CN115655885A - Young modulus measurement test device - Google Patents
Young modulus measurement test device Download PDFInfo
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- CN115655885A CN115655885A CN202211321320.8A CN202211321320A CN115655885A CN 115655885 A CN115655885 A CN 115655885A CN 202211321320 A CN202211321320 A CN 202211321320A CN 115655885 A CN115655885 A CN 115655885A
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Abstract
The invention relates to a Young modulus measurement test device, which comprises a sample support, a force application mechanism, a Hall sensor and a magnet seat, wherein the force application mechanism is arranged on the sample support; the sample support is provided with a fixed clamp and a movable clamp, and the fixed clamp and the movable clamp are respectively used for connecting two ends of a sample; the force application mechanism is used for pulling the movable clamp towards the direction far away from the fixed clamp; a uniform gradient magnetic field is constructed in the magnet seat; the Hall sensor is connected with the movable clamp and extends into the magnet seat; the device disclosed by the invention is used for representing the micro deformation in the Young modulus measurement experiment by constructing the uniform gradient magnetic field and utilizing the characteristic that the magnetic field and the corresponding position form a linear relation, the micron-scale deformation measurement can be realized by combining the precision of the Hall sensor, the operation difficulty is low, the measurement efficiency is high, in addition, the whole device is simple in structure, the size is greatly reduced compared with the conventional size, the occupied operation space is greatly reduced, and the measurement is convenient for students.
Description
Technical Field
The invention relates to the technical field of experimental instruments, in particular to a Young modulus measurement test device.
Background
The Young modulus is an important physical quantity for representing the relation between the deformation and the internal force of the solid material and describing the deformation resistance of the solid material, and is one of important parameters when mechanical members are selected in engineering, so that the Young modulus measurement of the material has important significance.
The Young's modulus is measured by a stretching method, a bending method, a vibration method and an internal friction method, wherein a static stretching method is a measurement method commonly used in physical experiments. In Young's modulus measurement, measuring small changes in wire length is the most critical task. The common measuring method is an optical lever amplification method, the measuring precision of the method is still good, but the operation difficulty is high, and the measuring efficiency is low.
Disclosure of Invention
Based on the expression, the invention provides the Young modulus measurement test device, which is characterized by micro deformation in the Young modulus measurement experiment by constructing a uniform gradient magnetic field and utilizing the characteristic that the magnetic field and the corresponding position are in a linear relation, can realize micron-scale deformation measurement by combining with the precision of a Hall sensor, and has low operation difficulty and high measurement efficiency.
The technical scheme for solving the technical problems is as follows: a Young modulus measurement test device comprises a sample support, a force application mechanism, a Hall sensor and a magnet seat; the sample support is provided with a fixed clamp and a movable clamp, and the fixed clamp and the movable clamp are respectively used for connecting two ends of a sample; the force application mechanism is used for pulling the movable clamp towards the direction far away from the fixed clamp;
a uniform gradient magnetic field is constructed in the magnet seat; the Hall sensor is connected with the movable clamp and extends into the magnet seat.
On the basis of the technical scheme, the invention can be further improved as follows.
Furthermore, the force application mechanism comprises a force application rod and a tension sensor, and the force application rod is connected with the movable clamp through the tension sensor.
Furthermore, the sample support comprises a cross beam, two longitudinal rods, an upper limiting plate and a lower limiting plate; the two ends of the cross beam are respectively connected with the tops of the two longitudinal rods, and the fixed clamp is arranged in the middle of the cross beam; two ends of the upper limiting plate and the lower limiting plate are respectively connected to the two longitudinal rods; the movable clamp is arranged above the upper limiting plate, the tension sensor is arranged between the upper limiting plate and the lower limiting plate, and the stress application rod is arranged below the lower limiting plate.
Furthermore, the tension sensor is connected with the stress application rod through a lower connecting rod, and the lower connecting rod can slidably penetrate through the lower limiting plate.
Furthermore, the movable clamp is connected with the tension sensor through an upper connecting rod, and the upper connecting rod can slidably penetrate through the upper limiting plate.
Further, the top of going up the connecting rod is provided with the mounting bracket, hall sensor connects the mounting bracket, the activity anchor clamps rotationally connect the mounting bracket.
Furthermore, the bottom of the magnet seat is provided with an adjusting nut for adjusting the height of the magnet seat.
Further, the gradient change direction of the magnetic field in the magnet seat is parallel to a connecting line of the fixed clamp and the movable clamp.
Compared with the prior art, the technical scheme of the application has the following beneficial technical effects:
1. according to the invention, a uniform gradient magnetic field is constructed, the characteristic that the magnetic field of the uniform gradient magnetic field is in a linear relation with a corresponding position is utilized to represent micro deformation in a Young modulus measurement experiment, micron-scale deformation measurement can be realized by combining the precision of a high-sensitivity Hall sensor, the operation difficulty is low, and the measurement efficiency is high;
2. the deformation of a sample to be measured is converted into the linear change of a magnetic field, and the deformation of the sample is measured by adopting a high-precision magnetic field sensor, so that the length requirement of the sample is greatly reduced, the overall size of the measuring device is reduced, and the measuring precision is high;
3. the length change and the tensile force of the sample can be converted into digital quantities and directly displayed, and errors caused by reading by naked eyes are reduced.
4. The force applying mechanism supports the electric rotating force applying rod to apply force, the control unit collects data of the force sensor at the same time, closed-loop tight control is formed, manual control errors can be reduced, and precision is improved.
5. The intelligent control, the electric control force application, the digital acquisition and display are adopted, the network remote access control equipment is supported, and the unattended operation and the data acquisition of the equipment are remotely completed.
Drawings
FIG. 1 is a schematic structural diagram of a Young's modulus measurement test apparatus provided in an embodiment of the present invention;
FIG. 2 is a schematic diagram of a sample holder according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of a force applying mechanism according to an embodiment of the present invention;
in the drawings, the components represented by the respective reference numerals are listed below:
1. a square base; 11. a magnetic field seat support; 12. adjusting the nut; 2. a sample holder; 21. a cross beam; 22. a longitudinal bar; 23. an upper limiting plate; 24. a lower limiting plate; 3. a force application mechanism; 31. a stressing rod; 32. a tension sensor; 33. a lower connecting rod; 34. an upper connecting rod; 35. a mounting frame; 4. a magnetic field base; 5. a movable clamp; 6. fixing the clamp; 7. a Hall sensor; 8. and (3) sampling.
Detailed Description
To facilitate an understanding of the present application, the present application will now be described more fully with reference to the accompanying drawings. Embodiments of the present application are set forth in the accompanying drawings. This application may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein in the description of the present application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.
As used herein, the singular forms "a", "an" and "the" may include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms "comprises/comprising," "includes" or "including," etc., specify the presence of stated features, integers, steps, operations, components, parts, or combinations thereof, but do not preclude the presence or addition of one or more other features, integers, steps, operations, components, parts, or combinations thereof.
The utility model provides a young's modulus measurement test device, includes square base 1 and installs sample support 2, application of force mechanism 3 and magnet seat 4 on square base 1.
Specifically, the sample holder 2 includes a cross member 21, two longitudinal bars 22, an upper limiting plate 23, and a lower limiting plate 24. The bottoms of the two longitudinal rods 22 are respectively fixed at two opposite corners of the square base 1, two ends of the cross beam 21 are respectively connected with the tops of the two longitudinal rods 22, and two ends of the upper limiting plate 23 and the lower limiting plate 24 are respectively fixedly installed on the two longitudinal rods 22.
The urging mechanism 3 includes an urging lever 31 and a tension sensor 32. The stressing rod 31 is vertically arranged, and the bottom of the stressing rod 31 is in threaded connection with the center of the square base 1. The tension sensor 32 is provided between the upper stopper plate 23 and the lower stopper plate 24.
In addition, a vertical lower link 33 is slidably disposed on the lower limiting plate 24, a bottom of the lower link 33 is connected to a top of the stressing rod 31, and a top of the lower link 33 is connected to a bottom of the tension sensor 32.
An upright upper link 34 is slidably disposed on the upper limiting plate 23, a bottom of the upper link 34 is connected to a top of the tension sensor 32, and a mounting bracket 35 is disposed on the top of the upper link 34.
The top of the mounting frame 35 is rotatably mounted with a movable clamp 5 for attachment to the bottom of the sample 8. The middle of the beam 21 is provided with a fixing clamp 6 for connecting the top of the sample 8. By rotating the force applying rod 31, the movable clamp 5 can be pulled downwards, so that the sample 8 is slightly deformed. The tension on the sample 8 can be measured by the tension sensor 32.
In addition, the other corner of the square base 1 is provided with a magnetic field seat support 11, and the bottom of the magnetic field seat 4 is installed on the top of the magnetic field seat support 11 through an adjusting nut 12. The height of the magnetic field base 4 can be adjusted by adjusting the nut 12 to adapt to the measurement of the young's modulus of samples 8 with different lengths.
A uniform gradient magnetic field is constructed in the magnetic field base 4, and the gradient change direction of the magnetic field is along the vertical direction. The mounting seat 35 is further fixed with a hall sensor 7, and one end of the hall sensor 7 extends into the magnetic field seat 4. The deformation of the sample 8 can be measured by the hall sensor 7.
In this embodiment, the hall sensor 7 converts the deformation amount of the sample 8 into the detection of the variation amount of the gradient magnetic field, and at the same time, measures the tension by the tension sensor 32. The Hall sensor 7 and the tension sensor 32 can be connected with a host (not shown in the figure), the host adopts high-precision AD conversion to convert deformation and tension into book quality and directly display the book quality, errors caused by reading with naked eyes can be reduced, and the measurement is more accurate.
In addition, the micro deformation in the Young modulus measurement experiment is represented by constructing a uniform gradient magnetic field and utilizing the characteristic that the magnetic field and the corresponding position are in a linear relation, the micron-scale deformation measurement can be realized by combining the precision of the Hall sensor 7, the operation difficulty is low, and the measurement efficiency is high. The deformation of the sample 8 is measured by adopting the high-precision magnetic field sensor, so that the length requirement of the sample 8 is greatly reduced, the overall size of the measuring device is reduced, and the measuring precision is high.
The principle of this example for measuring Young's modulus of sample 8 is as follows:
when the Lorentz force and the electrostatic acting force applied to the directional moving current carrier in the Hall sensor 7 are equal, a stable potential difference, namely a Hall voltage V, is established at the output end H ＝KI H B, where K is the sensitivity of the Hall sensor 7, I H Is the current of the hall sensor 7 and B is the magnetic field strength across the hall sensor 7.
If the current I of the Hall sensor 7 is maintained H When the Hall effect current sensor is not changed and moves in a uniform gradient magnetic field, the change quantity of the output Hall effect current difference is as follows:
in the homogeneous magnetic field, the magnetic field is uniform,
is constant, therefore, the displacement amount of the hall sensor 7, i.e., the deformation amount Δ L of the sample 7, is:
in addition, the tension F on the sample 8 can be obtained by the tension sensor 32, the original length L of the sample 8 can be measured by a tape measure, and the diameter d of the sample 8 can be measured by a micrometer screw.
Thus, for cylindrical sample 8 having a diameter d, its Young's modulus is:
in addition, preferably, the force application mechanism can apply force by using an electric rotating force application rod, a control unit simultaneously acquires data of the force sensor, closed-loop tight control is formed, manual control errors can be reduced, and precision is improved.
Meanwhile, a communication module can be arranged, the remote host is connected through a network, and modularized intelligent control is adopted, so that unattended operation and remote completion of the experiment operation and data acquisition of the equipment are realized.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like that fall within the spirit and principle of the present invention are intended to be included therein.
Claims (8)
1. A Young modulus measurement test device is characterized by comprising a sample support, a force application mechanism, a Hall sensor and a magnet seat; the sample support is provided with a fixed clamp and a movable clamp, and the fixed clamp and the movable clamp are respectively used for connecting two ends of a sample; the force application mechanism is used for pulling the movable clamp towards the direction far away from the fixed clamp;
a uniform gradient magnetic field is constructed in the magnet seat; the Hall sensor is connected with the movable clamp and extends into the magnet seat.
2. The apparatus for testing young's modulus measurement as claimed in claim 1, wherein said force applying mechanism comprises a force applying rod and a tension sensor, said force applying rod is connected to said movable clamp through said tension sensor.
3. The young's modulus measurement test device as claimed in claim 2, wherein said sample holder comprises a beam, two longitudinal rods, an upper limiting plate and a lower limiting plate; the two ends of the cross beam are respectively connected with the tops of the two longitudinal rods, and the fixed clamp is arranged in the middle of the cross beam; two ends of the upper limiting plate and the lower limiting plate are respectively connected to the two longitudinal rods; the movable clamp is arranged above the upper limiting plate, the tension sensor is arranged between the upper limiting plate and the lower limiting plate, and the stress application rod is arranged below the lower limiting plate.
4. The Young's modulus measurement tester as claimed in claim 3, wherein said tension sensor and said stress beam are connected by a lower link, said lower link slidably passing through said lower limiting plate.
5. The Young's modulus measurement test device according to claim 3, wherein the movable clamp and the tension sensor are connected by an upper link rod, and the upper link rod slidably passes through the upper limiting plate.
6. The Young's modulus measurement testing device according to claim 5, wherein a mounting rack is arranged at the top of the upper connecting rod, the Hall sensor is connected with the mounting rack, and the movable clamp is rotatably connected with the mounting rack.
7. The young's modulus measurement test device as claimed in claim 1, wherein the bottom of the magnet base is provided with an adjusting nut for adjusting the height of the magnet base.
8. The apparatus for testing young's modulus as claimed in claim 1, wherein the gradient of the magnetic field in said magnet holder is parallel to the line connecting said fixed jig and said movable jig.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211321320.8A CN115655885A (en) | 2022-10-26 | 2022-10-26 | Young modulus measurement test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211321320.8A CN115655885A (en) | 2022-10-26 | 2022-10-26 | Young modulus measurement test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN115655885A true CN115655885A (en) | 2023-01-31 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202211321320.8A Pending CN115655885A (en) | 2022-10-26 | 2022-10-26 | Young modulus measurement test device |
Country Status (1)
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|---|---|
| CN (1) | CN115655885A (en) |
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- 2022-10-26 CN CN202211321320.8A patent/CN115655885A/en active Pending
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