CN115661483B - Method, device, storage medium and electronic equipment for identifying Kelvin probe center - Google Patents
Method, device, storage medium and electronic equipment for identifying Kelvin probe center Download PDFInfo
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Abstract
The application discloses a method, a device, a storage medium and electronic equipment for identifying Kelvin probe centers. Wherein the method comprises the following steps: determining a first probe and a second probe in a Kelvin probe image, determining a first contour point set corresponding to the first probe in the image and a second contour point set corresponding to the second probe in the image; screening out a first contour point with a first distance from the end part of the second probe in the first contour point set and a second contour point with a second distance from the end part of the first probe in the second contour point set; and constructing a first straight line according to the first contour point, constructing a second straight line according to the second contour point, and determining the center point of the Kelvin probe based on the first straight line and the second straight line. The utility model provides a because Kelvin needle is under the long-time circumstances of using, the needle point is wearing and tearing easily, oxidation or can accumulate dirty, leads to the bright needle point to diminish or disappear, has caused the technical problem that is difficult to through discernment needle point location its two needle centers.
Description
Technical Field
The present application relates to the field of visual images, and in particular, to a method, an apparatus, a storage medium, and an electronic device for identifying a kelvin probe center.
Background
With the increasing demands of modern electronic devices for miniaturization, light weight, high performance, multifunction, low power consumption and low cost, the feature size of IC chips is continuously reduced, the scale of integration is rapidly expanding, the chip packaging technology is continuously innovated, the Bump processing technology (Bump process flow) is also developed, the Bump wafer test is also becoming more popular, and the Bump wafer test needs to be performed by using a special probe for the puncture test, wherein the kelvin probe is also a commonly used Bump test probe. And the position of the probe is determined by needle alignment in the test process, and the coordinate position of the bulb is determined by needle alignment in the test process, and the coordinate position of the probe is determined by needle alignment.
The Kelvin double needle consists of two needles, and the conventional Kelvin double needle tip shows obvious lightening, however, under the condition that the Kelvin probe is used for a long time, the needle tip is easy to wear, oxidize or accumulate dirt, so that the lightening needle tip is reduced or disappears. It is therefore difficult to determine the center of the double needle by locating the needle tip, and there is no kelvin double needle recognition algorithm for wear, oxidation or accumulation of dirt on the needle tip in the related art.
In view of the above problems, no effective solution has been proposed at present.
Disclosure of Invention
The embodiment of the application provides a method, a device, a storage medium and electronic equipment for identifying the center of a Kelvin probe, which at least solve the technical problem that the shiny needle point is reduced or disappears due to the fact that the needle point is easy to wear, oxidize or accumulate dirt under the condition that the Kelvin probe is used for a long time, and the center of a double needle of the Kelvin probe is difficult to position through identifying the needle point.
According to an aspect of embodiments of the present application, there is provided a method of identifying a center of a kelvin probe, including: determining a first probe and a second probe in a Kelvin probe image, determining a first contour point set corresponding to the first probe in the image and a second contour point set corresponding to the second probe in the image; screening out a first contour point with a first distance from the end part of the second probe in the first contour point set and a second contour point with a second distance from the end part of the first probe in the second contour point set; and constructing a first straight line according to the first contour point, constructing a second straight line according to the second contour point, and determining the center point of the Kelvin probe based on the first straight line and the second straight line.
Optionally, the first contour point builds a first straight line, and the second contour point builds a second straight line, including: respectively taking the first contour point and the second contour point as references, determining and screening out a third contour point with a third distance from the end part of the second probe in the first contour point set and a fourth contour point with a fourth distance from the end part of the first probe in the second contour point set, wherein the first distance is smaller than the third distance, and the second distance is smaller than the fourth distance; obtaining a first straight line according to the first contour point and the third contour point; and obtaining a second straight line according to the second contour point and the fourth contour point.
Optionally, determining the center point of the kelvin probe based on the first line and the second line includes: moving the first straight line along the first probe by a preset distance to obtain a third straight line intersecting with two sides of the first probe; moving the second straight line along the second probe by a preset distance to obtain a fourth straight line intersecting with two sides of the second probe; the center point of the Kelvin probe is determined based on the third line and the fourth line.
Optionally, determining the center point of the kelvin probe based on the third line and the fourth line includes: respectively acquiring a first center point corresponding to a third straight line and a second center point corresponding to a fourth straight line; the center point of the line between the first center point and the second center point is determined as the center point of the Kelvin probe.
Optionally, determining the first probe and the second probe in the kelvin probe image includes: acquiring the central position of a Kelvin probe image; identifying a connected domain in the Kelvin probe image, and determining the connected domain closest to the central position as a first probe; and determining the nearest connected domain to the first probe as the second probe.
Optionally, before identifying the connected domain in the kelvin probe image, further comprises: and carrying out graying treatment on the Kelvin probe image to obtain a gray level image corresponding to the Kelvin probe image, and detecting whether the gray level image meets the preset brightness requirement.
Optionally, identifying the connected domain in the kelvin probe image includes: invoking an adaptive threshold algorithm to perform local adaptive threshold segmentation on the gray level image to obtain a target binarized image; and calling a depth priority algorithm to determine a connected domain corresponding to the Kelvin probe image in the target binarized image.
Optionally, detecting whether the gray scale map meets a preset brightness requirement includes: determining a white part in the target binarized image as a background picture in the gray level image; and counting the pixel value of the background picture to be larger than the first image pixel area corresponding to the preset value, obtaining the second image pixel area corresponding to the binary image, calculating the ratio of the first image pixel area to the second image pixel area, and determining whether the gray level image meets the preset brightness requirement according to the ratio.
Optionally, determining whether the gray scale map meets the preset brightness requirement according to the ratio includes: under the condition that the ratio is larger than a preset ratio, determining that the gray level diagram meets the preset brightness requirement; and under the condition that the ratio is smaller than the preset ratio, determining that the gray scale map does not meet the preset brightness requirement.
According to another aspect of the embodiments of the present application, there is also provided an apparatus for identifying a center of a kelvin probe, including: the identification module is used for determining a first probe and a second probe in the Kelvin probe image, determining a first contour point set corresponding to the first probe in the image and a second contour point set corresponding to the second probe in the image; the screening module is used for screening out a first contour point with a first distance from the end part of the second probe in the first contour point set and a second contour point with a second distance from the end part of the first probe in the second contour point set; and the determining module is used for constructing a first straight line according to the first contour point, constructing a second straight line according to the second contour point, and determining the center point of the Kelvin probe based on the first straight line and the second straight line.
According to another aspect of the embodiments of the present application, there is also provided a nonvolatile storage medium including: the storage medium includes a stored program, wherein the program, when run, controls the device in which the storage medium resides to perform any one of a number of methods of identifying the center of the Kelvin probe.
According to another aspect of the embodiments of the present application, there is also provided an electronic device, including: a processor; a memory for storing processor-executable instructions; wherein the processor is configured to execute instructions to implement any one of a number of methods of identifying a Kelvin probe center.
In the embodiment of the application, a needle contour positioning mode is adopted, and a first contour point set corresponding to a first probe in an image and a second contour point set corresponding to a second probe in the image are determined by determining the first probe and the second probe in a Kelvin probe image; screening out a first contour point with a first distance from the end part of the second probe in the first contour point set and a second contour point with a second distance from the end part of the first probe in the second contour point set; according to the method, a first straight line is constructed according to a first contour point, a second straight line is constructed according to a second contour point, the center point of the Kelvin probe is determined based on the first straight line and the second straight line, and the purpose of accurately positioning the center of the Kelvin probe based on the contour of a needle body is achieved, so that the technical effect of avoiding the influence of defects of the edge of a needle point on contour precision is achieved, and the technical problem that the needle point is easy to wear, oxidize or accumulate dirt under the condition that the Kelvin probe is used for a long time, so that the shiny needle point becomes smaller or disappears, and the problem that the double-needle center of the Kelvin probe is difficult to position by identifying the needle point is solved.
Drawings
The accompanying drawings, which are included to provide a further understanding of the application and are incorporated in and constitute a part of this application, illustrate embodiments of the application and together with the description serve to explain the application and do not constitute an undue limitation to the application. In the drawings:
FIG. 1 is a flow diagram of a method of identifying a Kelvin probe center according to an embodiment of the application;
FIG. 2 is a schematic flow chart of constructing a first straight line from a first contour point and constructing a second straight line from a second contour point according to some embodiments of the present application;
FIG. 3 is a schematic flow chart of determining a center point of a Kelvin probe based on a first line and a second line in some alternative embodiments of the present application;
FIG. 4 is a schematic flow chart of an alternative method for determining the first probe and the second probe in the Kelvin probe image;
FIG. 5 is a flow chart of identifying connected domains in a Kelvin probe image in an exemplary embodiment of the present application;
FIG. 6 is a flow chart implementing Kelvin double needle identification in accordance with an embodiment of the present application;
FIG. 7 is a Kelvin probe gray scale plot according to an embodiment of the present application;
FIGS. 8a, 8b are diagrams of Kelvin probe background binary values according to embodiments of the present application;
FIG. 9 is a first Kelvin probe edge profile according to an embodiment of the present application;
FIG. 10 is a second Kelvin probe edge profile according to an embodiment of the present application;
FIG. 11 is a graph of results of a Kelvin double needle first pair edge point calculation according to an embodiment of the present application;
FIG. 12 is a graph of the results of a Kelvin double needle second pair edge point calculation according to an embodiment of the present application;
FIG. 13 is a schematic diagram showing the distribution of a first straight line and a second straight line according to an exemplary embodiment of the present application;
FIG. 14 is a schematic view showing the distribution of the third straight line, the fourth straight line, the center point corresponding to the third straight line, and the center point corresponding to the fourth straight line according to an exemplary embodiment of the present disclosure;
FIG. 15 is a schematic illustration of the location of the center of a Kelvin probe in an example embodiment of the present application;
FIG. 16 is a schematic structural view of an apparatus for identifying the center of a Kelvin probe according to an embodiment of the present application;
fig. 17 shows a schematic block diagram of an example electronic device 170 that may be used to implement embodiments of the present application.
Detailed Description
In order to make the present application solution better understood by those skilled in the art, the following description will be made in detail and with reference to the accompanying drawings in the embodiments of the present application, it is apparent that the described embodiments are only some embodiments of the present application, not all embodiments. All other embodiments, which can be made by one of ordinary skill in the art based on the embodiments herein without making any inventive effort, shall fall within the scope of the present application.
It should be noted that the terms "first," "second," and the like in the description and claims of the present application and the above figures are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used may be interchanged where appropriate such that embodiments of the present application described herein may be implemented in sequences other than those illustrated or otherwise described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
For a better understanding of those skilled in the art, related embodiments of the present application will now be described with reference to the technical terms or partial terms that may be used in the present application:
the wafer test is to perform needle test on each die on the chip, to install a probe made of gold wire on the test head, to contact with the contact point on the die, to test the electrical characteristics, the unqualified die will be marked with marks, then when the chip is cut into independent dies by the die unit, the unqualified die marked with marks will be eliminated, and the next process will not be performed, so as to avoid increasing the manufacturing cost. At the time of testing, the wafer is held on a vacuum suction chuck and aligned with a very thin probe tester while the probe is in contact with each bond pad of the die. The electrical tester tests the circuit and records the result under the drive of the power supply. The number, sequence and type of tests are controlled by a computer program.
Kelvin probes are a non-contact, non-destructive, gas-phase, ambient metal surface potential measurement technique based on vibrating capacitance, used to measure the Work Function (Work Function) or surface potential (Surface Potential) of a material. The method can be used for detecting the tiny change of the surface potential of the material caused by factors such as temperature, humidity, surface chemistry, electricity, mechanics, crystal, adsorption, film formation and the like in the gas phase environment, is a high-sensitivity surface electrochemical analysis technology, and is the only method capable of measuring the surface potential of the corrosion electrode in the gas phase environment. The Kelvin probe comprises nine components including a vibration probe module, a sample electrode module, a sample environment module, a scanning movement control module, a signal acquisition analysis module, a mechanical support module, a measurement control software module, a data analysis software module and a computer.
Binary images are usually represented by black and white, B & W, and monochrome images, with each pixel on the image having only two possible values or gray scale states. The binary image is that in the image, the gray level is only two, the gray value of any pixel point in the image is 0 or 255, and the gray values respectively represent black and white.
The adaptive thresholding method is based on the idea that, instead of calculating the threshold value of the global image, the local threshold value is calculated according to the brightness distribution of different areas of the image, so that different threshold values can be calculated adaptively for different areas of the image.
DFS is one of the graph algorithms, a traversal algorithm for graphs and trees. Depth-first search is a classical algorithm in graph theory, and by using the depth-first search algorithm, a corresponding topological ranking table of the target graph can be generated, and by using the topological ranking table, many related graph theory problems, such as a maximum path problem, and the like, can be conveniently solved. The DFS algorithm is typically implemented with assistance from a heap or stack. The process is briefly that each possible branch path goes deep until the branch path can not go deep any more, if dead legs are encountered, the branch path goes back, if the branch path which is not explored is encountered in the back process, the branch path is entered for going deep, and each node can only access once.
A connected domain, a region G on a complex plane, is called a single connected region if a simple closed curve is made in either of the connected domains, and the inside of the closed curve always belongs to G. One region is referred to as a multiple-communication region if it is not a single-communication region.
Convex hull the most commonly used convex hull algorithm is the gram scan method, and the gram scan algorithm idea is based on the properties of the convex hull: the point p with the smallest y value in the N points is obtained; the rest N-1 points are ordered according to the polar angle value of the point p; traversing the N-1 points after sorting, only reserving the points which rotate anticlockwise.
In accordance with the embodiments of the present application, there is provided a method embodiment for identifying a Kelvin probe center, it being noted that the steps shown in the flowchart of the figures may be performed in a computer system, such as a set of computer-executable instructions, and, although a logical order is shown in the flowchart, in some cases, the steps shown or described may be performed in an order other than that shown or described herein.
Fig. 1 is a method of identifying a center of a kelvin probe according to an embodiment of the present application, as shown in fig. 1, the method includes the steps of:
step S102, determining a first probe and a second probe in a Kelvin probe image, and determining a first contour point set corresponding to the first probe in the image and a second contour point set corresponding to the second probe in the image;
it will be appreciated that the first set of contour points refers to the set of needle contour points of the first probe, and the second set of contour points refers to the set of needle contour points of the second probe; the above-mentioned manners of determining the contour point of the needle body include, but are not limited to: the convex hull algorithm is used for extracting the outline of the Kelvin probe, so that the influence of the edge defect of the needle tip on the outline precision can be effectively avoided.
Step S104, screening out a first contour point with a first distance from the end part of the second probe in the first contour point set and a second contour point with a second distance from the end part of the first probe in the second contour point set;
the first contour point is the point closest to the tip end of the second probe in the first contour point set, and similarly, the second contour point is the point closest to the tip end of the first probe in the second contour point set, and in the screening process, optional distance calculation methods include, but are not limited to: euclidean distance, manhattan distance, chebyshev distance, etc.
Step S106, constructing a first straight line according to the first contour point, constructing a second straight line according to the second contour point, and determining the center point of the Kelvin probe based on the first straight line and the second straight line;
it will be appreciated that the first straight line constructed from the first contour point is a straight line passing through the first contour point, and similarly, the second straight line constructed from the second contour point is a straight line passing through the second contour point.
In the method for identifying the center of the Kelvin probe, a first contour point set corresponding to a first probe in an image and a second contour point set corresponding to a second probe in the image are determined by determining the first probe and the second probe in the Kelvin probe image; screening out a first contour point with a first distance from the end part of the second probe in the first contour point set and a second contour point with a second distance from the end part of the first probe in the second contour point set; according to the method, a first straight line is constructed according to a first contour point, a second straight line is constructed according to a second contour point, the center point of the Kelvin probe is determined based on the first straight line and the second straight line, and the purpose of accurately positioning the center of the Kelvin probe based on the contour of the needle body is achieved, so that the technical effect of avoiding the influence of defects of the edge of the needle body on contour precision is achieved, and the technical problem that the shiny needle point is reduced or disappears due to easy abrasion and oxidation or accumulation of dirt of the needle point under the condition that the Kelvin probe is used for a long time is solved, and the technical problem that the double-needle center of the needle point is difficult to position by identifying the needle point is caused.
Fig. 2 is a schematic flow chart of constructing a first straight line according to a first contour point and constructing a second straight line according to a second contour point in some embodiments of the present application, as shown in fig. 2, the flow mainly includes the following steps:
s202, a third contour point with a third distance from the end part of the second probe in the first contour point set and a fourth contour point with a fourth distance from the end part of the first probe in the second contour point set can be determined and selected by taking the first contour point and the second contour point as references, wherein the first distance is smaller than the third distance, and the second distance is smaller than the fourth distance;
s204, obtaining a first straight line according to the first contour point and the third contour point;
s206, obtaining a second straight line according to the second contour point and the fourth contour point.
Alternatively, the screening of the third contour point based on the first contour point may be to screen all contour points in a preset radius range from the first contour point set based on the first contour point as a circle center, and then determine a point closest to the end (tip) of the second probe from all contour points as a third contour point, and similarly, the screening of the fourth contour point based on the second contour point may be to screen all contour points in a preset radius range from the second contour point set based on the second contour point as a circle center, and then determine a point closest to the end (tip) of the first probe from all contour points as a fourth contour point.
It is easy to note that a unique first straight line may be determined based on the first contour point and the third contour point, and a unique second straight line may be determined based on the second contour point and the fourth contour point.
FIG. 3 is a schematic flow chart of determining a center point of a Kelvin probe based on a first line and a second line, according to some alternative embodiments of the present application, and as shown in FIG. 3, the process may be implemented by:
s302, the first straight line can be moved along the first probe for a preset distance to obtain a third straight line intersecting with two sides of the first probe;
s304, moving the second straight line along the second probe by a preset distance to obtain a fourth straight line intersecting with two sides of the second probe;
s306, determining the center point of the Kelvin probe based on the third line and the fourth line.
It is easy to note that after the first straight line is moved along the first probe by a preset distance, two intersection points are formed after the first straight line intersects with two sides of the first probe body, and the third straight line is a straight line segment determined by the two intersection points. Similarly, the fourth straight line is a straight line segment determined by two intersection points, and the two intersection points are formed after the second straight line is intersected with two side edges of the second probe body after being moved along the second probe by a preset distance.
Specifically, determining the center point of the kelvin probe based on the third line and the fourth line may be achieved by: the first center point corresponding to the third straight line and the second center point corresponding to the fourth straight line can be obtained respectively, then the center point of the connecting line between the first center point and the second center point is determined to be the center point of the Kelvin probe, and it is easy to notice that the center point of the probe is identified in a contour positioning mode, so that the influence of the defect of the edge of the needle point on contour precision is avoided, and the technical problem that the shiny needle point is reduced or disappears due to the fact that the needle point is easy to wear, oxidize or accumulate dirt under the condition that the Kelvin probe is used for a long time, and the double-needle center of the needle point is difficult to position through the identification is solved.
As another alternative embodiment, the determination of the center point of the kelvin probe based on the third line and the fourth line may also be implemented by specifically obtaining the first center point corresponding to the third line and the second center point corresponding to the fourth line, and then determining the center positions of the first center line and the second center point as the center of the kelvin probe.
As an alternative embodiment, fig. 4 is a schematic flow chart of an alternative method for determining the first probe and the second probe in the kelvin probe image in the present application, as shown in fig. 4, the flow may be implemented specifically by the following ways:
s402, acquiring the center position of a Kelvin probe image;
s404, identifying a connected domain in the Kelvin probe image, and determining the connected domain closest to the central position as a first probe;
s406, determining the connected domain nearest to the first probe as the second probe.
The connected domain may be calculated by using a DFS algorithm, and the calculation method for measuring the distance between the center position and the connected domain may be a euclidean distance, a manhattan distance, or a chebyshev distance, for example, the connected domain closest to the center position is calculated by using a euclidean distance.
It can be understood that, because the distance calculation modes of different dimensions may have differences in the final obtained results, in an embodiment of the present application, a plurality of distance calculation modes may be used to determine the connected domain closest to the center position, and then, the connected domain closest to the center position is obtained by combining the calculation with the various distance calculation methods.
In an alternative embodiment, before identifying the connected domain in the kelvin probe image, the method further includes: and carrying out graying treatment on the Kelvin probe image to obtain a gray level image corresponding to the Kelvin probe image, and detecting whether the gray level image meets the preset brightness requirement.
Fig. 5 is a schematic flow chart of identifying connected domains in a kelvin probe image according to an exemplary embodiment of the present application, and as shown in fig. 5, the process may include the following steps:
s502, calling a self-adaptive threshold algorithm to perform local self-adaptive threshold segmentation on the gray level image to obtain a target binarized image;
s504, calling a depth priority algorithm to determine a connected domain corresponding to the Kelvin probe image in the target binarization image.
The adaptive threshold segmentation is to adaptively calculate different thresholds according to brightness distribution of different areas of the gray image, and the method is suitable for processing images with uneven illumination. The threshold value of the corresponding local area can be generally determined by calculating the pixel point mean value, the median value and the gaussian weighted average of a certain local area, wherein the threshold value can be set according to the actual situation, and the related embodiments of the application are not particularly limited.
In some embodiments of the present application, optional adaptive threshold segmentation methods include, but are not limited to: a local self-adaptive threshold segmentation method (preferred), a maximum entropy threshold segmentation method, an iterative threshold segmentation method and an Ojin method; depth-first algorithms include, but are not limited to, DFS algorithms.
Optionally, in order to effectively separate the needle body from the background picture, improve accuracy of the identification result, before identifying the connected domain in the kelvin probe image, gray-scale processing may be performed on the kelvin probe image to obtain a gray-scale image corresponding to the kelvin probe image, and after the gray-scale image meets the preset brightness requirement, other operations are performed.
Specifically, the detection of whether the gray level map meets the preset brightness requirement can be realized through the following steps: determining a white part in the target binarized image as a background picture in the gray level image; and counting the pixel value of the background picture to be larger than the first image pixel area corresponding to the preset value, obtaining the second image pixel area corresponding to the binary image, calculating the ratio of the first image pixel area to the second image pixel area, and determining whether the gray level image meets the preset brightness requirement according to the ratio.
In some embodiments of the present application, determining whether the gray map meets a preset brightness requirement according to the ratio includes: when the ratio is greater than the preset ratio, the gray level map is determined to satisfy the preset brightness requirement, and it is easy to note that when the ratio is less than the preset ratio, the gray level map is determined not to satisfy the preset brightness requirement.
For example, assuming that the predetermined value is 110 at this time, the first image pixel area of the background picture greater than the predetermined value 110 is 10, and the second image pixel area is 60, if the area ratio of the background picture to the binary image is less than 1/5, the background brightness is determined to be too dark, then an early warning prompt is performed to remind to adjust the brightness, and when the needle contour and the background are obviously distinguished, the image recognition is performed again; if the predetermined value is still 110, the pixel value of the background picture is adjusted by the light, the pixel area of the first image with the background picture larger than the predetermined value 110 becomes 20, and the area ratio of the background picture to the binary image is larger than 1/5, the background brightness can be determined to be normal, and the next segmentation operation is performed.
The above-mentioned background brightness adjustment method includes: manually adjusting the light source controller and calling an algorithm to automatically adjust the brightness.
It is easy to note that in the above technical solution, a mode of fitting the contour of the needle body can be adopted, a straight line of the end of the double needle is constructed through the contour point of the end of the needle body, the straight line of the end of the needle body is deflected towards the inside of the needle body, a straight line constructed by the side points of the needle body is obtained in the inside of the needle body, a straight line connected with the double needle is constructed by the center point of the deflected straight line, the center point of the straight line connected with the double needle is the center point of the double needle, compared with the mode of positioning the needle point, the method is more stable, and the center of the double needle of kelvin can be positioned no matter whether the needle point is worn or not.
In order to facilitate a better understanding of the technical solutions of the present application, a specific embodiment will now be described.
Fig. 6 is a flowchart illustrating a method for implementing identification of a kelvin probe center according to an embodiment of the present application, and as shown in fig. 6, the flowchart mainly includes the following steps:
(1) And acquiring a focused Kelvin probe picture, and carrying out graying treatment on the Kelvin probe picture to obtain a gray level diagram shown in fig. 7.
(2) Dividing a background binary image according to whether a background evaluation picture is excessively dark or not (namely determining that a white part in the binary image is a background picture in a gray level picture), positioning the background by using the white part of the binary image as shown in fig. 8a and 8b, calculating the number of pixels of which the pixel value exceeds a set value (optionally, the set value can be 110), if the number meets an image area which is more than 1/5 (namely, a preset proportion), judging that the background brightness is normal (namely, counting a first image pixel area corresponding to the pixel value of the background picture which is more than a preset value, acquiring a second image pixel area corresponding to the binary image, calculating the ratio of the first image pixel area to the second image pixel area, and determining that the gray level picture meets the preset brightness requirement under the condition that the ratio is more than the preset ratio), and entering step S3; if the number does not meet the image area larger than 1/5 (preset proportion), determining that the gray level map does not meet the preset brightness requirement, giving an alarm, and then adjusting the brightness until the number of pixels exceeding the set value is larger than 1/5.
It should be noted that, the manner of adjusting the brightness when the background is too dark includes, but is not limited to: the light source controller is manually adjusted manually, for example, a prompt message is sent to a user, the user participates in adjusting or calling a brightness adjusting algorithm, optionally, in the brightness adjusting process based on the brightness adjusting algorithm, the brightness value of the light source can be sequentially improved according to a preset step length (optionally, the step length value can be 10) until the number of pixels exceeding a set value meets the image area of more than 1/5 (preset proportion).
(3) And carrying out self-adaptive threshold segmentation on the obtained gray level image to obtain a connected domain of the dark needle body, and obtaining a needle body binary image.
Alternative adaptive thresholding methods include, but are not limited to: a local self-adaptive threshold segmentation method, a maximum entropy threshold segmentation method, an iterative threshold segmentation method and an Ojin method.
(4) And calling a depth-first DFS algorithm to determine a connected domain corresponding to the Kelvin probe image in the target binarization image.
(5) And screening the needle body communication domain of the first probe closest to the center picture.
It should be noted that alternative distance calculation methods include, but are not limited to: euclidean distance, manhattan distance, chebyshev distance.
(6) And screening the needle communicating region of the second probe closest to the center of the needle communicating region screened by the previous screening. Alternative distance calculation means in this process include, but are not limited to: euclidean distance, manhattan distance, chebyshev distance.
(7) The contours of the two needles can be extracted by a convex hull algorithm, and the needle contours of the first probe and the second probe are extracted, as shown in fig. 9 and 10, which are respectively a needle edge contour map of the first probe and a needle edge contour map of the second probe.
(8) A first contour point of the first contour point set, which is at a first distance from the end of the second probe, and a second contour point of the second contour point set, which is at a second distance from the end of the first probe, are selected, and according to the first contour point, two of the second contour points form a first pair of edge points (which may also be a first edge point pair), as shown in fig. 11, which is a schematic diagram of the first pair of edge points. It should be noted that, in the above-mentioned distance determining process, optional distance calculating manners include, but are not limited to: euclidean distance, manhattan distance, chebyshev distance.
(9) Screening out a first contour point closest to the end part of the second probe in the first contour point set and a second contour point closest to the end part of the first probe in the second contour point set; then, a third contour point closest to the end of the second probe except the first contour point in the first contour point set and a fourth contour point closest to the end of the first probe except the second contour point in the second contour point set are screened out based on the first contour point and the second contour point, and a second pair of edge points (also referred to as a second edge point pair) is formed according to the third contour point and the fourth contour point, and a schematic diagram of the second pair of edge points is shown in fig. 12.
Similarly, the distance calculation manners optionally used in the distance calculation process include, but are not limited to: euclidean distance, manhattan distance, chebyshev distance.
(10) And obtaining a first straight line according to the first contour point and the third contour point, and obtaining a second straight line according to the second contour point and the fourth contour point, wherein fig. 13 is a schematic diagram of the distribution of the first straight line and the second straight line.
(11) Moving the first straight line along the first probe by a preset distance to obtain a third straight line intersecting with two sides of the first probe; moving the second straight line along the second probe by a preset distance to obtain a fourth straight line intersecting with two sides of the second probe; and the center points of the third line and the fourth line are respectively determined, as shown in fig. 14, and are distribution diagrams of the third line, the fourth line, the center point corresponding to the third line, and the center point corresponding to the fourth line.
(12) The center points of the third line and the fourth line are connected to obtain a line, the center point of the line is calculated to be the center point of the Kelvin probe, fig. 15 is a schematic diagram of the distribution positions of the centers of the Kelvin probes, and as shown in fig. 15, the center of the Kelvin probe is the center position of a connecting line formed after the center point of the third line is connected with the center point of the fourth line.
Fig. 16 is an apparatus for identifying a center of a kelvin probe according to an embodiment of the present application, as shown in fig. 16, the apparatus includes:
the identifying module 160 is configured to determine a first probe and a second probe in the kelvin probe image, determine a first set of contour points corresponding to the first probe in the image, and determine a second set of contour points corresponding to the second probe in the image;
the screening module 162 is configured to screen a first contour point in the first contour point set, where the distance between the first contour point and the end of the second probe is a first distance, and a second contour point in the second contour point set, where the distance between the second contour point and the end of the first probe is a second distance;
the determining module 164 is configured to construct a first straight line according to the first contour point, construct a second straight line according to the second contour point, and determine a center point of the kelvin probe based on the first straight line and the second straight line.
In the device, an identification module 160 is configured to determine a first probe and a second probe in a kelvin probe image, determine a first set of contour points corresponding to the first probe in the image, and determine a second set of contour points corresponding to the second probe in the image; the screening module 162 is configured to screen a first contour point in the first contour point set, where the distance between the first contour point and the end of the second probe is a first distance, and a second contour point in the second contour point set, where the distance between the second contour point and the end of the first probe is a second distance; the determining module 164 is configured to construct a first straight line according to the first contour point, construct a second straight line according to the second contour point, and determine a center point of the kelvin probe based on the first straight line and the second straight line, so as to achieve the purpose of accurate positioning, thereby realizing the technical effect of avoiding the influence of the defect of the edge of the needle body on the contour precision, and further solving the technical problem that the needle point is easy to wear, oxidize or accumulate dirt under the condition of long-time use of the kelvin probe, so that the shiny needle point becomes smaller or disappears, and the double-needle center is difficult to determine by positioning the needle point.
According to another aspect of the embodiments of the present application, there is further provided a nonvolatile storage medium, where the nonvolatile storage medium includes a stored program, and when the program runs, the device in which the nonvolatile storage medium is controlled to execute any one of the methods for identifying the kelvin probe center.
Specifically, the storage medium is configured to store program instructions for the following functions, and implement the following functions:
determining a first probe and a second probe in a Kelvin probe image, determining a first contour point set corresponding to the first probe in the image and a second contour point set corresponding to the second probe in the image; screening out a first contour point with a first distance from the end part of the second probe in the first contour point set and a second contour point with a second distance from the end part of the first probe in the second contour point set; and constructing a first straight line according to the first contour point, constructing a second straight line according to the second contour point, and determining the center point of the Kelvin probe based on the first straight line and the second straight line.
Alternatively, in the present embodiment, the storage medium may include, but is not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any suitable combination of the foregoing. More specific examples of a storage medium would include an electrical connection based on one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.
There is provided, according to an embodiment of the present application, an electronic device including: at least one processor; and a memory communicatively coupled to the at least one processor; wherein the memory stores instructions executable by the at least one processor to enable the at least one processor to perform any one of the methods of identifying a Kelvin probe center described above.
Optionally, the electronic device may further include a transmission device and an input/output device, where the transmission device is connected to the processor, and the input device is connected to the processor.
Fig. 17 shows a schematic block diagram of an example electronic device 170 that may be used to implement embodiments of the present application. Electronic devices are intended to represent various forms of digital computers, such as laptops, desktops, workstations, personal digital assistants, servers, blade servers, mainframes, and other appropriate computers. The electronic device may also represent various forms of mobile devices, such as personal digital processing, cellular telephones, smartphones, wearable devices, and other similar computing devices. The components shown herein, their connections and relationships, and their functions, are meant to be exemplary only, and are not meant to limit implementations of the application described and/or claimed herein.
As shown in fig. 17, the apparatus 170 includes a computing unit 171 that can perform various appropriate actions and processes according to a computer program stored in a Read Only Memory (ROM) 172 or a computer program loaded from a storage unit 178 into a Random Access Memory (RAM) 173. In the RAM 173, various programs and data required for the operation of the device 170 may also be stored. The computing unit 171, the ROM 172, and the RAM 173 are connected to each other through a bus 174. An input/output (I/O) interface 175 is also connected to bus 174.
Various components in the device 170 are connected to the I/O interface 175, including: an input unit 176 such as a keyboard, a mouse, etc.; an output unit 177 such as various types of displays, speakers, and the like; a storage unit 178 such as a magnetic disk, optical disk, etc.; and a communication unit 179, such as a network card, modem, wireless communication transceiver, or the like. The communication unit 179 allows the device 170 to exchange information/data with other devices via a computer network, such as the internet, and/or various telecommunication networks.
The computing unit 171 may be a variety of general and/or special purpose processing components having processing and computing capabilities. Some examples of computing unit 171 include, but are not limited to, a Central Processing Unit (CPU), a Graphics Processing Unit (GPU), various specialized Artificial Intelligence (AI) computing chips, various computing units running machine learning model algorithms, a Digital Signal Processor (DSP), and any suitable processor, controller, microcontroller, etc. The computing unit 171 performs the respective methods and processes described above. For example, in some embodiments, the method of identifying a Kelvin probe center may be implemented as a computer software program tangibly embodied on a machine-readable medium, such as storage unit 178. In some embodiments, some or all of the computer program may be loaded and/or installed onto device 170 via ROM 172 and/or communication unit 179. When the computer program is loaded into RAM 173 and executed by computing unit 171, one or more steps of the method of identifying a kelvin probe center described above may be performed. Alternatively, in other embodiments, the computing unit 171 may be configured to perform the method of identifying the Kelvin probe center by any other suitable means (e.g., by means of firmware).
Various implementations of the systems and techniques described here above may be implemented in digital electronic circuitry, integrated circuit systems, field Programmable Gate Arrays (FPGAs), application Specific Integrated Circuits (ASICs), application Specific Standard Products (ASSPs), systems On Chip (SOCs), load programmable logic devices (CPLDs), computer hardware, firmware, software, and/or combinations thereof. These various embodiments may include: implemented in one or more computer programs, the one or more computer programs may be executed and/or interpreted on a programmable system including at least one programmable processor, which may be a special purpose or general-purpose programmable processor, that may receive data and instructions from, and transmit data and instructions to, a storage system, at least one input device, and at least one output device.
Program code for carrying out methods of the present application may be written in any combination of one or more programming languages. These program code may be provided to a processor or controller of a general purpose computer, special purpose computer, or other programmable data processing apparatus such that the program code, when executed by the processor or controller, causes the functions/operations specified in the flowchart and/or block diagram to be implemented. The program code may execute entirely on the machine, partly on the machine, as a stand-alone software package, partly on the machine and partly on a remote machine or entirely on the remote machine or server.
In the context of this application, a machine-readable medium may be a tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device. The machine-readable medium may be a machine-readable signal medium or a machine-readable storage medium. The machine-readable medium may include, but is not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any suitable combination of the foregoing. More specific examples of a machine-readable storage medium would include an electrical connection based on one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.
The foregoing embodiment numbers of the present application are merely for describing, and do not represent advantages or disadvantages of the embodiments.
In the foregoing embodiments of the present application, the descriptions of the embodiments are emphasized, and for a portion of this disclosure that is not described in detail in this embodiment, reference is made to the related descriptions of other embodiments.
In the several embodiments provided in the present application, it should be understood that the disclosed technology content may be implemented in other manners. The above-described embodiments of the apparatus are merely exemplary, and the division of the units, for example, may be a logic function division, and may be implemented in another manner, for example, a plurality of units or components may be combined or may be integrated into another system, or some features may be omitted, or not performed. Alternatively, the coupling or direct coupling or communication connection shown or discussed with each other may be through some interfaces, units or modules, or may be in electrical or other forms.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.
In addition, each functional unit in each embodiment of the present application may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit. The integrated units may be implemented in hardware or in software functional units.
The integrated units, if implemented in the form of software functional units and sold or used as stand-alone products, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present application may be embodied in essence or a part contributing to the prior art or all or part of the technical solution in the form of a software product stored in a storage medium, including several instructions to cause a computer device (which may be a personal computer, a server or a network device, etc.) to perform all or part of the steps of the methods described in the embodiments of the present application. And the aforementioned storage medium includes: a U-disk, a Read-Only Memory (ROM), a random access Memory (RAM, random Access Memory), a removable hard disk, a magnetic disk, or an optical disk, or other various media capable of storing program codes.
The foregoing is merely a preferred embodiment of the present application and it should be noted that modifications and adaptations to those skilled in the art may be made without departing from the principles of the present application and are intended to be comprehended within the scope of the present application.
Claims (10)
1. A method of identifying a center of a kelvin probe, comprising:
determining a first probe and a second probe in a Kelvin probe image, and determining a first contour point set corresponding to the first probe in the image and a second contour point set corresponding to the second probe in the image;
screening out a first contour point with a first distance from the end part of the second probe in the first contour point set and a second contour point with a second distance from the end part of the first probe in the second contour point set;
constructing a first straight line according to the first contour point, and constructing a second straight line according to the second contour point, wherein the method comprises the following steps: respectively taking the first contour point and the second contour point as references, determining and screening out a third contour point with a third distance from the end part of the second probe in the first contour point set and a fourth contour point with a fourth distance from the end part of the first probe in the second contour point set, obtaining a first straight line according to the first contour point and the third contour point, and obtaining a second straight line according to the second contour point and the fourth contour point, wherein the first distance is smaller than the third distance, and the second distance is smaller than the fourth distance;
Determining a center point of the kelvin probe based on the first line and the second line includes: moving the first straight line along the first probe by a preset distance to obtain a third straight line intersecting with two sides of the first probe; moving the second straight line along the second probe by the preset distance to obtain a fourth straight line intersecting with two sides of the second probe; a center point of the kelvin probe is determined based on the third line and the fourth line.
2. The method of claim 1, wherein determining the center point of the kelvin probe based on the third line and the fourth line comprises:
respectively acquiring a first center point corresponding to the third straight line and a second center point corresponding to the fourth straight line;
and determining the central point of the connecting line between the first central point and the second central point as the central point of the Kelvin probe.
3. The method of claim 1, wherein determining the first probe and the second probe in the kelvin probe image comprises:
acquiring the central position of the Kelvin probe image;
identifying a connected domain in the Kelvin probe image, and determining the connected domain closest to the central position as the first probe;
And determining the nearest connected domain to the first probe as the second probe.
4. A method according to claim 3, wherein prior to identifying connected domains in the kelvin probe image, the method further comprises:
and carrying out graying treatment on the Kelvin probe image to obtain a gray level image corresponding to the Kelvin probe image, and detecting whether the gray level image meets the preset brightness requirement.
5. The method of claim 4, wherein identifying connected domains in the kelvin probe image comprises:
invoking an adaptive threshold algorithm to perform local adaptive threshold segmentation on the gray level image to obtain a target binarized image;
and calling a depth priority algorithm to determine a connected domain corresponding to the Kelvin probe image in the target binarization image.
6. The method of claim 5, wherein detecting whether the gray scale map meets a preset brightness requirement comprises:
determining a white part in the target binarized image as a background picture in the gray scale image;
and counting a first image pixel area of which the pixel value is larger than a preset value and corresponding to the background picture, obtaining a second image pixel area of which the target binarization image corresponds to, solving a ratio of the first image pixel area to the second image pixel area, and determining whether the gray level diagram meets a preset brightness requirement according to the ratio.
7. The method of claim 6, wherein determining whether the gray scale map meets a preset brightness requirement based on the ratio comprises:
under the condition that the ratio is larger than a preset ratio, determining that the gray scale image meets the preset brightness requirement;
and under the condition that the ratio is smaller than the preset ratio, determining that the gray scale image does not meet the preset brightness requirement.
8. An apparatus for identifying a center of a kelvin probe, comprising:
the identification module is used for determining a first probe and a second probe in a Kelvin probe image, determining a first contour point set corresponding to the first probe in the image and a second contour point set corresponding to the second probe in the image;
the screening module is used for screening out a first contour point with a first distance from the end part of the first probe in the first contour point set and a second contour point with a second distance from the end part of the second probe in the second contour point set;
the determining module is configured to construct a first straight line according to the first contour point, construct a second straight line according to the second contour point, and determine a center point of the kelvin probe based on the first straight line and the second straight line, and includes: respectively taking the first contour point and the second contour point as references, determining and screening out a third contour point with a third distance from the end part of the second probe in the first contour point set and a fourth contour point with a fourth distance from the end part of the first probe in the second contour point set, obtaining a first straight line according to the first contour point and the third contour point, and obtaining a second straight line according to the second contour point and the fourth contour point, wherein the first distance is smaller than the third distance, and the second distance is smaller than the fourth distance; moving the first straight line along the first probe by a preset distance to obtain a third straight line intersecting with two sides of the first probe; moving the second straight line along the second probe by the preset distance to obtain a fourth straight line intersecting with two sides of the second probe; a center point of the kelvin probe is determined based on the third line and the fourth line.
9. A non-volatile storage medium, characterized in that the storage medium comprises a stored program, wherein the program, when run, controls a device in which the storage medium is located to perform the method of identifying a kelvin probe center according to any of claims 1 to 7.
10. An electronic device, comprising:
a processor;
a memory for storing the processor-executable instructions;
wherein the processor is configured to execute the instructions to implement the method of identifying a kelvin probe center according to any one of claims 1 to 7.
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| US6710798B1 (en) * | 1999-03-09 | 2004-03-23 | Applied Precision Llc | Methods and apparatus for determining the relative positions of probe tips on a printed circuit board probe card |
| CN111551099A (en) * | 2020-06-15 | 2020-08-18 | 徐州徐工挖掘机械有限公司 | Caliper system for measuring contour dimension of bucket tooth |
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