeve limiting part is arranged on the inner side of the wire hole.
Furthermore, the wire through hole limiting part is a limiting blind hole groove arranged on the upper side and/or the lower side of the wire through hole, and the distance between the conductive probes is adjusted by matching the insulating sleeve limiting part with the limiting blind hole groove at different positions.
On the other hand, the invention also provides a through type wiring terminal rapid testing device, which comprises the through type wiring terminal testing unit, a clamp and a testing cable;
the clamp is a single-claw clamp and comprises a clamp body, a fixing plate, a fixing pin, a torsion spring and an anti-skidding cushion pad; the middle part of the clamp body is connected with a fixing plate through a fixing pin, and the fixing plate is connected with clamp mounting parts on the left side and the right side of the adjusting lamination; the torsional spring is installed to the fixed pin outside, makes the double-layered body twist reverse and have the elasticity reset function along the fixed pin, and the double-layered body head passes through the fixed pin to be connected with anti-skidding blotter.
Furthermore, the main body of the test cable is a multi-core cable, the head of each wire of the multi-core cable is connected with a banana male head, and the banana male head is connected with or detached from a banana female head in the through type wiring terminal test unit.
The through type wiring terminal test unit and the through type wiring terminal rapid test device have the following beneficial effects:
according to the through type wiring terminal test unit and the through type wiring terminal rapid test device, the adjustment lamination is adopted, all terminal signals can be rapidly led out according to the type and the number of the through type wiring terminals to be tested, and the test efficiency and the test quality are improved; by adopting the spring probe, the through-type wiring terminal testing unit and the through-type wiring terminal rapid testing device can be reliably contacted with the through-type wiring terminal to be tested for on-off detection. The through type wiring terminal rapid testing device provided by the invention adopts the clamp, and the rapid and convenient mounting and dismounting between the testing device and the through type wiring terminal to be tested can be realized.
Drawings
Fig. 1 is a schematic diagram of a through type connection terminal to be tested and a rapid testing apparatus for the through type connection terminal according to an embodiment of the present invention.
Fig. 2 is a cross-sectional view of a through type connection terminal to be tested according to an embodiment of the invention.
Fig. 3 is an isometric view of a pass-through terminal testing unit in accordance with an embodiment of the invention.
Fig. 4 is a partial cross-sectional view of a pass-through terminal testing unit in accordance with an embodiment of the invention.
Fig. 5 is an exploded view of a through terminal testing unit according to an embodiment of the present invention.
Fig. 6 is a schematic view of the alignment laminations and insulating sleeve in accordance with an embodiment of the present invention.
FIG. 7 is a cross-sectional view of a spring probe according to an embodiment of the present invention.
FIG. 8 is an isometric view of a single jaw clamp of an embodiment of the invention.
Fig. 9 is an isometric view of a test cable according to an embodiment of the present invention.
The labels in the figure are: 1-through type wiring terminal, 11-testing screw, 12-testing hole, 2-fixed guide rail, 3-through type wiring terminal rapid testing device, 31-through type wiring terminal testing unit, 311-conductive probe, 3111-probe body, 3112-spring, 3113-sleeve tube, 312-banana female head, 313-insulating sleeve, 3131-insulating sleeve limiting part, 314-adjusting lamination, 3141-convex particle, 3142-wire passing hole, 3143-clamp mounting part, 3144-wire passing hole limiting part, 3145-groove, 32-testing cable, 321-banana male head, 322-multi-core cable, 33-clamp, 331-fixed pin, 332-anti-slip buffer pad, 333-clamp body, 334-torsion spring and 335-fixed plate.
Detailed Description
The present invention will be described in further detail with reference to the following examples and the accompanying drawings.
Example 1:
as shown in fig. 1 and 2, a through-type connection terminal 1 to be tested is mounted on a stationary rail 2. During testing, a plurality of through type wiring terminals 1 to be tested are pressed together. Each through type wiring terminal to be tested is provided with a test hole 12, and a test screw 11 is arranged in each test hole 12 and is used for being connected and conducted with the through type wiring terminal rapid test device.
One embodiment of the invention is a rapid testing device for a through type wiring terminal. As shown in fig. 1, the through type connection terminal rapid test device 3 of the present invention includes a through type connection terminal test unit 31, a test cable 32, and a clamp 33.
The number of through terminal test units 31 in the through terminal rapid test apparatus 3 of the present embodiment is determined according to the number of through terminals 1 to be tested, i.e. the number of through terminal test units 31 in the through terminal rapid test apparatus 3 is determined by the number of through terminals 1 to be tested. The method comprises the steps of pressing all through type wiring terminal testing units 31 in a through type wiring terminal rapid testing device 3 together, determining a proper position in the middle of the through type wiring terminal rapid testing device 3 as a mounting position of a clamp 33, mounting a pair of clamps 33 on two sides of the corresponding through type wiring terminal testing unit 31, and fixing the through type wiring terminal testing units 31 on through type wiring terminals 1 to be tested through clamping action of the pair of clamps 33. The test cable 32 is connected to the rear of the through terminal test unit 31.
As shown in fig. 3 to 5, the main body of the through type connection terminal testing unit 31 is an adjusting lamination 314, a pair of insulating sleeves 313 are embedded and connected in the adjusting lamination 314, a banana female head 312 is connected in the insulating sleeves 313, and a conductive probe is connected in the banana female head 312.
When the direct-through type wiring terminal rapid testing device is used, the conductive probe of each direct-through type wiring terminal testing unit 31 on the direct-through type wiring terminal rapid testing device 3 is aligned with the corresponding testing screw 11 of the direct-through type wiring terminal 1 to be tested, the conductive probe 311 is pressed into the testing hole 12, the conductive probe 3111 is in good contact with the testing screw 11, and then the direct-through type wiring terminal rapid testing device 3 is fixed on the direct-through type wiring terminal 1 to be tested through the clamp 33.
Preferably, in another embodiment, a plurality of adjustment laminations 314 are stacked and then connected together by a connecting member. Preferably, in another embodiment, the top and bottom of the adjustment stack 314 are provided with a protrusion 3141 and a groove 3145, respectively, as shown in fig. 4. The convex grain 3141 and the groove 3145 are in interference fit, so that the plurality of adjusting laminations 314 can be pressed together, and the assembly and disassembly are quick and convenient. For example, at least one protrusion is provided on the top of the adjustment stack 314 and a corresponding recess is provided on the bottom, with an interference fit between the protrusions and recesses.
The front and back parts of the adjusting lamination 314 are provided with through wire through holes 3142, and the banana female head 312 is connected with the test cable 32 at the back part of the adjusting lamination 314 through the wire through holes 3142.
An insulating sleeve limiting part 3131 is arranged outside the insulating sleeve 313 to ensure that the conductive probe 311 is fully constrained relative to the adjustment lamination 314. Preferably, in another embodiment, the insulation sleeve limiting portion 3131 is a limiting protrusion arranged axially along the insulation sleeve 313.
Preferably, in another embodiment, a wire hole stopper 3144 engaged with the insulation sleeve stopper 3131 is disposed inside the wire hole 3142. Preferably, in another embodiment, the wire hole stopper 3144 is a blind hole stopper groove disposed on the upper side and/or the lower side of the wire hole 3142, as shown in fig. 6. By matching the insulating sleeve limiting part 3131 with the limiting blind hole groove at different positions, the distance between the pair of conductive probes 311 can be adjusted according to different types of through type wiring terminals 1 to be tested, and different types of through type wiring terminals 1 to be tested can be compatibly tested.
Preferably, in another embodiment, the conductive probes 311 are spring probes. As shown in fig. 7, the spring probe includes a probe body 3111, a spring 3112, and a shaft tube 3113. If manufacturing or installation errors exist in the through type wiring terminal 1 to be tested, the testing screws 11 may not be in the same plane, the spring 3112 can compensate for the distance between the testing screws 11 along the axial direction of the probe body 3111, meanwhile, the spring 3112 applies axial pressure to the probe body 3111, good contact between the probe body 3111 and the testing screws 11 is guaranteed, and reliable contact between the through type wiring terminal rapid testing device and the through type wiring terminal to be tested can be achieved for on-off detection.
Preferably, in another embodiment, the clamp 33 is a single-jaw clamp, and includes a fixing pin 331, a non-slip buffer 332, a clamp body 333, a torsion spring 334, and a fixing plate 335, as shown in fig. 8. The main body of the clamp 33 is a clamp body 333, the middle part of the clamp body 333 is connected with a fixing plate 335 through a fixing pin 331, and the fixing plate 335 is connected with clamp mounting parts at the left and right sides of the adjusting lamination 314. The fixing pin 331 is externally provided with a torsion spring 334, so that the clamp body 333 can be twisted along the fixing pin 331 and has an elastic reset function, and the head of the clamp body 333 is connected with the anti-slip buffer pad 332 through the fixing pin 331, so that the clamp 33 can be firmly and reliably clamped.
The main body of the test cable 32 is a multi-core cable 322, and the heads of the wires of the multi-core cable 322 are connected with banana male heads 321, as shown in fig. 9. The banana male connector 321 can be quickly and conveniently connected with and detached from the banana female connector 312 in the through-type wiring terminal testing unit 31.
In summary, the through-type wiring terminal test unit and the through-type wiring terminal rapid test device provided by the invention adopt the adjusting lamination, all terminal signals can be rapidly derived according to the type and the number of the through-type wiring terminals to be tested, and the test efficiency and the test quality are improved; by adopting the spring probe, the through-type wiring terminal testing unit and the through-type wiring terminal rapid testing device can be reliably contacted with the through-type wiring terminal to be tested for on-off detection. The through type wiring terminal rapid testing device provided by the invention adopts the single-claw clamp, and the rapid and convenient mounting and dismounting between the testing device and the wiring terminal to be tested can be realized.
Although the present invention has been described in terms of the preferred embodiment, it is not intended that the invention be limited to the embodiment. Any equivalent changes or modifications made without departing from the spirit and scope of the present invention also belong to the protection scope of the present invention. The scope of protection of the invention should therefore be determined with reference to the claims of the present application.
Claims (10)
1. A through type wiring terminal test unit is used for detecting the on-off state of a through type wiring terminal to be tested when the through type wiring terminal is contacted with the through type wiring terminal, and is characterized in that a main body is an adjusting lamination,
a pair of insulating sleeves is embedded and connected in the adjusting lamination, a banana female head is connected in the insulating sleeves, and a conductive probe is connected in the banana female head;
the front part and the rear part of the adjusting lamination are provided with through wire passing holes, and the banana female head is connected with a test cable at the rear part of the adjusting lamination through the wire passing holes;
and the left side and the right side of the adjusting lamination are respectively provided with a clamp mounting part for mounting an external clamp, and the clamp fixes the through type wiring terminal testing unit on the through type wiring terminal to be tested.
2. A flow-through terminal test unit according to claim 1, wherein the electrically conductive probe is a spring probe.
3. A flow-through terminal test unit according to claim 1, wherein the several adjusting laminations are stacked and connected together by connecting elements.
4. A flow-through terminal test unit according to claim 1 wherein the top and bottom of the alignment laminations are provided with interference fit projections and recesses, respectively, to allow a plurality of alignment laminations to be crimped together.
5. A flow-through terminal test unit according to claim 1, wherein the insulating sleeve is provided with an insulating sleeve stop on the outside to ensure full restraint of the conductive probe relative to the adjustment stack.
6. A flow-through terminal test unit according to claim 5, wherein the insulation sleeve limiting portion is a limiting rib arranged in the axial direction of the insulation sleeve.
7. A flow-through terminal test unit according to claim 5, wherein a terminal hole-limiting portion cooperating with the insulating sleeve-limiting portion is provided inside the terminal hole.
8. A flow-through terminal test unit according to claim 5, wherein the wire via hole limiting part is a limiting blind hole groove arranged on the upper side and/or the lower side of the wire via hole, and the spacing of the conductive probes is adjusted by matching the insulating sleeve limiting part with the limiting blind hole groove at different positions.
9. A fast testing device for through-type connection terminals, characterized in that it comprises a through-type connection terminal testing unit, a clamp, a testing cable according to claims 1-4;
the clamp is a single-claw clamp and comprises a clamp body, a fixing plate, a fixing pin, a torsion spring and an anti-skid cushion pad; the middle part of the clamp body is connected with a fixing plate through a fixing pin, and the fixing plate is connected with clamp mounting parts on the left side and the right side of the adjusting lamination; the torsional spring is installed in the fixed pin outside, makes the double-layered body can twist reverse and have the elasticity reset function along the fixed pin, and the double-layered body head passes through the fixed pin to be connected with anti-skidding blotter.
10. A fast testing device of a pass-through type connection terminal according to claim 9, wherein the main body of the testing cable is a multi-core cable, each conductor head of the multi-core cable is connected with a banana male head, and the banana male head is connected with or detached from a banana female head in the pass-through type connection terminal testing unit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211366687.1A CN115754366A (en) | 2022-11-01 | 2022-11-01 | Through type binding post test element and through type binding post quick testing arrangement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211366687.1A CN115754366A (en) | 2022-11-01 | 2022-11-01 | Through type binding post test element and through type binding post quick testing arrangement |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN115754366A true CN115754366A (en) | 2023-03-07 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202211366687.1A Pending CN115754366A (en) | 2022-11-01 | 2022-11-01 | Through type binding post test element and through type binding post quick testing arrangement |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN115754366A (en) |
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2022
- 2022-11-01 CN CN202211366687.1A patent/CN115754366A/en active Pending
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