CN115598420A - Method, device and equipment for calculating phase delay time and storage medium - Google Patents
Method, device and equipment for calculating phase delay time and storage medium Download PDFInfo
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Abstract
The application discloses a method, a device, equipment and a storage medium for calculating phase delay time, wherein the method comprises the following steps: acquiring a current signal acquired by a first channel and a voltage signal acquired by a second channel of the oscilloscope in the process of recovering the blocking of the semiconductor device; carrying out frequency domain analysis on a current signal or a voltage signal to obtain an oscillation period of the current signal or the voltage signal, wherein the frequency of the current signal is the same as that of the voltage signal; performing time domain analysis on the current signal and the voltage signal to obtain a phase difference between the current signal and the voltage signal; and calculating the phase delay time between the first channel and the second channel of the oscilloscope on the basis of the oscillation period and the phase difference, and improving the universality of calculating the phase delay time between the two channels of the oscilloscope.
Description
Technical Field
The present application relates to the field of power electronics technologies, and in particular, to a method, an apparatus, a device, and a storage medium for calculating a phase delay time.
Background
With the development of power electronic technology, an oscilloscope needs to measure voltage and current waveforms in the power semiconductor switching process at the same time, and because the frequency responses of the acquisition probes of voltage and current signals are inconsistent, the voltage and current signals acquired by the oscilloscope by the two probes at the same time have phase delay time.
The phase delay time is fixed and is obtained by substituting the oscillation period and the phase difference into a correlation formula. However, in the prior art, in the field of power electronics, for obtaining the phase difference, first, the Vce1 voltage platform obtained by the first channel and the current change rate di/dt obtained by the second channel are used to calculate the stray inductance Ls; then, calculating an actual Vce2 in the second channel by using the current change rate di/dt, the ideal voltage Vceo and the stray inductance Ls acquired by the second channel; and finally, obtaining a phase difference according to the difference value of the actual Vce2 calculated by the first channel Vce1 and the second channel of the oscilloscope. This solution is implemented because the stray inductance Ls can be calculated by the first channel Vce1 voltage platform, but during the turn-on process of the third generation semiconductor device, the voltage platform of Vce1 is not available, and when the power semiconductor to be measured is the third generation semiconductor, the universality is poor.
Disclosure of Invention
Based on the above problems, the present application provides a method, an apparatus, a device, and a storage medium for obtaining a phase delay time, so as to improve the generality of the phase delay time calculation between two channels of an oscilloscope.
The embodiment of the application discloses the following technical scheme:
in a first aspect, the present application provides a method for obtaining a bit delay time, where the method includes:
acquiring a current signal acquired by a first channel and a voltage signal acquired by a second channel of the oscilloscope in the process of recovering blocking of the semiconductor device;
performing frequency domain analysis on a current signal or a voltage signal to obtain an oscillation period of the current signal or the voltage signal, wherein the frequency of the current signal is the same as that of the voltage signal;
performing time domain analysis on the current signal and the voltage signal to obtain a phase difference between the current signal and the voltage signal;
calculating a phase delay time based on the oscillation period and the phase difference.
Optionally, the performing time domain analysis on the current signal and the voltage signal to obtain a phase difference between the current signal and the voltage signal includes:
determining two adjacent peaks or valleys between the current signal and the voltage signal;
and obtaining the phase difference between the current signal and the voltage signal according to a first time point corresponding to the wave crest or the wave trough of the current signal and a second time point corresponding to the wave crest or the wave trough of the voltage signal.
Optionally, the performing frequency domain analysis on the current signal or the voltage signal to obtain an oscillation period of the current signal or the voltage signal includes:
transforming the current signal or the voltage signal from a time domain to a frequency domain by adopting a Fast Fourier Transform (FFT) algorithm;
and analyzing the current signal or the voltage signal in the frequency domain to obtain the oscillation period of the current signal or the voltage signal.
Optionally, the manner of calculating the phase delay time based on the oscillation period and the phase difference is as follows:
wherein, t delay Representing the phase delay time, T s Representing the period of oscillation, t ph Representing the phase difference between the current signal and the voltage signal.
In a second aspect, the present application provides an apparatus for obtaining a phase delay time, the apparatus comprising:
the device comprises an acquisition module, a frequency domain analysis module, a time domain analysis module and a calculation module;
the acquisition module is used for acquiring a current signal acquired by a first channel and a voltage signal acquired by a second channel of the oscilloscope in the process of recovering the blocking of the semiconductor device;
the frequency domain analysis module is used for carrying out frequency domain analysis on the current signal or the voltage signal to obtain the oscillation period of the current signal or the voltage signal, and the frequency of the current signal is the same as that of the voltage signal;
the time domain analysis module is used for performing time domain analysis on the current signal and the voltage signal to obtain a phase difference between the current signal and the voltage signal;
the calculating module is used for calculating the phase delay time based on the oscillation period and the phase difference.
Optionally, the time domain analysis module is specifically configured to:
determining two adjacent peaks or valleys between the current signal and the voltage signal;
and obtaining the phase difference between the current signal and the voltage signal according to a first time point corresponding to the wave crest or the wave trough of the current signal and a second time point corresponding to the wave crest or the wave trough of the voltage signal.
Optionally, the frequency domain analysis module is specifically configured to:
transforming the current signal or the voltage signal from a time domain to a frequency domain by adopting a Fast Fourier Transform (FFT) algorithm;
and analyzing the current signal or the voltage signal in the frequency domain to obtain the oscillation period of the current signal or the voltage signal.
Optionally, the calculation module calculates the phase delay time by the following formula:
wherein, t delay Representing the phase delay time, T s Representing the period of oscillation, t ph Representing the phase difference between the current signal and the voltage signal.
In a third aspect, the present application provides an apparatus for calculating a phase delay time, the apparatus comprising: a memory, a processor;
the memory for storing a computer program;
the processor, when executing the computer program, is configured to implement the steps of the method of calculating a phase delay time according to any of the first aspect.
In a fourth aspect, the present application provides a computer readable storage medium having stored thereon a computer program which, when executed by a processor, implements the steps of the method of calculating a phase delay time according to any one of the first aspect.
Firstly, acquiring a current signal acquired by a first channel and a voltage signal acquired by a second channel of an oscilloscope in the process of recovering and blocking a semiconductor device; secondly, carrying out frequency domain analysis on the current signal or the voltage signal to obtain an oscillation period of the current signal or the voltage signal, wherein the frequency of the current signal is the same as that of the voltage signal; then, performing time domain analysis on the current signal and the voltage signal to obtain a phase difference between the current signal and the voltage signal; finally, a phase delay time is calculated based on the oscillation period and the phase difference.
Compared with the prior art, the method has the following beneficial effects:
the voltage signal and the current signal are directly analyzed to obtain the phase difference between the voltage signal and the current signal, the dependence on a Vce or Vds voltage platform appearing in the opening process of the semiconductor device is avoided, and the universality of the method for calculating the phase delay time is improved.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art that other drawings can be obtained according to the drawings without inventive exercise.
Fig. 1 is a flowchart of a method for calculating a phase delay time according to an embodiment of the present application;
FIG. 2 is a schematic diagram of frequency domain analysis provided in an embodiment of the present application;
fig. 3 is a schematic diagram of time domain analysis provided in an embodiment of the present application;
fig. 4 is a schematic structural diagram of an apparatus for calculating a phase delay time according to an embodiment of the present disclosure.
Detailed Description
The terms "first", "second" and "third", etc. in the description and claims of this application and the description of the drawings are used for distinguishing between different objects and not for limiting a particular order.
In the embodiments of the present application, words such as "exemplary" or "for example" are used to mean serving as an example, instance, or illustration. Any embodiment or design described herein as "exemplary" or "e.g.," is not necessarily to be construed as preferred or advantageous over other embodiments or designs. Rather, use of the word "exemplary" or "such as" is intended to present concepts related in a concrete fashion.
As described above, the current method must calculate the voltage value Vce2 of the second channel of the oscilloscope with the known stray inductance Ls. Comparing the obtained Vce1 of the first channel with the calculated Vce2 of the second channel to obtain a phase difference, and then compensating the phase of the current signal or the voltage signal according to the phase difference. Through research, in order to accurately calculate the stray inductance Ls, a voltage platform of Vce1 acquired by the first channel is required, but the voltage platform of Vce1 is not available in the turn-on process of the third generation semiconductor device.
In view of this, the embodiment of the present application discloses a method for calculating a phase delay time, first, analyzing a first voltage signal and a first current signal of a switching device to obtain a phase difference between the first voltage signal and the first current signal; then, analyzing the first voltage signal of the switching device to obtain the oscillation period of the switching device; and finally, calculating the phase delay time according to the phase difference and the oscillation period. The voltage signal and the current signal are directly analyzed to obtain the phase difference between the voltage signal and the current signal, the voltage platform of Vce generated in the switching-on process of a switching device is avoided being relied on, and the universality of the method for calculating the phase delay time is improved.
In order to make the technical solutions of the present application better understood, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
Referring to fig. 1, it is a flowchart of a method for calculating a phase delay time according to this embodiment.
As shown in fig. 1, the calculation method includes:
s101: and acquiring a current signal acquired by a first channel and a voltage signal acquired by a second channel of the oscilloscope in the process of recovering the blocking of the semiconductor device.
The semiconductor device may be a first generation semiconductor switching device, a second generation semiconductor switching device, or a third generation semiconductor switching device. Among them, the first generation semiconductor materials, represented by silicon (Si) and germanium (Ge), particularly silicon, form the basis of all logic devices; the second generation semiconductor material mainly refers to compound semiconductor materials, represented by gallium arsenide (GaAs) and indium phosphide (InP); the third generation semiconductor material, invented and applied in the early years of this century, has emerged as a new semiconductor material having a wide bandgap (Eg > 2.3 eV) characteristic, such as silicon carbide (SiC), gallium nitride (GaN), zinc oxide (ZnO), diamond (C), aluminum nitride (AlN), and has been also called a wide bandgap semiconductor material.
The recovery blocking process may be a second turn-on process of the semiconductor device.
S102: and carrying out frequency domain analysis on the current signal or the voltage signal to obtain the oscillation period of the current signal or the voltage signal, wherein the frequency of the current signal is the same as that of the voltage signal.
The oscilloscope samples the current or voltage signal waveform and then converts the sample to a discrete value. Because a transform occurs, fourier transforms cannot be performed on these data, and a Discrete Fourier Transform (DFT) can be used, the result being a frequency domain signal in discrete form.
Specifically, a Fast Fourier Transform (FFT) algorithm is adopted to transform a current signal or a voltage signal from a time domain to a frequency domain; and analyzing the current signal or the voltage signal in the frequency domain to obtain the oscillation period of the current signal or the voltage signal.
Preferably, the voltage signal is transformed from the time domain to the frequency domain using an FFT; and analyzing the voltage signal in the frequency domain to obtain the oscillation period of the voltage signal.
Fast Fourier Transform (FFT) is an implementation of DFT that is computationally inexpensive, but essentially a decomposition of the signal that acts to convert a current or voltage signal from the time domain to the frequency domain.
The current signal and the voltage signal in this embodiment are of the same frequency, that is, the current signal may be transformed into a frequency domain through an FFT algorithm, and an oscillation period of the current signal is obtained by a waveform of the current signal in the frequency domain; the voltage signal can also be transformed into the frequency domain through an FFT algorithm, and the oscillation period of the voltage signal is obtained by the waveform of the voltage signal in the frequency domain. Wherein the oscillation period of the current signal is equal to the oscillation period of the voltage signal.
Fig. 2 is a waveform diagram of a voltage signal in a frequency domain, from which the oscillation period of the voltage signal can be directly read.
S103: and performing time domain analysis on the current signal and the voltage signal to obtain a phase difference between the current signal and the voltage signal.
Specifically, two adjacent peaks or valleys between the current signal and the voltage signal are determined; and obtaining the phase difference between the current signal and the voltage signal according to the first time point corresponding to the wave crest or the wave trough of the current signal and the second time point corresponding to the wave crest or the wave trough of the voltage signal.
In some possible implementations, the first time point may be a time point corresponding to a current peak, the second time point may be a time point corresponding to a voltage peak, and the phase difference between the current signal and the voltage signal is obtained according to the first time point corresponding to the current signal peak and the second time point corresponding to the voltage signal peak.
In some possible implementation manners, the first time point may be a time point corresponding to a current trough, the second time point may be a time point corresponding to a voltage trough, and the phase difference between the current signal and the voltage signal is obtained according to the first time point corresponding to the current signal trough and the second time point corresponding to the voltage signal trough.
In other possible implementations, the first time point may be a time point corresponding to 1/2 between peaks and troughs of the current, and the second time point may be a time point corresponding to 1/2 between peaks and troughs of the voltage.
As an example, take a complete current waveform and voltage waveform with a period T s If the first point in time corresponds to the current waveform T s At the point in time/n, the second point in time corresponds to the voltage waveform T s And the time point corresponding to the position/n, and the phase difference between the first time point and the second time point can be obtained according to the first time point and the second time point.
As shown in fig. 3, the peaks of the first voltage are, from left to right, peak 1, peak 2, and peak 3 … … peak 8; the wave peaks of the first current are respectively wave peak 1, wave peak 2 and wave peak 3 … … wave peak 8 from left to right. The two adjacent peaks of the current signal and the voltage signal may be a peak 1 of the current signal and a peak 1 of the first voltage signal, or a peak 2 of the current signal and a peak 2 of the voltage signal. This embodiment does not describe every adjacent peak that meets the requirement.
S104: and calculating the phase delay time according to the oscillation period and the phase difference.
Specifically, the phase delay time is calculated by:
wherein, t delay Representing the minimum phase delay time, T, between the current signal and the voltage signal s Representing the period of oscillation, t ph Representing the absolute value of the phase difference between the current signal and the voltage signal.
Specifically, the phase delay time can be calculated using the following equation:
n represents the number of oscillation cycles, and when the oscillation frequency of the system is high or the delay is large, the calculated value of the delay may be added or subtracted by n oscillation cycles.
Firstly, acquiring a current signal acquired by a first channel and a voltage signal acquired by a second channel of an oscilloscope in the process of recovering and blocking a semiconductor device; secondly, carrying out frequency domain analysis on the current signal or the voltage signal to obtain an oscillation period of the current signal or the voltage signal, wherein the frequency of the current signal is the same as that of the voltage signal; then, performing time domain analysis on the current signal and the voltage signal to obtain a phase difference between the current signal and the voltage signal; finally, a phase delay time is calculated based on the oscillation period and the phase difference.
The voltage signal and the current signal are directly analyzed to obtain the phase difference between the voltage signal and the current signal, the Vce voltage platform appearing in the switching-on process of the switching device is avoided being relied on, and the universality of the method for calculating the phase delay time is improved.
Referring to fig. 4, this figure is a schematic structural diagram of an apparatus for calculating a phase delay time according to this embodiment.
As shown in fig. 4, the phase compensation device includes: an obtaining module 401, a frequency domain analyzing module 402, a time domain analyzing module 403 and a calculating module 404;
the acquiring module 401 is configured to acquire a current signal acquired by a first channel and a voltage signal acquired by a second channel of an oscilloscope in a semiconductor device blocking recovery process;
a frequency domain analysis module 402, configured to perform frequency domain analysis on the current signal or the voltage signal to obtain an oscillation period of the current signal or the voltage signal, where the frequency of the current signal is the same as that of the voltage signal;
a time domain analysis module 403, configured to perform time domain analysis on the current signal and the voltage signal to obtain a phase difference between the current signal and the voltage signal;
a calculating module 404, configured to calculate a phase delay time based on the oscillation period and the phase difference.
Optionally, the time domain analyzing module 403 is specifically configured to:
determining two adjacent peaks or valleys between the current signal and the voltage signal;
and obtaining the phase difference between the current signal and the voltage signal according to the first time point corresponding to the wave crest or the wave trough of the current signal and the second time point corresponding to the wave crest or the wave trough of the voltage signal.
Optionally, the frequency domain analyzing module 402 is specifically configured to:
transforming the current signal or the voltage signal from a time domain to a frequency domain by adopting a Fast Fourier Transform (FFT) algorithm;
and analyzing the current signal or the voltage signal in the frequency domain to obtain the oscillation period of the current signal or the voltage signal.
Optionally, the calculating module 404 calculates the phase delay time specifically by using the following formula:
wherein, t delay Representing the minimum phase delay time, T, between the current signal and the voltage signal s Representing the period of oscillation, t ph Representing the phase difference between the current signal and the voltage signal.
Specifically, the phase delay time can be calculated using the following equation:
n represents the number of oscillation cycles, and when the oscillation frequency of the system is very high or the delay is large, the calculated value of the delay may be added or subtracted by n oscillation cycles.
Embodiments of the present application provide a computer-readable storage medium, on which a computer program is stored, where the computer program is executed by a processor, and the computer program implements the method for calculating a phase delay time according to the embodiments of the present application.
In practice, the computer-readable storage medium may take any combination of one or more computer-readable media. The computer readable medium may be a computer readable signal medium or a computer readable storage medium. A computer readable storage medium may be, for example, but not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination of the foregoing. More specific examples (a non-exhaustive list) of the computer readable storage medium would include the following: an electrical connection having one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing. In the present embodiment, a computer readable storage medium may be any tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device.
A computer readable signal medium may include a propagated data signal with computer readable program code embodied therein, for example, in baseband or as part of a carrier wave. Such a propagated data signal may take many forms, including, but not limited to, electro-magnetic, optical, or any suitable combination thereof. A computer readable signal medium may also be any computer readable medium that is not a computer readable storage medium and that can communicate, propagate, or transport a program for use by or in connection with an instruction execution system, apparatus, or device.
Program code embodied on a computer readable medium may be transmitted using any appropriate medium, including but not limited to wireless, wireline, optical fiber cable, RF, etc., or any suitable combination of the foregoing.
Computer program code for carrying out operations for aspects of the present invention may be written in any combination of one or more programming languages, including an object oriented programming language such as Java, smalltalk, C + + or the like and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The program code may execute entirely on the user's computer, partly on the user's computer, as a stand-alone software package, partly on the user's computer and partly on a remote computer or entirely on the remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer through any type of network, including a Local Area Network (LAN) or a Wide Area Network (WAN), or the connection may be made to an external computer (for example, through the Internet using an Internet service provider).
It should be noted that, in this specification, each embodiment is described in a progressive manner, and the same and similar parts between the embodiments are referred to each other, and each embodiment focuses on differences from other embodiments. The above-described embodiments of the apparatus are merely illustrative, and the units described as separate parts may or may not be physically separate, and the parts indicated as units may or may not be physical units, may be located in one position, or may be distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of the present embodiment. One of ordinary skill in the art can understand and implement it without inventive effort.
The above description is only one specific embodiment of the present application, but the scope of the present application is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present application should be covered by the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (10)
1. A method of calculating a phase delay time, the method comprising:
acquiring a current signal acquired by a first channel and a voltage signal acquired by a second channel of the oscilloscope in the process of recovering the blocking of the semiconductor device;
carrying out frequency domain analysis on a current signal or a voltage signal to obtain an oscillation period of the current signal or the voltage signal, wherein the frequency of the current signal is the same as that of the voltage signal;
performing time domain analysis on the current signal and the voltage signal to obtain a phase difference between the current signal and the voltage signal;
and calculating the phase delay time between the first channel and the second channel of the oscilloscope on the basis of the oscillation period and the phase difference.
2. The method of claim 1, wherein the time domain analyzing the current signal and the voltage signal to obtain a phase difference between the current signal and the voltage signal comprises:
determining two adjacent peaks or valleys between the current signal and the voltage signal;
and obtaining the phase difference between the current signal and the voltage signal according to a first time point corresponding to the wave crest or the wave trough of the current signal and a second time point corresponding to the wave crest or the wave trough of the voltage signal.
3. The method of claim 1, wherein the frequency domain analyzing the current signal or the voltage signal to obtain the oscillation period of the current signal or the voltage signal comprises:
transforming the current signal or the voltage signal from a time domain to a frequency domain by adopting a Fast Fourier Transform (FFT) algorithm;
and analyzing the current signal or the voltage signal in the frequency domain to obtain the oscillation period of the current signal or the voltage signal.
4. The method of claim 1, wherein the phase delay time between the first and second channels of the oscilloscope is calculated based on the oscillation period and the phase difference by:
wherein, t delay Representing the phase delay time, T s Representing the period of oscillation, t ph Representing the phase difference between the current signal and the voltage signal.
5. An apparatus for calculating a phase delay time, the apparatus comprising: the device comprises an acquisition module, a frequency domain analysis module, a time domain analysis module and a calculation module;
the acquisition module is used for acquiring a current signal acquired by a first channel and a voltage signal acquired by a second channel of the oscilloscope in the process of recovering the blocking of the semiconductor device;
the frequency domain analysis module is used for carrying out frequency domain analysis on the current signal or the voltage signal to obtain the oscillation period of the current signal or the voltage signal, and the frequency of the current signal is the same as that of the voltage signal;
the time domain analysis module is used for performing time domain analysis on the current signal and the voltage signal to obtain a phase difference between the current signal and the voltage signal;
and the calculating module is used for calculating the phase delay time between the first channel and the second channel of the oscilloscope based on the oscillation period and the phase difference.
6. The apparatus of claim 5, wherein the time domain analysis module is specifically configured to:
determining two adjacent peaks or valleys between the current signal and the voltage signal;
and obtaining the phase difference between the current signal and the voltage signal according to a first time point corresponding to the wave crest or the wave trough of the current signal and a second time point corresponding to the wave crest or the wave trough of the voltage signal.
7. The apparatus of claim 5, wherein the frequency domain analysis module is specifically configured to:
transforming the current signal or the voltage signal from a time domain to a frequency domain by adopting a Fast Fourier Transform (FFT) algorithm;
and analyzing the current signal or the voltage signal in the frequency domain to obtain the oscillation period of the current signal or the voltage signal.
8. The apparatus of claim 5, wherein the calculation module calculates the phase delay time between the first and second channels of the oscilloscope by the formula:
wherein, t delay Representing the phase delay time, T s Representing the period of oscillation, t ph Representing the phase difference between the current signal and the voltage signal.
9. An apparatus for calculating a phase delay time, the apparatus comprising: a memory, a processor;
the memory for storing a computer program;
the processor, when executing the computer program, implementing the steps of the method of calculating a phase delay time according to any of claims 1 to 4.
10. A computer-readable storage medium, having stored thereon a computer program which, when being executed by a processor, carries out the steps of the method of calculating a phase delay time according to any one of claims 1 to 4.
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