CN115718265A - Method for correcting battery DC resistance test value, electronic device and storage medium - Google Patents
Method for correcting battery DC resistance test value, electronic device and storage medium Download PDFInfo
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Abstract
The invention discloses a method for correcting a battery direct current resistance test value, electronic equipment and a storage medium. The method comprises the following steps: acquiring a direct current resistance standard value of a battery to be tested at a standard temperature and direct current resistance test values at different test temperatures; determining a correction coefficient and a correction constant in a correction model according to the direct current resistance standard value, the direct current resistance test value, the standard temperature and the test temperature; and substituting the correction coefficient, the correction constant, the direct current resistance test value, the standard temperature and the test temperature into the correction model to obtain a correction value. The invention provides a correction method of a battery direct current resistance test value, electronic equipment and a storage medium, which can reduce the influence of environmental temperature on direct current resistance measurement, reduce screening deviation caused by direct current resistance fluctuation, improve the consistency judgment of a battery core and improve the product yield.
Description
Technical Field
The embodiment of the invention relates to the technical field of battery direct current impedance testing, in particular to a method for correcting a battery direct current resistance testing value, electronic equipment and a storage medium.
Background
In the production process of battery module, the electric core screening of battery is the indispensable process in the battery production process, constitute the module with the unanimous electric core of performance, can improve the uniformity of battery module, wherein, the screening of electric core includes the open circuit voltage of electric core, the capacity of electric core, electric core self discharge K value, and the Direct Current Resistance (DCIR) of electric core etc. and wherein the Direct Current Resistance of electric core will directly influence the power characteristic of electric core, be one of the important performance index of electric core.
The direct current resistance comprises ohmic internal resistance and electrochemical internal resistance, because the electrochemical internal resistance is greatly influenced by the temperature of the battery cell, the higher the temperature is, the smaller the electrochemical internal resistance is, in the production process of the battery cell, because the temperature fluctuation of the battery cell and the test environment is large, the fluctuation of the measured direct current resistance value is also large, so that the deviation between the measured value and the true value is caused, the consistency judgment of the battery cell is influenced, and the product yield is reduced.
Disclosure of Invention
The invention provides a correction method of a battery direct current resistance test value, electronic equipment and a storage medium, which can reduce the influence of environmental temperature on direct current resistance measurement, reduce screening deviation caused by direct current resistance fluctuation, improve the consistency judgment of a battery core and improve the product yield.
In a first aspect, an embodiment of the present invention provides a method for correcting a dc resistance test value of a battery, including:
acquiring a direct current resistance standard value of a battery to be tested at a standard temperature and direct current resistance test values at different test temperatures;
determining a correction coefficient and a correction constant in a correction model according to the direct current resistance standard value, the direct current resistance test value, the standard temperature and the test temperature;
and substituting the correction coefficient, the correction constant, the direct current resistance test value, the standard temperature and the test temperature into the correction model to obtain a correction value.
Optionally, the modified model is:
wherein R is Correction Is the correction value;
R measured in fact The DC resistance test values at different test temperatures;
T standard of merit Is the standard temperature;
T measured in fact Is the test temperature;
b is the correction constant;
Optionally, determining a correction coefficient and a correction constant in a correction model according to the dc resistance standard value, the dc resistance test value, the standard temperature, and the test temperature, includes:
acquiring a temperature coefficient according to the standard temperature and the test temperature;
obtaining a test coefficient according to the direct current resistance standard value and the direct current resistance test value;
and performing linear fitting on the temperature coefficient and the corresponding test coefficient at the test temperature to obtain a fitting curve, and determining the correction coefficient and the correction constant in the correction model according to the fitting curve.
Optionally, the temperature coefficient is a difference between an inverse of the test temperature and an inverse of the standard temperature.
Optionally, the test coefficient is a logarithm of a ratio of the dc resistance test value to the dc resistance standard value.
Optionally, obtaining a dc resistance standard value of the battery to be tested at the standard temperature and dc resistance test values at different test temperatures includes:
acquiring a first voltage value of the battery to be tested at the standard temperature or the test temperature;
performing constant current charging or discharging on the battery to be tested at a preset current to obtain a second voltage value of the battery to be tested after the constant current charging or discharging;
and obtaining the direct current resistance standard value at the standard temperature or the direct current resistance test value at the test temperature according to the first voltage value, the preset current and the second voltage value.
Optionally, obtaining the dc resistance standard value at the standard temperature or the dc resistance test value at the test temperature according to a first voltage value, a preset current, and a second voltage value, includes:
the direct current resistance standard value or the direct current resistance test value is a ratio of a difference value between the second voltage value and the first voltage value to the preset current, wherein the value of the difference value is greater than zero.
Optionally, the preset current ranges from 1C to 1.5C.
In a second aspect, an embodiment of the present invention provides an electronic device, where the electronic device includes:
at least one processor; and
a memory communicatively coupled to the at least one processor; wherein the content of the first and second substances,
the memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor to enable the at least one processor to implement the method for correcting the battery dc resistance test value according to any of the embodiments of the present invention.
In a third aspect, an embodiment of the present invention provides a storage medium, where the storage medium stores computer instructions, and the computer instructions are configured to enable a processor to execute the method for correcting a dc resistance test value of a battery according to any one of the embodiments of the present invention.
The invention provides a correction method of a battery direct current resistance test value, which combines a direct current resistance standard value, a direct current resistance test value, a standard temperature and a test temperature to determine a correction coefficient and a correction constant of a correction model, substitutes the direct current resistance test value, the standard temperature and the test temperature into the correction model, and obtains a correction value through calculation of the correction model. Therefore, the direct current resistance test value is corrected, the influence of the environment temperature on the direct current resistance measurement is reduced, the screening deviation caused by the direct current resistance fluctuation is reduced, the consistency judgment of the battery cell is improved, and the product yield is improved.
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Fig. 1 is a schematic flow chart of a method for correcting a dc resistance test value of a battery according to an embodiment of the present invention;
fig. 2 is a schematic flow chart illustrating a process of obtaining a dc resistance standard value at a standard temperature of a battery to be tested and a dc resistance test value at different test temperatures according to an embodiment of the present invention;
fig. 3 is a schematic structural diagram of a device for correcting a dc resistance test value of a battery according to an embodiment of the present invention;
FIG. 4 shows the DC resistance test value before correction;
FIG. 5 is a corrected DC resistance test value;
fig. 6 is a schematic structural diagram of an electronic device according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Fig. 1 is a schematic flow chart of a method for correcting a battery dc resistance test value according to an embodiment of the present invention, where the method may be performed by a device for correcting a battery dc resistance test value, and the device may be implemented in a hardware and/or software manner. The method specifically comprises the following steps:
s110, acquiring a direct current resistance standard value of the battery to be tested at a standard temperature and direct current resistance test values at different test temperatures;
specifically, the standard temperature is set according to the type of the battery cell. The test temperature is the actual battery temperature when the direct current resistance test is performed, wherein the test temperature can be obtained by using an infrared temperature measuring device, and the cell temperature when the cell test is performed is measured by the infrared temperature measuring device. The DC resistance test value obtained at the respective test temperature can be obtained by a DC resistance test.
S120, determining a correction coefficient and a correction constant in the correction model according to the direct current resistance standard value, the direct current resistance test value, the standard temperature and the test temperature;
specifically, the actual test value of the direct current resistance is corrected through related chemical knowledge such as an arrhenius empirical formula and a solution resistance calculation formula to obtain a correction model, the relation between a direct current resistance standard value and a direct current resistance test value is represented through a standard temperature and a test temperature, and a correction coefficient and a correction constant of the correction model are determined, so that the correction model of the battery cell of the type is obtained.
And S130, substituting the correction coefficient, the correction constant, the direct current resistance test value, the standard temperature and the test temperature into the correction model to obtain a correction value.
The invention provides a correction method of a battery direct current resistance test value, which combines a direct current resistance standard value, a direct current resistance test value, a standard temperature and a test temperature to determine a correction coefficient and a correction constant of a correction model, substitutes the direct current resistance test value, the standard temperature and the test temperature into the correction model, and obtains a correction value through calculation of the correction model. Therefore, the direct current resistance test value is corrected, the influence of the environment temperature on the direct current resistance measurement is reduced, the screening deviation caused by the fluctuation of the direct current resistance is reduced, the consistency judgment of the battery cell is improved, and the product yield is improved.
Optionally, the modified model is:
wherein R is Correction Is a correction value;
R measured in fact Testing values of direct current resistance at different testing temperatures;
T standard of reference Measuring the temperature for a standard;
T measured in fact Is the test temperature;
b is a correction constant;
Specifically, through related chemical knowledge such as an arrhenius empirical formula and a solution resistance calculation formula, the direct current resistance data obtained by testing the battery under different test conditions are integrated, and a correction model of the battery is obtained through derivation and design.
Based on the foregoing embodiment, optionally, determining a correction coefficient and a correction constant in a correction model according to the dc resistance standard value, the dc resistance test value, the standard temperature, and the test temperature includes:
acquiring a temperature coefficient according to the standard temperature and the test temperature;
obtaining a test coefficient according to the direct current resistance standard value and the direct current resistance test value;
and performing linear fitting according to the temperature coefficient and the corresponding test coefficient at the test temperature to obtain a fitting curve, and determining a correction model according to the fitting curve.
Specifically, through related chemical knowledge such as an arrhenius empirical formula and a solution resistance calculation formula, direct current resistance data obtained by testing the battery under different test conditions are integrated, and a correction model of the battery is obtained through derivation. Wherein, the correction model is as follows:
wherein R is Correction Is a correction value;
R measured actually Testing direct current resistance values at different testing temperatures;
T standard of merit Measuring the temperature for a standard;
T measured in fact Is the test temperature;
b is a correction constant;
Under different designs, the standards of the battery core are different, so that the corresponding correction constants and correction coefficients are different, a large number of direct current resistance test values of actual tests at different test temperatures are utilized, the temperature coefficient is obtained according to the standard temperature and the test temperature, and optionally, the temperature coefficient is the difference value between the reciprocal of the test temperature and the reciprocal of the standard temperature, namely the temperature coefficient is the difference value between the reciprocal of the test temperature and the reciprocal of the standard temperature
Obtaining a test coefficient according to the direct current resistance standard value and the direct current resistance test value, wherein the test coefficient is the logarithm of the ratio of the direct current resistance test value to the direct current resistance standard value, namely
For is to
And
linear fitting is performed on the data to obtain a slope of
The fitting relation formula is brought into the correction model, and the correction coefficient in the correction formula can be obtained according to the cell type
And correcting the specific value of the constant B, thereby determining a correction model of the type of the battery cell.
Fig. 2 is a schematic flow chart for acquiring a dc resistance standard value of a battery to be tested at a standard temperature and a dc resistance test value at different test temperatures according to an embodiment of the present invention, which is shown in fig. 2:
s210, acquiring a first voltage value of the battery to be tested at a standard temperature or a test temperature;
specifically, the temperature is adjusted to the standard temperature or the test temperature, and the state of charge of the battery cell is adjusted to a preset state, illustratively, 20% soc, and the battery is left to stand, and the current first voltage value of the battery to be tested, i.e., the voltage value before charging and discharging, is detected.
S220, performing constant current charging or discharging on the battery to be tested at a preset current to obtain a second voltage value of the battery to be tested after the battery to be tested is subjected to constant current charging or discharging;
specifically, constant current charging or discharging is performed at a preset current, for example, in a charging process, constant current charging is performed at a current of 1C for 10S, standing for 1min, and a second voltage value after charging is measured. Illustratively, taking the discharge process as an example, constant current discharge is performed at a current of 1C for a discharge time of 10S, and the second voltage value after discharge is measured. Optionally, the preset current ranges from 1C to 1.5C.
And S230, acquiring a direct current resistance standard value at the standard temperature or a direct current resistance test value at the test temperature according to the first voltage value, the preset current and the second voltage value.
Optionally, the obtaining a standard value of the dc resistance at the standard temperature or a test value of the dc resistance at the test temperature according to the first voltage value, the preset current, and the second voltage value includes:
the direct current resistance standard value or the direct current resistance test value is a ratio of a difference value of the second voltage value and the first voltage value to a preset current, wherein the value of the difference value is larger than zero.
Specifically, according to the adjusted test temperature, the test value of the dc resistance at the time of charging at the temperature (the second voltage value — the first voltage value)/the charging current can be correspondingly obtained. The test value of the direct current resistance during discharging is (second voltage value-first voltage value)/discharging current. Similarly, at the standard temperature, a standard value of the direct current resistance at the standard temperature can be obtained.
Fig. 3 is a schematic structural diagram of a device for correcting a test value of a direct current resistance of a battery according to an embodiment of the present invention, including:
the acquiring module 110 is configured to acquire a dc resistance standard value of a battery to be tested at a standard temperature and dc resistance test values at different test temperatures;
a determining module 120, configured to determine a correction coefficient and a correction constant in the correction model according to the dc resistance standard value, the dc resistance test value, the standard temperature, and the test temperature;
and the correction module 130 is configured to correct the dc resistance test value according to the correction model, the dc resistance test value, the standard temperature, and the test temperature to obtain a correction value.
Specifically, the standard temperature is set according to the type of the battery cell. The test temperature is an actual battery temperature when the dc resistance test is performed, wherein the test temperature can be obtained by using an infrared temperature measuring device, the cell temperature when the cell test is performed is measured by the infrared temperature measuring device, and the obtaining module 110 obtains a dc resistance test value at each test temperature. The determining module 120 corrects the actual dc resistance test value through the arrhenius empirical formula, the solution resistance calculation formula, and other relevant chemical knowledge to obtain a correction model, and characterizes the relationship between the dc resistance standard value and the dc resistance test value through the standard temperature and the test temperature, and determines the correction coefficient and the correction constant of the correction model, thereby obtaining the correction model of the battery cell of the type. The correction module 130 substitutes the dc resistance test value, the standard temperature, and the test temperature into the correction model, and obtains a correction value through calculation of the correction model.
The invention provides a correction device for a battery direct-current resistance test value, wherein a determination module is combined with a direct-current resistance standard value, a direct-current resistance test value, a standard temperature and a test temperature to determine a correction model, the correction module substitutes the direct-current resistance test value, the standard temperature and the test temperature into the correction model, and a correction value is obtained through calculation of the correction model. Therefore, the direct current resistance test value is corrected, the influence of the environment temperature on the direct current resistance measurement is reduced, the screening deviation caused by the direct current resistance fluctuation is reduced, the consistency judgment of the battery cell is improved, and the product yield is improved.
Optionally, the determining module includes:
the first acquisition unit is used for acquiring a temperature coefficient according to the standard temperature and the test temperature;
the second acquisition unit is used for acquiring a test coefficient according to the direct current resistance standard value and the direct current resistance test value;
and the fitting unit is used for performing linear fitting on the temperature coefficient and the corresponding test coefficient at the test temperature to obtain a fitting curve, and determining a correction coefficient and a correction constant in the correction model according to the fitting curve.
Specifically, the correction unit integrates direct-current resistance data obtained by testing the battery under different test conditions through related chemical knowledge such as an arrhenius empirical formula and a solution resistance calculation formula, and designs and obtains a correction model of the battery. Wherein, the correction model is as follows:
wherein R is Correction Is a correction value;
R measured in fact Testing direct current resistance values at different testing temperatures;
T standard of reference Measuring the temperature for a standard;
T measured actually Is the test temperature;
b is a correction constant;
Under different designs, the standards of the battery core are different, so that the corresponding correction constants and correction coefficients are different, a large number of actual test direct current resistance test values at different test temperatures are utilized, the first acquisition unit acquires a temperature coefficient according to the standard temperature and the test temperature, and optionally, the temperature coefficient is the difference between the reciprocal of the test temperature and the reciprocal of the standard temperature, namely
The second acquisition unit acquires a test coefficient according to the direct current resistance standard value and the direct current resistance test value, and optionally testsThe test coefficient is the logarithm of the ratio of the DC resistance test value to the DC resistance standard value, i.e. the test coefficient is the logarithm of the DC resistance standard value
Fitting unit pair
And
linear fitting is carried out on the relationship to obtain a slope of
The fitting relation formula is brought into the correction model, and the correction coefficient in the correction formula can be obtained according to the type of the battery cell
And correcting the specific value of the constant B, thereby determining a correction model of the type of the battery cell. Substituting the direct current resistance test value, the standard temperature and the test temperature into the correction model to correct the direct current resistance value obtained by the test, wherein fig. 4 is the direct current resistance test value before correction, and fig. 5 is the direct current resistance test value after correction, wherein a direct current resistance value qualified interval is arranged between horizontal lines in the diagram, and according to the results shown in fig. 4 and 5, the direct current resistance value is increased in proportion in the qualified interval by correcting the qualified battery cells under different temperature conditions, so that the screening accuracy is improved.
Optionally, the obtaining module includes:
the third acquisition unit is used for acquiring a first voltage value of the battery to be tested at the standard temperature or the test temperature;
the fourth obtaining unit is used for carrying out constant current charging or discharging on the battery to be tested at a preset current to obtain a second voltage value of the battery to be tested after constant current charging or discharging;
and the calculation unit is used for obtaining a direct current resistance standard value at the standard temperature or a direct current resistance test value at the test temperature according to the first voltage value, the preset current and the second voltage value.
Specifically, the temperature is adjusted to the standard temperature or the test temperature, and the state of charge of the battery cell is adjusted to the preset state, for example, 20% of the soc, the battery cell is allowed to stand, and the third acquiring unit detects the current first voltage value of the battery to be tested, that is, the voltage value before charging and discharging. And (3) performing constant current charging or discharging at a preset current, exemplarily, taking the charging process as an example, performing constant current charging at a current of 1C, charging for 10S, standing for 1min, and measuring a second voltage value after charging. Illustratively, taking the discharging process as an example, constant current discharging is performed at a current of 1C, the discharging time is 10S, and the fourth acquiring unit measures the second voltage value after discharging. Optionally, the preset current ranges from 1C to 1.5C. Optionally, the dc resistance standard value or the dc resistance test value is a ratio of a difference between the second voltage value and the first voltage value to a preset current, where a value of the difference is greater than zero. The calculation unit may obtain a test value of the dc resistance during charging as (second voltage value-first voltage value)/charging current. The test value of the direct current resistance during discharging is (second voltage value-first voltage value)/discharging current. Similarly, at the standard temperature, a standard value of the direct current resistance at the standard temperature can be obtained.
An embodiment of the present invention further provides an electronic device, where the electronic device includes:
at least one processor; and
a memory communicatively coupled to the at least one processor; wherein the content of the first and second substances,
the memory stores a computer program executable by the at least one processor, the computer program being executable by the at least one processor to enable the at least one processor to perform the method of correcting a test value for dc resistance of a battery according to any of the embodiments of the present invention.
Fig. 6 is a schematic structural diagram of an electronic device according to an embodiment of the present invention. Electronic devices are intended to represent various forms of digital computers, such as laptops, desktops, workstations, personal digital assistants, servers, blade servers, mainframes, and other appropriate computers. The electronic device may also represent various forms of mobile devices, such as personal digital assistants, cellular phones, smart phones, wearable devices (e.g., helmets, glasses, watches, etc.), and other similar computing devices. The components shown herein, their connections and relationships, and their functions, are meant to be exemplary only, and are not meant to limit implementations of the inventions described and/or claimed herein.
As shown in fig. 6, the electronic device 10 includes at least one processor 11, and a memory communicatively connected to the at least one processor 11, such as a Read Only Memory (ROM) 12, a Random Access Memory (RAM) 13, and the like, wherein the memory stores a computer program executable by the at least one processor, and the processor 11 can perform various suitable actions and processes according to the computer program stored in the Read Only Memory (ROM) 12 or the computer program loaded from a storage unit 18 into the Random Access Memory (RAM) 13. In the RAM 13, various programs and data necessary for the operation of the electronic apparatus 10 can also be stored. The processor 11, the ROM 12, and the RAM 13 are connected to each other via a bus 14. An input/output (I/O) interface 15 is also connected to bus 14.
A number of components in the electronic device 10 are connected to the I/O interface 15, including: an input unit 16 such as a keyboard, a mouse, or the like; an output unit 17 such as various types of displays, speakers, and the like; a storage unit 18 such as a magnetic disk, optical disk, or the like; and a communication unit 19 such as a network card, modem, wireless communication transceiver, etc. The communication unit 19 allows the electronic device 10 to exchange information/data with other devices via a computer network such as the internet and/or various telecommunication networks.
The processor 11 may be a variety of general and/or special purpose processing components having processing and computing capabilities. Some examples of processor 11 include, but are not limited to, a Central Processing Unit (CPU), a Graphics Processing Unit (GPU), various specialized Artificial Intelligence (AI) computing chips, various processors running machine learning model algorithms, a Digital Signal Processor (DSP), and any suitable processor, controller, microcontroller, or the like. The processor 11 performs the various methods and processes described above.
Various implementations of the systems and techniques described here above may be implemented in digital electronic circuitry, integrated circuitry, field Programmable Gate Arrays (FPGAs), application Specific Integrated Circuits (ASICs), application Specific Standard Products (ASSPs), system on a chip (SOCs), load programmable logic devices (CPLDs), computer hardware, firmware, software, and/or combinations thereof. These various embodiments may include: implemented in one or more computer programs that are executable and/or interpretable on a programmable system including at least one programmable processor, which may be special or general purpose, receiving data and instructions from, and transmitting data and instructions to, a storage system, at least one input device, and at least one output device.
Computer programs for implementing the methods of the present invention can be written in any combination of one or more programming languages. These computer programs may be provided to a processor of a general purpose computer, special purpose computer, or other programmable data processing apparatus, such that the computer programs, when executed by the processor, cause the functions/acts specified in the flowchart and/or block diagram block or blocks to be performed. A computer program can execute entirely on a machine, partly on a machine, as a stand-alone software package partly on a machine and partly on a remote machine or entirely on a remote machine or server.
In the context of the present invention, a storage medium may be a tangible medium that can contain, or store a computer program for use by or in connection with an instruction execution system, apparatus, or device. A storage medium may include, but is not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any suitable combination of the foregoing. Alternatively, the storage medium may be a machine-readable signal medium. More specific examples of a machine-readable storage medium would include an electrical connection based on one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.
To provide for interaction with a user, the systems and techniques described here can be implemented on an electronic device having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to a user; and a keyboard and a pointing device (e.g., a mouse or a trackball) by which a user can provide input to the electronic device. Other kinds of devices may also be used to provide for interaction with a user; for example, feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user may be received in any form, including acoustic, speech, or tactile input.
The systems and techniques described here can be implemented in a computing system that includes a back-end component (e.g., as a data server), or that includes a middleware component (e.g., an application server), or that includes a front-end component (e.g., a user computer having a graphical user interface or a web browser through which a user can interact with an implementation of the systems and techniques described here), or any combination of such back-end, middleware, or front-end components. The components of the system can be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include: local Area Networks (LANs), wide Area Networks (WANs), blockchain networks, and the internet.
The computing system may include clients and servers. A client and server are generally remote from each other and typically interact through a communication network. The relationship of client and server arises by virtue of computer programs running on the respective computers and having a client-server relationship to each other. The server can be a cloud server, also called a cloud computing server or a cloud host, and is a host product in a cloud computing service system, so that the defects of high management difficulty and weak service expansibility in the traditional physical host and VPS service are overcome.
It should be understood that various forms of the flows shown above may be used, with steps reordered, added, or deleted. For example, the steps described in the present invention may be executed in parallel, sequentially, or in different orders, and are not limited herein as long as the desired result of the technical solution of the present invention can be achieved.
Finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (10)
1. A method for correcting a battery direct current resistance test value is characterized by comprising the following steps:
acquiring a direct current resistance standard value of a battery to be tested at a standard temperature and direct current resistance test values at different test temperatures;
determining a correction coefficient and a correction constant in a correction model according to the direct current resistance standard value, the direct current resistance test value, the standard temperature and the test temperature;
and substituting the correction coefficient, the correction constant, the direct current resistance test value, the standard temperature and the test temperature into the correction model to obtain a correction value.
2. The method for correcting the DC resistance test value of the battery according to claim 1, wherein the correction model is:
wherein R is Correction Is the correction value;
R measured actually Testing values of the direct current resistance at different testing temperatures;
T standard of reference Is the standard temperature;
T measured in fact Is the test temperature;
b is the correction constant;
3. The method for correcting the dc resistance test value of the battery according to claim 2, wherein determining the correction coefficient and the correction constant in the correction model based on the dc resistance standard value, the dc resistance test value, the standard temperature, and the test temperature comprises:
acquiring a temperature coefficient according to the standard temperature and the test temperature;
obtaining a test coefficient according to the direct current resistance standard value and the direct current resistance test value;
and performing linear fitting on the temperature coefficient and the corresponding test coefficient at the test temperature to obtain a fitting curve, and determining the correction coefficient and the correction constant in the correction model according to the fitting curve.
4. The method according to claim 3, wherein the temperature coefficient is a difference between an inverse of the test temperature and an inverse of the standard temperature.
5. The method according to claim 3, wherein the test coefficient is a logarithm of a ratio of the DC resistance test value to the DC resistance standard value.
6. The method for correcting the direct current resistance test value of the battery according to any one of claims 1 to 5, wherein the step of obtaining the direct current resistance standard value of the battery to be tested at the standard temperature and the direct current resistance test value of the battery to be tested at different test temperatures comprises the following steps:
acquiring a first voltage value of the battery to be tested at the standard temperature or the test temperature;
performing constant current charging or discharging on the battery to be tested at a preset current to obtain a second voltage value of the battery to be tested after the constant current charging or discharging;
and obtaining the direct current resistance standard value at the standard temperature or the direct current resistance test value at the test temperature according to the first voltage value, the preset current and the second voltage value.
7. The method according to claim 6, wherein obtaining the standard value of the DC resistance at the standard temperature or the test value of the DC resistance at the test temperature according to a first voltage value, a preset current and a second voltage value comprises:
the direct current resistance standard value or the direct current resistance test value is a ratio of a difference value of the second voltage value and the first voltage value to the preset current, wherein the value of the difference value is larger than zero.
8. The method for correcting the DC resistance test value of the battery according to claim 6, wherein the predetermined current is in a range of 1C to 1.5C.
9. An electronic device, characterized in that the electronic device comprises:
at least one processor; and
a memory communicatively coupled to the at least one processor; wherein the content of the first and second substances,
the memory stores a computer program executable by the at least one processor, the computer program being executable by the at least one processor to enable the at least one processor to perform the method of correcting a battery dc resistance test value of any one of claims 1-8.
10. A storage medium storing computer instructions for causing a processor to execute the method for correcting a dc resistance test value of a battery according to any one of claims 1 to 8.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114325436A (en) * | 2021-12-24 | 2022-04-12 | 华鼎国联四川动力电池有限公司 | Calibration method for DCIR test value |
| CN116487285A (en) * | 2023-06-14 | 2023-07-25 | 英利能源发展(天津)有限公司 | Photovoltaic module electrical parameter test result correction method and related device |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114325436A (en) * | 2021-12-24 | 2022-04-12 | 华鼎国联四川动力电池有限公司 | Calibration method for DCIR test value |
| CN114325436B (en) * | 2021-12-24 | 2023-10-10 | 华鼎国联四川动力电池有限公司 | Calibration method of DCIR test value |
| CN116487285A (en) * | 2023-06-14 | 2023-07-25 | 英利能源发展(天津)有限公司 | Photovoltaic module electrical parameter test result correction method and related device |
| CN116487285B (en) * | 2023-06-14 | 2023-09-05 | 英利能源发展(天津)有限公司 | Photovoltaic module electrical parameter test result correction method and related device |
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